Datasheet HAL800UT-K, HAL800UT-E, HAL800UT-C, HAL800UT-A Datasheet (Micronas Intermetall)

Page 1
PRELIMINARY DATA SHEET
MICRONAS
HAL 800 Programmable Linear Hall Effect Sensor
Edition Oct. 20, 1999 6251-441-1DS
MICRONAS
Page 2
Contents Page Section Title
3 1. Introduction
3 1.1. Major Applications 3 1.2. Features 4 1.3. Marking Code 4 1.4. Operating Junction Temperature Range (T 4 1.5. Hall Sensor Package Codes 4 1.6. Solderability 4 1.7. Pin Connections and Short Descriptions
5 2. Functional Description
5 2.1. General Function 7 2.2. Digital Signal Processing and EEPROM 9 2.3. Calibration Procedure 9 2.3.1. General Procedure 10 2.3.2. Calibration of Angle Sensor
)
J
11 3. Specifications
11 3.1. Outline Dimensions 11 3.2. Dimensions of Sensitive Area 11 3.3. Position of Sensitive Area 12 3.4. Absolute Maximum Ratings 12 3.5. Recommended Operating Conditions 13 3.6. Electrical Characteristics 14 3.7. Magnetic Characteristics 14 3.8. Typical Characteristics
17 4. Application Notes
17 4.1. Application Circuit 17 4.2. Temperature Compensation 18 4.3. Am bi ent Te mpe ratur e 18 4.4. EMC and ESD
19 5. Programming of the Sensor
19 5.1. Definition of Programming Pulses 19 5.2. Definition of the Telegram 21 5.3. Telegram Codes 22 5.4. Number Formats 23 5.5. Register Information 23 5.6. Programming Information
24 6. Data Sheet History
2 Micronas
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Programmable Linear Hall Effect Sensor

1. Introduction

The
HAL 800 is an universal magnetic field sensor with
a linear output based on the Hall effect. The IC is designed and produ ced in sub-mic ron CMOS techn ol­ogy and can be used for angle or distance measure­ments if combined wit h a rotating or moving magnet. The major characteristics like magnetic field range, sensitivity, output quiescent voltage (output voltage at B = 0 mT), and output voltage range are p rogramma­ble in a non-volatile memo ry. The sensor has a ratio­metric output ch aracter isti c, which mean s th at the out­put voltage is propor ti on al to the m agn eti c flux and t he supply voltage.
HAL 800 features a temperature compensated
The Hall plate with choppered offset compensation, an A/D converter, digital signal processing, a D/A converter with output driver, an EEPROM memory with redun­dancy and lock function for the calibration data, a serial interface for programming the EEPROM, and protec­tion devices at all pins. The internal di gital signal pro­cessing is of great benefit because analog offsets, temperature shifts, and mechanical stress do not degrade the sensor accuracy.

1.1. Major Applications

Due to the sensor’s versatile programming characteris­tics, the applications such as:
– contactless potentiometers, – rotary position measurement, – linear position detection, – magnetic field and current measurement.

1.2. Features

– high precision linear Hall effect sensor with
ratiometric output
– multiple programmable magnetic characteristics
with non-volatile memory – digital signal processing – temperature characteristics programmable for
matching all common magnetic materials – programmable clamping voltages – programming with a modulation of the supply
voltage
HAL 800 is the optimal system solution for
HAL 800 is programmable by modulating the sup-
The ply voltage. No additional programming pi n is needed. The easy programmab ility allows a 2-point calib ration by adjusting the output voltage directly to the input sig­nal (like mechanical angle, distance or current). An individual adjustment of each sensor during the cus­tomers manufacturing process is possible. With this calibration procedur e the tolera nces of the sensor, the magnet, and the mechanical positioning can be com­pensated in the final assembly.
In addition, the t emperature compensation of the Hall IC can be fit to all commo n magne tic mat er ials by pro­gramming first and second order temperature coeffi­cients of the Hall sensor sensitivity. This enables an operation over the full temperature range with high accuracy.
The calculation of the indiv idual se nsor cha racteristi cs and the programming of the EEPROM memory can easily be done with a PC and the applic ation kit from Micronas. The characteristics can be programmed in a wide range. Therefore, one Hall IC type can be used for various applications.
HAL 800 eases logistic because its
– lock function and redundancy for EEPROM memory
operates from 40 °C up to 150 °C
ambient temperature
operates from 4.5 V up to 5.5 V supply voltageoperates with static magnetic fields and dynamic
magnetic fields up to 2 kHz
choppered offset compensa tio novervoltage and reverse-voltage protection at all
pins – magnetic characteristics extremely robust against
mechanical stress
short-circuit protected push-pull outputEMC optimized design
The sensor is desig ned for hostile indus trial and a uto­motive applications and operates with typically 5 V supply voltage in the amb ient temperature range from
40 °C up to 150 °C.
The
HAL 800 is available in the very small leaded
package TO-92UT.
Micronas 3
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HALXXXPA-T
Temperature Range: A, K, E, or C Package: UT for TO-92UT Type: 800

1.3. Marki n g C o de

HAL 800 has a marking on the package surface
The (branded side). T his m ark ing in clud es the name o f th e sensor and the temperature range.
Type Temperature Range
A K E C
HAL 800 800A 800K 800E 800C
1.4. Operating Junction Temperature Range (T
A: TJ = K: TJ = E: TJ =
40 °C to +170 °C
40 °C to +140 °C
40 °C to +100 °C
)
J
C: TJ = 0 °C to +100 °C The Hall sensors from Micronas are specified to the
chip temperature (junction temperature T The relationship between ambient temperature (T
and junction temperature is explained in
on page 18
.
).
J
Section 4.3.
A

1.6. Solderability

Package TO-92UT: according to IEC68-2-58 During soldering reflow processing and manual
reworking, a component body temperature of 260 °C should not be exceeded.
Components stored in the original packaging should provide a shelf life of at least 12 m onths, starting fro m the date code prin ted on the labels, even in environ­ments as extreme as 40 °C and 90% relative humidity.

1.7. Pin Connections and Short Descriptions

Pin
Pin Name Type Short Description
No.
1V
DD
IN Supply Voltage and
Programming Pin
2 GND Ground
)
3 OUT OUT Push Pull Output
V
1
DD

1.5. Hall Sensor Package Codes

Example: HAL800UT-A
Type: 800Package: TO-92UTTemperature Range: T
= 40°C to +170°C
J
Hall sensors are available in a wide variety of packag­ing versions and quantities. For more detailed informa­tion, please refer to the brochure: Ordering Co des for Hall Sensors”.
OUT
3
2
GND
Fig. 1–1: Pin configuration
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2. Functional Description

2.1. General Function

HAL 800 is a monolithic integrated circuit which
The provides an output voltage proportional to the mag­netic flux through the Hall pla te an d pr oportional to the supply voltage.
The external magnetic field component perpendi cular to the branded side of th e package generates a Hall voltage. This voltage is converted to a digital value, processed in the Digital S ignal Processing Uni t (DSP) according to the EEPROM programming, converted to an analog voltage with ratio metr ic behavior, and stabi­lized by a push-pull output transis tor stage. The func­tion and the parameters for the DSP are detailed explained in
Section 2.2. on page 7.
The setting of the LOCK register disables the program­ming of the EE PROM memor y for all time. This r egis­ter cannot be reset.
As long as the LOCK register is not set, the output characteristic can be adjusted by modifying the EEPROM registers. The IC is addressed by modulat­ing the supply voltage
(see Fig. 2–1). In the supply
voltage range from 4.5 V up to 5.5 V , the sensor gener-
ates an analog outp ut voltage. After detecting a com­mand, the sensor reads or writes the memory and answers with a digital signal on the output pin. The analog output is switched off during the communica­tion.
Internal temperature compensation circuitry and the choppered offset compensation enables operation over the full temperature range with minim al changes in accuracy and high o ffset stability. The circuitry also rejects offset shifts d ue to mechanical stres s from the package. The non-volatile memory is equipped with redundant EEPROM cells. In addi ti on, th e s ensor IC i s equipped with devices for overvoltage and reverse volt­age protection at all pins.
HAL
8 7
(V)
DD
6
V
5
800A
V
DD
GND
Fig. 2–1: Programming with V
OUT
DD
V
DD
(V)
OUT
V
digital
modulation
analog
V
DD
Internally stabilized Supply and Protection Devices
Switched A/D Hall Plate Converter
Supply Level Detection
GND
Temperature Dependent Bias
Fig. 2–2: HAL800 block diagram
Digital Signal Processing
EEPROM Memory
Lock Control
Oscillator
D/A Analog Converter Output
Digital Output
Protection Devices
100
OUT
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0
1
2
3
4
5
–40 –20 0 20 40
mT
V
B
V
OUT
Clamp-high = 4 V
Sensitivity = 0.15
V
OQ
= 2.5 V
Clamp-low = 1 V
Range = 30 mT
Fig. 24: Example for output characteristics
ADC-READOUT Register
14 bit
Digital Signal Processing
TC 6 bit
A/D Converter
TCSQ 5 bit
Digital Filter
MODE Register RANGE 2 bit
FILTER 1 bit
Multiplier Adder Limiter D/A
SENSI­TIVITY LOW
14 bit
VOQ
11 bit
EEPROM Memory
Fig. 2–3: Details of EEPROM and Digital Signal Processing
CLAMP-
10 bit
CLAMP­HIGH
11 bit
LOCK 1 bit
Lock Control
Digital
Output
Converter
Micronas Registers
V
V
5
Clamp-high = 4.5 V
OUT
4
3
2
1
0 –150 –100 –50 0 50 100 150
Range = 150 mT
Sensitivity = –0.45 V
= –0.5 V
OQ
Clamp-low = 0.5 V
B
Fig. 25: Example for output characteristics
mT
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2.2. Digital Signal Processing and EEPROM

The DSP is the m a jo r pa rt of thi s s ens or a nd performs the signal conditioning. The parameters for the DSP are stored in the EEPROM r egisters. The details are shown in
Fig. 2–3.
Terminology:
SENSITIVITY:name of the register or register value Sensitivity: name of the parameter
The EEPROM registers consist of three groups: Group 1 contains the r egisters for the adaption of the
sensor to the magnetic system: MODE for selecting the magnetic fie ld range and filter frequency, TC and TCSQ for temperature characteris­tics of the magnetic sensitivity.
Group 2 contains the registers for defining the output characteristics: SENSITIVITY, VOQ, CLAMP-LOW, and CLAMP-HIGH. The output characteristic of the sensor is defined by these 4 parameters (see
Fig. 2–4
and Fig. 2–5 for examples). – The parameter V
(Output Quiescent Voltage) cor-
OQ
responds to the output voltage at B = 0 mT.
– The parameter Sensitivity is defined as:
V
Sensitivity =
OUT
B
The output voltage can be calculated as:
Sensitivity × B + V
V
OUT
OQ
The output voltage range can be clamped by setting the registers CLAMP -LOW and CLA MP-H IGH in order to enable failure detection (such as short-circuits to
or GND).
V
DD
Group 3 contains the Micronas registers and LOCK for the locking of all registers. The Micronas registers are programmed and locked during production and are read-only for the customer. These registers are used for oscillator frequency tr imming, A/D converter offset compensation, and several other special settings.
The ADC converts positive or negative Hall voltages (operates with m agnetic north and south poles at the branded side of the package) in a digital value. This signal is filtered in the Di gital Filter and is readable in the ADC-READOUT regi ster as long as the LOCK b it is not set.
Note: The ADC-READOUT values and the resolution of the system depe nds on the filte r freque ncy. Po sitive values accord to a magnetic north pole on the branded side of the package.
Fig. 2–6 and Fig. 2–7 show typi-
cal ADC-READOUT values for the different magneti c field ranges and filter frequencies.
6000
4000
ADC­READOUT
2000
2000
4000
6000
0
–200–150–100–50 0 50 100 150 200
Filter = 500 Hz
Fig. 26: Typical ADC-READOUT versus magnetic field for filter = 500 Hz
Range 150 mT Range 90 mT Range 75 mT Range 30 mT
B
mT
1500
1000
ADC­READOUT
500
0
500
1000
1500
20015010050 0 50 100 150 200
Fig. 27: Typical ADC-READOUT versus magnetic field for filter = 2 kHz
Filter = 2 kHz
Range 150 mT Range 90 mT Range 75 mT Range 30 mT
mT
B
Micronas 7
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Range
The RANGE bits are the two lowest bits of the MODE register; they define the magnetic field range of the A/D converter.
RANGE Magnetic Field Range
0 30 mT...30 mT 1 75 mT...75 mT 2 90 mT...90 mT 3 150 mT...15 0 mT
Filter
The FILTER bit is the highest bit of the MODE register; it defines the
3 dB frequency of the digital low pass fil-
ter
FILTER 3 dB Frequency
02 kHz
For all calculations, the di gi tal value from th e magnetic field of the A/D converter is use d. This digital i nforma­tion is readable from the ADC-READOUT register.
V
* 2048
Sensitivity =
ADC-READOUT * V
OUT
DD
VOQ
The VOQ register contains the parameter for the Adder in the DSP. V
is the output voltage without
OQ
external magnetic fie ld (B = 0 mT) and programmable
V
from
up to VDD. For VDD = 5 V the register can
DD
be changed in steps of 4.9 mV. Note: If V
is programmed to a negative voltage, the
OQ
maximum output voltage is limited to:
V
OUTmax
= VOQ + V
DD
For calibration in the system environment, a 2-point adjustment procedure mended. The suitable Sensitivity and V
(see Section 2.3.) is recom-
valu es for
OQ
each sensor can be ca lculated indi viduall y by this pro­cedure.
1 500 Hz
TC and TCSQ
The temperature dependence of the magnetic sensitiv­ity can be adapted to different magnetic materials in order to compensate for the change of the magnetic strength with temperature. The adaption is done by programming the TC (Temperature Coefficient) and the TCSQ registers (Quadratic Temperature Coeffi­cient). Thereby, the slope and the curvature of the magnetic sensitivity can be matched to the magnet and the sensor as sembly. As a result, the output volt­age characteristic c an be fixed over the full tempera­ture range. The sensor can compensate for linear tem­perature coefficients in the range from about -2900 ppm/K up to 700 ppm/K and quadratic coefficients from about -5 ppm/K² to 5 ppm/K². Please refer to
Section 4.2. on page 17 for the recommended setti ngs
for different linear temperature coefficients.
Sensitivity
The SENSITIVITY register contains the parameter for the Multiplier in the DSP. The Sensitivity is programma­ble between -4 and 4. For V
= 5 V the register can
DD
be changed in steps of 0.00049. Sensiti vity = 1 corre­sponds to an increase o f the output voltage by V
DD
if
the ADC-READOUT increases by 2048.
Clamping Voltage
The output voltage range can be clamped in order to detect failures like shorts to V
or GND.
DD
The CLAMP-LOW register co ntains the parameter for the lower limit. The lower clamping voltage is program­mable between 0 V and V
/2. For VDD = 5 V the reg-
DD
ister can be changed in steps of 2.44 mV. The CLAMP-HIGH reg ister contains the parameter for
the higher limit. The higher clamping voltage is pro­grammable between 0 V and V
. For VDD = 5 V in
DD
steps of 2.44 mV.
LOCK
By setting this 1-bit register, all registers will be locked, and the sensor will no longer respond to any supply voltage modulation.
Warning: This register cannot be reset!
ADC-READOUT
This 14-bit register delivers the actual digital value of the applied magnetic field before the signal process­ing. This regist er can be read o ut and is the bas is for the calibration proce dure of the sensor in the s ystem environment.
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2.3. Calibration Procedure

2.3.1. General Procedure

For calibration in the system environm ent , the applic a­tion kit from Micronas i s recom mended. It contai ns the hardware for the generation of the se rial telegram for programming and the corresponding software for the input of the register values.
In this section, programming of the sensor with this programming tool is explained. Please refer to
Section 5. on page 19 for information about program-
ming without this tool. For the individual calibration of each sensor in the cus-
tomer application, a two point adjustment is recom­mended (see
Fig. 2–8 for an example). When using
the application ki t, the cali bration can b e done i n thr ee steps:
Step 1: Input of the registers which need not be adjusted individually
The magnetic circuit, the magnetic material with its temperature characteristics, the filter frequency, and low and high clamping voltage are given for this appli­cation.
Therefore, the values of the following registers should be identical for all sensors of the customer application.
– FILTER
(according to the maximum signal frequency)
Step 2: Calculation of V
and Sensitivity
OQ
The calibration points 1 and 2 can be set inside the specified range. The corresponding values for V and V
Low clamping voltage ≤ V
result from the application requirements.
OUT2
High clamping voltage
OUT1,2
OUT1
For highest accuracy of the sensor, calibration poin ts near the minimum an d maximum input s ignal are rec­ommended. The difference of the output voltage between calibration point 1 and calibration point 2 should be more than 3.5 V.
Set the system to calibrat ion point 1 a nd read the reg ­ister ADC-READOUT. The result is the value ADC­READOUT1.
Now, set the system to calibration point 2, read the register ADC-READOUT again, and get the value ADC-READOUT2.
With these values and the target values V
, for the calibration points 1 and 2, respecti vely,
V
OUT2
the values for Sensitivity and V
V
V
Sensitivity =
VOQ = V
OUT1
ADC-READOUT1ADC-READOUT2
ADC-READOUT1 * Sensitivity * V
OUT1
2048
are calculated as:
OQ
OUT2
*
DD
OUT1
2048
V
DD
and
This calculation has to be done individually for each sensor.
– RANGE
(according to the maximum magnetic field at the sensor position)
– TC and TCSQ
(depends on the material of the magnet and the other temperature dependencies of the application)
– CLAMP-LOW and CLAMP-HIGH
(according to the application requirements)
Write the appr opriate settings into the
HAL 800 regis-
ters. After writing, the information is stored in an internal
RAM and not in the EEPROM. It is valid until switching off the supply voltage. If the values should be per ma­nently stored in the EEPROM, the “STORE” comma nd must be used before switching off the supply voltage.
Now, write the calculated values for Sensitivity and
for adjusting the sensor.
V
OQ
Use the “STORE” command for permanently storing the EEPROM registers. The sensor is now calibrated for the customer application. However, the program­ming can be changed again and again if necessary.
Step 3: Locking the Sensor
The last step is activating the LOCK function with the LOCK command. The sensor is now locked and does not respond to any programming or reading com­mands.
Warning: This register cannot be reset!
Micronas 9
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4.5 V 0.5 V
25002350
Sensitivity =
5V
2048
*
=
0.3378
VOQ = 4.5 V
2048
2500 * (−0.3378) * 5 V
= 2.438 V

2.3.2. Calibration of Angle Sensor

The following description explains the calibrati on pro­cedure using an angle sensor as an example. The required output characteristic is shown in
Fig. 2–8.
the angle range is from 25° to 25°temperature coefficient of the magnet: 500 ppm/K
Step 1: Input of the registers which need not to be adjusted individually
The register values for the following registers are given for all applications:
– FILTER
Select the filter frequency: 500 Hz
– RANGE
Select the magnetic field range: 30 mT
– TC
For this magnetic material: 1
– TCSQ
For this magnetic material: 12
– CLAMP-LOW
For our example: 0.5 V
V
5
Clamp-high = 4.5 V
Calibration point 1
V
OUT
4
3
2
1
0
–30 –20 –10 0 10 20 30
Clamp-low = 0.5 V
Calibration point 2
Angle
Fig. 28: Example for output characteristics
°
– CLAMP-HIGH
For our example: 4.5 V
Enter these values in the software, and use the WRITE command for wr iting the values in the regis­ters.
Step 2: Calculation of V
There are 2 ways to calculate the values for V
and Sensitivity
OQ
OQ
and
Sensitivity Manual Calculation: Set the system to c alibration point 1 (angl e 1 =
25°)
and read the register A DC-READOUT. For our exam­ple, the result is ADC-READOUT1 =
2500.
Now, set the system to calibration point 2 (angle 2 = 25°), and read th e reg is ter ADC-READOUT again . For our example, the result is ADC-READOUT2 =
With these measurements and the targets V
4.5 V and V are
V
OQ
= 0.5 V, the values for Sensiti vity an d
OUT2
+2350.
OUT1
=
This calculation has to be done individually for each sensor.
Automatic Calibration: Use the menu CALIBRATE from the PC sof tware and
enter the values 4.5 V for V Set the system to cali bration point 1 (angl e 1 =
and 0.5 V for V
OUT1
OUT2
25°),
hit the button Read ADC-Readou t1, set the syst em to calibration point 2 (angle 2 = 25 °), hit the button Read ADC-Readout2, and hit the button Calcul ate. The soft­ware will then calc ulate th e approp riate V
and Sen-
OQ
sitivity. Now, write the calculated values into the
HAL 800 for
programming the sensor a nd use the “STORE” com­mand for permanently storing the EEPROM registers.
Step 3: Locking the Sensor
The last step is activating the LO CK function with the LOCK command. The sensor is now locked and does not respond to any programming or reading com­mands.
.
Warning: This register cannot be reset!
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3. Specifications

3.1. Outline Dimensions

±0.1
0.48
0.55
0.42
4.06
x2
x1
123
1.271.27
(2.54)
branded side
1.5
0.3
0.36
45°
SPGS0014-3-A/1E
±0.2
0.75
y
4.05
±0.2
2.1
13.0 min.

3.2. Dimensions of Sensitive Area

0.25 mm x 0.25 mm
sensitive area

3.3. Position of Sensitive Area

TO-92UT
±0.1
x1 x2/ 2 0.2 mm y = 1.5 mm ± 0.2 mm
0.8
Fig. 3–1:
Plastic Transist or Single Outline Package
(TO-92UT)
Weight approximately 0.14 g Dimensions in mm A mechanical tolerance of
±50 µm applies to all
dimensions where no tolerance is explicitly given.
Micronas 11
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3.4. Abso lute Max imum Ratings

Symbol Parameter Pin No. Min. Max. Unit
V V
I I V
V
DD
DD
Z
OUT
OUT
DD
V
Supply Voltage 1 −8.5 8.5 V Supply Voltage 1 −14.4 Reverse Supply C ur ren t 1 50 Current through Protection Device 1 or 3 −300 Output Voltage 3 −5
Excess of Output Voltage
DD
over Supply Voltage
I
OUT
t
Sh
T
S
T
J
1)
as long as T
2)
t < 10 minutes (V
3)
as long as T
4)
t < 2 ms
5)
t < 1000h
6)
internal protection resistor = 100
Continuous Output Current 3 −10 10 mA Output Short Circuit Duration 3 10 min Storage Temperature Range −65 150 °C Junction Temperature Range −40
is not exceeded
Jmax
Jmax
= 15 V for t < 1min, V
DDmin
is not exceeded, output is not protected to external 14 V-line (or to −14 V)
5
1) 2)
4)
6)
6)
14.4
1)
300
8.5
14.4
1) 2)
4)
3)
3) 2)
3,1 2 V
5)
170
= 16 V for t < 1min)
DDmax
40
150
V mA mA V
°C °C
Stresses beyond those listed in the Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating onl y. Functional operation of the device at these or any oth er condi tions beyond those indic ated i n the Rec ommended Operating Conditions/Character istics of this specificati on is not i mplied. Ex posure to abs olute maximum ratings conditions for extended periods may affect device reliability.

3.5. Recommended Operating Conditions

Symbol Parameter Pin No. Min. Typ. Max. Unit
V I
OUT
R C
DD
L
L
Supply Voltage 1 4.5 5 5.5 V Continuous Output Current 3 −1 1mA Load Resistor 3 4.5 −−k Load Capacitance 3 0.33 10 1000 nF
12 Micronas
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3.6. Electrical Characteristics

= 40 °C to +170 °C, VDD = 4.5 V to 5.5 V, after programming, as not otherwise specified in Conditions.
at T
J
Typical Characteristics for T
Symbol Parameter Pin No. Min. Typ. Max. Unit Conditions
= 25 °C and VDD = 5 V.
J
I
DD
I
DD
V
DDZ
V
OZ
Supply Current 1 7 10 mA TJ = 25 °C, VDD = 4.5 V to 8.5 V Supply Current
over Temperature Range Overvoltage Protection
at Supply Overvoltage Protection
at Output Resolution 3 12 bit ratiometric to V
E
A
Accuracy Error over all 3 202%R
INL Non-Linearity of Output Voltage
over Temperature
E
V
R
OUTCL
Ratiometric Error of Output over Temperature (Error in V
OUT
/ VDD)
Accuracy of Output Voltage at Clamping Low Voltage over Temperature Range
V
OUTCH
Accuracy of Output Voltage at Clamping High Voltage over Temperature Range
V
OUTH
Output High Voltage 3 4.65 4.8 V V
1710mA
1 17.5 20 V IDD = 25 mA, TJ = 25 °C, t = 20 ms
31719.5VI
3 1 0 1 % % of supply voltage
3
3
3
101% V
45 0 45 mV R
45 0 45 mV R
= 10 mA, TJ = 25 °C, t = 20 ms
O
1)
DD
= 4.7 k (% of supply voltage)
L
3)
- V
OUT2
> 2 V
DD
DD
= 5 V
= 5 V
OUT
1mA
OUT1
during calibration procedure
= 4.7 kΩ, V
L
= 4.7 kΩ, V
L
= 5 V, 1 mA I
DD
3)
V f
ADC
f
ADC
t
r(O)
t
d(O)
t
POD
OUTL
Output Low Voltage 3 0.2 0.35 V V
= 5 V, 1 mA I
DD
Internal ADC Frequency 120 128 140 kHz TJ = 25 °C Internal ADC Frequency over
Temperature Range Response Time of Output 3 2
110 128 150 kHz V
1
2
4
ms ms
= 4.5 V to 8.5 V
DD
3 dB Filter frequency = 500 Hz 3 dB Filter frequency = 2 kHz C
= 10 nF, time from 10% to 90% of
L
final output voltage for a steplike signal B
step
Delay Time of Output 3 0.1 0.5 ms Power-Up Time (Time to reach
stabilized Output Voltage)
3 2
5 3
ms 3 dB Filter frequency = 500 Hz
3 dB Filter frequency = 2 kHz 90% of V
OUT
BW Small Signal Bandwidth (3dB) 3 2 kHz BAC < 10 mT;
3 dB Filter frequency = 2 kHz
V
OUTn
R
OUT
R
thJA
TO-92UT
1)
Output DAC full scale = 5 V ratiometric, Output DAC offset = 0 V, Output DAC LSB = VDD/4096
2)
peak-to-peak value exceeded: 5%
3)
if more than 50% of the selected magnetic field range are used
Noise Output Voltage
pp
Output Resistance over Recom­mended Operating Range
Thermal Resistance Junction to Soldering Point
3 36mV2) magnetic range = 90 mT 3 110 V
OUTL
V
OUT
−−150 200 K/W
OUT
from 0 mT to B
V
OUTH
1mA
max
Micronas 13
Page 14
20
15
10
5
0
5
10
15
20
–15 –10 –50 5101520
V
mA
V
DD
I
DD
T
A
= –40 °C
T
A
= 25 °C
TA=150 °C
Fig. 32: Typical current consumption versus supply voltage

3.7. Magnetic Characteristics

= 40 °C to +170 °C, VDD = 4.5 V to 5.5 V, after programming, as not otherwise specified in Conditions.
at T
J
Typical Characteristics for T
Symbol Parameter Pin No. Min. Typ. Max. Unit Test Conditions
= 25 °C and VDD = 5 V.
J
B
Offset
B
Offset
B
Hysteresis
SR Magnetic Slew Rate 3
n
meff
f
Cflicker
f
Cflicker
Magnetic Offset 3 101mTB = 0 mT, I
/T Magnetic Offset Change
due to T
J
Magnetic Hysteresis 20 0 20 µT Range = 30 mT, Filter = 500 Hz
Magnetic RMS Broadband Noise
Corner Frequency of 1/f Noise 3 20 Hz B = 0 mT Corner Frequency of 1/frms
Noise

3.8. Typical Characteristics

= 0 mA, TJ = 25 °C
OUT
15 0 15 µT/K B = 0 mT, I
12
50
3 10 −µT BW = 10 Hz to 2 kHz
3 100 Hz B = 65 mT, TJ = 25 °C
mT/ms Filter frequency = 500 Hz
Filter frequency = 2 kHz
OUT
= 0 mA
mA
10
V
= 5 V
DD
I
8
DD
6
4
2
0
–50 0 50 100 150 200
T
A
°
C
Fig. 33: Typical current consumption versus ambient temperature
14 Micronas
Page 15
mA
10
T
= 25 °C
A
V
= 5 V
DD
I
8
DD
6
4
2
0
–1.5 –1.0 –0.5 0.0 0.5 1.0 1.5
I
OUT
Fig. 34: Typical current consumption versus output current
mA
%
1.0
0.8
E
R
0.6
0.4
0.2
0.0
0.2
V
0.4
0.6
0.8
1
45678
OUT/VDD
V
OUT/VDD
V
OUT/VDD
V
OUT/VDD
V
OUT/VDD
= 0.82 = 0.66 = 0.5 = 0.34 = 0.18
Fig. 36: Typical ratiometric error versus supply voltage
V
V
DD
dB
5
0
V
OUT
5
10
15
20
25
30
Filter: 500 Hz
–35
Filter: 2 kHz
–40
10 100 1000 10000
Fig. 35: Typical output voltage versus signal frequency
f
signal
–3
Hz
%
120
1/sensitivity
100
80
60
40
TC = 16, TCSQ = 8
20
TC = 0, TCSQ = 12 TC = –20, TCSQ = 12 TC = –31, TCSQ = 0
0
–50 0 50 100 150 200
Fig. 37: Typical 1/sensitivity versus ambient temperature
°C
T
A
Micronas 15
Page 16
1
0.8
0.6
0.4
0.2
0.0
0.2
0.4
0.6
0.8
1.0
–50 0 50 100 150 200
°C
mT
T
A
B
Offset
TC = 16, TCSQ = 8 TC = 0, TCSQ = 12 TC = –20, TCSQ = 12
Fig. 38: Typical magnetic offset versus ambient temperature
INL
%
1.0
0.8
0.6
0.4
0.2
0.0
0.2
0.4
0.6
Range = 30 mT
0.8
1
40 20 0 20 40
Fig. 39: Typical nonlinearity versus magnetic field
mT
B
16 Micronas
Page 17

4. Application Notes

4.1. Application Circuit

For EMC protection, it is recomm ended to add eac h a ceramic 4.7 nF capacitor between ground and the sup­ply voltage respectively the output voltage pin. In addi­tion, the input of the con troller unit should be pulled­down with a 4.7 k Ohm resistor and a ceramic 4.7 nF capacitor.
Please note that during programming , the sensor will be supplied repeatedl y with the programming voltage of 12 V for 100 ms. All components conn ected to the
line at this time must be able to resist this voltage.
V
DD
V
DD
OUT
4.7 k
µ
C
4.7 nF
GND
HAL800
4.7 nF 4.7 nF
Temperature
TC TCSQ Coefficient of Magnet (ppm/K)
01110
100 8 10
200 6 11
300 4 11
400 3 12
500 1 12
600 113
700 313
800 514
900 614
1000 815
1100 915
1200 11 16
Fig. 4–1: Recommended application circuit

4.2. Temperature Compensation

The relation between the temperature coefficient of the magnet and the corresponding TC and TCSQ code s for a linear compensation is given in the following table. In addition to the linear chang e of the magnetic field with temperature, the cur vature can be adjusted, too. For that purpose, TC and TCSQ have to be changed to combinations that are not given in the table. Please contact Micr onas for more de tailed in for­mation.
Temperature
TC TCSQ Coefficient of Magnet (ppm/K)
700 29 8 600 26 9 500 23 9
1300 13 17
1400 14 17
1500 15 18
1600 17 18
1700 18 18
1800 19 19
1900 20 19
2000 22 20
2100 23 21
2200 24 21
2300 25 22
2400 26 22
2500 27 23
2600 28 23
400 21 9 300 18 9 200 16 9
2700 29 24
2800 30 24
2900 31 26
100 14 10
Micronas 17
Page 18

4.3. Ambient Temperature

Due to the intern al power dissipation , the temperature on the silicon c hip (junction temperature T
) is higher
J
than the temperature outside the package (ambient temperature T
= TA + ∆T
T
J
).
A
At static conditions, the following equation is valid:
T = I
* VDD * R
DD
thJA
For typical values, use the typical parameters. For worst case calculation, use the max. parameters for
and Rth, and the max. value for VDD from the appli-
I
DD
cation. For V
temperature difference For all sensors, the junction temperature T
fied. The maximum ambient temperature T
= 5.5 V, Rth = 200 K/W and IDD = 10 mA the
DD
T = 11 K.
is speci-
J
can be
Amax
calculated as: T
Amax
= T
Jmax
−∆T

4.4. EMC and ESD

HAL 800 is designed for a stabilized 5 V supply.
The Interferences and disturbances conducted along the 12 V onboard system (product standards DIN40839 part 1 or ISO 7637 part 1) are not relevant for these applications.
For applications with disturbances by capacitive or inductive coupling on the supply line or radiat ed distur­bances, the application circuit shown in Fig. 4–1 is rec­ommended.
Applications with this arrangement passed the EMC tests according to the product standards DIN 40839 part 3 (Electrical transient transmission by capacitive or inductive coupling) and part 4 (Radiated distur­bances).
Please contact M icronas for the detailed investigation reports with the EMC and ESD results.
18 Micronas
Page 19

5. Programming of the Sensor

5.1. Definition of Programming Pulses

The sensor is addre ssed by modulating a serial tele­gram on t he su ppl y voltage. The sensor answers with a serial telegram on the output pin.
The bits in the s er ial tel egram have a different Bit tim e for the V V
-line is defined through the length of the S ync Bit
DD
-line and the output. The Bit time for the
DD
at the beginning of ea ch telegram. The Bi t time for the output is defined through the Acknowledge Bit.
A logical 0 is coded as no voltage change within the Bit time. A logical 1 is coded as a voltage change between 50% and 80% of the Bit time. After each bi t a voltage change occurs.

5.2. Definition of the Telegram

Each telegram starts with the Sync Bit (logical 0), 3 bits for the Command (COM), th e Comm and Parity B it (CP), 4 bits for the Address ( ADR), and the Address Parity Bit (AP).
command has been proces sed the sensor answers with an Acknowledge Bit (logical 0) on the output.
– Read a register (see Fig. 5–3)
After evaluating this command the sensor answers with the Acknowledge Bit, 14 Data Bits, and the Data Parity Bit on the output.
– Programming the EEPROM cells (see Fig. 5–4)
After evaluating this command the sensor answers with the Acknowledge Bit. After the delay time t supply voltage rises up to the programming voltage.
logical 0
logical 1
V
V
V
V
DDH
DDL
DDH
DDL
t
r
t
p1
t
f
t
p0
t
p0
or
or
t
p0
t
p1
t
p0
w
the
There are 3 kinds of telegrams:
Fig. 5–1: Definition of logical 0 and 1 bit
– Write a register (see Fig. 5–2)
After the AP Bit follow 14 Data Bits (DAT) and the Data Parity Bit (DP). If the telegram is valid and the
Table 5–1: Telegram parameters
Symbol Parameter Pin Min. Typ. Max. Unit Remarks
V
DDL
V
DDH
t
r
t
f
t
p0
t
pOUT
t
p1
V
DDPROG
Supply Voltage for Low Level during Programming
Supply Voltage for High Level during Programming
Rise time 1 0.05 ms Fall time 1 0.05 ms Bit time on V Bit time on output pin 3 4 6 8 ms t
Voltage Change for logical 1 1, 3 50 65 80 % % of t Supply Voltage for
Programming the EEPROM
DD
155.66V
16.88.08.5V
13.43.53.6mst
1 11.95 12 12.1 V
is defined through the Sync Bit
p0
pOUT
Acknowledge Bit
is defined through the
or t
p0
pOUT
t
PROG
t
rp
t
fp
t
w
Programming Time for EEPROM 1 95 100 105 m s Rise time of programming voltage 1 0.2 0.5 1 ms Fall time of programming voltage 1 0 1 ms Delay time of programming voltage
after Acknowledge
10.50.71ms
Micronas 19
Page 20
WRITE
Sync COM CP ADR AP DAT DP
V
DD
V
OUT
Fig. 5–2: Telegram f or coding a Write command
READ
Acknowledge
Sync COM CP ADR
V
DD
V
OUT
AP
Fig. 5–3: Telegram for coding a Read command
ERASE, PROM, LOCK, and LOCKI t
V
DDPROG
Sync COM CP ADR
V
DD
V
OUT
AP
Acknowledge
t
w
DA T DPAcknowledge
t
rp
PROG
t
fp
Fig. 5–4: Telegram for coding the EEPROM programming
20 Micronas
Page 21

5.3. Telegram Codes

Sync Bit
Each telegram star ts with the Sync Bit. This logical 0 pulse defines the exact timing for t
Command Bits (COM)
The Command code contains 3 bits and is a binar y number. the corresponding codes for the
Command Parity Bit (CP)
This parity bit is 1, if the number of zeros within the 3 Command Bits is uneven. The parity bit is 0, if the number of zeros is even.
Address Bits (ADR)
The Address code contains 4 bits and is a binary num­ber.
HAL 800 registers.
Table 5–2 shows the available commands and
Table 5–3 s hows the available addresses for the
.
p0
HAL 800.
Address parity bit (AP)
This parity bit is 1, if the number of zeros within the 4 Address bits is uneven. The par ity bit is 0, if the num­ber of zeros is even.
Data Bits (DAT)
The 14 Data Bits contain the register information. The registers use different number formats for the Data
Bits. These formats are explained in In the Write command the last bits are valid. If for
example the TC register (6 bits) is written, only the last 6 bits are valid.
In the Read command the first bits are valid. If for example the TC register (6 bits) is re ad, on ly the fi rst 6 bits are valid.
Data Parity Bit (DP)
This parity bit is 1, if the number of zeros within the binary number is e ven. The parity bit is 0, if th e n umb er of zeros is uneven.
Section 5.4.
Table 5–2: Available Commands
Command Code Explanation
READ 2 read a register WRITE 3 write a register PROM 4 program all nonvolatile registers (except the lock bits) ERASE 5 erase all nonvolatile registers (except the lock bits) LOCKI 6 lock Micronas lockable register LOCK 7 lock the whole device and switch permanently to the analog-mode Please note:
The Micronas lock bit (LOCKI) has already been set during production and cannot be reset.
Micronas 21
Page 22

5.4. Number Formats

Binary number:
The most significant bit is given as first, the least signif­icant bit as last digit.
Example:
Signed binary number:
The first digit represents the sign of the following binary number (1 for negative, 0 for positive sign).
Example:
101001 represents 41 decimal.
0101001 represents +41 decimal 1101001 represents 41 decimal
Table 5–3: Available register addresses
Parameter Code Data
Bits
Format Customer Remark
Two-complementary number:
The first digit of positive numbers is 0, the r est of the number is a binary number. Negative numbers start with 1. In order to calculate the abs olute value of the number, you have to calculate the complement of the remaining digits and to add 1.
Example:
0101001 represents +41 decimal 1010111 represents 41 decimal
CLAMP-LOW 1 10 binary read/write/program Low clamping voltage CLAMP-HIGH 2 11 binary read/write/program High clamping voltage VOQ 3 11 two compl.
binary SENSITIVITY 4 14 signed binary read/write/program MODE 5 3 binary read/write/program Range and filter parameters
LOCKR 6 1 binary lock Lock Bit ADC-READOUT 7 14 two compl.
binary TC 11 6 signed binary read/write/program TCSQ 12 5 binary read/write/program
Micronas registers (read only for customers)
Parameter Code Data
Bits
Format Remark
read/write/program
read
see
Table 5–4 for details
OFFSET 8 4 two compl. binary ADC offset adjustment FOSCAD 9 5 binary Oscillator frequency adjustment SPECIAL 13 6 special settings IMLOCK 14 1 binary Lock Bit for the Micronas registers
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Page 23

5.5. Register Information

CLAMP-LOW
The register range is from 0 up to 1023.The register value is calculated by:
Low Clamping Voltage
V
DD
* 2048CLAMP-LOW =
CLAMP-HIGH
The register range is from 0 up to 2047.The register value is calculated by:
High Clamping Voltage
V
DD
* 2048CLAMP-HIGH =
VOQ
The register range is from 1024 up to 1023.
The register value is calculated by:
V
OQ
* 1024VOQ =
V
DD
SENSITIVITY
The register range is from 8192 up to 8191.
The register value is calculated by:
SENSITIVITY =
Sensitivity
2048
MODE
– The register range is from 0 up to 7 and contains the
settings for FILTER and RANGE
ADC-READOUT
This register is read only.
The register range is from 8192 up to 8191.
TC and TCSQ
The TC register range is from 31 up to 31,
The TCSQ register range is from 0 up to 31.
Please refer
Section 4.2. on page 17 for the recom-
mended values.

5.6. Programming Information

If you want to change the content of any register (except the lock registers) you have to write the desired value into the correspo nding RAM register at first.
If you want to permanently store the value in the EEPROM, you have to send an ERASE command first and a PROM command afterwards. The address within the ERASE and PROM command is not important. ERASE and PROM acts on all registers in parallel.
If you want to change all r eg ist ers of the
HAL 800, you
can send all writing commands one after each other and send one ERASE and PROM command at the end.
Table 5–4: Parameters for the MODE register
MODE FILTER 3 dB Frequency RANGE Magnetic Field Range
00 2 kHz 0 10 2 kHz 1 20 2 kHz 2 30 2 kHz 3 4 1 500 Hz 0 5 1 500 Hz 1 6 1 500 Hz 2 7 1 500 Hz 3
30 mT...30 mT
75 mT...75 mT
90 mT...90 mT
150 mT...150 mT
30 mT...30 mT
75 mT...75 mT
90 mT...90 mT
150 mT...150 mT
Micronas 23
Page 24

6. Data Sheet History

1. Advance information: HAL 800 Programmable Lin­ear Hall Effect Sensor, Aug. 24, 1998, 6251-441-1AI. First release of the advance information.
2. Fina l data sh eet: HAL 800 Programmable Linear Hall Effect Sensor, Oct. 20, 1999, 6251-441-1DS. First release of the final data sheet.
Micronas GmbH Hans-Bunte-Strasse 19 D-79108 Freiburg (Germany) P.O. Box 840 D-79008 Freiburg (Germany) Tel. +49-761-517-0 Fax +49-761-517-2174 E-mail: docservice@micronas.com Internet: www.micronas.com
Printed in Germany Order No. 6251-441-1DS
All information and data contained in this data sheet are without any commitment, are not to be considered as an offer for conclusion of a contract, nor shall they be construed as to create any liability. Any new issue of this data sheet invalidates previous issues. Product availability and delivery are exclusively subject to our respective order confirmation form; the same applies to orders based on development samples deliv­ered. By this publication, Micronas GmbH does not assume responsibil­ity for patent infr ingements or other right s of third parties whic h may result from its use. Further, Micronas GmbH reserves the right to revise this publication and to make changes to its conte nt, at any t ime, withou t obligatio n to noti fy any person or entity of such revisions or changes. No part of this publication may be reproduced, photocopied, stored on a retrieval system, or transmitted without the express written consent of Micronas GmbH .
24 Micronas
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