Datasheet HGTP7N60B3, HGTD7N60B3S, HGT1S7N60B3S Datasheet (Intersil Corporation)

Page 1
HGTD7N60B3S, HGT1S7N60B3S, HGTP7N60B3
Data Sheet January 2000
14A, 600V, UFS Series N-Channel IGBTs
The HGTD7N60B3S, HGT1S7N60B3S and HGTP7N60B3 are MOS gated high voltage switching devices combining the best features of MOSFETs and bipolar transistors. These devices have the high input impedance of a MOSFET and the low on-state conduction loss of a bipolar transistor. The much lower on-state voltage drop varies only moderately between
o
25
C and 150oC.
The IGBT is ideal for many high voltage switching applications operating at moderate frequencies where low conduction losses are essential, such as: AC and DC motor controls, power suppliesanddriv ersfor solenoids, relays and contactors.
Formerly Developmental Type TA49190.
Ordering Information
PART NUMBER PACKAGE BRAND
HGTD7N60B3S TO-252AA G7N60B HGT1S7N60B3S TO-263AB G7N60B3
File Number 4412.2
Features
• 14A, 600V, TC = 25oC
• 600V Switching SOA Capability
• Typical Fall Time. . . . . . . . . . . . . . . . 120ns at T
• Short Circuit Rating
• Low Conduction Loss
Packaging
JEDEC TO-220AB
E
C
COLLECTOR
(FLANGE)
JEDEC TO-263AB
= 150oC
J
G
HGTP7N60B3 TO-220AB G7N60B3
NOTE: When ordering,usethe entire part number.Add the suffix9A to obtain the TO-252AAand TO-263AB variant in tape and reel, e.g., HGTD7N60B3S9A.
Symbol
C
G
E
INTERSIL CORPORATION IGBT PRODUCT IS COVERED BY ONE OR MORE OF THE FOLLOWING U.S. PATENTS
4,364,073 4,417,385 4,430,792 4,443,931 4,466,176 4,516,143 4,532,534 4,587,713 4,598,461 4,605,948 4,620,211 4,631,564 4,639,754 4,639,762 4,641,162 4,644,637 4,682,195 4,684,413 4,694,313 4,717,679 4,743,952 4,783,690 4,794,432 4,801,986 4,803,533 4,809,045 4,809,047 4,810,665 4,823,176 4,837,606 4,860,080 4,883,767 4,888,627 4,890,143 4,901,127 4,904,609 4,933,740 4,963,951 4,969,027
G
E
JEDEC TO-252AA
G
E
COLLECTOR (FLANGE)
COLLECTOR (FLANGE)
1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper ESD Handling Procedures.
1-888-INTERSIL or 321-724-7143
| Copyright © Intersil Corporation 2000
Page 2
HGTD7N60B3S, HGT1S7N60B3S, HGTP7N60B3
Absolute Maximum Ratings T
= 25oC, Unless Otherwise Specified
C
ALL TYPES UNITS
Collector to Emitter Voltage. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .BV
CES
600 V
Collector Current Continuous
At TC = 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .I
At TC = 110oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
Collector Current Pulsed (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
Gate to Emitter Voltage Continuous. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .V
Gate to Emitter Voltage Pulsed . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
C25
C110
CM
GES
GEM
14 A
7A
56 A
±20 V ±30 V
Switching Safe Operating Area at TJ = 150oC, Figure 2 . . . . . . . . . . . . . . . . . . . . . . . . SSOA 35A at 600V
Power Dissipation Total at TC = 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . P
D
60 W
Power Dissipation Derating TC > 25oC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.476 W/oC
Reverse Voltage Avalanche Energy. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . E
Operating and Storage Junction Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . TJ, T
Maximum Lead Temperature for Soldering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . T
Short Circuit Withstand Time (Note 2) at VGE = 15V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .t
Short Circuit Withstand Time (Note 2) at VGE = 10V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .t
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
ARV STG
L SC SC
100 mJ
-55 to 150 260
2 µs
12 µs
o
C
o
C
NOTES:
1. Single Pulse; Pulse width limited by maximum junction temperature. Parts may current limit at less than ICM.
2. VCE = 360V, TJ = 125oC, RG = 50.
Electrical Specifications T
= 25oC, Unless Otherwise Specified
C
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Collector to Emitter Breakdown Voltage BV Emitter to Collector Breakdown Voltage BV Collector to Emitter Leakage Current I
CESIC ECSIC
CES
= 250µA, VGE = 0V 600 - - V = 3mA, VGE= 0V 15 28 - V
VCE = BV
CES
TC = 25oC - - 100 µA TC = 150oC - - 2.0 mA
Collector to Emitter Saturation Voltage V
Gate to Emitter Threshold Voltage V Gate to Emitter Leakage Current I
CE(SAT)IC
GE(TH)IC
GES
Switching SOA SSOA TJ = 150oC
= I
,
C110
VGE = 15V
= 250µA, VCE = V
TC = 25oC - 1.8 2.1 V TC = 150oC - 2.1 2.4 V
GE
3.0 5.1 6.0 V
VGE = ±20V - - ±100 nA
VCE= 480V 42 - - A RG = 50 VGE = 15V
VCE= 600V 35 - - A L = 100µH
Gate to Emitter Plateau Voltage V On-State Gate Charge Q
Current Turn-On Delay Time t
d(ON)I
Current Rise Time t Current Turn-Off Delay Time t
d(OFF)I
Current Fall Time t Turn-On Energy (Note 4) E Turn-On Energy (Note 4) E Turn-Off Energy (Note 3) E
GEPIC
G(ON)IC
rI
fI ON1 ON2 OFF
= I
, VCE = 0.5 BV
C110
= I
,
C110
VCE = 0. 5BV
CES
CES
VGE = 15V - 23 28 nC VGE = 20V - 30 37 nC
IGBT and Diode Both at TJ = 25oC ICE = I
, VCE = 0.8 BV
C110
CES
, VGE = 15V, RG= 50, L = 2mH Test Circuit (Figure 17)
- 7.7 - V
-26-ns
-21-ns
- 130 160 ns
-6080ns
-72-µJ
- 160 200 µJ
- 120 200 µJ
2
Page 3
HGTD7N60B3S, HGT1S7N60B3S, HGTP7N60B3
Electrical Specifications T
= 25oC, Unless Otherwise Specified (Continued)
C
PARAMETER SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
Current Turn-On Delay Time t
d(ON)I
Current Rise Time t Current Turn-Off Delay Time t
d(OFF)I
Current Fall Time t Turn-On Energy (Note 4) E Turn-On Energy (Note 4) E Turn-Off Energy (Note 3) E Thermal Resistance Junction To Case R
ON1 ON2 OFF
θJC
IGBT and Diode Both at TJ = 150oC ICE = I
rI
VGE = 15V, RG=50Ω, L = 2mH
, VCE = 0.8 BV
C110
Test Circuit (Figure 17)
fI
CES
-24-ns
,
-22-ns
- 230 295 ns
- 120 175 ns
-80-µJ
- 310 350 µJ
- 350 500 µJ
- - 2.1
NOTE:
3. Turn-OffEnergy Loss (E
) is defined as the integral of the instantaneous power loss starting at the trailing edge of the input pulse and ending
OFF
at the point where the collector current equals zero (ICE= 0A). All devices were tested per JEDEC standard No. 24-1 Method for Measurement of Power Device Turn-Off Switching Loss. This test method produces the true total Turn-Off Energy Loss. Turn-On losses include losses due to diode recovery.
4. Values for two Turn-On loss conditions are shown for the convenience of the circuit designer. E
is the Turn-On loss of the IGBT only. E
ON1
is the Turn-On loss when a typical diode is used in the test circuit and the diode is at the same TJ as the IGBT. The diode type is specified in Figure 17.
Typical Performance Curves Unless Otherwise Specified
o
C/W
ON2
16
14
12
10
8
6
4
, DC COLLECTOR CURRENT (A)
2
CE
I
0
25 50 75 100 125 150
TC, CASE TEMPERATURE (oC)
FIGURE 1. DC COLLECTOR CURRENT vs CASE
TEMPERATURE
V
= 15V
GE
50
40
30
20
10
, COLLECTOR TO EMITTER CURRENT (A)
0
CE
I
VCE, COLLECTOR TO EMITTER VOLTAGE (V)
TJ= 150oC, RG = 50Ω, VGE= 15V
200 3001000 400 500
600
700
FIGURE 2. MINIMUM SWITCHING SAFE OPERATING AREA
3
Page 4
HGTD7N60B3S, HGT1S7N60B3S, HGTP7N60B3
Typical Performance Curves Unless Otherwise Specified (Continued)
400
TJ= 150oC, RG = 50, L = 2mH, VCE = 480V
100
10
f
MAX1
f
MAX2
P
, OPERATING FREQUENCY (kHz)
MAX
f
C
R
ØJC
1
1
= 0.05 / (t = (PD- PC) / (E
= CONDUCTION DISSIPATION
(DUTY FACTOR = 50%)
= 2.1oC/W, SEE NOTES
I
, COLLECTOR TO EMITTER CURRENT (V)
CE
d(OFF)I
+ t
ON2
32
d(ON)I
+ E
)
)
OFF
510
T
C
o
75
o
75
110oC
110oC
V
GE
C
15V
C
10V 15V 10V
15468
FIGURE 3. OPERATINGFREQUENCY vs COLLECTOR TO
EMITTER CURRENT
30
PULSE DURATION = 250µs DUTY CYCLE < 0.5%, VGE = 10V
25
20
TC = -55oC
15
10
5
, COLLECTOR TO EMITTER CURRENT (A)
CE
0
I
02468
1357
V
, COLLECTOR TO EMITTER VOLTAGE (V)
CE
TC = 150oC
TC = 25oC
18
14
10
6
, SHORT CIRCUIT WITHSTAND TIME (µs)
SC
2
t
10 11 12 13 14 15
VCE = 360V, RG = 50, TJ= 125oC
, GATE TO EMITTER VOLTAGE (V)
V
GE
I
SC
t
SC
FIGURE 4. SHORT CIRCUIT WITHSTAND TIME
40
30
20
10
, COLLECTOR TO EMITTER CURRENT (A)
CE
0
I
TC = -55oC
PULSE DURATION = 250µs DUTY CYCLE < 0.5%, VGE = 15V
046823 5 7
1
VCE, COLLECTOR TO EMITTER VOLTAGE (V)
TC = 150oC
TC = 25oC
100
80
60
40
, PEAK SHORT CIRCUIT CURRENT (A)
SC
I
20
FIGURE 5. COLLECTOR TO EMITTER ON STATE VOLTAGE FIGURE 6. COLLECTOR TO EMITTER ON STATE VOLTAGE
1600
RG = 50, L = 2mH, VCE = 480V
T
1200
, TURN-ON ENERGY LOSS (µJ)
ON2
E
= 150oC, VGE = 10V
J
TJ = 150oC, VGE = 15V
TJ = 25oC, VGE = 10V
800
TJ = 25oC, VGE = 15V
400
0
3 7 11 13
I
CE
951
, COLLECTOR TO EMITTER CURRENT (A)
FIGURE 7. TURN-ON ENERGY LOSS vs COLLECTOR TO
EMITTER CURRENT
15
1000
RG = 50, L = 2mH, VCE = 480V
800
TJ = 150oC, VGE = 10V AND 15V
TJ = 25oC, VGE = 10V AND 15V
37 13
ICE, COLLECTOR TO EMITTER CURRENT (A)
11951
, TURN-OFF ENERGY LOSS (µJ)
OFF
E
600
400
200
0
FIGURE 8. TURN-OFF ENERGY LOSS vs COLLECTOR TO
EMITTER CURRENT
4
15
Page 5
HGTD7N60B3S, HGT1S7N60B3S, HGTP7N60B3
Typical Performance Curves Unless Otherwise Specified (Continued)
60
RG = 50, L = 2mH, VCE = 480V
, TURN-ON DELAY TIME (ns)
dI
t
50
40
30
20
10
TJ = 150oC, VGE = 10V
TJ = 25oC, VGE = 10V
TJ = 25oC, VGE = 15V
TJ = 150oC, VGE = 15V
37 13
51 9 11 15
ICE, COLLECTOR TO EMITTER CURRENT (A)
FIGURE 9. TURN-ON DELAYTIME vs COLLECTOR TO
EMITTER CURRENT
250
200
TJ = 150oC, VGE = 15V
150
RG = 50, L = 2mH, VCE = 480V
TJ = 150oC, VGE = 10V
140
RG = 50, L = 2mH, VCE = 480V
120
100
TJ = 150oC, VGE = 10V
TJ = 25oC and 150oC, VGE= 15V
5 9 13 15
, RISE TIME (ns)
rI
t
80
TJ = 25oC, VGE= 10V
60
40
20
0
1
3711
ICE, COLLECTOR TO EMITTER CURRENT (A)
FIGURE 10. TURN-ON RISE TIME vs COLLECTOR TO
EMITTER CURRENT
120
RG = 50, L = 2mH, VCE = 480V
100
TJ = 150oC, VGE = 10V and 15V
80
, TURN-OFF DELAY TIME (ns)
100
d(OFF)I
t
50
TJ = 25oC, VGE = 10V
5 9 13 15
3711
1
ICE, COLLECTOR TO EMITTER CURRENT (A)
TJ = 25oC, VGE = 15V
FIGURE 11. TURN-OFF DELAYTIME vs COLLECTOR TO
EMITTER CURRENT
40
DUTY CYCLE = < 0.5% PULSE DURATION = 250µs
= 10V
V
CE
32
24
16
T
= 150oC
C
8
, COLLECTOR TO EMITTER CURRENT (A)
CE
0
I
814612
V
GE
T
= -55oC
C
10
, GATE TO EMITTER VOLTAGE (V)
TC = 25oC
, FALL TIME (ns)
fI
t
60
TJ = 25oC, VGE = 10V and 15V
40
1591315
3711
ICE, COLLECTOR TO EMITTER CURRENT (A)
FIGURE 12. FALLTIME vs COLLECTOR TO EMITTER
CURRENT
15
I
= 0.758mA, RL = 86Ω, TC= 25oC
g(REF)
12
V
= 400V
CE
VCE = 600V
20
244
= 200V
V
9
6
3
, GATE TO EMITTER VOLTAGE (V)
GE
V
0
012816 28
CE
QG, GATE CHARGE (nC)
FIGURE 13. TRANSFER CHARACTERISTIC FIGURE 14. GATE CHARGE WAVEFORMS
5
Page 6
HGTD7N60B3S, HGT1S7N60B3S, HGTP7N60B3
Typical Performance Curves Unless Otherwise Specified (Continued)
FIGURE 15. CAPACITANCE vs COLLECTOR TO EMITTER VOLTAGE
DUTY CYCLE - DESCENDING ORDER
0
10
0.5
0.2
0.1
-1
10
0.05
0.02
0.01
, NORMALIZED THERMAL RESPONSE
θJC
-2
10
Z
-5
10
SINGLE PULSE
-4
10
1200
1000
800
600
400
C, CAPACITANCE (pF)
200
C
0
0 5 10 15 20 25
C
OES
RES
VCE, COLLECTOR TO EMITTER VOLTAGE (V)
-3
10
t1, RECTANGULAR PULSE DURATION (s)
C
10
FREQUENCY = 1MHz
IES
DUTY FACTOR, D = t1 / t PEAK TJ = (PDX Z
-2
θJC
t
1
P
D
2
X R
) + T
θJC
C
-1
10
t
2
0
10
1
10
FIGURE 16. NORMALIZED TRANSIENT THERMAL RESPONSE, JUNCTION TO CASE
Test Circuit and Waveforms
L = 2mH
V
GE
V
CE
90%
I
CE
t
d(OFF)I
10%
t
RG = 50
RHRD660
+
= 480V
V
DD
-
FIGURE 17. INDUCTIVE SWITCHING TEST CIRCUIT FIGURE 18. SWITCHING TEST WAVEFORMS
6
90%
E
E
OFF
fI
ON2
10%
t
d(ON)I
t
rI
Page 7
HGTD7N60B3S, HGT1S7N60B3S, HGTP7N60B3
Handling Precautions for IGBTs
Insulated Gate Bipolar Transistors are susceptible to gate-insulation damage by the electrostatic discharge of energy through the devices. When handling these devices, care should be exercised to assure that the static charge built in the handler’s body capacitance is not discharged through the device. With proper handling and application procedures, however, IGBTs are currently being extensively used in production by numerous equipment manufacturersin military, industrial and consumer applications, with virtually no damage problems due to electrostatic discharge. IGBTs can be handled safely if the following basic precautions are taken:
1. Prior to assembly into a circuit, all leads should be kept shorted together either by the use of metal shorting springs or by the insertion into conductive material such as “ECCOSORBD™ LD26” or equivalent.
2. When devices are removed by hand from their carriers, the hand being used should be grounded by any suitable means - for example, with a metallic wristband.
3. Tips of soldering irons should be grounded.
4. Devices should never be inserted into or removedfrom circuits with power on.
5. Gate Voltage Rating - Never exceed the gate-voltage rating of V permanent damage to the oxide layer in the gate region.
6. Gate Termination - The gates of these devices are essentially capacitors. Circuits that leave the gate open-circuited or floating should be avoided. These conditions can result in turn-on of the device due to voltage buildup on the input capacitor due to leakage currents or pickup.
7. Gate Protection - These devices do not havean internal monolithic Zener diode from gate to emitter. If gate protection is requiredan external Zener is recommended.
. Exceeding the rated VGE can result in
GEM
Operating Frequency Information
Operating frequency information for a typical device (Figure 3) is presented as a guide for estimating device performance for a specific application. Other typical frequency vs collector current (I the information shown fora typical unit in Figures 5, 6, 7, 8, 9 and 11. The operating frequency plot (Figure 3) of a typical device shows f
MAX1
or f
MAX2
point. The information is based on measurements of a typical device and is bounded by the maximum rated junction temperature.
f
is defined by f
MAX1
MAX1
= 0.05/(t Deadtime (the denominator) has been arbitrarily held to 10% of the on-state time for a 50% duty factor. Other definitions are possible. t
d(OFF)I
and t
d(ON)I
Device turn-off delay can establish an additional frequency limiting condition for an application other than T is important when controlling output ripple under a lightly loaded condition.
f
is defined by f
MAX2
allowabledissipation (P
= (PD - PC)/(E
MAX2
) is defined by PD=(TJM-TC)/R
D
The sum of device switching and conduction losses must not exceed P the conduction losses (P P
=(VCExICE)/2.
C
E
and E
ON2
shown in Figure 18. E power loss (I
. A 50% duty factor was used (Figure 3) and
D
are defined in the switching waveforms
OFF
x VCE) during turn-on and E
CE
) are approximated by
C
is the integral of the instantaneous
ON2
integral of the instantaneous power loss (I turn-off. All tail losses are included in the calculation for E i.e., the collector current equals zero (I
) plots are possible using
CE
; whichever is smaller at each
d(OFF)I
+ t
d(ON)I
).
are defined in Figure 18.
. t
JM
d(OFF)I
OFF
OFF
x VCE) during
CE
= 0).
CE
+ E
ON2
is the
). The
θJC
OFF
.
;
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil semiconductor products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time with­out notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However ,no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site www.intersil.com
7
ECCOSORBD™ is a Trademark of Emerson and Cumming, Inc.
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