This N-Channel IGBT is a MOS gated, logic level device
which is intended to be used as an ignition coil driver in automotive ignition circuits. Unique features include an active
voltage clamp between the collector and the gate which provides Self Clamped Inductive Switching (SCIS) capability in
ignition circuits. Internal diodes provide ESD protection for
the logic level gate. Both a series resistor and a shunt resistor are provided in the gate circuit.
FIGURE 1. TRANSFER CHARACTERISTICSFIGURE 2. SATURATION CHARACTERISTICS
50
40
30
VGE = 4.5V
-40oC
40
30
TC= +175oC
VGE = 5.0V
VGE = 4.5V
6.0V
5.5V
5.0V
4.5V
4.0V
3.5V
3.0V
2.5V
= +25oC
C
+25oC
+175oC
20
10
, COLLECTOR EMITTER CURRENT (A)
CE
I
0
01234
V
, SATURATION VOLTAGE (V)
CE(SAT)
VGE = 4.0V
FIGURE 3. COLLECTOR-EMITTER CURRENT AS A FUNCTION
OF SATURATION VOLTAGE
1.4
ICE= 10A
VGE= 4.0V
1.3
1.2
, SATURATION VOLTAGE (V)
CE(SAT)
V
1.1
-25
+25
TJ, JUNCTION TEMPERATURE (oC)
+75
VGE= 4.5V
VGE= 5.0V
+125
+175
FIGURE 5. SATURATION VOLTAGE AS A FUNCTION OF
JUNCTION TEMPERATURE
20
10
, COLLECTOR EMITTER CURRENT (A)
CE
I
0
0
1
V
CE(SAT)
2
, SATURATION VOLTAGE (V)
3
4
5
FIGURE 4. COLLECTOR-EMITTER CURRENT AS A FUNCTION
OF SATURATION VOLTAGE
2.2
2.1
2.0
1.9
1.8
1.7
, SATURATION VOLTAGE (V)
1.6
CE(SAT)
V
1.5
ICE= 20A
VGE= 4.0V
VGE= 4.5V
VGE= 4.5V
VGE= 4.5V
VGE= 5.0V
-25+25+75+125
TJ, JUNCTION TEMPERATURE (oC)
+175
FIGURE 6. SATURATION VOLTAGE AS A FUNCTION OF
JUNCTION TEMPERATURE
3-68
Page 4
HGTP20N35G3VL, HGT1S20N35G3VL, HGT1S20N35G3VLS
Typical Performance Curves (Continued)
25
VGE= 5.0V
20
PACKAGE LIMITED
15
10
5
, COLLECTOR-EMITTER CURRENT (A)
CE
I
0
+25
+50
+75
T
, CASE TEMPERATURE (oC)
C
+100
+125+150
+175
FIGURE 7. COLLECTOR-EMITTER CURRENT AS A FUNCTION
OF CASE TEMPERATURE
5
10
4
10
3
10
2
10
V
= 20V
ECS
1.2
ICE= 1mA
1.1
1.0
0.9
0.8
0.7
0.6
, NORMAILZED THRESHOLD VOLTAGE
TH
V
0.5
-25+75
+25
, JUNCTION TEMPERATURE (oC)
T
J
+125+175
FIGURE 8. NORMALIZED THRESHOLD VOLTAGE AS A
FUNCTION OF JUNCTION TEMPERATURE
18
VCL= 300V, RGE= 25Ω, VGE= 5V, L= 550H
16
ICE= 6A, RL= 50Ω
14
1
10
LEAKAGE CURRENT ( A)
0
10
-1
10
+25
+50
V
= 250V
CES
+75
, JUNCTION TEMPERATURE (oC)
T
J
+100
+125
+150
FIGURE 9. LEAKAGE CURRENT AS A FUNCTION OF
JUNCTION TEMPERATURE
45
40
35
+25oC
30
25
20
15
+175oC
10
, COLLECTOR-EMITTER CURRENT (A)
CE
I
5
0
2
4
6
INDUCTANCE (mH)
VGE= 5V
8
+175
10
, TURN OFF TIME (s)
(OFF)I
t
12
ICE=15A, RL= 20Ω
ICE=10A, RL= 30Ω
10
+25
+50
+75
T
, JUNCTION TEMPERATURE (oC)
J
+100
+125
FIGURE 10. TURN-OFF TIME AS A FUNCTION OF
JUNCTION TEMPERATURE
1200
1000
+25oC
800
600
, ENERGY (mJ)
AS
E
400
200
0
2
+175oC
4
6
INDUCTANCE (mH)
+150
VGE= 5V
8
+175
10
FIGURE 11. SELF CLAMPED INDUCTIVE SWITCHING
CURRENT AS A FUNCTION OF INDUCTANCE
FIGURE 12. SELF CLAMPED INDUCTIVELY SWITCHING
ENERGY AS A FUNCTION OF INDUCTANCE
3-69
Page 5
HGTP20N35G3VL, HGT1S20N35G3VL, HGT1S20N35G3VLS
Typical Performance Curves (Continued)
1600
FREQUENCY = 1MHz
1400
1200
1000
C
IES
800
600
C, CAPACITANCE (pF)
400
C
OES
200
C
RES
0
5
1015
20
25
VCE, COLLECTOR-TO-EMITTER VOLTAGE (V)
FIGURE 13. CAPACITANCE AS A FUNCTION OF COLLECTOR-
EMITTER VOLTAGE
0
10
0.5
t
0.2
0.1
-1
10
0.05
0.02
0.01
-2
10
, NORMALIZED THERMAL RESPONSE
θJC
Z
SINGLE PULSE
-5
10
DUTY FACTOR, D = t1 / t
PEAK TJ = (PDX Z
-3
10
10
1
P
D
t
2
2
X R
θJC
) + T
C
1
10
θJC
-1
t1, RECTANGULAR PULSE DURATION (s)
FIGURE 15. NORMALIZED TRANSIENT THERMAL
IMPEDANCE, JUNCTION TO CASE
12
IG REF = 1.022mA, RL= 1.2Ω, TC= +25oC
10
VCE= 12V
8
6
VCE= 8V
VCE= 4V
4
2
, COLLECTOR-EMITTER VOLTAGE (V)
CE
V
0
0
10
Q
G
20
, GATE CHARGE (nC)
30
40
FIGURE 14. GATE CHARGE WAVEFORMS
350
345
TC = +25oC AND +175oC
340
, COLLECTOR-EMITTER
BKDN VOLTAGE (V)
CER
BV
335
0200040006000800010000
, GATE-TO-EMITTER RESISTANCE (V)
R
GE
I
CER
= 10mA
FIGURE 16. BREAKDOWN VOLTAGE AS A FUNCTION OF
GATE - EMITTER RESISTANCE
6
5
4
3
2
1
0
, GATE-EMITTER VOLTAGE (V)
GE
V
Test Circuits
R
= 25Ω
GEN
5V
FIGURE 17. USE TEST CIRCUITFIGURE 18. INDUCTIVE SWITCHING TEST CIRCUIT
R
L
2.3mH
V
DD
C
R
G
DUT
G
E
1/R
= 1/R
G
R
10V
GEN
GEN
+ 1/R
= 50Ω
GE
G
= 50Ω
R
GE
C
DUT
L = 550µH
+
-
V
CC
300V
E
3-70
Page 6
HGTP20N35G3VL, HGT1S20N35G3VL, HGT1S20N35G3VLS
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
Intersil semiconductor products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see web site www.intersil.com
Sales Office Headquarters
NORTH AMERICA
Intersil Corporation
P. O. Box 883, Mail Stop 53-204
Melbourne, FL 32902
TEL: (321) 724-7000
FAX: (321) 724-7240
EUROPE
Intersil SA
Mercure Center
100, Rue de la Fusee
1130 Brussels, Belgium
TEL: (32) 2.724.2111
FAX: (32) 2.724.22.05
3-71
ASIA
Intersil (Taiwan) Ltd.
7F-6, No. 101 Fu Hsing North Road
Taipei, Taiwan
Republic of China
TEL: (886) 2 2716 9310
FAX: (886) 2 2715 3029
Spec Number
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