IDT70T651/9S Preliminary
High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM Industrial and Commercial Temperature Ranges
Description
The IDT70T651/9 is a high-speed 256/128K x 36 Asynchronous
Dual-Port Static RAM. The IDT70T651/9 is designed to be used as a
stand-alone 9216/4608K-bit Dual-Port RAM or as a combination MASTER/SLAVE Dual-Port RAM for 72-bit-or-more word system. Using the
IDT MASTER/SLAVE Dual-Port RAM approach in 72-bit or wider
memory system applications results in full-speed, error-free operation
without the need for additional discrete logic.
This device provides two independent ports with separate control,
address, and I/O pins that permit independent, asynchronous access for
reads or writes to any location in memory. An automatic power down
feature controlled by the chip enables (either CE
on-chip circuitry of each port to enter a very low standby power mode.
The IDT70T651/9 has a RapidWrite Mode which allows the designer
to perform back-to-back write operations without pulsing the R/W input
each cycle. This is especially significant at the 8 and 10ns cycle times of
the IDT70T651/9, easing design considerations at these high performance levels.
The 70T651/9 can support an operating voltage of either 3.3V or 2.5V
on one or both ports, controlled by the OPT pins. The power supply for
the core of the device (VDD) is at 2.5V.
0 or CE1) permit the
2
IDT70T651/9S Preliminary
High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM Industrial and Commercial Temperature Ranges
Pin Configuration
03/18/03
A2
A1
B1
I/O
C1
I/O
D1
I/O
E1
I/O
F1
I/O
G1
I/O
H1
I/O
J1
I/O
K1
I/O
L1
I/O
M1
I/O
N1
I/O
P1
I/O
R1
I/O
T1
NC
18L
18R
20R
21R
23L
24R
26L
27L
29R
30L
32R
33L
35R
35L
NC
A3
NC
TDI
B3
B2
TDO
NC
C3
C2
V
I/O
19L
D2
D3
I/O
19R
I/O
E2
E3
I/O
21L
I/O
F2
F3
I/O
22R
I/O
G2
G3
I/O
24L
I/O
H3
H2
I/O
I/O
25R
J2
J3
I/O
28R
I/O
K2
K3
I/O
29L
I/O
L3
L2
I/O
I/O
31R
M2
M3
I/O
32L
I/O
N2
N3
I/O
34R
I/O
P2
P3
I/O
34L
TMSP4A
R2
NCR3TRSTR4NC
T2
TCKT3NCT4A
(1,2,3)
SS
20L
22L
23R
25L
26R
27R
28L
30R
31L
33R
A4
A
B4
C4
D4
E4
V
F4
V
G4
V
H4
V
J4
V
K4
V
L4
V
M4
V
N4
17L
NC
A
16L
V
DD
DDQL
DDQL
DDQR
DDQR
DDQL
DDQL
DDQR
DDQR
V
DD
16R
17R
70T651/9BC
BC-256
(5,6)
256-Pin BGA
Top View
A6
A
B6
A
C6
A
D6
V
E6
F6
G6
H6
J6
K6
L6
M6
N6
V
P6
A
R6
A
T6
A
11L
12L
10L
DDQL
V
DD
NC
V
SS
V
SS
V
SS
V
SS
NC
V
DD
DDQR
10R
12R
11R
A7
B7
C7
D7
V
E7
F7
G7
H7
J7
K7
L7
M7
N7
V
P7
R7
T7
A
8L
A
9L
A
7L
DDQR
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
DDQL
A
7R
A
9R
A
8R
A5
(4)
A
14L
B5
A
15L
C5
A
13L
D5
V
DDQL
E5
V
DD
F5
V
DD
G5
V
SS
H5
V
SS
J5
ZZ
R
K5
V
SS
L5
V
DD
M5
V
DD
N5
V
DDQR
P5
A
13R
R5
A
15R
T5
(4)
A
14R
A8
B8
BE
C8
D8
V
E8
F8
G8
H8
J8
K8
L8
M8
N8
V
P8
BE
R8
BE
T8
BE
BE
DDQR
V
V
SS
V
SS
V
SS
V
V
V
V
DDQL
BE
A9
A10
CE
1L
2L
3L
1L
SS
SS
SS
SS
SS
1R
3R
2R
B9
CE
C9
BE
D9
V
E9
F9
G9
H9
J9
K9
L9
M9
N9
V
P9
BE
R9
CE
T9
CE
0L
DDQL
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
DDQR
0R
0R
OE
L
B10
0L
R/W
L
C10
SEM
L
D10
V
DDQL
E10
V
SS
F10
V
SS
G10
V
SS
H10
V
SS
J10
V
SS
K10
V
SS
L10
V
SS
M10
V
SS
N10
V
DDQR
P10
SEM
R
R10
R/W
R
T10
1R
OE
R
A11
INT
B11
NC
C11
BUSY
D11
V
DDQR
E11
V
DD
F11
V
SS
G11
V
SS
H11
V
SS
J11
V
SS
K11
V
SS
L11
V
SS
M11
V
DD
N11
V
DDQL
P11
BUSY
R11
M/S
T11
INT
A12
A13
A14
A
A
2L
A
1L
A
3L
V
DD
DDQR
DDQR
DDQL
DDQL
DDQR
DDQR
DDQL
DDQL
V
DD
A
3R
A
1R
A
2R
B14
NC
C14
OPT
D14
I/O
E14
I/O
F14
I/O
G14
I/O
H14
I/O
J14
I/O
K14
I/O
L14
I/O
M14
I/O
N14
I/O
P14
I/O
R14
OPT
T14
A
0L
L
15R
13L
12R
10L
9R
8R
6R
5L
3R
2L
0L
R
0R
A
5L
L
B12
B13
A
4L
C12
C13
A
6L
L
D12
D13
V
DDQR
E12
E13
V
DD
V
F13
F12
V
DD
V
G13
G12
V
SS
V
H13
H12
V
V
SS
J13
J12
V
ZZ
L
K12
K13
V
SS
V
L12
L13
V
DD
V
M12
M13
V
DD
V
N12
N13
V
DDQL
P12
P13
A
6R
R
R12
R13
A
4R
T12
R
T13
A
5R
A16
A15
NC
B16
B15
I/O
17L
C16
C15
I/O
I/O
17R
D16
D15
I/O
I/O
15L
E16
E15
I/O
I/O
14L
F15
F16
I/O
I/O
13R
G15
G16
I/O
I/O
11L
H16
H15
I/O
IO
9L
J15
J16
I/O
7R
K16
K15
I/O
I/O
6L
L16
L15
I/O
I/O
4R
M16
M15
I/O
3L
N16
N15
I/O
I/O
1R
P16
P15
I/O
0R
R16
R15
NC
T15NCT16
I/O
I/O
I/O
NC
NC
NC
NC
16L
16R
14R
12L
11R
10R
8L
7L
5R
4L
2R
1L
,
NOTES:
DD pins must be connected to 2.5V power supply.
1. All V
DDQ pins must be connected to appropriate power supply: 3.3V if OPT pin for that port is set to VDD (2.5V), and 2.5V if OPT pin for that port is
2. All V
3. All V
4. A
SS (0V).
set to V
SS pins must be connected to ground supply.
17X is a NC for IDT70T659.
5. Package body is approximately 17mm x 17mm x 1.4mm, with 1.0mm ball-pitch.
6. This package code is used to reference the package diagram.
3
5632 drw 02f
,
IDT70T651/9S Preliminary
High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM Industrial and Commercial Temperature Ranges
I/O
I/O
I/O
V
V
I/O
I/O
I/O
I/O
V
V
I/O
I/O
I/O
I/O
V
V
I/O
I/O
I/O
I/O
V
V
V
V
V
V
ZZ
V
I/O
I/O
I/O
I/O
V
V
I/O
I/O
I/O
I/O
V
V
I/O
I/O
I/O
I/O
V
V
I/O
I/O
I/O
I/O
DDQ pins must be connected to appropriate power supply: 3.3V if OPT pin for that port is set to VDD (2.5V) and 2.5V if OPT pin for that port is
2. All V
3. All V
4. A
SS (0V).
set to V
SS pins must be connected to ground.
17X is a NC for IDT70T659.
5. Package body is approximately 28mm x 28mm x 3.5mm.
6. This package code is used to reference the package diagram.
7. 8ns Commercial and 10ns Industrial speed grades are not available in the DR-208 package.
8. This text does not indicate orientation of the actual part-marking.
4
IDT70T651/9S Preliminary
High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM Industrial and Commercial Temperature Ranges
21
I/O
(1,2,3)
18LVSS
(con't.)
TDO
NC
9876543
A
12L
A
A
16L
8L
BE
1L
10
V
11
DD
SEM
INT
L
L
141213
15
A
0L
A4
L
OPT
1716
A
V
SS
I/O
17L
L
Pin Configurations
03/18/03
I/O
19L
A
I/O
20RVSS
B
V
DDQL
C
I/O
22LVSS
D
I/O
23L
E
V
DDQL
F
I/O
26LVSS
G
V
DD
H
V
DDQ L
J
I/O
28RVSS
K
I/O
29R
L
V
DDQL
M
I/O
31LVSS
N
I/O
32R
P
VSSI/O
R
I/O
33R
T
V
SS
U
I/O
19R
I/O
22RVDDQR
I/O
23R
I/O
26R
V
DD
I/O
28LVDDQR
I/O
29L
I/O
32LVDDQR
33L
I/O
34LVDDQL
I/O
35L
I/O
18R
V
DDQ R
I/O
21L
I/O
24LVSS
I/O
25L
V
DDQ R
VSSZZ
I/O
27R
I/O
30RVSS
I/O
31R
I/O
34R
V
DD
I/O
(4)
TDI
A
17L
V
DD
NCI/O
A
15LA11LA7L
I/O
20L
I/O
21R
I/O
24R
I/O
25R
R
V
SS
I/O
27L
I/O
30L
TRST
35R
(4)
A
17R
TCK
NC
TMS
NC
A
15R
A
9L
A
13L
A
10L
A
14L
A
16RA12RA8R
A
13RA9R
A
14RA10R
A
11RA7R
CE
0L
BE
2L
CE
1L
BE
3L
V
DD
BE
0L
70T651/9BF
BF-208
(5,6)
208-Ball
fpBGA
Top View
BE
1R
BE
2R
CE
0
R
CE
1R
BE
3R
V
DD
BE
0R
A5
V
SS
BUSY
V
SS
OE
L
L
1L
L
R/
W
L
NC
A
A
2L
A6
L
V
DD
A
3
L
(7)
A
V
DD
SEM
R
V
SS
BUS Y
R
V
SS
R/
W
R
M/
S
OE
R
INT
A
A
A
4R
R
A
1R
5R
A
2R
6R
A
0R
3R
V
V
SS
V
DD
I/O
17R
V
I/O
I/O
12L
V
SS
I/O
I/O9LV
VDDI/O
ZZ
L
V
I/O
7R
I/O
6R
V
SS
I/O
3R
V
I/O2LI/O
V
SS
V
SS
V
DD
OPTRI/O0LI/O
I/O
I/O
I/O
V
I/O
DDQR
DDQL
DDQL
V
DDQL
DDQL
DDQL
13R
12R
DD
16R
9R
7L
6L
3L
0R
I/O16L
15L
I/O
14L
V
SS
I/O
11L
I/O
10L
VSSI/O
V
SS
I/O8R
V
SS
I/O
5R
I/O
4R
V
SS
I/O1RV
V
SS
I/O
15R
B
V
SS
C
I/O
14R
D
I/O
13L
E
V
DDQR
F
I/O
11R
G
H
10R
V
DDQR
J
V
SS
K
I/O
8L
L
V
DDQR
M
N
I/O
5L
I/O
4L
P
DDQ R
R
I/O
2R
T
1L
U
5632 drw 02e
NOTES:
DD pins must be connected to 2.5V power supply.
1. All V
DDQ pins must be connected to appropriate power supply: 3.3V if OPT pin for that port is set to VDD (2.5V) and 2.5V if OPT pin for that port is
2. All V
3. All V
4. A
SS (0V).
set to V
SS pins must be connected to ground.
17X is a NC for IDT70T659.
5. Package body is approximately 15mm x 15mm x 1.4mm with 0.8mm ball pitch.
6. This package code is used to reference the package diagram.
7. This text does not indicate orientation of the actual part-marking.
5
IDT70T651/9S Preliminary
High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM Industrial and Commercial Temperature Ranges
Pin Names
Left PortRight PortNames
0L
CE
R/W
L
OE
0L
A
0L
I/O
SEM
INT
BUSY
0L
BE
,
L
- A
- I/O
L
L
- BE
CE
L
V
17L
DDQL
OPT
ZZ
1L
(1)
35L
3L
L
CE
0R
,
CE
1R
R/W
R
OE
R
(1)
A0R - A
17R
I/O0R - I/O
35R
SEM
R
INT
R
BUSY
R
BE0R - BE
3R
V
DDQR
L
OPT
ZZ
R
M/SMaster or Slav e Select (Input)
V
DD
SS
V
TDITest Data Inp ut
TDOTes t Data Outp ut
TCKTest Lo gic Cloc k (10MHz) (Input)
TMSTest Mode Select (Input)
TRST
Chip Enables (Input)
Read /Write Enable (Input)
Output Enable (Input)
Address (Input)
Data Inp ut/Outp ut
Semapho re Enable (Inp ut)
Interrup t Fl ag (Output)
Busy Flag (Output)
Byte Enab le s (9-bit bytes) (Input)
Power (I/O Bus) (3.3V or 2.5V)
R
Optio n fo r sele c ting V
Sleep Mode Pin
Power (2.5V)
(2)
(Input)
Ground (0V) (Input)
Reset (Initialize TAP Controller) (Input)
(4)
(Input)
DDQX
(2,3 )
(2)
(Input)
(Input)
(5)
5632 tbl 01
NOTES:
1. Address A
2. V
applying inputs on I/O
3. OPT
If OPT
levels and V
port's I/Os and controls will operate at 2.5V levels and V
17x is a NC for IDT70T659.
DD, OPTX, and VDDQX must be set to appropriate operating levels prior to
X.
X selects the operating voltage levels for the I/Os and controls on that port.
X is set to VDD (2.5V), then that port's I/Os and controls will operate at 3.3V
DDQX must be supplied at 3.3V. If OPTX is set to VSS (0V), then that
DDQX must be supplied
at 2.5V. The OPT pins are independent of one another—both ports can operate
at 3.3V levels, both can operate at 2.5V levels, or either can operate at 3.3V
with the other at 2.5V.
4. The sleep mode pin shuts off all dynamic inputs, except JTAG inputs, when
asserted. OPTx, INTx, M/S and the sleep mode pins themselves (ZZx) are
not affected during sleep mode. It is recommended that boundry scan not be
operated during sleep mode.
5. BUSY is an input as a Slave (M/S=V
IH).
(M/S=V
IL) and an output when it is a Master
6
IDT70T651/9S Preliminary
High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM Industrial and Commercial Temperature Ranges
18-26
(1,2)
Byte 1
I/O
9-1 7
Byte 0
I/O
0-8
MODE
Truth Table I—Read/Write and Enable Control
OESEMCE
1
0
BE3BE2BE1BE
0
R/WZZ
I/O
CE
Byte 3
27-35
Byte 2
I/O
XHHXXXXXXLHigh-ZHigh-ZHigh-ZHigh-ZDeselected–Power Down
XHXLXXXXXLHigh-ZHigh-ZHigh-ZHigh-Z Deselected–Power Down
2. It is possible to read or write any combination of bytes during a given access. A few representative samples have been illustrated here.
Truth Table II – Semaphore Read/Write Control
(1)
Inputs
(2)
CE
R/W
OEBE
3
BE
2
BE
1
BE
0
SEM
HHLLLLLLDATA
H
↑
XXXXL L X DATAINWrite I/O0 into Semaphore Flag
LXXXXXX L
NOTES:
1. There are eight semaphore flags written to I/O
2. CE = L occurs when CE
0 = VIL and CE1 = VIH. CE = H when CE0 = VIH and/or CE1 = VIL.
3. Each byte is controlled by the respective BEn. To read data BEn = V
0 and read from all the I/Os (I/O0-I/O35). These eight semaphore flags are addressed by A0-A2.
IL.
7
Outputs
I/O
1-3 5
OUT
____________
(1)
I/O
DATA
0
OUT
Read Data in Semaphore Flag
Not Allowed
Mode
(3)
5632 tbl 03
IDT70T651/9S Preliminary
High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM Industrial and Commercial Temperature Ranges
Recommended Operating
Temperature and Supply Voltage
Ambi ent
Grade
Commercial0OC to +70OC0V2.5V + 100mV
Industrial-40
NOTE:
1. This is the parameter TA. This is the "instant on" case temperature.
Capacitance
(TA = +25°C, F = 1.0MHZ) PQFP ONLY
SymbolParameterConditions
IN
Input CapacitanceVIN = 3dV8pF
C
(3)
OUT
C
NOTES:
1. These parameters are determined by device characterization, but are not
production tested.
2. 3dV references the interpolated capacitance when the input and output switch
from 0V to 3V or from 3V to 0V.
3. C
Outp ut Cap acitanceV
OUT also references CI/O.
Absolute Maximum Ratings
SymbolRatingCommercial
TE R M
V
(VDD)
(2 )
TE R M
V
(V
DDQ
)
(2)
TER M
V
(INPUTS and I/O' s)
(3)
BIAS
T
T
STG
JN
T
OUT
(Fo r V
DDQ =
I
OUT
(Fo r V
I
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS
may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any other conditions above those
indicated in the operational sections of this specification is not implied. Exposure
to absolute maximum rating conditions for extended periods may affect
reliability.
2. This is a steady-state DC parameter that applies after the power supply has
reached its nominal operating value. Power sequencing is not necessary;
however, the voltage on any Input or I/O pin cannot exceed V
supply ramp up.
3. Ambient Temperature under DC Bias. No AC Conditions. Chip Deselected.
3.3V ) DC Output Curre nt50mA
DDQ =
2.5V ) DC Output Curre nt40mA
TemperatureGNDV
O
C to +85OC0V2.5V + 100mV
(1)
(2)
OUT
= 3dV10.5pF
(1)
& Ind ustri al
V
DD
Terminal Voltag e
with Re spec t to GND
V
DDQ
Te rminal Voltag e
with Re spec t to GND
Input and I/O Terminal
Voltage with Respect to GND
Tempe rature
Under Bias
Storage
Tempe rature
Junc tio n Tempe rature+150
-0.5 to 3.6V
-0.3 to V
DDQ
-0.3 to V
DDQ
-55 to +125
-65 to +150
DDQ during power
(1)
DD
5632 tbl 04
Max.Unit
5632 tbl 08
+ 0.3V
+ 0.3V
5632 tbl 07
Unit
o
o
o
C
C
C
Recommended DC Operating
Conditions with V
SymbolParameterMin.Typ.Max.Unit
DD
Core Supp ly Voltag e2.42.52.6V
V
V
DDQ
I/O Supply Voltage
V
SS
Ground000V
Inp ut Hi gh Vo lltage
(Address, Control &
V
IH
Data I/ O Inputs)
Inp ut Hi gh Vo ltag e
V
IH
JTAG
Input High Voltage -
V
IH
ZZ, OP T, M /S
IL
Inp ut Lo w Voltag e-0.3
V
Input Low Voltage -
V
IL
ZZ, OP T, M /S
NOTES:
IL (min.) = -1.0V for pulse width less than tRC/2 or 5ns, whichever is less.
1. V
IH (max.) = VDDQ + 1.0V for pulse width less than tRC/2 or 5ns, whichever is
2. V
less.
3. To select operation at 2.5V levels on the I/Os and controls of a given port, the
OPT pin for that port must be set to V
supplied as indicated above.
(3)
_
DDQ at 2.5V
(3)
2.42.52.6V
____
1.7
____
1.7
DD
- 0.2V
V
-0.3
____
(1)
____
(1)
____
SS(0V), and VDDQX for that port must be
V
V
V
DDQ
DD
DD
+ 100m V
+ 100m V
(2)
+ 100mV
(2)
(2)
0.7V
0.2V
5632 tb l 05
V
V
V
Recommended DC Operating
Conditions with V
SymbolParameterMin.Typ.Max.Unit
V
DD
Core Sup ply Voltag e2.42. 52. 6V
V
DDQ
I/O Supply Voltage
V
SS
Ground000V
Input Hig h Vo ltag e
(Add re ss , Co ntrol
IH
V
&Data I/O Inp uts )
Input Hig h Vo ltag e
V
IH
JTAG
Input High Voltage -
V
IH
ZZ, O P T, M/S
V
IL
Input Lo w Voltag e-0.3
Input Lo w Vol tag e -
V
IL
ZZ, O P T, M/S
NOTES:
IL (min.) = -1.0V for pulse width less than tRC/2 or 5ns, whichever is less.
1. V
IH (max.) = VDDQ + 1.0V for pulse width less than tRC/2 or 5ns, whichever is
2. V
less.
3. To select operation at 3.3V levels on the I/Os and controls of a given port, the
OPT pin for that port must be set to V
supplied as indicated above.
(3)
(3)
_
DDQ at 3.3V
3.153. 33. 45V
2.0
1.7
DD
- 0.2V
V
-0.3
DD (2.5V), and VDDQX for that port must be
____
V
DDQ
____
V
DD
____
V
DD
(1)
____
(1)
____
(2)
+ 150mV
(2)
+ 100m V
(2)
+ 100m V
0.8V
0.2V
V
V
V
5632 tbl 06
8
IDT70T651/9S Preliminary
High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM Industrial and Commercial Temperature Ranges
DC Electrical Characteristics Over the Operating
Temperature and Supply Voltage Range
SymbolParameterTest Conditions
LI
|Input Le ak age Current
|I
LI
|JTAG & ZZ Input Le akage Current
|I
|I
LO
|Outp ut Leakage Curre nt
OL
(3.3V) Outp ut Lo w Vol tage
V
OH
(3.3V) Output Hig h Voltage
V
OL
(2.5V) Outp ut Lo w Vol tage
V
V
OH
(2.5V) Output Hig h Voltage
NOTES:
DDQ is selectable (3.3V/2.5V) via OPT pins. Refer to page 6 for details.
1. V
2. Applicable only for TMS, TDI and TRST inputs.
3. Outputs tested in tri-state mode.
(1)
(1,3)
(1)
(1)
(1)
(1)
V
DDQ
= Max., VIN = 0V to V
(1,2)
V
DD =
Max., VIN = 0V to V
CE0 = VIH or CE1 = VIL, V
IOL = +4mA, V
IOH = -4mA, V
IOL = +2mA, V
IOH = -2mA, V
DDQ
= Min.
DDQ
= Min.2.4
DDQ
= Min.
DDQ
= Min.2.0
(VDD = 2.5V ± 100mV)
DDQ
DD
OUT
= 0V to V
DDQ
70T651/9S
___
___
___
___
___
10µA
+30µA
10µA
0.4V
___
0.4V
___
5632 tb l 09
UnitMin.Max.
V
V
DC Electrical Characteristics Over the Operating
(3)
Temperature and Supply Voltage Range
SymbolParameterTest ConditionVersionTyp.
DD
Dynamic Operating
I
Current (Both
Ports Active)
(6)
I
SB1
Standb y Current
(Both P orts - TTL
Le ve l Inputs)
(6)
I
SB2
Standb y Current
(One Port - TTL
Le ve l Inputs)
I
SB3
Full Standby Current
(Both P orts - CMOS
Le ve l Inputs)
(6)
I
SB4
Full Standby Current
(One Port - CMOS
Le ve l Inputs)
I
ZZ
Sleep Mode Current
(Both P orts - TTL
Le ve l Inputs)
NOTES:
1. At f = f
MAX, address and control lines (except Output Enable) are cycling at the maximum frequency read cycle of 1/tRC, using "AC TEST CONDITIONS" at input
levels of GND to 3.3V.
2. f = 0 means no address or control lines change. Applies only to input at CMOS level standby.
3. Port "A" may be either left or right port. Port "B" is the opposite from port "A".
DD = 3.3V, TA = 25°C for Typ, and are not production tested. IDD DC(f=0)= 100mA (Typ).
4. V
X = VIL means CE0X = VIL and CE1X = VIH
5. CE
CEX = VIH means CE0X = VIH or CE1X = VIL
CEX < 0.2V means CE0X < 0.2V and CE1X > VDDQX - 0.2V
X > VDDQX - 0.2V means CE0X > VDDQX - 0.2V or CE1X < 0.2V.
CE
"X" represents "L" for left port or "R" for right port.
SB1, ISB2 and ISB4 will all reach full standby levels (ISB3) on the appropriate port(s) if ZZL and /or ZZR = VIH.
6. I
7. 8ns Commercial and 10ns Industrial speed grades are available in BF-208 and BC-256 packages only.
L
and CER= VIL,
CE
Outputs Disabled
(1)
f = f
MAX
L
= CER = V
CE
f = f
MAX
CE
"A"
Active Po rt Outputs Disable d,
f = f
MAX
IH
(1)
= VIL and CE
(1)
"B"
= V
(5)
IH
Both Ports CEL and
CE
R
> VDD - 0.2V, VIN > VDD - 0.2V
or V
IN
< 0.2V, f = 0
"A"
< 0.2V and CE
CE
VIN > VDD - 0.2V or VIN < 0.2V, Ac tiv e
Po rt, Outp uts Dis ab led , f = f
ZZ
L = ZZR = VIH
(1)
f = f
MAX
(2)
"B"
> VDD - 0.2 V
MAX
(1)
COM'LS350475300405300355225305
INDS
COM'LS11514090120751056085
INDS
COM'LS240315200265180230150200
INDS
COM'LS210210210210
INDS
(5)
COM'LS240315200265180230150200
INDS
COM'LS210210210210
INDS
(VDD = 2.5V ± 100mV)
(4)
(7)
70T651/9S10
Max.Typ.
300445300395
9014575130
200290180255
220220
200290180255
220220
70T651/9S8
Com'l Only
________
________
________
________
________
________
Com'l
& Ind
(4)
(7)
Max.Typ.
70T651/9S12
Com'l
& Ind
(4)
Max.Typ.
70T651/9S15
Com'l Only
(4)
Max.Unit
________
________
________
________
________
________
mA
mA
mA
mA
mA
mA
5632 tbl 10
9
IDT70T651/9S Preliminary
,
High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM Industrial and Commercial Temperature Ranges
IDT70T651/9S Preliminary
High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM Industrial and Commercial Temperature Ranges
AC Electrical Characteristics Over the
Operating Temperature and Supply Voltage Range
(5)
70T651/9S10
Com'l
& Ind
____
10
____
8
____
8
____
4
____
4
____
3
____
3
____
0
____
0
____
7
____
4
____
5
SymbolParameter
READ CYCLE
RC
t
t
AA
ACE
t
ABE
t
AOE
t
t
OH
LZ
t
t
LZOB
t
HZ
PU
t
PD
t
SOP
t
t
SAA
SOE
t
Read Cyc le Tim e8
Address Access Time
Chip Enable Ac cess Time
Byte Enable Access Time
(3)
(3)
Outp ut E nab le A cc e ss Time
Output Hold from Address Change3
Output Low-Z Time Chip Enable and Se mapho re
Output Low-Z Time Output Enable and Byte Enable
Output Hig h-Z Time
Chip Enab le to Po we r Up Time
(1,2)
(2)
Chip Disabl e to Powe r Do wn Tim e
Semaphore Flag Update Pulse (OE or SEM)
Semaphore Address Access Time28210212215ns
Semaphore Output Enable Access Time
70T651/9S8
Com'l Only
____
____
____
____
(1,2)
(1,2)
3
0
03.5040608ns
0
(2)
____
____
____
(4)
(5)
70T651/9S12
Com 'l
& Ind
70T651/9S15
Com'l Only
UnitMin.Max.Min.Max.Min.Max.Min.Max.
____
10
10
5
5
____
____
____
____
8
4
5
____
12
____
12
____
12
____
6
____
6
____
3
____
3
____
0
____
0
____
8
____
6
____
6
15
____
____
____
____
3
3
0
0
____
____
____
____
ns
15ns
15ns
7ns
7ns
____
ns
____
ns
____
ns
____
ns
12ns
8ns
7ns
5632tb l 12
AC Electrical Characteristics Over the
Com' l Onl y
6
0
3
4
4
____
____
____
____
____
____
____
____
3.5
____
____
____
(4)
(5)
70T651/9S10
Com 'l
(5)
& Ind
10
7
7
0
7
0
5
0
____
3
5
5
70T651/9S12
Com' l
& Ind
____
____
____
____
____
____
____
____
4
____
____
____
____
12
____
9
____
9
____
0
____
9
____
0
____
7
____
0
____
6
____
3
____
5
____
5
Operating Temperature and Supply Voltage
70T651/9S8
SymbolParameter
WRI T E CYCLE
t
WC
t
EW
t
AW
t
AS
t
WP
t
WR
t
DW
t
DH
t
WZ
t
OW
t
SWRD
t
SPS
NOTES:
1. Transition is measured 0mV from Low or High-impedance voltage with Output Test Load (Figure 1).
2. This parameter is guaranteed by device characterization, but is not production tested.
3. To access RAM, CE= V
CE
4. These values are valid regardless of the power supply level selected for I/O and control signals (3.3V/2.5V). See page 6 for details.
5. 8ns Commercial and 10ns Industrial speed grades are available in BF-208 and BC-256 packages only.
Write Cycle Time8
Chip Enable to End-of-Write
(3)
Address Valid to End-of-Write6
Address Set-up Time
(3)
Write Pulse Width6
Write Recovery Time0
Data Valid to End-of-Write4
Data Ho ld Time0
Write Enable to Output in High-Z
Outp ut Activ e fro m E nd -o f-Write
(1,2)
(1,2)
SEM Flag Write to Read Time
SEM Flag Contention Window
0 = VIL and CE1 = VIH. CE = VIH when CE0 = VIH and/or CE1 = VIL.
IL and SEM = VIH. To access semaphore, CE = VIH and SEM = VIL. Either condition must be valid for the entire tEW time. CE = VIL when
____
70T651/9S15
Com'l Only
15
12
12
0
12
0
10
0
____
3
5
5
UnitMin.Max.Mi n.Max.Min.Max.Min.Max.
____
ns
____
ns
____
ns
____
ns
____
ns
____
ns
____
ns
____
ns
8ns
____
ns
____
ns
____
ns
5632 tbl 13
11
IDT70T651/9S Preliminary
High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM Industrial and Commercial Temperature Ranges
Waveform of Read Cycles
(5)
t
RC
ADDR
(4)
t
AA
(4)
t
CE
(6)
ACE
t
AOE
(4)
OE
(4)
t
ABE
BEn
R/W
t
LZOB
(1)
(4)
(3,4)
t
BDD
AOE, tACE, tAA,tABE or tBDD.
VALID DATA
tLZ/t
DATA
OUT
BUSY
OUT
NOTES:
1. Timing depends on which signal is asserted last, OE, CE or BEn.
2. Timing depends on which signal is de-asserted first CE, OE or BEn.
BDD delay is required only in cases where the opposite port is completing a write operation to the same address location. For simultaneous read operations BUSY
3. t
has no relation to valid output data.
4. Start of valid data depends on which timing becomes effective last t
5. SEM = V
6. CE = L occurs when CE
IH.
0 = VIL and CE1 = VIH. CE = H when CE0 = VIH and/or CE1 = VIL.
OH
(2)
t
HZ
.
5632 drw 06
Timing of Power-Up Power-Down
CE
t
PU
I
CC
I
SB
50%50%
12
t
PD
5632 drw 07
.
IDT70T651/9S Preliminary
High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM Industrial and Commercial Temperature Ranges
Timing Waveform of Write Cycle No. 1, R/W Controlled Timing
t
WC
(1,5,8)
ADDRESS
(7)
t
HZ
OE
t
AW
t
WP
(2)
t
WR
(3)
CE or SEM
BEn
(9)
(9)
(6)
t
AS
R/W
(7)
t
OW
t
DH
DATA
DATA
OUT
(7)
t
WZ
(4)(4)
t
DW
IN
Timing Waveform of Write Cycle No. 2, CE Controlled Timing
t
WC
ADDRESS
t
AW
BEn
R/W
(9)
(6)
t
AS
(9)
(2)
t
EW
t
DW
t
WR
(3)
t
DH
CE or SEM
(1,5,8)
5632 drw 10
.
IN
DATA
5632 drw 11
NOTES:
1. R/W or CE or BEn = V
2. A write occurs during the overlap (t
WR is measured from the earlier of CE, BEn or R/W (or SEM or R/W) going HIGH to the end of write cycle.
3. t
IH during all address transitions for Write Cycles 1 and 2.
EW or tWP) of a CE = VIL, BEn = VIL, and a R/W = VIL for memory array writing cycle.
4. During this period, the I/O pins are in the output state and input signals must not be applied.
5. If the CE or SEM = V
IL transition occurs simultaneously with or after the R/W = VIL transition, the outputs remain in the High-impedance state.
6. Timing depends on which enable signal is asserted last, CE or R/W.
7. This parameter is guaranteed by device characterization, but is not production tested. Transition is measured 0mV from steady state with the Output Test Load
(Figure 1).
8. If OE = V
9. To access RAM, CE = V
IL during R/W controlled write cycle, the write pulse width must be the larger of tWP or (tWZ + tDW) to allow the I/O drivers to turn off and data to be
placed on the bus for the required t
WP.
specified t
DW. If OE = VIH during an R/W controlled write cycle, this requirement does not apply and the write pulse can be as short as the
IL and SEM = VIH. To access semaphore, CE = VIH and SEM = VIL. tEW must be met for either condition. CE = VIL when CE0 = VIL
and CE1 = VIH. CE = VIH when CE0 = VIH and/or CE1 = VIL.
13
.
.
IDT70T651/9S Preliminary
High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM Industrial and Commercial Temperature Ranges
RapidWrite Mode Write Cycle
taken to still meet the Write Cycle time (t
WC), the time in which the Address
inputs must be stable. Input data setup and hold times (tDW and tDH) will
Unlike other vendors' Asynchronous Random Access Memories,
the IDT70T651/9 is capable of performing multiple back-to-back write
operations without having to pulse the R/W, CE, or BEn signals high
during address transitions. This RapidWrite Mode functionality allows the
system designer to achieve optimum back-to-back write cycle performance
without the difficult task of generating narrow reset pulses every cycle,
simplifying system design and reducing time to market.
During this new RapidWrite Mode, the end of the write cycle is now
defined by the ending address transition, instead of the R/W or CE or BEn
transition to the inactive state. R/W, CE, and BEn can be held active
throughout the address transition between write cycles. Care must be
now be referenced to the ending address transition. In this RapidWrite
Mode the I/O will remain in the Input mode for the duration of the operations
due to R/W being held low. All standard Write Cycle specifications must
be adhered to. However, t
AS and tWR are only applicable when switching
between read and write operations. Also, there are two additional
conditions on the Address Inputs that must also be met to ensure correct
address controlled writes. These specifications, the Allowable Address
Skew (t
AAS) and the Address Rise/Fall time (tARF), must be met to use the
RapidWrite Mode. If these conditions are not met there is the potential for
inadvertent write operations at random intermediate locations as the
device transitions between the desired write addresses.
4. The timing represented in this cycle can be repeated multiple times to execute sequential RapidWrite Mode writes.
5. This parameter is guaranteed by device characterization, but is not production tested. Transition is measured 0mV from steady state with the Output Test Load
6. To access RAM, CE = V
IL for this timing waveform as shown. OE may equal VIH with same write functionality; I/O would then always be in High-Z state.
EW or tWP) of a CE = VIL, BEn = VIL, and a R/W = VIL for memory array writing cycle. The last transition LOW of CE, BEn, and
R/W initiates the write sequence. The first transition HIGH of CE, BEn, and R/W terminates the write sequence.
IL transition occurs simultaneously with or after the R/W = VIL transition, the outputs remain in the High-impedance state.
(Figure 1).
IL and SEM = VIH. To access semaphore, CE = VIH and SEM = VIL. tEW must be met for either condition. CE = VIL when CE0 = VIL
and CE1 = VIH. CE = VIH when CE0 = VIH and/or CE1 = VIL.
t
DH
t
DW
t
DH
t
DW
t
DW
(5)
t
OW
t
DH
5632 drw 08
14
IDT70T651/9S Preliminary
High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM Industrial and Commercial Temperature Ranges
AC Electrical Characteristics over the Operating Temperature Range
and Supply Voltage Range for RapidWrite Mode Write Cycle
SymbolParameterMinMaxUnit
t
AAS
t
ARF
NOTE:
1. Timing applies to all speed grades when utilizing the RapidWrite Mode Write Cycle.
Allowable Address Skew for RapidWrite Mode
Address Rise/Fall Time for RapidWrite Mode1.5
____
1ns
____
(1)
V/ns
5632 tbl 14
Timing Waveform of Address Inputs for RapidWrite Mode Write Cycle
A
0
t
ARF
t
ARF
A
17
t
AAS
(1)
NOTE:
16 for IDT70T659.
1. A
5632 drw 09
15
IDT70T651/9S Preliminary
High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM Industrial and Commercial Temperature Ranges
Timing Waveform of Semaphore Read after Write Timing, Either Side
t
SAA
A0-A
SEM
2
(1)
I/O
VALID ADDRESS
t
AW
t
EW
DATAVALID
t
t
AS
WP
t
DW
IN
t
WR
t
DH
VALID ADDRESS
t
ACE
t
SOP
DATA
VALID
t
OUT
OH
(2)
(1)
R/W
t
SWRD
t
SOE
OE
Write Cycle
NOTES:
0 = VIH and CE1 = VIL are required for the duration of both the write cycle and the read cycle waveforms shown above. Refer to Truth Table II for details and for
1. CE
appropriate BEn controls.
2. "DATA
OUT VALID" represents all I/O's (I/O0 - I/O35) equal to the semaphore value.
Timing Waveform of Semaphore Write Contention
A
(2)
SIDE"A"
(2)
SIDE
"B"
0"A"-A2"A"
R/W
SEM
A
0"B"-A2"B"
R/W
"A"
"A"
"B"
MATCH
t
t
SPS
MATCH
SOP
Read Cycle
5632 drw 12
(1,3,4)
.
SEM
"B"
NOTES:
OR = DOL = VIL, CEL = CER = VIH. Refer to Truth Table II for appropriate BE controls.
1. D
2. All timing is the same for left and right ports. Port "A" may be either left or right port. "B" is the opposite from port "A".
3. This parameter is measured from R/W
SPS is not satisfied,the semaphore will fall positively to one side or the other, but there is no guarantee which side will be granted the semaphore flag.
4. If t
"A" or SEM"A" going HIGH to R/W"B" or SEM"B" going HIGH.
5632 drw 13
.
16
IDT70T651/9S Preliminary
High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM Industrial and Commercial Temperature Ranges
AC Electrical Characteristics Over the
Operating Temperature and Supply Voltage Range
(6)
70T651/9S8
Com'l Only
70T651/9S10
Com 'l
(6)
& Ind
SymbolParameter
Min.Max.Min.Max.Min.Max.Min.Max.
IH
BUSY TIMING (M/ S=V
BAA
t
BDA
t
BAC
t
t
BDC
APS
t
t
BDD
t
WH
BUSY TIMING (M/ S=V
WB
t
t
WH
)
BUSY Access Time fro m Address Match
BUSY Disable Time from Address Not Matched
BUSY Access Time fro m Chip Enable Low
BUSY Disable Time from Chip Enable High
Arbitration Priority Set-up Time
BUSY Disable to Valid Data
Write Ho ld Afte r BUSY
IL
)
BUSY Input to Write
Write Ho ld Afte r BUSY
(2)
(3)
(5)
(4)
(5)
____
____
____
____
2.5
____
____
8
____
8
____
8
____
8
____
2.5
____
8
____
6
____
0
____
6
7
0
7
PORT-TO-PORT DELAY TIMING
t
t
WDD
DDD
Write Pulse to Data Delay
(1)
Write Data Valid to Read Data De lay
(1)
____
____
____
12
____
12
NOTES:
1. Port-to-port delay through RAM cells from writing port to reading port, refer to "Timing Waveform of Write with Port-to-Port Read and BUSY (M/S = V
2. To ensure that the earlier of the two ports wins.
BDD is a calculated parameter and is the greater of the Max. spec, tWDD – tWP (actual), or tDDD – tDW (actual).
3. t
4. To ensure that the write cycle is inhibited on port "B" during contention on port "A".
5. To ensure that a write cycle is completed on port "B" after contention on port "A".
6. 8ns Commercial and 10ns Industrial speed grades are available in BF-208 and BC-256 packages only.
____
____
____
____
70T651/9S12
Com'l
70T651/9S15
Com'l Only
& In d
____
10
____
10
____
10
____
10
2.5
____
10
9
0
9
____
14
____
14
12
12
12
12
____
12
____
____
____
16
16
____
____
____
____
2.5
____
12
12
____
____
15ns
15ns
15ns
15ns
____
15ns
____
____
0
____
20ns
20ns
5632 tbl 15
IH)".
Uni t
ns
ns
ns
ns
AC Electrical Characteristics Over the
Operating Temperature and Supply Voltage Range
70T651/ 9S8
Com'l Only
SymbolParameter
SLEEP MODE TIMING (ZZx=V
ZZS
t
t
ZZR
t
ZZPD
t
ZZPU
Sleep Mode Set Time8
Sleep Mode Reset Time8
Sleep Mode Power Down Time
Sleep Mode Power Up Time
IH
)
(5)
(5)
Min.Max.Min.Max.Min.Max.Min.Max.
8
____
NOTES:
1. Timing is the same for both ports.
2. The sleep mode pin shuts off all dynamic inputs, except JTAG inputs, when asserted. OPTx, INTx, M/S and the sleep mode pins themselves (ZZx) are not affected
during sleep mode. It is recommended that boundary scan not be operated during sleep mode.
3. These values are valid regardless of the power supply level selected for I/O and control signals (3.3V/2.5V). See page 6 for details.
4. 8ns Commercial and 10ns Industrial speed grades are available in BF-208 and BC-256 packages only.
5. This parameter is guaranteed by device characterization, but is not production tested.
17
(4)
____
____
____
0
(1,2,3)
70T651/ 9S10
Com 'l
(4)
& In d
10
10
10
____
____
____
____
0
70T651/ 9S12
Com 'l
& Ind
12
12
12
____
____
____
____
0
70T651/ 9S15
Com'l Only
15
15
15
____
5632 tbl 15a
____
____
____
0
IDT70T651/9S Preliminary
High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM Industrial and Commercial Temperature Ranges
Timing Waveform of Write with Port-to-Port Read and BUSY (M/S = VIH)
t
WC
(2,4,5)
t
BAA
MATCH
t
WP
t
DW
MATCH
t
WDD
VALID
t
DDD
(3)
ADDR
DATA
ADDR
BUSY
DATA
R/W
IN "A"
OUT "B"
"A"
"A"
"B"
"B"
t
APS
(1)
NOTES:
1. To ensure that the earlier of the two ports wins. t
0L = CE0R = VIL; CE1L = CE1R = VIH.
2. CE
3. OE = V
4. If M/S = V
IL for the reading port.
IL (slave), BUSY is an input. Then for this example BUSY"A" = VIH and BUSY"B" input is shown above.
APS is ignored for M/S = VIL (SLAVE).
5. All timing is the same for left and right ports. Port "A" may be either the left or right port. Port "B" is the port opposite from port "A".
t
BDA
t
DH
t
BDD
VALID
.
5632 drw 14
Timing Waveform of Write with BUSY (M/S = VIL)
t
WP
R/W
"A"
(3)
t
WB
BUSY
"B"
R/W
"B"
NOTES:
WH must be met for both BUSY input (SLAVE) and output (MASTER).
1. t
2. BUSY is asserted on port "B" blocking R/W
WB only applies to the slave mode.
3. t
"B", until BUSY"B" goes HIGH.
(2)
18
t
WH
(1)
5632 drw 15
.
IDT70T651/9S Preliminary
High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM Industrial and Commercial Temperature Ranges
Waveform of BUSY Arbitration Controlled by CE Timing (M/S = VIH)
(1)
ADDR
and
CE
CE
BUSY
"A"
"B"
"A"
"B"
"B"
t
APS
(2)
ADDRESSES MATCH
t
BAC
t
BDC
Waveform of BUSY Arbitration Cycle Controlled by Address Match
Timing
ADDR
ADDR
"A"
"B"
(M/S = VIH)
(1,3,4)
t
APS
ADDRESS "N"
(2)
MATCHING ADDRESS "N"
5632 drw 16
.
t
BAA
BUSY
"B"
NOTES:
1. All timing is the same for left and right ports. Port “A” may be either the left or right port. Port “B” is the port opposite from port “A”.
APS is not satisfied, the BUSY signal will be asserted on one side or another but there is no guarantee on which side BUSY will be asserted.
2. If t
X= VIL when CE0X = VIL and CE1X = VIH. CEX = VIH when CE0X = VIH and/or CE1X = VIL.
3. CE
0X = OEX = BEnX = VIL. CE1X = VIH.
4. CE
t
BDA
5632drw 17
AC Electrical Characteristics Over the
Operating Temperature and Supply Voltage Range
2. These values are valid regardless of the power supply level selected for I/O and control signals (3.3V/2.5V). See page 6 for details.
3. 8ns Commercial and 10ns Industrial speed grades are available in BF-208 and BC-256 packages only.
Address Set-up Time0
Write Recovery Time0
Interrupt Se t Time
Interrup t Re set Time
____
____
____
____
(3)
70T651/9S10
Com'l
& Ind
0
0
____
8
____
8
(1,2)
70T651 /9S12
____
____
Com' l
& Ind
____
0
____
0
12
12
(3)
____
____
10
10
70T651 /9S15
Com'l Only
0
0
____
____
____
____
15ns
15ns
5632 tbl 16
,
ns
ns
19
IDT70T651/9S Preliminary
High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM Industrial and Commercial Temperature Ranges
Waveform of Interrupt Timing
ADDR
CE
R/W
INT
"A"
"A"
(3)
"A"
"B"
INTERRUPT SET ADDRESS
(4)
t
AS
(4)
t
INS
(1)
t
WC
(2)
t
WR
(5)
t
RC
ADDR
CE
"B"
OE
INT
"B"
(3)
"B"
"B"
INTERRUPT CLEAR ADDRESS
(4)
t
AS
(4)
t
INR
(2)
NOTES:
1. All timing is the same for left and right ports. Port “A” may be either the left or right port. Port “B” is the port opposite from port “A”.
2. Refer to Interrupt Truth Table.
X = VIL means CE0X = VIL and CE1X = VIH. CEX = VIH means CE0X = VIH and/or CE1 X = VIL.
3. CE
4. Timing depends on which enable signal (CE or R/W) is asserted last.
5. Timing depends on which enable signal (CE
or R/W) is de-asserted first.
5632 drw 18
5632 drw 19
.
.
Truth Table III — Interrupt Flag
(1,4)
Left PortRight Port
L
CE
L
OE
L
A
17L-A0L
(5)
INT
R/W
L
R
CE
R
OE
R
A
17R-A0R
(5)
INT
LLX3FFFFXXXX X L
XXXXXXLL3FFFFH
XXX X L
XLL3FFFEH
(3)
(2)
LLX3FFFEXSet Left INTL Flag
XXXXXRe s e t Le ft INTL Flag
NOTES:
1. Assumes BUSY
2. If BUSY
3. If BUSY
L and INTR must be initialized at power-up.
4. INT
17x is a NC for IDT70T659. Therefore, Interrupt Addresses are 1FFFF and 1FFFE.
5. A
L = BUSYR =VIH. CE0X = VIL and CE1 X = VIH.
L = VIL, then no change.
R = VIL, then no change.
20
R
(2)
Se t Right INTR Flag
(3)
Res et Rig ht INTR Flag
FunctionR/W
5632 tb l 17
IDT70T651/9S Preliminary
High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM Industrial and Commercial Temperature Ranges
Truth Table IV —
Address BUSY Arbitration
InputsOutputs
(4)
AOL-A
(5)
CE
(5)
L
CE
R
XXNO MATCHHHNormal
HX MATCHHHNormal
XH MATCHHHNormal
LL MATCH(2)(2)
AOR-A
17L
17R
BUSY
(1)
L
BUSY
(1)
R
Function
Write Inhibit
(3)
NOTES:
1. Pins BUSY
IDT70T651/9 are push-pull, not open drain outputs. On slaves the BUSY
2. "L" if the inputs to the opposite port were stable prior to the address and enable inputs of this port. "H" if the inputs to the opposite port became stable after the address
and enable inputs of this port. If t
3. Writes to the left port are internally ignored when BUSY
when BUSY
4. A
5. CE
L and BUSYR are both outputs when the part is configured as a master. Both are inputs when configured as a slave. BUSYoutputs on the
APS is not met, either BUSYL or BUSYR = LOW will result. BUSYL and BUSYR outputs can not be LOW simultaneously.
L outputs are driving LOW regardless of actual logic level on the pin. Writes to the right port are internally ignored
R outputs are driving LOW regardless of actual logic level on the pin.
17 is a NC for IDT70T659. Address comparison will be for A0 - A16.
X = L means CE0X = VIL and CE1X = VIH. CEX = H means CE0X = VIH and/or CE1X = VIL.
Truth Table V — Example of Semaphore Procurement Sequence
5632 tbl 18
input internally inhibits writes.
(1,2,3)
FunctionsD0 - D35 LeftD0 - D35 RightSta tus
No Action11Semaphore free
Left Port Writes "0" to Semaphore 01Left port has semaphore token
Right Port Writes " 0" to Semap hore 01No chang e . Rig ht side has no write ac cess to s emap ho re
Left Port Writes "1" to Semaphore1 0Right port obtains semaphore token
Left Port Writes "0" to Se mapho re1 0No chang e. Le ft port has no write acce s s to s emaphore
Right Port Writes "1" to Semaphore 01Left port obtains semaphore token
Left Port Writes "1" to Semaphore11Semaphore free
Right Port Writes "0" to Semaphore1 0Right port has semaphore token
Right Port Writes "1" to Semaphore11Semaphore free
Left Port Writes "0" to Semaphore 01Left port has semaphore token
Left Port Writes "1" to Semaphore11Semaphore free
NOTES:
1. This table denotes a sequence of events for only one of the eight semaphores on the IDT70T651/9.
2. There are eight semaphore flags written to via I/O
3. CE = V
IH, SEM = VIL to access the semaphores. Refer to the Semaphore Read/Write Control Truth Table.
0 and read from all I/O's (I/O0-I/O35). These eight semaphores are addressed by A0 - A2.
5632 tbl 19
Functional Description
The IDT70T651/9 provides two ports with separate control, address
and I/O pins that permit independent access for reads or writes to any
location in memory. The IDT70T651/9 has an automatic power down
feature controlled by CE. The CE0 and CE1 control the on-chip power
down circuitry that permits the respective port to go into a standby mode
when not selected (CE = HIGH). When a port is enabled, access to the
entire memory array is permitted.
Interrupts
If the user chooses the interrupt function, a memory location (mail
box or message center) is assigned to each port. The left port interrupt
flag (INT
L) is asserted when the right port writes to memory location
3FFFE (HEX), where a write is defined as CER = R/WR = VIL per the
Truth Table. The left port clears the interrupt through access of
address location 3FFFE when CEL = OEL = VIL, R/W is a "don't care".
Likewise, the right port interrupt flag (INTR) is asserted when the left port
writes to memory location 3FFFF (HEX) and to clear the interrupt
flag (INTR), the right port must read the memory location 3FFFF. The
message (36 bits) at 3FFFE or 3FFFF (1FFFF or 1FFFE for IDT70T659)
is user-defined since it is an addressable SRAM location. If the interrupt
function is not used, address locations 3FFFE and 3FFFF are not used
21
IDT70T651/9S Preliminary
High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM Industrial and Commercial Temperature Ranges
as mail boxes, but as part of the random access memory. Refer to Truth
Table III for the interrupt operation.
The BUSY arbitration on a master is based on the chip enable and
address signals only. It ignores whether an access is a read or write.
In a master/slave array, both address and chip enable must be valid
Busy Logic
Busy Logic provides a hardware indication that both ports of the RAM
have accessed the same location at the same time. It also allows one of the
two accesses to proceed and signals the other side that the RAM is “Busy”.
The BUSY pin can then be used to stall the access until the operation on
the other side is completed. If a write operation has been attempted from
the side that receives a BUSY indication, the write signal is gated internally
to prevent the write from proceeding.
The use of BUSY logic is not required or desirable for all applications.
In some cases it may be useful to logically OR the BUSY outputs together
and use any BUSY indication as an interrupt source to flag the event of
an illegal or illogical operation. If the write inhibit function of BUSY logic is
not desirable, the BUSY logic can be disabled by placing the part in slave
mode with the M/S pin. Once in slave mode the BUSY pin operates solely
as a write inhibit input pin. Normal operation can be programmed by tying
the BUSY pins HIGH. If desired, unintended write operations can be
prevented to a port by tying the BUSY pin for that port LOW.
The BUSY outputs on the IDT70T651/9 RAM in master mode, are
push-pull type outputs and do not require pull up resistors to operate.
A
18
CE
MASTER
Dual PortRAM
BUSY
BUSY
L
0
R
SLAVE
Dual Port RAM
BUSY
CE
0
R
BUSY
L
long enough for a BUSY flag to be output from the master before the
actual write pulse can be initiated with the R/W signal. Failure to
observe this timing can result in a glitched internal write inhibit signal
and corrupted data in the slave.
Semaphores
The IDT70T651/9 is an extremely fast Dual-Port 256/128K x 36
CMOS Static RAM with an additional 8 address locations dedicated to
binary semaphore flags. These flags allow either processor on the left or
right side of the Dual-Port RAM to claim a privilege over the other processor
for functions defined by the system designer’s software. As an example, the semaphore can be used by one processor to inhibit the
other from accessing a portion of the Dual-Port RAM or any other
shared resource.
The Dual-Port RAM features a fast access time, with both ports
being completely independent of each other. This means that the
activity on the left port in no way slows the access time of the right port.
Both ports are identical in function to standard CMOS Static RAM and
can be read from or written to at the same time with the only possible
conflict arising from the simultaneous writing of, or a simultaneous
READ/WRITE of, a non-semaphore location. Semaphores are protected against such ambiguous situations and may be used by the
system program to avoid any conflicts in the non-semaphore portion
of the Dual-Port RAM. These devices have an automatic power-down
feature controlled by CE
0 and CE 1, the Dual-Port RAM chip enables, and
SEM, the semaphore enable. The CE0, CE1, and SEM pins control on-
MASTER
Dual PortRAM
BUSY
L
BUSY
CE
1
R
SLAVE
Dual Port RAM
BUSY
L
CE
BUSY
1
R
chip power down circuitry that permits the respective port to go into standby
mode when not selected.
Systems which can best use the IDT70T651/9 contain multiple
processors or controllers and are typically very high-speed systems
which are software controlled or software intensive. These systems
5632 drw 20
Figure 3. Busy and chip enable routing for both width and depth
expansion with IDT70T651/9 Dual-Port RAMs.
.
can benefit from a performance increase offered by the IDT70T651/9s
hardware semaphores, which provide a lockout mechanism without
requiring complex programming.
If these RAMs are being expanded in depth, then the BUSY indication
for the resulting array requires the use of an external AND gate.
Software handshaking between processors offers the maximum in
system flexibility by permitting shared resources to be allocated in
varying configurations. The IDT70T651/9 does not use its semaphore
Width Expansion with Busy Logic
Master/Slave Arrays
When expanding an IDT70T651/9 RAM array in width while using
BUSY logic, one master part is used to decide which side of the RAMs
array will receive a BUSY indication, and to output that indication. Any
number of slaves to be addressed in the same address range as the
flags to control any resources through hardware, thus allowing the
system designer total flexibility in system architecture.
An advantage of using semaphores rather than the more common
methods of hardware arbitration is that wait states are never incurred
in either processor. This can prove to be a major advantage in very
high-speed systems.
master use the BUSY signal as a write inhibit signal. Thus on the
IDT70T651/9 RAM the BUSY pin is an output if the part is used as a
master (M/S pin = VIH), and the BUSY pin is an input if the part used
as a slave (M/S pin = VIL) as shown in Figure 3.
If two or more master parts were used when expanding in width, a
split decision could result with one master indicating BUSY on one side
of the array and another master indicating BUSY on one other side of
the array. This would inhibit the write operations from one port for part
of a word and inhibit the write operations from the other port for the
other part of the word.
How the Semaphore Flags Work
The semaphore logic is a set of eight latches which are independent of the Dual-Port RAM. These latches can be used to pass a flag,
or token, from one port to the other to indicate that a shared resource
is in use. The semaphores provide a hardware assist for a use
assignment method called “Token Passing Allocation.” In this method,
the state of a semaphore latch is used as a token indicating that a
shared resource is in use. If the left processor wants to use this
resource, it requests the token by setting the latch. This processor then
22
IDT70T651/9S Preliminary
High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM Industrial and Commercial Temperature Ranges
verifies its success in setting the latch by reading it. If it was successful, it
proceeds to assume control over the shared resource. If it was not
successful in setting the latch, it determines that the right side processor
has set the latch first, has the token and is using the shared resource.
The left processor can then either repeatedly request that
semaphore’s status or remove its request for that semaphore to
perform another task and occasionally attempt again to gain control of
the token via the set and test sequence. Once the right side has
relinquished the token, the left side should succeed in gaining control.
The semaphore flags are active LOW. A token is requested by
writing a zero into a semaphore latch and is released when the same
side writes a one to that latch.
The eight semaphore flags reside within the IDT70T651/9 in a
separate memory space from the Dual-Port RAM. This address space
is accessed by placing a low input on the SEM pin (which acts as a chip
select for the semaphore flags) and using the other control pins (Address,
CE0, CE1,R/W and BEn) as they would be used in accessing a
standard Static RAM. Each of the flags has a unique address which can
be accessed by either side through address pins A0 – A2. When accessing
the semaphores, none of the other address pins has any effect.
When writing to a semaphore, only data pin D0 is used. If a low level
is written into an unused semaphore location, that flag will be set to
a zero on that side and a one on the other side (see Truth Table V).
That semaphore can now only be modified by the side showing the zero.
When a one is written into the same location from the same side, the flag
will be set to a one for both sides (unless a semaphore request
from the other side is pending) and then can be written to by both sides.
The fact that the side which is able to write a zero into a semaphore
subsequently locks out writes from the other side is what makes
semaphore flags useful in interprocessor communications. (A thorough
discussion on the use of this feature follows shortly.) A zero written into the
same location from the other side will be stored in the semaphore request
latch for that side until the semaphore is freed by the first side.
When a semaphore flag is read, its value is spread into all data bits so
that a flag that is a one reads as a one in all data bits and a flag containing
a zero reads as all zeros for a semaphore read, the SEM, BEn, and OE
signals need to be active. (Please refer to Truth Table II). Furthermore,
the read value is latched into one side’s output register when that side's
semaphore select (SEM, BEn) and output enable (OE) signals go active.
This serves to disallow the semaphore from changing state in the middle
of a read cycle due to a write cycle from the other side.
A sequence WRITE/READ must be used by the semaphore in
order to guarantee that no system level contention will occur. A
processor requests access to shared resources by attempting to write
a zero into a semaphore location. If the semaphore is already in use,
the semaphore request latch will contain a zero, yet the semaphore
flag will appear as one, a fact which the processor will verify by the
subsequent read (see Table V). As an example, assume a processor
writes a zero to the left port at a free semaphore location. On a
subsequent read, the processor will verify that it has written successfully to that location and will assume control over the resource in
question. Meanwhile, if a processor on the right side attempts to write
a zero to the same semaphore flag it will fail, as will be verified by the
fact that a one will be read from that semaphore on the right side
during subsequent read. Had a sequence of READ/WRITE been
used instead, system contention problems could have occurred during
the gap between the read and write cycles.
It is important to note that a failed semaphore request must be followed
by either repeated reads or by writing a one into the same location. The
reason for this is easily understood by looking at the
simple logic diagram of the semaphore flag in Figure 4. Two semaphore
request latches feed into a semaphore flag. Whichever latch is first to
present a zero to the semaphore flag will force its side of the semaphore
flag LOW and the other side HIGH. This condition will continue until a one
is written to the same semaphore request latch. If the opposite side
semaphore request latch has been written to zero in the meantime, the
semaphore flag will flip over to the other side as soon as a one is written
into the first request latch. The opposite side flag will now stay LOW until
its semaphore request latch is written to a one. From this it is easy to
LPORT
SEMAPHORE
REQUEST FLIP FLOP
0
D
D
WRITE
SEMAPHORE
READ
Figure 4. IDT70T651/9 Semaphore Logic
SEMAPHORE
REQUEST FLIP FLOP
Q
Q
RPORT
0
D
D
WRITE
SEMAPHORE
READ
5632 drw 21
understand that, if a semaphore is requested and the processor which
requested it no longer needs the resource, the entire system can hang up
until a one is written into that semaphore request latch.
The critical case of semaphore timing is when both sides request
a single token by attempting to write a zero into it at the same time. The
semaphore logic is specially designed to resolve this problem. If
simultaneous requests are made, the logic guarantees that only one
side receives the token. If one side is earlier than the other in making
the request, the first side to make the request will receive the token. If
both requests arrive at the same time, the assignment will be arbitrarily
made to one port or the other.
One caution that should be noted when using semaphores is that
semaphores alone do not guarantee that access to a resource is
secure. As with any powerful programming technique, if semaphores
are misused or misinterpreted, a software error can easily happen.
Initialization of the semaphores is not automatic and must be
handled via the initialization program at power-up. Since any semaphore request flag which contains a zero must be reset to a one,
all semaphores on both sides should have a one written into them
at initialization from both sides to assure that they will be free
when needed.
23
IDT70T651/9S Preliminary
High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM Industrial and Commercial Temperature Ranges
n
o
i
t
a
r
e
p
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a
m
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o
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,
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w
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T
A
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D
I
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A
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A
T
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D
D
P
Z
Z
t
D
D
I
1 = VIH.
Timing Waveform of Sleep Mode
24
NOTES:
1. CE
2. All timing is same for Left and Right ports.
IDT70T651/9S Preliminary
High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM Industrial and Commercial Temperature Ranges
Sleep Mode
The IDT70T651/9 is equipped with an optional sleep or low power
mode on both ports. The sleep mode pin on both ports is active high. During
normal operation, the ZZ pin is pulled low. When ZZ is pulled high, the
port will enter sleep mode where it will meet lowest possible power
conditions. The sleep mode timing diagram shows the modes of operation:
Normal Operation, No Read/Write Allowed and Sleep Mode.
For a period of time prior to sleep mode and after recovering from sleep
mode (tZZS and tZZR), new reads or writes are not allowed. If a write or read
operation occurs during these periods, the memory array may be
corrupted. Validity of data out from the RAM cannot be guaranteed
immediately after ZZ is asserted (prior to being in sleep).
During sleep mode the RAM automatically deselects itself. The RAM
disconnects its internal buffer. All outputs will remain in high-Z state while
in sleep mode. All inputs are allowed to toggle. The RAM will not be selected
and will not perform any reads or writes.
JTAG Timing Specifications
t
JCYC
t
t
JCL
JR
t
JCH
TCK
t
JF
Device Inputs
(1)
/
TDI/TMS
t
JStJH
(2)
TDO
/
t
JRSR
Device Outputs
TRST
t
JRST
NOTES:
1. Device inputs = All device inputs except TDI, TMS, TCK and TRST.
2. Device outputs = All device outputs except TDO.
JTAG AC Electrical
Characteristics
SymbolParameterMin.Max.Units
JCYC
t
t
JCH
JCL
t
t
JR
t
JF
JRST
t
t
JRSR
JCD
t
t
JDC
t
JS
JH
t
JTAG Clock Input Period100
JTAG Clock HIGH40
JTAG Clock Low40
JTAG Clock Rise Time
JTAG Clock Fall Time
JTAG Reset Recovery50
JTAG Data Output
JTAG Data Output Hold0
(1,2,3,4,5)
____
____
JTAG Reset50
____
JTAG Setup15
JTAG Hold15
70T651/ 9
____
____
____
(1)
3
(1)
3
____
____
25ns
____
____
____
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
5632 tbl 20
t
JDC
JCD
t
x
5632 drw 23
NOTES:
1. Guaranteed by design.
2. 30pF loading on external output signals.
3. Refer to AC Electrical Test Conditions stated earlier in this document.
4. JTAG operations occur at one speed (10MHz). The base device may run at
any speed specified in this datasheet.
5. JTAG cannot be tested in sleep mode.
25
IDT70T651/9S Preliminary
High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM Industrial and Commercial Temperature Ranges
Identification Register Definitions
Instruction Fi eldVal ueDescription
Revision Numbe r (31:28)0x0Rese rve d for version numbe r
IDT Device ID (27:12)
IDT JEDEC ID (11:1)0x33All ows unique id entific atio n o f dev ice vendor as IDT
ID Register Indicator Bit (Bit 0)1Indicates the presence of an ID register
NOTE:
1. Device ID for IDT70T659 is 0x339.
0x338
(1)
Defines IDT part numb er 70T651
Scan Register Sizes
Register NameBit Size
Instruction (IR)4
Bypass (BYR)1
Identific atio n (IDR)32
Boundary Scan (BSR)Note (3)
5632 tbl 2 2
5632 tb l 21
System Interface Parameters
InstructionCodeDescripti on
EXTEST0000Fo rces contents of the boundary scan cells onto the de vice outputs
Places the boundary scan register (BSR) between TDI and TDO.
BYPASS1111Places the bypass register (BYR) between TDI and TDO.
IDCODE0010Loads the ID register (IDR) with the vendor ID cod e and places the
register between TDI and TDO.
HIGHZ
CLAMP0011
SAMPLE/PRELOAD0001Places the boundary scan register (BSR) between TDI and TDO.
RESERVED
NOTES:
1. Device outputs = All device outputs except TDO.
2. Device inputs = All device inputs except TDI, TMS, TCK and TRST.
3. The Boundary Scan Descriptive Language (BSDL) file for this device is available on the IDT website (www.idt.com), or by contacting your local
IDT sales representative.
0100Places the bypass register (BYR) between TDI and TDO. Forces all
device output drivers to a High-Z state.
Uses BYR. Forces contents of the boundary scan cells onto the device
outputs. Places the bypass register (BYR) between TDI and TDO.
(2)
SAMPLE allows data from device inputs
and outputs
in the bound ary sc an ce lls and shifted serially thro ug h TDO. PRELOAD
allows data to be input serially into the boundary scan cells via the TDI.
All Other Codes
Se veral comb inatio ns are re serve d. Do not use code s o ther than those
identifie d abo v e .
(1)
to be captured
(1)
.
5632 tbl 23
26
IDT70T651/9S Preliminary
High-Speed 2.5V 256/128K x 36 Asynchronous Dual-Port Static RAM Industrial and Commercial Temperature Ranges
Ordering Information
XXXXX
IDT
Device
Type
NOTE:
1. 8ns Commercial and 10ns Industrial speed grades are available in BF-208 and BC-256 packages only.
"PRELIMINARY' datasheets contain descriptions for products that are in early release.
Datasheet Document History:
04/25/03: Initial Datasheet
10/01/03: Page 9 Added 8ns speed DC power numbers to DC Electrical Characteristics Table
Page 9 Updated DC power numbers for 10, 12 & 15ns speeds in the DC Electrical Characteristics Table
Page 9, 11, 15, 17 & 25 Added footnote that indicates that 8ns speed is available in BF-208 and BC-256 packages only
Page 10 Added Capacitance Derating Drawing
Page 11, 15 & 17 Added 8ns AC timing numbers to the AC Electrical Characteristics Tables
Page 11 Added tSOE and tLZOB to the AC Read Cycle Electrical Characteristics Table
Page 12 Added tLZOB to the Waveform of Read Cycles Drawing
Page 14 Added tSOE to Timing Waveform of Semaphore Read after Write Timing, Either Side Drawing
Page 1 & 25 Added 8ns speed grade and 10ns I-temp to features and to ordering information
Page 1, 14 & 15 Added RapidWrite Mode Write Cycle text and waveforms
10/20/03:Page 15 Corrected tARF to 1.5V/ns Min.
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2975 Stender Way800-345-7015 or 408-727-6116831-754-4613
Santa Clara, CA 95054fax: 408-492-8674DualPortHelp@idt.com
www.idt.com
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