Datasheet HRF3205 Datasheet (Fairchild Semiconductor)

Page 1
HRF3205, HRF3205S
Data Sheet December 2001
100A, 55V, 0.008 Ohm, N-Channel, Power MOSFETs
These are N-Channel enhancement mode silicon gate power field effect transistors. They are advanced power MOSFETs designed, tested, and guaranteed to withstand a specified level of energy in the breakdown avalanche mode of operation. All of these power MOSFETs are designed for applications such as switc hi ng r egulators, s w itc hing converters, motor drivers, relay drivers, and drivers for high power bipolar switching transistors requiring high speed and low gate drive power. These types can be operated directly from integrated circuits.
NOTE: Calculated continuous current based on maximum allowable junction temperature. Package limited to 75A continuous, see Figure 9.
Ordering Information
PART NUMBER PACKAGE BRAND
HRF3205 TO-220AB HRF3205 HRF3205S TO-263AB HRF3205S
NOTE: When ordering, use the entir e part number. Add the suffix T to obtain the TO-263AB variant in tape and reel, e.g., HRF3205ST.
Features
• 100A, 55V (See Note)
• Low On-Resistance, r
• Temperature Compensating PSPICE
DS(ON)
= 0.008Ω
®
Model
• Thermal Impedance SPICE Model
• UIS Rating Curve
• Related Literature
- TB334, “Guidelines f or Solde ring Surface Mount Components to PC Boards”
Symbol
D
G
S
Packaging
DRAIN
(FLANGE)
JEDEC TO-220AB JEDEC TO-263AB
SOURCE DRAIN
GATE
GATE
SOURCE
DRAIN (FLANGE)
©2001 Fairchild Semiconductor Corpo ration HRF3205, HRF3205S Rev. B
Page 2
D
HRF3205, HRF3205S
Absolute Maximum Ratings
Drain to Source Voltage (Note 1). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
Drain to Gate Voltage (R
Gate to Source Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
= 20kΩ) (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
GS
TC = 25oC, Unless Othewise Specified
DSS
DGR
GS
55 V 55 V
±20V V
Drain Current
Continuous. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
Pulsed Drain Current (Note 2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
Pulsed Avalanche Rating. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . E
Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . P
Derate Above 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating and Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T
, T
J
STG
D
DM
AS
D
100 390
Figure 10
175
1.17
-55 to 175
Maximum Temperature for Soldering
Leads at 0.063in (1.6mm) from Case for 10s. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T
Package Body for 10s, See Techbrief 334 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T
CAUTION: Stresses above those listed in “A bsolute Maximu m Rating s” may cause per manent d amage to t he device. This is a str ess on ly rating and operation o f the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
L
pkg
300 260
A A
W
W/oC
o
C
o
C
o
C
NOTE:
= 25oC to 150oC.
1. T
J
Electrical Specifications
TC = 25oC, Unless Otherwise Specified
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Drain to Source Breakdown Voltage BV Gate to Source Threshold Voltage V
GS(TH)VGS
Zero Gate Voltage Drain Current I
Gate to Source Leakage Current I Breakdown Voltage Temperature
∆V
(BR)DSS
Coefficient Drain to Source On Resistance r Turn-On Delay Time t
DS(ON)ID
d(ON)
Rise Time t Turn-Off Delay Time t
d(OFF)
Fall Time t Total Gate Charge Q Gate to Source Charge Q Gate to Drain “Miller” Charge Q Input Capacitance C Output Capacitance C Reverse Transfer Capacitance C Internal Source Inductance L
DSSID
DSS
GSS
∆T
J
r
f
g
gs
gd
ISS OSS RSS
S
= 250µA, VGS = 0V 55 - - V
= VDS, ID = 250µA2-4V VDS = 55V, VGS = 0V - - 25 µA V
= 44V, VGS = 0V, TC = 150oC - - 250 µA
DS
VGS = ±20V - - 100 nA
/
Reference to 25oC, ID = 250µA - 0.057 - V
= 59A, VGS = 10V (Figure 4) - 0.0065 0.008 Ω
VDD = 28V, ID ≅ 59A,
= 0.47Ω, VGS = 10V,
R
L
= 2.5Ω
R
GS
-14 - ns
- 100 - ns
-43 - ns
-70 - ns
VDD = 44V, ID ≅ 59A,
= 10V, I
V
GS
(Figure 6)
g(REF)
= 3mA
- - 170 nC
- - 32 nC
- - 74 nC
VDS = 25V, VGS = 0V, f = 1MHz (Figure 5)
- 4000 - pF
- 1300 - pF
- 480 - pF
Measured From the Contact Screw on Tab to Center of Die
Measured From the Drain Lead, 6mm (0.25in) From
Modified MOSFET Symbol Showing the Internal Devices In­ductances
-7.5 - nH
Package to Center of Die
L
Internal Drain Inductance L
Thermal Resistance Junction to Case R Thermal Resistance Junction to
Ambient
Measured From the Source
D
Lead, 6mm (0.25in) From Head­er to Source Bonding Pad
θJC
R
θJA
TO-220 - - 62
G
TO-263 (PCB Mount, Steady State) - - 40
D
L
S
S
-4.5 - nH
- - 0.85
o o o
C/W C/W C/W
©2001 Fairchild Semiconductor Corpo ration HRF3205, HRF3205S Rev. B
Page 3
Source to Drain Diode Specifications
0
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Continuous Source to Drain Current I
Pulsed Source to Drain Current (Note 2) I
HRF3205, HRF3205S
SD
SDM
MOSFET Symbol Showing The Integral Reverse P-N Junction Diode
D
- - 100 (Note 1
A
- - 390 A
G
S
Source to Drain Diode Voltage V Reverse Recovery Time t Reverse Recovered Charge Q
SD
RR
ISD = 59A (Note 4) - - 1.3 V ISD = 59A, dISD/dt = 100A/µs (Note 4) - 110 170 ns
rr
ISD = 59A, dISD/dt = 100A/µs (Note 4) - 450 680 nC
NOTE:
2. Repetitive rating; pulse width limited by maximum junction temperature (See Figure 11)
Typical Performance Curves
1000
V
IN DECENDING ORDER
GS
15V
10V
8.0V
7.0V
6.0V
5.5V
5.0V
100
4.5V
, DRAIN TO SOURCE CURRENT (A)
D
I
10
0.1 1.0 10 10 V
, DRAIN TO SOURCE VOLTAGE (V)
DS
20µs PULSE WIDTH
T
= 25oC
C
FIGURE 1. OUTPUT CHARACTERISTICS FIGURE 2. OUTPUT CHARACTERISTICS
1000
100
, DRAIN TO SOURCE CURRENT (A)
D
I
10
0.1 1 10 100
IN DECENDING ORDER
V
GS
15V 10V
8.0V
7.0V
6.0V
5.5V
5.0V
4.5V
, DRAIN TO SOURCE VOLTAGE (V)
V
DS
20µs PULSE WIDTH
= 175oC
T
C
1000
TJ = 25oC
100
10
, DRAIN TO SOURCE CURRENT(A)
D
I
1
34.567.59
TJ = 175oC
= 25V
V
DS
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
VGS, GATE TO SOURCE VOLTAGE (V)
2.5 ID = 98A, VGS = 10V
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
2.0
1.5
1.0
ON RESISTANCE
0.5
NORMALIZED DRAIN TO SOURCE
0
-80 -40 0 40 80 120 160 200 TJ, JUNCTION TEMPERATURE (oC)
FIGURE 3. TRANSFER CHARACTERISTICS FIGURE 4. NORMALIZED DRAIN TO SOURCE ON
RESISTANCE vs JUNCTION TEMPERATURE
©2001 Fairchild Semiconductor Corpo ration HRF3205, HRF3205S Rev. B
Page 4
HRF3205, HRF3205S
OSS
(Continued)
20
ID = 59A
16
12
8
4
, GATE TO SOURCE VOLTAGE (V)
GS
V
0
0 36 72 108 144 180
Qg, GATE CHARGE (nC)
V
DS
VDS = 28V
= 11V
VDS = 44V
Typical Performance Curves
8000
V
= 0V, f = 1MHz
GS
= CGS + C
C
C, CAPACITANCE (pF)
7000
6000
5000
4000
3000
2000
1000
ISS
C
= C
RSS
C
≈ CDS + C
OSS
0
1
GD
GD
GS
C
ISS
C
C
RSS
VDS, DRAIN TO SOURCE VOLTAGE (V)
10 100
FIGURE 5. CAPACITANCE vs DRAIN TO SOURCE VOLTA GE FIGURE 6. GATE CHARGE WA VEFORMS FOR CONSTANT
GATE CURRENT
1000
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
TJ = 175oC
100
1000
100
10µs
100µs
10
, REVERSE DRAIN CURRENT(A)
SD
I
1
0.5 1.0 1.5 2.0
TJ = 25oC
VSD, SOURCE TO DRAIN VOLTAGE (V)
OPERATION IN THIS AREA MAY BE LIMITED BY r
10
, DRAIN CURRENT (A)
D
I
1
110100
DS(ON)
V
DSS(MAX)
, DRAIN TO SOURCE VOLTAGE (V)
V
DS
= 55V
1ms
10ms
FIGURE 7. SOURCE TO DRAIN DIODE FORWARD VOLTAGE FIGURE 8. FORWARD BIAS SAFE OPERATING AREA
120
90
60
, DRAIN CURRENT (A)
30
D
I
CURRENT LIMITED BY PACKAGE
0
25 50 75 100 125 150 175
TC, CASE TEMPERATURE (oC)
1000
If R = 0 tAV = (L)(IAS)/(1.3*RATED BV
If R ≠ 0 t
= (L/R)ln[(IAS*R)/(1.3*RATED BV
AV
100
STARTING TJ = 150oC
, AVALANCHE CURRENT (A)
AS
I
10
- VDD)
DSS
DSS
STARTING TJ = 25oC
0.1
tAV, TIME IN AVALANCHE (ms)
1101000.01
- VDD) +1]
FIGURE 9. MAXIMUM CONTINUOUS DRAIN CURRENT vs
CASE TEMPERATURE
©2001 Fairchild Semiconductor Corpo ration HRF3205, HRF3205S Rev. B
FIGURE 10. UNCLAMPED INDUCTIVE SWITCHING
CAPABILITY
Page 5
HRF3205, HRF3205S
Typical Performance Curves
10
DUTY CYCLE - DESCENDING ORDER
0.5
0.2
0.1
0.05
0.02
1
0.01
, NORMALIZED
JC
0.1
θ
Z
THERMAL IMPEDANCE
0.01
-5
10
SINGLE PULSE
-4
10
FIGURE 11. NORMALIZED MAXIMUM TRANSIENT THERMAL IMPEDANCE
Test Circuits and Waveforms
TO OBTAIN
VARY t
P
REQUIRED PEAK I
V
GS
AS
R
G
(Continued)
10
V
DS
L
DUT
-3
-2
10
t, RECTANGULAR PULSE DURATION (s)
+
V
DD
-
NOTES: DUTY FACTOR: D = t
PEAK TJ = PDM x Z
-1
10
t
P
I
AS
BV
10
P
θ
DSS
DM
0
JC
1/t2
x R
t
1
t
2
+ T
JC
C
θ
1
10
V
DS
V
DD
0V
P
I
AS
0.01Ω
0
t
AV
t
FIGURE 12. UNCLAMPED ENERGY TEST CIRCUIT FIGURE 13. UNCLAMPED ENERGY WAVEFORMS
V
DD
Q
g(TOT)
Q
gd
Q
gs
V
DS
V
GS
0
I
G(REF)
I
G(REF)
V
DS
R
L
V
GS
+
V
DD
-
DUT
0
FIGURE 14. GATE CHARGE TEST CIRCUIT FIGURE 15. GATE CHARGE WAVEFORM
©2001 Fairchild Semiconductor Corpo ration HRF3205, HRF3205S Rev. B
Page 6
HRF3205, HRF3205S
Test Circuits and Waveforms
V
DS
V
GS
R
GS
V
GS
FIGURE 16. SWITCHING TIME TEST CIRCUIT FIGURE 17. RESISTIVE SWITCHING WAVEFORMS
(Continued)
R
L
DUT
t
ON
t
d(ON)
t
V
DS
+
V
DD
-
0
V
GS
10%
0
r
90%
10%
50%
PULSE WIDTH
t
d(OFF)
90%
t
OFF
50%
t
f
90%
10%
©2001 Fairchild Semiconductor Corpo ration HRF3205, HRF3205S Rev. B
Page 7
PSPICE Electrical Model
SUBCKT HRF3205P3 2 1 3 ; rev 7/ 25/97
CA 12 8 4.9e-9 CB 15 14 4.9e-9 CIN 6 8 3.45e-9
DBODY 7 5 DBODYMOD DBREAK 5 11 D B REAK MOD DPLCAP 10 5 DPLCAPMOD
EBREAK 11 7 17 18 57 EDS 14 8 5 8 1 EGS 13 8 6 8 1 ESG 6 10 6 8 1 EVTHRES 6 21 19 8 1 EVTEMP 20 6 18 22 1
GATE
IT 8 17 1 LDRAIN 2 5 1e-9
LGATE 1 9 2.6e-9 LSOURCE 3 7 1.1e-9 K1 LGATE LSOURCE 0.0085
MMED 16 6 8 8 MMEDMOD MSTRO 16 6 8 8 MSTROMOD MWEAK 16 21 8 8 MWEAKMOD
RBREAK 17 18 RBREAKMOD 1 RDRAIN 50 16 RDRAINMOD 3.5e-4 RGATE 9 20 0.36 RLDRAIN 2 5 10 RLGATE 1 9 26 RLSOURCE 3 7 11 RSLC1 5 51 RSLCMOD 1e-6 RSLC2 5 50 1e3 RSOURCE 8 7 RSOURCEMOD 4.5e-3 RVTHRES 22 8 RVTHRESMOD 1 RVTEMP 18 19 RVTE MPMOD 1
LGATE
1
RLGATE
RGATE
9
CA
HRF3205, HRF3205S
DPLCAP
10
RSLC2
­6
ESG
8
EVTHRES
+
+
-
EVTEMP +
-
18 22
20
S1A
12
13
8
S1B
EGS EDS
13
19
8
6
CIN
S2A
14 13
+
+
-
-
15
S2B
CB
+
6 8
5 8
-
5
RSLC1
51
+
5
51
­50
RDRAIN
21
MSTRO
14
ESLC
16
8
MMED
DBREAK
11
EBREAK
MWEAK
RSOURCE
RBREAK
17 18
IT
8
RVTHRES
LDRAIN
RLDRAIN
+
17 18
-
DBODY
LSOURCE
7
RLSOURCE
RVTEMP 19
­VBAT
+
22
DRAIN
2
SOURCE
3
S1A 6 12 13 8 S1AMOD S1B 13 12 13 8 S1BMOD S2A 6 15 14 13 S2AMOD S2B 13 15 14 13 S2BMOD
VBAT 22 19 DC 1 ESLC 51 50 VALUE={(V(5,51)/ABS(V(5,51)))*(PWR(V(5,51)/(1e-6*550),3))} .MODEL DBODYMOD D (IS = 4.25e-12 RS = 1.8e-3 TRS1 = 2.75e-3 TRS2 = 5e-6 CJO = 5.95e-9 TT = 4e-7 M = 0.55)
.MODEL DBREAKMOD D (RS = 0.0 6IKF = 30 TRS1 = -3e- 3TRS2 = 3e-6) .MODEL DPLCAPMOD D (CJO = 4.45e- 9IS = 1e-3 0N = 1 M = 0.88 VJ = 1.45) .MODEL MMEDMO D NMOS (VTO = 2. 93 KP = 9.5 IS = 1e-30 N = 10 TOX = 1 L = 1 u W = 1u RG = 1) .MODEL MSTR OMOD NMOS (VTO = 3.23 KP = 150 IS = 1e-3 0 N = 1 0 T OX = 1 L = 1u W = 1u) .MODEL MWEAKMOD NMOS (VTO = 2.35 KP = 0.02 IS = 1e-30 N = 10 TOX = 1 L = 1u W = 1u RG = 10) .MODEL RBREAKMOD RES (TC1 = 8e- 4TC2 = 4e-6) .MODEL RDRAINMOD RES (TC1 = 8e-2 TC2 = 5e-6) .MODEL RSLCMOD RES (TC1 = 1e-4 TC2 = 1.05 e-6) .MODEL RSOURCEMOD RES (TC1 = 1e-4 TC2 = 1.5e-5) .MODEL RVTHRESMOD RES (TC1 = -2.3e-3 TC2 = -1.2e-5) .MODEL RVTEMPMOD RES (TC1 = -2.2e- 3TC2 = -7e-6)
.MODEL S1AMOD VSWITCH (RON = 1e-5 ROFF = 0.1 VON = -9 VOFF= -4) .MODEL S1BMOD VSWITCH (RON = 1e-5 ROFF = 0.1 VON = -4 VOFF= -9) .MODEL S2AMOD VSWITCH (RON = 1e-5 ROFF = 0.1 VON = 0 VOFF= 2.5) .MODEL S2BMOD VSWITCH (RON = 1e-5 ROFF = 0.1 VO N = 2.5 VOFF= 0)
.ENDS
NOTE: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global Temperature Options; IEEE Powe r El ectronics Specialist Conference Records, 1991, written by William J. Hepp and C. Frank Wheatley.
©2001 Fairchild Semiconductor Corpo ration HRF3205, HRF3205S Rev. B
Page 8
HRF3205, HRF3205S
SPICE Thermal Model
REV 25 July 97
HRF3205
CTHERM1 7 6 2.53e-5 CTHERM2 6 5 1.38e-3 CTHERM3 5 4 7.00e-3 CTHERM4 4 3 2.50e-2 CTHERM5 3 2 1.33e-1 CTHERM6 2 1 5.75e-1
RTHERM1 7 6 7.78e-4 RTHERM2 6 5 8.55e-3 RTHERM3 5 4 3.00e-2 RTHERM4 4 3 1.42e-1 RTHERM5 3 2 2.65e-1 RTHERM6 2 1 2.33e-1
RTHERM1
RTHERM2
RTHERM3
RTHERM4
JUNCTION
7
CTHERM1
6
CTHERM2
5
CTHERM3
4
CTHERM4
RTHERM5
RTHERM6
3
CTHERM5
2
CTHERM6
1
CASE
©2001 Fairchild Semiconductor Corpo ration HRF3205, HRF3205S Rev. B
Page 9
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks.
ACEx™ Bottomless™ CoolFET™ CROSSVOLT™ DenseTrench™ DOME™ EcoSPARK™ E2CMOS EnSigna
TM
TM
FACT™ FACT Quiet Series™
STAR*POWER is used under license
FAST FASTr™ FRFET™ GlobalOptoisolator™ GTO™ HiSeC™ ISOPLANAR™ LittleFET™ MicroFET™ MicroPak™ MICROWIRE™
OPTOLOGIC™ OPTOPLANAR™ PACMAN™ POP™ Power247™ PowerTrench
QFET™ QS™ QT Optoelectronics™ Quiet Series™ SILENT SWITCHER
SMART START™ STAR*POWER™ Stealth™ SuperSOT™-3 SuperSOT™-6 SuperSOT™-8 SyncFET™ TinyLogic™ TruTranslation™ UHC™
UltraFET
VCX™
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, or (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in significant injury to the user.
PRODUCT STATUS DEFINITIONS Definition of Terms
Datasheet Identification Product Status Definition
Advance Information
Preliminary
No Identification Needed
Formative or In Design
First Production
Full Production
2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or
effectiveness.
This datasheet contains the design specifications for product development. Specifications may change in any manner without notice.
This datasheet contains preliminary data, and supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design.
This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product that has been discontinued by Fairchild semiconductor. The datasheet is printed for reference information only.
Rev. H4
Loading...