IDT7134SA/LA
High-Speed 4K x 8 Dual-Port Static SRAM Military, Industrial and Commercial Temperature Ranges
Description
The IDT7134 is a high-speed 4K x 8 Dual-Port Static RAM
designed to be used in systems where on-chip hardware port arbitration
is not needed. This part lends itself to those systems which cannot
tolerate wait states or are designed to be able to externally arbitrate or
withstand contention when both sides simultaneously access the
same Dual-Port RAM location.
The IDT7134 provides two independent ports with separate control,
address, and I/O pins that permit independent, asynchronous access
for reads or writes to any location in memory. It is the user’s responsibility
to ensure data integrity when simultaneously accessing the same
memory location from both ports. An automatic power down feature,
controlled by CE, permits the on-chip circuitry of each port to enter a very
low standby power mode.
Fabricated using IDT’s CMOS high-performance technology, these
Dual-Ports typically operate on only 700mW of power. Low-power (LA)
versions offer battery backup data retention capability, with each port
typically consuming 200µW from a 2V battery.
The IDT7134 is packaged on either a sidebraze or plastic 48-pin
DIP, 48-pin LCC, 52-pin PLCC and 48-pin Flatpack. Military grade
product is manufactured in compliance with the latest revision of MILPRF-38535 QML, making it ideally suited to military temperature
applications demanding the highest level of performance and reliability.
Pin Configurations
CE
L
148
R/W
A
A
OE
A
A
A
A
A
A
A
A
A
A
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
GND
11L
10L
0L
1L
2L
3L
4L
5L
6L
7L
8L
9L
L
L
0L
1L
2L
3L
4L
5L
6L
7L
2
3
4
5
6
7
8
IDT7134P or C
P48-1
9
10
C48-2
11
12
48-Pin
13
View
14
15
16
17
18
19
20
21
22
23
24
Top
47
46
45
44
43
42
41
(4)
40
&
39
(4)
38
37
36
(5)
35
34
33
32
31
30
29
28
27
26
25
(1,2,3)
CC
V
CE
R/W
A
11R
A
10R
OE
A
0R
A
1R
A
2R
A
3R
A
4R
A
5R
A
6R
A
7R
A
8R
A
9R
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
2720 drw 02
R
7R
6R
5R
4R
3R
2R
1R
0R
L
L
0
8
9
10
11
12
13
14
15
16
17
18
19
20
A
L
4
O
/
I
L
0
A
INDEX
A
I/O
I/O
I/O
I/O
1L
A
2L
A
3L
A
4L
A
5L
A
6L
A
7L
A
8L
A
9L
0L
1L
2L
3L
R
R
,
INDEX
1
0
E
1
1
O
A
A
L
L
L
5
6
7
O
O
O
/
/
/
I
I
I
L
L
L
0
1
E
1
1
O
A
A
L
C
W
/
/
E
N
R
C
234567
1
IDT7134J
J52-1
52-Pin
PLCC
Top View
R
D
C
/
0
N
N
O
/
G
I
L
L
W
E
/
C
R
(4)
L
L
L
R
R
R
C
W
/
E
C
V
C
R
R
C
1
0
/
1
1
N
A
A
474849505152
46
OE
R
45
A
0R
44
A
1R
43
A
2R
42
A
3R
41
A
4R
40
A
5R
39
A
(5)
38
37
36
35
34
33323130292827262524232221
R
R
R
R
R
1
2
3
O
O
O
/
/
/
I
I
I
R
R
C
W
E
/
C
C
R
V
R
4
5
6
O
O
O
/
/
/
I
I
I
R
R
R
1
0
E
1
1
O
A
A
6R
A
7R
A
8R
A
9R
N/C
I/O
2720 drw03
7R
NOTES:
CC pins must be connected to the power supply.
1. All V
2. All GND pins must be connected to the ground supply.
3. P48-1 package body is approximately .55 in x 2.43 in x .18 in.
C48-2 package body is approximately .62 in x 2.43 in x .15 in.
J52-1 package body is approximately .75 in x .75 in x .17 in.
L48-1 package body is approximately .57 in x .57 in x .68 in.
F48-1 package body is approxiamtely .75 in x .75 in x .11 in.
4. This package code is used to reference the package diagram.
5. This text does not indicate orientation of actual part-marking.
65432148 47 46 45 44 43
42
41
40
39
38
37
36
35
34
33
32
31
A
A
A
A
A
A
A
A
A
A
I/O
I/O
0R
1R
2R
3R
4R
5R
6R
7R
8R
9R
,
7R
6R
I/O
I/O
I/O
A
1L
7
A
2L
8
A
3L
9
A
4L
10
A
5L
11
A
6L
12
A
7L
13
A
8L
14
A
9L
15
0L
16
1L
17
2L
18
IDT7134L48 or F
48-Pin LCC/Flatpack
L48-1
&
F48-1
Top View
(4)
(4)
(5)
19 20 21 22 2325 26 27 28 29 3024
2720 drw 04
L
3
O
/
I
L
L
L
L
5
6
4
O
O
O
/
/
/
I
I
I
R
D
R
7
N
O
/
G
I
R
0
1
2
O
O
O
/
/
/
I
I
I
R
R
R
5
4
3
O
O
O
/
/
/
I
I
I
2
IDT7134SA/LA
High-Speed 4K x 8 Dual-Port Static SRAM Military, Industrial and Commercial Temperature Ranges
Absolute Maximum Ratings
SymbolRatingCommercial
& Ind ust ria l
V
TERM
(2)
Te rminal Vo ltage
-0.5 to +7.0-0.5 to +7.0V
with Re s p ec t
to G ND
T
BIAS
Temperature
-55 to +125-65 to +135
Unde r Bias
STG
T
Storage
-65 to +150-65 to +150
Temperature
(3)
T
P
Power
1.51.5W
MilitaryUnit
(1)
Recommended Operating
Temperature and Supply Voltage
Military-55
o
Commercial0
C
Industrial-40
o
C
NOTES:
1. This is the parameter T
GradeAmbient
Temperature
O
C to + 12 5OC0V 5.0V + 10%
O
C to + 70OC0V5.0V
O
C to + 85OC0V 5.0V + 10%
A. This is the "instant on" case temperature.
GNDVcc
+
10%
2720 tbl 03
Dissipation
I
OUT
DC Output
5050mA
Current
NOTES:
27 20 tb l 01
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may
cause permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated in the
operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect reliability.
TERM must not exceed Vcc + 10% for more than 25%of the cycle time or 10 ns
2. V
maximum, and is limited to
TERM = 5.5V.
3. V
Capacitance
SymbolParameterConditions
C
IN
Input CapacitanceVIN = 3dV11pF
< 20mA for the period of VTERM > Vcc +10%.
(1)
(TA = +25°C, f = 1.0MHz)
(2)
Max.Unit
Recommended DC Operating
Conditions
SymbolParameterMin.Typ.Max.Unit
V
CC
Sup pl y Vo ltag e4.55.05.5V
GNDGround000V
IH
Input Hi gh Vo ltage2.2
V
V
IL
Input Lo w Voltag e-0.5
NOTES:
1. V
IL (min.) > -1.5V for pulse width less than 10ns.
TERM must not exceed Vcc + 10%.
2. V
____
(1)
____
(2)
6.0
0.8V
2720 tbl 04
(1,2)
V
C
OUT
Outp ut Ca p aci tanc eV
NOTES:
OUT
= 3dV11pF
2720 tbl 02
1. This parameter is determined by device characterization but is not production
tested.
2. 3dV references the interpolated capacitance when the input and output signals
switch from 0V to 3V and from 3V to 0V.
DC Electrical Characteristics Over the Operating
Temperature and Supply Voltage Range
SymbolParameterTest Conditions
|I
LI
|Input Leakage Current
|I
LO
|Outp ut Le ak age C urren t
Output Lo w Vo ltag e
OL
V
V
OH
Output High VoltageIOH = -4mA2.4
NOTES:
1. At Vcc
< 2.0V input leakages are undefined.
(1)
VCC = 5.5V, VIN = 0V to V
IH
, V
OUT
CE - V
I
OL
= 6mA
I
OL
= 8mA
= 0V to V
(VCC = 5V ± 10%)
CC
CC
___
___
___
___
7134SA7134LA
10
10
0.4
0.5
___
___
___
___
___
2.4
UnitMin.Max.Min.Max.
5µA
5µA
0.4V
0.5V
___
V
2720 t bl 0 5
3
IDT7134SA/LA
High-Speed 4K x 8 Dual-Port Static SRAM Military, Industrial and Commercial Temperature Ranges
1. 'X' in part number indicates power rating (SA or LA).
CC = 5V, TA = +25°C for typical, and parameters are not production tested.
2. V
MAX = 1/tRC = All inputs cycling at f = 1/tRC (except Output Enable). f = 0 means no address or control lines change. Applies only to inputs at CMOS level standby ISB3.
3. f
4
2720 tbl 06b
IDT7134SA/LA
High-Speed 4K x 8 Dual-Port Static SRAM Military, Industrial and Commercial Temperature Ranges
Data Retention Characteristics Over All Temperature Ranges
(LA Version Only) VLC = 0.2V, VHC = VCC - 0.2V
SymbolParameterTest ConditionMin.Typ.
V
DR
I
CCDR
CDR
t
(3)
t
R
(3)
V
CC
fo r Da ta Re ten ti o nVCC = 2V2.0
Data Rete ntio n Current
CE >
V
HC
VIN > VHC or < V
MIL. & IND.
LC
COM'L.
Chip Deselect to Data Rete ntio n Time0
Operation Recovery Timet
___
___
(2)
RC
NOTES:
CC = 2V, TA = +25°C, and are not production tested.
1. V
RC = Read Cycle Time.
2. t
3. This parameter is guaranteed by device characterization, but not production tested.
(1)
Max.Unit
______
1004000
1001500
______
______
2720 tbl 07
Data Retention Waveform
DATARETENTION MODE
V
µA
ns
ns
V
CC
CE
AC T est Conditions
Inp ut Pul se Le v e ls
Inp ut Ris e/ Fal l Time s
Inp ut Timing Re fe re nc e L ev e ls
Outp ut Refe re nc e Le v el s
Outp ut Lo ad
DATA
OUT
775Ω
+5V
t
CDR
V
IH
1250Ω
30pF
GND to 3.0V
5ns
1.5V
1.5V
Fi g ure s 1 and 2
2720 tbl 08
DR
≥ 2V
V
V
DR
4.5V4.5V
t
R
V
IH
2720 drw 05
+5V
1250Ω
OUT
DATA
775Ω
5pF *
2720 drw 06
,
Figure 1. AC Output Test LoadFigure 2. Output Test Load
LZ, tHZ, tWZ, tOW)
(for t
*Including scope and jig
5
2720 drw 07
,
IDT7134SA/LA
High-Speed 4K x 8 Dual-Port Static SRAM Military, Industrial and Commercial Temperature Ranges
AC Electrical Characteristics Over the
Operating Temperature and Supply Voltage
7134X20
Com'l Only
READ CYCLE
t
t
t
t
t
t
t
t
t
RC
AA
ACE
AOE
OH
LZ
HZ
PU
PD
Re ad Cyc l e Ti me20
Address Acce ss Time
Chip Enable Access Time
Output E nab le A cc e s s Tim e
Output Hold from Address Change0
Output Lo w-Z Time
Outp ut Hi g h-Z Tim e
Chip Enable to Po wer Up Time
Chip Disab l e to Po we r Down Tim e
(1,2)
(1,2)
(2)
(2)
____
____
____
0
____
0
____
7134X45
Com'l &
Military
(3)
____
____
____
____
7134X25
Com'l, Ind
& Mil itar y
7134X35
Com'l, Ind
& Military
UnitSymbolParameterMin.Max.Min.Max.Min.Max.
25
20
20
15
____
____
____
0
0
15
____
0
20
____
____
____
____
____
35
25
25
15
____
____
____
0
0
15
____
0
25
____
7134X55
Com'l, Ind
& Military
7134X70
Com'l &
Military
____
35ns
35ns
20ns
____
____
20ns
____
35ns
2 720 tbl 09a
ns
ns
ns
ns
UnitSymbolParameterMin.Max.Min.Max.Min.Max.
READ CYCLE
t
t
t
t
t
t
t
t
t
RC
AA
ACE
AOE
OH
LZ
HZ
PU
PD
Read Cyc le Time45
Address Acce ss Time
Chip Enable Access Time
Output Enable Acce ss Time
Output Hold from Address Change0
Output Low-Z Time
Output High-Z Time
Chip Enabl e to Po we r Up Time
Chi p Disab le to Po we r Down Time
(1,2)
(1,2)
(2)
(2)
____
____
____
5
____
0
____
____
45
45
25
____
____
20
____
45
NOTES:
1. Transition is measured 0mV from Low or High-impedance voltage with the Output Test Load (Figure 2).
2. This parameter is guaranteed by device characterization, but is not production tested.
3. 'X' in part number indicates power rating (SA or LA).
____
____
____
____
____
55
0
5
0
____
____
____
____
70
55
55
30
____
____
____
0
5
25
____
0
50
____
____
70ns
70ns
40ns
____
____
30ns
____
50ns
2720 t bl 0 9b
ns
ns
ns
ns
6
IDT7134SA/LA
t
High-Speed 4K x 8 Dual-Port Static SRAM Military, Industrial and Commercial Temperature Ranges
Timing Waveform of Read Cycle No. 1, Either Side
t
RC
(1,2,4)
ADDRESS
(5)
t
t
OH
AA
t
OH
DATA
OUT
PREVIOUS DATA VALIDDATA VALID
Timing Waveform of Read Cycle No. 2, Either Side
ACE
CE
(4)
t
AOE
OE
(1)
t
LZ
OUT
DATA
(1)
t
t
PU
CURRENT
I
CC
I
SB
NOTES:
1. Timing depends on which signal is asserted last, OE or CE.
2. Timing depends on which signal is de-asserted first, OE or CE.
3. R/W = V
IH.
4. Start of valid data depends on which timing becomes effective, t
5. tAA for RAM Address Access and tSAA for Semaphore Address Access.
LZ
AOE, tACE or tAA
(1,3)
VALID DATA
2720 drw 08
(2)
t
HZ
(2)
t
HZ
(4)
t
PD
50%50%
2720drw 09
7
IDT7134SA/LA
High-Speed 4K x 8 Dual-Port Static SRAM Military, Industrial and Commercial Temperature Ranges
AC Electrical Characteristics Over the
7134X20
Com'l Only
____
0
____
3
____
____
7134X45
Com ' l &
Military
____
3
____
3
____
____
(5)
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
____
7134X25
Com'l, Ind
& Mil itary
25
20
20
0
20
0
15
15
____
0
15
____
3
40
30
____
____
____
____
____
____
____
____
____
____
____
7134X55
Com'l, Ind
& Military
55
50
50
0
50
0
25
20
____
3
20
____
3
70
45
____
____
____
____
____
____
____
____
____
____
____
Operating Temperature and Supply Voltage
SymbolParameter
WRI TE CY CL E
t
WC
EW
t
t
AW
AS
t
WP
t
t
WR
t
DW
HZ
t
t
DH
WZ
t
t
OW
t
WDD
DDD
t
SymbolParameter
WRI TE CY CL E
t
WC
EW
t
t
AW
t
AS
WP
t
t
WR
t
DW
HZ
t
t
DH
WZ
t
t
OW
t
WDD
DDD
t
NOTES:
1. Transition is measured 0mV from Low or High-impedance voltage with Output Test Load (Figure 2).
2. This parameter is guaranteed by device characterization, but is not production tested.
3. The specification for t
temperature, the actual t
4. Port-to-port delay through RAM cells from writing port to reading port, refer to “Timing Waveform of Write with Port-to-Port Read”.
5. 'X' in part number indicates power rating (SA or LA).
DDD = 35ns for military temperature range.
6. t
Write Cy c le Time20
Chip Enab le to E nd-o f-Write15
Address Valid to End-of-Write15
Address Set-up Time0
Write Pulse Width15
Write Recovery Time0
Data Vali d to End -of-Write15
Outp ut Hi g h-Z Tim e
Data Hold Ti m e
Write Enable to Output in High-Z
Output A cti v e fro m E nd -o f-Write
Write Pulse to Data Delay
Write Data Valid to Re ad Data Del ay
(1,2)
(3)
(1,2)
(1, 2,3)
(4)
(4,6)
Write Cy c le Time45
Chip Enab le to E nd-o f-Write40
Address Valid to End-of-Write40
Address Set-up Time0
Write Pulse Width40
Write Recovery Time0
Data Vali d to End -of-Write20
Outp ut Hi g h-Z Tim e
Data Hold Ti m e
Write Enable to Output in High-Z
Output A cti v e fro m E nd -o f-Write
Write Pulse to Data Delay
Write Data Valid to Re ad Data Del ay
DH must be met by the device supplying write data to the RAM under all operating conditions. Although tDH and tOW values will vary over voltage and
DH will always be smaller than the actual tOW.
(1,2)
(3)
(1,2)
(1, 2,3)
(4)
(4,6)
7134X35
Com'l, Ind
& Military
UnitMin.Max.Min.Max.Min.Max.
35
30
30
0
25
0
20
15
____
3
15
____
3
50
30
____
____
____
____
____
____
____
____
____
20ns
____
20ns
____
60ns
35ns
2 720 tbl 10a
ns
ns
ns
ns
ns
ns
ns
ns
ns
7134X70
Com'l &
Military
UnitMin.Max.Min.Max.Min.Max.
70
60
60
0
60
0
30
25
____
3
25
____
3
80
55
____
____
____
____
____
____
____
____
____
30ns
____
30ns
____
90ns
70ns
2720 tbl 10b
ns
ns
ns
ns
ns
ns
ns
ns
ns
8
IDT7134SA/LA
High-Speed 4K x 8 Dual-Port Static SRAM Military, Industrial and Commercial Temperature Ranges
Timing Waveform of Write with Port-to-Port Read
t
WC
ADDR
R/W
"A"
"A"
(1)
MATCH
t
WP
t
DW
(1,2,3)
t
AW
DATA
IN "A"
ADDR
"B"
DATA
OUT "B"
NOTES:
1. Write cycle parameters should be adhered to, in order to ensure proper writing.
L = CER = VIL. OE"B" = VIL.
2. CE
3. Port "A" may be either left or right port. Port "B" is the opposite from port "A".
VALID
t
WDD
MATCH
t
DDD
Timing Waveform of Write Cycle No. 1, R/W Controlled Timing
t
WC
ADDRESS
(6)
t
AS
OE
(3)
t
t
AW
WR
VALID
2720 drw 10
(1,5,8)
CE
t
WP
(2)
(7)
t
HZ
R/W
(7)
t
(4)
WZ
t
DW
t
DH
t
OW
(7)
t
LZ
DATA
OUT
DATA
IN
NOTES:
1. R/W or CE must be HIGH during all address transitions.
2. A write occurs during the overlap (t
WR is measured from the earlier of CE or R/W going to VIH to the end-of-write cycle.
3. t
4. During this period, the I/O pins are in the output state, and input signals must not be applied.
5. If the CE = V
6. Timing depends on which enable signal (CE or R/W) is asserted last.
7. This parameter is guaranteed by device characterization, but is not production tested. Transition is measured 0mV from steady state with the Output Test Load
(Figure 2).
8. If OE = V
for the required t
IL transition occurs simultaneously with or after the R/W = VIL transition, the outputs remain in the High-impedance state.
IL during a R/W controlled write cycle, the write pulse width must be the larger of tWP or (tWZ + tDW) to allow the I/O drivers to turn off data to be placed on the bus
DW. If OE = VIH during an R/W controlled write cycle, this requirement does not apply and the write pulse can be as short as the specified tWP.
EW or tWP) of a CE =VIL and R/W = VIL.
9
(4)
t
HZ
(7)
2720 drw 11
IDT7134SA/LA
1
High-Speed 4K x 8 Dual-Port Static SRAM Military, Industrial and Commercial Temperature Ranges
Timing Waveform of Write Cycle No. 2, CE Controlled Timing
t
WC
(1,4)
ADDRESS
t
AW
CE
(5)
t
AS
(2)
t
EW
t
WR
(3)
R/W
t
DW
DATA
IN
NOTES:
1. R/W or CE must be HIGH during all address transitions.
2. A write occurs during the overlap (t
WR is measured from the earlier of CE or R/W going HIGH to the end-of-write cycle.
3. t
4. If the CE LOW transition occurs simultaneously with or after the R/W LOW transition, the outputs remain in the High-impedance state.
5. Timing depends on which enable signal (CE or R/W) is asserted last.
EW or tWP) of a CE =VIL and R/W = VIL.
t
DH
2720 drw 12
Functional Description
The IDT7134 provides two ports with separate control, address,
and I/O pins that permit independent access for reads or writes to any
location in memory. These devices have an automatic power down
feature controlled by CE. The CE controls on-chip power down circuitry
that permits the respective port to go into standby mode when not
selected (CE HIGH). When a port is enabled, access to the entire
memory array is permitted. Each port has its own Output Enable
control (OE). In the read mode, the port’s OE turns on the output drivers
when set LOW. Non-contention READ/WRITE conditions are illustrated
inTruth Table I.
Truth Table I – Read/Write Control
Left or Right Port
R/W
CEOE
XHXZPort Deselected and in Power-Down
XHXZ
LLXDATAINData o n p o rt w ri tte n in to memo r y
HLLDATA
XXHZHigh impedance o utputs
NOTE:
0L - A11L≠ A0R - A11R
1. A
"H" = VIH, "L" = VIL, "X" = Don’t Care, and "Z" = High Impedance
(1)
D
0-7
Mode, I
R
= CEL = H, P o w er Do wn
CE
Mode I
OUT
Data in memory output on port
SB2
SB1
or I
or I
Function
SB4
SB3
2720 tb l 1
10
IDT7134SA/LA
High-Speed 4K x 8 Dual-Port Static SRAM Military, Industrial and Commercial Temperature Ranges
Ordering Information
IDTXXXXA999AA
Device Type Power Speed PackageProcess/
NOTES:
1. Contact your local sales office for industrial temp. range for other speeds, packages and powers.
2. Green parts available. For specific speeds, packages and powers contact your local sales office.
A
Temperature
Range
Blank
(1)
I
B
(2)
G
P
C
J
L48
F
20
25
35
45
55
70
LA
SA
7134
Commercial(0°Cto+70°C)
Industrial (-40°Cto+85°C)
Military (-55°C to +125°C)
Compliant to MIL-PRF-38535 QML
Commercial Only
Commercial, Industrial & Military
Commercial, Industrial & Military
Commercial & Military
Commercial, Industrial & Military
Commercial & Military
Low Power
Standard Power
32K (4K x 8-Bit) Dual-Port RAM
Datasheet Document History
,
Speed in nanoseconds
2720 drw 13
03/25/99:Initiated datasheet document history
Converted to new format
Cosmetic and typographical corrections
Pages 2Added additional notes to pin configurations
060/9/99:Changed drawing format
10/01/99:Added Industrial Temperature Ranges and removed corresponding notes
11/10/99:Replaced IDT logo
12/22/99:Page 1Made corrections to drawing
03/03/00:Corrected block diagram and pin configurations
Changed ±500mV to 0mV
01/12/00:Pages 1 2Moved "Description to page 2 and adjusted page layout
Page 1Added "LA only)" to paragraph
Page 2Fixed P48-1 package description
Page 3Increased storage temperature parameters
Clarified TA parameter
Page 4DC Electrical parameters–changed wording from "open" to "disabled"
Page 10Fixed Truth Table specification in "Functional Description" paragraph
01/17/06:Page 1Added green availability to features
Page 11Added green indicator to ordering information
Page 1 & 11Replaced old IDTTM with new IDTTM logo
CORPORATE HEADQUARTERSfor SALES:for Tech Support:
6024 Silver Creek Valley Road800-345-7015 or 408-284-8200408-284-2794
San Jose, CA 95138fax: 408-284-2775DualPortHelp@idt.com
www.idt.com
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
11
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