JESD13B " STANDARD SPECIFICATIONS
FOR DESCRIPTI ON OF B SERI ES CMOS
DEVICES"
DESCRIPTION
The HCF4033B is a m onolithic integrated circuit
fabricated in Metal Oxide Semiconductor
technology available in DIP and SOP packages.
The HCF4033B consists of a 5-stages Johnson
decade counter and an output decoder which
converts the Johnson code to a 7 segment
decoded output for driving one stage in a
numerical display. This device is particularly
advantageous in display applications where low
power dissipation and/or low packag e count are
DIPSOP
ORDER CODES
PACKAGETUBET & R
DIPHCF4033BEY
SOPHCF4033BM1HCF4033M013TR
important. This device has CLOCK, RESET,
CLOCK INHIBIT, RIPPLE BLANKING, LAMP
TEST input, CARRY OUT, RIPPLE BLANKING
and 7 DECODED outputs (a to g).
A high RESET signal clears the decade counter to
its zero count. The counter is advanced one count
at the positive clock signal transition if the CLOCK
INHIBIT signal is low. Counter advancem ent via
the clock line is inhibited when the CLOCK
INHIBIT signal is high. Antilock gating is provided
on the JOHN SON counter, thus assurin g proper
counting sequence. The CARRY-OUT (C
OUT
signal completes one cycle every ten CLOCK
INPUT cycles and is used to clock the succeeding
decade directly in a multi-decade counting chain.
)
PIN CONNECTION
1/11September 2001
Page 2
HCF4033B
The seven decoded outputs (a, b, c, d, e, f, g)
illuminate the proper segments in a seven
segment display device us ed for representing the
decimal numbers 0 to 9. The 7-segment outputs
go high on s election. This device has provisions
for automating blanking of the non-significant
zeros in a multi digit decimal number which results
in a easily readable display consistent with normal
writing practice. For example, the number
0050.07000 in an eight digit display would be
displayed as 50.07. Zero suppression on the
integer side is obtained by connecting the RBI
terminal of the HCF4033B associated with the
most significant digit in th e display to a low level
voltage and connecting the RBO terminal of that
stage to the RBI terminal of the HCF4033B in the
next lower significant position in the displ ay. This
procedure is continued for each succeeding
HCF4033B on the integer side o f the display. On
the fraction side of the display the RBI of the
HCF4033B associated with the least significant bit
is connected to a low level voltage and the RBO of
that HCF4033B is connected to the RBI terminal
of the HCF4033B i n the next more sign ificant bit
position. Again, this procedure is continued for all
HCF4033B’s on the fraction side of the display. In
a purely fractional number the zero immediately
preceding the decimal point can be displayed by
connecting the RBI of that stage to a high level
voltage (instead of to the RBO of the next more
significant stage). For example : optional zero →
0.7346. Likewise, the zero i n a number such as
763.0 can be displ ayed by connec ting the RBI of
the HCF4033B associated with it to a high leve l
voltage. Ripple blanking of non-significant zeros
provides an appreciable savings in display power.
The HCF4033B has a LAMP TES T input which,
when connected to a hi gh level vo ltage, ov errides
normal decoder operation and enables a ch eck to
be made on possible display malfunctions by
putting the seven outputs in the high state.
INPUT EQUIVALENT CIRCUIT PIN DESCRIPTION
PIN NoSYMBOLNAME AND FUNCTION
1
10, 12, 13, 9,
11, 6, 7
2
15RESETReset Input
3
CLOCK
a to g
CLOCK
INHIBIT
RIPPLE
BLANKING INRipple Blanking Input
Clock Input
7 - Segments Decoded
Outputs
Clock Inhibit Input
2/11
5CARRY OUT Carry Out Output
4
14LAMP TEST Lamp Test Input
8
16
RIPPLE
BLANKING
OUT
V
SS
V
DD
Ripple Blanking Output
Negative Supply Voltage
Positive Supply Voltage
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FUNCTIONAL DIAGRAM
LOGIC DIAGRAM
HCF4033B
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Page 4
HCF4033B
TIMING CHART
ABSOLUTE MAXIMUM RATINGS
SymbolParameterValueUnit
V
V
P
Supply Voltage
DD
DC Input Voltage-0.5 to VDD + 0.5
I
I
DC Input Current
I
Power Dissipation per Package200mW
D
-0.5 to +22V
± 10mA
V
Power Dissipation per Output Transistor100mW
T
T
Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is
not implied.
All voltage values are referred to V
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mentioned in this publication ar e subject to change without notice. This publication supersedes and replaces all information
previously supplied. S TMicroelectronics products are not authorized for use as critica l components in life suppo rt devices or
systems without express written approval of STMicroelectronics.
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