Datasheet IDT74FCT163601PV, IDT74FCT163601PF, IDT74FCT163601PA, IDT74FCT163601APV, IDT74FCT163601APF Datasheet (Integrated Device Technology)

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Integrated Device Technology, Inc.
3.3V CMOS 18-BIT UNIVERSAL BUS TRANSCEIVER WITH 3-STATE OUTPUTS
IDT74FCT163601/A
ADVANCE INFORMATION
FEATURES:
• 0.5 MICRON CMOS Technology
Typical tSK(o) (Output Skew) < 250ps
• ESD > 2000V per MIL-STD-883, Method 3015; > 200V using machine model (C = 200pF, R = 0)
• Packages include 25 mil pitch SSOP, 19.6 mil pitch TSSOP and 15.7 mil pitch TVSOP
• Extended commercial range of -40°C to +85°C
•V
CC = 3.3V ±0.3V, Normal Range or
VCC = 2.7 to 3.6V, Extended Range
• CMOS power levels (0.4µW typ. static)
• Rail-to-Rail output swing for increased noise margin
• Low Ground Bounce (0.3V typ.)
• Inputs (except I/O) can be driven by 3.3V or 5V components
DESCRIPTION:
using advanced dual metal CMOS technology. These 18-bit
FUNCTIONAL BLOCK DIAGRAM
OEAB
CLKENAB
CLKAB
LEAB LEBA
CLKBA
1
56
55
2
28
30
universal bus transceivers combine D-type latches and D­type flip-flops to allow data flow in transparent, latched and clocked modes.
(
OEAB
and
OEBA
), latch-enable (LEAB and LEBA), and clock (CLKAB and CLKBA) inputs. The clock can be controlled by the clock-enable (
CLKENAB
and
CLKENBA
) inputs. For A-to­B data flow, the device operates in the transparent mode when LEAB is high. When LEAB is low, the A data is latched if CLKAB is held at a high or low logic level. If LEAB is low, the A-bus data is stored in the latch/flip-flop on the low-to-high transition of CLKAB. Output enable When
OEAB
is low, the outputs are active. When
OEAB
is active low.
OEAB
is
high, the outputs are in the high-impedance state.
Data flow for B to A is similar to that of A to B but uses
LEBA, CLKBA and
CLKENBA
.
OEBA
The FCT163601 has series current limiting resistors. These offer low ground bounce, minimal undershoot, and controlled output fall times-reducing the need for external series termi­nating resistors.
,
A1
29
27
3
CE
1D C1
CLK
TO 17 OTHER CHANNELS
CE 1D C1
CLK
54
B1
3251 drw 01
CLKENBA
OEBA
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
COMMERCIAL TEMPERATURE RANGE AUGUST 1996
1996 Integrated Device Technology, Inc. 5.9 DSC-3251/1
1
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IDT74FCT163601/A
3.3V CMOS 18-BIT UNIVERSAL BUS TRANSCEIVERS COMMERCIAL TEMPERATURE RANGE
PIN CONFIGURATIONS
OEAB
LEAB
A
GND
A A
V
CC
A A A
GND
A A
A A A A
GND
A A A
V
CC
A A
GND
A
OEBA
LEBA
1 2
1
3 4
2
5
3
6 7
4
8
5
9
6
10 11
7
12
8
13
9
14
SO56-1
10
11
12
15 16 17
SO56-2 SO56-3
18
13
14
15
19 20 21 22
16
17
23 24
56 55 54 53 52 51 50 49
48
47 46 45 44
43
42 41 40 39 38 37 36 35 34 33 3225
18
26 27 28
31 30 29
SSOP
TSSOP/TVSOP
TOP VIEW
CLKENAB CLKAB B
1
GND
2
B B
3
V
CC
B
4
B
5
B
6
GND B
7
B
8
B
9
B
10
B
11
B
12
GND B
13
B
14
B
15
V
CC
16
B B
17
GND B
18
CLKBA CLKENBA
3251 drw 02
PIN DESCRIPTION
Pin Names Description
OEAB OEBA
LEAB A-to-B Latch Enable Input LEBA B-to-A Latch Enable Input CLKAB A-to-B Clock Input CLKBA B-to-A Clock Input Ax A-to-B Data Inputs or B-to-A 3-State Outputs Bx B-to-A Data Inputs or A-to-B 3-State Outputs
CLKENAB CLKENBA
A-to-B Output Enable Input (Active LOW) B-to-A Output Enable Input (Active LOW)
A to B Clock Enable Input (Active LOW) B to A Clock Enable Input (Active LOW)
3251 tbl 01
CAPACITANCE (TA = +25°C, f = 1.0MHz)
Symbol Parameter
CIN Input
Capacitance
CI/O I/O
Capacitance
NOTE:
1. This parameter is measured at characterization but not tested.
ABSOLUTE MAXIMUM RATINGS
Symbol Description Max. Unit
(2)
VTERM
Terminal Voltage with Respect to GND
(3)
VTERM
Terminal Voltage with Respect to GND
(4)
VTERM
Terminal Voltage with Respect to GND
TSTG Storage Temperature –65 to +150 °C IOUT DC Output Current –60 to +60 mA
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RAT­INGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
2. Vcc terminals.
3. Input terminals.
4. Output and I/O terminals.
FUNCTION TABLE
CLKENAB
CLKENAB
XHXXXZ XLHXLL XLHXHH HLLXXB0 LLL↑LL LLL↑HH L LLLXB0 LLLHXB0
NOTES: 3251 tbl 02
1. A-to-B data flow is shown. B-to-A data flow is similar but uses LEBA, CLKBA and
2. Output level before the indicated steady-state input conditions were established.
3. Output level before the indicated steady-state input conditions were established, provided that CLKAB was HIGH before LEAB went LOW.
4. H = HIGH Voltage Level L = LOW Voltage Level X = Don't Care Z = High-impedance ↑ = LOW-to-HIGH Transition
OEAB
OEAB
(1)
Conditions Typ. Max. Unit
VIN = 0V 3.5 6.0 pF
VOUT = 0V 3.5 8.0 pF
3251 lnk 04
(1)
–0.5 to +4.6 V
–0.5 to +7.0 V
–0.5 to
CC + 0.5
V
V
3251 lnk 03
(1,4)
Inputs Outputs
LEAB CLKAB A B
(2)
(2)
(3)
CLKENBA
.
OEBA
,
5.9 2
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IDT74FCT163601/A
3.3V CMOS 18-BIT UNIVERSAL BUS TRANSCEIVERS COMMERCIAL TEMPERATURE RANGE
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified: Commercial: TA = –40°C to +85°C, VCC = 2.7V to 3.6V
Symbol Parameter Test Conditions
(1)
Min. Typ.
VIH Input HIGH Level (Input pins) Guaranteed Logic HIGH Level 2.0 5.5 V
Input HIGH Level (I/O pins) 2.0 VCC+0.5
VIL Input LOW Level Guaranteed Logic LOW Level –0.5 0.8 V
(Input and I/O pins)
II H Input HIGH Current (Input pins) VCC = Max. VI = 5.5V ±1 µA
Input HIGH Current (I/O pins) VI = VCC ±1
II L Input LOW Current (Input pins) VI = GND ±1
Input LOW Current (I/O pins) VI = GND ±1 IOZH High Impedance Output Current VCC = Max. VO = VCC ±1 µA IOZL (3-State Output pins) VO = GND ±1 VIK Clamp Diode Voltage VCC = Min., IIN = –18mA 0.7 1.2 V IODH Output HIGH Current VCC = 3.3V, VIN = VIH or VIL, VO = 1.5V IODL Output LOW Current VCC = 3.3V, VIN = VIH or VIL, VO = 1.5V
(3) (3)
–36 –60 –110 mA
50 90 200 mA
VOH Output HIGH Voltage VCC = Min. IOH = –0.1mA VCC0.2 V
VIN = VIH or VIL IOH = –3mA 2.4 3.0 — VCC = 3.0V
V
IN = VIH or VIL
IOH = –8mA 2.4
(5)
VOL Output LOW Voltage VCC = Min. IOL = 0.1mA 0.2 V
VIN = VIH or VIL IOL = 16mA 0.2 0.4
IOL = 24mA 0.3 0.55
IOS Short Circuit Current
(4)
VCC = 3.0V V
IN = VIH or VIL
VCC = Max., VO = GND
IOL = 24mA 0.3 0.50
(3)
–60 135 –240 mA VH Input Hysteresis 150 mV ICCL
ICCH
Quiescent Power Supply Current VCC = Max.,
V
IN = GND or VCC
0.1 10 µA
ICCZ
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at Vcc = 3.3V, +25°C ambient.
3. Not more than one output should be tested at one time. Duration of the test should not exceed one second.
4. This parameter is guaranteed but not tested.
OH = VCC –0.6V at rated current.
5. V
(2)
Max. Unit
3.0
3251 lnk 05
5.9 3
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IDT74FCT163601/A
3.3V CMOS 18-BIT UNIVERSAL BUS TRANSCEIVERS COMMERCIAL TEMPERATURE RANGE
POWER SUPPLY CHARACTERISTICS
Symbol Parameter Test Conditions
CC Quiescent Power Supply VCC = Max. 2.0 30 µA
I
Current TTL Inputs HIGH V
ICCD Dynamic Power Supply Current
IN = VCC –0.6V
(4)
VCC = Max., Outputs Open VIN = VCC 60 100 µA/
OEAB
= V
CC
(3
OEBA
(1)
Min. Typ.
= GND V IN = GND MHz One Input Toggling 50% Duty Cycle
I
C Total Power Supply Current
(6)
VCC = Max., Outputs Open VIN = VCC 0.6 1.0 mA f
CP = 10MHz (CLKBA) VIN = GND
50% Duty Cycle
OEAB
= V
CC
OEBA
= GND
LEBA = GND V
CLKENBA
= GND V
IN = VCC –0.6 0.6 1.0 IN = GND
One Bit Toggling f
i = 5MHz
50% Duty Cycle V
CC = Max., Outputs Open VIN = VCC 3.0 5.0
fCP = 10MHz (CLKBA) VIN = GND 50% Duty Cycle
OEAB
= V
CC
OEBA
= GND
LEBA = GND V
CLKENBA
= GND VIN = GND
IN = VCC –0.6 3.0 5.3
Eighteen Bits Toggling f
i = 2.5MHz
50% Duty Cycle
NOTES:
1. For conditions shown as max. or min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
3. Per TTL driven input; all other inputs at V
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of the I
C = IQUIESCENT + IINPUTS + IDYNAMIC
6. I IC = ICC + ICC DHNT + ICCD (fCPNCP/2 + fiNi) I
CC = Quiescent Current (ICCL, ICCH and ICCZ)
CC = Power Supply Current for a TTL High Input
I
H = Duty Cycle for TTL Inputs High
D
T = Number of TTL Inputs at DH
N ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL)
CP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
f
CP = Number of Clock Inputs at fCP
N fi = Input Frequency
i = Number of Inputs at fi
N
CC = 3.3V, +25°C ambient.
CC or GND.
CC formula. These limits are guaranteed but not tested.
(2)
Max. Unit
(5)
(5)
3251 tbl 06
5.9 4
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IDT74FCT163601/A
3.3V CMOS 18-BIT UNIVERSAL BUS TRANSCEIVERS COMMERCIAL TEMPERATURE RANGE
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
FCT163601 FCT163601A
Symbol Parameter Condition
fMAX CLKAB or CLKBA frequency
tPLH
Propagation Delay Ax to Bx or Bx to Ax
tPHL tPLH
Propagation Delay LEBA to Ax, LEAB to Bx
tPHL tPLH
Propagation Delay CLKBA to Ax, CLKAB to Bx
tPHL tPZH
Output Enable Time
OEBA
to Ax,
OEAB
OEAB
to Bx
to Bx
tPZL
tPHZ
Output Disable Time
OEBA
tPLZ
to Ax,
(4)
CL = 50pF 100 150 MHz
RL = 500 1.5 6.5 1.5 5.5 ns
(1)
tSU Set-up Time, HIGH or LOW
Ax to CLKAB, Bx to CLKBA
tH Hold Time HIGH or LOW
Ax to CLKAB, Bx to CLKBA
tSU Set-up Time
HIGH or LOW Ax to LEAB, Bx to LEBA
tSU Set-up Time,
CLKEN
Clock LOW Clock HIGH
to CLK 3.0 2.5 ns
tH Hold Time, HIGH or LOW
Ax to LEAB, Bx to LEBA
tH Hold Time,
CKLEN
after CLK 0 0 ns
tW LEAB or LEBA Pulse Width
(4)
HIGH
tW CLKAB or CLKBA Pulse Width
HIGH or LOW
tSK(o) Output Skew
NOTES: 3251 tbl 07
1. See test circuit and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
3. Skew between any two outputs of the same package switching in the same direction. This parameter is guaranteed by design.
4. This parameter is guaranteed but not tested.
(4)
(3)
Min.
(2)
Max. Min.
(2)
Max. Unit
1.5 7.2 1.5 6.2 ns
1.5 7.3 1.5 6.3 ns
1.5 7.5 1.5 6.5 ns
1.5 6.5 1.5 5.2 ns
4.0 3.0 ns
0—0—ns
2.5 2.5 ns
2.0 2.0 ns
1.5 1.0 ns
3.0 2.5 ns
3.0 3.0 ns
0.5 0.5 ns
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IDT74FCT163601/A
3.3V CMOS 18-BIT UNIVERSAL BUS TRANSCEIVERS COMMERCIAL TEMPERATURE RANGE
TEST CIRCUITS AND WAVEFORMS TEST CIRCUITS FOR ALL OUTPUTS
V
CC
V
OUT
50pF
C
L
Pulse
Generator
V IN
D.U.T.
R T
500
500
3251 lnk 04
SWITCH POSITION
6V
Open
GND
Disable High
All Other tests Open
DEFINITIONS:
L= Load capacitance: includes jig and probe capacitance.
C R
T = Termination resistance: should be equal to ZOUT of the Pulse
Generator.
Test Switch
Open Drain
Disable Low
Enable Low
Enable High
SET-UP, HOLD AND RELEASE TIMES PULSE WIDTH
3V
1.5V 0V
3251 lnk 05
3V
1.5V 0V
3V
1.5V 0V
3V
1.5V
0V
LOW-HIGH-LOW
PULSE
HIGH-LOW-HIGH
PULSE
DATA
INPUT
TIMING
INPUT
ASYNCHRONOUS CONTROL
PRESET
CLEAR
ETC.
SYNCHRONOUS CONTROL
PRESET
CLEAR
CLOCK ENABLE
ETC.
tSU
tSU
tH
tREM
tH
6V
GND
3251 tbl 08
1.5V
tW
1.5V
3251 lnk 06
SAME PHASE
INPUT TRANSITION
OUTPUT
OPPOSITE PHASE
INPUT TRANSITION
tPLH
tPHL
tPLH tPHL
3V
1.5V 0V
V
OH
1.5V
VOL
3V
1.5V 0V
3251 lnk 07
ENABLE AND DISABLE TIMESPROPAGATION DELAY
ENABLE DISABLE
CONTROL
INPUT
PLZtPZL
t
OUTPUT
NORMALLY
LOW
SWITCH 6V
tPZH tPHZ
OUTPUT
NORMALLY
HIGH
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH.
2. Pulse Generator for All Pulses: Rate 1.0MHz; t
3. If V
CC is below 3V, input voltage swings should be adjusted not to
exceed V
CC.
SWITCH GND
3V
1.5V
1.5V 0V
0.3V
0.3V
F ≤ 2.5ns; tR 2.5ns.
3V
1.5V 0V
3V
VOL
VOH
0V
3251 lnk 08
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IDT74FCT163601/A
3.3V CMOS 18-BIT UNIVERSAL BUS TRANSCEIVERS COMMERCIAL TEMPERATURE RANGE
ORDERING INFORMATION
IDT XX
Temp. Range
FCT
XXXX
Device Type
X
Package
PV PA PF
163601 163601A
74
Shrink Small Outline Package (SO56-1) Thin Shrink Small Outline Package (SO56-2) Thin Very Small Outline Package (SO56-3)
Non-Inverting 18-Bit Registered Transceiver
–40°C to +85°C
5.9 7
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