Drain to source voltageV
Gate to source voltageV
Drain currentI
Drain peak currentI
Body-drain diode reverse drain currentI
Avalanche currentHAT2033RI
DSS
GSS
D
D(pulse)
DR
Note4
AP
Note1
HAT2033RJ7A
Avalanche energyHAT2033RE
Note4
AR
HAT2033RJ4.2mJ
Channel dissipationPch
Note2
Channel temperatureTch150°C
Storage temperatureTstg– 55 to + 150°C
Note:1. PW ≤ 10µs, duty cycle ≤ 1 %
2. When using the glass epoxy board (FR4 40 x 40 x 1.6 mm), PW≤ 10s
3. Value at Tch=25°C, Rg≥50Ω
60V
± 20V
7A
56A
7A
——
——
2.5W
2
Page 3
HAT2033R/HAT2033RJ
Electrical Characteristics (Ta = 25°C)
ItemSymbol MinTypMaxUnitTest Conditions
Drain to source breakdown voltageV
Gate to source breakdown voltageV
Gate to source leak currentI
Zero gate voltageHAT2033RI
drain currentHAT2033RJ I
Zero gate voltageHAT2033RI
drain currentHAT2033RJ I
Gate to source cutoff voltageV
Static drain to source on stateR
resistanceR
(BR)DSS
(BR)GSS
GSS
DSS
DSS
DSS
DSS
GS(off)
DS(on)
DS(on)
Forward transfer admittance|yfs|6.510—SID = 4 A, VDS = 10 V
Input capacitanceCiss—740—pFVDS = 10 V
Output capacitanceCoss—370—pFVGS = 0
Reverse transfer capacitanceCrss—130—pFf = 1MHz
Turn-on delay timet
Rise timet
Turn-off delay timet
Fall timet
Body–drain diode forward voltageV
Body–drain diode reverse
1.2—2.2VVDS = 10 V, I D = 1 mA
—0.030.038 ΩID = 4 A, VGS = 10 V
—0.040.053 ΩID = 4 A, VGS = 4 V
—13—nsVGS =10 V, ID = 4 A
—55—nsVDD ≅ 30 V
—140—ns
—95—ns
—0.821.07VIF = 7 A, VGS = 0
Note4
—45—nsIF = 7 A , VGS = 0
diF/ dt = 50 A/µs
Note4
Note4
Note4
3
Page 4
HAT2033R/HAT2033RJ
Main Characteristics
Power vs. Temperature Derating
4.0
Test Condition :
When using the glass epoxy board
(FR4 40x40x1.6 mm), PW < 10 s
3.0
2.0
1.0
Channel Dissipation Pch (W)
0
50100150200
Ambient Temperature Ta (°C)
Typical Output Characteristics
50
10 V
6 V
40
Pulse Test
4.5 V
Maximum Safe Operation Area
100
10 µs
30
10
D
DC Operation (PW < 10 s)
3
1
Operation in
0.3
Drain Current I (A)
this area is
limited by R
0.1
Ta = 25°C
0.03
1 shot Pulse
1 Drive Operation
0.01
0.1
DS(on)
0.3131030100
Drain to Source Voltage V (V)
Note 6 :
When using the glass epoxy board
(FR4 40x40x1.6 mm)
Typical Transfer Characteristics
20
V = 10 V
DS
Pulse Test
16
100 µs
1 ms
PW = 10 ms (1shot)
Note6
DS
D
30
20
Drain Current I (A)
10
0
Drain to Source Voltage V (V)
4
4.0 V
3.5 V
3.0 V
V = 2.5 V
GS
246810
DS
D
12
8
Drain Current I (A)
4
0
Tc = 75°C
12345
Gate to Source Voltage V (V)
25°C
–25°C
GS
Page 5
HAT2033R/HAT2033RJ
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
0.5
Pulse Test
0.4
DS(on)
V (V)
0.3
0.2
0.1
I = 5 A
D
2 A
Drain to Source Saturation Voltage
0
48
Gate to Source Voltage V (V)
12
1620
GS
Static Drain to Source on State Resistance
vs. Temperature
Ω
0.10
Pulse Test
0.08
DS(on)
R ( )
0.06
0.04
0.02
V = 4 V
GS
10 V
1, 2 A
1, 2, 5 A
0
Static Drain to Source on State Resistance
–4004080120160
Case Temperature Tc (°C)
1 A
5 A
Static Drain to Source on State Resistance
vs. Drain Current
0.5
Pulse Test
Ω
0.2
DS(on)
R ( )
0.1
V = 4 V
0.05
0.02
Drain to Source On State Resistance
0.01
0.11100.25
Drain Current I (A)
GS
10 V
20.5
D
Forward Transfer Admittance vs.
Drain Current
50
fs
20
Tc = –25 °C
10
5
75 °C
2
1
Forward Transfer Admittance |y | (S)
0.5
V = 10 V
Pulse Test
0.10.3131030100
Drain Current I (A)
D
5020
25 °C
DS
5
Page 6
HAT2033R/HAT2033RJ
Body–Drain Diode Reverse
1000
Recovery Time
di / dt = 50 A / µs
500
V = 0, Ta = 25 °C
GS
200
100
50
20
Reverse Recovery Time trr (ns)
10
0.10.3131030100
Reverse Drain Current I (A)
DR
Dynamic Input Characteristics
100
I = 7 A
D
80
DS
V = 50 V
60
DD
25 V
V
10 V
DS
V
40
20
Drain to Source Voltage V (V)
0
V = 50 V
DD
25 V
10 V
8 16243240
Gate Charge Qg (nc)
GS
Typical Capacitance vs.
Drain to Source Voltage
5000
2000
1000
500
200
100
Capacitance C (pF)
50
V = 0
20
GS
f = 1 MHz
10
01020304050
Drain to Source Voltage V (V)
Switching Characteristics
20
16
GS
1000
300
100
12
30
t
f
t
r
8
10
4
0
Switching Time t (ns)
3
Gate to Source Voltage V (V)
1
0.10.3131030100
Drain Current I (A)
Ciss
Coss
Crss
DS
t
d(off)
t
d(on)
V = 10 V, V = 3 0 V
GS
DD
PW = 5 µs, duty < 1 %
D
6
Page 7
HAT2033R/HAT2033RJ
Reverse Drain Current vs.
Souece to Drain Voltage
20
16
DR
10 V
12
8
5 V
V = 0, –5 V
4
Reverse Drain Current I (A)
0
0.40.81.21.62.0
Source to Drain Voltage V (V)
Avalanche Test Circuit
V
DS
Monitor
Rg
Vin
15 V
50Ω
GS
D. U. T
Pulse Test
SD
L
I
AP
Monitor
Maximun Avalanche Energy vs.
Channel Temperature Derating
5
I = 7 A
AP
AR
4
V = 25 V
DD
L = 100 µH
duty < 0.1 %
3
Rg > 50
Ω
2
1
Repetive Avalanche Energy E (mJ)
0
255075100125150
Channel Temperature Tch (°C)
Avalanche Waveform
V
1
E = • L • I •
AR
2
I
AP
V
DD
I
D
V
DD
0
AP
2
DSS
V – V
DSSDD
V
DS
V
(BR)DSS
7
Page 8
HAT2033R/HAT2033RJ
10
Normalized Transient Thermal Impedance vs. Pulse Width
s (t)
γ
D = 1
1
0.5
0.2
0.1
0.1
0.05
0.01
0.02
0.01
0.001
Normalized Transient Thermal Impedance
1shot pulse
0.0001
10 µ
100 µ1 m10 m100 m110
θ γ θ
ch – f(t) = s (t) • ch – f
θ
ch – f = 83.3 °C/W, Ta = 25 °C
When using the glass epoxy board
(FR4 40x40x1.6 mm)
P
DM
Pulse Width PW (S)
PW
D =
T
PW
T
100100010000
Switching Time Test CircuitSwitching Time Waveform
Vin Monitor
Vout
Monitor
D.U.T.
R
Vin
10 V
50Ω
L
V
DD
= 30 V
Vin
Vout
td(on)
10%
10%
90%
tr
90%
td(off)
90%
10%
t
f
8
Page 9
Package Dimensions
5.0 Max
HAT2033R/HAT2033RJ
Unit: mm
8
1
1.27
0.51 Max
5
4
4.0 Max
1.75 Max
0.25 Max
0.15
0.25
M
6.2 Max
0.25 Max
0 – 8°
1.27 Max
Hitachi code
EIAJ
JEDEC
FP–8DA
—
MS-012AA
9
Page 10
Cautions
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent,
copyright, trademark, or other intellectual property rights for information contained in this document.
Hitachi bears no responsibility for problems that may arise with third party’s rights, including
intellectual property rights, in connection with use of the information contained in this document.
2. Products and product specifications may be subject to change without notice. Confirm that you have
received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However,
contact Hitachi’s sales office before using the product in an application that demands especially high
quality and reliability or where its failure or malfunction may directly threaten human life or cause risk
of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation,
traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly
for maximum rating, operating supply voltage range, heat radiation characteristics, installation
conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used
beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable
failure rates or failure modes in semiconductor devices and employ systemic measures such as failsafes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other
consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without
written approval from Hitachi.
7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor
products.
Hitachi, Ltd.
Semiconductor & Integrated Circuits.
Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan
Tel: Tokyo (03) 3270-2111 Fax: (03) 3270-5109
URLNorthAmerica : http:semiconductor.hitachi.com/
For further information write to:
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(America) Inc.
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Tel: <1> (408) 433-1990
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Japan: http://www.hitachi.co.jp/Sicd/indx.htm
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Taipei Branch Office
3F, Hung Kuo Building. No.167,
Tun-Hwa North Road, Taipei (105)
Tel: <886> (2) 2718-3666
Fax: <886> (2) 2718-8180
Copyright ' Hitachi, Ltd., 1999. All rights reserved. Printed in Japan.
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7/F., North Tower, World Finance Centre,
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Kowloon, Hong Kong
Tel: <852> (2) 735 9218
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