The HGTD7N60A4S, HGT1S7N60A4S, HGTG7N60A4 and
HGTP7N60A4 are MOS gated high voltage switching
devices combining the best features of MOSFETs and
bipolar transistors. These devices have the high input
impedance of a MOSFET and the low on-state conduction
loss of a bipolar transistor. The much lower on-state voltage
drop varies only moderately between 25
o
C and 150oC.
This IGBT is ideal for many high voltage switching
applications operating at high frequencies where low
conduction losses are essential. This device has been
optimized for high frequency switch mode power supplies.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
L
PKG
300
260
o
C
o
C
o
C
NOTE:
1. Pulse width limited by maximum junction temperature.
Electrical SpecificationsT
= 25oC, Unless Otherwise Specified
J
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAXUNITS
Collector to Emitter Breakdown VoltageBV
Emitter to Collector Breakdown VoltageBV
Collector to Emitter Leakage CurrentI
Collector to Emitter Saturation VoltageV
Gate to Emitter Threshold VoltageV
Gate to Emitter Leakage CurrentI
CES
ECS
CES
CE(SAT)IC
GE(TH)
GES
Switching SOASSOAT
IC = 250µA, VGE = 0V600--V
IC = 10mA, VGE= 0V20--V
VCE = 600VTJ = 25oC--250µA
= 125oC--2mA
T
J
= 7A,
VGE = 15V
TJ = 25oC-1.92.7V
= 125oC-1.62.2V
T
J
IC = 250µA, VCE = 600V4.55.97.0V
VGE = ±20V--±250nA
= 150oC, RG = 25Ω, VGE = 15V
J
35--A
L = 100µH, VCE= 600V
Pulsed Avalanche EnergyE
Gate to Emitter Plateau VoltageV
On-State Gate ChargeQ
Current Turn-On Delay Timet
d(ON)I
Current Rise Timet
Current Turn-Off Delay Timet
d(OFF)I
Current Fall Timet
Turn-On Energy (Note 2)E
Turn-On Energy (Note 2)E
Turn-Off Energy (Note 3)E
AS
GEP
g(ON)
rI
fI
ON1
ON2
OFF
ICE = 7A, L = 500µH25--mJ
IC = 7A, VCE = 300V-9.0-V
IC = 7A,
VCE = 300V
IGBT and Diode at TJ = 25oC
ICE = 7A
VCE = 390V
VGE = 15V
RG= 25Ω
L = 1mH
Test Circuit (Figure 20)
VGE = 15V-3745nC
V
= 20V-4860nC
GE
-11- ns
-11- ns
-100-ns
-45- ns
-55- µJ
-120150µJ
-6075µJ
2-2
Page 3
HGTD7N60A4S, HGT1S7N60A4S, HGTG7N60A4, HGTP7N60A4
Electrical SpecificationsT
= 25oC, Unless Otherwise Specified (Continued)
J
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAXUNITS
Current Turn-On Delay Timet
d(ON)I
Current Rise Timet
Current Turn-Off Delay Timet
d(OFF)I
Current Fall Timet
Turn-On Energy (Note 2)E
Turn-On Energy (Note 2)E
Turn-Off Energy (Note 3)E
Thermal Resistance Junction To CaseR
rI
fI
ON1
ON2
OFF
θJC
IGBT and Diode at TJ = 125oC
ICE = 7A
VCE = 390V
VGE = 15V
RG= 25Ω
L = 1mH
Test Circuit (Figure 20)
-10- ns
-7-ns
-130150ns
-7585ns
-50- µJ
-200215µJ
-125170µJ
--1.0
NOTES:
2. Values for two Turn-On loss conditions are shown for the convenience of the circuit designer. E
is the turn-on loss of the IGBT only. E
ON1
is the turn-on loss when a typical diode is used in the test circuit and the diode is at the same TJ as the IGBT. The diode type is specified in
Figure 20.
3. Turn-Off Energy Loss (E
) is defined as the integral of the instantaneouspower loss starting at the trailing edge of the input pulse and ending
OFF
at the point where the collector current equals zero (ICE= 0A). All devices were tested per JEDEC Standard No. 24-1 Method for Measurement
of Power Device Turn-Off Switching Loss. This test method produces the true total Turn-Off Energy Loss.
FIGURE 19. IGBT NORMALIZED TRANSIENT THERMAL RESPONSE, JUNCTION TO CASE
Test Circuit and Waveforms
RHRP660
L = 1mH
RG = 25Ω
-3
10
t1, RECTANGULAR PULSE DURATION (s)
+
= 390V
V
DD
-
10
t
1
P
D
t
2
DUTY FACTOR, D = t1 / t
PEAK TJ = (PDX Z
-2
V
GE
V
CE
I
CE
-1
10
90%
t
d(OFF)I
10%
10
90%
E
OFF
t
fI
2
X R
10%
θJC
t
d(ON)I
t
rI
) + T
C
1
10
θJC
0
E
ON2
FIGURE 20. INDUCTIVE SWITCHING TEST CIRCUITFIGURE 21. SWITCHING TEST WAVEFORMS
2-6
Page 7
HGTD7N60A4S, HGT1S7N60A4S, HGTG7N60A4, HGTP7N60A4
Handling Precautions for IGBTs
Insulated Gate Bipolar Transistors are susceptible to
gate-insulation damage by the electrostatic discharge of
energy through the devices. When handling these devices,
care should be exercised to assure that the static charge
built in the handler’s body capacitance is not discharged
through the device. With proper handling and application
procedures, however, IGBTs are currently being extensively
used in production bynumerous equipment manufacturers in
military, industrial and consumer applications, with virtually
no damage problems due to electrostatic discharge. IGBTs
can be handled safely if the following basic precautions are
taken:
1. Prior to assembly into a circuit, all leads should be kept
shorted together either by the use of metal shorting
springs or by the insertion into conductive material such
as “ECCOSORBD LD26” or equivalent.
2. When devices are removed by hand from their carriers,
the hand being used should be grounded by any suitable
means - for example, with a metallic wristband.
3. Tips of soldering irons should be grounded.
4. Devicesshould never be inserted into or removed from
circuits with power on.
5. Gate Voltage Rating - Neverexceedthe gate-voltage
rating of V
permanent damage to the oxide layer in the gate region.
6. Gate Termination - The gates of these devices are
essentially capacitors. Circuits that leave the gate
open-circuited or floating should be avoided. These
conditions can result in turn-on of the device due to
voltage buildup on the input capacitor due to leakage
currents or pickup.
7. GateProtection - These devices do not have an internal
monolithic Zener diode from gate to emitter. If gate
protection is required an externalZener is recommended.
. Exceeding the rated VGE can result in
GEM
Operating Frequency Information
Operating frequency information for a typical device
(Figure 3) is presented as a guide for estimating device
performance for a specific application. Other typical
frequency vs collector current (I
the information shown for a typical unit in Figures 5, 6, 7, 8, 9
and 11. The operating frequency plot (Figure 3) of a typical
device shows f
MAX1
or f
MAX2
point. The information is based on measurements of a
typical device and is bounded by the maximum rated
junction temperature.
f
is defined by f
MAX1
MAX1
= 0.05/(t
Deadtime (the denominator) has been arbitrarily held to 10%
of the on-state time for a 50% duty factor. Other definitions
are possible. t
d(OFF)I
and t
Device turn-off delay can establish an additional frequency
limiting condition for an application other than T
f
is defined by f
MAX2
allowabledissipation (P
= (PD - PC)/(E
MAX2
) is defined by PD=(TJM-TC)/R
D
The sum of device switching and conduction losses must
not exceed P
the conduction losses (P
P
=(VCEx ICE)/2.
C
E
and E
ON2
shown in Figure 21. E
. A 50% duty factor was used (Figure 3) and
D
are defined in the switching waveforms
OFF
) are approximated by
C
is the integral of the
ON2
instantaneous power loss (I
E
is the integral of the instantaneous power loss
OFF
(I
CExVCE
calculation for E
(I
CE
) during turn-off. All tail losses are included in the
; i.e., the collector current equals zero
OFF
= 0).
) plots are possible using
CE
; whichever is smaller at each
+ t
d(OFF)I
are defined in Figure 21.
d(ON)I
OFF
x VCE) during turn-on and
CE
d(ON)I
JM
+ E
).
.
ON2
). The
θJC
.
2-7
ECCOSORBD™ is a trademark of Emerson and Cumming, Inc.
1. These dimensions are within allowable dimensions of Rev.J of
JEDEC TO-220AB outline dated 3-24-87.
2. Lead dimension and finish uncontrolled in L1.
3. Lead dimension (without solder).
4. Add typically 0.002 inches (0.05mm) for solder coating.
5. Position of lead to be measured 0.250 inches (6.35mm) from bottom of dimension D.
6. Position of lead to be measured 0.100 inches (2.54mm) from bottom of dimension D.
7. Controlling dimension: Inch.
8. Revision 2 dated 7-97.
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil semiconductor products are sold by description only.Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site www.intersil.com
Sales Office Headquarters
NORTH AMERICA
Intersil Corporation
P. O. Box 883, Mail Stop 53-204
Melbourne, FL 32902
TEL: (321) 724-7000
FAX: (321) 724-7240
2-11
EUROPE
Intersil SA
Mercure Center
100, Rue de la Fusee
1130 Brussels, Belgium
TEL: (32) 2.724.2111
FAX: (32) 2.724.22.05
ASIA
Intersil Ltd.
8F-2, 96, Sec. 1, Chien-kuo North,
Taipei, Taiwan 104
Republic of China
TEL: 886-2-2515-8508
FAX: 886-2-2515-8369
Loading...
+ hidden pages
You need points to download manuals.
1 point = 1 manual.
You can buy points or you can get point for every manual you upload.