The HGTD2N120CNS, HGTP2N120CN, and
HGT1S2N120CNS are Non-Punch Through (NPT) IGBT
designs. They are new members of the MOS gated high
voltage switching IGBT family. IGBTs combine the best
features of MOSFETs and bipolar transistors. This device
has the high input impedance of a MOSFET and the low
on-state conduction loss of a bipolar transistor.
The IGBT is ideal for many high voltage switching
applications operating at moderate frequencies where low
conduction losses are essential, such as: AC and DC motor
controls, power supplies and drivers for solenoids, relays
and contactors.
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
L
pkg
SC
300
260
8µs
o
C
o
C
NOTES:
1. Pulse width limited by maximum junction temperature.
2. ICE= 3A, L = 4mH.
3. V
= 840V, TJ = 125oC, RG = 51Ω.
CE(PK)
Electrical SpecificationsT
= 25oC, Unless Otherwise Specified
C
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAXUNITS
Collector to Emitter Breakdown VoltageBV
Emitter to Collector Breakdown VoltageBV
Collector to Emitter Leakage CurrentI
CES
ECS
CES
IC = 250µA, VGE = 0V1200--V
IC = 10mA, VGE= 0V15--V
VCE = BV
Gate to Emitter Threshold VoltageV
Gate to Emitter Leakage CurrentI
CE(SAT)IC
GE(TH)
GES
= 2.6A,
VGE = 15V
IC = 45µA, VCE = V
TC = 25oC-2.052.40V
TC = 150oC-2.753.50V
GE
VGE = ±20V--±250nA
Switching SOASSOATJ = 150oC, RG = 51Ω, VGE = 15V,
Gate to Emitter Plateau VoltageV
On-State Gate ChargeQ
GEP
G(ON)
L = 5mH, V
IC = 2.6A, VCE = 0.5 BV
IC = 2.6A,
VCE = 0.5 BV
CE(PK)
CES
= 1200V
CES
VGE = 15V-3036nC
VGE = 20V-3643nC
6.46.7-V
13--A
-10.2-V
2
Page 3
HGTD2N120CNS, HGTP2N120CN, HGT1S2N120CNS
Electrical SpecificationsT
= 25oC, Unless Otherwise Specified (Continued)
C
PARAMETERSYMBOLTEST CONDITIONSMINTYPMAXUNITS
Current Turn-On Delay Timet
d(ON)I
Current Rise Timet
Current Turn-Off Delay Timet
d(OFF)I
Current Fall Timet
Turn-On Energy (Note 4)E
Turn-On Energy (Note 4)E
Turn-Off Energy (Note 5)E
Current Turn-On Delay Timet
d(ON)I
Current Rise Timet
Current Turn-Off Delay Timet
d(OFF)I
Current Fall Timet
Turn-On Energy (Note 4)E
Turn-On Energy (Note 4)E
Turn-Off Energy (Note 5)E
Thermal Resistance Junction To CaseR
rI
fI
ON1
ON2
OFF
rI
fI
ON1
ON2
OFF
θJC
IGBT and Diode at TJ = 25oC
ICE = 2.6A
VCE = 0.8 BV
CES
VGE = 15V
RG= 51Ω
L = 5mH
Test Circuit (Figure 18)
IGBT and Diode at TJ = 150oC,
ICE = 2.6A,
VCE = 0.8 BV
CES
,
VGE = 15V,
RG= 51Ω,
L = 5mH,
Test Circuit (Figure 18)
-2530ns
-1115ns
-205220ns
-260320ns
-96- µJ
-425590µJ
-355390µJ
-2125ns
-1115ns
-225240ns
-360420ns
-96- µJ
-8001100µJ
-530580µJ
--1.20
NOTES:
4. Values for two Turn-On loss conditions are shown for the convenience of the circuit designer. E
is the turn-on loss of the IGBT only. E
ON1
is the turn-on loss when a typical diode is used in the test circuit and the diode is at the same TJ as the IGBT. The diode type is specified in
Figure 18.
5. Turn-OffEnergy Loss (E
) is defined as the integral of the instantaneous powerloss starting atthe trailing edgeof the inputpulse and ending
OFF
at the point where the collector current equals zero (ICE= 0A). All devices were tested per JEDEC Standard No. 24-1 Method for Measurement
of Power Device Turn-Off Switching Loss. This test method produces the true total Turn-Off Energy Loss.
FIGURE 17. NORMALIZED TRANSIENT THERMAL RESPONSE, JUNCTION TO CASE
Test Circuit and Waveforms
RHRD4120
90%
V
GE
RG = 51Ω
L = 5mH
V
CE
90%
+
= 960V
V
DD
-
I
CE
t
d(OFF)I
10%
E
t
fI
FIGURE 18. INDUCTIVE SWITCHING TEST CIRCUITFIGURE 19. SWITCHING TEST WAVEFORMS
6
OFF
E
ON2
10%
t
d(ON)I
t
rI
Page 7
HGTD2N120CNS, HGTP2N120CN, HGT1S2N120CNS
Handling Precautions for IGBTs
Insulated Gate Bipolar Transistors are susceptible to
gate-insulation damage by the electrostatic discharge of
energy through the devices. When handling these devices,
care should be exercised to assure that the static charge
built in the handler’s body capacitance is not discharged
through the device. With proper handling and application
procedures, however, IGBTs are currently being extensively
used in production by numerousequipment manufacturersin
military, industrial and consumer applications, with virtually
no damage problems due to electrostatic discharge. IGBTs
can be handled safely if the following basic precautions are
taken:
1. Prior to assembly into a circuit, all leads should be kept
shorted together either by the use of metal shorting
springs or by the insertion into conductive material such
as “ECCOSORBD™ LD26” or equivalent.
2. When devices are removed by hand from their carriers,
the hand being used should be groundedby anysuitable
means - for example, with a metallic wristband.
3. Tips of soldering irons should be grounded.
4. Devices should never be inserted into or removed from
circuits with power on.
5. Gate Voltage Rating - Never exceed the gate-voltage
rating of V
permanent damage to the oxide layer in the gate region.
6. Gate Termination- The gatesof these devicesare
essentially capacitors. Circuits that leave the gate
open-circuited or floating should be avoided. These
conditions can result in turn-on of the device due to
voltage buildup on the input capacitor due to leakage
currents or pickup.
7. Gate Protection- Thesedevices do not have an internal
monolithic Zener diode from gate to emitter. If gate
protection is required, an external Zener is
recommended.
. Exceeding the rated VGE can result in
GEM
Operating Frequency Information
Operating frequency information for a typical device (Figure
3) is presented as a guide forestimating deviceperformance
fora specific application. Other typical frequency vs collector
current (I
fora typical unitin Figures 5, 6, 7, 8, 9 and 11. The operating
frequency plot (Figure 3) of a typical device shows f
f
MAX2
based on measurements of a typical device and is bounded
by the maximum rated junction temperature.
f
MAX1
Deadtime (the denominator) hasbeen arbitrarily held to 10%
of the on-state time for a 50% duty factor. Other definitions
are possible. t
Device turn-off delay can establish an additional frequency
limiting condition for an application other than T
is important when controlling output ripple under a lightly
loaded condition.
f
MAX2
allowable dissipation (P
The sum of device switching and conduction losses must
not exceed P
the conduction losses (P
P
=(VCEx ICE)/2.
C
E
ON2
shown in Figure 19. E
instantaneous power loss (I
E
OFF
(I
CExVCE
the calculation for E
zero (I
) plots are possible using the information shown
CE
MAX1
; whichever is smaller ateach point. The information is
is defined by f
d(OFF)I
is defined by f
. A 50% duty factor was used (Figure 3) and
D
and E
are defined in the switching waveforms
OFF
= 0.05/(t
MAX1
and t
= (PD - PC)/(E
MAX2
) is defined by PD=(TJM-TC)/RθJC.
D
C
ON2
are defined in Figure 19.
d(ON)I
) are approximated by
is the integral of the
x VCE) during turn-on and
CE
d(OFF)I
OFF
+ t
+ E
d(ON)I
JM
ON2
).
. t
d(OFF)I
). The
is the integral of the instantaneous power loss
) during turn-off. All tail losses are included in
; i.e., the collector current equals
OFF
CE
= 0).
or
7
ECCOSORBD™ is a trademark of Emerson and Cumming, Inc.
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