Dual J-K negative edge-triggered
flip-flops without reset
Product specification
IC15 Data Handbook
1991 Feb 14
Page 2
Philips Semiconductors Product specification
Dual J-K negative edge-triggered flip-flops
without reset
FEA TURE
•Industrial temperature range available (–40°C to +85°C)
DESCRIPTION
The 74F113, dual negative edge-triggered JK-type flip-flop, features
individual J, K, clock (CP
outputs. The asynchronous S
to the steady state levels as shown in the function table regardless
of the level at the other inputs.
A high level on the clock (CP
data will be accepted. The logic levels at the J and K inputs may be
allowed to change while the CP
according to the function table as long as minimum setup and hold
times are observed. Output changes are initiated by the high-to-low
transition of the CP
TYPETYPICAL f
74F113100MHz15mA
ORDERING INFORMATION
DESCRIPTION
14-pin plastic DIPN74F113NI74F1 13NSOT27–1
14-pin plastic SON74F113DI74F1 13DSOT108–1
), set (SD) inputs, true and complementary
D input, when low, forces the outputs
) input enables the J and K inputs and
is high and flip-flop will perform
.
COMMERCIAL RANGE
VCC = 5V ±10%,
T
= 0°C to +70°C
amb
max
ORDER CODE
PIN CONFIGURATION
CP
1
0
2
K0
J0
3
S
D0
4
Q0
5
0
6
Q
GND
TYPICAL SUPPLY CURRENT (TOTAL)
INDUSTRIAL RANGE
VCC = 5V ±10%,
T
= –40°C to +85°C
amb
14
13
12
11
10
9
87
SF00140
V
CP
K1
J1
SD1
Q1
Q1
74F1 13
CC
1
PKG. DWG. #
INPUT AND OUTPUT LOADING AND FAN-OUT TABLE
PINSDESCRIPTION74F (U.L.) HIGH/LOWLOAD VALUE HIGH/LOW
H = High-voltage level
h = High-voltage level one setup time prior to high-to-low
clock transition
L = Low-voltage level
l= Low-voltage level one setup time prior to high-to-low clock
transition
q = Lower case indicate the state of the referenced output
prior to the high-to-low clock transition
X = Don’t care
↓ = high-to-low clock transition
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limits set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free-air temperature range.)
SYMBOL
V
CC
V
IN
I
IN
V
OUT
I
OUT
amb
T
stg
Supply voltage–0.5 to +7.0V
Input voltage –0.5 to +7.0V
Input current–30 to +5mA
Voltage applied to output in High output state–0.5 to V
Current applied to output in Low output state40mA
Dual J-K negative edge-triggered flip-flops
without reset
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
LIMITS
MINTYP2MAX
V
= MIN, V
p
p
V
IK
I
I
I
IH
Input clamp voltageVCC = MIN, II = I
Input current at maximum input voltageVCC = MAX, VI = 7.0V100µA
High-level input currentVCC = MAX, VI = 2.7V20µA
VIH = MIN
V
= MIN, V
VIH = MIN
= MAX
= MAX
IK
OH
OL
=
=
±10%V
±5%V
±10%V
±5%V
Jn, Kn–0.6mA
I
IL
Low-level input current
CPn
VCC = MAX, VI = 0.5V
SDn–3.0mA
I
OS
I
CC
Short-circuit output current
Supply current4 (total)VCC = MAX1521mA
3
VCC = MAX-60–150mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
3. Not more than one output should be shorted at a time. For testing I
CC
= 5V, T
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
amb
= 25°C.
, the use of high-speed test apparatus and/or sample-and-hold
OS
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
4. Measure I
with the clock input grounded and all outputs open, then with Q and Q outputs high in turn.
CC
tests should be performed last.
OS
2.5V
CC
2.73.4V
CC
CC
CC
–0.73–1.2V
74F113
0.300.50V
0.300.50V
–2.4mA
AC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOLPARAMETER
TEST
CONDITION
VCC = +5.0V
T
= +25°C
amb
= 50pF
C
L
R
= 500Ω
L
VCC = +5.0V ± 10%
T
= 0°C to +70°C
amb
= 50pF
C
L
R
= 500Ω
L
VCC = +5.0V ± 10%
T
= –40°C to +85°C
amb
= 50pF
C
L
R
= 500Ω
L
MINTYP MAXMINMAXMINMAX
f
max
t
PLH
t
PHL
t
PLH
t
PHL
Maximum clock frequencyWaveform 1851008080ns
Propagation delay
CPn to Qn or Q
n
Propagation delay
SDn, to Qn or Qn
Waveform 1
Waveform 2
2.0
2.0
2.0
2.0
4.0
4.0
4.5
4.5
6.0
6.0
6.5
6.5
2.0
2.0
2.0
2.0
7.0
7.0
7.5
7.5
2.0
2.0
2.0
2.0
7.5
7.0
8.0
7.5
AC SETUP REQUIREMENTS
LIMITS
VCC = +5.0V
T
SYMBOLPARAMETER
TEST
CONDITION
amb
C
R
L
L
= +25°C
= 50pF
= 500Ω
MINTYP MAXMINMAXMINMAX
t
(H)
su
tsu(L)
t
(H)
h
t
(L)
h
t
(H)
w
t
(L)
w
t
(L)SDn pulse width, lowWaveform 24.55.05.0ns
w
t
rec
Setup time, high or low
Jn, Kn to CPn
Hold time, high or low
Jn, Kn to CPn
CP pulse width,
high or low
Recovery time
SDn to CPn
Waveform 1
Waveform 1
Waveform 1
4.0
3.5
0.0
0.0
4.5
4.5
Waveform 24.55.05.0ns
VCC = +5.0V ± 10%
T
= 0°C to +70°C
amb
C
= 50pF
L
R
= 500Ω
L
5.0
4.0
0.0
0.0
5.0
5.0
VCC = +5.0V ± 10%
T
= –40°C to +85°C
amb
C
= 50pF
L
R
= 500Ω
L
5.0
4.5
0.0
0.0
5.0
5.0
UNIT
ns
ns
UNIT
ns
ns
ns
1996 Mar 14
4
Page 5
Philips Semiconductors Product specification
Dual J-K negative edge-triggered flip-flops
without reset
AC WAVEFORMS
For all waveforms, VM = 1.5V.
The shaded areas indicate when the input is permitted to change for predictable output performance.
Kn
Jn, Kn
CPn
Qn
Qn
V
V
M
M
Jn
tsu(L)th(L) = 0
V
M
t
PLH
t
PHL
1/f
max
(L)
t
w
V
M
V
M
Waveform 1. Propagation Delay for Data to Output, Data Setup Time and Hold Times, and Clock Width,
and Maximum Clock Frequency
Jn
V
V
M
M
Kn
tsu(H)
tw(H)
V
M
t
(H) = 0
h
V
M
t
PHL
V
M
t
PLH
V
74F113
M
SF00144
Jn, Kn
SDn
CPn
Qn
Qn
t
PLH
t
PHL
tw(L)
V
M
V
M
t
rec
V
M
V
M
V
M
SF00145
Waveform 2. Propagation Delay for Set to Output, Set Pulse Width, and Recovery Time for Set to Clock
1996 Mar 14
5
Page 6
Philips Semiconductors Product specification
Dual J-K negative edge-triggered flip-flops
without reset
TEST CIRCUIT AND WAVEFORMS
V
CC
NEGATIVE
PULSE
V
PULSE
GENERATOR
IN
R
T
Test Circuit for Totem-Pole Outputs
DEFINITIONS:
= Load resistor;
R
L
see AC ELECTRICAL CHARACTERISTICS for value.
= Load capacitance includes jig and probe capacitance;
C
L
see AC ELECTRICAL CHARACTERISTICS for value.
R
= T ermination resistance should be equal to Z
T
pulse generators.
D.U.T.
V
OUT
R
C
L
L
POSITIVE
PULSE
of
OUT
family
74F
90%
10%
amplitude
3.0V
t
w
V
M
10%
)
t
THL (tf
)
t
TLH (tr
90%
V
M
t
t
t
w
TLH (tr
THL (tf
10%
)
)
90%
V
M
V
Input Pulse Definition
INPUT PULSE REQUIREMENTS
V
M
1.5V
rep. rate
1MHz500ns
t
w
90%
M
10%
t
TLHtTHL
2.5ns2.5ns
74F113
AMP (V)
0V
AMP (V)
0V
SF00006
1996 Mar 14
6
Page 7
Philips SemiconductorsProduct specification
Dual J-K negative edge-triggered flip-flops without reset
Dual J-K negative edge-triggered flip-flops without reset
SO14: plastic small outline package; 14 leads; body width 3.9 mmSOT108-1
74F113
1996 Mar 14
8
Page 9
Philips SemiconductorsProduct specification
Dual J-K negative edge-triggered flip-flops without reset
NOTES
74F113
1996 Mar 14
9
Page 10
Philips SemiconductorsProduct specification
Dual J-K negative edge-triggered flip-flops without reset
Data sheet status
Data sheet
status
Objective
specification
Preliminary
specification
Product
specification
Product
status
Development
Qualification
Production
Definition
This data sheet contains the design target or goal specifications for product development.
Specification may change in any manner without notice.
This data sheet contains preliminary data, and supplementary data will be published at a later date.
Philips Semiconductors reserves the right to make chages at any time without notice in order to
improve design and supply the best possible product.
This data sheet contains final specifications. Philips Semiconductors reserves the right to make
changes at any time without notice in order to improve design and supply the best possible product.
[1]
74F113
[1] Please consult the most recently issued datasheet before initiating or completing a design.
Definitions
Short-form specification — The data in a short-form specification is extracted from a full data sheet with the same type number and title. For
detailed information see the relevant data sheet or data handbook.
Limiting values definition — Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or
at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended
periods may affect device reliability.
Application information — Applications that are described herein for any of these products are for illustrative purposes only. Philips
Semiconductors make no representation or warranty that such applications will be suitable for the specified use without further testing or
modification.
Disclaimers
Life support — These products are not designed for use in life support appliances, devices or systems where malfunction of these products can
reasonably be expected to result in personal injury . Philips Semiconductors customers using or selling these products for use in such applications
do so at their own risk and agree to fully indemnify Philips Semiconductors for any damages resulting from such application.
Right to make changes — Philips Semiconductors reserves the right to make changes, without notice, in the products, including circuits, standard
cells, and/or software, described or contained herein in order to improve design and/or performance. Philips Semiconductors assumes no
responsibility or liability for the use of any of these products, conveys no license or title under any patent, copyright, or mask work right to these
products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right infringement, unless
otherwise specified.
Philips Semiconductors
811 East Arques Avenue
P.O. Box 3409
Sunnyvale, California 94088–3409
Telephone 800-234-7381
Copyright Philips Electronics North America Corporation 1998
All rights reserved. Printed in U.S.A.
print codeDate of release: 10-98
Document order number:9397-750-05072
yyyy mmm dd
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