Datasheet HM62W16255HJPI-15, HM62W16255HTTI-15 Datasheet (HIT)

Page 1
HM62W16255HI Series
4M High Speed SRAM (256-kword × 16-bit)
ADE-203-1038B (Z)
Rev. 2.0
Jan. 20, 2000
Description
The HM62W16255HI is a 4-Mbit high speed static RAM organized 256-kword × 16-bit. It has realized high speed access time by employing CMOS process (4-transistor + 2-poly resistor memory cell)and high speed circuit designing technology. It is most appropriate for the application which requires high speed, high density memory and wide bit width configuration, such as cache and buffer memory in system. It is packaged in 400-mil 44-pin SOJ and 400-mil 44-pin plastic TSOPII.
Features
Single 3.3 V supply: 3.3 V ± 0.3V
Access time: 15 ns (max)
Completely static memoryNo clock or timing strobe required
Equal access and cycle times
Directly TTL compatibleAll inputs and outputs
Operating current: 160 mA (max)
TTL standby current: 50 mA (max)
CMOS standby current: 5 mA (max)
Center VCC and VSS type pinout
Temperature range: –40 to 85°C
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HM62W16255HI Series
Ordering Information
Type No. Access time Package
HM62W16255HJPI-15 15 ns 400-mil 44-pin plastic SOJ (CP-44D) HM62W16255HTTI-15 15 ns 400-mil 44-pin plastic TSOPII (TTP-44DE)
Pin Arrangement
HM62W16255HJPI Series
A0 A1 A2 A3 A4
CS
I/O1 I/O2 I/O3 I/O4
V
CC
V
SS
I/O5 I/O6 I/O7 I/O8
WE
A5 A6 A7 A8 A9
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22
44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23
(Top View)
A17 A16 A15
OE UB LB
I/O16 I/O15 I/O14 I/O13 V
SS
V
CC
I/O12 I/O11 I/O10 I/O9 NC A14 A13 A12 A11 A10
HM62W16255HTTI Series
1
A0
2
A1
3
A2
4
A3
5
A4
6
CS
7
I/O1
8
I/O2
9
I/O3
10
I/O4
CC SS
I/O5 I/O6 I/O7 I/O8
WE
A5 A6 A7 A8 A9
11 12 13 14 15 16 17 18 19 20 21 22
V
V
(Top View)
44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23
A17 A16 A15
OE UB LB
I/O16 I/O15 I/O14 I/O13 V
SS
V
CC
I/O12 I/O11 I/O10 I/O9 NC A14 A13 A12 A11 A10
2
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Pin Description
Pin name Function
A0 to A17 Address input I/O1 to I/O16 Data input/output
CS Chip select OE Output enable WE Write enable UB Upper byte select LB Lower byte select
V
CC
V
SS
Power supply Ground
NC No connection
Block Diagram
HM62W16255HI Series
(LSB)
(MSB)
I/O16
A1
A17
A7 A11 A16
A2
A6
A5
I/O1
I/O8 I/O9
WE CS
LB
UB
OE
V
CC
Row
decoder
Memory matrix
256 rows × 8 columns ×
128 blocks × 16 bit
V
SS
(4,194,304 bits)
CS
.
.
.
Input
data
.
.
.
control
A10 A8 A9 A12 A13 A14 A0 A15 A3 A4
Column I/O
Column decoder
CS
CS
3
Page 4
HM62W16255HI Series
Operation Table
CS OE WE LB UB Mode VCC current I/O1–I/O8 I/O9–I/O16 Ref. cycle
H ××××Standby I LHH××Output disable I L L H L L Read I L L H L H Lower byte read I L L H H L Upper byte read I L LHHH— I L × L L L Write I L × L L H Lower byte write I L × L H L Upper byte write I L × L HH— I
, I
SB
CC
CC
CC
CC
CC
CC
CC
CC
CC
Note: ×: H or L
Absolute Maximum Ratings
SB1
High-Z High-Z — High-Z High-Z — Output Output Read cycle Output High-Z Read cycle High-Z Output Read cycle High-Z High-Z — Input Input Write cycle Input High-Z Write cycle High-Z Input Write cycle High-Z High-Z
Parameter Symbol Value Unit
Supply voltage relative to V Voltage on any pin relative to V
SS
SS
Power dissipation P
V
CC
V
T
T
–0.5 to +4.6 V –0.5*1 to VCC + 0.5*
2
V
1.0 W Operating temperature Topr –40 to +85 °C Storage temperature Tstg –55 to +125 °C Storage temperature under bias Tbias –40 to +85 °C
Notes: 1. VT (min) = –2.0 V for pulse width (under shoot) 8 ns
2. V
(max) = VCC + 2.0 V for pulse width (over shoot) 8 ns
T
4
Page 5
HM62W16255HI Series
Recommended DC Operating Conditions (Ta = –40 to +85°C)
Parameter Symbol Min Typ Max Unit
3
Supply voltage V
Input voltage V
CC
VSS*
IH
V
IL
*
4
Notes: 1. VIL (min) = –2.0 V for pulse width (under shoot) 8 ns
2. V
(max) = VCC + 2.0 V for pulse width (over shoot) 8 ns
IH
3. The supply voltage with all V
4. The supply voltage with all V
pins must be on the same level.
CC
pins must be on the same level.
SS
DC Characteristics (Ta = –40 to +85°C, VCC = 3.3 V ± 0.3 V, VSS = 0 V)
3.0 3.3 3.6 V 000V
2.2 VCC + 0.5*2V
1
–0.5*
0.8 V
Parameter Symbol Min Typ*
Input leakage current |I Output leakage
current* Operating power
1
15 ns cycle I
|——2 µA Vin = VSS to V
LI
|ILO|——2 µA Vin = VSS to V
CC
160 mA Min cycle
supply current
Standby power supply
15 ns cycle I
SB
50 mA Min cycle, CS = VIH,
current
I
SB1
0.05 5 mA f = 0 MHz
1
Max Unit Test conditions
CS = V Other inputs = V
Other inputs = V
V
CS VCC – 0.2 V,
CC
CC
CC
, Iout = 0 mA
IL
IH/VIL
IH/VIL
(1) 0 V Vin 0.2 V or
Output voltage V
(2) V
OL
V
OH
0.4 V IOL = 8 mA
2.4 V IOH = –4 mA
Vin VCC – 0.2 V
CC
Note: 1. Typical values are at VCC = 3.3 V, Ta = +25°C and not guaranteed.
Capacitance (Ta = +25°C, f = 1.0 MHz)
Parameter Symbol Min Typ Max Unit Test conditions
Input capacitance* Input/output capacitance*
1
1
Note: 1. This parameter is sampled and not 100% tested.
Cin 6 pF Vin = 0 V C
I/O
——8 pFV
= 0 V
I/O
5
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HM62W16255HI Series
AC Characteristics (Ta = –40 to +85°C, VCC = 3.3 V ± 0.3 V, unless otherwise noted.)
Test Conditions
Input pulse levels: 3.0 V/0.0 V
Input rise and fall time: 3 ns
Input and output timing reference levels: 1.5 V
Output load: See figures (Including scope and jig)
3.3 V
1.5 V 319
Dout
RL=50
Dout
Zo=50
353
5 pF
Output load (A)
(for t
Output load (B)
, t
OLZ
t
, t
LBHZ
CLZ
LBLZ
, t
, t
UBHZ
UBLZ
, t
WHZ
, t
, t
CHZ
, and tOW)
OHZ
,
Read Cycle
HM62W16255HI
-15
Parameter Symbol Min Max Unit Notes
Read cycle time t Address access time t Chip select access time t Output enable to output valid t
RC
AA
ACS
OE
Byte select to output valid tLB, t Output hold from address change t Chip select to output in low-Z t Output enable to output in low-Z t Byte select to output in low-Z t Chip deselect to output in high-Z t Output disable to output in high-Z t Byte deselect to output in high-Z t
OH
CLZ
OLZ
LBLZ
CHZ
OHZ
LBHZ
UB
, t
UBLZ
, t
UBHZ
15 ns —15ns —15ns —7 ns —7 ns 3—ns 3 ns 1 0 ns 1 0 ns 1 — 7 ns 1 — 7 ns 1 — 7 ns 1
6
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HM62W16255HI Series
Write Cycle
HM62W16255HI
-15
Parameter Symbol Min Max Unit Notes
Write cycle time t Address valid to end of write t Chip select to end of write t Write pulse width t Byte select to end of write t Address setup time t Write recovery time t Data to write time overlap t Data hold from write time t Write disable to output in low-Z t Output disable to output in high-Z t Write enable to output in high-Z t
WC
AW
CW
WP
LBW
AS
WR
DW
DH
OW
OHZ
WHZ
, t
UBW
Notes: 1. Transition is measured ±200 mV from steady voltage with Load (B). This parameter is sampled
and not 100% tested.
2. If the CS or LB or UB low transition occurs simultaneously with the WE low transition or after the WE transition, output remains a high impedance state.
3. WE and/or CS must be high during address transition time.
4. If CS, OE, LB and UB are low during this period, I/O pins are in the output state. Then the data input signals of opposite phase to the outputs must not be applied to them.
5. t
is measured from the latest address transition to the latest of CS, WE, LB or UB going low.
AS
6. t
is measured from the earliest of CS, WE, LB or UB going high to the first address transition.
WR
7. A write occurs during the overlap of low CS, low WE and low LB or low UB.
is measured from the later of CS going low to the end of write.
8. t
CW
9. t
is measured from the later of LB going low to the end of write.
LBW
10.t
is measured from the later of UB going low to the end of write.
UBW
15 ns 10 ns 10 ns 8 10 ns 7 10 ns 9, 10 0 ns 5 0 ns 6 7—ns 0—ns 3 ns 1 — 7 ns 1 — 7 ns 1
7
Page 8
HM62W16255HI Series
Timing Waveforms
Read Timing Waveform (1) (WE = VIH)
t
RC
Address
CS
OE
LB
UB
Dout
(Lower byte)
t
AA
High Impedance
Valid address
t
ACS
t
OE
t
LB
t
UB
t
LBLZ
4
*
t
UBLZ
t
OLZ
1
*
t
CHZ
1
t
*
OHZ
1
t
*
LBHZ
1
t
1
*
Valid data
1
*
1
*
UBHZ
t
OH
*
4
*
Dout
(Upper byte)
8
High Impedance
1
t
*
CLZ
4
*
Valid data
4
*
Page 9
Read Timing Waveform (2) (WE = VIH, LB = VIL, UB, = VIL)
t
RC
HM62W16255HI Series
Address
CS
OE
Dout
(Lower/Upper
byte)
High Impedance
Valid address
t
AA
t
ACS
t
t
CLZ
4
*
t
OLZ
OE
t
OH
1
t
*
CHZ
1
t
*
OHZ
1
*
1
*
4
Valid data
*
9
Page 10
HM62W16255HI Series
Write Timing Waveform (1) (LB, UB Controlled)
t
WC
Address
3
WE*
3
CS*
OE
LB
UB
Valid address
t
AW
t
AS
t
WP
t
CW
t
LBW
t
UBW
t
WHZ
t
WR
t
OLZ
Dout
(Lower byte)
Dout
(Upper byte)
Din
(Lower byte)
Din
(Upper byte)
10
t
OHZ
High impedance
High impedance
t
DW
t
DW
Valid data
Valid data
t
DH
t
OW
t
DH
Page 11
Write Timing Waveform (2) (WE Controlled)
t
HM62W16255HI Series
WC
Address
3
WE*
3
CS*
OE
LB, UB
Dout
(Lower/Upper
byte)
Valid address
t
AW
t
AS
t
OHZ
t
WHZ
t
LBW
t
CW
t
WP
t
UBW
t
WR
t
t
OW
OLZ
High impedance
2
*
t
DW
t
DH
Din
(Lower/Upper
byte)
Valid data
11
Page 12
HM62W16255HI Series
Write Timing Waveform (3) (CS Controlled)
t
WC
Address
3
WE
*
3
CS *
OE
LB, UB
Dout
(Lower/Upper
byte)
Valid address
t
AW
t
AS
t
WHZ
t
OHZ
t
LBW
t
WP
t
t
UBW
CW
High impedance
2
*
t
DW
t
WR
t
OLZ
t
OW
4
*
t
DH
Din
(Lower/Upper
byte)
12
Valid data
Page 13
Package Dimensions
HM62W16255HJPI Series (CP-44D)
28.33
28.90 Max
44 23
10.16 ± 0.13
HM62W16255HI Series
Unit: mm
11.18 ± 0.13
122
0.74
1.30 Max
*0.43 ± 0.10
0.41 ± 0.08
0.10
*Dimension including the plating thickness
Base material dimension
1.27
3.50 ± 0.26
+0.25
–0.17
0.80
Hitachi Code JEDEC EIAJ Weight
(reference value)
2.65 ± 0.12
9.40 ± 0.25
CP-44D Conforms —
1.8 g
13
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HM62W16255HI Series
HM62W16255HTTI Series (TTP-44DE)
18.41
18.81 Max
44 23
Unit: mm
10.16
122
*0.27 ± 0.07
0.25 ± 0.05
0.80
0.13
M
1.005 Max
0.10
1.20 Max
*Dimension including the plating thickness
Base material dimension
0.125 ± 0.04
*0.145 ± 0.05
11.76 ± 0.20
0.13 ± 0.05
0° – 5°
Hitachi Code JEDEC EIAJ Weight
(reference value)
0.80
0.50 ± 0.10
TTP-44DE — —
0.43 g
0.68
14
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HM62W16255HI Series
Cautions
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent, copyright, trademark, or other intellectual property rights for information contained in this document. Hitachi bears no responsibility for problems that may arise with third party’s rights, including intellectual property rights, in connection with use of the information contained in this document.
2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact Hitachi’s sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as fail-safes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Hitachi.
7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor products.
Hitachi, Ltd.
Semiconductor & Integrated Circuits. Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan Tel: Tokyo (03) 3270-2111 Fax: (03) 3270-5109
URL NorthAmerica : http:semiconductor.hitachi.com/
For further information write to:
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Hitachi Europe GmbH Electronic components Group Dornacher Straße 3 D-85622 Feldkirchen, Munich Germany Tel: <49> (89) 9 9180-0 Fax: <49> (89) 9 29 30 00
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Copyright © Hitachi, Ltd., 1998. All rights reserved. Printed in Japan.
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15
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HM62W16255HI Series
Revision Record
Rev. Date Contents of Modification Drawn by Approved by
1.0 Apr. 15, 1999 Initial issue T. Fukazawa K. Makuta
2.0 Jan. 20, 2000 Ordering information: Correct error
16
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