•Industrial temperature range available (–40°C to +85°C)
1
0
CP
2
DESCRIPTION
The 74F112, Dual Negative Edge-Triggered JK-Type Flip-Flop,
feature individual J, K, Clock (CP
inputs, true (Qn) and complementary (Q
The SD and RD inputs, when Low, set or reset the outputs as shown
in the Function Table, regardless of the level at the other inputs.
A High level on the clock (CP
n), Set (SD) and Reset (RD)
n) outputs.
n) input enables the J and K inputs and
K0
J0
3
S
4
D0
5
Q0
0
6
Q
Q
1
data will be accepted. The logic levels at the J and K inputs may be
allowed to change while the CP
n is High and flip-flop will perform
according to the Function Table as long as minimum setup and hold
times are observed. Output changes are initiated by the High-to-Low
transition of the CP
n.
TYPETYPICAL PROPAGATION DELAYTYPICAL SUPPLY CURRENT (TOTAL)
74F112100MHz15mA
ORDERING INFORMATION
ORDER CODE
DESCRIPTION
16-pin plastic DIPN74F112NI74F1 12NSOT38-4
16-pin plastic SON74F112DI74F1 12DSOT109-1
COMMERCIAL RANGE
VCC = 5V ±10%, T
= 0°C to +70°C
amb
VCC = 5V ±10%, T
INDUSTRIAL RANGE
= –40°C to +85°C
amb
16
15
14
13
12
11
107
98GNDQ1
SF00103
V
R
R
CP1
K1
J1
SD1
CC
D0
D1
PKG DWG #
INPUT AND OUTPUT LOADING AND FAN-OUT TABLE
PINSDESCRIPTION74F (U.L.) HIGH/LOWLOAD VALUE HIGH/LOW
H = High voltage level
h = High voltage level one setup time prior to High-to-Low clock transition
L = Low voltage level
l = Low voltage level one setup time prior to High-to-Low clock transition
q = Lower case letters indicate the state of the reference output prior to the High-to-Low clock transition
X = Don’t care
↓ = High-to-Low clock transition
* = Both outputs will be High while both S
D and RD are Low, but the output states are unpredictable if SD and RD go High simultaneously.
SF00106
February 9, 1990
3
Page 4
Philips Semiconductors Product specification
T
Operating free-air temperature range
SYMBOL
PARAMETER
UNIT
T
Operating free-air temperature range
SYMBOL
PARAMETER
TEST CONDITIONS
1
UNIT
VOHHigh-level output voltage
V
VOLLow-level output voltage
V
74F112Dual J-K negative edge-triggered flip-flop
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limits set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free-air temperature range.)
SYMBOL
V
V
I
IN
V
I
OUT
T
CC
IN
OUT
amb
stg
Supply voltage–0.5 to +7.0V
Input voltage –0.5 to +7.0V
Input current–30 to +5mA
Voltage applied to output in High output state–0.5 to V
Current applied to output in Low output state40mA
Short-circuit output current
Supply current (total)
3
4
VCC = MAX–60–150mA
VCC = MAX1521mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
3. Not more than one output should be shorted at a time. For testing I
CC
= 5V, T
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
amb
= 25°C.
, the use of high-speed test apparatus and/or sample-and-hold
OS
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
4. Measure I
with the clock input grounded and all outputs open, with the Q and Q outputs High in turn.
CC
tests should be performed last.
OS
2
MAX
0.350.50
0.350.50
–0.73–1.2V
–2.4mA
February 9, 1990
4
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Philips Semiconductors Product specification
74F112Dual J-K negative edge-triggered flip-flop
AC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOLPARAMETER
f
MAX
t
PLH
t
PHL
t
PLH
t
PHL
Maximum clock frequencyWaveform 1851008080MHz
Propagation delay
CP to Qn or Qn
Propagation delay
SDn, RD to Qn or Qn
AC SETUP REQUIREMENTS
SYMBOLPARAMETER
tS(H)
tS((L)
th(H)
th(L)
tW(H)
t
(L)
W
tW(L)
t
REC
Setup time, High or Low
Jn, Kn to CP
Hold time, High or Low
Jn, Kn to CP
CP Pulse width
High or Low
SDn, RD Pulse width
Low
Recovery time
SDn, RD to CP
VCC = +5.0V
T
TEST
CONDITION
amb
C
R
L
L
= +25°C
= 50pF
= 500Ω
MINTYPMAXMINMAXMINMAX
2.0
Waveform 1
Waveform 2,3
2.0
2.0
2.0
5.0
5.0
4.5
4.5
VCC = +5.0V
T
TEST
CONDITION
amb
C
R
L
L
= +25°C
= 50pF
= 500Ω
MINTYPMAXMINMAXMINMAX
Waveform 1
Waveform 1
Waveform 1
4.0
3.5
0.0
0.0
4.5
4.5
Waveform 2,34.55.05.0ns
Waveform 2,34.55.05.0ns
VCC = +5.0V ± 10%
T
amb
6.5
6.5
6.5
6.5
2.0
2.0
2.0
2.0
VCC = +5.0V ± 10%
T
amb
5.0
4.0
0.0
0.0
5.0
5.0
= 0°C to +70°C
C
= 50pF
L
= 500Ω
R
L
7.5
7.5
7.5
7.5
LIMITS
= 0°C to +70°C
C
= 50pF
L
R
= 500Ω
L
VCC = +5.0V ± 10%
T
= –40°C to +85°C
amb
C
= 50pF
L
= 500Ω
R
L
2.0
2.0
1.5
1.5
VCC = +5.0V ± 10%
T
= –40°C to +85°C
amb
C
= 50pF
L
R
= 500Ω
L
5.0
4.0
0.0
0.0
5.0
5.0
7.5
7.5
7.5
7.5
UNIT
ns
ns
UNIT
ns
ns
ns
AC WAVEFORMS
For all waveforms, VM = 1.5V.
Jn, Kn
CPn
Qn
Qn
V
The shaded areas indicate when the input is permitted to change for predictable output performance.
Waveform 1. Propagation Delay for Data to Output, Data Setup Time and Hold Times, and Clock Pulse Width
February 9, 1990
M
ts(L)th(L)
V
M
V
M
t
PLH
t
PHL
tw(L)
V
ts(H)th(H)
f
max
V
M
V
M
V
M
(H)
t
w
V
M
V
M
t
PHL
t
M
V
PLH
M
V
M
SF00107
5
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Philips Semiconductors Product specification
74F112Dual J-K negative edge-triggered flip-flop
Jn, Kn
t
PLH
t
PHL
tw(L)
V
M
t
REC
V
M
V
M
V
M
SF00108
SDn
CPn
Qn
Qn
V
M
Waveform 2. Propagation Delay for Set to Output, Set Pulse Width, and Recovery Time for Set to Clock
Jn, Kn
t
PHL
t
PLH
tw(L)
V
M
t
REC
V
M
V
M
RDn
CPn
Qn
V
M
Waveform 3. Propagation Delay for Reset to Output, Reset Pulse Width, and Recovery Time for Reset to Clock
February 9, 1990
Qn
V
M
SF00109
6
Page 7
Philips Semiconductors Product specification
74F112Dual J-K negative edge-triggered flip-flop
TEST CIRCUIT AND WAVEFORMS
V
CC
PULSE
GENERATOR
V
IN
R
T
D.U.T.
V
OUT
R
C
L
L
Test Circuit for Totem-Pole Outputs
DEFINITIONS:
= Load resistor;
R
L
see AC ELECTRICAL CHARACTERISTICS for value.
= Load capacitance includes jig and probe capacitance;
SO16: plastic small outline package; 16 leads; body width 3.9 mmSOT109-1
74F112
1990 Feb 09
9
Page 10
Philips SemiconductorsProduct specification
Dual J-K negative edge-triggered flip-flop
Data sheet status
Data sheet
status
Objective
specification
Preliminary
specification
Product
specification
Product
status
Development
Qualification
Production
Definition
This data sheet contains the design target or goal specifications for product development.
Specification may change in any manner without notice.
This data sheet contains preliminary data, and supplementary data will be published at a later date.
Philips Semiconductors reserves the right to make chages at any time without notice in order to
improve design and supply the best possible product.
This data sheet contains final specifications. Philips Semiconductors reserves the right to make
changes at any time without notice in order to improve design and supply the best possible product.
[1]
74F112
[1] Please consult the most recently issued datasheet before initiating or completing a design.
Definitions
Short-form specification — The data in a short-form specification is extracted from a full data sheet with the same type number and title. For
detailed information see the relevant data sheet or data handbook.
Limiting values definition — Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or
at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended
periods may affect device reliability.
Application information — Applications that are described herein for any of these products are for illustrative purposes only. Philips
Semiconductors make no representation or warranty that such applications will be suitable for the specified use without further testing or
modification.
Disclaimers
Life support — These products are not designed for use in life support appliances, devices or systems where malfunction of these products can
reasonably be expected to result in personal injury . Philips Semiconductors customers using or selling these products for use in such applications
do so at their own risk and agree to fully indemnify Philips Semiconductors for any damages resulting from such application.
Right to make changes — Philips Semiconductors reserves the right to make changes, without notice, in the products, including circuits, standard
cells, and/or software, described or contained herein in order to improve design and/or performance. Philips Semiconductors assumes no
responsibility or liability for the use of any of these products, conveys no license or title under any patent, copyright, or mask work right to these
products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right infringement, unless
otherwise specified.
Philips Semiconductors
811 East Arques Avenue
P.O. Box 3409
Sunnyvale, California 94088–3409
Telephone 800-234-7381
Copyright Philips Electronics North America Corporation 1998
All rights reserved. Printed in U.S.A.
print codeDate of release: 10-98
Document order number:9397-750-05071
yyyy mmm dd
10
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