Datasheet IDT74FCT16H501CTPFB, IDT74FCT16H501CTPF, IDT74FCT16H501CTPAB, IDT74FCT16H501CTPA, IDT74FCT16H501CTEB Datasheet (Integrated Device Technology)

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Integrated Device Technology, Inc.
IDT54/74FCT16501AT/CT/ET
IDT54/74FCT162501AT/CT/ET
IDT54/74FCT162H501AT/CT/ET
FEATURES:
• Common features:
– 0.5 MICRON CMOS Technology
– High-speed, low-power CMOS replacement for
ABT functions
– Typical tSK(o) (Output Skew) < 250ps – Low input and output leakage 1µA (max.)
– ESD > 2000V per MIL-STD-883, Method 3015;
> 200V using machine model (C = 200pF, R = 0)
– Packages include 25 mil pitch SSOP, 19.6 mil pitch
TSSOP, 15.7 mil pitch TVSOP and 25 mil pitch Cerpack
– Extended commercial range of -40°C to +85°C
• Features for FCT16501AT/CT/ET:
– High drive outputs (-32mA I
OH, 64mA IOL)
– Power off disable outputs permit “live insertion” – Typical VOLP (Output Ground Bounce) < 1.0V at
VCC = 5V, TA = 25°C
• Features for FCT162501AT/CT/ET:
– Balanced Output Drivers: ±24mA (commercial),
±16mA (military)
– Reduced system switching noise – Typical VOLP (Output Ground Bounce) < 0.6V at
VCC = 5V,TA = 25°C
• Features for FCT162H501AT/CT/ET:
– Bus Hold retains last active bus state during 3-state – Eliminates the need for external pull up resistors
DESCRIPTION:
The FCT16501AT/CT/ET and FCT162501AT/CT/ET 18-
bit registered transceivers are built using advanced dual metal
FUNCTIONAL BLOCK DIAGRAM
OEAB
CLKBA
LEBA
CMOS technology. These high-speed, low-power 18-bit reg­istered bus transceivers combine D-type latches and D-type flip-flops to allow data flow in transparent, latched and clocked modes. Data flow in each direction is controlled by output­enable (OEAB and
OEBA
), latch enable (LEAB and LEBA) and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the device operates in transparent mode when LEAB is HIGH. When LEAB is LOW, the A data is latched if CLKAB is held at a HIGH or LOW logic level. If LEAB is LOW, the A bus data is stored in the latch/flip-flop on the LOW-to-HIGH transition of CLKAB. OEAB is the output enable for the B port. Data flow from the B port to the A port is similar but requires using
OEBA
LEBA and CLKBA. Flow-through organization of signal pins simplifies layout. All inputs are designed with hysteresis for improved noise margin.
The FCT16501AT/CT/ET are ideally suited for driving high-capacitance loads and low-impedance backplanes. The output buffers are designed with power off disable capability to allow "live insertion" of boards when used as backplane drivers.
The FCT162501AT/CT/ET have balanced output drive with current limiting resistors. This offers low ground bounce, minimal undershoot, and controlled output fall times–reducing the need for external series terminating resistors. The FCT162501AT/CT/ET are plug-in replacements for the FCT16501AT/CT/ET and ABT16501 for on-board bus inter­face applications.
The FCT162H501AT/CT/ET have "Bus Hold" which re­tains the input's last state whenever the input goes to high impedance. This prevents "floating" inputs and eliminates the need for pull-up/down resistors.
,
OEBA
CLKAB
LEAB
C
D
C
D
2547 drw 01
1
B
A1
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
C
D
C
D
TO 17 OTHER CHANNELS
MILITARY AND COMMERCIAL TEMPERATURE RANGES AUGUST 1996
1996 Integrated Device Technology, Inc. 5.10 DSC-2547/8
1
IDT54/74FCT16501AT/CT/ET, 162501AT/CT/ET, 162H501AT/CT/ET FAST CMOS 18-BIT REGISTERED TRANSCEIVER MILITARY AND COMMERCIAL TEMPERATURE RANGES
PIN CONFIGURATIONS
OEAB
LEAB
A
GND
A A3
VCC
A4 A5 A
GND
A7 A8
A9 A A11 A12
GND
A13 A14 A
VCC
A16 A
GND
A18
OEBA
LEBA
1 2 3
1
4 5
2
6 7 8 9 10
6
11 12 13 14
SO56-1 SO56-2
10
15
SO56-3 16 17 18 19 20
15
21 22 23
17
24
26 27 28
56 55 54 53 52 51 50 49
48
47 46 45 44
43
42 41 40 39 38 37 36 35 34 33 3225 31 30 29
GND CLKAB B1 GND B
2
B3 VCC B
4
B5 B6 GND B7 B8 B9 B10 B11
12
B GND B13 B14 B15 VCC
16
B B17 GND B
18
CLKBA GND
OEAB
LEAB
A
GND
A A3
VCC
A4 A5 A
GND
A7 A8
A9 A A11 A12
GND
A13 A14 A
VCC
A16 A
GND
A18
OEBA
LEBA
1
2
6
10
15
17
1 2 3 4
5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24
26 27 28
E56-1
56 55 54 53
52 51 50 49
48
47 46 45 44
43
42 41 40 39 38 37 36 35 34 33 3225 31 30 29
GND CLKAB B1 GND
B
2
B3 VCC B
4
B5 B6 GND B7 B8 B9 B10 B11 B
12
GND B13 B14 B15 VCC B
16
B17 GND
18
B CLKBA GND
SSOP/
TSSOP/TVSOP
TOP VIEW
2547 drw 02
CERPACK
2547 drw 03
TOP VIEW
5.10 2
IDT54/74FCT16501AT/CT/ET, 162501AT/CT/ET, 162H501AT/CT/ET FAST CMOS 18-BIT REGISTERED TRANSCEIVER MILITARY AND COMMERCIAL TEMPERATURE RANGES
PIN DESCRIPTION
Pin Names Description
OEAB A-to-B Output Enable Input
OEBA
LEAB A-to-B Latch Enable Input LEBA B-to-A Latch Enable Input CLKAB A-to-B Clock Input CLKBA B-to-A Clock Input Ax A-to-B Data Inputs or B-to-A 3-State Outputs Bx B-to-A Data Inputs or A-to-B 3-State Outputs
NOTE:
1. On FCT16xH501T these pins have “Bus Hold”. All other pins are standard inputs, outputs or I/Os.
ABSOLUTE MAXIMUM RATINGS
Symbol Description Max. Unit
(2)
VTERM
(3)
VTERM
TSTG Storage Temperature –65 to +150 °C IOUT DC Output Current –60 to +120 mA
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RAT­INGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
2. All device terminals except FCT162XXXT Output and I/O terminals.
3. Output and I/O terminals for FCT162XXXT.
B-to-A Output Enable Input (Active LOW)
Terminal Voltage with Respect to GND Terminal Voltage with Respect to GND
(1)
(1)
2547 tbl 01
(1)
–0.5 to +7.0 V
–0.5 to
CC +0.5
V
2547 lnk 03
V
FUNCTION TABLE
(1,4)
Inputs Outputs
OEAB LEAB CLKAB Ax Bx
LXX XZ HHX LL HHX HH HLLL HLHH HLL XB HLH XB
NOTES: 2547 tbl 02
1. A-to-B data flow is shown. B-to-A data flow is similar but uses
LEBA, and CLKBA.
2. Output level before the indicated steady-state input conditions were established.
3. Output level before the indicated steady-state input conditions were established, provided that CLKAB was HIGH before LEAB went LOW.
4. H = HIGH Voltage Level L = LOW Voltage Level X = Don't Care Z = High-impedance ↑ = LOW-to-HIGH Transition
(2)
(3)
OEBA
CAPACITANCE (TA = +25°C, f = 1.0MHz)
Symbol Parameter
CIN Input
Capacitance
CI/O I/O
Capacitance
NOTE:
1. This parameter is measured at characterization but not tested.
(1)
Conditions Typ. Max. Unit
VIN = 0V 3.5 6.0 pF
VOUT = 0V 3.5 8.0 pF
2547 lnk 04
,
5.10 3
IDT54/74FCT16501AT/CT/ET, 162501AT/CT/ET, 162H501AT/CT/ET FAST CMOS 18-BIT REGISTERED TRANSCEIVER MILITARY AND COMMERCIAL TEMPERATURE RANGES
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE (STANDARD PARTS)
Following Conditions Apply Unless Otherwise Specified: Commercial: TA = –40°C to +85°C, VCC = 5.0V ± 10%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%
Symbol Parameter Test Conditions
(1)
Min. Typ.
VIH Input HIGH Level Guaranteed Logic HIGH Level 2.0 V VIL Input LOW Level Guaranteed Logic LOW Level 0.8 V II H Input HIGH Current (Input pins)
Input HIGH Current (I/O pins)
II L Input LOW Current (Input pins)
Input LOW Current (I/O pins)
(5)
VCC = Max. VI = VCC ±1 µA
(5)
(5)
VI = GND ±1
(5)
±1
±1 IOZH High Impedance Output Current VCC = Max. VO = 2.7V ±1 µA IOZL (3-State Output pins)
(5)
VO = 0.5V ±1 VIK Clamp Diode Voltage VCC = Min., IIN = –18mA 0.7 1.2 V IOS Short Circuit Current VCC = Max., VO = GND
(3)
–80 140 225 mA VH Input Hysteresis 100 mV ICCL
Quiescent Power Supply Current VCC = Max., VIN = GND or VCC 5 500 µA ICCH ICCZ
(2)
Max. Unit
2547 lnk 05
OUTPUT DRIVE CHARACTERISTICS FOR FCT16501T
Symbol Parameter Test Conditions
IO Output Drive Current VCC = Max., VO = 2.5V
(3)
(1)
Min. Typ.
–50 —–180 mA
VOH Output HIGH Voltage VCC = Min. IOH = –3mA 2.5 3.5 V
VIN = VIH or VIL IOH = –12mA MIL.
VOL Output LOW Voltage VCC = Min.
IN = VIH or VIL
V
IOFF Input/Output Power Off Leakage
(5)
VCC = 0V, VIN or VO 4.5V ±1 µA
OH = –15mA COM'L.
I IOH = –24mA MIL.
OH = –32mA COM'L.
I IOL = 48mA MIL.
OL = 64mA COM'L.
I
2.4 3.5 V
2.0 3.0 V
(4)
0.2 0.55 V
(2)
Max. Unit
2547 lnk 06
OUTPUT DRIVE CHARACTERISTICS FOR FCT162501T
Symbol Parameter Test Conditions
IODL Output LOW Current VCC = 5V, VIN = VIH or VIL, VOUT = 1.5V IODH Output HIGH Current VCC = 5V, VIN = VIH or V IL, VOH Output HIGH Voltage VCC = Min.
V
IN = VIH or VIL
VOL Output LOW Voltage VCC = Min.
V
IN = VIH or VIL
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at Vcc = 5.0V, +25°C ambient.
3. Not more than one output should be tested at one time. Duration of the test should not exceed one second.
4. Duration of the condition can not exceed one second.
5. The test limit for this parameter is ± 5µA at T
A = –55°C.
(1)
(3)
VOUT = 1.5V
(3)
IOH = –16mA MIL. I
OH = –24mA COM'L.
IOL = 16mA MIL. I
OL = 24mA COM'L.
Min. Typ.
60 115 200 mA
–60 –115 –200 mA
2.4 3.3 V
0.3 0.55 V
(2)
Max. Unit
2547 lnk 07
5.10 4
IDT54/74FCT16501AT/CT/ET, 162501AT/CT/ET, 162H501AT/CT/ET FAST CMOS 18-BIT REGISTERED TRANSCEIVER MILITARY AND COMMERCIAL TEMPERATURE RANGES
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE (BUS HOLD)
Following Conditions Apply Unless Otherwise Specified: Commercial: TA = –40°C to +85°C, VCC = 5.0V ± 10%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%
Symbol Parameter Test Conditions
V
IH
V
IL
I
I H
Input HIGH Level Guaranteed Logic HIGH Level 2.0 — Input LOW Level Guaranteed Logic LOW Level 0.8 V
(5)
(5)
VCC = Max. VI = V
Input Standard Input HIGH Standard I/O
(4)
Current
Bus-Hold Input
(1)
CC
Min. Typ.
—— ——
Bus-Hold I/O
I
I L
Input Standard Input LOW Standard I/O
(4)
Current
Bus-Hold Input
(5)
(5)
——
VI = GND
Bus-Hold I/O
I
BHH
I
BHL
I
OZH
I
OZL
V
IK
I
OS
V
H
I
CCL
I
CCH
I
CCZ
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at Vcc = 5.0V, +25°C ambient.
3. Not more than one output should be tested at one time. Duration of the test should not exceed one second.
4. Pins with Bus Hold are identified in the pin description.
5. The test limit for this parameter is ± 5µA at T
6. Does not include Bus Hold I/O pins.
Bus Hold Bus-Hold Input VCC = Min. VI = 2.0V –50 — Sustain
Current
(4)
I
= 0.8V +50
V
High Impedance Output Current VCC = Max. VO = 2.7V — (3-State Output pins) Clamp Diode Voltage VCC = Min., I Short Circuit Current VCC = Max., VO = GND Input Hysteresis Quiescent Power Supply Current VCC = Max., VIN = GND or V
(5,6)
A = –55°C.
IN
= –18mA
VO = 0.5V
(3)
CC
–80–140–225 mA
100 — 5 500
(2)
Max. Unit
±
1
±
1
±
100
±
100
±
1
±
1
±
100
±
100
— —
0.7–1.2 V
±
1
±
1
V
µ
A
µ
A
µ
A
mV
µ
A
2547 lnk 08
5.10 5
IDT54/74FCT16501AT/CT/ET, 162501AT/CT/ET, 162H501AT/CT/ET FAST CMOS 18-BIT REGISTERED TRANSCEIVER MILITARY AND COMMERCIAL TEMPERATURE RANGES
POWER SUPPLY CHARACTERISTICS
Symbol Parameter Test Conditions
CC Quiescent Power Supply VCC = Max. 0.5 1.5 mA
I
Current TTL Inputs HIGH V
ICCD Dynamic Power Supply Current
IN = 3.4V
(4)
VCC = Max., Outputs Open VIN = VCC 75 120 µA/ OEAB =
(3)
OEBA
= V
CC or GND VIN = GND MHz
(1)
Min. Typ.
One Input Toggling 50% Duty Cycle
I
C Total Power Supply Current
(6)
VCC = Max., Outputs Open VIN = VCC 0.8 1.7 mA f
CP = 10MHz (CLKAB) VIN = GND
50% Duty Cycle OEAB =
OEBA
= V
CC
LEAB = GND VIN = 3.4V 1.3 3.2 One Bit Toggling V f
i = 5MHz
IN = GND
50% Duty Cycle V
CC = Max., Outputs Open VIN = VCC 3.8 6.5
fCP = 10MHz (CLKAB) VIN = GND 50% Duty Cycle OEAB =
OEBA
= V
CC
LEAB = GND VIN = 3.4V 8.5 20.8 Eighteen Bits Toggling VIN = GND f
i = 2.5MHz
50% Duty Cycle
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
3. Per TTL driven input (V
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of the I
C = IQUIESCENT + IINPUTS + IDYNAMIC
6. I IC = ICC + ICC DHNT + ICCD (fCPNCP/2 + fiNi)
I
CC = Quiescent Current (ICCL, ICCH and ICCZ)
CC = Power Supply Current for a TTL High Input (VIN = 3.4V)
I D
H = Duty Cycle for TTL Inputs High T = Number of TTL Inputs at DH
N ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL)
CP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
f N
CP = Number of Clock Inputs at fCP
fi = Input Frequency
i = Number of Inputs at fi
N
CC = 5.0V, +25°C ambient.
IN = 3.4V). All other inputs at VCC or GND.
CC formula. These limits are guaranteed but not tested.
(2)
Max. Unit
(5)
(5)
2547 tbl 09
5.10 6
IDT54/74FCT16501AT/CT/ET, 162501AT/CT/ET, 162H501AT/CT/ET FAST CMOS 18-BIT REGISTERED TRANSCEIVER MILITARY AND COMMERCIAL TEMPERATURE RANGES
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
FCT16501AT/162501AT FCT16501CT/162501CT FCT16501ET/162501ET
Com'l. Mil. Com'l. Mil. Com'l. Mil.
(1)
Symbol Parameter Condition
fMAX CLKAB or CLKBA frequency
tPLH
Propagation Delay Ax to Bx or Bx to Ax
tPHL tPLH
Propagation Delay LEBA to Ax, LEAB to Bx
tPHL tPLH
Propagation Delay CLKBA to Ax, CLKAB to Bx
tPHL tPZH
Output Enable Time
OEBA
tPZL
tPHZ
tPLZ
to Ax, OEAB to Bx
Output Disable Time
OEBA
to Ax, OEAB to Bx
(4)
CL = 50pF 150 150 150 150 150 — MHz
RL = 5001.5 5.1 1.5 5.6 1.5 4.6 1.5 4.6 1.5 3.8 ns
tSU Set-up Time, HIGH or LOW
(2)
Min.
Max. Min.
1.5 5.6 1.5 6.0 1.5 5.3 1.5 5.6 1.5 4.2 ns
1.5 5.6 1.5 6.0 1.5 5.3 1.5 5.4 1.5 4.2 ns
1.5 6.0 1.5 6.4 1.5 5.6 1.5 6.0 1.5 4.8 ns
1.5 5.6 1.5 6.0 1.5 5.2 1.5 5.6 1.5 5.2 ns
3.0 3.0 3.0 3.0 2.4 ns
Ax to CLKAB, Bx to CLKBA
tH Hold Time HIGH or LOW
0—0—0—0—0———ns
Ax to CLKAB, Bx to CLKBA
tSU Set-up Time
HIGH or LOW Ax to LEAB, Bx to LEBA
tH Hold Time, HIGH or LOW
Clock LOW Clock HIGH
3.0 3.0 3.0 3.0 2.0 ns
1.5 1.5 1.5 1.5 1.5 ns
1.5 1.5 1.5 1.5 0.5 ns
Ax to LEAB, Bx to LEBA
tW LEAB or LEBA Pulse Width
(4)
HIGH
tW CLKAB or CLKBA Pulse Width
HIGH or LOW
tSK(o) Output Skew
NOTES: 2547 tbl 10
1. See test circuits and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
3. Skew between any two outputs of the same package switching in the same direction. This parameter is guaranteed by design.
4. This parameter is guaranteed but not tested.
(4)
(3)
3.0 3.0 3.0 3.0 3.0 ns
3.0 3.0 3.0 3.0 3.0 ns
0.5 0.5 0.5 0.5 0.5 ns
(2)
Max. Min.
(2)
Max. Min.
(2)
Max. Min.
(2)
Max. Min.
(2)
Max. Unit
5.10 7
IDT54/74FCT16501AT/CT/ET, 162501AT/CT/ET, 162H501AT/CT/ET FAST CMOS 18-BIT REGISTERED TRANSCEIVER MILITARY AND COMMERCIAL TEMPERATURE RANGES
TEST CIRCUITS AND WAVEFORMS TEST CIRCUITS FOR ALL OUTPUTS
V
CC
7.0V
SWITCH POSITION
Test Switch
Open Drain Disable Low
Enable Low
All Other Tests
Generator.
Pulse
Generator
500
V
V
IN
OUT
D.U.T.
50pF
500
T
R
C
L
2547 drw 04
DEFINITIONS:
C
L= Load capacitance: includes jig and probe capacitance. T = Termination resistance: should be equal to ZOUT of the Pulse
R
SET-UP, HOLD AND RELEASE TIMES PULSE WIDTH
DATA
INPUT
TIMING
INPUT
ASYNCHRONOUS CONTROL
PRESET
CLEAR
ETC.
SYNCHRONOUS CONTROL
PRESET
CLEAR
CLOCK ENABLE
ETC.
t
t
REM
H
t
H
t
SU
t
SU
3V
1.5V 0V
3V
1.5V 0V
3V
1.5V 0V
3V
1.5V 0V
2547 drw 05
LOW-HIGH-LOW
PULSE
HIGH-LOW-HIGH
PULSE
Closed
Open
2547 lnk 11
1.5V
t
W
1.5V
2547 drw 06
SAME PHASE
INPUT TRANSITION
OUTPUT
OPPOSITE PHASE
INPUT TRANSITION
t
PLH
t
PLH
t
t
PHL
PHL
3V
1.5V 0V
V
OH
1.5V
V
OL
3V
1.5V 0V
2547 drw 07
ENABLE AND DISABLE TIMESPROPAGATION DELAY
ENABLE DISABLE
3V
CONTROL
INPUT
t
PHZ
PLZ
t
F ≤ 2.5ns; tR 2.5ns
t
PZL
OUTPUT
NORMALLY
OUTPUT
NORMALLY
HIGH
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH
2. Pulse Generator for All Pulses: Rate 1.0MHz; t
LOW
SWITCH CLOSED
t
PZH
SWITCH OPEN
3.5V
1.5V
1.5V 0V
0.3V
0.3V
1.5V 0V
3.5V
V
V
0V
OL
OH
2547 drw 08
5.10 8
IDT54/74FCT16501AT/CT/ET, 162501AT/CT/ET, 162H501AT/CT/ET FAST CMOS 18-BIT REGISTERED TRANSCEIVER MILITARY AND COMMERCIAL TEMPERATURE RANGES
ORDERING INFORMATION
X
IDT
Temperature
Range
FCT
X
Drive
X
Bus Hold
XXXX
Device TypeXPackageXProcess
Blank B
PV PA PF E
501AT 501CT 501ET
Blank H
16 162
54 74
Commercial MIL-STD-883, Class B
Shrink Small Outline Package (SO56-1) Thin Shrink Small Outline Package (SO56-2) Thin Very Small Outline Package (SO56-3) CERPACK (E56-1)
Non-Inverting 18-Bit Registered Transceiver
Standard Bus Hold
16-Bit High Drive 16-Bit Balanced Drive
–55°C to +125°C –40°C to +85°C
2547 drw 09
5.10 9
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