The HGTD7N60B3S, HGT1S7N60B3S and HGTP7N60B3
are MOS gated high voltage switching devices combining the
best features of MOSFETs and bipolar transistors. These
devices have the high input impedance of a MOSFET and the
low on-state conduction loss of a bipolar transistor. The much
lower on-state voltage drop varies only moderately between
o
25
C and 150oC.
The IGBT is ideal for many high voltage switching applications
operating at moderate frequencies where low conduction
losses are essential, such as: AC and DC motor controls,
power suppliesanddriv ersfor solenoids, relays and contactors.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
ARV
STG
L
SC
SC
100mJ
-55 to 150
260
2µs
12µs
o
C
o
C
NOTES:
1. Single Pulse; Pulse width limited by maximum junction temperature. Parts may current limit at less than ICM.
2. VCE = 360V, TJ = 125oC, RG = 50Ω.
Electrical SpecificationsT
= 25oC, Unless Otherwise Specified
C
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAXUNITS
Collector to Emitter Breakdown VoltageBV
Emitter to Collector Breakdown VoltageBV
Collector to Emitter Leakage CurrentI
CESIC
ECSIC
CES
= 250µA, VGE = 0V600--V
= 3mA, VGE= 0V1528-V
VCE = BV
CES
TC = 25oC--100µA
TC = 150oC--2.0mA
Collector to Emitter Saturation VoltageV
Gate to Emitter Threshold VoltageV
Gate to Emitter Leakage CurrentI
CE(SAT)IC
GE(TH)IC
GES
Switching SOASSOATJ = 150oC
= I
,
C110
VGE = 15V
= 250µA, VCE = V
TC = 25oC-1.82.1V
TC = 150oC-2.12.4V
GE
3.05.16.0V
VGE = ±20V--±100nA
VCE= 480V42--A
RG = 50Ω
VGE = 15V
VCE= 600V35--A
L = 100µH
Gate to Emitter Plateau VoltageV
On-State Gate ChargeQ
Current Turn-On Delay Timet
d(ON)I
Current Rise Timet
Current Turn-Off Delay Timet
d(OFF)I
Current Fall Timet
Turn-On Energy (Note 4)E
Turn-On Energy (Note 4)E
Turn-Off Energy (Note 3)E
GEPIC
G(ON)IC
rI
fI
ON1
ON2
OFF
= I
, VCE = 0.5 BV
C110
= I
,
C110
VCE = 0. 5BV
CES
CES
VGE = 15V-2328nC
VGE = 20V-3037nC
IGBT and Diode Both at TJ = 25oC
ICE = I
, VCE = 0.8 BV
C110
CES
,
VGE = 15V, RG= 50Ω, L = 2mH
Test Circuit (Figure 17)
-7.7-V
-26-ns
-21-ns
-130160ns
-6080ns
-72-µJ
-160200µJ
-120200µJ
2
Page 3
HGTD7N60B3S, HGT1S7N60B3S, HGTP7N60B3
Electrical SpecificationsT
= 25oC, Unless Otherwise Specified (Continued)
C
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAXUNITS
Current Turn-On Delay Timet
d(ON)I
Current Rise Timet
Current Turn-Off Delay Timet
d(OFF)I
Current Fall Timet
Turn-On Energy (Note 4)E
Turn-On Energy (Note 4)E
Turn-Off Energy (Note 3)E
Thermal Resistance Junction To CaseR
ON1
ON2
OFF
θJC
IGBT and Diode Both at TJ = 150oC
ICE = I
rI
VGE = 15V, RG=50Ω, L = 2mH
, VCE = 0.8 BV
C110
Test Circuit (Figure 17)
fI
CES
-24-ns
,
-22-ns
-230295ns
-120175ns
-80-µJ
-310350µJ
-350500µJ
--2.1
NOTE:
3. Turn-OffEnergy Loss (E
) is defined as the integral of the instantaneous power loss starting at the trailing edge of the input pulse and ending
OFF
at the point where the collector current equals zero (ICE= 0A). All devices were tested per JEDEC standard No. 24-1 Method for Measurement
of Power Device Turn-Off Switching Loss. This test method produces the true total Turn-Off Energy Loss. Turn-On losses include losses due
to diode recovery.
4. Values for two Turn-On loss conditions are shown for the convenience of the circuit designer. E
is the Turn-On loss of the IGBT only. E
ON1
is the Turn-On loss when a typical diode is used in the test circuit and the diode is at the same TJ as the IGBT. The diode type is specified in
Figure 17.
FIGURE 15. CAPACITANCE vs COLLECTOR TO EMITTER VOLTAGE
DUTY CYCLE - DESCENDING ORDER
0
10
0.5
0.2
0.1
-1
10
0.05
0.02
0.01
, NORMALIZED THERMAL RESPONSE
θJC
-2
10
Z
-5
10
SINGLE PULSE
-4
10
1200
1000
800
600
400
C, CAPACITANCE (pF)
200
C
0
0510152025
C
OES
RES
VCE, COLLECTOR TO EMITTER VOLTAGE (V)
-3
10
t1, RECTANGULAR PULSE DURATION (s)
C
10
FREQUENCY = 1MHz
IES
DUTY FACTOR, D = t1 / t
PEAK TJ = (PDX Z
-2
θJC
t
1
P
D
2
X R
) + T
θJC
C
-1
10
t
2
0
10
1
10
FIGURE 16. NORMALIZED TRANSIENT THERMAL RESPONSE, JUNCTION TO CASE
Test Circuit and Waveforms
L = 2mH
V
GE
V
CE
90%
I
CE
t
d(OFF)I
10%
t
RG = 50Ω
RHRD660
+
= 480V
V
DD
-
FIGURE 17. INDUCTIVE SWITCHING TEST CIRCUITFIGURE 18. SWITCHING TEST WAVEFORMS
6
90%
E
E
OFF
fI
ON2
10%
t
d(ON)I
t
rI
Page 7
HGTD7N60B3S, HGT1S7N60B3S, HGTP7N60B3
Handling Precautions for IGBTs
Insulated Gate Bipolar Transistors are susceptible to
gate-insulation damage by the electrostatic discharge of
energy through the devices. When handling these devices,
care should be exercised to assure that the static charge
built in the handler’s body capacitance is not discharged
through the device. With proper handling and application
procedures, however, IGBTs are currently being extensively
used in production by numerous equipment manufacturersin
military, industrial and consumer applications, with virtually
no damage problems due to electrostatic discharge. IGBTs
can be handled safely if the following basic precautions are
taken:
1. Prior to assembly into a circuit, all leads should be kept
shorted together either by the use of metal shorting
springs or by the insertion into conductive material such
as “ECCOSORBD™ LD26” or equivalent.
2. When devices are removed by hand from their carriers,
the hand being used should be grounded by any suitable
means - for example, with a metallic wristband.
3. Tips of soldering irons should be grounded.
4. Devices should never be inserted into or removedfrom
circuits with power on.
5. Gate Voltage Rating - Never exceed the gate-voltage
rating of V
permanent damage to the oxide layer in the gate region.
6. Gate Termination - The gates of these devices are
essentially capacitors. Circuits that leave the gate
open-circuited or floating should be avoided. These
conditions can result in turn-on of the device due to
voltage buildup on the input capacitor due to leakage
currents or pickup.
7. Gate Protection - These devices do not havean internal
monolithic Zener diode from gate to emitter. If gate
protection is requiredan external Zener is recommended.
. Exceeding the rated VGE can result in
GEM
Operating Frequency Information
Operating frequency information for a typical device
(Figure 3) is presented as a guide for estimating device
performance for a specific application. Other typical
frequency vs collector current (I
the information shown fora typical unit in Figures 5, 6, 7, 8, 9
and 11. The operating frequency plot (Figure 3) of a typical
device shows f
MAX1
or f
MAX2
point. The information is based on measurements of a
typical device and is bounded by the maximum rated
junction temperature.
f
is defined by f
MAX1
MAX1
= 0.05/(t
Deadtime (the denominator) has been arbitrarily held to 10%
of the on-state time for a 50% duty factor. Other definitions
are possible. t
d(OFF)I
and t
d(ON)I
Device turn-off delay can establish an additional frequency
limiting condition for an application other than T
is important when controlling output ripple under a lightly
loaded condition.
f
is defined by f
MAX2
allowabledissipation (P
= (PD - PC)/(E
MAX2
) is defined by PD=(TJM-TC)/R
D
The sum of device switching and conduction losses must
not exceed P
the conduction losses (P
P
=(VCExICE)/2.
C
E
and E
ON2
shown in Figure 18. E
power loss (I
. A 50% duty factor was used (Figure 3) and
D
are defined in the switching waveforms
OFF
x VCE) during turn-on and E
CE
) are approximated by
C
is the integral of the instantaneous
ON2
integral of the instantaneous power loss (I
turn-off. All tail losses are included in the calculation for E
i.e., the collector current equals zero (I
) plots are possible using
CE
; whichever is smaller at each
d(OFF)I
+ t
d(ON)I
).
are defined in Figure 18.
. t
JM
d(OFF)I
OFF
OFF
x VCE) during
CE
= 0).
CE
+ E
ON2
is the
). The
θJC
OFF
.
;
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil semiconductor products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However ,no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site www.intersil.com
7
ECCOSORBD™ is a Trademark of Emerson and Cumming, Inc.
Loading...
+ hidden pages
You need points to download manuals.
1 point = 1 manual.
You can buy points or you can get point for every manual you upload.