• ESD > 2000V per MIL-STD-883, Method 3015;
> 200V using machine model (C = 200pF, R = 0)
• Packages include 25 mil pitch SSOP, 19.6 mil pitch TSSOP,
15.7 mil pitch TVSOP and 25 mil pitch Cerpack
• Extended commercial range of –40°C to +85°C
•VCC = 5V ±10%
• Balanced Output Drivers:±24mA (commercial)
±16mA (military)
• Series current limiting resistors
• Generate/Check, Check/Check modes
• Open drain parity error allows wire-OR
DESCRIPTION:
The FCT162511AT/CT 16-bit registered/latched transceiver
with parity is built using advanced dual metal CMOS technology. This high-speed, low-power transceiver combines D-
SIMPLIFIED FUNCTIONAL BLOCK DIAGRAM:
type latches and D-type flip-flops to allow data flow in transparent, latched or clocked modes. The device has a parity
generator/cheker in the A-to-B direction and a parity checker
in the B-to-A direction. Error checking is done at the byte level
with separate parity bits for each byte. Separate error flags
exits for each direction with a single error flag indicating an
error for either byte in the A-to-B direction and a second error
flag indicating an error for either byte in the B-to-A direction.
The parity error flags are open drain outputs which can be tied
together and/or tied with flags from other devices to form a
single error flag or interrupt. The parity error flags are enabled
by the
OExx
control pins allowing the designer to disable the
error flag during combinational transitions.
The control pins LEAB, CLKAB and
tion in the A-to-B direction while LEBA, CLKBA and
control the B-to-A direction.
GEN
/CHK is only for the selection
OEAB
control opera-
OEBA
of A-to-B operation, the B-to-A direction is always in checking
mode. The ODD/
directions. Except for the ODD/
EVEN
select is common between the two
EVEN
control, independent
operation can be achieved between the two directions by
using the corresponding control lines.
LEAB
CLKAB
GEN/CHK
A0-15
PA1,2
ODD/EVEN
OEBA
PERA
(Open Drain)
Data
Byte
Parity
Generator/
Checker
Parity, data
18
16
Parity
2
Latch/
Register
Latch/
Register
Parity, data
Parity, Data
18
Byte
Parity
Checking
18
OEAB
B0-15
PB1,2
PERB
(Open Drain)
LEBA
CLKBA
2916 drw 01
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
MILITARY AND COMMERCIAL TEMPERATURE RANGESAUGUST 1996
IDT54/74FCT162511AT/CT
FAST CMOS 16-BIT REGISTERED/LATCHED TRANSCEIVER WITH PARITYMILITARY AND COMMERCIAL TEMPERATURE RANGES
ABSOLUTE MAXIMUM RATINGS
(1)
SymbolDescriptionMax.Unit
(2)
VTERM
VTERM
Terminal Voltage with Respect to
GND
(3)
Terminal Voltage with Respect to
GND
–0.5 to +7.0V
–0.5 to
CC +0.5
V
V
TSTGStorage Temperature–65 to +150°C
IOUTDC Output Current–60 to +120 mA
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating
only and functional operation of the device at these or any other conditions
above those indicated in the operational sections of this specification is
not implied. Exposure to absolute maximum rating conditions for
extended periods may affect reliability.
2. Open drain and all device terminals except FCT162XXXT Output and I/O
terminals.
3. Output and I/O terminals for FCT162XXXT.
FUNCTION TABLE
(1,4)
2916 lnk 01
InputsOutputs
OEAB
OEAB
LEABCLKABAxBx
HXX XZ
LHX LL
LHX HH
LL↑ LL
LL↑ HH
LLL XB
LLH XB
NOTES:2916 tbl 02
1. A-to-B data flow is shown. B-to-A data flow is similar but uses
LEBA, and CLKBA.
2. Output level before the indicated steady-state input conditions were
established.
3. Output level before the indicated steady-state input conditions were
established, provided that CLKAB was HIGH before LEAB went LOW.
4. H = HIGH Voltage Level
L = LOW Voltage Level
X = Don't Care
Z = High Impedance
↑ = LOW-to-HIGH Transition
(2)
(3)
OEBA
PIN DESCRIPTION
Pin NamesDescription
OEABOEBA
LEABA-to-B Latch Enable Input
LEBAB-to-A Latch Enable Input
CLKABA-to-B Clock Input
CLKBAB-to-A Clock Input
AxA-to-B Data Inputs or B-to-A 3-State Outputs
BxB-to-A Data Inputs or A-to-B 3-State Outputs
PERAPERB
(1)
PAx
PBxB-to-A Parity Input, A-to-B Parity Output
ODD/
EVEN
GEN
/CHKA to B Port Generate or Check Mode Input
NOTES:
1. The PAx pin input is internally disabled during parity generation. This
means that when generating parity in the A to B direction there is no need
to add a pull up resistor to guarantee state. The pin will still function
properly as the parity output for the B to A direction.
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
3. Per TTL driven input (V
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of the I
C = IQUIESCENT + IINPUTS + IDYNAMIC
6. I
IC = ICC + ∆ICC DHNT + ICCD (fCPNCP/2 + fiNi)
I
CC = Quiescent Current (ICCL, ICCHand ICCZ)
CC = Power Supply Current for a TTL High Input (VIN = 3.4V)
∆I
D
H = Duty Cycle for TTL Inputs High
T = Number of TTL Inputs at DH
N
ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL)
CP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
f
N
CP = Number of Clock Inputs at fCP
fi = Input Frequency
i = Number of Inputs at fi
N
CC = 5.0V, +25°C ambient.
IN = 3.4V). All other inputs at VCC or GND.
CC formula. These limits are guaranteed but not tested.
(2)
Max.Unit
(5)
(5)
2916 tbl 09
5.117
Page 8
IDT54/74FCT162511AT/CT
FAST CMOS 16-BIT REGISTERED/LATCHED TRANSCEIVER WITH PARITYMILITARY AND COMMERCIAL TEMPERATURE RANGES
SWITCHING CHARACTERISTICS OVER OPERATING RANGE (PROPAGATION DELAYS)
FCT162511ATFCT162511CT
Com'l.Mil.Com'l.Mil.
SymbolParameterCondition
tPLH
tPHL
tPLHPropagation Delay
Propagation Delay, PAx to PBx
Ax to Bx or Bx to Ax, PBx to PAx
GEN
/CHK LOW1.57.51.58.01.56.51.56.8ns
CL = 50pF
R
(1)
L = 500Ω
tPHLAx to PBx
(3)
tPLH
tPHLAx to
tPLH
tPHLBx to
tPLH
tPHL
Propagation Delay 1.59.01.59.01.57.51.57.8ns
PERB
, PAx to
(3)
Propagation Delay1.59.01.59.01.57.51.57.8ns
PERA
, PBx to
PERB
PERA
Propagation Delay
LEBA to Ax and PAx
LEAB to Bx and PBx
(3)
tPLH
tPHLLEBA to
tPLH
tPHL
Propagation Delay1.57.01.57.01.56.01.56.3ns
PERA
, LEAB to
PERB
1.56.01.56.01.55.01.55.3
Propagation Delay
CLKBA to Ax and PAx
CLKAB to Bx and PBx
(3)
tPLH
tPHLCLKBA to
tPZH
tPZL
tPHZ
tPLZ
tPLZ
tPZL
tPLH
Propagation Delay1.57.01.57.01.56.01.56.3ns
PERA
CLKAB to
PERB
Output Enable Time
OEBA
to Ax and PAx
OEAB
to B
X and PBx
Output Disable Time
OEBA
to Ax and PAx
OEAB
(3)
(3)
to Bx and PBx
Parity ERROR Enable1.56.01.56.31.56.01.56.3ns
OEBA
to
ODD/
PERA, OEAB
EVEN
to
PERx
to
PERB
tPHL1.510.01.510.01.510.01.510.0
tPLHODD/
EVEN
to PBx1.510.01.510.01.510.01.510.0ns
tPHL
NOTES:2916 tbl 10
1. See test circuits and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
3. On Open Drain Outputs t
PLH is measured at VOUT = VOL + 0.3V.
Min.
(2)
Max.Min.
(2)
Max.Min.
(2)
Max.Min.
(2)
Max.Unit
1.55.01.55.31.54.21.54.5ns
1.58.01.58.01.56.51.56.8
1.58.01.58.01.56.51.56.8
1.55.61.56.01.55.31.55.5ns
1.55.61.56.01.55.31.55.5ns
1.56.01.56.01.55.01.55.3
1.56.01.56.51.55.61.55.8ns
1.55.61.56.01.55.21.55.5ns
1.56.01.56.31.56.01.56.3
1.510.01.510.01.510.01.510.0ns
5.118
Page 9
IDT54/74FCT162511AT/CT
FAST CMOS 16-BIT REGISTERED/LATCHED TRANSCEIVER WITH PARITYMILITARY AND COMMERCIAL TEMPERATURE RANGES
SWITCHING CHARACTERISTICS OVER OPERATING RANGE (SET UP TIMES)
FCT162511ATFCT162511CT
Com'l.Mil.Com'l.Mil.
SymbolParameterTest Conditions
t
SU
Set-up Time GEN
/CHK LOWPBx validCL = 50pF4—4—3—3.5—ns
HIGH or LOWPBx not validRL = 500
Ax to CLKAB
GEN
/CHK HIGH
PERBPERB
t
SU
Set-up Time GEN
PAx to CLKAB
t
SU
Set-up Time
Bx to CLKBA,
/CHK HIGH
PERBPERBPERAPERA
PBx to CLKBA
t
SU
Set-up Time CLKAB LOWPBx valid3.5—3.5—3—3—ns
Ax to LEAB
GEN
/CHK LOWPBx not valid3—3—3—3—ns
CLKAB LOW
GEN
/CHK HIGH
PERBPERB
CLKAB HIGHPBx valid3.5—3.5—3—3—ns
GEN
/CHK LOWPBx not valid3—3—3—3—ns
t
SU
Set-up Time CLKAB LOW
PAx to LEAB
t
SU
Set-up Time CLKBA LOW
Bx to LEBA
PBx to LEBACLKBA HIGH
CLKAB HIGH
GEN
/CHK HIGH
GEN
/CHK HIGH
CLKAB HIGH
GEN
/CHK HIGH
PERBPERBPERBPERBPERBPERBPERAPERAPERAPERA
t
SK(O)
Output Skew
(4)
(1,3)
Min.Max.Min. Max.Min.Max.Min. Max. Unit
Ω
3—3—3—3—ns
valid4—4—3—3—ns
not valid3—3—3—3—ns
valid4—4—3—3—ns
not valid3—3—3—3—ns
valid4—4—3—3—ns
not valid3—4—3—3—ns
valid3.5—3.5—3—3—ns
not valid3—3—3—3—ns
valid3.5—3.5—3—3—ns
not valid3—3—3—3—ns
valid3.5—3.5—3—3—ns
not valid3—3—3—3—ns
valid3.5—3.5—3—3—ns
not valid3—3—3—3—ns
valid3.5—3.5—3—3—ns
not valid3—3—3—3—ns
valid3.5—3.5—3—3—ns
not valid3—3—3—3—ns
—0.5—0.5—0.5—0.5ns
2916 tbl 11
SWITCHING CHARACTERISTICS OVER OPERATING RANGE (HOLD TIMES)
FCT162511ATFCT162511CT
Com'l.Mil.Com'l.Mil.
SymbolParameterCondition
tHHold Time HIGH or LOW Ax to LEAB, Bx to LEBACL = 50pF1—1—1—1—ns
tHHold Time HIGH or LOW PAx to LEABRL = 500Ω1—1—1—1—ns
tH Hold Time HIGH or LOW PBx to LEBA1—1—1—1—ns
tHHold Time Ax to CLKAB, PAx to CLKAB1—1—0—0—ns
tHHold Time Bx to CLKBA, PBx to CLKBA1—1—0—0—ns
tWLEAB or LEBA Pulse Width HIGH
tWCLKAB or CLKBA Pulse Width HIGH or LOW
NOTES:
1. See test circuits and waveforms.
2. This parameter is guaranteed but not tested.
3. "Not valid" means the set-up time indicated is not sufficient to assure proper functioning of this output; however, the set-up time indicated will assure
proper functioning of the A to B or B to A port respective to the indicated direction.
4. Skew between any two outputs of the same package, switching in the same direction, excluding
PERx
in transparent/latched mode. This parameter is guaranteed by design.
(2)
(2)
(1)
Min.Max.Min. Max.Min.Max.Min.Max. Unit
3—3—3—3—ns
3—3—3—3—ns
2916 tbl 12
PERx
in clocked mode, and Pxx (parity bits) and
5.119
Page 10
IDT54/74FCT162511AT/CT
FAST CMOS 16-BIT REGISTERED/LATCHED TRANSCEIVER WITH PARITYMILITARY AND COMMERCIAL TEMPERATURE RANGES
TEST CIRCUITS AND WAVEFORMS
TEST CIRCUITS FOR ALL OUTPUTS
V
CC
7.0V
SWITCH POSITION
TestSwitch
Open Drain
Disable Low
Enable Low
All Other Tests
Generator.
Pulse
Generator
500
Ω
V
V
IN
OUT
D.U.T.
50pF
500
T
R
C
L
Ω
2916 drw 05
DEFINITIONS:
C
L= Load capacitance: includes jig and probe capacitance.
T = Termination resistance: should be equal to ZOUT of the Pulse
R
SET-UP, HOLD AND RELEASE TIMESPULSE WIDTH
DATA
INPUT
TIMING
INPUT
ASYNCHRONOUS CONTROL
PRESET
CLEAR
ETC.
SYNCHRONOUS CONTROL
PRESET
CLEAR
CLOCK ENABLE
ETC.
t
t
REM
H
t
H
t
SU
t
SU
3V
1.5V
0V
3V
1.5V
0V
3V
1.5V
0V
3V
1.5V
0V
2916 drw 06
LOW-HIGH-LOW
PULSE
HIGH-LOW-HIGH
PULSE
Closed
Open
2916 lnk 13
1.5V
t
W
1.5V
2916 drw 07
SAME PHASE
INPUT TRANSITION
OUTPUT
OPPOSITE PHASE
INPUT TRANSITION
t
PLH
t
PLH
t
t
PHL
PHL
3V
1.5V
0V
V
OH
1.5V
V
OL
3V
1.5V
0V
2916 drw 08
ENABLE AND DISABLE TIMESPROPAGATION DELAY
ENABLEDISABLE
3V
CONTROL
INPUT
t
PHZ
PLZ
t
F≤ 2.5ns; tR≤ 2.5ns
t
PZL
OUTPUT
NORMALLY
OUTPUT
NORMALLY
HIGH
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control
Disable-HIGH
2. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; t
LOW
SWITCH
CLOSED
t
PZH
SWITCH
OPEN
3.5V
1.5V
1.5V
0V
0.3V
0.3V
1.5V
0V
3.5V
V
V
0V
OL
OH
2916 drw 09
5.1110
Page 11
IDT54/74FCT162511AT/CT
)
FAST CMOS 16-BIT REGISTERED/LATCHED TRANSCEIVER WITH PARITYMILITARY AND COMMERCIAL TEMPERATURE RANGES
ORDERING INFORMATION
IDT
Temperature
Range
FCT
X
XXXX
Device
X
PackageXProcess
Type
Blank
B
PV
PA
PF
E
162511AT
Commercial
MIL-STD-883, Class B
Shrink Small Outline Package (SO56-1)
Thin Shrink Small Outline Package (SO56-2
Thin Very Small Outline Package (SO56-3)
CERPACK (E56-1)
16-Bit Registered Transceiver with Parity
162511CT
54
74
–55°C to +125°C
–40
°C to +85°C
2916 drw 10
5.1111
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