Datasheet GS82032Q-133, GS82032T-6I, GS82032T-6, GS82032T-5I, GS82032T-5 Datasheet (GSI)

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Page 1
Preliminary
GS82032T/Q-150/138/133/117/100/66
TQFP, QFP
64K x 32
Commercial Temp Industrial Temp
2M Synchronous Burst SRAM
Features
• FT pin for user-configurable flow through or pipeline operation
• Single Cycle Deselect (SCD) operation
• 3.3 V +10%/–5% core power supply
• 2.5 V or 3.3 V I/O supply
• LBO pin for Linear or Interleaved Burst mode
• Internal input resistors on mode pins allow floating mode pins
• Default to Interleaved Pipeline mode
• Byte Write (BW) and/or Global Write (GW) operation
• Common data inputs and data outputs
• Clock Control, registered, address, data, and control
• Internal self-timed write cycle
• Automatic power-down for portable applications
• JEDEC-standard 100-lead TQFP or QFP package
-150 -138 -133 -117 -100 -66 Unit
Pipeline
3-1-1-1
Flow
Through
2-1-1-1
tCycle
tKQ IDD
tCycle
tKQ IDD
6.6
3.8
270
10.5 9
170
7.25 4
245
15
9.7
120
7.5 4
240
15 10
120
8.5
4.5
210
15 11
120
10
5
180
15 12
120
12.5 6
150
20 18 95
ns ns
mA
ns ns
mA
Functional Description
Applications
The GS82032 is a 2,097,152-bit high performance synchronous SRAM with a 2-bit burst address counter. Although of a type originally developed for Level 2 Cache applications supporting high performance CPUs, the device now finds application in synchronous SRAM applications ranging from DSP main store to networking chip set support.
Controls
Addresses, data I/Os, chip enables (E1, E2, E3), address burst control inputs (ADSP, ADSC, ADV), and write control inputs (Bx, BW, GW) are synchronous and are controlled by a positive-edge-triggered clock input (CK). Output enable (G) and power down control (ZZ) are asynchronous inputs. Burst cycles can be initiated with either ADSP or ADSC inputs. In Burst mode, subsequent burst addresses are generated internally and are controlled by ADV. The burst address counter may be configured to count in either linear or interleave order with the Linear Burst Order (LBO) input. The Burst function need not be used. New addresses can be loaded on every cycle with no degradation of chip performance.
150 MHz–66 MHz
3.3 V V
DD
3.3 V and 2.5 V I/O
Flow Through/Pipeline Reads
The function of the Data Output register can be controlled by the user via the FT mode pin/bump (Pin 14 in the TQFP, Bump 1F in the FP-BGA). Holding the FT mode pin/bump low, places the RAM in Flow Through mode, causing output data to bypass the Data Output Register. Holding FT high places the RAM in Pipeline mode, activating the rising-edge-triggered Data Output Register.
SCD Pipelined Reads
The GS82032 is an SCD (Single Cycle Deselect) pipelined synchronous SRAM. DCD (Dual Cycle Deselect) versions are also available. SCD SRAMs pipeline deselect commands one stage less than read commands. SCD RAMs begin turning off their outputs immediately after the deselect command has been captured in the input registers.
Byte Write and Global Write
Byte write operation is performed by using Byte Write enable (BW) input combined with one or more individual byte write signals (Bx). In addition, Global Write (GW) is available for writing all bytes at one time, regardless of the byte write control inputs.
Sleep Mode
Low power (Sleep mode) is attained through the assertion (High) of the ZZ signal, or by stopping the clock (CK). Memory data is retained during Sleep mode.
Core and Interface Voltages
The GS82032 operates on a 3.3 V power supply and all inputs/ outputs are 3.3 V- and 2.5 V-compatible. Separate output power (V
internal circuit.
) pins are used to decouple output noise from the
DDQ
Rev: 1.04 2/2001 1/23 © 2000, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com. ByteSafe is a Trademark of Giga Semiconductor, Inc. (GSI Technology).
Page 2
GS82032 100-Pin TQFP and QFP Pinout
A6
E1
A7
E2
Preliminary
GS82032T/Q-150/138/133/117/100/66
DD
E3
BB
BA
BC
BD
SS
V
V
BW
GW
G
CK
ADSC
A8
ADV
ADSP
A9
NC DQC8 DQC7
V
DDQ
V DQC6 DQC5 DQC4 DQC3
V
V
DDQ
DQC2 DQC1
V
NC
V DQD1 DQD2
V
DDQ
V DQD3 DQD4
DQD5 DQD6
V V
DDQ
DQD7 DQD8
NC
SS
SS
FT
DD
SS
SS
SS
100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30
31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50
64K x 32
Top View
80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51
NC DQB8 DQB7 V
DDQ
V
SS
DQB6 DQB5 DQB4 DQB3 V
SS
V
DDQ
DQB2 DQB1 V
SS
NC V
DD
ZZ DQA1 DQA2 V
DDQ
V
SS
DQA3 DQA4 DQA5 DQA6 V
SS
V
DDQ
DQA7 DQA8 NC
SS
A5
A4
A3
A2
A1
A0
NC
LBO
NC
DD
NC
V
V
A11
NC
A10
A12
A13
NC
A14
A15
Rev: 1.04 2/2001 2/23 © 2000, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Page 3
GS82032T/Q-150/138/133/117/100/66
TQFP Pin Description
Pin Location Symbol Type Description
37, 36 A0, A1 I Address field LSBs and Address Counter preset Inputs
35, 34, 33, 32, 100, 99, 82, 81, 44, 45,
46, 47, 48, 49
52, 53, 56, 57, 58, 59, 62, 63 68, 69, 72, 73, 74, 75, 78, 79
2, 3, 6, 7, 8, 9, 12, 13
18, 19, 22, 23, 24, 25, 28, 29
16, 38, 39, 42, 43, 66, 50, 51, 80, 1, 30 NC No Connect
87 BW I Byte Write—Writes all enabled bytes; active low 93, 94 BA, BB I Byte Write Enable for DQA, DQB Data I/Os; active low 95, 96 BC, BD I Byte Write Enable for DQC, DQD Data I/Os; active low
89 CK I Clock Input Signal; active high
88 GW I Global Write Enable—Writes all bytes; active low 98, 92 E1, E3 I Chip Enable; active low
97 E2 I Chip Enable; active high
86 G I Output Enable; active low
83 ADV I Burst address counter advance enable; active low 84, 85 ADSP, ADSC I Address Strobe (Processor, Cache Controller); active low
64 ZZ I Sleep Mode control; active high
14 FT I Flow Through or Pipeline mode; active low
31 LBO I Linear Burst Order mode; active low
15, 41, 65, 91
5,10,17, 21, 26, 40, 55, 60, 67, 71, 76, 90
4, 11, 20, 27, 54, 61, 70, 77
A2–A15 I Address Inputs
DQA1–DQA8 DQB1–DQB8 DQC1–DQC8 DQD1–DQD8
V
DD
V
SS
V
DDQ
I/O Data Input and Output pins
I Core power supply I I/O and Core Ground I Output driver power supply
Preliminary
Rev: 1.04 2/2001 3/23 © 2000, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Page 4
GS82032 Block Diagram
A0–An
LBO ADV
CK ADSC
ADSP GW
BW BA
Register
D Q
A0
A1
D0 D1
Counter
Load
Register
D Q
Q0 Q1
Preliminary
GS82032T/Q-150/138/133/117/100/66
A0 A1
A
Memory
Array
Q D
BB
BC
BD
E1 E2
E3
FT
G
Register
D Q
Register
D Q
Register
D Q
Register
D Q
Register
D Q
Register
D Q
32
4
DQ
Register
32
Register
DQ
ZZ
Power Down
Control
1
DQx1–DQx8
Rev: 1.04 2/2001 4/23 © 2000, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Page 5
Linear Burst Sequence
I
Mode Pin Functions
Preliminary
GS82032T/Q-150/138/133/117/100/66
Mode Name
Burst Order Control LBO
Output Register Control FT
Power Down Control ZZ
Note: There are pull-up devices on LBO and FT pins and a pull down device on the ZZ pin, so those input pins can be unconnected and the chip will operate in the default states as specified in the above tables.
Pin
Name
State Function
L Linear Burst
H or NC Interleaved Burst
L Flow Through
H or NC Pipeline
L or NC Active
H
Standby, IDD = I
SB
Burst Counter Sequences
nterleaved Burst Sequence
A[1:0] A[1:0] A[1:0] A[1:0]
1st address 00 01 10 11 2nd address 01 10 11 00 3rd address 10 11 00 01 4th address 11 00 01 10
Note: The burst counter wraps to initial state on the 5th clock.
1st address 00 01 10 11 2nd address 01 00 11 10 3rd address 10 11 00 01 4th address 11 10 01 00
Note: The burst counter wraps to initial state on the 5th clock.
A[1:0] A[1:0] A[1:0] A[1:0]
Byte Write Truth Table
Function GW BW BA BB BC BD Notes
Read H H X X X X 1
Read H L H H H H 1 Write byte A H L L H H H 2, 3 Write byte B H L H L H H 2, 3 Write byte C H L H H L H 2, 3, 4 Write byte D H L H H H L 2, 3, 4
Write all bytes H L L L L L 2, 3, 4 Write all bytes L X X X X X
Notes:
1. All byte outputs are active in read cycles regardless of the state of Byte Write Enable inputs.
2. Byte Write Enable inputs BA, BB, BC, and/or BD may be used in any combination with BW to write single or multiple bytes.
3. All byte I/Os remain High-Z during all write operations regardless of the state of Byte Write Enable inputs.
Rev: 1.04 2/2001 5/23 © 2000, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Page 6
Synchronous Truth Table
Preliminary
GS82032T/Q-150/138/133/117/100/66
Operation
Deselect Cycle, Power Down None X H X X L X X High-Z
Deselect Cycle, Power Down None X L F L X X X High-Z
Deselect Cycle, Power Down None X L F H L X X High-Z
Read Cycle, Begin Burst External R L T L X X X Q
Read Cycle, Begin Burst External R L T H L X F Q
Write Cycle, Begin Burst External W L T H L X T D
Read Cycle, Continue Burst Next CR X X H H L F Q
Read Cycle, Continue Burst Next CR H X X H L F Q
Write Cycle, Continue Burst Next CW X X H H L T D
Write Cycle, Continue Burst Next CW H X X H L T D Read Cycle, Suspend Burst Current X X H H H F Q Read Cycle, Suspend Burst Current H X X H H F Q Write Cycle, Suspend Burst Current X X H H H T D Write Cycle, Suspend Burst Current H X X H H T D
Notes:
1. X = Don’t Care, H = High, L = Low.
2. E = T (True) if E2 = 1 and E3 = 0; E = F (False) if E2 = 0 or E3 = 1.
3. W = T (True) and F (False) is defined in the Byte Write Truth Table preceding.
4. G is an asynchronous input. G can be driven high at any time to disable active output drivers. G low can only enable active drivers (shown as “Q” in the Truth Table above).
5. All input combinations shown above are tested and supported. Input combinations shown in gray boxes need not be used to accomplish basic synchronous or synchronous burst operations and may be avoided for simplicity.
6. Tying ADSP high and ADSC low allows simple non-burst synchronous operations. See BOLD items above.
7. Tying ADSP high and ADV low while using ADSC to load new addresses allows simple burst operations. See ITALIC items above.
Address
Used
Diagram
5
Key
E1
E
2
ADSP ADSC ADV
W
3
DQ
4
State
Rev: 1.04 2/2001 6/23 © 2000, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Page 7
Preliminary
Simplified State Diagram
GS82032T/Q-150/138/133/117/100/66
X
Deselect
W R
W
X
Simple Synchronous OperationSimple Burst Synchronous Operation
First Write
W R
Burst Write
CW CR
R
CR
R
CR
R
First Read
Burst Read
X
CRCW
XX
Notes:
1. The diagram shows only supported (tested) synchronous state transitions. The diagram presumes G is tied low.
2. The upper portion of the diagram assumes active use of only the Enable (E1, E2, E3) and Write (BA, BB, BC, BD, BW, and GW) control inputs, and that ADSP is tied high and ADSC is tied low.
3. The upper and lower portions of the diagram together assume active use of only the Enable, Write, and ADSC control inputs, and assumes ADSP is tied high and ADV is tied low.
Rev: 1.04 2/2001 7/23 © 2000, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Page 8
Simplified State Diagram with G
Preliminary
GS82032T/Q-150/138/133/117/100/66
X
Deselect
W R
W
X
First Write
W
X
Burst Write
CW CR
R
CR
R
CR
W
CW
W
CW
R
First Read
R
Burst Read
X
CRCW
X
Notes:
1. The diagram shows supported (tested) synchronous state transitions plus supported transitions that depend upon the use of G.
2. Use of “Dummy Reads” (Read Cycles with G High) may be used to make the transition from read cycles to write cycles without passing through a deselect cycle. Dummy read cycles increment the address counter just like normal read cycles.
3. Transitions shown in gray tone assume G has been pulsed high long enough to turn the RAM’s drivers off and for incoming data to meet Data Input Set Up Time.
Rev: 1.04 2/2001 8/23 © 2000, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Page 9
GS82032T/Q-150/138/133/117/100/66
Absolute Maximum Ratings
(All voltages reference to VSS)
Symbol Description Value Unit
Preliminary
V
T
T
V
DDQ
V V
V
I
I
OUT
P
STG
BIAS
DD
CK I/O
IN
IN
D
Voltage on VDD Pins –0.5 to 4.6 V Voltage in V
Pins –0.5 to V
DDQ
DD
V Voltage on Clock Input Pin –0.5 to 6 V Voltage on I/O Pins –0.5 to V
+0.5 ( 4.6 V max.) V
DDQ
Voltage on Other Input Pins –0.5 to VDD+0.5 ( 4.6 V max.) V Input Current on Any Pin +/–20 mA Output Current on Any I/O Pin +/–20 mA Package Power Dissipation 1.5 W Storage Temperature –55 to 125 Temperature Under Bias –55 to 125
o
o
C C
Note: Permanent damage to the device may occur if the Absolute Maximum Ratings are exceeded. Operation should be restricted to Recommended Operating Conditions. Exposure to conditions exceeding the Absolute Maximum Ratings, for an extended period of time, may affect reliability of this component.
Recommended Operating Conditions
Parameter Symbol Min. Typ. Max. Unit Notes
V
V
DDQ
V
V
T T
DD
IH IL
3.135 3.3 3.6 V
2.375 2.5
1.7
V
DD
V
+0.3
DD
V 1 V 2
–0.3 0.8 V 2
A A
0 25 70 °C 3
–40 25 85 °C 3
2.375 V (i.e., 2.5 V I/O)
DDQ
Supply Voltage I/O Supply Voltage Input High Voltage Input Low Voltage Ambient Temperature (Commercial Range Versions) Ambient Temperature (Industrial Range Versions)
Notes:
1. Unless otherwise noted, all performance specifications quoted are evaluated for worst case at both 2.75 V V and 3.6 V V
3.135 V (i.e., 3.3 V I/O), and quoted at whichever condition is worst case.
DDQ
2. This device features input buffers compatible with both 3.3 V and 2.5 V I/O drivers.
3. Most speed grades and configurations of this device are offered in both Commercial and Industrial Temperature ranges. The part number of Industrial Temperature Range versions end the character “I”. Unless otherwise noted, all performance specifications quoted are evaluated for worst case in the temperature range marked on the device.
4. Input Under/overshoot voltage must be –2 V > Vi < VDD+2 V with a pulse width not to exceed 20% tKC.
Rev: 1.04 2/2001 9/23 © 2000, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Page 10
GS82032T/Q-150/138/133/117/100/66
Undershoot Measurement and Timing Overshoot Measurement and Timing
V
IH
VDD+-2.0V
V
SS
50%
20% tKC
Preliminary
50%
VSS-2.0V
20% tKC
V
DD
V
IL
Capacitance
(TA = 25oC, f = 1 MHZ, V
DD
= 3.3 V)
Parameter Symbol Test conditions Typ. Max. Unit
Control Input Capacitance Input Capacitance Output Capacitance
Note: This parameter is sample tested.
C
C
C
OUT
I
IN
V
V
DD
V
IN
OUT
= 3.3 V
= 0 V
= 0 V
3 4 pF 4 5 pF 6 7 pF
Package Thermal Characteristics
Rating Layer Board Symbol TQFP Max QFP Max Unit Notes
Junction to Ambient (at 200 lfm) single Junction to Ambient (at 200 lfm) four Junction to Case (TOP)
Notes:
1. Junction temperature is a function of SRAM power dissipation, package thermal resistance, mounting board temperature, ambient. Temperature air flow, board density, and PCB thermal resistance.
2. SCMI G-38-87.
3. Average thermal resistance between die and top surface, MIL SPEC-883, Method 1012.1.
4. For x18 configuration, consult factory.
R R R
ΘJA ΘJA ΘJC
40 TBD °C/W 1,2,4 24 TBD °C/W 1,2,4
9 TBD °C/W 3,4
Rev: 1.04 2/2001 10/23 © 2000, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Page 11
GS82032T/Q-150/138/133/117/100/66
AC Test Conditions
Parameter Conditions
Input high level 2. 3V Input low level 0.2 V Input slew rate 1 V/ns Input reference level 1.25 V Output reference level 1.25 V Output load Fig. 1& 2
Notes:
1. Include scope and jig capacitance.
2. Test conditions as specified with output loading as shown in Fig. 1 unless otherwise noted.
3. Output Load 2 for tLZ, tHZ, t
4. Device is deselected as defined by the Truth Table.
DQ
and t
OLZ
Output Load 1
OHZ
.
Preliminary
Output Load 2
2.5 V
DC Electrical Characteristics
Parameter Symbol Test Conditions Min Max
Input Leakage Current (except mode pins)
ZZ Input Current
Mode Pin Input Current
Output Leakage Current
Output High Voltage Output High Voltage Output Low Voltage
I
INZZ
I
I
V V V
I
IL
INM
OL
OH OH OL
50
VT = 1.25 V
*
30pF
* Distributed Test Jig Capacitance
V
= 0 to V
IN
V
DD ≥ VIN ≥ VIH
0 V ≤ V V
DD ≥ VIN ≥ VIL
0 V ≤ V
IN
IN
DD
V
V
IH
IL
Output Disable,
V
= 0 to V
I
= –4 mA, V
OH
I
= –4 mA, V
OH
OUT
I
OL
DDQ DDQ
= 4 mA
DD
= 2.375 V = 3.135 V
DQ
5pF
–1 uA 1 uA
–1 uA –1 uA
–300 uA
–1 uA
–1 uA 1 uA
1.7 V
2.4 V
*
225
225
1 uA
300 uA
1 uA 1 uA
0.4 V
Rev: 1.04 2/2001 11/23 © 2000, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Page 12
Preliminary
GS82032T/Q-150/138/133/117/100/66
Unit
to
–40
85°C
0
to
70°C
to
–40
85°C
0
to
70°C
to
–40
85°C
0
to
70°C
to
–40
85°C
0
to
70°C
to
–40
85°C
0
to
70°C
to
–40
85°C
-150 -138 -133 -117 -100 -66
0
to
270 275 245 250 240 245 210 215 180 185 150 155 mA
70°C
IDD
IDD
Pipeline
VIH or VIL
Device Selected;
All other inputs
10 15 10 15 10 15 10 15 10 15 10 15 mA
170 175 120 125 120 125 120 125 120 125 95 100 mA
ISB
Flow-Thru
– 0.2 V
Output open
ZZ V
90 95 80 85 80 85 70 75 60 65 50 55 mA
45 50 40 45 40 45 40 45 40 45 40 45 mA
IDD
IDD
Flow-Thru
DD
Pipeline
Flow-Thru
VIH or VIL
All other inputs
Device Deselected;
Current
Operating Currents
Rev: 1.04 2/2001 12/23 © 2000, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Parameter Test Conditions Symbol
Operating
Current
Standby
Current
Deselect
Page 13
AC Electrical Characteristics
Preliminary
GS82032T/Q-150/138/133/117/100/66
Pipeline
Flow
Through
Parameter Symbol
-150 -138 -133 -117 -100 -66
Min Max Min Max Min Max Min Max Min Max Min Max
Clock Cycle Time tKC 6.6 7.25 7.5 8.5 10 12.5 ns
Clock to Output Valid tKQ 3.8 4 4 4.5 5 6 ns
Clock to Output Invalid tKQX 1.5 2 2 2 2 2 ns
Clock to Output in Low-Z
tLZ
1
1.5 2 2 2 2 2 ns
Clock Cycle Time tKC 10.5 15 15 15 15 20 ns
Clock to Output Valid tKQ 9.0 9.7 10 11 12 18 ns
Clock to Output Invalid tKQX 3 3 3 3 3 3 ns
Clock to Output in Low-Z
tLZ
1
3 3 3 3 3 3 ns
Clock HIGH Time tKH 1.8 1.9 1.9 2 3 4 ns
Clock LOW Time tKL 1.8 1.9 1.9 2 3 4 ns
Clock to Output in High-Z
tHZ
1
1.5 3.8 1.5 4 1.5 4 1.5 4 5 6 ns
G to Output Valid tOE 3.8 4 4 4 5 6 ns
G to output in Low-Z
G to output in High-Z
tOLZ tOHZ
1
0 0 0 0 0 0 ns
1
4 4 4 4 5 6 ns
Setup time tS 1.7 2 2 2 2 2 ns
Hold time tH 0.5 0.5 0.5 0.5 0.5 0.5 ns
ZZ setup time
ZZ hold time
tZZS tZZH
2
5 5 5 5 5 5 ns
2
1 1 1 1 1 1 ns
ZZ recovery tZZR 20 20 20 20 20 20 ns
Unit
Notes:
1. These parameters are sampled and are not 100% tested
2. ZZ is an asynchronous signal. However, in order to be recognized on any given clock cycle, ZZ must meet the specified setup and hold times as specified above.
Rev: 1.04 2/2001 13/23 © 2000, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Page 14
Preliminary
GS82032T/Q-150/138/133/117/100/66
CK
ADSP
ADSC
ADV
A0–An
GW
BW
BA–BD
Single Write
tH
tS
tH
tS
WR1
tS
tH
Burst Write
ADSP is blocked by E1 inactive
tKC
tKL
tKH
tH
tS
tH
tS
ADV must be inactive for ADSP Write
WR2 WR3
tS tH
tH
tS
tS
tH
WR1 WR2 WR3
WR1
WR2 WR3
E1 masks ADSP
Write
ADSC initiated write
Deselected
E1
tH
tS
Deselected with E2
E2
tS tH
E2 and E3 only sampled with ADSP or ADSC
E3
G
tS
tH
DQA–DQD
Hi-Z
D1A
Rev: 1.04 2/2001 14/23 © 2000, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Write specified byte for 2A and all bytes for 2B, 2C& 2D
D2A D2B
D2C D2D D3A
Page 15
Preliminary
Flow Through Read Cycle Timing
GS82032T/Q-150/138/133/117/100/66
CK
ADSP
ADSC
ADV
A0–An
GW
BW
BA–BD
Single Read
tS
tH
tS
tS
tH
RD1
tS
tS
tH
tS
tKL
tKH
tS
tH
tH
RD2 RD3
Burst Read
ADSP is blocked by E1 inactive
tKC
Suspend Burst
E1 masks ADSP
ADSC initiated read
Suspend Burst
tH
tH
E1
tH
tS
E2 and E3 only sampled with ADSP or ADSC
Deselected with E2
E2
tS
tH
E3
tOE
tOHZ
G
DQA–DQD
tOLZ
Hi-Z
Q1A
tLZ
tKQ
Q2A
tKQX
Q2CQ2B
Q2D
Rev: 1.04 2/2001 15/23 © 2000, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
tKQX
Q3A
tHZ
Page 16
Flow Through Read-Write Cycle Timing
Single Read
CK
tH
tS
ADSP
ADSC
tH
tS
ADV
tS
tH
tKH
tKL
Single Write
tKC
tS
tH
Preliminary
GS82032T/Q-150/138/133/117/100/66
Burst Read
ADSP is blocked by E inactive
ADSC initiated read
A0–An
GW
BW
BA–BD
E1
E2
E3
G
DQA–DQD
Hi-Z
tS
tS
tS
RD1
tH
tH
tH
tOE
tKQ
tS
tH
tS
E2 and E3 only sampled with ADSP and ADSC
tOHZ
Q1A D1A
tH
tS
tS
WR1
WR1
tH
tH
RD2
E1 masks ADSP
Q2A
Q2B Q2C
Deselected with E3
Q2A
Q2D
Burst wrap around to its initial state
Rev: 1.04 2/2001 16/23 © 2000, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Page 17
Pipelined SCD Read Cycle Timing
Preliminary
GS82032T/Q-150/138/133/117/100/66
CK
ADSP
ADSC
ADV
An
GW
BW
BWA–BWD
Single Read
tH
tS
tH
tS
RD1
tS
tS
tS
tH
tS
RD2
tKH
tH
tKL
Burst Read
tKC
ADSP is blocked by E1 inactive
ADSC initiated read
Suspend Burst
RD3
tH
tH
tH
tS
E1 masks ADSP
E1
tH
tS
E2 and E3 only sampled with ADSP or ADSC
Deselected with E2
E2
tS
tH
E3
tOE
G
tOHZ
tKQX
Q2A
Q2B
Q2C
DQA–DQD
Hi-Z
tOLZ
Q1A
tLZ
tKQ
Q2D
tKQX
Q3A
tHZ
Rev: 1.04 2/2001 17/23 © 2000, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Page 18
Preliminary
Pipelined SCD Read-Write Cycle Timing
GS82032T/Q-150/138/133/117/100/66
CK
ADSP
ADSC
ADV
A0–An
GW
BW
BA–BWD
tS
tS
RD1
Single Read
tH
tS tH
tH
tS
tS
tH
tKH
tKL
Single Write
tKC
tS tH
WR1
tH
tS
WR1
Burst Read
ADSP is blocked by E inactive
ADSC initiated read
RD2
tH
E1
E2
E3
G
DQa–DQd
Hi-Z
tS
tS
tS
tH
tH
tH
E2 and E3 only sampled with ADSP and ADSC
tOE tOHZ
tS
tKQ
Q1A
tH
D1A Q2A
E1 masks ADSP
Deselected with E3
Q2B Q2C
Q2D
Rev: 1.04 2/2001 18/23 © 2000, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Page 19
Sleep Mode Timing Diagram
CK
tH
tS
ADSP
ADSC
ZZ
Application Tips
tKC
tKH
tKL
tZZS
~
~
~
~
~
~
~
~
~
~
~
~
Snooze
tZZH
Preliminary
GS82032T/Q-150/138/133/117/100/66
tZZR
Single and Dual Cycle Deselect
SCD devices force the use of “dummy read cycles” (read cycles that are launched normally, but that are ended with the output drivers inactive) in a fully synchronous environment. Dummy read cycles waste performance, but their use usually assures there will be no bus contention in transitions from reads to writes or between banks of RAMs. DCD SRAMs do not waste bandwidth on dummy cycles, and are logically simpler to manage in a multiple bank application (wait states need not be inserted at bank address boundary crossings), but greater care must be exercised to avoid excessive bus contention.
Rev: 1.04 2/2001 19/23 © 2000, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Page 20
GS 82032 Output Driver Characteristics
I Out (mA)
VDDQ
60
Preliminary
GS82032T/Q-150/138/133/117/100/66
-20
-40
40
Pull Down Drivers
20
I Out
0
VOut
VSS
Pull Up Drivers
-60
-80
-0.5 0 0.5 1 1.5 2 2.5 3 3.5 4 V Out (Pull Down)
VDDQ - V Out (Pull Up)
3.6V PD LD 3.3V PD LD 3.1V PD LD 3.1V PU LD 3.3V PU LD 3.6V PU LD
Rev: 1.04 2/2001 20/23 © 2000, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Page 21
TQFP and QFP Package Drawing
θ
L
L1
e
b
c
Preliminary
GS82032T/Q-150/138/133/117/100/66
Pin 1
D1
D
A1
A2
Y
E1
E
TQFP QFP
Symbol Description Min. Nom. Max Min. Nom. Max
A1 Standoff 0.05 0.10 0.15 0.25 0.35 0.45 A2 Body Thickness 1.35 1.40 1.45 2.55 2.72 2.90
b Lead Width 0.20 0.30 0.40 0.20 0.30 0.40 c Lead Thickness 0.09 0.20 0.10 0.15 0.20
D Terminal Dimension 21.9 22.0 22.1 22.95 23.2 23.45
D1 Package Body 19.9 20.0 20.1 19.9 20.0 20.1
E Terminal Dimension 15.9 16.0 16.1 17.0 17.2 17.4
E1 Package Body 13.9 14.0 14.1 13.9 14.0 14.1
e Lead Pitch 0.65 0.65 — L Foot Length 0.45 0.60 0.75 .60 0.80 1.00
L1 Lead Length 1.00 1.60
Y Coplanarity 0.10 0.10 θ Lead Angle 0° 7° 0° 7°
Notes:
1. All dimensions are in millimeters (mm).
2. Package width and length do not include mold protrusion
Rev: 1.04 2/2001 21/23 © 2000, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Page 22
Preliminary
GS82032T/Q-150/138/133/117/100/66
Ordering Information
2
Org
64K x 32 GS82032T-150 Pipeline/Flow Through TQFP 150/9 C 64K x 32 GS820322T-138 Pipeline/Flow Through TQFP 138/9.7 C 64K x 32 GS82032T-133 Pipeline/Flow Through TQFP 133/10 C 64K x 32 GS82032T-4 Pipeline/Flow Through TQFP 133/10 C 64K x 32 GS82032T-5 Pipeline/Flow Through TQFP 100/12 C 64K x 32 GS82032T-6 Pipeline/Flow Through TQFP 66/18 C 64K x 32 GS82032T-150I Pipeline/Flow Through TQFP 150/9 I Not Available 64K x 32 GS82032T-138I Pipeline/Flow Through TQFP 138/9.7 I 64K x 32 GS82032T-133I Pipeline/Flow Through TQFP 133/10 I 64K x 32 GS82032T-4I Pipeline/Flow Through TQFP 133/10 I 64K x 32 GS82032T-5I Pipeline/Flow Through TQFP 100/12 I 64K x 32 GS82032T-6I Pipeline/Flow Through TQFP 66/18 I 64K x 32 GS82032Q-150 Pipeline/Flow Through QFP 150/9 C 64K x 32 GS82032Q-138 Pipeline/Flow Through QFP 138/9.7 C 64K x 32 GS82032Q-133 Pipeline/Flow Through QFP 133/10 C 64K x 32 GS82032Q-4 Pipeline/Flow Through QFP 133/10 C 64K x 32 GS82032Q-5 Pipeline/Flow Through QFP 100/12 C 64K x 32 GS82032Q-6 Pipeline/Flow Through QFP 66/18 C 64K x 32 GS82032Q-150I Pipeline/Flow Through QFP 150/9 I Not Available 64K x 32 GS82032Q-138I Pipeline/Flow Through QFP 138/9.7 I 64K x 32 GS82032Q-133I Pipeline/Flow Through QFP 133/10 I 64K x 32 GS82032Q-4I Pipeline/Flow Through QFP 133/10 I 64K x 32 GS82032Q-5I Pipeline/Flow Through QFP 100/12 I 64K x 32 GS82032Q-6I Pipeline/Flow Through QFP 66/18 I
Notes:
1. Customers requiring delivery in Tape and Reel should add the character “T” to the end of the part number. Example: GS82032T-100IT.
2. The speed column indicates the cycle frequency (MHz) of the device in Pipeline mode and the latency (ns) in Flow Through mode. Each device is Pipeline/Flow Through mode-selectable by the user.
3. TA = C = Commercial Temperature Range. TA = I = Industrial Temperature Range.
4. GSI offers other versions this type of device in many different configurations and with a variety of different features, only some of which are covered in this data sheet. See the GSI Technology web site(www.gsitechnology.com)for a complete listing of current offerings.
Part Number
1
Type Package
Speed
(MHz/ns)
T
A
3
Status
Rev: 1.04 2/2001 22/23 © 2000, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Page 23
Revision History
Preliminary
GS82032T/Q-150/138/133/117/100/66
DS/DateRev. Code: Old;
New
GSGS82032 Rev 1.00 9/
1999A
GSGS82032 Rev 1.00 9/
1999A; 1.01 11/1999B
GSGS82032 Rev 1.01 11/
1999B; 1.02 1/2000C
GS820321.02 1/
2000C;820321.03 2/2000D
820321.03 2/2000D; 82032_r1_04
Types of Changes Format or Content
Format
Content
Content
Format/Content
Format/Content
Revisions
• This was the first release of 2 Meg Burst Datasheets in the new format. They included information for the Fine Pitch BGA package.
• Took out the Fine Pitch BGA information.
• Ordering information. Changed 128K x 32 to 64K x 32; Typo
• Ordering information. Changed “0” to go before “H” or “E” in part number.
• Ordering information. Changed - 117 to -4, -100 to -5. and -66 to -6.
• New GSI Logo
• Switched TKQ with TCycle in Flow Through part of table on page 1.
• Updated format to comply with Technical Publication Standards
• Changed all -4 references in ordering information table on page 22 from 117/11 to 133/10.
Rev: 1.04 2/2001 23/23 © 2000, Giga Semiconductor, Inc.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
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