Datasheet IDT70V24L20GI, IDT70V24L20J, IDT70V24L20JI, IDT70V24L20PF, IDT70V24L20PFI Datasheet (Integrated Device Technology Inc)

...
1
©2000 Integrated Device Technology, Inc.
MARCH 2000
DSC-2911/8
I/O
Control
Address Decoder
ARRAY
ARBITRATION
INTERRUPT
SEMAPHORE
LOGIC
Address Decoder
I/O
Control
R/
W
L
UB
L
BUSY
L
A
11L
A
0L
2911 drw 01
LB
L
CE
L
OE
L
I/O8L-I/O
15L
I/O0L-I/O
7L
CE
L
OE
L
R/
W
L
SEM
L
INT
L
M/
S
R/
W
R
UB
R
BUSY
R
LB
R
CE
R
OE
R
I/O8R-I/O
15R
I/O0R-I/O
7R
A
11R
A
0R
R/
W
R
SEM
R
INT
R
CE
R
OE
R
(2)
(1,2)
(1,2)
(2)
12
12
IDT70V24S/LHIGH-SPEED 3.3V 4K x 16 DUAL-PORT STATIC RAM
Features
◆◆
◆◆
True Dual-Ported memory cells which allow simultaneous reads of the same memory location
◆◆
◆◆
High-speed access
– Commercial: 15/20/25/35/55ns (max.) – Industrial: 20/25/35/55ns (max.)
◆◆
◆◆
Low-power operation
– IDT70V24S
Active: 400mW (typ.) Standby: 3.3mW (typ.)
– IDT70V24L
Active: 380mW (typ.) Standby: 660µW (typ.)
◆◆
◆◆
Separate upper-byte and lower-byte control for multiplexed bus compatibility
◆◆
◆◆
IDT70V24 easily expands data bus width to 32 bits or more using the Master/Slave select when cascading more than one device
◆◆
◆◆
M/S = VIH for BUSY output flag on Master M/S = V
IL for BUSY input on Slave
◆◆
◆◆
BUSY and Interrupt Flag
◆◆
◆◆
On-chip port arbitration logic
◆◆
◆◆
Full on-chip hardware support of semaphore signaling between ports
◆◆
◆◆
Fully asynchronous operation from either port
◆◆
◆◆
LVTTL-compatible, single 3.3V (±0.3V) power supply
◆◆
◆◆
Available in 84-pin PGA, 84-pin PLCC and 100-pin TQFP
◆◆
◆◆
Industrial temperature range (-40°C to +85°C) is available for selected speeds
Functional Block Diagram
NOTES:
1. (MASTER): BUSY is output; (SLAVE): BUSY is input.
2. BUSY outputs and INT outputs are non-tri-stated push-pull.
6.42
IDT70V24S/L High-Speed 4K x 16 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
2
Description
The IDT70V24 is a high-speed 4K x 16 Dual-Port Static RAM. The IDT70V24 is designed to be used as a stand-alone 64K-bit Dual-Port RAM or as a combination MASTER/SLAVE Dual-Port RAM for 32-bit-or-more word systems. Using the IDT MASTER/SLAVE Dual-Port RAM approach in 32-bit or wider memory system applications results in full-speed, error­free operation without the need for additional discrete logic.
This device provides two independent ports with separate control, address, and I/O pins that permit independent, asyn-chronous access for
reads or writes to any location in memory. An automatic power down feature controlled by CE permits the on-chip circuitry of each port to enter a very low standby power mode.
Fabricated using IDT’s CMOS high-performance technology,
these devices typically operate on only 400mW of power.
The IDT70V24 is packaged in a ceramic 84-pin PGA, an 84-Pin
PLCC and a 100-pin Thin Quad Flatpack.
Pin Configurations
(1,2,3)
NOTES:
1. All V
CC pins must be connected to power supply.
2. All GND pins must be connected to ground supply.
3. J84-1 package body is approximately 1.15 in x 1.15 in x .17 in.
PN100-1 package body is approximately 14mm x 14mm x 1.4mm.
4. This package code is used to reference the package diagram.
5. This text does not indicate orientation of the actual part-marking.
2911 drw 02
14 15 16 17 18 19 20
INDEX
21 22 23 24
11109876543218483
33 34 35 36 37 38 39 40 41 42 43 44 45
V
CC
GND
I/O
8L
A
7L
13
12
25 26 27 28 29 30 31 32
46 47 48 49 50 51 52 53
72 71 70 69 68 67 66 65 64 63 62
73
74
61 60 59 58 57 56 55 54
82 81 80 79 78 77 76 75
GND
BUSY
L
GND
IDT70V24J
J84-1
(4)
84-Pin PLCC
Top View
(5)
INT
L
M/
S
INT
R
I/O
9L
I/O
10L
I/O
11L
I/O
12L
I/O
13L
I/O
14L
I/O
15L
I/O
0R
I/O
1R
I/O
2R
V
CC
I/O
3R
I/O
4R
I/O
5R
I/O
6R
I/O
7R
I/O
8R
A
6L
A
5L
A
4L
A
3L
A
2L
A
1L
A
0L
BUSY
R
A
0R
A
2R
A
3R
A
4R
A
5R
A
6R
A
1R
I
/
O
7
L
I
/
O
6
L
I
/
O
5
L
I
/
O
4
L
I
/
O
3
L
I
/
O
2
L
V
C
C
R
/
W
L
S
E
M
L
C
E
L
U
B
L
L
B
L
N
/
C
A
1
1
L
G
N
D
I
/
O
1
L
I
/
O
0
L
A
1
0
L
A
9
L
A
8
L
O
E
L
I
/
O
9
R
I
/
O
1
0
R
I
/
O
1
1
R
I
/
O
1
2
R
I
/
O
1
3
R
I
/
O
1
4
R
G
N
D
I
/
O
1
5
R
G
N
D
N
/
C
A
1
1
R
A
1
0
R
A
9
R
A
8
R
A
7
R
O
E
R
R
/
W
R
S
E
M
R
C
E
R
U
B
R
L
B
R
Index
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25
75 74
73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51
26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50
100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 80 79 78 77 76
IDT70V24PF
PN100-1
(4)
100-Pin TQFP
Top View
(5)
N/C N/C N/C N/C
I/O
10L
I/O
11L
I/O
12L
I/O
13L
GND
I/O
14L
I/O
15L
V
CC
GND
I/O
0R
I/O
1R
I/O
2R
I/O
3R
V
CC
I/O
4R
I/O
5R
I/O
6R
N/C N/C N/C N/C
2911 drw 03
N/C N/C N/C N/C A
5L
A
4L
A
3L
A
2L
A
1L
A
0L
INT
L
GND M/
S
BUSY
R
INT
R
A
0R
N/C N/C N/C N/C
BUSY
L
A
1R
A
2R
A
3R
A
4R
I
/
O
9
L
I
/
O
8
L
I
/
O
7
L
I
/
O
6
L
I
/
O
5
L
I
/
O
4
L
I
/
O
3
L
I
/
O
2
L
G
N
D
I
/
O
1
L
I
/
O
0
L
O
E
L
V
C
C
R
/
W
L
S
E
M
L
C
E
L
U
B
L
L
B
L
N
/
C
A
1
1
L
A
1
0
L
A
9
L
A
8
L
A
7
L
A
6
L
I
/
O
7
R
I
/
O
8
R
I
/
O
9
R
I
/
O
1
0
R
I
/
O
1
1
R
I
/
O
1
2
R
I
/
O
1
3
R
I
/
O
1
4
R
G
N
D
I
/
O
1
5
R
O
E
R
R
/
W
R
S
E
M
R
C
E
R
U
B
R
L
B
R
G
N
D
N
/
C
A
1
1
R
A
1
0
R
A
9
R
A
8
R
A
7
R
A
6
R
A
5
R
6.42
IDT70V24S/L High-Speed 4K x 16 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
3
NOTES:
1. All V
CC pins must be connected to power supply.
2. All GND pins must be connected to ground supply.
3. Package body is approximately 1.12 in x 1.12 in x .16 in.
4. This package code is used to reference the package diagram.
5. This text does not indicate orientation of the actual part-marking.
Pin Names
Pin Configurations
(1,2,3)
(con't.)
2911 drw 04
I/O
7L
63 61 60 58 55 54 51 48 46 45
66
67
69
72
75
76
79
81
82
83
12578
11
10
12
14 17 20
23
26
28 29
32 31
33 35
38
41
43
IDT70V24G
G84-3
(4)
84-Pin PGA Top View
(5)
ABCDEFGHJ KL
42
59 56 49 50 40
25
27
30
36
34
37
39
84346915131618
22 24
19 21
68
71
70
77
80
UB
R
CE
R
GND
11
10
09
08
07
06
05
04
03
02
01
64
65
62
57 53 52
47 44
73
74
78
GND
GND
R/
W
R
OERLB
R
GNDGND
SEM
R
N/C
UB
L
CE
L
R/
W
L
OE
L
GND
SEM
L
V
CC
LB
L
INT
R
BUSY
R
BUSY
L
M/
S
I
NT
L
A
11L
N/C
Index
I/O
5L
I/O4LI/O2LI/O
0L
I/O
10L
I/O8LI/O6LI/O3LI/O
1L
I/O
11L
I/O
9L
I/O
13L
I/O
12L
I/O
15L
I/O
14L
I/O
0R
A
9L
A
10L
A
8L
A
7L
A
5L
A
6L
A
4L
A
3L
A
2L
A
0L
A
1L
A
0R
A
2R
A
1R
A
5R
A
3R
A
6R
A
4R
A
9R
A
7R
A
8R
A
10R
A
11R
I/O
1R
I/O
2R
V
CC
I/O
3R
I/O
4R
I/O
5R
I/O
7R
I/O6RI/O
9R
I/O8RI/O
11R
I/O
10R
I/O
12R
I/O
13R
I/O
14R
I/O
15R
V
CC
Left Port Right Port Names
CEL CER
Chip Enable
R/
WL
R/
WR
Read /Write E nable
OEL OER
Output Enab le
A0L - A
11L
A0R - A
11R
Address
I/O0L - I/O
15L
I/O0R - I/O
15R
Data Inp ut/ O utp ut
SEML SEMR
Semaphore Enable
UBL UBR
Upper Byte Select
LBL LBR
Lower Byte Selec t
INT
L
INT
R
Inte rr up t F la g
BUSYL BUSYR
Busy Flag
M/
S
Master or Slave Select
V
CC
Power
GND Ground
2911 tb l 01
6.42
IDT70V24S/L High-Speed 4K x 16 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
4
Truth Table I: Non-Contention Read/Write Control
Truth Table II: Semaphore Read/Write Control
(1)
NOTE:
1. A0L A11L A0R A11R
NOTE:
1. There are eight semaphore flags written to via I/O0 and read from all of the I/O's (I/O0-I/O15). These eight semaphores are addressed by A0-A2.
Inputs
(1)
Outputs
Mode
CE
R/
W
OE UB LB SEM
I/O
8-15
I/O
0-7
H X X X X H High-Z High-Z Des el ec ted : P owe r Down X X X H H H High-Z High-Z Both Bytes Deselected LLXLHHDATA
IN
High-Z Write to Upper Byte Only
L L X H L H High-Z DATA
IN
Wri t e to Lower By te O nl y
LLXLLHDATA
IN
DATA
IN
Write to B oth B yte s
LHLLHHDATA
OUT
High-Z Read Upp e r Byte Only
LHLHLHHigh-ZDATA
OUT
Read Lo we r By te Onl y
LHLLLHDATA
OUT
DATA
OUT
Read Both Bytes
X X H X X X High-Z High-Z Outputs Disabled
2911 t bl 02
Inputs Outputs
Mode
CE
R/
W
OE UB LB SEM
I/O
8-15
I/O
0-7
HHLXXLDATA
OUT
DATA
OUT
Read Data in Semaphore Flag
XHLHHLDATA
OUT
DATA
OUT
Read Data in Semaphore Flag
H
XXXLDATAINDATA
IN
Write D
IN0
into Semaphore Flag
X
XHHLDATAINDATA
IN
Write D
IN0
into Semaphore Flag
LXXLXL
____ ____
Not All owe d
LXXXLL
____ ____
Not All owe d
2911 tb l 03
6.42
IDT70V24S/L High-Speed 4K x 16 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
5
Absolute Maximum Ratings
(1)
Maximum Operating Temperature and Supply Voltage
(1)
Recommended DC Operating Conditions
Capacitance
(TA = +25°C, f = 1.0MHz)
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may
cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
2. V
TERM must not exceed Vcc +0.3V for more than 25% of the cycle time or 10ns
maximum, and is limited to
< 20mA for the period over VTERM > Vcc + 0.3V.
NOTES:
1. This parameter is determined by device characterization but is not production
tested.
2. 3dV references the interpolated capacitance when the input and output signals
switch from 0V to 3V or from 3V to 0V.
NOTES:
1. This is the parameter T
A.
NOTES:
1. V
IL> -1.5V for pulse width less than 10ns.
2. V
TERM must not exceed Vcc + 0.3V.
DC Electrical Characteristics Over the Operating Temperature and Supply Voltage Range
(VCC = 3.3V ± 0.3V)
NOTE:
1. At V
CC < 2.0V input leakages are undefined.
Symbol Rating Commercial
& Industrial
Unit
V
TERM
(2)
Termi nal Vol tage with Re s p e ct to G ND
-0.5 to +4.6 V
T
BIAS
Temperature Und e r Bi as
-55 to +125
o
C
T
STG
Storage Temperature
-55 to +125
o
C
I
OUT
DC Ou tpu t Current
50 mA
2911 tbl 04
Grade Ambient
Temperature
GND Vcc
Commercial 0
O
C to + 70OC0V3.3V
+
0.3V
Industrial -40OC to + 85OC0V3.3V
+
0.3V
29 11 t bl 05
Symbol Parameter Min. Typ. Max. Unit
V
CC
Sup pl y Vo ltage 3.0 3.3 3.6 V
GND Ground 0 0 0 V
V
IH
Input H i g h Vo l t ag e 2.0
____
VCC+0.3
(2)
V
V
IL
Input Lo w Vo ltage -0.3
(1)
____
0.8 V
2911 tbl 06
Symbol Parameter Conditions
(2)
Max . Unit
C
IN
Inpu t Capa c itanc e VIN = 3dV 9 pF
C
OUT
Output Capac itance V
OUT
= 3dV 11 pF
2911 tbl 07
Symbol Parameter Test Conditions
70V24S 70V24L
UnitMin. Max. Min. Max.
|I
LI
| Inp ut Le ak age Curre nt
(1)
VCC = 3. 6V, VIN = 0V to V
CC
___
10
___
A
|I
LO
| Outp ut Leak ag e Cu rrent
CE
= VIH, V
OUT
= 0V to V
CC
___
10
___
A
V
OL
Output Lo w Vol tage IOL = +4mA
___
0.4
___
0.4 V
V
OH
Output Hig h Vo ltag e IOH = -4mA 2.4
___
2.4
___
V
2911 tbl 08
6.42
IDT70V24S/L High-Speed 4K x 16 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
6
DC Electrical Characteristics Over the Operating Temperature and Supply Voltage Range
(1)
(VCC = 3.3V ± 0.3V)
NOTES:
1. 'X' in part number indicates power rating (S or L)
2. V
CC = 3.3V, TA = +25°C, and are not production tested. ICC DC = 115mA (typ.)
3. At f = f
MAX, address and control lines (except Output Enable) are cycling at the maximum frequency read cycle of 1/tRC, and using AC Test Conditions of input levels of GND
to 3V.
4. f = 0 means no address or control lines change.
5. Port "A" may be either left or right port. Port "B" is the opposite from port "A".
70V24X15
Com'l Only
70V24X20
Com'l & Ind
70V24X25
Com'l & Ind
Symbol Parameter Test Condition Version Typ.
(2)
Max. Typ.
(2)
Max. Typ.
(2)
Max. Unit
I
CC
Dynam ic Op e rati ng Current (Both Ports Active)
CE = V
IL
, Outputs Op en
SEM = V
IH
f = f
MAX
(3)
COM'L SL150
140
215 185
140 130
200 175
130 125
190 165
mA
IND S
L
____ ____
____ ____
140 130
225 195
130 125
210 180
I
SB1
Stand b y Curr ent (Both Po rts - TTL Le ve l Inp uts )
CE
R
and CEL = V
IH
SEM
R
= SEML = V
IH
f = f
MAX
(3)
COM'L SL25
20
35 30
20 15
30 25
16 13
3025mA
MIL & IND
S L
____ ____
____ ____
20 15
45 40
16 13
45 40
I
SB2
Stand b y Curr ent (One Po rt - TTL Le ve l Inp uts )
CE
"A"
= VIL and CE
"B"
= V
IH
(5)
Active Port Outputs Open, f=f
MAX
(3)
SEM
R
= SEML = V
IH
COM'L SL8580120
1108075
110 1007572
11095mA
MIL & IND
S L
____ ____
____ ____
8075130
115
7572125
110
I
SB3
Full Standby Current (Both Po rts ­CMO S L e v e l Inp uts )
Both Ports CEL and
CE
R
> VCC - 0.2V,
V
IN
> VCC - 0.2V or
V
IN
< 0.2V, f = 0
(4)
SEM
R
= SEML > VCC-0.2V
COM'L SL1.0
0.252.5
1.0
0.252.5
1.0
0.252.5
mA
MIL & IND
S L
____ ____
____ ____
1.0
0.2
15
5
1.0
0.2
15
5
I
SB4
Full Standby Current (One Port ­CMO S L e v e l Inp uts )
CE
"A"
< 0.2V and
CE
"B"
> VCC - 0. 2V
(5)
SEM
R
= SEML > VCC-0.2V
V
IN
> VCC - 0.2V o r VIN < 0.2V Active Port Outputs Open, f = f
MAX
(3)
COM'L SL8580125
1058075
115 1007570
105
90
mA
MIL & IND
S L
____ ____
____ ____
8075130
1157570
120 105
2911 tbl 09a
70V24X35
Com'l
& Ind
70V24X55
Com'l & Ind
Symbo l Parameter Test Condition Version Typ.
(2)
Max. Typ.
(2)
Max. Unit
I
CC
Dynamic Operating Current (Both P o rts A ctive )
CE = V
IL
, Outputs Open
SEM = V
IH
f = f
MAX
(3)
COM'L SL120
115
180 155
120 115
180 155
mA
IND SL120
115
200 170
120 115
200
170
I
SB1
Standb y Current (Both P o rts - TTL Le ve l Inp uts )
CE
R
and CEL = V
IH
SEM
R
= SEML = V
IH
f = f
MAX
(3)
COM'L SL13
11
25 20
13
11
2520mA
MIL & IND
SL13
11
40 35
13
11
40 35
I
SB2
Standb y Current (One P o rt - TTL Le ve l Inp uts )
CE
"A"
= VIL and CE
"B"
= V
IH
(5)
Active Port Outputs Ope n, f=f
MAX
(3)
SEM
R
= SEML = V
IH
COM'L SL70651009070
65
10090mA
MIL & IND
SL7065120
1057065
120 105
I
SB3
Full Standb y Current (Both P o rts ­CM O S L e v e l Inp u ts )
Both Ports
CE
L
and
CE
R
> VCC - 0.2V,
V
IN
> VCC - 0. 2V or
V
IN
< 0.2V, f = 0
(4)
SEM
R
= SEML > VCC-0.2V
COM'L SL1.0
0.252.5
1.0
0.252.5
mA
MIL & IND
SL1.0
0.2
15
5
1.0
0.2
15
5
I
SB4
Full Standb y Current (One P o rt ­CM O S L e v e l Inp u ts )
CE
"A"
< 0.2V and
CE
"B"
> VCC - 0.2V
(5)
SEM
R
= SEML > VCC-0.2V
V
IN
> VCC - 0. 2V or VIN < 0.2V
Active Port Outputs Ope n, f = f
MAX
(3)
COM'L SL65601008565
60
100
85
mA
MIL & IND
SL6560115
1006560
115 100
2911 tbl 09b
6.42
IDT70V24S/L High-Speed 4K x 16 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
7
AC Test Conditions
Figure 1. AC Output Test Load
(for t
LZ, tHZ, tWZ, tOW)
Figure 2. Output Test Load
(for t
LZ, tHZ, tWZ, tOW)
* Including scope and jig.
Timing of Power-Up Power-Down
2911 drw 06
t
PU
I
CC
I
SB
t
PD
CE
50%
50%
,
Input Pu ls e Le v el s Input Ri se /F all Tim es Input Timi ng R efe re nce Le ve l s Output Re fe renc e Lev e ls Output Load
GND to 3. 0V
3ns M ax .
1.5V
1.5V
Figures 1 and 2
2 9 11 t b l 10
2911 drw 05
590
30pF
435
3.3V
DATA
OUT
BUSY
I
NT
590
5pF*
435
3.3V
DATA
OUT
,
6.42
IDT70V24S/L High-Speed 4K x 16 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
8
AC Electrical Characteristics Over the Operating Temperature and Supply Voltage Range
(4)
NOTES:
1. Transition is measured 0mV from Low or High-impedance voltage with Output Test Load (Figure 2).
2. This parameter is guaranteed by device characterization, but is not production tested.
3. To access RAM, CE = V
IL, UB or LB = VIL, and SEM = VIH. To access semaphore, CE = VIH or UB and LB = VIH, and SEM = VIL.
4. 'X' in part number indicates power rating (S or L).
70V24X15
Com'l Only
70V24X20
Com'l & Ind
70V24X25
Com'l
& Ind
UnitSymbol Parameter Min.Max.Min.Max.Min.Max.
READ CYCLE
t
RC
Read Cy cl e Tim e 15
____
20
____
25
____
ns
t
AA
Address Access Time
____
15
____
20
____
25 ns
t
ACE
Chip Enable Access Time
(3)
____
15
____
20
____
25 ns
t
ABE
Byte Enable Access Time
(3)
____
15
____
20
____
25 ns
t
AOE
Outp ut E nable Access Time
(3)
____
10
____
12
____
13 ns
t
OH
Output Hold from Address Change 3
____
3
____
3
____
ns
t
LZ
Ou t p u t L ow -Z Ti me
(1,2)
3
____
3
____
3
____
ns
t
HZ
Output High-Z Time
(1,2)
____
10
____
12
____
15 ns
t
PU
Chip Enab le to P owe r Up Time
(1,2)
0
____
0
____
0
____
ns
t
PD
Chip Disab le to Po we r Down Time
(1,2)
____
15
____
20
____
25 ns
t
SOP
Semaphore Flag Update Pulse (OE or
SEM
)10
____
10
____
10
____
ns
t
SAA
Semaphore Address Acce ss
(3)
____
15
____
20
____
25 ns
2911 tbl 11a
70V24X35
Com'l & Ind
70V24X55
Com'l
& Ind
UnitSymbol Parameter Min. Max. Min. Max.
READ CYCLE
t
RC
Read Cy cl e Tim e 35
____
55
____
ns
t
AA
Address Access Time
____
35
____
55 ns
t
ACE
Chip Enable Access Time
(3)
____
35
____
55 ns
t
ABE
Byte Enable Access Time
(3)
____
35
____
55 ns
t
AOE
Outp ut E nable Access Time
(3)
____
20
____
30 ns
t
OH
Output Hold from Address Change 3
____
3
____
ns
t
LZ
Ou t p u t L ow -Z Ti me
(1,2)
3
____
3
____
ns
t
HZ
Output High-Z Time
(1,2)
____
15
____
25 ns
t
PU
Chip Enab le to P owe r Up Time
(1,2)
0
____
0
____
ns
t
PD
Chip Disab le to Po we r Down Time
(1,2)
____
35
____
50 ns
t
SOP
Semaphore Flag Update Pulse (OE or
SEM
)15
____
15
____
ns
t
SAA
Semaphore Address Acce ss
(3)
____
35
____
55 ns
2911 tbl 11b
6.42
IDT70V24S/L High-Speed 4K x 16 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
9
t
RC
R/
W
CE
ADDR
t
AA
OE
UB
,
LB
2911 drw 07
(4)
t
ACE
(4)
t
AOE
(4)
t
ABE
(4)
(1)
t
LZ
t
OH
(2)
t
HZ
(3,4)
t
BDD
DATA
OUT
BUSY
OUT
VALID DATA
(4)
Waveform of Read Cycles
(5)
NOTES:
1. Timing depends on which signal is asserted last, OE, CE, LB, or UB.
2. Timing depends on which signal is de-asserted first CE, OE, LB, or UB.
3. t
BDD delay is required only in cases where opposite port is completing a write operation to the same address location. For simultaneous read operations BUSY has no relation
to valid output data.
4. Start of valid data depends on which timing becomes effective last t
ABE, tAOE, tACE, tAA or tBDD.
5. SEM = V
IH.
6.42
IDT70V24S/L High-Speed 4K x 16 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
10
NOTES:
1. Transition is measured 0mV from Low or High-impedance voltage with Output Test Load (Figure 2).
2. This parameter is guaranteed by device characterization, but is not production tested.
3. To access SRAM, CE = V
IL, UB or LB = VIL, SEM = VIH. To access semaphore, CE = VIH or UB and LB = VIH and SEM = VIL. Either condition must be valid for
the entire t
EW time.
4. The specification for t
DH must be met by the device supplying write data to the SRAM under all operating conditions. Although tDH and tOW values will vary over
voltage and temperature, the actual t
DH will always be smaller than the actual tOW.
5. 'X' in part number indicates power rating (S or L).
AC Electrical Characteristics Over the Operating Temperature and Supply Voltage
(5)
Symbol Parameter
70V24X15
Com'l Only
70V24X20
Com'l & Ind
70V24X25
Com'l & Ind
UnitMin. Max. Min. Max. Min. Max.
WRITE CYCLE
t
WC
Write Cycle Time 15
____
20
____
25
____
ns
t
EW
Chip Enable to End-of-Write
(3)
12
____
15
____
20
____
ns
t
AW
Address Valid to End-of-Write 12
____
15
____
20
____
ns
t
AS
Address Set-up Time
(3)
0
____
0
____
0
____
ns
t
WP
Write Pulse Width 12
____
15
____
20
____
ns
t
WR
Write Recovery Time 0
____
0
____
0
____
ns
t
DW
Data Va li d to En d -o f-W rite 10
____
15
____
15
____
ns
t
HZ
Output High-Z Time
(1,2)
____
10
____
12
____
15 ns
t
DH
Data Hol d Time
(4)
0
____
0
____
0
____
ns
t
WZ
Write Enab l e to Outp ut in Hig h-Z
(1,2)
____
10
____
12
____
15 ns
t
OW
Outp ut Ac ti ve fr o m En d -o f-Wr ite
(1, 2,4)
0
____
0
____
0
____
ns
t
SWRD
SEM
Flag Write to R ead Time
5
____
5
____
5
____
ns
t
SPS
SEM
Flag Contention Window
5
____
5
____
5
____
ns
2911 tbl 12a
Symbol Parameter
70V24X35
Com'l & Ind
70V24X55
Com'l & Ind
UnitMin. Max. Min. Max.
WRITE CYCLE
t
WC
Write Cycle Time 35
____
55
____
ns
t
EW
Chip Enable to End-of-Write
(3)
30
____
45
____
ns
t
AW
Address Valid to End-of-Write 30
____
45
____
ns
t
AS
Address Set-up Time
(3)
0
____
0
____
ns
t
WP
Write Pulse Width 25
____
40
____
ns
t
WR
Write Recovery Time 0
____
0
____
ns
t
DW
Data Va li d to En d -o f-W rite 15
____
30
____
ns
t
HZ
Output High-Z Time
(1,2)
____
15
____
25 ns
t
DH
Data Hol d Time
(4)
0
____
0
____
ns
t
WZ
Write Enab l e to Outp ut in Hig h-Z
(1,2)
____
15
____
25 ns
t
OW
Outp ut Ac ti ve fr o m En d -o f-Wr ite
(1, 2,4)
0
____
0
____
ns
t
SWRD
SEM
Flag Write to R ead Time
5
____
5
____
ns
t
SPS
SEM
Flag Contention Window
5
____
5
____
ns
2911 tbl 12b
6.42
IDT70V24S/L High-Speed 4K x 16 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
11
Timing Waveform of Write Cycle No. 1, R/W Controlled Timing
(1,5,8)
NOTES:
1. R/W or CE or UB & LB must be high during all address transitions.
2. A write occurs during the overlap (t
EW or tWP) of a low UB or LB and a LOW CE and a LOW R/W for memory array writing cycle.
3. t
WR is measured from the earlier of CE or R/W (or SEM or R/W) going HIGH to the end of write cycle.
4. During this period, the I/O pins are in the output state and input signals must not be applied.
5. If the CE or SEM LOW transition occurs simultaneously with or after the R/W LOW transition, the outputs remain in the high-impedance state.
6. Timing depends on which enable signal is asserted last, CE, R/W or byte control.
7. This parameter is guaranteed by device characterization, but is not production tested.Transition is measured 0mV from low or high-impedance voltage with Output Test Load (Figure 2).
8. If OE is LOW during R/W controlled write cycle, the write pulse width must be the larger of t
WP or (tWZ + tDW) to allow the I/O drivers to turn off and data to be placed on the
bus for the required t
DW. If OE is HIGH during an R/W controlled write cycle, this requirement does not apply and the write pulse can be as short as the specified tWP.
9. To access SRAM, CE = V
IL, UB or LB = VIL, SEM = VIH. To access semaphore, CE = VIH or UB and LB = VIH and SEM = VIL. Either condition must be valid for
the entire t
EW time.
R/
W
t
WC
t
HZ
t
AW
t
WR
t
AS
t
WP
DATA
OUT
(2)
t
WZ
t
DW
t
DH
t
OW
OE
ADDRESS
DATA
IN
(6)
(4) (4)
(7)
CEorSEM
2911 drw 08
(9)
CEorSEM
(9)
(7)
(3)
2911 drw 09
t
WC
t
AS
t
WR
t
DW
t
DH
ADDRESS
DATA
IN
R/
W
t
AW
t
EW
UBorLB
(3)
(2)
(6)
CEorSEM
(9)
(9)
Timing Waveform of Write Cycle No. 2, CE, UB, LB Controlled Timing
(1,5)
6.42
IDT70V24S/L High-Speed 4K x 16 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
12
Timing Waveform of Semaphore Read after Write Timing, Either Side
(1)
Timing Waveform of Semaphore Write Contention
(1,3,4)
NOTES:
1. D
0R = D0L = VIL, CER = CEL = VIH, or Both UB & LB = VIH.
2. All timing is the same for left or right port. “A” may be either left or right port. “B” is the opposite port from “A”.
3. This parameter is measured from R/W
"A" or SEM"A" going HIGH to R/W"B" or SEM"B" going HIGH.
4. If t
SPS is not satisfied there is no guarantee which side will be granted the semaphore flag.
NOTES:
1. CE = V
IH or UB & LB = VIH for the duration of the above timing (both write and read cycle).
2. DATA
OUT VALID represents all I/O's (I/O0-I/O15)equal to the semaphore value.
SEM
"A"
2911 drw 11
t
SPS
MATCH
R/W
"A"
MATCH
A
0"A"-A2"A"
SIDE
"A"
(2)
SEM
"B"
R/W
"B"
A
0"B"-A2"B"
SIDE
(2)
"B"
SEM
2911drw 10
t
AW
t
EW
t
SOP
I/O
0
VALID ADDRESS
t
SAA
R/
W
t
WR
t
OH
t
ACE
VALIDADDRESS
DATA
IN
VALID
t
DW
t
WP
t
DH
t
AS
t
SWRD
t
AOE
Read CycleWrite Cycle
A0-A
2
OE
DATA
OUT
VALID
(2)
6.42
IDT70V24S/L High-Speed 4K x 16 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
13
AC Electrical Characteristics Over the Operating Oemperature and Supply Voltage Range
(6)
NOTES:
1. Port-to-port delay through SRAM cells from writing port to reading port, refer to "Timing Waveform of Read With BUSY (M/S = V
IH)" or "Timing Waveform of Write
With Port-To-Port Delay (M/S = V
IL)".
2. To ensure that the earlier of the two ports wins.
3. t
BDD is a calculated parameter and is the greater of 0ns, tWDD – tWP (actual) or tDDD – tDW (actual).
4. To ensure that the write cycle is inhibited during contention.
5. To ensure that a write cycle is completed after contention.
6. 'X' in part number indicates power rating (S or L).
70V24X15
Com' l Ony
70V24X20
Com'l
& Ind
70V24X25
Com'l & Ind
Symbol Parameter Min. Max. Min. Max. Min. Max. Unit
BUSY
TIMING (M/S = VIH)
t
BAA
BUSY
Access Time from Address Match
____
15
____
20
____
20 ns
t
BDA
BUSY
Disable Time from Address Not Matched
____
15
____
20
____
20 ns
t
BAC
BUSY
Ac ce s s Time from Chi p E nab le LOW
____
15
____
20
____
20 ns
t
BDC
BUSY
Disable Time from Chip Enable HIGH
____
15
____
17
____
17 ns
t
APS
Arbitration Priority Set-up Time
(2)
5
____
5
____
5
____
ns
t
BDD
BUSY
Disab l e to Valid Data
(3)
____
18
____
30
____
30 ns
t
WH
Write Hold After
BUSY
(5)
12
____
15
____
17
____
ns
BUSY
TIMING (M/S = VIL)
t
WB
BUSY
Inp ut to W rite
(4)
0
____
0
____
0
____
ns
t
WH
Write Hold After
BUSY
(5)
12
____
15
____
17
____
ns
PORT -TO- PORT DEL AY TI MI NG
t
WDD
Write Pulse to Data Delay
(1)
____
30
____
45
____
50 ns
t
DDD
Write Data Valid to Re a d Da ta Del ay
(1)
____
25
____
35
____
35 ns
2911 tbl 13a
70V24X35
Com'l
& Ind
70V24X55
Com'l
& Ind
Symbol Parameter Min. Max. Min. Max. Unit
BUSY
TIMING (M/S = VIH)
t
BAA
BUSY
Access Time from Address Match
____
20
____
45 ns
t
BDA
BUSY
Disable Time from Address Not Matched
____
20
____
40 ns
t
BAC
BUSY
Acce ss Time from Chip Enable LOW
____
20
____
40 ns
t
BDC
BUSY
Dis able Time fro m Ch ip En ab le HIGH
____
20
____
35 ns
t
APS
Arbitration Priority Set-up Time
(2)
5
____
5
____
ns
t
BDD
BUSY
Disable to Valid Data
(3)
____
35
____
40 ns
t
WH
Write Hold After
BUSY
(5)
25
____
25
____
ns
BUSY
TIMING (M/S = VIL)
t
WB
BUSY
Inp ut to W rite
(4)
0
____
0
____
ns
t
WH
Write Hold After
BUSY
(5)
25
____
25
____
ns
PORT -TO- PORT DE LAY TI MI NG
t
WDD
Write Pulse to Data Delay
(1)
____
60
____
80 ns
t
DDD
Write Data Valid to Read Data Delay
(1)
____
45
____
65 ns
2911 tbl 13b
6.42
IDT70V24S/L High-Speed 4K x 16 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
14
2911 drw 12
t
DW
t
APS
ADDR
"A"
t
WC
DATA
OUT "B"
MATCH
t
WP
R/
W
"A"
DATA
IN "A"
ADDR
"B"
t
DH
VALID
(1)
MATCH
BUSY
"B"
t
BDA
VALID
t
BDD
t
DDD
(3)
t
WDD
t
BAA
Timing Waveform of Read with BUSY
(2,4,5)
(M/S = VIH)
NOTES:
1. To ensure that the earlier of the two ports wins. t
APS is ignored for M/S = VIL (slave).
2. CE
L = CER = VIL.
3. OE = V
IL for the reading port.
4. If M/S = V
IL (slave), BUSY is an input. Then for this example BUSY"A" = VIH and BUSY"B" input is shown above.
5. All timing is the same for both left and right ports. Port "A" may be either the left or right Port. Port "B" is the port opposite from port "A".
6.42
IDT70V24S/L High-Speed 4K x 16 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
15
Timing Waveform of Slave Write (M/S = VIL)
2911 drw 13
R/
W
"A"
BUSY
"B"
t
WP
t
WB
(3)
R/
W
"B"
t
WH
(1)
(2)
NOTES:
1. t
WH must be met for both BUSY input (slave) and output (master).
2. Busy is asserted on port "B" blocking R/W
"B", until BUSY"B" goes HIGH.
3. t
WB is only for the “slave” version.
Waveform of BUSY Arbitration Controlled by CE Timing
(1)
(M/S = VIH)
Waveform of BUSY Arbitration Cycle Controlled by Address Match Timing
(1)
(M/S = VIH)
NOTES:
1. All timing is the same for left and right ports. Port “A” may be either the left or right port. Port “B” is the port opposite from “A”.
2. If t
APS is not satisfied, the BUSY signal will be asserted on one side or another but there is no guarantee on which side BUSY will be asserted.
2911 drw 14
ADDR
"A"
and
"B"
ADDRESSES MATCH
CE
"A"
CE
"B"
BUSY
"B"
t
APS
t
BAC
t
BDC
(2)
2911 drw 15
ADDR
"A"
ADDRESS "N"
ADDR
"B"
BUSY
"B"
t
APS
t
BAA
t
BDA
(2)
MATCHING ADDRESS "N"
6.42
IDT70V24S/L High-Speed 4K x 16 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
16
AC Electrical Characteristics Over the Operating Temperature and Supply Voltage Range
(1)
NOTES:
1. 'X' in part number indicates power rating (S or L).
70V24X15
Com 'l On l y
70V24X20
Com'l
& Ind
70V24X25
Com'l
& Ind
Symbol Parameter Min.Max.Min.Max.Min.Max.Unit
INTERRUPT TIMI NG
t
AS
Address Set-up Time 0
____
0
____
0
____
ns
t
WR
Write Re cove ry Time 0
____
0
____
0
____
ns
t
INS
Interrup t Se t Time
____
15
____
20
____
20 ns
t
INR
Inte r ru p t Re s e t Ti me
____
15
____
20
____
20 ns
2911 tbl 14a
70V24X35
Com'l
& Ind
70V24X55
Com'l
& Ind
Symbol Parameter Min. Max. Min. Max. Unit
INTERRUPT TIMING
t
AS
Address Set-up Time 0
____
0
____
ns
t
WR
Write Re co v er y Time 0
____
0
____
ns
t
INS
Interrup t Se t Time
____
25
____
40 ns
t
INR
Interrup t Re se t Time
____
25
____
40 ns
2911 tbl 14b
6.42
IDT70V24S/L High-Speed 4K x 16 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
17
Waveform of Interrupt Timing
(1)
NOTES:
1. All timing is the same for left and right ports. Port “A” may be either the left or right port. Port “B” is the port opposite from “A”.
2. See Interrupt Truth Table III.
3. Timing depends on which enable signal (CE or R/W) is asserted last.
4. Timing depends on which enable signal (CE or R/W) is de-asserted first.
2911 drw 16
ADDR
"A"
INTERRUPT SET ADDRESS
CE
"A"
R/
W
"A"
t
AS
t
WC
t
WR
(3) (4)
t
INS
(3)
INT
"B"
(2)
2911 drw 17
ADDR
"B"
INTERRUPTCLEAR ADDRESS
CE
"B"
OE
"B"
t
AS
t
RC
(3)
t
INR
(3)
INT
"B"
(2)
6.42
IDT70V24S/L High-Speed 4K x 16 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
18
Truth Table IV  Address BUSY Arbitration
NOTES:
1. Pins BUSY
L and BUSYR are both outputs when the part is configured as a master. Both are inputs when configured as a slave. BUSY outputs on the IDT70V24 are push
pull, not open drain outputs. On slaves the BUSY input internally inhibits writes.
2. L if the inputs to the opposite port were stable prior to the address and enable inputs of this port. V
IH if the inputs to the opposite port became stable after the address and
enable inputs of this port. If t
APS is not met, either BUSYL or BUSYR = LOW will result. BUSYL and BUSYR outputs cannot be LOW simultaneously.
3. Writes to the left port are internally ignored when BUSY
L outputs are driving LOW regardless of actual logic level on the pin. Writes to the right port are internally ignored when
BUSY
R outputs are driving LOW regardless of actual logic level on the pin.
Truth Table V  Example of Semaphore Procurement Sequence
(1,2,3)
NOTES:
1. This table denotes a sequence of events for only one of the eight semaphores on the IDT70V24.
2. There are eight semaphore flags written to via I/O
0 and read from all I/O's (I/O0-I/O15). These eight semaphores are addressed by A0-A2.
3. CE = V
IH, SEM = VIL to access the semaphores. Refer to the Semaphore Read/Write Control Truth Table.
Truth Table III  Interrupt Flag
(1)
NOTES:
1. Assumes BUSY
L = BUSYR = VIH.
2. If BUSY
L = VIL, then no change.
3. If BUSY
R = VIL, then no change.
Left Po rt Righ t Po rt
FunctionR/
W
L
CE
L
OE
L
A
11L-A0L
INT
L
R/
W
R
CE
R
OE
R
A
11R-A0R
INT
R
L LXFFFXXXX X L
(2)
Se t Ri g h t
INT
R
Flag
XXXXXXLLFFF H
(3)
Re s e t Ri g ht
INT
R
Flag
XXX X L
(3)
LLXFFE XSet Left
INT
L
Flag
XLLFFE H
(2)
X X X X X Re se t L e ft
INT
L
Flag
2911 tbl 15
Inputs Outputs
Function
CELCE
R
A0L-A
11L
A0R-A
11R
BUSY
L
(1)
BUSY
R
(1)
XXNO MATCH H H Normal HX MATCH H H Normal XH MATCH H H Normal L L MATCH (2) (2) Write Inhib it
(3)
2911 tbl 16
Functions D0 - D15 Left D0 - D15 Righ t Sta tus
No Action 1 1 Semaphore free Left Port Writes "0" to Semaphore 0 1 Left port has semaphore token Right Port Writes "0" to Semaphore 0 1 No change. Right side has no write access to semaphore Left Port Writes "1" to Semaphore 1 0 Right port obtains semaphore token Left Port Writes "0" to Semaphore 1 0 No change. Left port has no write access to semaphore Right Port Writes "1" to Semaphore 0 1 Left port obtains semaphore token Left Port Writes "1" to Semaphore 1 1 Semaphore free Right Port Writes "0" to Semaphore 1 0 Right port has semaphore token Right Port Writes "1" to Semaphore 1 1 Semaphore free Left Port Writes "0" to Semaphore 0 1 Left port has semaphore token Left Port Writes "1" to Semaphore 1 1 Semaphore free
2911 tbl 17
6.42
IDT70V24S/L High-Speed 4K x 16 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
19
Figure 3. Busy and chip enable routing for both width and depth expansion with IDT70V24 SRAMs.
prevented to a port by tying the BUSY pin for that port LOW.
The busy outputs on the IDT 70V24 SRAM in master mode, are push­pull type outputs and do not require pull up resistors to operate. If these RAMs are being expanded in depth, then the BUSY indication for the resulting array requires the use of an external AND gate.
Width Expansion with BUSY Logic Master/Slave Arrays
When expanding an IDT70V24 SRAM array in width while using busy logic, one master part is used to decide which side of the SRAM array will receive a BUSY indication, and to output that indication. Any number of slaves to be addressed in the same address range as the master, use the
BUSY signal as a write inhibit signal. Thus on the IDT70V24 SRAM the BUSY pin is an output if the part is used as a master (M/S pin = V
IH), and
the BUSY pin is an input if the part used as a slave (M/S pin = V
IL) as shown
in Figure 3.
If two or more master parts were used when expanding in width, a split decision could result with one master indicating BUSY on one side of the array and another master indicating BUSY on one other side of the array. This would inhibit the write operations from one port for part of a word and inhibit the write operations from the other port for the other part of the word.
The BUSY arbitration, on a master, is based on the chip enable and address signals only. It ignores whether an access is a read or write. In a master/slave array, both address and chip enable must be valid long enough for a BUSY flag to be output from the master before the actual write pulse can be initiated with either the R/W signal or the byte enables. Failure to observe this timing can result in a glitched internal write inhibit signal and corrupted data in the slave.
Semaphores
The IDT70V24 is an extremely fast Dual-Port 4K x 16 CMOS Static RAM with an additional 8 address locations dedicated to binary semaphore flags. These flags allow either processor on the left or right side of the Dual-Port SRAM to claim a privilege over the other processor for functions defined by the system designers software. As an example, the semaphore can be used by one processor to inhibit the other from accessing a portion of the Dual-Port SRAM or any other shared resource.
2911drw 18
MASTER Dual Port SRAM
BUSY
L
BUSY
R
CE
MASTER Dual Port SRAM
BUSY
L
BUSY
R
CE
SLAVE Dual Port SRAM
BUSY
L
BUSY
R
CE
SLAVE Dual Port SRAM
BUSY
L
BUSY
R
CE
BUSY
L
BUSY
R
D
E
C
O
D
E
R
Functional Description
The IDT70V24 provides two ports with separate control, address and I/O pins that permit independent access to any location in memory. The IDT70V24 has an automatic power down feature controlled by CE. The CE controls on-chip power down circuitry that permits the respec­tive port to go into a standby mode when not selected (CE HIGH). When a port is enabled, access to the entire memory array is permitted.
Interrupts
If the user chooses the interrupt function, a memory location (mail box or message center) is assigned to each port. The left port interrupt flag (INTL) is asserted when the right port writes to memory location FFE (HEX), where a write is defined as the CE=R/W=V
IL per Truth
Table III. The left port clears the interrupt by accessing address location FFE when CER = OER = VIL, R/W is a "don't care". Likewise, the right port interrupt flag (INT
R) is asserted when the left port writes
to memory location FFF (HEX) and to clear the interrupt flag (INT
R),
the right port must read the memory location FFF. The message (16 bits) at FFE or FFF is user-defined, since it is an addressable SRAM location. If the interrupt function is not used, address locations FFE and FFF are not used as mail boxes, but as part of the random access memory. Refer to Truth Table IIII for the interrupt operation.
Busy Logic
Busy Logic provides a hardware indication that both ports of the SRAM have accessed the same location at the same time. It also allows one of the two accesses to proceed and signals the other side that the SRAM is busy. The BUSY pin can then be used to stall the access until the operation on the other side is completed. If a write operation has been attemp-ted from the side that receives a BUSY indication, the write signal is gated internally to prevent the write from proceeding.
The use of BUSY logic is not required or desirable for all applications. In some cases it may be useful to logically OR the BUSY outputs together and use any BUSY indication as an interrupt source to flag the event of an illegal or illogical operation. If the write inhibit function of BUSY logic is not desirable, the BUSY logic can be disabled by placing the part in slave mode with the M/S pin. Once in slave mode the BUSY pin operates solely as a write inhibit input pin. Normal operation can be programmed by tying the BUSY pins HIGH. If desired, unintended write operations can be
6.42
IDT70V24S/L High-Speed 4K x 16 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
20
The Dual-Port SRAM features a fast access time, and both ports are completely independent of each other. This means that the activity on the left port in no way slows the access time of the right port. Both ports are identical in function to standard CMOS Static RAM and can be accessed to, at the same time with the only possible conflict arising from the simultaneous writing of, or a simultaneous READ/WRITE of, a non­semaphore location. Semaphores are protected against such ambiguous situations and may be used by the system program to avoid any conflicts in the non-semaphore portion of the Dual-Port SRAM. These devices have an automatic power-down feature controlled by CE, the Dual-Port SRAM enable, and SEM, the semaphore enable. The CE and SEM pins control on-chip power down circuitry that permits the respective port to go into standby mode when not selected. This is the condition which is shown in Truth Table I where CE and SEM are both HIGH.
Systems which can best use the IDT70V24 contain multiple processors or controllers and are typically very high-speed systems which are software controlled or software intensive. These systems can benefit from a performance increase offered by the IDT70V24's hardware sema­phores, which provide a lockout mechanism without requiring complex programming.
Software handshaking between processors offers the maximum in system flexibility by permitting shared resources to be allocated in varying configurations. The IDT70V24 does not use its semaphore flags to control any resources through hardware, thus allowing the system designer total flexibility in system architecture.
An advantage of using semaphores rather than the more common methods of hardware arbitration is that wait states are never incurred in either processor. This can prove to be a major advantage in very high-speed systems.
How the Semaphore Flags Work
The semaphore logic is a set of eight latches which are indepen­dent of the Dual-Port SRAM. These latches can be used to pass a flag, or token, from one port to the other to indicate that a shared resource is in use. The semaphores provide a hardware assist for a use assignment method called Token Passing Allocation. In this method, the state of a semaphore latch is used as a token indicating that shared resource is in use. If the left processor wants to use this resource, it requests the token by setting the latch. This processor then verifies its success in setting the latch by reading it. If it was successful, it proceeds to assume control over the shared resource. If it was not successful in setting the latch, it determines that the right side processor has set the latch first, has the token and is using the shared resource. The left processor can then either repeatedly request that semaphores status or remove its request for that semaphore to perform another task and occasionally attempt again to gain control of the token via the set and test sequence. Once the right side has relinquished the token, the left side should succeed in gaining control.
The semaphore flags are active LOW. A token is requested by writing a zero into a semaphore latch and is released when the same side writes a one to that latch.
The eight semaphore flags reside within the IDT70V24 in a separate memory space from the Dual-Port SRAM. This address space is accessed by placing a LOW input on the SEM pin (which acts as a chip select for the semaphore flags) and using the other control pins (Address, OE, and R/W) as they would be used in accessing a standard
Static RAM. Each of the flags has a unique address which can be accessed by either side through address pins A
0 – A2. When accessing the
semaphores, none of the other address pins has any effect.
When writing to a semaphore, only data pin D
0 is used. If a LOW level
is written into an unused semaphore location, that flag will be set to a zero on that side and a one on the other side (see Truth Table V). That semaphore can now only be modified by the side showing the zero. When a one is written into the same location from the same side, the flag will be set to a one for both sides (unless a semaphore request from the other side is pending) and then can be written to by both sides. The fact that the side which is able to write a zero into a semaphore subsequently locks out writes from the other side is what makes semaphore flags useful in interprocessor communications. (A thorough discussion on the use of this feature follows shortly.) A zero written into the same location from the other side will be stored in the semaphore request latch for that side until the semaphore is freed by the first side.
When a semaphore flag is read, its value is spread into all data bits so that a flag that is a one reads as a one in all data bits and a flag containing a zero reads as all zeros. The read value is latched into one sides output register when that side's semaphore select (SEM) and output enable (OE) signals go active. This serves to disallow the semaphore from changing state in the middle of a read cycle due to a write cycle from the other side. Because of this latch, a repeated read of a semaphore in a test loop must cause either signal (SEM or OE) to go inactive or the output will never change.
A sequence WRITE/READ must be used by the semaphore in order to guarantee that no system level contention will occur. A processor requests access to shared resources by attempting to write a zero into a semaphore location. If the semaphore is already in use, the semaphore request latch will contain a zero, yet the semaphore flag will appear as one, a fact which the processor will verify by the subsequent read (see Truth Table V). As an example, assume a processor writes a zero to the left port at a free semaphore location. On a subsequent read, the processor will verify that it has written success­fully to that location and will assume control over the resource in question. Meanwhile, if a processor on the right side attempts to write a zero to the same semaphore flag it will fail, as will be verified by the fact that a one will be read from that semaphore on the right side during subsequent read. Had a sequence of READ/WRITE been used instead, system contention problems could have occurred during the gap between the read and write cycles.
It is important to note that a failed semaphore request must be followed by either repeated reads or by writing a one into the same location. The reason for this is easily understood by looking at the simple logic diagram of the semaphore flag in Figure 4. Two sema­phore request latches feed into a semaphore flag. Whichever latch is first to present a zero to the semaphore flag will force its side of the semaphore flag LOW and the other side HIGH. This condition will continue until a one is written to the same semaphore request latch. Should the other sides semaphore request latch have been written to a zero in the meantime, the semaphore flag will flip over to the other side as soon as a one is written into the first sides request latch. The second sides flag will now stay LOW until its semaphore request latch is written to a one. From this it is easy to understand that, if a semaphore is requested and the processor which requested it no longer needs the resource, the entire system can hang up until a one is written into that semaphore request
6.42
IDT70V24S/L High-Speed 4K x 16 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
21
latch.
The critical case of semaphore timing is when both sides request a single token by attempting to write a zero into it at the same time. The semaphore logic is specially designed to resolve this problem. If simultaneous requests are made, the logic guarantees that only one side receives the token. If one side is earlier than the other in making the request, the first side to make the request will receive the token. If both requests arrive at the same time, the assignment will be arbitrarily made to one port or the other.
One caution that should be noted when using semaphores is that semaphores alone do not guarantee that access to a resource is secure. As with any powerful programming technique, if semaphores are misused or misinterpreted, a software error can easily happen.
Initialization of the semaphores is not automatic and must be handled via the initialization program at power-up. Since any sema­phore request flag which contains a zero must be reset to a one, all semaphores on both sides should have a one written into them at initialization from both sides to assure that they will be free when needed.
Using SemaphoresSome Examples
Perhaps the simplest application of semaphores is their applica­tion as resource markers for the IDT70V24s Dual-Port SRAM. Say the 4K x 16 SRAM was to be divided into two 2K x 16 blocks which were to be dedicated at any one time to servicing either the left or right port. Semaphore 0 could be used to indicate the side which would control the lower section of memory, and Semaphore 1 could be defined as the indicator for the upper section of memory.
To take a resource, in this example the lower 2K of Dual-Port SRAM, the processor on the left port could write and then read a zero in to Semaphore 0. If this task were successfully completed (a zero was read back rather than a one), the left processor would assume control of the lower 2K. Meanwhile the right processor was attempting to gain control of the resource after the left processor, it would read back a one in response to the zero it had attempted to write into Semaphore 0. At this point, the software could choose to try and gain control of the second 2K section by writing, then reading a zero into Semaphore
1. If it succeeded in gaining control, it would lock out the left side.
Once the left side was finished with its task, it would write a one to Semaphore 0 and may then try to gain access to Semaphore 1. If Semaphore 1 was still occupied by the right side, the left side could undo its semaphore request and perform other tasks until it was able to write, then read a zero into Semaphore 1. If the right processor performs a similar task with Semaphore 0, this protocol would allow the two processors to swap 2K blocks of Dual-Port SRAM with each other.
The blocks do not have to be any particular size and can even be variable, depending upon the complexity of the software using the semaphore flags. All eight semaphores could be used to divide the Dual-Port SRAM or other shared resources into eight parts. Sema­phores can even be assigned different meanings on different sides rather than being given a common meaning as was shown in the example above.
Semaphores are a useful form of arbitration in systems like disk interfaces where the CPU must be locked out of a section of memory during a transfer and the I/O device cannot tolerate any wait states. With the use of semaphores, once the two devices has determined which memory area was off-limits to the CPU, both the CPU and the I/O devices could access their assigned portions of memory continu­ously without any wait states.
Semaphores are also useful in applications where no memory WAIT state is available on one or both sides. Once a semaphore handshake has been performed, both processors can access their assigned SRAM segments at full speed.
Another application is in the area of complex data structures. In this case, block arbitration is very important. For this application one processor may be responsible for building and updating a data structure. The other processor then reads and interprets that data structure. If the interpreting processor reads an incomplete data structure, a major error condition may exist. Therefore, some sort of arbitration must be used between the two different processors. The building processor arbitrates for the block, locks it and then is able to go in and update the data structure. When the update is completed, the data structure block is released. This allows the interpreting processor to come back and read the complete data structure, thereby guaran­teeing a consistent data structure.
D
2911 drw 19
0
D
Q
WRITE
D
0
D
Q
WRITE
SEMAPHORE
REQUEST FLIP FLOP
SEMAPHORE
REQUESTFLIP FLOP
LPORT
RPORT
SEMAPHORE
READ
SEMAPHORE READ
,
Figure 4. IDT70V24 Semaphore Logic
6.42
IDT70V24S/L High-Speed 4K x 16 Dual-Port Static RAM Industrial and Commercial Temperature Ranges
22
Ordering Information
2911 drw 20
A
Power
999
SpeedAPackage
A
Process/
Temperature
Range
Blank I
Commerc ial (0°Cto+70°C) Industria l(-40°Cto+85°C)
PF G J
100-pin TQFP (PN100-1) 84-pin PGA (G84-3) 84-pin PLCC (J84-1)
15 20 25 35 55
S L
Standard Power Low Power
XXXXX
Device
Type
64K (4K x 16) 3.3V Dual-Port RAM70V24
IDT
Speed in nanoseconds
Commercial Only Commercial & Industrial Commercial & Industrial Commercial & Industrial Commercial & Industrial
CORPORATE HEADQUARTERS for SALES: for Tech Support:
2975 Stender Way 800-345-7015 or 408-727-6116 831-754-4613 Santa Clara, CA 95054 fax: 408-492-8674 DualPortHelp@idt.com
www.idt.com
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
Datasheet Document History
3/8/99: Initiated datasheet document history
Converted to new format Cosmetic and typographical corrections
Pages 2 and 3 Added additional notes to pin configurations 6/10/99: Changed drawing format 8/1/99: Page 2 TQFP for corrected pinout (no pin 55 was shown) 8/30/99: Page 1 Changed 660mW to 660µW 11/12/99: Replaced IDT logo 3/10/00: Added 15 and 20ns speed grades
Upgraded DC parameters
Added Industrial Temperature information Changed ±200 mV to 0mV in notes
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