Datasheet HAT2016R-D Datasheet (HIT)

Page 1
HAT2016R
Silicon N Channel Power MOS FET
High Speed Power Switching
ADE-208-438 H (Z)
9th. Edition
June 1997
Features
• Capable of 4 V gate drive
• Low drive current
• High density mounting
Outline
SOP–8
1
2
3
4
5
6
7
8
G
DSD
G
DSD
MOS1
MOS2
1
2
78
4
5
6
3
1, 3 Source 2, 4 Gate 5, 6, 7, 8 Drain
Page 2
HAT2016R
2
Absolute Maximum Ratings (Ta = 25°C)
Item Symbol Ratings Unit
Drain to source voltage V
DSS
30 V
Gate to source voltage V
GSS
±20 V
Drain current I
D
6.5 A
Drain peak current I
D(pulse)
Note1
52 A
Body-drain diode reverse drain current I
DR
6.5 A
Channel dissipation Pch
Note2
2W
Channel dissipation Pch
Note3
3W Channel temperature Tch 150 °C Storage temperature Tstg –55 to +150 °C
Note: 1. PW ≤ 10µs, duty cycle ≤ 1 %
2. 1 Drive operation : When using the glass epoxy board (FR4 40 x 40 x 1.6 mm), PW≤ 10s
3. 2 Drive operation : When using the glass epoxy board (FR4 40 x 40 x 1.6 mm), PW≤ 10s
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HAT2016R
3
Electrical Characteristics (Ta = 25°C)
Item Symbol Min Typ Max Unit Test Conditions
Drain to source breakdown voltage
V
(BR)DSS
30——V I
D
= 10mA, VGS = 0
Gate to source breakdown voltage
V
(BR)GSS
±20——V I
G
= ±100µA, VDS = 0
Gate to source leak current I
GSS
——±10 µAV
GS
= ±16V, VDS = 0
Zero gate voltege drain current I
DSS
——10µAV
DS
= 30 V, VGS = 0
Gate to source cutoff voltage V
GS(off)
1.0 — 2.0 V VDS = 10V, I D = 1mA
Static drain to source on state R
DS(on)
— 0.03 0.045 Ω ID = 4A, VGS = 10V
Note4
resistance R
DS(on)
— 0.05 0.08 Ω ID = 4A, VGS = 4V
Note4
Forward transfer admittance |yfs| 58—SI
D
= 4A, VDS = 10V
Note4
Input capacitance Ciss — 560 — pF VDS = 10V Output capacitance Coss — 380 — pF VGS = 0 Reverse transfer capacitance Crss — 170 — pF f = 1MHz Turn-on delay time t
d(on)
— 30 — ns VGS = 4V, ID = 4A
Rise time t
r
— 270 — ns VDD ≅ 10V
Turn-off delay time t
d(off)
—40—ns
Fall time t
f
—65—ns
Body–drain diode forward voltage
V
DF
— 0.9 1.4 V IF = 6.5A, VGS = 0
Note4
Body–drain diode reverse recovery time
t
rr
— 45 — ns IF = 6.5A, VGS = 0
diF/ dt =20A/µs
Note: 4. Pulse test
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HAT2016R
4
Main Characteristics
Channel Dissipation Pch (W)
Ambient Temperature Ta (°C)
Power vs. Temperature Derating
Drain to Source Voltage V (V)
DS
Drain Current I (A)
D
Maximum Safe Operation Area
Drain to Source Voltage V (V)
DS
Drain Current I (A)
D
Typical Output Characteristics
Gate to Source Voltage V (V)
GS
Drain Current I (A)
D
Typical Transfer Characteristics
Note 5 : When using the glass epoxy board (FR4 40x40x1.6 mm)
4.0
3.0
2.0
1.0
0
50 100 150 200
100
30 10
3 1
0.3
0.1
0.03
0.01
0.1
0.3 1 3 10 30 100
10 µs
100 µs
1 ms
PW = 10 ms
20
16
12
8
4
0
246810
10 V
6 V
3 V
4.5 V
3.5 V
V = 2.5 V
GS
4 V
5 V
20
16
12
8
4
0
1234
5
Tc = –25 °C
75 °C
25 °C
2 Drive Operation
1 Drive Operation
Operation in this area is limited by R
DS(on)
Pulse Test
V = 10 V Pulse Test
DS
Test Condition : When using the glass epoxy board (FR4 40x40x1.6 mm), PW < 10 s
Note 5
DC Operation (PW < 10 s)
Ta = 25 °C 1 shot Pulse 1 Drive Operation
Page 5
HAT2016R
5
Gate to Source Voltage V (V)
GS
Drain to Source Voltage V (V)
DS(on)
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
Drain Current I (A)
D
Drain to Source On State Resistance
R ( )
Ω
DS(on)
Static Drain to Source on State Resistance
vs. Drain Current
Case Temperature Tc (°C)
R ( )
DS(on)
Static Drain to Source on State Resistance
Ω
Static Drain to Source on State Resistance
vs. Temperature
Forward Transfer Admittance |yfs| (S)
Drain Current I (A)
D
Forward Transfer Admittance vs.
Drain Current
0.5
0.4
0.3
0.2
0.1
0
246810
2 A 1 A
I = 5 A
D
0.2
0.5
1
2
51020
0.5
0.2
0.1
0.02
0.05
0.01
0.005
10 V
V = 4 V
GS
0.10
0.08
0.06
0.04
0.02
–40 0 40 80 120 160
0
I = 1 A, 2 A, 5 A
D
1 A, 2 A, 5 A
10 V
V = 4 V
GS
0.2
0.5 1 2
510
20
20
10
2
5
1
0.2
0.5
25 °C
Tc = –25 °C
75 °C
Pulse Test
Pulse Test
Pulse Test
DS
V = 10 V Pulse Test
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HAT2016R
6
Reverse Drain Current I (A)
DR
Reverse Recovery Time trr (ns)
Body–Drain Diode Reverse
Recovery Time
Capacitance C (pF)
Drain to Source Voltage V (V)
DS
Typical Capacitance vs. Drain to Source Voltage
Gate Charge Qg (nc)
Drain to Source Voltage V (V)
DS
Gate to Source Voltage V (V)
GS
Dynamic Input Characteristics
0.2 0.5 1 2 5 10 20
500
200
100
20
50
10
5
di/dt = 20 A/µs V = 0, Ta = 25°C
GS
0 10 20 30 40 50
10000
3000
1000
300
100
30
10
Ciss
Coss Crss
V = 0 f = 1 MHz
GS
50
40
30
20
10
0
20
16
12
8
4
816243240
0
V
GS
V
DS
V = 5 V
10 V 25 V
DD
V = 25 V
10 V
5 V
DD
I = 6.5 A
D
Source to Drain Voltage V (V)
SD
Reverse Drain Current I (A)
DR
Reverse Drain Current vs.
Souece to Drain Voltage
20
16
12
8
4
0
0.4 0.8 1.2 1.6 2.0
V = 0, –5 V
GS
5 V
Pulse Test
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HAT2016R
7
Vin Monitor
D.U.T.
Vin 4 V
R
L
V = 10 V
DD
tr
td(on)
Vin
90%
90%
10%
10%
Vout
td(off)
Vout Monitor
50Ω
90%
10%
t
f
Switching Time Test Circuit Switching Time Waveform
Drain Current I (A)
D
Switching Time t (ns)
Switching Characteristics
1000
200
500
100
20
50
10
0.2 0.5 1 2 5 100.1
V = 4 V, V = 10 V PW = 3 µs, duty < 1 %
GS
DD
t
f
r
t
d(on)
t
d(off)
t
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HAT2016R
8
Pulse Width PW (S)
Normalized Transient Thermal Impedance vs. Pulse Width (1 Drive Operation)
Normalized Transient Thermal Impedance
s (t)
γ
10 µ
100 µ 1 m 10 m 100 m 1 10
100 1000 1000
10
1
0.1
0.01
0.001
0.0001
D = 1
0.5
0.2
0.1
0.05
0.02
0.01
1shot pulse
DM
P
PW
T
D =
PW
T
ch – f(t) = s (t) • ch – f ch – f = 125 °C/W, Ta = 25 °C
θ γ θ θ
When using the glass epoxy board (FR4 40x40x1.6 mm)
10 µ
100 µ 1 m 10 m 100 m 1 10
100 1000 1000
Pulse Width PW (S)
Normalized Transient Thermal Impedance vs. Pulse Width (2 Drive Operation)
Normalized Transient Thermal Impedance
s (t)
γ
10 µ
100 µ 1 m 10 m 100 m 1 10
100 1000 1000
10
1
0.1
0.01
0.001
0.0001
D = 1
0.5
0.2
0.1
0.05
0.02
0.01
1shot pulse
DM
P
PW T
D =
PW
T
ch – f(t) = s (t) • ch – f ch – f = 166 °C/W, Ta = 25 °C
θ γ θ θ
When using the glass epoxy board (FR4 40x40x1.6 mm)
Page 9
HAT2016R
9
Package Dimensions
Unit: mm
1.75 Max
4.0 Max
M
8
5
1
4
5.0 Max
6.2 Max
1.27
0.15 Hitachi code
EIAJ
JEDEC
FP–8DA
—
MS-012AA
0.25 Max
0.25 Max
1.27 Max
0.51 Max
0.25
0 – 8°
Page 10
HAT2016R
10
Cautions
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent, copyright, trademark, or other intellectual property rights for information contained in this document. Hitachi bears no responsibility for problems that may arise with third party’s rights, including intellectual property rights, in connection with use of the information contained in this document.
2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact Hitachi’s sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as fail­safes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Hitachi.
7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor products.
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Copyright © Hitachi, Ltd., 1998. All rights reserved. Printed in Japan.
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