Datasheet HD74CDC2509B Datasheet (HIT)

Page 1
HD74CDC2509B
3.3-V Phase-lock Loop Clock Driver
ADE-205-218F (Z)
7th. Edition
October 1999
Description
The HD74CDC2509B is a high-performance, low-skew, low-jitter, phase-lock loop clock driver. It uses a phase-lock loop (PLL) to precisely align, in both frequency and phase, the feedback (FBOUT) output to the clock (CLK) input signal. It is specifically designed for use with synchronous DRAMs. The HD74CDC2509B operates at 3.3 V VCC and is designed to drive up to five clock loads per output.
One bank of five outputs and one bank of four outputs provide nine low-skew, low-jitter copies of the input clock. Output signal duty cycles are adjusted to 50 percent independent of the duty cycle at the input clock. Each bank of outputs can be enabled or disabled separately via the control (1G and 2G) inputs. When the G inputs are high, the outputs switch in phase and frequency with CLK; when the G inputs are low, the outputs are disabled to the logic-low state.
Unlike many products containing PLLs, the HD74CDC2509B does not require external RC networks. The loop filter for the PLL is included on-chip, minimizing component count, board space, and cost.
Because it is based on PLL circuitry, HD74CDC2509B requires a stabilization time to achieve phase lock of the feedback signal to the reference signal. This stabilization time is required, following power up and application of a fixed-frequency, fixed-phase signal at CLK, as well as following any changes to the PLL reference or feedback signals. The PLL can be bypassed for test purposes by strapping AVCC to ground.
Features
• Meets “PC SDRAM registered DIMM design support document, Rev. 1.2”
• Phase-lock loop clock distribution for synchronous DRAM applications
• External feedback (FBIN) pin is used to synchronize the outputs to the clock input
• No external RC network required
• Support spread spectrum clock (SSC) synthesizers
Note: Only by a change of a suffix (A to B) for standardization, there isn’t any change of the product.
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HD74CDC2509B
Function Table
Inputs Outputs 1G 2G CLK 1Y (0:4) 2Y (0:3) FBOUT
XXLLLL LLHLLH LHHL HH HLHHL H HHHHHH
H : High level L : Low level X : Immaterial
Pin Arrangement
AGND
V
CC
1Y0 1Y1
1Y2 GND GND
1Y3
1Y4
V
CC
1G
FBOUT
10 11
12
1 2 3 4 5
6 7
8
9
(Top view)
24 23 22 21 20 19 18 17 16 15 14 13
CLK AV
CC
V
CC
2Y0 2Y1 GND GND 2Y2 2Y3 V
CC
2G FBIN
2
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HD74CDC2509B
Absolute Maximum Ratings
Item Symbol Ratings Unit Conditions
Supply voltage V Input voltage Output voltage
*1
*1, 2
Input clamp current I Output clamp current I Continuous output current I Supply current ICC or I Maximum power dissipation
at Ta = 55°C (in still air)
*3
Storage temperature T
CC
V
I
V
O
IK
OK
O
GND
P
T
stg
Notes: Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage
to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute maximum rated conditions for extended periods may affect device reliability.
1. The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings are observed.
2. This value is limited to 4.6 V maximum.
3. The maximum package power dissipation is calculated using a junction temperature of 150°C and a board trace length of 750 mils.
–0.5 to 4.6 V –0.5 to 6.5 V –0.5 to VCC +0.5 V –50 mA VI < 0
±50 mA VO < 0 or VO > V ±50 mA VO = 0 to V
CC
±100 mA
0.7 W
–65 to +150 °C
CC
Recommended Operating Conditions
Item Symbol Min Typ Max Unit Conditions
Supply voltage V Input voltage V
Output current I
Operating temperature T
CC
IH
V
IL
V
I
OH
I
OL
a
Note: Unused inputs must be held high or low to prevent them from floating.
3.0 — 3.6 V
2.0 — — V — — 0.8 0—V
CC
— — –12 mA ——12 0—85°C
3
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HD74CDC2509B
Logic Diagram
11
1G
14
2G
24
CLK
CC
13
23
FBIN
AV
PLL
3
4
5
8
9
21
20
17
16
12
1Y0 1Y1
1Y2
1Y3
1Y4
2Y0 2Y1
2Y2
2Y3
FBOUT
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HD74CDC2509B
CC
CC
Pin Function
Pin name No. Type Description
CLK 24 I Clock input. CLK provides the clock signal to be distributed by the
HD74CDC2509B clock driver. CLK is used to provide the reference signal to the integrated PLL that generates the clock output signals. CLK must have a fixed frequency and fixed phase for the PLL to obtain phase lock. Once the circuit is powered up and a valid CLK signal is applied, a stabilization time is required for the PLL to phase lock the feedback signal to its reference signal.
FBIN 13 I Feedback input. FBIN provides the feedback signal to the internal
PLL. FBIN must be hard-wired to FBOUT to complete the PLL. The integrated PLL synchronizes CLK and FBIN so that there is nominally zero phase error between CLK and FBIN.
1G 11 I Output bank enable. 1G is the output enable for outputs 1Y(0:4).
When 1G is low, outputs 1Y(0:4)are disabled to a logic-low state. When 1G is high, all outputs 1Y(0:4) are enabled and switch at the same frequency as CLK.
2G 14 I Output bank enable. 2G is the output enable for outputs 2Y(0:3).
When 2G is low, outputs 2Y(0:3)are disabled to a logic low state. When 2G is high, all outputs 2Y(0:3) are enabled and switch at the same frequency as CLK.
FBOUT 12 O Feedback output. FBOUT is dedicated for external feedback. It
switches at the same frequency as CLK. When externally wired to FBIN, FBOUT completes the feedback loop of the PLL.
1Y(0:4) 3, 4, 5, 8, 9 O Clock outputs. These outputs provide low-skew copies of CLK.
Output bank 1Y(0:4) is enabled via the 1G input. These outputs can be disabled to a logic low state by deasserting the 1G control input.
2Y(0:3) 16, 17, 20,21O Clock outputs. These outputs provide low-skew copies of CLK.
Output bank 2Y(0:3) is enabled via the 2G input. These outputs can be disabled to a logic low state by deasserting the 2G control input.
AV
CC
AGND 1 Ground Analog ground. AGND provides the ground reference for the
V
CC
GND 6, 7, 18,19 Ground Ground
23 Power Analog power supply. AVCC provides the power reference for the
analog circuitry. In addition, AV for test purposes. When AV
can be used to bypass the PLL
is strapped to ground, PLL is
bypassed and CLK is buffered directly to the device outputs.
analog circuitry.
2, 10, 15, 22 Power Power supply
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HD74CDC2509B
CC
Electrical Characteristics
Item Symbol Min Typ
Input clamp voltage V Output voltage V
— — –1.2 V VCC = 3 V, II = –18 mA
IK
VCC–0.2 — — V VCC = Min to Max, IOH = –100 µA
OH
*1
Max Unit Test Conditions
2.1 — — VCC = 3 V, IOH = –12 mA
2.4 — — VCC = 3 V, IOH = –6 mA
V
— — 0.2 VCC = Min to Max, IOL = 100 µA
OL
— — 0.8 VCC = 3 V, IOL = 12 mA
— — 0.55 VCC = 3 V, IOL = 6 mA Input current I Quiescent supply
current
Input capacitance C Output capacitance C
I
∆I
IN
CC
——±5 µAVCC = 3.6 V, VIN = VCC or GND
——10µAAVCC = GND, VCC = 3.6 V,
V
= VCC or GND, IO = 0
I
— — 500 µAAVCC = GND, VCC = 3.3 to 3.6 V
CC
One input at V Other inputs at V
—4—pFV
IN
—6—pFV
O
= 3.3 V, VI = VCC or GND
CC
= 3.3 V, VO = VCC or GND
CC
–0.6 V,
or GND
CC
Note: 1. For conditions shown as Min or Max, use the appropriate value specified under recommended
operating conditions.
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HD74CDC2509B
Switching Characteristics (CL = 30 pF, Ta = 0 to 85°C)
Item Symbol VCC = 3.3 V±0.3 V Unit From (Input) To (Output)
Min Typ Max
Phase error time t
Between output pins skew *1t
pe
sk (O)
–150 — 150 ps 66 MHz <
CLKIN↑ ≤ 100 MHz
— — 200 ps Any Y or
FBOUT
FBIN↑
Any Y or FBOUT
Cycle to cycle jitter –100 — 100 ps F (clkin =
100 MHz)
Duty cycle 45 — 55 % F (clkin =
66 to 100 MHz)
Output rise / fall time t
TLH
5.0 — 1.0 volts/ns Any Y or
Any Y or FBOUT
Any Y or FBOUT
FBOUT
t
THL
5.0 — 1.0 Any Y or FBOUT
Analog power supply
Vapsr
*2
100 — — mV
P–P
AV
CC
rejection (DC to 10 MHz)
Notes: The specifications for parameters in this table are applicable only after any appropriate
stabilization time has elapsed.
1. The t
specification is only valid for equal loading of all outputs.
sk(O)
2. This parameter is characterized but not tested.
Timing requirements
Item Symbol Min Max Unit Test Conditions
Input clock frequency f
clock
Input clock duty cycle 40 60 % Stabilization time
*1
Note: 1. Time required for the integrated PLL circuit to obtain phase lock of its feedback signal to its
reference signal. In order for phase lock to be obtained, a fixed-frequency, fixed-phase reference signal must be present at CLK. Until phase lock is obtained, the specifications for propagation delay and skew parameters given in the switching characteristics table are not applicable.
50 125 MHz
— 1 ms After power up
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HD74CDC2509B
Test Circuit
From output
under test
*1
C = 30 pF
L
Note: 1. CL includes probe and jig capacitance.
Waveforms – 1
Input
Output (=FBOUT)
50% V
50% V
CC
0.4 V
CC
50% V
2 V 2 V
t
TLH
CC
500 Ω
t
THL
0.4 V
3 V
0 V
V
V
OH
OL
Notes: 1. All input pulses are supplied by generators having the following characteristics: PRR ≤ 100
MHz, ZO = 50 Ω, tr = 1.2 ns, tf = 1.2 ns.
2. The outputs are measured one at a time with one transition per measurement.
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Waveforms – 2
CLKIN
FBIN
FBOUT
Any Y
t
phase error
t
sk (o)
HD74CDC2509B
Any Y
Any Y
t
sk (o)
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HD74CDC2509B
Package Dimensions
8.10 Max
24 13
112
+0.08
0.22
–0.07
0.20 ± 0.06
7.80
0.13
0.65 Max
Unit : mm
4.4
0.65
1.0
M
6.4 ± 0.2
0.10
1.10 Max
Dimension including the plating thickness
Base material dimension
0.17 ± 0.05
0.15 ± 0.04
+0.03
–0.04
0.07
0° – 8°
Hitachi Code JEDEC EIAJ Weight
(reference value)
0.5 ± 0.1
TTP-24DB — —
0.08 g
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HD74CDC2509B
Cautions
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent, copyright, trademark, or other intellectual property rights for information contained in this document. Hitachi bears no responsibility for problems that may arise with third party’s rights, including intellectual property rights, in connection with use of the information contained in this document.
2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact Hitachi’s sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as fail­safes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Hitachi.
7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor products.
Hitachi, Ltd.
Semiconductor & Integrated Circuits. Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan Tel: Tokyo (03) 3270-2111 Fax: (03) 3270-5109
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Copyright ' Hitachi, Ltd., 1999. All rights reserved. Printed in Japan.
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