Datasheet HGTG20N120C3D Datasheet (Intersil Corporation)

Page 1
HGTG20N120C3D
Data Sheet October 1998 File Number
45A, 1200V, UFS Series N-Channel IGBT with Anti-Parallel Hyperfast Diode
The HGTG20N120C3D is a MOS gated high voltage switching device combining the best features of MOSFETs and bipolar transistors. This device has the high input impedance of a MOSFET and the low on-state conduction loss of a bipolar transistor. The much lower on-state voltage drop varies only moderately between 25
The IGBT is ideal for many high voltage switching applications operating at moderate frequencies where low conduction losses are essential, such as: AC and DC motor controls, power supplies and drivers for solenoids, relays and contactors.
The diode used in anti-parallel with the IGBT was formerly developmental type TA49155.
The IGBT diode combination was formerly developmental type TA49264.
o
C and 150oC.
Features
• 45A, 1200V, TC = 25oC
• 1200V Switching SOA Capability
• Typical Fall Time. . . . . . . . . . . . . . . . 300ns at T
• Short Circuit Rating
• Low Conduction Loss
Symbol
C
G
E
4508.1
= 150oC
J
Ordering Information
PART NUMBER PACKAGE BRAND
HGTG20N120C3D TO-247 20N120C3D
NOTE: When ordering, use the entire part number.
INTERSIL CORPORATION IGBT PRODUCT IS COVERED BY
ONE OR MORE OF THE FOLLOWING U.S. PATENTS
4,364,073 4,417,385 4,430,792 4,443,931 4,466,176 4,516,143 4,532,534 4,567,641 4,587,713 4,598,461 4,605,948 4,618,872 4,620,211 4,631,564 4,639,754 4,639,762 4,641,162 4,644,637 4,682,195 4,684,413 4,694,313 4,717,679 4,743,952 4,783,690 4,794,432 4,801,986 4,803,533 4,809,045 4,809,047 4,810,665 4,823,176 4,837,606 4,860,080 4,883,767 4,888,627 4,890,143 4,901,127 4,904,609 4,933,740 4,963,951 4,969,027
Packaging
JEDEC STYLE TO-247
E
C
G
1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper ESD Handling Procedures.
www.intersil.com or 407-727-9207
| Copyright © Intersil Corporation 1999
Page 2
HGTG20N120C3D
Absolute Maximum Ratings T
Collector to Emitter Voltage. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . BV
= 25oC, Unless Otherwise Specified
C
CES
HGTG20N120C3D UNITS
1200 V
Collector Current Continuous
At TC = 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
At TC = 110oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .I
Collector Current Pulsed (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
Gate to Emitter Voltage Continuous . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
Gate to Emitter Voltage Pulsed . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
C25
C110
CM
GES
GEM
45 A 20 A
160 A
±20 V ±30 V
Switching Safe Operating Area at TJ = 150oC, Figure 2. . . . . . . . . . . . . . . . . . . . . SSOA 20A at 1200V
Power Dissipation Total at TC = 25oC. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .P
D
208 W
Power Dissipation Derating TC > 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.67 W/oC
Reverse Voltage Avalanche Energy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . E
Operating and Storage Junction Temperature Range. . . . . . . . . . . . . . . . . . . . .TJ, T
Maximum Lead Temperature for Soldering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T
Short Circuit Withstand Time (Note 2) at VGE = 15V. . . . . . . . . . . . . . . . . . . . . . . . . . t
Short Circuit Withstand Time (Note 2) at VGE = 12V. . . . . . . . . . . . . . . . . . . . . . . . . . t
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operationofthe device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
ARV STG
L SC SC
100 mJ
-40 to 150 260
8 µs
15 µs
o
C
o
C
NOTES:
1. Pulse width limited by maximum junction temperature.
2. V
Electrical Specifications T
= 720V, TJ = 125oC, RGE = 3Ω.
CE(PK)
= 25oC, Unless Otherwise Specified
C
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Collector to Emitter Breakdown Voltage BV Collector to Emitter Leakage Current I
Collector to Emitter Saturation Voltage V
CE(SAT)IC
CES
CES
IC = 250µA, VGE = 0V 1200 - - V VCE = BV
= I
C110
VGE = 15V
Gate to Emitter Threshold Voltage V Gate to Emitter Leakage Current I
GE(TH)
GES
IC = 250µA, VCE = V VGE = ±20V - - ±250 nA
Switching SOA SSOA TJ = 150oC,
RG = 3Ω, VGE = 15V
L = 100µH, Gate to Emitter Plateau Voltage V On-State Gate Charge Q
GEP
G(ON)
IC = I
IC = I
C110
C110
VCE = 0.5 BV
Current Turn-On Delay Time t
d(ON)I
Current Rise Time t Current Turn-Off Delay Time t
d(OFF)I
Current Fall Time t Turn-On Energy (Note 4) E Turn-On Energy (Note 4) E Turn-Off Energy (Note 3) E
rI
fI
ON1
ON2
OFF
IGBT and Diode at TJ = 25oC
ICE = I
C110
VCE = 0.8 BV
VGE = 15V
RG= 3
L = 1mH
Test Circuit - (Figure 19)
CES
TC = 25oC - - 150 µA TC = 150oC - - 2.0 mA
,
TC = 25oC - 2.4 3.0 V TC = 150oC - 2.2 2.9 V
GE
V V
, VCE = 0.5 BV ,
VGE = 15V - 93 130 nC
CES
VGE = 20V - 186 230 nC
CES
5.0 7.0 7.5 V
= 960V 60 - - A
CE (PK)
= 1200V 20 - - A
CE (PK)
CES
- 9.4 - V
-39- ns
-22- ns
- 110 - ns
-95- ns
- 950 - µJ
- 2250 - µJ
- 1200 2400 µJ
2
Page 3
HGTG20N120C3D
Electrical Specifications T
= 25oC, Unless Otherwise Specified (Continued)
C
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Current Turn-On Delay Time t
d(ON)I
Current Rise Time t Current Turn-Off Delay Time t
d(OFF)I
Current Fall Time t Turn-On Energy (Note 4) E Turn-On Energy (Note 4) E Turn-Off Energy (Note 3) E Diode Forward Voltage V Diode Reverse Recovery Time t
rI
fI
ON1
ON2
OFF
EC
rr
IGBT and Diode at TJ = 150oC
ICE = I
C110
VCE = 0.8 BV
CES
VGE = 15V
RG= 3
L = 1mH
Test Circuit - (Figure 19)
-39- ns
-20- ns
- 360 550 ns
- 300 400 ns
- 950 - µJ
- 3365 - µJ
- 4400 8000 µJ IEC = 20A - 2.6 3.4 V IEC= 1A, dIEC/dt = 200A/µs--50ns IEC= 20A, dIEC/dt = 200A/µs--70ns
Thermal Resistance
R
θJC
IGBT - - 0.6
Junction To Case
Diode - - 1.25
NOTES:
3. Turn-Off Energy Loss (E
) is defined as the integral of the instantaneous power loss starting at the trailing edge of the input pulse and ending
OFF
at the point where the collector current equals zero (ICE= 0A). All devices were tested per JEDEC Standard No. 24-1 Method for Measurement of Power Device Turn-Off Switching Loss. This test method produces the true total Turn-Off Energy Loss.
4. Values for two Turn-On loss conditions are shown for the convenience of the circuit designer. E
is the turn-on loss of the IGBT only. E
ON1
the turn-on loss when a typical diode is used in the test circuit and the diode is at the same TJ as the IGBT. The diode type is specified in Figure 19.
o
o
C/W C/W
ON2
is
Typical Performance Curves
45 40 35 30 25 20 15 10
, DC COLLECTOR CURRENT (A)
5
CE
I
0
25 75 100 125 150
50
TC, CASE TEMPERATURE (oC)
(Unless Otherwise Specified)
FIGURE 1. DC COLLECTOR CURRENT vs CASE
TEMPERATURE
VGE= 15V
70
TJ= 150oC, RG = 3, VGE= 15V, L = 100µH
60
50
40
30
20
10
, COLLECTOR TO EMITTER CURRENT (A)
0
CE
I
0
V
, COLLECTOR TO EMITTER VOLTAGE (V)
CE
600 800400200 1000 1200
1400
FIGURE 2. MINIMUM SWITCHING SAFE OPERATING AREA
3
Page 4
HGTG20N120C3D
Typical Performance Curves
60
10
f
= 0.05 / (t
MAX1
f
= (PD- PC) / (E
MAX2
= CONDUCTION DISSIPATION
P
C
, OPERATING FREQUENCY (kHz)
MAX
f
1
(DUTY FACTOR = 50%)
R
= 0.6oC/W, SEE NOTES
ØJC
5
TJ= 150oC, RG = 3, L = 1mH,
+ t
d(OFF)I
ON2
10
I
, COLLECTOR TO EMITTER CURRENT (A)
CE
d(ON)I
+ E
)
OFF
(Unless Otherwise Specified) (Continued)
V
CE
T
C
o
75
o
75
o
110 110oC
)
FIGURE 3. OPERATINGFREQUENCY vs COLLECTORTO
EMITTER CURRENT
70
DUTY CYCLE <0.5%, V PULSE DURATION = 250µs
60
50
40
30
20
10
, COLLECTOR TO EMITTER CURRENT (A)
CE
0
I
024
, COLLECTOR TO EMITTER VOLTAGE (V)
V
CE
GE
= 12V
TC = 150oC
TC = 25oC
TC = -40oC
6810
= 960V
C C C
V
15V 12V 15V 12V
GE
35 400
VCE = 720V, RGE = 3, TJ= 125oC
30
25
20
15
10
, SHORT CIRCUIT WITHSTAND TIME (µs)
6020
5
SC
t
11 12 13 14 15 16
VGE, GATE TO EMITTER VOLTAGE (V)
I
SC
350
300
250
200
150
t
SC
, PEAK SHORT CIRCUIT CURRENT (A)
SC
I
100
FIGURE 4. SHORT CIRCUIT WITHSTAND TIME
200
DUTY CYCLE <0.5%, VGE = 15V
175
PULSE DURATION = 250µs
150
125
100
75
50
25
, COLLECTOR TO EMITTER CURRENT (A)
CE
0
I
024
VCE, COLLECTOR TO EMITTER VOLTAGE (V)
6810
TC = -40oC
TC = 150oC
TC = 25oC
12 14
FIGURE 5. COLLECTOR TO EMITTER ON-STATE VOLTAGE FIGURE 6. COLLECTOR TO EMITTER ON-STATE VOLTAGE
20.0 RG = 3, L = 1mH, VCE = 960V
17.5
15.0
12.5
10.0
7.5
5.0
, TURN-ON ENERGY LOSS (mJ)
2.5
ON2
E
TJ = 25oC, TJ = 150oC, VGE = 12V
0
, COLLECTOR TO EMITTER CURRENT (A)
I
CE
TJ = 25oC, TJ = 150oC, VGE = 15V
2010 3025155
35 40 45
FIGURE 7. TURN-ON ENERGY LOSS vs COLLECTOR TO
EMITTER CURRENT
12
RG = 3, L = 1mH, VCE = 960V
10
8
TJ = 150oC, VGE = 12V OR 15V
6
4
, TURN-OFF ENERGY LOSS (mJ)
2
OFF
E
0
ICE, COLLECTOR TO EMITTER CURRENT (A)
TJ = 25oC, VGE = 12V OR 15V
251510 20 305
4035 45
FIGURE 8. TURN-OFF ENERGY LOSS vs COLLECTOR TO
EMITTER CURRENT
4
Page 5
HGTG20N120C3D
Typical Performance Curves
55
RG = 3, L = 1mH, VCE = 960V
50
TJ = 25oC, TJ = 150oC, VGE = 12V
TJ = 25oC, TJ = 150oC, VGE = 15V
20
, TURN-ON DELAY TIME (ns)
dI
t
45
40
35
30
1051525
ICE, COLLECTOR TO EMITTER CURRENT (A)
(Unless Otherwise Specified) (Continued)
30
FIGURE 9. TURN-ON DELAYTIME vs COLLECTOR TO
EMITTER CURRENT
450
400
350
300
250
200
, TURN-OFF DELAY TIME (ns)
150
100
d(OFF)I
t
50
RG = 3, L = 1mH,
TJ = 150oC, VGE = 12V, VGE = 15V TJ = 25oC, VGE = 12V, VGE = 15V
10 15 305
I
, COLLECTOR TO EMITTER CURRENT (A)
CE
VCE = 960V
2520
4035 45
300
RG = 3, L = 1mH, VCE = 960V
250
TJ = 25oC, TJ = 150oC, VGE= 12V
200
150
TJ = 25oC, TJ = 150oC, VGE= 15V
100
, RISE TIME (ns)
rI
t
50
0
10
ICE, COLLECTOR TO EMITTER CURRENT (A)
305
252015
454035
FIGURE 10. TURN-ON RISE TIME vs COLLECTOR TO
EMITTER CURRENT
350
RG = 3, L = 1mH, VCE = 960V
300
TJ = 150oC, VGE = 12V AND 15V
250
200
, FALL TIME (ns)
150
fI
t
100
50
454035
TJ = 25oC, VGE = 12V AND 15V
10 15 305
ICE, COLLECTOR TO EMITTER CURRENT (A)
2520
454035
FIGURE 11. TURN-OFF DELAYTIME vs COLLECTOR TO
EMITTER CURRENT
175
DUTY CYCLE <0.5%, V PULSE DURATION = 250µs
150
125
100
75
50
25
, COLLECTOR TO EMITTER CURRENT (A)
0
CE
I
V
, GATE TO EMITTER VOLTAGE (V)
GE
TC = 150oC
= 10V
CE
TC = 25oC
TC = -40oC
11
137 8 9 10 12
14 15
FIGURE 13. TRANSFER CHARACTERISTIC FIGURE 14. GATE CHARGE WAVEFORMS
5
FIGURE 12. FALLTIME vs COLLECTOR TO EMITTER
CURRENT
15
I
= 1mA, RL = 30, TC = 25oC
G (REF)
12
VCE = 1200V
9
VCE = 800V
150100
6
, GATE TO EMITTER VOLTAGE (V)
3
GE
V
0
VCE = 400V
0
50
25 75 175125
QG, GATE CHARGE (nC)
Page 6
HGTG20N120C3D
Typical Performance Curves
C, CAPACITANCE (pF)
FIGURE 15. CAPACITANCE vs COLLECTOR TO EMITTER VOLTAGE
0
10
0.50
0.20
(Unless Otherwise Specified) (Continued)
8000 7000
6000
5000
4000
3000
2000
1000
0
0 5 10 15 20 25
VCE, COLLECTOR TO EMITTER VOLTAGE (V)
C
C
C
IES
OES
RES
FREQUENCY = 1MHz
0.10
-1
10
0.05
0.02
0.01
, NORMALIZED THERMAL RESPONSE
-2
10
θJC
Z
-5
10
SINGLE PULSE
-4
10
-3
10
t1, RECTANGULAR PULSE DURATION (s)
FIGURE 16. NORMALIZED TRANSIENT THERMAL RESPONSE, JUNCTION TO CASE
100
150oC
10
, FORWARD CURRENT (A)
F
I
1
012 3 45
V
VF, FORWARD VOLTAGE (V)
, FORWARD VOLTAGE (V)
F
25oC
FIGURE 17. DIODE FORWARDCURRENT vs FORWARD
VOLTAGE DROP
t
P
DUTY FACTOR, D = t1 / t PEAK TJ = (PDX Z
-2
10
70
= 150oC
T
C
60
50
t
rr
40
t
30
t
20
t, RECOVERY TIMES (ns)
10
2
X R
θJC
10
) + T
θJC
C
-1
a
b
2
IF, FORWARD CURRENT (A)
D
0
10
5
FIGURE 18. RECOVERY TIMES vs FORWARD CURRENT
1
t
2
1
10
10
201
6
Page 7
Test Circuit and Waveforms
HGTG20N120C3D
HGTG20N120C3D
90%
V
GE
L = 1mH
RG = 3
+
= 960V
V
DD
-
FIGURE 19. INDUCTIVE SWITCHING TEST CIRCUIT FIGURE 20. SWITCHING TEST WAVEFORMS
Handling Precautions for IGBTs
Insulated Gate Bipolar Transistors are susceptible to gate­insulation damage by the electrostatic discharge of energy through the devices. When handling these de vices , care should be exercisedto assure that the static charge built in the handler’s body capacitance is not discharged through the device. With proper handling and application procedures, howev er, IGBTs are currently being extensively used in production by numerous equipment manufacturers in military, industrial and consumer applications, with virtually no damage problems due to electrostatic discharge. IGBTs can be handled safely if the follo wing basic precautions are tak en:
1. Prior to assembly into a circuit, all leads should be kept shorted together either by the use of metal shorting springs or by the insertion into conductive material such as “ECCOSORBD™ LD26” or equivalent.
2. When devices are removed by hand from their carriers, the hand being used should be grounded by any suitable means - for example, with a metallic wristband.
3. Tips of soldering irons should be grounded.
4. Devices should never be inserted into or removed from circuits with power on.
5. Gate Voltage Rating - Neverexceed the gate-voltage rating of V permanent damage to the oxide layer in the gate region.
6. Gate Termination - The gates of these devices are essentially capacitors. Circuits that leave the gate open­circuited or floating should be avoided. These conditions can result in turn-on of the device due to voltage buildup on the input capacitor due to leakage currents or pickup.
7. Gate Protection- These devicesdo not havean internal monolithic Zener diode from gate to emitter. If gate
. Exceeding the rated VGE can result in
GEM
V
CE
90%
I
CE
t
d(OFF)I
10%
Operating Frequency Information
Operating frequency information for a typical device (Figure 3) is presented as a guide for estimating device performance for a specific application. Other typical frequency vs collector current (I the information shown for a typical unit in Figures 5, 6, 7, 8, 9 and 11. The operating frequency plot (Figure 3) of a typical device shows f point. The information is based on measurements of a typical device and is bounded by the maximum rated junction temperature.
f
is defined by f
MAX1
Deadtime (the denominator) has been arbitrarily held to 10% of the on-state time for a 50% duty factor. Other definitions are possible. t Device turn-off delay can establish an additional frequency limiting condition for an application other than T is important when controlling output ripple under a lightly loaded condition.
f
is defined by f
MAX2
allowable dissipation (P The sum of device switching and conduction losses must not exceed P
. A 50% duty factor was used (Figure 3) and the
D
conduction losses (P P
=(VCExICE)/2.
C
E
and E
ON2
OFF
shown in Figure 20. E power loss (I
CE
integral of the instantaneous power loss (I turn-off. All tail losses are included in the calculation forE i.e., the collector current equals zero (I
or f
MAX1
MAX1
d(OFF)I
MAX2
C
are defined in the switching waveforms
x VCE) during turn-on and E
E
t
fI
MAX2
= 0.05/(t
and t
d(ON)I
= (PD - PC)/(E
) is defined by PD=(TJM-TC)/R
D
) are approximated by
is the integral of the instantaneous
ON2
E
ON2
OFF
) plots are possible using
CE
; whichever is smaller at each
d(OFF)I
are defined in Figure 20.
CE
protection is required an external Zener is recommended.
10%
t
rI
t
d(ON)I
+ t
d(ON)I
JM
+ E
OFF
ON2
is the
OFF
x VCE) during
CE
= 0).
).
. t
d(OFF)I
). The
θJC
OFF
.
;
7
ECCOSORBD‰ is a Trademark of Emerson and Cumming, Inc.
Page 8
TO-247
3 LEAD JEDEC STYLE TO-247 PLASTIC PACKAGE
HGTG20N120C3D
E
Q
ØR
D
A
ØS
TERM. 4
ØP
SYMBOL
A 0.180 0.190 4.58 4.82 -
b 0.046 0.051 1.17 1.29 2, 3
b
1
b
2
INCHES MILLIMETERS
NOTESMIN MAX MIN MAX
0.060 0.070 1.53 1.77 1, 2
0.095 0.105 2.42 2.66 1, 2
c 0.020 0.026 0.51 0.66 1, 2, 3
D 0.800 0.820 20.32 20.82 -
L
1
L
b
1
b
2
c
b
2
1
e
3
e
1
J
1
3
BACK VIEW
2
1
E 0.605 0.625 15.37 15.87 -
e 0.219 TYP 5.56 TYP 4
e
1
J
1
0.438 BSC 11.12 BSC 4
0.090 0.105 2.29 2.66 5
L 0.620 0.640 15.75 16.25 -
L
1
0.145 0.155 3.69 3.93 1
ØP 0.138 0.144 3.51 3.65 -
Q 0.210 0.220 5.34 5.58 ­ØR 0.195 0.205 4.96 5.20 ­ØS 0.260 0.270 6.61 6.85 -
NOTES:
1. Lead dimension and finish uncontrolled in L1.
2. Lead dimension (without solder).
3. Add typically 0.002 inches (0.05mm) for solder coating.
4. Positionofleadtobe measured 0.250 inches(6.35mm)from bottom of dimension D.
5. Positionofleadtobe measured 0.100 inches(2.54mm)from bottom of dimension D.
6. Controlling dimension: Inch.
7. Revision 1 dated 1-93.
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil semiconductor products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time with­out notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However ,no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
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8
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