Datasheet HY62256ALLP-70, HY62256ALLP-85, HY62256ALLR1-55, HY62256ALLR1-70, HY62256ALLR1-85 Datasheet (HEI)

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HY62256A-(I) Series
32Kx8bit CMOS SRAM
Description Features
The HY62256A/HY62256A-I is a high-speed, low power and 32,786 x 8-bits CMOS Static Random Access Memory fabricated using Hyundai's high performance CMOS process technology. The HY62256A/HY62256A-I has a data retention mode that guarantees data to remain valid at the minimum power supply voltage of 2.0 volt. Using the CMOS technology, supply voltages from 2.0 to 5.5 volt has little effect on supply current in the data retention mode. The HY62256A/HY62256A-I is suitable for use in low voltage operation and battery back-up application.
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Fully static operation and Tri-state outputs
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TTL compatible inputs and outputs
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Low power consumption
-2.0V(min.) data retention
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Standard pin configuration
-28 pin 600 mil PDIP
-28 pin 330 mil SOP
-28 pin 8x13.4 mm TSOP-1 (standard and reversed)
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Product No.
Voltage
(V)
Speed
(ns)
Operation
Current(mA)
Standby
Current(uA)
Temperature
(°C)
L LL HY62256A 5.0 55/70/85 50 1mA 100 25 0-70(Normal) HY62256A-I 5.0 55/70/85 50 1mA 100 - -40-85(E.T.) Note
1. E T. Extended Temperature, Normal: Normal Temperature
2. Current value is max.
Features | Pins | Ratings | Timing | Package | Ordering
3101 North First Street, San Jose, CA 95134
Phone: 408-232-8000 URL: http://www.hea.com/
SRAM Data Sheets | Memory Products | email: [email protected]
Copyright © 1997 Hyundai Electronics America.
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HYUNDAI ELECTRONICS AMERICA HY62256A-(I) Series 32Kx8bit CMOS SRAM
PIN INFORMATION
PIN CONNECTION
BLOCK DIAGRAM
PIN DESCRIPTION
Pin Name Pin Function
/CS Chip Select /WE Write Enable /OE Output Enable A0-A14 Address Inputs I/O1-I/O8 Data Input/Output Vcc Power(+5.0V) Vss Ground
Features | Pins | Ratings | Timing | Package | Ordering
3101 North First Street, San Jose, CA 95134
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Phone: 408-232-8000 URL: http://www.hea.com/
SRAM Data Sheets | Memory Products | email: [email protected]
Copyright © 1997 Hyundai Electronics America.
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HYUNDAI ELECTRONICS AMERICA HY62256A-(I) Series 32Kx8bit CMOS SRAM
RATINGS INFORMATION
ABSOLUTE MAXIMUM RATING (1)
Symbol Parameter Rating Unit Remark
VCC VIN VOUT
Power Supply Input/Output Voltage
-0.5 to 7.0 V
TA Operating Temperature
0 to 70 °C HY62256A
-40 to 85 °C HY62256A-I TSTG Storage Temperature -65 to 150 °C PD Power Dissipation 1.0 W IOUT Data OutPut Current 50 mA
TSOLDER
Lead Soldering Temperature & Time
260 /10 °C / sec
Note
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is stress rating only and the functional operation of the device under these or any other conditions above those indicated in the operation of this specification is not implied. Exposure to the absolute maximum rating conditions for extended period may affect reliability.
RECOMMENDED DC OPERATING CONDITIONS
TA=0°C to 70°C / TA= -40°C to 85°C (E.T.)
Symbol Parameter Min Typ Max Unit
VCC Power Supply Voltage 4.5 5.0 5.5 V VIH Input High Voltage 2.2 - VCC+0.5 V VIL Input Low Voltage -0.5(1) - 0.8 V Note
1. VIL = -3.0V for pulse width less than 30ns
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TRUTH TABLE
/CS /WE /OE MODE I/O OPERATION
H X X Standby High-Z L H H Output Disabled High-Z L H L Read Data Out L L X Write Data In Note:
1. H=VIH, L=VIL, X=Don't Care
Features | Pins | Ratings | Timing | Package | Ordering
DC CHARACTERISTICS Vcc = 5V ?% TA = 0°C to 70°C (Normal) / -40°C to 85°C (E.T.) unless otherwise
specified
Symbol Parameter Test Condition Min Typ Max Unit
ILI Input Leakage Current Vss <= VIN <= Vcc -1 - 1 uA
ILO Output Leakage Current
Vss <= VOUT <= Vcc /CS=VIH or /OE=VIH or /WE = VIL
-1 - 1 uA
Icc
Operating Power Supply Current
/CS= VIL, VIN=VIH or VIL, II/O= 0mA
- 30 50 mA
Icc1
Average Operating Current
/CS = VIL Min. Duty Cycle = 100%, II/O =0mA
- 40 70 mA
ISB
TTL Standby Current (TTL Inputs)
/CS = VIH VIN = VIH or VIL
- 0.4 2 mA
ISB1
CMOS Standby Current (CMOS Input)
HY62256A
/CS >= Vcc-
0.2V VIN <= 0.2V or VIN >= VCC-0.2V
- - 1 mA L - 2 100 uA LL - 1 25 uA
HY62256A-I
- - 1 mA L - 2 100 uA
VOL Output Low Voltage IOL= 2.1 mA - - 0.4 V VOH Output High Voltage IOH = 1mA 2.4 - - V Note: Typical values are at Vcc = 5.0V TA = 25°C
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AC CHARACTERISTICS
Vcc = 5V(±)10%, TA = 0°C to 70°C (Normal)/ -40°C to 85°C (E.T.) unless otherwise specified.
# Symbol Parameter
-55 -70 -85 Unit
Min. Max. Min. Max. Min. Max. READ CYCLE 1 tRC Read Cycle Time 55 - 70 - 85 - ns 2 tAA Address Access Time - 55 - 70 - 85 ns 3 tACS Chip Select Access Time - 55 - 70 - 85 ns
4 tOE
Output Enable to Output Valid
- 30 - 35 - 45 ns
5 tCLZ
Chip Select to Output in Low Z
5 - 5 - 5 - ns
6 tOLZ
Output Enable to Output in Low Z
5 - 5 - 5 - ns
7 tCHZ
Chip Deselection to Output in High Z
0 20 0 30 0 30 ns
8 tOHZ
Out Disable to Output in High Z
0 20 0 30 0 30 ns
9 tOH
Output Hold from Address Change
5 - 5 - 5 - ns WRITE CYCLE
10 tWC Write Cycle Time 55 - 70 - 85 - ns 11 tCW
Chip Selection to End of Write
50 - 65 - 75 - ns
12 tAW
Address Valid to End of Write
50 - 65 - 75 - ns 13 tAS Address Set-up Time 0 - 0 - 0 - ns
14 tWP Write Pulse Width 40 - 50 - 55 - ns 15 tWR Write Recovery Time 0 - 0 - 0 - ns 16 tWHZ Write to Output in High Z 0 20 0 30 0 30 ns 17 tDW Data to Write Time Overlap 25 - 35 - 40 - ns 18 tDH Data Hold from Write Time 0 - 0 - 0 - ns
19 tOW
Output Active from End of Write
5 - 5 - 5 - ns
AC TEST CONDITIONS
TA = 0°C to 70°C (Normal) / -40°C to 85°C (E.T.) unless otherwise specified.
PARAMETER VALUE
Input Pulse Level 0.8V to 2.4V Input Rise and Fall Time 5ns Input and Output Timing Reference Levels 1.5V
Output Load
70/85/100ns CL = 100pF + 1TTL Load 55ns CL = 50pF + 1TTL Load
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AC TEST LOADS
Note: Including jig and scope capacitance
CAPACITANCE
TAA= 25 °C, f = 1.0MHz
Symbol Parameter Condition Max Unit
CIN Input Capacitance VIN = 0V 6 pF CI/O Input/Output Capacitance VI/O= 0V 8 pF Note: These parameters are sampled and not 100% tested
Features | Pins | Ratings | Timing | Package | Ordering
3101 North First Street, San Jose, CA 95134
Phone: 408-232-8000 URL: http://www.hea.com/
SRAM Data Sheets | Memory Products | email: [email protected]
Copyright © 1997 Hyundai Electronics America.
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HYUNDAI ELECTRONICS AMERICA HY62256A-I 32K x 8bit CMOS SRAM
TIMING INFORMATION
TIMING DIAGRAM
READ CYCLE 1
Note (READ CYCLE):
1. tCHZ and tOHZ are defined as the time at which the outputs achieve the open circuit conditions and are not referenced to output voltage levels.
2. At any given temperature and voltage condition, tCHZ max. is less than tCLZ min. both for a given device and from device to device.
3. /WE is high for the read cycle.
READ CYCLE 2
Note (READ CYCLE):
1. /WE is high for the read cycle.
2. Device is continuously selected /CS= VIL.
3. /OE =VIL.
WRITE CYCLE 1 (/OE Clocked)
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WRITE CYCLE 2 (/OE Low Fixed)
Notes (WRlTE CYCLE):
1. A write occurs during the overlap of a low /CS and a low /WE. A write begins at the latest transition among /CS going low and /WE going low: A write ends at the earliest transition among /CS going high and /WE going high. tWP is measured from the beginning of write to the end of write.
2. tcw is measured from the later of /CS going low to the end of write .
3. tAS is measured from the address valid to the beginning of write.
4. tWR is measured from the end of write to the address change. tWR is applied in case a write ends as /CS, or /WE going high.
5. If /OE and /WE are in the read mode during this period, and the I/O pins are in the output low-Z state, input of opposite phase of the output must not be applied because bus contention can occur.
6. If /CS goes low simultaneously with /WE going low, or after /WE going low, the outputs remain in high impedance state.
7. DOUT is the same phase of latest written data in this write cycle.
8. DOUT is the read data of the new address.
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DATA RETENTION CHARACTERISTIC
TA= 0°C to 70°C (normal) /-40°C to 85°C (E.T.)
Symbol Parameter Test Condition Min Typ Max Unit
VDR Vcc for Data Re! ention
/CS >= Vcc-0.2V Vss <= VIN <= Vcc
2 - - V
ICCDR
Data Retention Current
HY62256A
Vcc = 3.0V /CS >= Vcc
-0.2V Vss <= VIN <= Vcc
L - 1 50 uA LL - 1 15(2) uA
HY62256A-1 L - 1 50 uA
tCDR
Chip Disable to Data Retention Time
See Data Retention Timing Diagram
0 - - ns
tR Operating Recovery Time tRC(3) - - ns Notes
1. Typical values are under the condition of TA = 25°C
2. 3uA max. at TA= 0°C to 40°C
3. tRC is read cycle time.
Data Retention Timing Diagram
RELIABILITY SPEC.
TEST MODE TEST SPEC.
ESD
HBM MM
>= 2000V >= 250V
LATCH-UP
<= -100mA >= 100mA
Features | Pins | Ratings | Timing | Package | Ordering
3101 North First Street, San Jose, CA 95134
Phone: 408-232-8000 URL: http://www.hea.com/
SRAM Data Sheets
|
Memory Products
|
Copyright © 1997 Hyundai Electronics America.
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HYUNDAI ELECTRONICS AMERICA HY62256A-(I) Series 32Kx8bit CMOS SRAM
PACKAGE INFORMATION
28pin 600mil Dual In-Line Package(P)
28pin 330mil Small Outline Package(J)
28pin 8X13.4mm Thin Small Outline Package Standard(T1)
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28pin 8X13.4mm Thin Small Outline Package SReversed(R1)
Features | Pins | Ratings | Timing | Package | Ordering
3101 North First Street, San Jose, CA 95134
Phone: 408-232-8000 URL: http://www.hea.com/
SRAM Data Sheets | Memory Products | email: [email protected]
Copyright © 1997 Hyundai Electronics America.
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HYUNDAI ELECTRONICS AMERICA HY62256A-(I) Series 32Kx8bit CMOS SRAM
ORDERING INFORMATION
Part No. Speed Power Temp. Package
HY62256AP 55/70/85 PDIP HY62256ALP 55/70/85 L-part PDIP HY62256ALLP 55/70/85 LL-part PDIP HY62256AJ 55/70/85 SOP HY62256ALJ 55/70/85 L-part SOP HY62256ALLJ 55/70/85 LL-part SOP HY62256AT1 55/70/85 TSOP-I Standard HY62256ALT1 55/70/85 L-part TSOP-I Standard HY62256ALLT1 55/70/85 LL-part TSOP-I Standard HY62256AR1 55/70/85 TSOP-I Reversed HY62256ALR1 55/70/85 L-part TSOP-I Reversed HY62256ALLR1 55/70/85 LL-part TSOP-I Reversed HY62256AP-I 55/70/85 E.T. PDIP HY62256ALP-I 55/70/85 L-part E.T. PDIP HY62256AJ-I 55/70/85 E.T. SOP HY62256ALJ-I 55/70/85 L-part E.T. SOP HY62256AT1-I 55/70/85 E .T. TSOP-I HY62256ALT1-I 55/70/85 L-part E.T. TSOP-I HY62256AR2-I 55/70/85 E.T. TSOP-I Reversed HY62256ALR2-I 55/70/85 L-part E.T. TSOP-I Reversed
Features | Pins | Ratings | Timing | Package | Ordering
3101 North First Street, San Jose, CA 95134
Phone: 408-232-8000 URL: http://www.hea.com/
SRAM Data Sheets | Memory Products | email: [email protected]
Copyright © 1997 Hyundai Electronics America.
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