The HGTD7N60C3S and HGTP7N60C3 are MOS gated
high voltage switching devices combining the best features
of MOSFETs and bipolar transistors. These devices have
the high input impedance of a MOSFET and the low on-state
conduction loss of a bipolar transistor. The much lower
on-state voltage drop varies only moderately between 25
and 150
o
C.
o
The IGBT is ideal for many high voltage switching
applications operating at moderate frequencies where low
conduction losses are essential, such as: AC and DC motor
controls, power supplies and drivers for solenoids, relays
and contactors.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
ARV
STG
L
SC
SC
100mJ
-40 to 150
260
1µs
8µs
o
C
o
C
NOTES:
1. Repetitive Rating: Pulse width limited by maximum junction temperature.
2. V
Electrical SpecificationsT
= 360V, TJ = 125oC, RG= 50Ω.
CE(PK)
= 25oC, Unless Otherwise Specified
C
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAXUNITS
Collector to Emitter Breakdown VoltageBV
Emitter to Collector Breakdown VoltageBV
Collector to Emitter Leakage CurrentI
CES
ECS
CES
IC = 250µA, VGE = 0V600--V
IC = 3mA, VGE= 0V1630-V
VCE = BV
VCE = BV
Collector to Emitter Saturation VoltageV
CE(SAT)IC
= I
C110
VGE = 15V
Gate to Emitter Threshold VoltageV
Gate to Emitter Leakage CurrentI
GE(TH)
GES
IC = 250µA,
VCE = V
GE
VGE = ±25V--±250nA
Switching SOASSOATJ = 150oC
RG = 50Ω
VGE = 15V
L = 1mH
Gate to Emitter Plateau VoltageV
On-State Gate ChargeQ
Current Fall Timet
Turn-On EnergyE
Turn-Off Energy (Note 3)E
Thermal ResistanceR
rI
fI
ON
OFF
θJC
TJ = 150oC
ICE = I
C110
V
= 0.8 BV
CE(PK)
VGE = 15V
RG= 50Ω
L = 1.0mH
CES
-8.5-ns
-11.5-ns
-350400ns
-140275ns
-165-µJ
-600-µJ
--2.1
NOTE:
3. Turn-OffEnergyLoss (E
) isdefinedas the integralofthe instantaneous powerlossstarting at thetrailingedge of the inputpulse and ending
OFF
at the point where the collector current equals zero (ICE= 0A). The HGTD7N60C3S and HGTP7N60C3 were tested per JEDEC standard No.
24-1 Method for Measurement of Power Device Turn-Off Switching Loss. This test method produces the true total Turn-Off Energy Loss. TurnOn losses include diode losses.
Typical Performance Curves
40
DUTY CYCLE <0.5%, V
PULSE DURATION = 250µs
35
30
25
TC = 150oC
20
T
= 25oC
C
15
TC = -40oC
10
5
, COLLECTOR TO EMITTER CURRENT (A)
CE
0
I
4681012
VGE, GATE TO EMITTER VOLTAGE (V)
CE
= 10V
14
40
PULSE DURATION = 250µs,
DUTY CYCLE <0.5%,
35
= 25oC
T
C
30
25
20
15
10
5
, COLLECTOR TO EMITTER CURRENT (A)
CE
0
I
VGE = 15.0V
0246810
VCE, COLLECTOR TO EMITTER VOLTAGE (V)
12.0V
o
C/W
10.0V
9.0V
8.5V
8.0V
7.5V
7.0V
FIGURE 1. TRANSFER CHARACTERISTICSFIGURE 2. SATURATION CHARACTERISTICS
FIGURE 3. COLLECTOR TO EMITTER ON-STATE VOLTAGEFIGURE 4. COLLECTOR TO EMITTER ON-STATE VOLTAGE
3
Page 4
HGTD7N60C3S, HGTP7N60C3
Typical Performance Curves (Continued)
15
12
9
6
3
, DC COLLECTOR CURRENT (A)
CE
I
0
255075100125150
TC, CASE TEMPERATURE (oC)
= 15V
V
GE
FIGURE 5. MAXIMUM DC COLLECTOR CURRENT vs CASE
TEMPERATURE
50
TJ = 150oC, RG = 50Ω, L = 1mH, V
40
30
20
10
, TURN-ON DELAY TIME (ns)
VGE = 10V
VGE = 15V
CE(PK)
= 480V
12
VCE = 360V, RG = 50Ω, TJ = 125oC
10
8
6
4
, SHORT CIRCUIT WITHSTAND TIME (µS)
SC
2
t
101112
V
, GATE TO EMITTER VOLTAGE (V)
GE
FIGURE 6. SHORT CIRCUIT WITHSTAND TIME
500
TJ = 150oC, RG = 50Ω, L = 1mH, V
450
400
350
300
, TURN-OFF DELAY TIME (ns)
250
VGE = 10V OR 15V
CE(PK)
I
SC
t
SC
141513
= 480V
140
120
100
80
60
, PEAK SHORT CIRCUIT CURRENT(A)
SC
I
40
d(ON)I
t
5
251114
I
CE
8
, COLLECTOR TO EMITTER CURRENT (A)
1720
FIGURE 7. TURN-ON DELAY TIME vs COLLECTOR TO
EMITTER CURRENT
200
TJ = 150oC, RG = 50Ω, L = 1mH, V
100
, TURN-ON RISE TIME (ns)
rI
10
t
5
28111417205
ICE, COLLECTOR TO EMITTER CURRENT (A)
= 480V
CE(PK)
VGE = 10V
VGE = 15V
FIGURE 9. TURN-ON RISE TIME vs COLLECTOR TO
EMITTER CURRENT
d(OFF)I
t
200
2811141720
5
ICE, COLLECTOR TO EMITTER CURRENT (A)
FIGURE 8. TURN-OFF DELAY TIME vs COLLECTOR TO
EMITTER CURRENT
300
TJ = 150oC, RG = 50Ω, L = 1mH, V
250
200
150
, FALL TIME (ns)
fI
t
100
28111417205
ICE, COLLECTOR TO EMITTER CURRENT (A)
VGE = 10V or 15V
CE(PK)
= 480V
FIGURE 10. TURN-OFF FALLTIME vs COLLECTOR TO
EMITTER CURRENT
4
Page 5
HGTD7N60C3S, HGTP7N60C3
Typical Performance Curves (Continued)
2000
TJ = 150oC, RG = 50Ω, L = 1mH, V
1000
500
100
, TURN-ON ENERGY LOSS (µJ)
ON
E
40
28111417205
ICE, COLLECTOR TO EMITTER CURRENT (A)
CE(PK)
VGE = 15V
= 480V
VGE = 10V
FIGURE 11. TURN-ON ENERGY LOSS vs COLLECTOR TO
EMITTER CURRENT
200
100
VGE = 10V
TJ = 150oC, TC = 75oC
= 50Ω, L = 1mH
R
G
VGE = 15V
3000
TJ = 150oC, RG = 50Ω, L = 1mH, V
1000
500
, TURN-OFF ENERGY LOSS (µJ)
OFF
E
100
28111417205
ICE, COLLECTOR TO EMITTER CURRENT (A)
VGE= 10V or 15V
CE(PK)
= 480V
FIGURE 12. TURN-OFF ENERGY LOSS vs COLLECTOR TO
EMITTER CURRENT
50
40
30
TJ = 150oC, VGE= 15V, RG= 50Ω, L = 1mH
f
= 0.05/(t
MAX1
10
f
= (PD - PC)/(EON + E
MAX2
= ALLOWABLE DISSIPATION
P
D
P
= CONDUCTION DISSIPATION
, OPERATING FREQUENCY (kHz)
MAX
f
C
(DUTY FACTOR = 50%)
R
= 2.1oC/W
θJC
1
2102030
ICE, COLLECTOR TO EMITTER CURRENT (A)
FIGURE 13. OPERATINGFREQUENCY vs COLLECTORTO
D(OFF)I
+ t
D(ON)I
OFF
)
)
20
10
, COLLECTOR TO EMITTER CURRENT (A)
CE
I
FIGURE 14. MINIMUM SWITCHING SAFE OPERATING AREA
EMITTER CURRENT
1200
1000
800
600
400
C, CAPACITANCE (pF)
200
0
0510152025
C
RES
VCE, COLLECTOR TO EMITTER VOLTAGE (V)
C
FREQUENCY = 1MHz
IES
C
OES
600
500
400
300
200
100
, COLLECTOR TO EMITTER VOLTAGE (V)
CE
V
0
0100200300400500600
V
, COLLECTOR TO EMITTER VOLTAGE (V)
CE(PK)
I
= 1.044mA, RL = 50Ω, TC = 25oC
G(REF)
VCE = 600V
VCE = 400V
VCE = 200V
0
510152025300
QG, GATE CHARGE (nC)
15
12.5
10
7.5
5
2.5
0
, GATE TO EMITTER VOLTAGE (V)
GE
V
FIGURE 15. CAPACITANCE vs COLLECTORTO EMITTER
VOLTAGE
5
FIGURE 16. GATE CHARGE WAVEFORMS
Page 6
HGTD7N60C3S, HGTP7N60C3
Typical Performance Curves (Continued)
0
10
0.5
0.2
0.1
-1
10
0.05
0.02
-2
10
10
0.01
SINGLE PULSE
-5
-4
10
-3
10
t1, RECTANGULAR PULSE DURATION (s)
, NORMALIZED THERMAL RESPONSE
JC
θ
Z
FIGURE 17. IGBT NORMALIZED TRANSIENT THERMAL IMPEDANCE, JUNCTION TO CASE
Test Circuit and Waveform
DUTY FACTOR, D = t1 / t
PEAK TJ = (PDX Z
-2
10
t
1
P
2
X R
JC
θ
-1
10
) + T
JC
θ
D
t
C
0
10
2
1
10
RG = 50Ω
L = 1mH
RHRD660
V
GE
V
CE
+
V
= 480V
DD
-
I
CE
90%
t
d(OFF)I
10%
t
90%
10%
E
fI
OFF
E
ON
t
rI
t
d(ON)I
FIGURE 18. INDUCTIVE SWITCHING TEST CIRCUITFIGURE 19. SWITCHING TEST WAVEFORMS
6
Page 7
HGTD7N60C3S, HGTP7N60C3
Handling Precautions for IGBTs
Insulated Gate Bipolar Transistors are susceptible to
gate-insulation damage by the electrostatic discharge of
energy through the devices. When handling these devices,
care should be exercised to assure that the static charge
built in the handler’s body capacitance is not discharged
through the device. With proper handling and application
procedures, however, IGBTs are currently being extensively
used in production by numerousequipment manufacturers in
military, industrial and consumer applications, with virtually
no damage problems due to electrostatic discharge. IGBTs
can be handled safely if the following basic precautions are
taken:
1. Prior to assemblyinto a circuit, allleads should be kept
shorted together either by the use of metal shorting
springs or by the insertion into conductive material such
as “ECCOSORBD LD26” or equivalent.
2. When devices are removed by hand fromtheir carriers,
the hand being used should be grounded by any suitable
means - for example, with a metallic wristband.
3. Tips of soldering irons should be grounded.
4. Devices should never be inserted into or removed from
circuits with power on.
5. Gate VoltageRating - Never exceedthe gate-voltage
rating of V
permanent damage to the oxidelayer in the gate region.
6. Gate Termination - Thegates of these devices are
essentially capacitors. Circuits that leave the gate opencircuited or floating should be avoided. Theseconditions
can result in turn-on of the device due to voltage buildup
on the input capacitor due to leakage currents or pickup.
7. Gate Protection - These devices do not have an internal
monolithic Zener diode from gate to emitter. If gate
protection is required an external Zener is recommended.
. Exceeding the rated VGE can result in
GEM
Operating Frequency Information
Figure 13 is presented as a guide for estimating device
performance for a specific application. Other typical
frequency vs collector current (I
the information shown for a typical unit in Figures 4, 7, 8, 11
and 12. The operatingfrequency plot (Figure 13) of a typical
device shows f
MAX1
or f
MAX2
point. The information is based on measurements of a
typical device and is bounded by the maximum rated
junction temperature.
f
is defined by f
MAX1
MAX1
= 0.05/(t
Deadtime (the denominator) has been arbitrarily held to 10%
of the on-state time for a 50% duty factor. Other definitions
are possible. t
D(OFF)I
and t
Device turn-off delay can establish an additional frequency
limiting condition for an application other than T
is important when controlling output ripple under a lightly
loaded condition.
f
is defined by f
MAX2
allowabledissipation (P
= (PD - PC)/(E
MAX2
) is defined by PD=(TJM-TC)/R
D
The sum of device switching and conduction losses must
not exceedP
the conduction losses (P
P
=(VCExICE)/2. EON and E
C
. A 50% duty factorwas used (Figure 13) and
D
) are approximated by
C
switching waveforms shown in Figure 19. E
integral of the instantaneous power loss (I
turn-on and E
power loss (I
is the integral of the instantaneous
OFF
CExVCE
) during turn-off. All tail losses are
included in the calculation for E
current equals zero (I
CE
= 0).
) plots are possible using
CE
whichever is smaller at each
+ t
D(OFF)I
are defined in Figure 19.
D(ON)I
are defined in the
OFF
; i.e. the collector
OFF
D(ON)I
+ EON). The
OFF
ON
CExVCE
. t
JM
is the
).
D(OFF)I
θJC
) during
.
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil semiconductor products are sold by description only.Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site www.intersil.com
7
ECCOSORBD™ is a Trademark of Emerson and Cumming, Inc.
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