Datasheet ICX248AL Datasheet (Sony)

Page 1
Description
The ICX248AL is an interline CCD solid-state image sensor suitable for EIA black-and-white video cameras with a diagonal 8mm (Type 1/2) system. Sensitivity, smear, D-range, S/N and other characteristics from visible light area to near infrared light area, have been greatly improved compared with the ICX038DLA through the adoption of EXview HAD CCDTMtechnology.
This chip features a field period readout system and an electronic shutter with variable charge-storage time.
This chip is compatible with and can replace the ICX038DLA.
Features
• Sensitivity in the near infrared light area
(+12dB compared with the ICX038DLA, λ = 945nm)
• High sensitivity
(+9dB compared with the ICX038DLA, without IR cut filter)
• Low smear (–15dB compared with the ICX038DLA)
• High D range (+2dB compared with the ICX038DLA)
• High S/N
• High resolution and low dark current
• Excellent antiblooming characteristics
• Continuous variable-speed shutter
• Substrate bias: Adjustment free (external adjustment also possible with 6 to 14V)
• Reset gate pulse: 5Vp-p adjustment free (drive also possible with 0 to 9V)
• Horizontal register: 5V drive
Device Structure
• Interline CCD image sensor
• Image size: Diagonal 8mm (Type 1/2)
• Number of effective pixels: 768 (H) × 494 (V) approx. 380K pixels
• Total number of pixels: 811 (H) × 508 (V) approx. 410K pixels
• Chip size: 7.95mm (H) × 6.45mm (V)
• Unit cell size: 8.4µm (H) × 9.8µm (V)
• Optical black: Horizontal (H) direction: Front 3 pixels, rear 40 pixels
Vertical (V) direction: Front 12 pixels, rear 2 pixels
• Number of dummy bits: Horizontal 22
Vertical 1 (even fields only)
• Substrate material: Silicon
– 1 –
ICX248AL
E98728A99
Diagonal 8mm (Type 1/2) CCD Image Sensor for EIA Black-and-White Video Cameras
Sony reserves the right to change products and specifications without prior notice. This information does not convey any license by any implication or otherwise under any patents or other right. Application circuits shown, if any, are typical examples illustrating the operation of the devices. Sony cannot assume responsibility for any problems arising out of the use of these circuits.
20 pin DIP (Cer-DIP)
A
A
A
Pin 1
V
3
40
2
12
Pin 11
H
Optical black position
(Top View)
TM
∗
EXview HAD CCD is a trademark of Sony Corporation EXview HAD CCD is a CCD that drastically improves light efficiency by including near infrared light region as a basic structure of HAD (Hole-Accnmulation Diode) sensor.
AAA AAA AAA
Page 2
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ICX248AL
Pin No. Symbol Description Pin No. Symbol Description
1 2 3 4 5 6 7 8 9
10
Vφ4 Vφ3 Vφ2
φSUB
GND Vφ1 VL GND VDD VOUT
Vertical register transfer clock Vertical register transfer clock Vertical register transfer clock Substrate clock GND Vertical register transfer clock Protective transistor bias GND Output circuit supply voltage Signal output
11 12 13 14 15 16 17 18 19 20
VGG VDSUB VSS GND GND RD
φRG
NC Hφ1 Hφ2
Output circuit gate bias Substrate bias circuit supply voltage Output circuit source GND GND Reset drain bias Reset gate clock
Horizontal register transfer clock Horizontal register transfer clock
1
2
3
4
5
6
7
8
9
10
11
12
13
14 15
16
Note)
Note) : Photo sensor
GND
V
L
Vφ
1
GND
φ
SUB
Vφ
2
Vφ
3
Vφ
4
V
GG
V
DSUB
V
SS
GND
GND
RD
φ
RG
NC
Horizontal Register
Vertical Register
17
18
19
20
V
DD
V
OUT
Hφ
1
Hφ
2
Block Diagram and Pin Configuration
(Top View)
Pin Description
Page 3
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ICX248AL
Item
–0.3 to +50 –0.3 to +18
–55 to +10 –15 to +20
to +10 to +15
to +17 –17 to +17 –10 to +15 –55 to +10
–65 to +0.3 –0.3 to +30
–30 to +80 –10 to +60
V V V V V V V V V V V
V °C °C
∗1
Ratings Unit Remarks
Absolute Maximum Ratings
∗1
+27V (Max.) when clock width < 10µs, clock duty factor < 0.1%.
Substrate clock φSUB – GND
VDD, VRD, VDSUB, VOUT, VSS – GND
Supply voltage
VDD, VRD, VDSUB, VOUT, VSS – φSUB Vφ1, Vφ2, Vφ3, Vφ4 – GND
Clock input voltage
Vφ1, Vφ2, Vφ3, Vφ4 – φSUB Voltage difference between vertical clock input pins Voltage difference between horizontal clock input pins Hφ1, Hφ2 – Vφ4
φRG, VGG – GND φRG, VGG – φSUB
VL – φSUB Pins other than GND and φSUB – VL Storage temperature Operating temperature
Page 4
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ICX248AL
Item
VDD VRD VGG VSS VL VDSUB VSUB ∆VSUB
14.55
14.55
1.75
6.0 –3
15.0
15.0
2.0
∗3 ∗4
15.45
15.45
2.25
14.0 +3
V V V
V
%
VRD = VDD
∗5 ∗5
Symbol Min. Typ. Max. Unit Remarks
Bias Conditions 2 [when used in substrate bias external adjustment mode]
Output circuit supply voltage Reset drain voltage Output circuit gate voltage Output circuit source Protective transistor bias Substrate bias circuit supply voltage Substrate voltage adjustment range Substrate voltage adjustment precision
∗3
VL setting is the VVL voltage of the vertical transfer clock waveform, or the same power supply as the VL power supply for the V driver should be used. (When CXD1267AN is used.)
∗4
Connect to GND or leave open.
∗5
The setting value of the substrate voltage (VSUB) is indicated on the back of the image sensor by a special code. When adjusting the substrate voltage externally, adjust the substrate voltage to the indicated voltage. The adjustment precision is ±3%. However, this setting value has not significance when used in substrate bias internal generation mode.
VSUB code — one character indication Code and optimal setting correspond to each other as follows.
DC Characteristics
Item
Output circuit supply current IDD 5.0 10.0 mA
Symbol Min. Typ. Max. Unit Remarks
VSUB code Optimal setting 6.0 6.5 7.0 7.5 8.0 8.5 9.0 9.5
10.0 10.5 11.011.5 12.0 12.5 13.0 13.5 14.0
E f G h J K L m N P Q R S T U V W
<Example> "L" → VSUB = 9.0V
Item
VDD VRD VGG VSS VL VDSUB
φSUB
14.55
14.55
1.75
14.55
15.0
15.0
2.0
∗1
15.0
∗2
15.45
15.45
2.25
15.45
V V V
V
VRD = VDD
Symbol Min. Typ. Max. Unit Remarks
Bias Conditions 1 [when used in substrate bias internal generation mode]
Output circuit supply voltage Reset drain voltage Output circuit gate voltage Output circuit source Protective transistor bias Substrate bias circuit supply voltage Substrate clock
Grounded with 390Ω resistor
∗1
VL setting is the VVL voltage of the vertical transfer clock waveform, or the same power supply as the VL power supply for the V driver should be used. (When CXD1267AN is used.)
∗2
Do not apply a DC bias to the substrate clock pin, because a DC bias is generated within the CCD.
Grounded with 390Ω resistor
Page 5
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ICX248AL
Item
Readout clock voltage
VVT VVH1, VVH2 VVH3, VVH4 VVL1, VVL2,
VVL3, VVL4 VφV | VVH1 – VVH2 | VVH3 – VVH VVH4 – VVH VVHH VVHL VVLH VVLL VφH VHL VRGL VφRG VRGLH – VRGLL VφSUB
14.55 –0.05
–0.2 –9.6
8.3
–0.25 –0.25
4.75
–0.05
4.5
23.0
15.0 0 0
–9.0
9.0
5.0 0
∗1
5.0
24.0
15.45
0.05
0.05 –8.5
9.65
0.1
0.1
0.1
0.5
0.5
0.5
0.5
5.25
0.05
5.5
0.8
25.0
V V V
V
Vp-p
V V V V V V V
Vp-p
V V
Vp-p
V
Vp-p
1 2 2
2 2
2 2 2 2 2 2 2 3 3 4 4 4 5
VVH = (VVH1 + VVH2)/2
VVL = (VVL3 + VVL4)/2 VφV = VVHn – VVLn (n = 1 to 4)
High-level coupling High-level coupling Low-level coupling Low-level coupling
Low-level coupling
Horizontal transfer clock voltage
Reset gate clock voltage
∗1
Substrate clock voltage
Vertical transfer clock voltage
Symbol Min. Typ. Max. Unit
Waveform
diagram
Remarks
Item Symbol Min. Typ. Max. Unit
Waveform
diagram
Remarks
∗1
Input the reset gate clock without applying a DC bias. In addition, the reset gate clock can also be driven with the following specifications.
Reset gate clock voltage
VRGL VφRG
–0.2
8.509.0
0.2
9.5VVp-p
4 4
Clock Voltage Conditions
Page 6
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ICX248AL
Clock Equivalent Circuit Constant
Item
Capacitance between vertical transfer clock and GND
CφV1, CφV3 CφV2, CφV4 CφV12, CφV34 CφV23, CφV41 CφH1 CφH2 CφHH CφRG CφSUB R1, R2, R3, R4 RGND
1800 2200
450 270
64 62 47
8
400
68 15
pF pF pF pF pF pF pF pF pF
Ω Ω
Capacitance between vertical transfer clocks
Capacitance between horizontal transfer clock and GND
Capacitance between horizontal transfer clocks Capacitance between reset gate clock and GND Capacitance between substrate clock and GND Vertical transfer clock series resistor Vertical transfer clock ground resistor
Symbol Min. Typ. Max. Unit Remarks
Hφ2Hφ1
CφH1 CφH2
CφHH
Vφ1
CφV12
Vφ2
Vφ4 Vφ3
CφV34
CφV23CφV41
CφV1 CφV2
CφV4 CφV3
RGND
R4
R1
R3
R2
Vertical transfer clock equivalent circuit Horizontal transfer clock equivalent circuit
Page 7
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ICX248AL
Drive Clock Waveform Conditions
(1) Readout clock waveform
(2) Vertical transfer clock waveform
II II
100%
90%
10%
0%
VVT
tr twh tf
φM
0V
φM
2
Vφ1 Vφ3
Vφ2 Vφ4
VVHH
VVH
VVHL
VVHH
VVHL
VVH1
VVL1
VVLH
VVLL
VVL
VVHH
VVH3
VVHL
VVH
VVHH
VVHL
VVL3
VVL
VVLL
VVLH
VVHH VVHH
VVH
VVHL
VVHL
VVH2
VVLH
VVL2
VVLL
VVL
VVHH VVHH
VVHL
VVH4
VVHL
VVH
VVL
VVLH
VVLL
VVL4
VVH = (VVH1 + VVH2)/2 VVL = (VVL3 + VVL4)/2 VφV = VVHn – VVLn (n = 1 to 4)
Page 8
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ICX248AL
(3) Horizontal transfer clock waveform
tr twh tf
90%
10%
twl
Vφ
H
VHL
(4) Reset gate clock waveform
Point A
twl
Vφ
RG
VRGH
VRGL + 0.5V V
RGL
+2.5V
V
RGLH
RG waveform
V
RGLL
Hφ1 waveform
twhtr tf
VRGLH is the maximum value and VRGLL is the minimum value of the coupling waveform during the period from Point A in the above diagram until the rising edge of RG. In addition, VRGL is the average value of VRGLH and VRGLL.
VRGL = (VRGLH + VRGLL)/2
Assuming VRGH is the minimum value during the interval twh, then:
VφRG = VRGH – VRGL
Page 9
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ICX248AL
(5) Substrate clock waveform
90%
100%
10%
0%
V
SUB
tr twh tf
φM
φM
2
VφSUB
Clock Switching Characteristics
Item
Readout clock Vertical transfer
clock
During imaging
During parallel­serial conversion
Reset gate clock
Substrate clock
VT V
φ
1, Vφ2,
V
φ
3, V
φ
4
Hφ Hφ1
Hφ2
φRG
φSUB
2.3
11
1.5
2.5
20
5.38
13
1.8
20
5.38
51
0.5
15
0.01
0.01 3
19
0.5
0.5
15
15
0.01
0.01 3
250
19
0.5
µs
ns
ns
µs
ns
µs
During readout
∗1
∗2
During drain charge
Symbol
twh
Min. Typ.
Max.
Min. Typ.
Max.
Min. Typ.
Max.
Min. Typ.
Max.
twl tr tf
Unit Remarks
∗1
When vertical transfer clock driver CXD1267AN is used.
∗2
tf ≥ tr – 2ns.
Item
Horizontal transfer clock
Hφ1, Hφ2 16 20 ns
∗3
Symbol
two
Min. Typ. Max.
Unit Remarks
∗3
The overlap period for twh and twl of horizontal transfer clocks Hφ1 and Hφ2 is two.
Horizontal
transfer clock
Page 10
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ICX248AL
Image Sensor Characteristics (Ta = 25°C)
Item Sensitivity Saturation signal Smear
Video signal shading
Dark signal Dark signal shading Flicker Lag
S Vsat Sm
SH
Vdt ∆Vdt F Lag
4500 1000
5500
0.00005 0.00018 20 25
2 1 2
0.5
mV mV
% %
% mV mV
%
%
1 2 3 4 4 5 6 7 8
∗1
Ta = 60°C
Zone 0 and I
Zone 0 to II' Ta = 60°C Ta = 60°C
Symbol Min. Typ. Max. Unit Measurement method Remarks
Zone Definition of Video Signal Shading
10
12
494 (V)
1414
768 (H)
V
10
H
8
H 8
V
10
Effective pixel region
Zone 0, I
Zone II, II'
Ignored region
∗1
Sensitivity data is the conversion value by Measurement method 1.
Page 11
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ICX248AL
Image Sensor Characteristics Measurement Method
Measurement conditions
1) In the following measurements, the device drive conditions are at the typical values of the bias and clock voltage conditions. (When used with substrate bias external adjustment, set the substrate voltage to the value indicated on the device and connect VDSUB pin to GND or leare it open.)
2) In the following measurements, spot blemishes are excluded and, unless otherwise specified, the optical black (OB) level is used as the reference for the signal output, and the value measured at point [∗A] in the drive circuit example is used.
Definition of standard imaging conditions
1) Standard imaging condition I: Use a pattern box (luminance: 706cd/m2, color temperature of 3200K halogen source) as a subject. (Pattern for evaluation is not applicable.) Use a testing standard lens and image at F8. The luminous intensity to the sensor receiving surface at this point is defined as the standard sensitivity testing luminous intensity. (IR cut filter is not applicable.)
2) Standard imaging condition II: Image a light source (color temperature of 3200K) with a uniformity of brightness within 2% at all angles. Use a testing standard lens and the luminous intensity is adjusted to the value indicated in each testing item by the lens diaphragm. (IR cut filter is not applicable.)
1. Sensitivity Set to standard imaging condition I. After selecting the electronic shutter mode with a shutter speed of 1/500s, measure the signal output (Vs) at the center of the screen and substitute the value into the following formula.
2. Saturation signal Set to standard imaging condition II. After adjusting the luminous intensity to 10 times the intensity with the average value of the signal output, 200mV, measure the minimum value of the signal output.
3. Smear Set to standard imaging condition II. Adjust the luminous intensity to 500 times the intensity with the average value of the signal output, 200mV. When the readout clock is stopped and the charge drain is executed by the electronic shutter at the respective H blankings, measure the maximum value (VSm [mV]) of the signal output and substitute the value into the following formula.
4. Video signal shading Set to standard imaging condition II. Adjust the luminous intensity so that the average value of the signal output is 200mV. Then measure the maximum (Vmax [mV]) and minimum (Vmin [mV]) values of the signal output and substitute the values into the following formula.
SH = (Vmax – Vmin)/200 × 100 [%]
Sm =
× 100 [%] (1/10V method conversion value)
× ×
200
VSm
500
1
10
1
S = Vs ×
[mV]
60
500
Page 12
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ICX248AL
5. Dark signal Measure the average value of the signal output (Vdt [mV]) with the device ambient temperature 60°C and the device in the light-obstructed state, using the horizontal idle transfer level as a reference.
6. Dark signal shading After measuring 5, measure the maximum (Vdmax [mV]) and minimum (Vdmin [mV]) values of the dark signal output and substitute the values into the following formula.
∆Vdt = Vdmax – Vdmin [mV]
7. Flicker Set to standard imaging condition II. Adjust the luminous intensity so that the average value of the signal output is 200mV, and then measure the difference in the signal level between fields (∆Vf [mV]). Then substitute the value into the following formula.
F = (∆Vf/200) × 100 [%]
8. Lag Adjust the signal output value generated by strobe light to 200mV. After setting the strobe light so that it strobes with the following timing, measure the residual signal (Vlag). Substitute the value into the following formula.
Lag = (Vlag/200) × 100 [%]
Vlag (lag)Signal output 200mV
Light
FLD
V1
Strobe light
timing
Output
Page 13
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ICX248AL
15V
XSUB
XV2
XV1
XSG1
XV3
XSG2
XV4
Hφ
2
Hφ1
RG
0.01
–9V
3.3/16V
1M
1
100k
1/35V
22/16V
22/20V
CXD1267AN
20
19
18
17
16
15
14
13
12
11
1
2
3
4
5
6
7
8
9
10
1 2 3 4 5 6 7 8 9 10
20 19 18 17 16 15 14 13 12 11
390
47/
6.3V
3.3/20V
0.01
0.01 180k
1/
6.3V
27k
3.9k
CCD OUT
[
∗
A]
100
Hφ
2
Hφ
1
NC
φ
RG
RD
GND
GND
Vss
V
DSUB
V
GG
Vφ
4
Vφ
3
Vφ
2
φ
SUB
GND
Vφ
1
V
L
GND
V
DD
V
OUT
ICX248AL
(BOTTOM VIEW)
Drive Circuit 1 (substrate bias internal generation mode)
Page 14
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ICX248AL
15V
XSUB
XV2
XV1
XSG1
XV3
XSG2
XV4
Hφ
2
Hφ1
RG
0.01
–9V
3.3/16V
1M
15k
47k
15k
0.1
39k
0.1
270k
27k
56k
0.1
100k
1/35V
1/35V
1/35V
22/16V
22/20V
CXD1267AN
20
19
18
17
16
15
14
13
12
11
1
2
4
5
6
7
8
9
10
1 2 3 4 5 6 7 8 9 10
20 19 18 17 16 15 14 13 12 11
390
47/
6.3V
3.3/20V 0.01
0.01 180k
1/
6.3V
27k
3.9k
CCD OUT
[
∗
A]
100
Hφ
2
Hφ
1
NC
φ
RG
RD
GND
GND
Vss
V
DSUB
V
GG
Vφ
4
Vφ
3
Vφ
2
φ
SUB
GND
Vφ
1
V
L
GND
V
DD
V
OUT
3
ICX248AL
(BOTTOM VIEW)
Drive Circuit 2 (substrate bias external adjustment mode)
Page 15
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ICX248AL
Spectral Sensitivity Characteristics (Includes lens characteristics, excludes light source characteristics)
1000
1.0
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0
500 600 700 800 900400
Wave Length [nm]
Relative Response
Sensor Readout Clock Timing Chart
unit: µs
Odd Field
Even Field
V1 V2
V3 V4
V1 V2
V3 V4
2.5
2.5 2.5 2.5
1.6
33.5
0.2
Page 16
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ICX248AL
Drive Timing Chart (Vertical Sync)
FLD
VD
BLK
HD
V1
V2
V3
V4
CCD
OUT
520
525
1
2
3
4
5
10
15
20
260
265
270
275
280
493
494
1 3 5
2 4 6
1 3 5
2 4 6
494
493
2
1
4
3
6
5
2
1
4
3
6
5
Page 17
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ICX248AL
Drive Timing Chart (Horizontal Sync)
760
768
1
2
3
5
10
20
30
40
1
2
3
5
10
20
22
1
2
3
1
2
3
10
20
HD
BLK
H1
H2
RG
V1
V2
V3
V4
SUB
Page 18
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ICX248AL
Notes on Handling
1) Static charge prevention CCD image sensors are easily damaged by static discharge. Before handling be sure to take the following protective measures. a) Either handle bare handed or use non-chargeable gloves, clothes or material.
Also use conductive shoes. b) When handling directly use an earth band. c) Install a conductive mat on the floor or working table to prevent the generation of static electricity. d) Ionized air is recommended for discharge when handling CCD image sensor. e) For the shipment of mounted substrates, use boxes treated for the prevention of static charges.
2) Soldering a) Make sure the package temperature does not exceed 80°C. b) Solder dipping in a mounting furnace causes damage to the glass and other defects. Use a ground 30W
soldering iron and solder each pin in less than 2 seconds. For repairs and remount, cool sufficiently.
c) To dismount an image sensor, do not use a solder suction equipment. When using an electric desoldering
tool, use a thermal controller of the zero cross On/Off type and connect it to ground.
3) Dust and dirt protection Image sensors are packed and delivered by taking care of protecting its glass plates from harmful dust and dirt. Clean glass plates with the following operation as required, and use them. a) Perform all assembly operations in a clean room (class 1000 or less). b) Do not either touch glass plates by hand or have any object come in contact with glass surfaces. Should
dirt stick to a glass surface, blow it off with an air blower. (For dirt stuck through static electricity ionized
air is recommended.) c) Clean with a cotton bud and ethyl alcohol if the grease stained. Be careful not to scratch the glass. d) Keep in a case to protect from dust and dirt. To prevent dew condensation, preheat or precool when
moving to a room with great temperature differences. e) When a protective tape is applied before shipping, just before use remove the tape applied for
electrostatic protection. Do not reuse the tape.
4) Installing (attaching) a) Remain within the following limits when applying a static load to the package. Do not apply any load more
than 0.7mm inside the outer perimeter of the glass portion, and do not apply any load or impact to limited portions. (This may cause cracks in the package.)
b) If a load is applied to the entire surface by a hard component, bending stress may be generated and the
package may fracture, etc., depending on the flatness of the ceramic portions. Therefore, for installation, use either an elastic load, such as a spring plate, or an adhesive.
Compressive strength
39N
0.9Nm
Upper ceramic
Lower ceramic
29N
Low melting point glass
29N
Shearing strength
Tensile strength Torsional strength
Page 19
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ICX248AL
c) The adhesive may cause the marking on the rear surface to disappear, especially in case the regulated
voltage value is indicated on the rear surface. Therefore, the adhesive should not be applied to this area, and indicated values should be transferred to other locations as a precaution.
d) The upper and lower ceramic are joined by low melting point glass. Therefore, care should be taken not
to perform the following actions as this may cause cracks.
• Applying repeated bending stress to the outer leads.
• Heating the outer leads for an extended period with a soldering iron.
• Rapidly cooling or heating the package.
• Applying any load or impact to a limited portion of the low melting point glass using tweezers or other
sharp tools.
• Prying at the upper or lower ceramic using the low melting point glass as a fulcrum. Note that the same cautions also apply when removing soldered products from boards.
e) Acrylate anaerobic adhesives are generally used to attach CCD image sensors. In addition, cyano-
acrylate instantaneous adhesives are sometimes used jointly with acrylate anaerobic adhesives. (reference)
5) Others a) Do not expose to strong light (sun rays) for long periods. For continuous using under cruel condition
exceeding the normal using condition, consult our company.
b) Exposure to high temperature or humidity will affect the characteristics. Accordingly avoid storage or
usage in such conditions.
c) This CCD image sensor has sensitivity in the near infrared area. Its focus may not match in the same
condition under visible light /near infrared light because of aberration.
Page 20
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ICX248AL
PACKAGE STRUCTURE
20pin DIP (600mil)
0.7
3
11.55 3
0.55
9.0
7.55
V
H
18.0 ± 0.4
1
10
11
20
15.1 ± 0.3
15.24
0° to 9°
1.4
0.25
(R0.7)
(1.0)
11
10
17.6
φ1.4
(4.0)
(1.7)
3.4 ± 0.3
0.7
3
14.6
4.0 ± 0.3
1.27
0.46
0.8
0.83
0.4
0.4
1.778
0.3
20
1
1. “A” is the center of the effective image area.
2. The two points “B” of the package are the horizontal reference.
The point “B'” of the package is the vertical reference.
3. The bottom “C” of the package is the height reference.
4. The center of the effective image area, relative to “B” and “B'” is
(H, V) = (9.0, 7.55) ± 0.15mm.
5. The rotation angle of the effective image area relative to H and V is ± 1°.
6. The height from the bottom “C” to the effective image area is 1.41 ± 0.15mm.
7. The tilt of the effective image area relative to the bottom “C” is less than 60µm.
8. The thickness of the cover glass is 0.75mm, and the refractive index is 1.5.
9. The notch and the hole on the bottom must not be used for reference of fixing.
C
B
~~
B'
~
M
PACKAGE MATERIAL
LEAD TREATMENT
LEAD MATERIAL
PACKAGE WEIGHT
Cer-DIP
TIN PLATING
42 ALLOY
2.6g
A
Package Outline Unit: mm
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