Datasheet HAT2028RJ, HAT2028R-D Datasheet (HIT)

Page 1
HAT2028R/HAT2028RJ
Silicon N Channel Power MOS FET
High Speed Power Switching
ADE-208-524C (Z)
4th. Edition
February 1999
Features
• Low on-resistance
• Capable of 4 V gate drive
• High density mounting
Outline
SOP–8
1
2
3
4
5
6
7
8
G
DSD
G
DSD
MOS1
MOS2
1
2
78
4
5
6
3
1, 3 Source 2, 4 Gate 5, 6, 7, 8 Drain
Page 2
HAT2028R/HAT2028RJ
2
Absolute Maximum Ratings (Ta = 25°C)
Item Symbol Ratings Unit
Drain to source voltage V
DSS
60 V
Gate to source voltage V
GSS
± 20 V
Drain current I
D
4A
Drain peak current I
D(pulse)
Note1
32 A
Body-drain diode reverse drain current I
DR
4A
Avalanche current HAT2028R I
AP
Note4
——
HAT2028RJ 4 A
Avalanche energy HAT2028R E
AR
Note4
——
HAT2028RJ 1.37 mJ
Channel dissipation Pch
Note2
2W
Channel dissipation Pch
Note3
3W Channel temperature Tch 150 °C Storage temperature Tstg – 55 to + 150 °C
Note: 1. PW ≤ 10µs, duty cycle ≤ 1 %
2. 1 Drive operation : When using the glass epoxy board (FR4 40 x 40 x 1.6 mm), PW≤ 10s
3. 2 Drive operation : When using the glass epoxy board (FR4 40 x 40 x 1.6 mm), PW≤ 10s
4. Value at Tch=25°C, Rg≥50Ω
Page 3
HAT2028R/HAT2028RJ
3
Electrical Characteristics (Ta = 25°C)
Item Symbol Min Typ Max Unit Test Conditions
Drain to source breakdownvoltage V
(BR)DSS
60——V ID = 10 mA, VGS = 0
Gate to source breakdownvoltage V
(BR)GSS
± 20 — — V IG = ± 100 µA, VDS = 0
Gate to source leak current I
GSS
——± 10 µAVGS = ± 16 V, VDS = 0
Zero gate voltage HAT2028R I
DSS
——1 µAVDS = 60 V, VGS = 0
drain current HAT2028RJ I
DSS
— — 0.1 µA
Zero gate voltage HAT2028R I
DSS
———µAVDS = 48 V, VGS = 0
drain current HAT2028RJ I
DSS
——10µA Ta = 125°C
Gate to source cutoff voltage V
GS(off)
1.3 — 2.3 V VDS = 10 V, I D = 1 mA
Static drain to source on state resistance R
DS(on)
— 0.08 0.1 Ω ID = 2 A, VGS = 10 V
Note5
R
DS(on)
— 0.12 0.16 Ω ID = 2 A, VGS = 4 V
Note5
Forward transfer admittance |yfs| 3.3 5 — S ID = 2 A, VDS = 10 V
Note5
Input capacitance Ciss — 280 — pF VDS = 10 V Output capacitance Coss — 150 — pF VGS = 0 Reverse transfer capacitance Crss — 55 — pF f = 1MHz Turn-on delay time t
d(on)
— 15 — ns VGS = 4 V, ID = 2 A
Rise time t
r
— 100 — ns VDD ≅ 30 V
Turn-off delay time t
d(off)
—35—ns
Fall time t
f
—45—ns
Body–drain diode forwardvoltage V
DF
— 0.88 1.15 V IF = 4 A, VGS = 0
Note5
Body–drain diode reverse recovery time t
rr
— 40 — ns IF = 4 A, VGS = 0
diF/ dt = 50 A/µs
Note: 5. Pulse test
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HAT2028R/HAT2028RJ
4
Main Characteristics
4.0
3.0
2.0
1.0
0
50 100 150 200
100
30 10
3 1
0.3
0.1
0.03
0.01
0.1
0.3 1 3 10 30 100
20
16
12
8
4
0
246810
10V
20
16
12
8
4
0
2468
10
10 µs
100 µs
1 ms
PW = 10 ms
8 V
Tc = 75°C
25°C
–25°C
V = 10 V Pulse Test
DS
Channel Dissipation Pch (W)
Ambient Temperature Ta (°C)
Power vs. Temperature Derating
Drain to Source Voltage V (V)
DS
Drain Current I (A)
D
Maximum Safe Operation Area
Drain to Source Voltage V (V)
DS
Drain Current I (A)
D
Typical Output Characteristics
Gate to Source Voltage V (V)
GS
Drain Current I (A)
D
Typical Transfer Characteristics
Note 6 : When using the glass epoxy board (FR4 40x40x1.6 mm)
2 Drive Operation
1 Drive Operation
Operation in this area is limited by R
DS(on)
Test Condition : When using the glass epoxy board (FR4 40x40x1.6 mm), PW < 10 s
Note6
DC Operation (PW < 10 s)
6 V
4.5 V
4 V
3.5 V
3 V
V = 2.5 V
GS
5 V
Pulse Test
Ta = 25°C 1 shot Pulse 1 Drive Operation
Page 5
HAT2028R/HAT2028RJ
5
0.5
0.4
0.3
0.2
0.1
0
0.5
0.2
0.05
0.1
0.02
1
0.01
0.2 0.5 1 2 5 10
0.25
0.20
0.15
0.10
0.05
–40 0 40 80 120 160
0
0.2 0.5
1
2 5 10 20
5
2
0.5
1
0.2
10
20
Gate to Source Voltage V (V)
GS
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
V (V)
DS(on)
Drain to Source Saturation Voltage
Drain Current I (A)
D
Drain to Source On State Resistance
R ( )
Ω
DS(on)
Static Drain to Source on State Resistance
vs. Drain Current
Case Temperature Tc (°C)
R ( )
DS(on)
Static Drain to Source on State Resistance
Ω
Static Drain to Source on State Resistance
vs. Temperature
Forward Transfer Admittance |y | (S)
fs
Forward Transfer Admittance vs.
Drain Current
Drain Current I (A)
D
Pulse Test
Pulse Test
I = 2 A
D
1 A
0.5 A
I = 0.5, 1, 2 A
D
V = 4 V
GS
10 V
246810
0.1
Pulse Test
V = 4 V
GS
10 V
0.5, 1, 2 A
25 °C
Tc = –25 °C
75 °C
DS
V = 10 V Pulse Test
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HAT2028R/HAT2028RJ
6
0.2 0.5 1 2 5 100.1
500
200
100
20
50
10
5
01020304050
1000
200
100
20 10
100
80
60
40
20
0
20
16
12
8
4
246810
0
di/dt = 50 A/µs V = 0, Ta = 25°C
GS
500
50
Ciss
Coss
Crss
V = 0 f = 1 MHz
GS
Reverse Drain Current I (A)
DR
Reverse Recovery Time trr (ns)
Body–Drain Diode Reverse
Recovery Time
Capacitance C (pF)
Drain to Source Voltage V (V)
DS
Typical Capacitance vs. Drain to Source Voltage
Gate Charge Qg (nc)
Drain to Source Voltage V (V)
DS
Gate to Source Voltage V (V)
GS
Dynamic Input Characteristics
V
GS
V
DS
I = 4 A
D
V = 50 V
25 V 10 V
DD
V = 10 V
25 V 50 V
DD
3
0.2 0.5 1 2 5 100.1
1000
300
100
10
30
1
Drain Current I (A)
D
Switching Time t (ns)
Switching Characteristics
t
f
r
t
d(off)
t
d(on)
t
V = 4 V, V = 30 V PW = 3 µs, duty < 1 %
GS
DD
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HAT2028R/HAT2028RJ
7
Vin Monitor
D.U.T.
Vin 4 V
R
L
V = 30 V
DD
tr
td(on)
Vin
90%
90%
10%
10%
Vout
td(off)
Vout Monitor
50Ω
90%
10%
t
f
Switching Time Test Circuit Switching Time Waveform
20
16
12
8
4
0
0.4 0.8 1.2 1.6 2.0
Source to Drain Voltage V (V)
SD
Reverse Drain Current I (A)
DR
Reverse Drain Current vs.
Souece to Drain Voltage
Pulse Test
0, –5 V
V = 5 V
GS
2.5
2.0
1.5
1.0
0.5
25 50 75 100 125 150
0
I = 4 A V = 25 V L = 100 µH duty < 0.1 % Rg > 50
AP
DD
Ω
Channel Temperature Tch (°C)
Repetive Avalanche Energy E (mJ)
AR
Maximun Avalanche Energy vs.
Channel Temperature Derating
D. U. T
Rg
I Monitor
AP
V Monitor
DS
V
DD
50Ω
Vin 15 V
0
I
D
V
DS
I
AP
V
(BR)DSS
L
V
DD
E = • L • I •
2
1
V
V – V
AR
AP
DSS
DSS DD
2
Avalanche Test Circuit Avalanche Waveform
Page 8
HAT2028R/HAT2028RJ
8
10 µ
100 µ 1 m 10 m 100 m 1 10
100 1000 10000
10
1
0.1
0.01
0.001
0.0001
D = 1
0.5
0.2
0.1
0.05
0.02
0.01
1shot pulse
Pulse Width PW (S)
Normalized Transient Thermal Impedance vs. Pulse Width (1 Drive Operation)
Normalized Transient Thermal Impedance
s (t)
γ
DM
P
PW
T
D =
PW
T
ch – f(t) = s (t) • ch – f ch – f = 125 °C/W, Ta = 25 °C
θ γ θ θ
When using the glass epoxy board (FR4 40x40x1.6 mm)
10 µ
100 µ 1 m 10 m 100 m 1 10
100 1000 10000
10
1
0.1
0.01
0.001
0.0001
D = 1
0.5
0.2
0.1
0.05
0.02
0.01
1shot pulse
Pulse Width PW (S)
Normalized Transient Thermal Impedance vs. Pulse Width (2 Drive Operation)
Normalized Transient Thermal Impedance
s (t)
γ
DM
P
PW
T
D =
PW
T
ch – f(t) = s (t) • ch – f ch – f = 166 °C/W, Ta = 25 °C
θ γ θ θ
When using the glass epoxy board (FR4 40x40x1.6 mm)
Page 9
HAT2028R/HAT2028RJ
9
Package Dimensions
Unit: mm
1.75 Max
4.0 Max
M
8
5
1
4
5.0 Max
6.2 Max
1.27
0.15 Hitachi code
EIAJ
JEDEC
FP–8DA
—
MS-012AA
0.25 Max
0.25 Max
1.27 Max
0.51 Max
0.25
0 – 8°
Page 10
Cautions
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2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact Hitachi’s sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as fail­safes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Hitachi.
7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor products.
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Copyright ' Hitachi, Ltd., 1999. All rights reserved. Printed in Japan.
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