Datasheet HSN-1000F, HSN-1000L Datasheet (MAXWELL)

HSN-1000

Nuclear Event Detector

BIT

FEATURES:

• Detects ionizing radiation pulses

• 100% tested/certified detection threshold level

• Adjustable circumvention period

• 100% testable with built-in test

• Detection threshold adjustability

• Single +5V operation

• Radiation hardness guaranteed

• Compliant to MIL-PRF-38534 Class H

• Flat pack (F) or DIP (L) packages

RADIATION HARDNESS
C

HARACTERISTICS:

• - Dose Rate (operate-through): 1 x 1012 rad(Si)/sec

• - Total Dose: 1 x 10

• - Neutron Fluence: 5 x 10

• - Approximate Detection Range: 2 x 105 - 2 x 107 rad(Si)/sec

6

rad(Si)

13

n/cm

2

V

B

8 9 14 1

Detector

(Pin Diode)

6

LED

Threshold

Adjust

Amplifier Pulse Timer

GND

V

H

457

CRC

Logic Diagram

DESCRIPTION:

Maxwell Technologies’ HSN-1000 radiation-hardened Hybrid
Nuclear Event Detector (NED) senses ionizing radiation pulses
generated by a nuclear event, such as the detonation of a nuclear
weapon, and rapidly switches its output from the normal high
state to a low state with a propagation delay time of less than
20ns. The active low Nuclear Event Detection signal (NED
used to initiate a wide variety of circumvention functions, thus
preventing upset and burnout of electronic components. The NED
output is also used to initiate both hardware and software recov­ery. This high-speed, 14-pin hybrid detector is used in electronic
systems as a general-purpose circumvention device to protect
memory, stop data processing, and drive power supply switches
as well as signal clamps.

The HSN-1000 is guaranteed to operate through three critical
environments: ionizing dose rate [10

6

dose [10

rad(Si)], and neutron fluence [5 x 1013 n/cm2]. In addi­tion, the device is designed to function throughout the transient
neutron pulse. The hybrid’s discrete design ensures a controlled
response in these radiation environments as well as immunity to
latchup. Each HSN-1000’s detection level and functionality are
tested in an ionizing dose rate environment. A certificate is pro­vided with each serialized hybrid, reporting the radiation test
results and guaranteeing its performance. The device is also lot
qualified in the total dose and neutron environments to ensure
performance.

12

rad(Si)/s], gamma total

V

L

Ω

10 k

2

NED

Memory

) is

1000554

[phone] - Fax: [phone] - www.maxwell.com

The detection threshold of the HSN-1000 is adjustable within the

5

range of 2 x 10

rad(Si)/s to 2 x 107 rad(Si)/s. This detection level
can be preset by Maxwell or adjusted by the user. Less than a
30% variation in detection threshold can be expected over the
entire operating temperature range.

12.19.01 Rev1

All data sheets are subject to change without notice

©2001 Maxwell Technologies

1

All rights reserved.

Nuclear Event Detector

PIN NUMBER PIN FUNCTION

HSN-1000

TABLE 1. PIN DESCRIPTION

1 Load Voltage, V

L

2 Nuclear Event Detector, NED

3 No Connection

4 External Capacitor

5 External Capacitor

6 Built In Test, BIT

7 Package Ground and Case

8 PIN Diode Bias, V

B

9 Threshold Adjust

10 No Connection

11 No Connection

12 No Connection

13 No Connection

14 Hardened Supply Voltage, V

TABLE 2. ELECTRICAL CHARACTERISTICS

PARAMETER SYMBOL CONDITIONS

°

-55

C < TA < 125°C

Memory

H

IN MAX UNIT GROUP A

M

S

UBGROUP

Hardened Supply Voltage V

Hardened Supply Current

- Standby

- Operational

1

2

Load Voltage V

Load Current

- Standby

- Operational

PIN Diode Bias Voltage - Standby

PIN Diode Bias Current - Standby

Built-In-Test (BIT)

1

2

1

V

1

3,4

NED

Radiation Propagation Delay Time

1000554

5

H

I

H

L

I

L

B

I

B

V

IH

I

IH

V

IL

I

IL

t

PW

V

OH

V

OL

t

D

VH = 5.5V

VL = 20V

VIH = 4.0V

V

= 0.5V

IL

Pin 9 Open, V

= 4.0V

IH

VL = 20V, IOH = -100 µA

I

= 10 mA

OL

I

= 100 mA

OL

12.19.01 Rev1

All data sheets are subject to change without notice

4.5 5.5 V 1,2,3

--

--

--

30

120

mA 1,2,3

-- 20 V 1,2,3

1,2,3

--

--

100

2.25

µA
mA

4.5 20 V 1,2,3

-- 100 µA 1,2,3

4.0

--

--

--

10

18.5

--

--

5.5
25

0.5
10

--

--

0.6

1.0

V

mA

V

µA

µs

V 1,2,3

7,8

1,2,3

7,8

1,2,3

9,10,11

1,2,3

-- 20 ns

2

©2001 Maxwell Technologies

All rights reserved.

Nuclear Event Detector

HSN-1000

Table 2. Notes

1. Standby mode is the normal state of the device, defined as having the NED output (pin 2) in the “high” state.

2. Operational mode is in effect during the timeout period of the NED signal, characterized by having the NED output in the “low”
state, causing the greatest current draw of the device.

3. BIT electrical characteristics are not guaranteed over the radiation range.

4. BIT may not meet specification when only a resistor is used to adjust the detection level. To use BIT in this situation, it is
advised that a series resistor/capacitor combination is used.

5. Guaranteed but not tested over temperature. Time delay, t
pulse to the falling edge of the NED

output at approximately 10 times the detection level.

, is measured at 50% points from the rising edge of the radiation

D

0.600

0.100
TYP

14 13 12 11 10 9 8

1234567

0.015 ± 0.003

0.795

Flatpack Hybrid Package

HSN-1000F

All tolerances are ± 0.005 unless specified

0.500
MIN

0.495

0.010 ± 0.002

0.145 MAX

0.070 ± 0.002

TOP VIEW

0.795

0.600

0.100 TYP

14 13 12 11 10 9 8

1234567

0.016
DIA

0.020

DIP Hybrid Package

HSN-1000L

0.300

Memory

0.495

0.145 MAX

0.200

1000554

MECHANICAL DIMENSIONS

Note: All dimensions in inches.

12.19.01 Rev1

All data sheets are subject to change without notice

©2001 Maxwell Technologies

All rights reserved.

3

Nuclear Event Detector

Important Notice:

The specifications presented within these data sheets represent the latest and most accurate information available to
date. However, these specifications are subject to change without notice and Maxwell Technologies assumes no
responsibility for the use of this information.

Maxwell Technologies’ products are not authorized for use as critical components in life support devices or systems
without express written approval from Maxwell Technologies.

Any claim against Maxwell Technologies must be made within 90 days from the date of shipment from Maxwell Tech­nologies. Maxwell Technologies’ liability shall be limited to replacement of defective parts.

HSN-1000

Product Ordering Options

Model Number

HSN-1000

Memory

X

Feature

Package

Base Product
Nomenclature

Option Details

L = Dual In-line Package (DIP)
F = Flat Pack

Nuclear Event Detector

1000554

12.19.01 Rev1

All data sheets are subject to change without notice

©2001 Maxwell Technologies

All rights reserved.

4