Datasheet HAF2005 Datasheet (HIT)

Page 1
HAF2005
Silicon N Channel MOS FET Series
Power Switching
ADE-208-688 (Z)
Target specification 1st. Edition
Nov. 1998
This FET has the over temperature shut–down capability sensing to the junction temperature. This FET has the built–in over temperature shut–down circuit in the gate area. And this circuit operation to shut–down the gate voltage in case of high junction temperature like applying over power consumption, over current etc.
Features
Logic level operation (4 to 6 V Gate drive)
High endurance capability against to the short circuit
Built–in the over temperature shut–down circuit
Latch type shut–down operation (Need 0 voltage recovery)
Outline
TO–220FM
G
Tempe– rature Sencing Circuit
Gate resistor
Latch Circuit
Gate Shut– down Circuit
D
1
2
3
S
1. Gate
2. Drain
3. Source
Page 2
HAF2005
Absolute Maximum Ratings (Ta = 25°C)
Item Symbol Ratings Unit
Drain to source voltage V Gate to source voltage V Gate to source voltage V Drain current I Drain peak current I Body-drain diode reverse drain current I Channel dissipation Pch
DSS
GSS
GSS
D
D(pulse)
DR
Note1
Note2
Channel temperature Tch 150 °C Storage temperature Tstg –55 to +150 °C
Note: 1. PW 10µs, duty cycle 1 %
2. Value at Ta = 25°C
Typical Operation Characteristics
Item Symbol Min Typ Max Unit Test Conditions
Input voltage V
Input current I (Gate non shut down) I
Input current I (Gate non shut down) I Shut down temperature T Gate operation voltage V
V
IH1
IH2
I
IL
IH(sd)1
IH(sd)2
IH
IL
sd
op
3.5 V — 1.2 V — 100 µA Vi = 8V, VDS = 0 ——50µA Vi = 3.5V, VDS = 0 ——1 µA Vi = 1.2V, VDS = 0 — 0.8 mA Vi = 8V, VDS = 0 — 0.35 — mA Vi = 3.5V, VDS = 0 — 175 °C Channel temperature
3.5 12 V
60 V (16) V (–2.5) V 40 A 80 A 40 A 30 W
2
Page 3
HAF2005
S
Electrical Characteristics (Ta = 25°C)
Item Symbol Min Typ Max Unit Test Conditions
Drain current I Drain current I Drain to source breakdown
D1
D2
V
(BR)DSS
voltage Gate to source breakdown
V
(BR)GSS
voltage Gate to source breakdown
V
(BR)GSS
voltage Gate to source leak current I
Input current (shut down) I
Zero gate voltege drain current I Gate to source cutoff voltage V Static drain to source on state
GSS1
I
GSS2
I
GSS3
I
GSS4
GS(op)1
I
GS(op)2
DSS
GS(off)
R
DS(on)
resistance Static drain to source on state
R
DS(on)
resistance Forward transfer admittance |yfs|2550—S I Output capacitance Coss 940 pF V
Turn-on delay time t Rise time t Turn-off delay time t Fall time t Body–drain diode forward
V
d(on)
r
d(off)
f
DF
voltage Body–drain diode reverse
t
rr
recovery time Over load shut down t operation time
Note4
os1
t
os2
Note: 3. Pulse test
4. Include the time shiff based on increasing of chennel temperature when operete under over load condition.
(25) A VGS = 3.5V, VDS = 2V ——10mAV 60——V I
= 1.2V, VDS = 2V
GS
= 10mA, VGS = 0
D
(16) V IG = (300µA), VDS = 0
(–2.5) V IG = (–100µA), VDS = 0
100 µAVGS = 8V, VDS = 0 ——50µAVGS = 3.5V, VDS = 0 ——1 µAVGS = 1.2V, VDS = 0 — –100 µAVGS = –2.4V, VDS = 0 — 0.8 mA VGS = 8V, VDS = 0 — 0.35 mA VGS = 3.5V, VDS = 0 — 250 µAVDS = 50 V, VGS = 0
1.0 2.25 V ID = 1mA, VDS = 10V —2533m ID = 20A, VGS = 4V
—1520m ID = 20A, VGS = 10V
= 20A, VDS = 10V
D
= 10V , VGS = 0
D
f = 1 MHz — (7.8) µsI — (64) µsR
= 20A, VGS = 5V
D
= 1.5
L
(19) µs — (30) µs — (0.85) V IF = 20A, VGS = 0
( ) ns IF = 20A, VGS = 0
diF/ dt =50A/µs — ( ) ms VGS = 5V, VDD = 12V — ( ) ms VGS = 5V, VDD = 24V
Note3
Note3
Note3
3
Page 4
HAF2005
Main Characteristics
Power vs. Temperature Derating
40
30
20
10
Channel Dissipation Pch (W)
0
50 100 150 200
Case Temperature Tc (°C)
4
Page 5
Package Dimensions
HAF2005
Unit: mm
1.2 ± 0.2
1.4 ± 0.2
0.7 ± 0.1
2.54 ± 0.5
10.0 ± 0.3
7.0 ± 0.3
φ
3.2 ± 0.2
12.0 ± 0.3
2.0 ± 0.3
5.0 ± 0.3
2.54 ± 0.5
4.45 ± 0.3
2.7
0.6
2.8 ± 0.2
2.5 ± 0.2
17.0 ± 0.3
14.0 ± 1.0
0.5 ± 0.1 Hitachi Code
EIAJ Code
JEDEC Code
TO–220FM
SC–72
5
Page 6
Cautions
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4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as fail­safes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product.
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