Datasheet HSN-500F, HSN-500L Datasheet (MAXWELL)

Download

Page 1

HSN-500

Nuclear Event Detector

BIT

FEATURES:

• Detects ionizing radiation pulses

• Tested/certified detection threshold level

• Adjustable circumvention period

• 100% testable with built-in test

• Detection threshold adjustability

• Single +5V operation

• Designed-in radiation hardness

• Compliant to MIL-PRF-38534 Class H

• Flat pack (F) or DIP (L) packages

RADIATION HARDNESS C

HARACTERISTICS

• Dose Rate (operate-through): 1 x 1012 rad(Si)/sec

• Total Dose: 1 x 10

• Neutron Fluence: 5 x 10

• Approximate Detection Range: 2 x 105 - 2 x 107 rad(Si)/sec

rad(Si)

n/cm

8 9 14 1

Detector

(Pin Diode)

LED

Threshold

Adjust

Amplifier Pulse Timer

GND

457

CRC

Logic Diagram

DESCRIPTION:

Maxwell Technologies’ HSN-500 radiation-hardened Hybrid Nuclear Event Detector (NED) senses ionizing radiation pulses generated by a nuclear event, such as the detonation of a nuclear weapon, and rapidly switches its output from the normal high state to a low state with a propagation delay time of less than 20 ns. The active low Nuclear Event Detection signal (NED to initiate a wide variety of circumvention functions, thus preventing upset and burnout of electronic components. The NED is also used to initiate both hardware and software recovery. This high-speed, 14-pin hybrid detector is used in electronic systems as a general-purpose circumvention device to protect memory, stop data processing, and drive power supply switches as well as signal clamps.

The HSN-500 is designed to operate through three critical environments: ionizing dose rate [10

rad(Si)], and neutron fluence [5 x 1013 n/cm2]. In addition, the

[10 device is designed to function throughout the transient neutron pulse. The hybrid’s discrete design ensures a controlled response in these radiation environments as well as immunity to latchup. The detection level and functionality of a sample of each HSN500 production lot are tested in an ionizing dose rate environment. A certificate is provided reporting the test results for the production lot.

rad(Si)/s], gamma total dose

10 k

Ω

NED

Memory

) is used

output

1000555

(858) 503-3300 - Fax: (858) 503-3301 - www.maxwell.com

The detection threshold of the HSN-500 is adjustable within the

range of 2 x 10

rad(Si)/s to 2 x 107 rad(Si)/s. This detection level can be preset by Maxwell or adjusted by the user. Less than a 30% variation in detection threshold can be expected over the entire operating temperature range.

12.19.01 Rev1

All data sheets are subject to change without notice

Page 2

Nuclear Event Detector

PIN NUMBER PIN FUNCTION

HSN-500

TABLE 1. PIN DESCRIPTION

1 Load Voltage, V

2 Nuclear Event Detector, NED

3 No Connection

4 External Capacitor

5 External Capacitor

6 Built In Test, BIT

7 Package Ground and Case

8 PIN Diode Bias, V

9 Threshold Adjust

10 No Connection

11 No Connection

12 No Connection

13 No Connection

14 Hardened Supply Voltage, V

TABLE 2. ELECTRICAL CHARACTERISTICS

PARAMETER SYMBOL CONDITIONS

Hardened Supply Voltage V

Hardened Supply Current

- Standby

- Operational

-55

C < TA < 125°C

VH = 5.5V

Memory

IN MAX UNIT GROUP A

UBGROUP

4.5 5.5 V 1,2,3

120

mA 1,2,3

Load Voltage V

Load Current

- Standby

- Operational

PIN Diode Bias Voltage - Standby

PIN Diode Bias Current - Standby

Built-In-Test (BIT)

3,4

NED

Radiation Propagation Delay Time

1000555

VL = 20V

VIH = 4.0V

= 0.5V

Pin 9 Open, V

= 4.0V

VL = 20V, IOH = -100 µA

= 10 mA

= 100 mA

12.19.01 Rev1

All data sheets are subject to change without notice

-- 20 V 1,2,3

1,2,3

100

2.25

µA mA

4.5 20 V 1,2,3

-- 100 µA 1,2,3

4.0

18.5

5.5 25

0.5 10

0.6

1.0

µA

µs

V 1,2,3

7,8

1,2,3

7,8

1,2,3

9,10,11

1,2,3

-- 20 ns

Page 3

Nuclear Event Detector

HSN-500

Table 2. Notes

1. Standby mode is the normal state of the device, defined as having the NED output (pin 2) in the “high” state.

2. Operational mode is in effect during the timeout period of the NED signal, characterized by having the NED output in the “low” state, causing the greatest current draw of the device.

3. BIT electrical characteristics are not guaranteed over the radiation range.

4. BIT may not meet specification when only a resistor is used to adjust the detection level. To use BIT in this situation, it is advised that a series resistor/capacitor combination is used.

5. Guaranteed but not tested over temperature. Time delay, t pulse to the falling edge of the NED

output at approximately 10 times the detection level.

, is measured at 50% points from the rising edge of the radiation

0.600

0.100 TYP

14 13 12 11 10 9 8

1234567

0.015 ± 0.003

0.795

Flatpack Hybrid Package

HSN-500F

All tolerances are ± 0.005 unless specified

0.500 MIN

0.495

0.010 ± 0.002

0.145 MAX

0.070 ± 0.002

TOP VIEW

0.795

0.600

0.100 TYP

14 13 12 11 10 9 8

1234567

0.016 DIA

0.020

DIP Hybrid Package

HSN-500L

0.300

Memory

0.495

0.145 MAX

0.200

1000555

MECHANICAL DIMENSIONS

Note: All dimensions in inches.

12.19.01 Rev1

All data sheets are subject to change without notice

Page 4

Nuclear Event Detector

Important Notice:

The specifications presented within these data sheets represent the latest and most accurate information available to date. However, these specifications are subject to change without notice and Maxwell Technologies assumes no responsibility for the use of this information.

Maxwell Technologies’ products are not authorized for use as critical components in life support devices or systems without express written approval from Maxwell Technologies.

Any claim against Maxwell Technologies must be made within 90 days from the date of shipment from Maxwell Technologies. Maxwell Technologies’ liability shall be limited to replacement of defective parts.

HSN-500

Product Ordering Options

Model Number

HSN-500

Memory

Feature

Package

Base Product Nomenclature

Option Details

L = Dual In-line Package (DIP) F = Flat Pack

Nuclear Event Detector

1000555

12.19.01 Rev1

All data sheets are subject to change without notice