Datasheet HGTP7N60A4D, HGTG7N60A4D, HGT1S7N60A4DS Datasheet (Intersil Corporation)

Page 1
TM
HGTG7N60A4D, HGTP7N60A4D,
HGT1S7N60A4DS
Data Sheet March 2000
The HGTG7N60A4D, HGTP7N60A4D and HGT1S7N60A4DS are MOS gated high voltage switching devices combining the best features of MOSFETs and bipolar transistors. These devices have the high input impedance of a MOSFET and the low on-state conduction loss of a bipolar transistor. The much lower on-state voltage drop varies only moderately between 25
o
C and 150oC. The IGBT used is the development type TA49331. The diode used in anti-parallel is the development type TA49370.
This IGBT is ideal for many high voltage switching applications operating at high frequencies where low conduction losses are essential. This device has been
optimized for high frequency switch mode power supplies.
Formerly Developmental Type TA49333.
Ordering Information
PART NUMBER PACKAGE BRAND
HGTG7N60A4D TO-247 7N60A4D HGTP7N60A4D TO-220AB 7N60A4D HGT1S7N60A4DS TO-263AB 7N60A4D
NOTE: When ordering, use the entirepart number.Add the suffix 9A to obtain the TO-263AB variant in tape and reel, e.g., HGT1S7N60A4DS9A.
File Number 4827.1
Features
• >100kHz Operation At 390V, 7A
• 200kHz Operation At 390V, 5A
• 600V Switching SOA Capability
• Typical Fall Time. . . . . . . . . . . . . . . . . 75ns at T
• Low Conduction Loss
Temperature Compensating SABER™ Model www.intersil.com
Packaging
JEDEC STYLE TO-247
E
C
G
COLLECTOR (FLANGE)
JEDEC TO-220AB
E
C
G
= 125oC
J
Symbol
C
G
E
G
INTERSIL CORPORATION IGBT PRODUCT IS COVERED BY ONE OR MORE OF THE FOLLOWING U.S. PATENTS
4,364,073 4,417,385 4,430,792 4,443,931 4,466,176 4,516,143 4,532,534 4,587,713 4,598,461 4,605,948 4,620,211 4,631,564 4,639,754 4,639,762 4,641,162 4,644,637 4,682,195 4,684,413 4,694,313 4,717,679 4,743,952 4,783,690 4,794,432 4,801,986 4,803,533 4,809,045 4,809,047 4,810,665 4,823,176 4,837,606 4,860,080 4,883,767 4,888,627 4,890,143 4,901,127 4,904,609 4,933,740 4,963,951 4,969,027
2-1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper ESD Handling Procedures.
Intersil and Design is a trademark of Intersil Corporation. | Copyright © Intersil Corporation 2000
SABER™ is a trademark of Analogy, Inc. | 1-888-INTERSIL or 321-724-7143
JEDEC TO-263AB
E
COLLECTOR (FLANGE)
COLLECTOR (FLANGE)
Page 2
HGTG7N60A4D, HGTP7N60A4D, HGT1S7N60A4DS
Absolute Maximum Ratings T
= 25oC, Unless Otherwise Specified
C
ALL TYPES UNITS
Collector to Emitter Voltage. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . BV
CES
600 V
Collector Current Continuous
At TC = 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
At TC = 110oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
Collector Current Pulsed (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .I
Gate to Emitter Voltage Continuous. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
Gate to Emitter Voltage Pulsed . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .V
C25
C110
CM
GES
GEM
34 A 14 A 56 A
±20 V ±30 V
Switching Safe Operating Area at TJ = 150oC, Figure 2 . . . . . . . . . . . . . . . . . . . . . . . . . . . .SSOA 35A at 600V
Power Dissipation Total at TC = 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . P
D
125 W
Power Dissipation Derating TC > 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.0 W/oC
Operating and Storage Junction Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . . . . TJ, T
STG
-55 to 150
Maximum Lead Temperature for Soldering
Leads at 0.063in (1.6mm) from Case for 10s. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .T
Package Body for 10s, See Tech Brief 334 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
L
PKG
300
260
o
C
o
C
o
C
NOTE:
1. Pulse width limited by maximum junction temperature.
Electrical Specifications T
= 25oC, Unless Otherwise Specified
J
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Collector to Emitter Breakdown Voltage BV Collector to Emitter Leakage Current I
CES
CES
IC = 250µA, VGE = 0V 600 - - V VCE = 600V TJ = 25oC - - 250 µA
TJ = 125oC--2mA
Collector to Emitter Saturation Voltage V
Gate to Emitter Threshold Voltage V Gate to Emitter Leakage Current I
CE(SAT)IC
GE(TH)
GES
Switching SOA SSOA TJ = 150oC, RG = 25, VGE = 15V,
= 7A,
VGE = 15V
TJ = 25oC - 1.9 2.7 V
TJ = 125oC - 1.6 2.2 V IC = 250µA, VCE = 600V 4.5 5.9 7 V VGE = ±20V - - ±250 nA
35 - - A
L = 100µH, VCE = 600V
Gate to Emitter Plateau Voltage V On-State Gate Charge Q
Current Turn-On Delay Time t
d(ON)I
Current Rise Time t Current Turn-Off Delay Time t
d(OFF)I
Current Fall Time t Turn-On Energy E Turn-On Energy E Turn-Off Energy (Note 2) E Current Turn-On Delay Time t
d(ON)I
Current Rise Time t Current Turn-Off Delay Time t
d(OFF)I
Current Fall Time t Turn-On Energy (Note 2) E Turn-On Energy (Note 2) E Turn-Off Energy (Note 3) E
GEP
g(ON)
rI
fI ON1 ON2 OFF
rI
fI ON1 ON2 OFF
IC = 7A, VCE = 300V - 9 - V IC = 7A,
VCE = 300V
IGBT and Diode at TJ = 25oC, ICE = 7A, VCE = 390V, VGE = 15V, RG = 25Ω, L = 1mH, Test Circuit (Figure 24)
VGE = 15V - 37 45 nC VGE = 20V - 48 60 nC
-11- ns
-11- ns
- 100 - ns
-45- ns
-55- µJ
- 120 150 µJ
-6075µJ
IGBT and Diode at TJ = 125oC, ICE = 7A, VCE = 390V, VGE = 15V, RG= 25Ω, L = 1mH, Test Circuit (Figure 24)
-10- ns
-7-ns
- 130 150 ns
-7585ns
-50- µJ
- 200 215 µJ
- 125 170 µJ
2-2
Page 3
HGTG7N60A4D, HGTP7N60A4D, HGT1S7N60A4DS
Electrical Specifications T
= 25oC, Unless Otherwise Specified (Continued)
J
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Diode Forward Voltage V Diode Reverse Recovery Time t
EC
rr
IEC = 7A - 2.4 - V IEC = 7A, dIEC/dt = 200A/µs - 34 - ns IEC = 1A, dIEC/dt = 200A/µs - 22 - ns
Thermal Resistance Junction To Case R
θJC
IGBT - - 1.0 Diode - - 2.2
NOTES:
2. Values for two Turn-On loss conditions are shown for the convenience of the circuit designer. E
is the turn-on loss of the IGBT only. E
ON1
is the turn-on loss when a typical diode is used in the test circuit and the diode is at the same TJ as the IGBT. The diode type is specified in Figure 24.
3. Turn-Off Energy Loss (E
) is defined as the integral of the instantaneouspower loss starting at the trailing edge of the input pulse and ending
OFF
at the point where the collector current equals zero (ICE= 0A). All devices were tested per JEDEC Standard No. 24-1 Method for Measurement of Power Device Turn-Off Switching Loss. This test method produces the true total Turn-Off Energy Loss.
Typical Performance Curves Unless Otherwise Specified
35
VGE= 15V
30
25
20
15
40
TJ= 150oC, RG = 25, VGE= 15V, L = 100µH
30
20
o o
C/W C/W
ON2
10
, DC COLLECTOR CURRENT (A)
5
CE
I
0
25 75 100 125 150
50
TC, CASE TEMPERATURE (oC)
FIGURE 1. DC COLLECTOR CURRENT vs CASE
TEMPERATURE
500
200
100
f
= 0.05 / (t
MAX1
= (PD- PC) / (E
f
MAX2
P
= CONDUCTION DISSIPATION
C
, OPERATING FREQUENCY (kHz)
MAX
f
30
(DUTY FACTOR = 50%)
R
= 1.0oC/W, SEE NOTES
ØJC
TJ= 125oC, RG = 25, L = 1mH, VCE= 390V
1
, COLLECTOR TO EMITTER CURRENT (A)
I
CE
d(OFF)I
+ t
ON2
d(ON)I
+ E
OFF
)
)
TCV
75
10
, COLLECTOR TO EMITTER CURRENT (A)
CE
0
I
0
VCE, COLLECTOR TO EMITTER VOLTAGE (V)
300 400200100 500 600
700
FIGURE 2. MINIMUM SWITCHING SAFE OPERATING AREA
GE
o
15V
C
20510
14
12
10
8
6
, SHORT CIRCUIT WITHSTAND TIME (µs)
SC
4
t
10
VCE = 390V, RG = 25, TJ= 125oC
I
SC
t
SC
11 12 15
VGE, GATE TO EMITTER VOLTAGE (V)
13 14
14016
120
100
80
60
40
, PEAK SHORT CIRCUIT CURRENT (A)
SC
I
20
FIGURE 3. OPERATING FREQUENCY vs COLLECTOR TO
EMITTER CURRENT
2-3
FIGURE 4. SHORT CIRCUIT WITHSTAND TIME
Page 4
HGTG7N60A4D, HGTP7N60A4D, HGT1S7N60A4DS
Typical Performance Curves Unless Otherwise Specified (Continued)
30
DUTY CYCLE < 0.5%, V PULSE DURATION = 250µs
25
20
15
10
5
, COLLECTOR TO EMITTER CURRENT (A)
CE
0
I
0 1.0
0.5 2.5
V
, COLLECTOR TO EMITTER VOLTAGE (V)
CE
GE
TJ = 150oC
= 12V
TJ = 125oC
TJ = 25oC
1.5 2.0 3.0
30
DUTY CYCLE < 0.5%, VGE = 15V PULSE DURATION = 250µs
25
20
15
10
5
, COLLECTOR TO EMITTER CURRENT (A)
CE
0
I
0 1.0 1.5 2.0 3.00.5 2.5
VCE, COLLECTOR TO EMITTER VOLTAGE (V)
TJ = 125oC
TJ = 150oC TJ = 25oC
FIGURE 5. COLLECTOR TO EMITTER ON-STATE VOLTAGE FIGURE 6. COLLECTOR TO EMITTER ON-STATE VOLTAGE
500
RG = 25, L = 1mH, VCE = 390V
400
TJ = 125oC, VGE = 12V, VGE = 15V
300
200
, TURN-ON ENERGY LOSS (µJ)
100
ON2
E
0
0
ICE, COLLECTOR TO EMITTER CURRENT (A)
TJ = 25oC, VGE = 12V, VGE = 15V
4268101214
350
RG = 25, L = 1mH, VCE = 390V
300
250
200
TJ = 125oC, VGE = 12V OR 15V
150
100
, TURN-OFF ENERGY LOSS (µJ)
50
OFF
E
0
, COLLECTOR TO EMITTER CURRENT (A)
I
CE
TJ = 25oC, VGE = 12V OR 15V
42 6 8 1012140
FIGURE 7. TURN-ON ENERGY LOSS vs COLLECTOR TO
EMITTER CURRENT
16
RG = 25, L = 1mH, VCE = 390V
TJ = 25oC, VGE = 12V
14
12
10
, TURN-ON DELAY TIME (ns)
d(ON)I
t
8
42681012140
ICE, COLLECTOR TO EMITTER CURRENT (A)
TJ = 125oC, VGE = 12V
TJ = 25oC, VGE = 15V
TJ = 125oC, VGE = 15V
FIGURE 9. TURN-ON DELAY TIME vs COLLECTOR TO
EMITTER CURRENT
2-4
FIGURE 8. TURN-OFF ENERGY LOSS vs COLLECTOR TO
EMITTER CURRENT
40
RG = 25, L = 1mH, VCE = 390V
TJ = 25oC, VGE= 12V, VGE= 15V
TJ = 125oC, VGE= 12V, VGE= 15V
42681012140
ICE, COLLECTOR TO EMITTER CURRENT (A)
, RISE TIME (ns)
rI
t
30
20
10
0
FIGURE 10. TURN-ON RISE TIME vs COLLECTOR TO
EMITTER CURRENT
Page 5
HGTG7N60A4D, HGTP7N60A4D, HGT1S7N60A4DS
Typical Performance Curves Unless Otherwise Specified (Continued)
180
160
140
120
100
, TURN-OFF DELAY TIME (ns)
d(OFF)I
t
80
60
42681012140
I
, COLLECTOR TO EMITTER CURRENT (A)
CE
RG = 25, L = 1mH, VCE = 390V
VGE = 15V, TJ = 125oC
VGE = 12V, TJ = 125oC
VGE = 15V, TJ = 25oC
VGE = 12V, TJ = 25oC
FIGURE 11. TURN-OFF DELAY TIME vs COLLECTOR TO
EMITTER CURRENT
120
DUTY CYCLE < 0.5%, V PULSE DURATION = 250µs
100
80
60
40
= 10V
CE
TJ = 25oC
TJ = 125oC TJ = -55oC
90
RG = 25, L = 1mH, VCE = 390V
80
, FALL TIME (ns)
fI
t
70
60
50
40
30
20
ICE, COLLECTOR TO EMITTER CURRENT (A)
TJ = 125oC, VGE = 12V OR 15V
TJ = 25oC, VGE = 12V OR 15V
42681012140
FIGURE 12. FALL TIME vs COLLECTOR TO EMITTER
CURRENT
15
I
= 1mA, RL = 43, TJ = 25oC
G(REF)
12
9
6
VCE = 600V
VCE = 400V
VCE = 200V
20
, COLLECTOR TO EMITTER CURRENT (A)
CE
0
I
8 9 11 12 15
7
V
, GATE TO EMITTER VOLTAGE (V)
GE
FIGURE 13. TRANSFER CHARACTERISTIC FIGURE 14. GATE CHARGE WAVEFORMS
800
RG = 25, L = 1mH, VCE = 390V, VGE = 15V E
= E
TOTAL
600
400
200
, TOTAL SWITCHING ENERGY LOSS (µJ)
0
TOTAL
E
+ E
ON2
OFF
ICE = 14A
ICE = 7A
ICE = 3.5A
50 75 100
, CASE TEMPERATURE (oC)
T
C
FIGURE 15. TOTAL SWITCHING LOSS vs CASE
TEMPERATURE
14
1310
12525 150
3
, GATE TO EMITTER VOLTAGE (V)
GE
V
0
, TOTAL SWITCHING ENERGY LOSS (mJ)
TOTAL
E
5 101520 3025 35 40
0
QG, GATE CHARGE (nC)
10
TJ = 125oC, L = 1mH, VCE = 390V, VGE = 15V E
= E
TOTAL
1
0.1 10 1000
+ E
ON2
OFF
ICE = 14A
ICE = 7A
ICE = 3.5A
R
, GATE RESISTANCE ()
G
100
FIGURE 16. TOTAL SWITCHING LOSS vs GATE RESISTANCE
2-5
Page 6
HGTG7N60A4D, HGTP7N60A4D, HGT1S7N60A4DS
Typical Performance Curves Unless Otherwise Specified (Continued)
1.4 FREQUENCY = 1MHz
1.2
1.0
0.8
0.6
0.4
C, CAPACITANCE (nF)
0.2
0
0 20406080100
C
IES
C
OES
C
RES
VCE, COLLECTOR TO EMITTER VOLTAGE (V)
FIGURE 17. CAPACITANCE vs COLLECTOR TO EMITTER
2.8
2.6
2.4
2.2
2.0
, COLLECTOR TO EMITTER VOLTAGE (V)
CE
1.8
V
9
FIGURE 18. COLLECTOR TO EMITTER ON-STATE VOLTAGE
VOLTAGE
35
DUTY CYCLE < 0.5%, PULSE DURATION = 250µs
30
25
20
15
10
, FORWARD CURRENT (A)
EC
I
5
0
04
123 5
VEC, FORWARD VOLTAGE (V)
125
o
C
25oC
100
dIEC/dt = 200A/µs
80
60
40
, RECOVERY TIMES (ns)
rr
t
20
0
0
DUTY CYCLE < 0.5%, TJ = 25oC PULSE DURATION = 250µs
ICE = 14A
ICE = 7A
ICE = 3.5A
10 12
11 13 14 15 16
VGE, GATE TO EMITTER VOLTAGE (V)
vs GATE TO EMITTER VOLTAGE
125oC t
rr
125oC t
b
125oC t
a
25oC t
rr
25oC t
a
25oC t
b
2 8 12 14
IEC, FORWARD CURRENT (A)
64
10
FIGURE 19. DIODE FORWARD CURRENT vs FORWARD
VOLTAGE DROP
60
50
40
30
, RECOVERY TIMES (ns)
rr
20
t
10
100 500
125oC t
b
125oC t
a
25oC t
a
25oC t
b
200 300 400 600 700
diEC/dt, RATE OF CHANGE OF CURRENT (A/µs)
IEC = 7A, VCE = 390V
FIGURE 21. RECOVERY TIMES vs RATE OF CHANGE OF
CURRENT
2-6
FIGURE 20. RECOVERY TIMES vs FORWARD CURRENT
500
VCE = 390V
400
300
200
100
, REVERSE RECOVERY CHARGE (nc)
rr
Q
0
400100 200 300
diEC/dt, RATE OF CHANGE OF CURRENT (A/µs)
125oC, IEC = 7A
125oC, IEC = 3.5A
25oC, IEC = 7A
25oC, IEC = 3.5A
500 600 700
FIGURE 22. STORED CHARGE vs RATEOF CHANGE OF
CURRENT
Page 7
HGTG7N60A4D, HGTP7N60A4D, HGT1S7N60A4DS
Typical Performance Curves Unless Otherwise Specified (Continued)
0
10
0.5
0.2
0.1
-1
10
0.05
0.02
0.01
, NORMALIZED THERMAL RESPONSE
θJC
Z
-2
10
10
-5
SINGLE PULSE
10
-4
-3
10
t1, RECTANGULAR PULSE DURATION (s)
-2
10
FIGURE 23. IGBT NORMALIZED TRANSIENT THERMAL RESPONSE, JUNCTION TO CASE
Test Circuit and Waveforms
DUTY FACTOR, D = t1 / t
PEAK TJ = (PDX Z
-1
10
t
1
P
D
t
2
2
X R
θJC
) + T
C
1
10
θJC
0
10
HGTG7N60A4D
L = 1mH
RG = 25
DUT
+
= 390V
V
DD
-
FIGURE 24. INDUCTIVE SWITCHING TEST CIRCUIT
90%
V
GE
E
V
CE
90%
I
CE
t
d(OFF)I
10%
OFF
t
fI
10%
E
ON2
t
rI
t
d(ON)I
FIGURE 25. SWITCHING TEST WAVEFORMS
2-7
Page 8
HGTG7N60A4D, HGTP7N60A4D, HGT1S7N60A4DS
Handling Precautions for IGBTs
Insulated Gate Bipolar Transistors are susceptible to gate­insulation damage by the electrostatic discharge of energy through the devices. When handling these devices, care should be exercised to assure that the static charge built in the handler’s body capacitance is not discharged through the device.With proper handling and application procedures, however, IGBTs are currently being extensively used in production by numerous equipment manufacturers in military, industrial and consumer applications, with virtually no damage problems due to electrostatic discharge. IGBTs can be handled safely if the following basic precautions are taken:
1. Prior to assembly into a circuit, all leads should be kept shorted together either by the use of metal shorting springs or by the insertion into conductive material such as “ECCOSORBD™ LD26” or equivalent.
2. When devices are removed by hand from their carriers, the hand being used should be grounded by any suitable means - for example, with a metallic wristband.
3. Tips of soldering irons should be grounded.
4. Devicesshould never be inserted into or removed from circuits with power on.
5. Gate Voltage Rating - Neverexceedthe gate-voltage rating of V permanent damage to the oxide layer in the gate region.
6. Gate Termination - The gates of these devices are essentially capacitors. Circuits that leave the gate open­circuited or floating should be avoided. These conditions can result in turn-on of the device due to voltage buildup on the input capacitor due to leakage currents or pickup.
7. GateProtection - These devices do not have an internal monolithic Zener diode from gate to emitter. If gate protection is required an externalZener is recommended.
. Exceeding the rated VGE can result in
GEM
Operating Frequency Information
Operating frequency information for a typical device (Figure 3) is presented as a guide for estimating device performance for a specific application. Other typical frequency vs collector current (I the information shown for a typical unit in Figures 6, 7, 8, 9 and 11. The operating frequency plot (Figure 3) of a typical device shows f
MAX1
or f
MAX2
point. The information is based on measurements of a typical device and is bounded by the maximum rated junction temperature.
f
is defined by f
MAX1
MAX1
= 0.05/(t Deadtime (the denominator) has been arbitrarily held to 10% of the on-state time for a 50% duty factor. Other definitions are possible. t
d(OFF)I
and t
d(ON)I
Device turn-off delay can establish an additional frequency limiting condition for an application other than T is important when controlling output ripple under a lightly loaded condition.
f
is defined by f
MAX2
allowabledissipation (P
= (PD - PC)/(E
MAX2
)is defined by PD=(TJM-TC)/R
D
The sum of device switching and conduction losses must not exceed P the conduction losses (P P
=(VCExICE)/2.
C
E
and E
ON2
shown in Figure 25. E
. A 50% duty factor was used (Figure 3) and
D
are defined in the switching waveforms
OFF
) are approximated by
C
is the integral of the
ON2
instantaneous power loss (I E
is the integral of the instantaneous power loss
OFF
(I
CExVCE
calculation for E (I
CE
) during turn-off. All tail losses are included in the
; i.e., the collector current equals zero
OFF
= 0).
) plots are possible using
CE
; whichever is smaller at each
d(OFF)I
+ t
d(ON)I
).
are defined in Figure 25.
. t
JM
d(OFF)I
+ E
OFF
x VCE) during turn-on and
CE
ON2
). The
θJC
.
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil semiconductor products are sold by description only.Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time with­out notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
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Sales Office Headquarters
NORTH AMERICA
Intersil Corporation P. O. Box 883, Mail Stop 53-204 Melbourne, FL 32902 TEL: (321) 724-7000 FAX: (321) 724-7240
2-8
EUROPE
Intersil SA Mercure Center 100, Rue de la Fusee 1130 Brussels, Belgium TEL: (32) 2.724.2111 FAX: (32) 2.724.22.05
ASIA
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ECCOSORBD™ is a trademark of Emerson and Cumming, Inc.
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