DISSIPATION UNDER A DIGITAL CONTROL
INPUT AND SUPPLY CONDITIONS : 0.2
(Typ.) at V
■ BINARY ADDR ESS D ECODING ON CHIP
■ QUIESCENT CURRENT SPECIFIED UP TO
- VSS = 10V
DD
µW
20V
■ STANDARDIZED SYMMETRICAL OUTPUT
CHARACTERISTICS
■ 5V, 10V AND 15V PARAMETRIC RATINGS
■ INPUT LEAKAGE CURRENT
I
= 100nA (MAX) AT VDD = 18V TA = 25°C
I
■ 100% TESTED FOR QUIESCENT CURRENT
■ MEETS ALL REQUIREMENTS OF JEDEC
JESD13B "STANDA RD SPECIFICATIONS
FOR DESCRIPTI ON OF B SERI ES CMOS
DEVICES"
SOP
ORDER CODES
PACKAGETUBET & R
SOPHCF4097BM1HCF4097M013TR
HCF4097B, a analog multiplexer/demultiplexer
CMOS, is a digitally controlled analog switches
device having low ON impedance, low OFF
leakage current and int ernal a ddress decodin g. in
addition, the ON resistance is rela tively constant
over the full input-signal range.
HCF4097B is a differential 8-channel multiplexer
having three binary control inputs A, B, C, and an
inhibit input. The inputs permit selection of one of
eight pairs of s witches. A logic "1" present at the
inhibit input turns all channels off.
DESCRIPTION
HCF4097B is monolithic integrated circuits
fabricated in Metal Oxide Semiconductor
technology available in SOP package.
PIN CONNECTION
1/10September 2002
Page 2
HCF4097B
INPUT EQUIVALENT CIRCUIT PIN DESCRIPTION
PIN NoSYMBOLNAME AND FUNCTION
10, 11, 14A, B, CBinary Control Inputs
1
17
13INHIBITInhibit Input
9, 8, 7, 6, 5,
4, 3, 2
COMMON X
OUT/IN
COMMON Y
OUT/IN
0 to 7 CHAN-
NEL IN/OUT X8 X channel In/Out
Common X Out/In
Common Y Out/In
FUNCTIONAL DIAGRAM
23, 22, 21,
20, 19, 18,
16, 15
12
24
0 to 7 CHAN-
NEL IN/OUT Y8 Y channel In/Out
V
SS
V
DD
Negative Supply Voltage
Positive Supply Voltage
TRUTH TABLE
ABCINHSELECTED CHANNEL
XXXHNONE
LLLL0X 0Y
HLLL1X 1Y
LHLL2X 2Y
HHLL3X 3Y
LLHL4X 4Y
HLHL5X 5Y
LHHL6X 6Y
HHHL7X 7Y
2/10
Page 3
LOGIC DIAGRAM
HCF4097B
3/10
Page 4
HCF4097B
ABSOLUTE MAXIMUM RATINGS
SymbolParameterValueUnit
V
V
P
T
T
Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is
not implied.
All voltage values are referred to V
RECOMMENDED OPERATING CONDITIONS
SymbolParameterValueUnit
V
V
T
Supply Voltage
DD
DC Input Voltage-0.5 to VDD + 0.5
I
I
DC Input Current
I
Power Dissipation per Package200mW
D
-0.5 to +22V
10mA
±
Power Dissipation per Output Transistor100mW
Operating Temperature
op
Storage Temperature
stg
pin voltage.
SS
Supply Voltage
DD
Input Voltage0 to V
I
Operating Temperature
op
-55 to +125°C
-65 to +150°C
3 to 20V
DD
-55 to 125°C
V
V
4/10
Page 5
STATIC ELECTRICAL CHARACTERISTICS
= 25°C,Typical temperature coefficient for all VDD value is 0.3 %/°C)
(T
amb
Test ConditionValue
= 25°C
SymbolParameter
I
Quiescent Supply
L
Current
V
(V)
V
V
IS
EE
(V)
(V)
SS
V
DD
(V)
50.045150150
100.0410300300
T
A
Min.Typ. Max. Min. Max.Min. Max.
150.0420600600
200.0810030003000
SWITCH
On Resistance
R
ON
Resistance
∆
ON
(between any 2 of
4 switches)
∆
RON
0 < VI
<
V
DD
00
00
5470105012001200
10180400500520
15125240300300
510
1010
155
OFF (•) Channel Leakage
Current Any
0018
0.110010001000
±
Channel Off
Channel Leakage
Current All
Channel Off
0018
0.110010001000
±
(Common Out/In)
CCapacitance Input
5
-55
Feedthrough0.2
CONTROL
Input Low Voltage
V
IL
= VDD
Input High Voltage53.53.53.5
V
IH
thru
1KΩ
V
= VSS
EE
R
= 1KΩ to
L
V
SS
IIS < 2µA (on
51.51.51.5
15444
all OFF
channels)
Input Leakage
I
I
Current
C
Input CapacitanceAny Address or Inhibit
I
The Noi se Margin fo r both "1" and "0" level is: 1V min. with VDD=5V, 2V min. with VDD=10V, 2.5V min. with VDD=15V
V
= 0/18V
I
Input
15111111
18
-3
10
±
57.5pF
• Determ i ned by minimum feasibl e leakage measurement for auto m ating test i ng
-40 to 85°C -55 to 125°C
0.1
±
1
±
HCF4097B
Unit
A
µ
Ω
Ω
A
µ
pFOutput capacitance35
V10333
V10777
1
±
A
µ
5/10
Page 6
HCF4097B
DYNAMIC ELECTRICAL CHARACTERISTICS (T
SymbolParameter
V
(V)
R
C
(K
Ω)
SWITCH
Propagation Delay
t
pd
Time (Signal Input
to Output)
= V
2000
DD
Frequency
Response Channel
"ON" (Sine Wave
Input) at
V
20 Log
–––– = -3dB
V
O
I
= V
15 (
DD
Feedthrough (All
channels OFF) at
V
20 Log
V
Frequency Signal
Crosstalk at
V
20 Log
V
Sine Wave
t
W
Distortion (f
1KHz sine wave)
O
––– =-40dB
I
O(A)
––– =-40dB
I(B)
=
IS
= V
V
C(A)
=V
V
C(B)
=V
155 (•)150.12
15 (
SS
DD
15 (
SS
5
101
CONTROL(Add ress or Inhibit)
t
PLH, tPHL
Propagation Delay
Time:Address or
Inhibit to Signal
10
OUT (Channel
Turning ON)
t
PLH, tPHL
Propagation Delay
Time:Address or
Inhibit to Signal
0.30
OUT (Channel
Turning OFF)
Address or Inhibit to
Signal Crosstalk
(*) Typical temperature coefficient for all VDD value is 0.3 %/°C
(**) : Both Ends of Channel
(•) : Peak to Peak voltage s ym m etrical about (V
10**01075
- VSS) / 2
DD
f
L
I
(KHz)
= 25°C, CL = 50pF, RL = 200KΩ, tr = tf = 20 ns)
amb
Test ConditionValue*Unit
VI
VSS
V
(V)
(V)
DD
(V)
Typ.Max.
53060
ns101530
151120
at Common
V
)0 10
•
)0 10
•
O
Out/In
V
at Any Chan-
O
nel
at Common
V
O
Out/In
V
at Any Chan-
O
nel
20
ns
60
12
MHz
8
Between Any two
(A and B)
1MHz
Channels
Between Sec-
)0 10
•
tions (A and B)
Measured on
10
Common
Between Sec-
tions (A and B)
Measured on any
18
Channel
2 (•)
50.3
0
%103 (•)10 0.2
5325650
10135270
ns
1595190
5220440
1090180
ns
1565130
mV
peak
6/10
Page 7
HCF4097B
APPLICATION INFORMATION
In applications where separate power sources are
used to drive V
and the signal inputs, the V
DD
DD
current capability should exceed VDD/RL (RL =
effective external load). This provision avoids
permanent current flow or clamp action on the
V
supply when power is applied or removed
DD
from the HCF4097B.
When switching from one address to another,
some of the ON periods of the channels of the
multipl exers will overlap mo mentarily , which ma y
be objectionable in certain applications. Also,
when a channel is turned ON or OFF by an
address input, there is a momentary conductive
path from the channel to V
, which will dump
SS
some charge from any capacitor connec ted to the
input or output of the channel. The inhibit input
turning on a channel will similarly dump some
charge to V
SS
.
The amount of charge dumped is mostly a
function of the signal level above V
V
- VSS = 10V, a 100 pF capacitor connected to
DD
. Typically, at
SS
TEST CIRCUIT
the input or output of the channel will lose 3-4% of
its voltage at the moment the channel turns ON or
OFF. This loss of voltage is essentially
independent of the address or inhibit signal
transition time, if the transition tim e is less th an 12 ms. When the inhibit signal turns a channel off,
there is no change dumping of V
. Rather, there
SS
is a slight rise in the channel voltage level (65 m V
typ.) due to the capacitance coupling from inhibit
input to channel input or output. Address input
also couple some vol tage steps ont o the c hannel
signal levels.
In certain applications, the external load-resistor
current may include both V
components. To avoid drawin g V
and signal line
DD
current when
DD
switch current flows into the transmission gate
inputs, the voltage drop across the bidirectional
switch must not exceed 0.8V (calculated from R
ON
values shown in ELECTRICAL
CHARACTERISTICS CHART). No V
will flow through R
if the switch current flows into
L
current
DD
terminal 1 on the HCF4097B.
CL = 50pF or equivalent (in cludes jig and probe capac i tance)
= 200K
R
R
Ω
L
= Z
of pulse generator (typically 50Ω)
T
OUT
7/10
Page 8
HCF4097B
WAVEFORM : PROPAGATION DELAY TIMES (f=1MHz; 50% duty cycle)
WAVEFORM : PROPAGATION DELAY TIMES (f=1MHz; 50% duty cycle)
8/10
Page 9
SO-24 MECHANICAL DATA
HCF4097B
DIM.
MIN.TYPMAX.MIN.TYP.MAX.
A2.650.104
a10.10.20.0040.008
a22.450.096
b0.350.490.0140.019
b10.230.320.0090.012
C0.50.020
c145˚ (typ.)
D15.2015.600.5980. 614
E10.0010.650.3930.419
e1.270.050
e313.970.550
F7.407.600.2910.300
L0.501.270.0200.050
S˚ (max.)
mm.inch
8
A
a2
b
e
e3
D
2413
F
112
L
a1
c1
b1
C
s
E
PO13T
9/10
Page 10
HCF4097B
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibi lity f or the
consequences of use of such informatio n nor for any infringement of paten ts or o ther rig hts of t hird part ies which ma y result from
its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications
mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information
previousl y suppl ied. STM icroel ectronics produc ts are not auth orized for use as c ritica l compone nts in l ife s upport dev ices or
systems without express written approval of STMicroelectronics.
Australia - Brazil - Canada - China - Finland - France - Germany - Hong Kong - India - Israel - Italy - Japan - Malaysia - Malta - Morocco