52A, 30V, 0.019 Ohm, N-Channel Logic
Level, Power MOSFETs
These are N-Channel enhancement mode silicon gate
power field effect transistors. They are advanced power
MOSFETs designed, tested, and guaranteed to withstand a
specified level of energy in the breakdown avalanche mode
of operation. All of these power MOSFETs are designed for
applications such as switching regulators, switching
converters, motor drivers, relay drivers, and drivers for high
power bipolar switching transistors requiring high speed and
low gate drive power. These types can be operated directly
from integrated circuits.
Ordering Information
PART NUMBERPACKAGEBRAND
HPLU3103TO-251AAHP3103
HPLR3103TO-252AAHP3103
NOTE: When ordering, use the entire part number. Add the suffix T
to obtain the TO-252AA variant in tape and reel, e.g., HPLR3103T.
Packaging
Features
• Logic Level Gate Drive
• 52A†, 30V
• Low On-Resistance, r
• UIS Rating Curve
• Related Literature
- TB334, “Guidelines for Soldering Surface Mount
Components to PC Boards”
†
Calculated continuous current based on maximum allowable junction
temperature. Package limited to 20A continuous, see Figure 9.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
DSS
DGR
GS
D
DM
AS
D
, T
J
STG
L
pkg
30V
30V
16VV
52
390
240mj
89
0.71
-55 to 150
300
260
W/
A
A
W
o
C
o
C
o
C
o
C
NOTE:
= 25
J
o
1. T
Electrical Specifications
C to 125
o
C.
o
T
= 25
C, Unless Otherwise Specified
C
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAXUNITS
Drain to Source Breakdown VoltageBV
Gate to Source Threshold VoltageV
GS(TH)
Zero Gate Voltage Drain CurrentI
Gate to Source Leakage CurrentI
Breakdown Voltage Temperature
Coefficient
Drain to Source On Resistance
(Note 3)
Turn-On Delay Timet
V
(BR)DSS
r
DS(ON)
d(ON)
Rise Timet
Turn-Off Delay Time (Note 3)t
d(OFF)
Fall Timet
Total Gate ChargeQ
Gate to Source ChargeQ
Gate to Drain “Miller” ChargeQ
Input CapacitanceC
Output CapacitanceC
Reverse Transfer CapacitanceC
Internal Source InductanceL
Internal Drain InductanceL
DSS
GSS
OSS
RSS
I
DSS
= 250µA, V
D
V
= V
GS
DS
V
= 30V, V
DS
V
= 24V, V
DS
V
= ±16V--100nA
GS
Reference to 25
T
J
I
= 28A, V
D
I
= 23A, V
D
V
= 15V, I
DD
R
=3.4Ω, I
r
f
g
gs
gd
ISS
GS
V
= 24V
DD
I
34A,
D
V
= 4.5V
GS
(Figure 6)
V
= 25V, V
DS
f = 1MHz (Figure 5)
Measured From the
S
Source Lead, 6mm (0.25in)
From Package to Center of
Die
Measured From the Drain-
D
Lead, 6mm (0.25in) From
= 0V30--V
GS
, I
= 250µA1--V
D
= 0V--25
GS
= 0V, T
GS
o
C, I
= 1mA-0.037-V
D
= 10V--0.019Ω
GS
= 4.5V--0.024Ω
GS
34A, R
D
g(REF)
L
= 3mA
o
= 125
C
C--250
= 0.441Ω, V
GS
4.5V,
-9 - ns
-210-ns
A
A
-20 - ns
-54 - ns
--50nC
--14nC
--28nC
GS
= 0V,
-1600-pF
-640-pF
-320-pF
Modified MOSFET
-7.5-nH
Symbol Showing
the Internal Devices Inductances
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Advance Information
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No Identification Needed
Formative or
In Design
First Production
Full Production
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be reasonably expected to cause the failure of the life
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changes at any time without notice in order to improve
design.
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Rev. H4
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