
ICPL2611
HIGH CMR, HIGH SPEED OPTO
ISOLATOR
DESCRIPTION
The ICPL 2611 consists of a GaAsP emitting diode and a 
unique integrated detector. The photons are detected by a 
photodiode and then amplified by a high gain linear 
amplifier that drives a logic gate with a strobable output. 
This output features a Schottky clamped open collector 
output transistor. The circuit is temperature, current and 
voltage compensated. This unique isolator design 
provides maximum DC and AC circuit isolation between 
input and output while achieving LSTTL/TTL circuit 
compatibility. The isolator operational parameters are 
guaranteed from 0°C to 70°C, such that a minimum input 
current of 5 mA will sink an eight gate fan-out (13mA) 
at the output with 5 volt Vcc supplied to the detector. 
This isolation and coupling is achieved with a typical 
propagation delay of 39ns. The enable input provides 
gating of the detector with input sinking and sourcing 
requirements compatible with LSTTL/TTL interfacing 
and a propagation delay of 35ns typical.
FEATURES
l LSTTL/TTL Compatible 
l High Speed 
l Low Input Current Required 
l Guaranteed Performance over Temperature 
l 2500 V 
l Internal Shield for High Common Mode Rejection
 Withstand Test Voltage (1 Minute)
RMS
2.54
Dimensions in mm
1 
2 
3
*
4
* ICPL2601 NOISE SHIELD
7.62
1.3
6.9
6.3
9.7
9.1
4.0
3.6
0.5
0.3
0.5
3.3
1.3
TRUTH TABLE
INPUT  ENABLE   OUTPUT 
H H L 
L H H
H L H 
L L H
ABSOLUTE MAXIMUM RATINGS 
(25 °C unless otherwise noted)
Storage Temperature ___________ -55 to +1250C 
Operating Temperature _________ -0°C to +700C 
Lead Solder Temperature ________ 2600C for 10secs 
(1.6mm below the seating plate)
INPUT DIODE
A 0.1µF bypass
capacitor must be
connected between
pins 8 and 5 ( See
note 1)
V
15° 
Max
CC
8 
7 
6 
5
GND
OPTION SM
 SURFACE MOUNT
1.2
0.6
 1.4
 0.9
OPTION G
 7.62
0.3
10.2
 9.5
10.16
ISOCOM COMPONENTS LTD
Unit 25B, Park View Road West,
Park View Industrial Estate, Brenda Road
Hartlepool, Cleveland, TS25 1YD
Tel: (01429) 863609 Fax: (01429) 863581
Forward Current 20mA (2) 
Reverse Voltage ________________ 5V 
Enable Voltage _________________5.5V
(Not to exceed Vcc by more that 500mV)
OUTPUT PHOTOTRANSISTOR
Supply VoltageVcc 7V (1 Min Max) 
Current - lo _____________________ 25mA 
Collector Power Dissipation _______40mW 
Collector Voltage - Vo ____________7V
All electrical parameters are 100 % tested 
Specifications are guaranteed to a cumulative 0.65% 
AQL
ISOCOM INC
1024 S. Greenville Ave, Suite 240,
Allen, TX 75002  USA
Tel: (214) 495-0755 Fax: (214) 495-0901
  e-mail  info@isocom.com
 http://www.isocom.com
DA91019-AAS/01
 

ELECTRICAL CHARACTERISTICS (Over recommended temperature 0°C to70°C unless specified)
PARAMETER
High Level Output Current I 
Low Level Output Voltage V
High Level Enable Current I 
Low Level Enable Current I 
High Level Supply Current I 
Low Level Supply Current I
OH
OL
EH
EL
CCH
CCL
Input - Output Insulation Leakage 
Current - I
IO
Withstand Insulation Test Voltage 
V
ISO
Resistance - R 
Capacitance - C 
Input Forward Voltage - V
IO
IO
F
Input Reverse Breakdown Voltage
- B
VR
Input Capacitance - C
IN
Current Transfer Ratio - CTR 
High Level Enable Voltage - V 
Low Level Enable Voltage - V 
 Input Diode Temperature 
Coefficient
EH
EL
    ∆VF
        ∆TA
MIN
2500
5
2.0
TYP*
7
0.4
-1.0
-1.6 
10 
15
10
0.6
1.5
60
700
-1.4
12
MAX UNITS
0.6
µA
V
250
mA 
mA
-2.0 
mA
15
mA
19
 µA
1.0
V
ohm
pF
1.75
V 
V
pF
%
V
V
0.8
RMS
TEST CONDITIONS
Vcc =5.5V, Vo = 5.5V. IF = 250µA VE= 2.0V
Vcc =5.5V, IF = 5mA, VE = 2.0V 
I0L (sinking) = 13mA
Vcc =5.5V, VE = 2.0V 
Vcc =5.5V, VE = 0.5V
Vcc =5.5V, IF = 0, VE = 0.5V
Vcc =5.5V, IF =10 mA, VE = 0.5V
Relative Humidity = 45% 
TA = 25 °C, t = 5s, VI0 = 3000 V DC mA,
RH < 50%, TA = 25°C, t = 1 Min
VI0 = 500V, t = 5s, TA = 25 °C
f = 1MHz, TA = 25 °C
IF = 10mA, TA = 25°C 
IR = 10 µA, TA = 25°C
VF = 0, f, = 1MHz
IF= 5mA, RL= 100Ω
Vcc =5.5V, IF =10 mA
Vcc =5.5V, IF =10 mA 
lF = 10mA,
FIG   NOTE
3
3
3 
3
12 
11 
11
*All typicals are at V
1 Bypassing of the power supply line is required, with a 0.01 µ F ceramic disc capacitor adjacent to
each isolator. The power supply bus for the isolator(s) should be seperate from the bus for any 
active loads. Otherwise a larger value of bypass capacitor (up to 0.1 µ F)may be needed to supress 
regenerative feedback via the power supply.
2 Peaking circuits may produce transient input currents up to 50mA, 50ns maximum pulse width,
provided average current does not exceed 20mA
3 Device considered a two terminal device; pins 1, 2, 3, and 4 shorted together, and pins 5, 6, 7
and 8 shorted together.
4 The t 
input pulse to the 1.5V point on the trailing edge of the output pulse.
5 The t 
input pulse to 1.5V point on the leading edge of the output pulse.
6 The t
input pulse to the 1.5V point on the trailing edge of the output pulse.
7 The t
input pulse to the 1.5V point on the leading edge of the output pulse.
8 CMH is the maximum tolerable rate of rise of the common mode voltage to assure that the output
will remain in a high logic state (ie Vout> 2.0V).
9 CML is the maximum tolerable rate of fall of the common mode voltage to assure that the output
will remain in a low logic state (ie Vout< 0.8V)
10 For sinusoidal voltages  dvCM        = π fCMVCM(p-p)
11 No external pull up is required for a high logic state on the enable input. 
12 DC current transfer ratio is defined as the ratio of the output collector current to the forward bias input
current times 100%.
= 5V, T
CC 
 propagation delay is measured from the 3.75 mA point on the trailing edge of the
PLH
 propagation delay is measured from the 3.75mA point on the leading edge of the
PHL
enable propagation delay is measured from the 1.5V point of the trailing edge of the
ELH
enable propagation delay is measured from the 1.5V point on the leading edge of the
EHL 
 = 25°C
A
( )
   dt    max
DA91019-AAS/02
 

SWITCHING CHARACTERISTICS (AT TA = 25°C, VCC = 5V )
PARAMETER
TYP*
MAX
UNITS
MIN
Propagation Delay to High Output 35 75 ns 
Level - t
 PLH
Propagation Delay Time to Low 39 75 ns 
Output Level - t 
Output rise time (10 -90%) - t 
Output Fall Time (90 - 10% - t
PHL
r
f
27 ns
16 ns 
Propagation Delay Time of 25 ns 
Enable from VEH to VEL - t
ELH
Propagation Delay time of Enable 14 ns 
from VEL to to VEH - t
EHL
Common Mode Transient Immunity 
at High Output Level -CM
H
      12000 V/µs
Common Mode Transient Immunity       11000 V/µs 
at Low Output Level - CM
L
RECOMMENDED OPERATING CONDITIONS
SYM MIN MAX UNITS
TEST CONDITIONS
RL = 350Ω CL = 15pF, 
1F = 7.5mA 
RL = 350Ω CL = 15 pF, 
IF = 7.5mA
RL =350ΩCL = 15pF
IF= 7.5mA 
RL = 350Ω CL = 15pF,
IF= 7.5mA, VEH = 3.0V, VEL = 0 
RL = 350 Ω CL = 15 pF,
IF = 7.5mA, V 
VCM =400V (peak), RL = 350Ω
IF = 0mA, Vo (min) = 2V 
VCM = 400V (peak) RL = 350Ω 
IF = 7.5mA, Vo (max) = 0.8V
= 3.0V, VEL = 0
EH 
FIG   NOTE
4
5
6
7
8,10
9,10
Current, Low Level I 
Input Current, High Level I 
High Level Enable Voltage V 
Low Level Enable Voltage (Output High) V 
Supply Voltage, Output V
FL
FH
EH
EL
CC
0 250 µA
6.3* 15 mA
2.0 V 
0 0.8 V
4.5 5.5 V 
Fan Out (TTL) N 8 
Operating Temperature T
A
0 70  °C
*6.3mA condition permits at least 20% CTR degradation guardband 
Initial switching threshold is 5mA or less
Pulse
Generator
ZO = 50Ω
tr = 5ns
Input
Monitoring
Node
47Ω
TEST CIRCUIT FOR t
.1 µF
Bypass
+5V
C
L
R
L
Output V
Monitoring
Node
O
*CL is approximately 15 pF which includes
probe and stray wiring capacitance
1
I
F
2
3
4
8
7
6
5
I
F
V
PHL
Input
O
Output
 AND t
t
PHL
PLH
CC
V
IF = 7.5mA
IF = 3.75mA
t
PLH
1.5V
DA-91019-AAS/01