• Byte Write (BW) and/or Global Write (GW) operation
• Common data inputs and data outputs
• Clock Control, registered, address, data, and control
• Internal self-timed write cycle
• Automatic power-down for portable applications
• JEDEC-standard 100-lead TQFP or QFP package
-150 -138 -133 -117 -100-66Unit
Pipeline
3-1-1-1
Flow
Through
2-1-1-1
tCycle
tKQ
IDD
tCycle
tKQ
IDD
6.6
3.8
270
10.5
9
170
7.25
4
245
15
9.7
120
7.5
4
240
15
10
120
8.5
4.5
210
15
11
120
10
5
180
15
12
120
12.5
6
150
20
18
95
ns
ns
mA
ns
ns
mA
Functional Description
Applications
The GS82032 is a 2,097,152-bit high performance
synchronous SRAM with a 2-bit burst address counter.
Although of a type originally developed for Level 2 Cache
applications supporting high performance CPUs, the device
now finds application in synchronous SRAM applications
ranging from DSP main store to networking chip set support.
Controls
Addresses, data I/Os, chip enables (E1, E2, E3), address burst
control inputs (ADSP, ADSC, ADV), and write control inputs
(Bx, BW, GW) are synchronous and are controlled by a
positive-edge-triggered clock input (CK). Output enable (G)
and power down control (ZZ) are asynchronous inputs. Burst
cycles can be initiated with either ADSP or ADSC inputs. In
Burst mode, subsequent burst addresses are generated
internally and are controlled by ADV. The burst address
counter may be configured to count in either linear or
interleave order with the Linear Burst Order (LBO) input. The
Burst function need not be used. New addresses can be loaded
on every cycle with no degradation of chip performance.
150 MHz–66 MHz
9 ns–18 ns
3.3 V V
DD
3.3 V and 2.5 V I/O
Flow Through/Pipeline Reads
The function of the Data Output register can be controlled by
the user via the FT mode pin/bump (Pin 14 in the TQFP, Bump
1F in the FP-BGA). Holding the FT mode pin/bump low,
places the RAM in Flow Through mode, causing output data to
bypass the Data Output Register. Holding FT high places the
RAM in Pipeline mode, activating the rising-edge-triggered
Data Output Register.
SCD Pipelined Reads
The GS82032 is an SCD (Single Cycle Deselect) pipelined
synchronous SRAM. DCD (Dual Cycle Deselect) versions are
also available. SCD SRAMs pipeline deselect commands one
stage less than read commands. SCD RAMs begin turning off
their outputs immediately after the deselect command has been
captured in the input registers.
Byte Write and Global Write
Byte write operation is performed by using Byte Write enable
(BW) input combined with one or more individual byte write
signals (Bx). In addition, Global Write (GW) is available for
writing all bytes at one time, regardless of the byte write
control inputs.
Sleep Mode
Low power (Sleep mode) is attained through the assertion
(High) of the ZZ signal, or by stopping the clock (CK).
Memory data is retained during Sleep mode.
Core and Interface Voltages
The GS82032 operates on a 3.3 V power supply and all inputs/
outputs are 3.3 V- and 2.5 V-compatible. Separate output
power (V
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
ByteSafe is a Trademark of Giga Semiconductor, Inc. (GSI Technology).
87BWIByte Write—Writes all enabled bytes; active low
93, 94BA, BBIByte Write Enable for DQA, DQB Data I/Os; active low
95, 96BC, BDIByte Write Enable for DQC, DQD Data I/Os; active low
89CKIClock Input Signal; active high
88GWIGlobal Write Enable—Writes all bytes; active low
98, 92E1, E3IChip Enable; active low
97E2IChip Enable; active high
86GIOutput Enable; active low
83ADVIBurst address counter advance enable; active low
84, 85ADSP, ADSCIAddress Strobe (Processor, Cache Controller); active low
64ZZISleep Mode control; active high
14FTIFlow Through or Pipeline mode; active low
31LBOILinear Burst Order mode; active low
15, 41, 65, 91
5,10,17, 21, 26, 40, 55, 60, 67, 71, 76, 90
4, 11, 20, 27, 54, 61, 70, 77
A2–A15IAddress Inputs
DQA1–DQA8
DQB1–DQB8
DQC1–DQC8
DQD1–DQD8
V
DD
V
SS
V
DDQ
I/OData Input and Output pins
ICore power supply
II/O and Core Ground
IOutput driver power supply
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Page 5
Linear Burst Sequence
I
Mode Pin Functions
Preliminary
GS82032T/Q-150/138/133/117/100/66
Mode Name
Burst Order ControlLBO
Output Register ControlFT
Power Down ControlZZ
Note:
There are pull-up devices on LBO and FT pins and a pull down device on the ZZ pin, so those input pins can be
unconnected and the chip will operate in the default states as specified in the above tables.
2.E = T (True) if E2 = 1 and E3 = 0; E = F (False) if E2 = 0 or E3 = 1.
3.W = T (True) and F (False) is defined in the Byte Write Truth Table preceding.
4.G is an asynchronous input. G can be driven high at any time to disable active output drivers. G low can only enable active drivers (shown
as “Q” in the Truth Table above).
5.All input combinations shown above are tested and supported. Input combinations shown in gray boxes need not be used to accomplish
basic synchronous or synchronous burst operations and may be avoided for simplicity.
6.Tying ADSP high and ADSC low allows simple non-burst synchronous operations. See BOLD items above.
7.Tying ADSP high and ADV low while using ADSC to load new addresses allows simple burst operations. See ITALIC items above.
1.The diagram shows only supported (tested) synchronous state transitions. The diagram presumes G is tied low.
2.The upper portion of the diagram assumes active use of only the Enable (E1, E2, E3) and Write (BA, BB, BC, BD, BW, and GW) control
inputs, and that ADSP is tied high and ADSC is tied low.
3.The upper and lower portions of the diagram together assume active use of only the Enable, Write, and ADSC control inputs, and
assumes ADSP is tied high and ADV is tied low.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Page 8
Simplified State Diagram with G
Preliminary
GS82032T/Q-150/138/133/117/100/66
X
Deselect
WR
W
X
First Write
W
X
Burst Write
CWCR
R
CR
R
CR
W
CW
W
CW
R
First Read
R
Burst Read
X
CRCW
X
Notes:
1.The diagram shows supported (tested) synchronous state transitions plus supported transitions that depend upon the use of G.
2.Use of “Dummy Reads” (Read Cycles with G High) may be used to make the transition from read cycles to write cycles without passing
through a deselect cycle. Dummy read cycles increment the address counter just like normal read cycles.
3.Transitions shown in gray tone assume G has been pulsed high long enough to turn the RAM’s drivers off and for incoming data to meet
Data Input Set Up Time.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Page 9
GS82032T/Q-150/138/133/117/100/66
Absolute Maximum Ratings
(All voltages reference to VSS)
SymbolDescriptionValueUnit
Preliminary
V
T
T
V
DDQ
V
V
V
I
I
OUT
P
STG
BIAS
DD
CK
I/O
IN
IN
D
Voltage on VDD Pins–0.5 to 4.6V
Voltage in V
Pins–0.5 to V
DDQ
DD
V
Voltage on Clock Input Pin–0.5 to 6V
Voltage on I/O Pins–0.5 to V
+0.5 (≤ 4.6 V max.)V
DDQ
Voltage on Other Input Pins–0.5 to VDD+0.5 (≤ 4.6 V max.)V
Input Current on Any Pin+/–20mA
Output Current on Any I/O Pin+/–20mA
Package Power Dissipation 1.5W
Storage Temperature–55 to 125
Temperature Under Bias–55 to 125
o
o
C
C
Note:
Permanent damage to the device may occur if the Absolute Maximum Ratings are exceeded. Operation should be
restricted to Recommended Operating Conditions. Exposure to conditions exceeding the Absolute Maximum Ratings,
for an extended period of time, may affect reliability of this component.
Recommended Operating Conditions
ParameterSymbolMin.Typ.Max.UnitNotes
V
V
DDQ
V
V
T
T
DD
IH
IL
3.1353.33.6V
2.3752.5
1.7—
V
DD
V
+0.3
DD
V1
V2
–0.3—0.8V2
A
A
02570°C3
–402585°C3
≤ 2.375 V (i.e., 2.5 V I/O)
DDQ
Supply Voltage
I/O Supply Voltage
Input High Voltage
Input Low Voltage
Ambient Temperature (Commercial Range Versions)
Ambient Temperature (Industrial Range Versions)
Notes:
1.Unless otherwise noted, all performance specifications quoted are evaluated for worst case at both 2.75 V ≤ V
and 3.6 V ≤ V
≤ 3.135 V (i.e., 3.3 V I/O), and quoted at whichever condition is worst case.
DDQ
2.This device features input buffers compatible with both 3.3 V and 2.5 V I/O drivers.
3.Most speed grades and configurations of this device are offered in both Commercial and Industrial Temperature ranges. The part number of
Industrial Temperature Range versions end the character “I”. Unless otherwise noted, all performance specifications quoted are evaluated
for worst case in the temperature range marked on the device.
4.Input Under/overshoot voltage must be –2 V > Vi < VDD+2 V with a pulse width not to exceed 20% tKC.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Page 10
GS82032T/Q-150/138/133/117/100/66
Undershoot Measurement and TimingOvershoot Measurement and Timing
V
IH
VDD+-2.0V
V
SS
50%
20% tKC
Preliminary
50%
VSS-2.0V
20% tKC
V
DD
V
IL
Capacitance
(TA = 25oC, f = 1 MHZ, V
DD
= 3.3 V)
ParameterSymbolTest conditionsTyp.Max.Unit
Control Input Capacitance
Input Capacitance
Output Capacitance
Note: This parameter is sample tested.
C
C
C
OUT
I
IN
V
V
DD
V
IN
OUT
= 3.3 V
= 0 V
= 0 V
34pF
45pF
67pF
Package Thermal Characteristics
RatingLayer BoardSymbolTQFP MaxQFP MaxUnitNotes
Junction to Ambient (at 200 lfm)single
Junction to Ambient (at 200 lfm)four
Junction to Case (TOP)
Notes:
1.Junction temperature is a function of SRAM power dissipation, package thermal resistance, mounting board temperature, ambient.
Temperature air flow, board density, and PCB thermal resistance.
2.SCMI G-38-87.
3.Average thermal resistance between die and top surface, MIL SPEC-883, Method 1012.1.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Parameter Test ConditionsSymbol
Operating
Current
Standby
Current
Deselect
Page 13
AC Electrical Characteristics
Preliminary
GS82032T/Q-150/138/133/117/100/66
Pipeline
Flow
Through
ParameterSymbol
-150-138-133-117-100-66
MinMaxMin MaxMinMaxMinMax MinMaxMinMax
Clock Cycle TimetKC6.6—7.25—7.5—8.5—10—12.5—ns
Clock to Output ValidtKQ—3.8—4—4—4.5—5—6ns
Clock to Output InvalidtKQX1.5—2—2—2—2—2—ns
Clock to Output in Low-Z
tLZ
1
1.5—2—2—2—2—2—ns
Clock Cycle TimetKC10.5—15—15—15—15—20—ns
Clock to Output ValidtKQ—9.0—9.7—10—11—12—18ns
Clock to Output InvalidtKQX3—3—3—3—3—3—ns
Clock to Output in Low-Z
tLZ
1
3—3—3—3—3—3—ns
Clock HIGH TimetKH1.8—1.9—1.9—2—3—4—ns
Clock LOW TimetKL1.8—1.9—1.9—2—3—4—ns
Clock to Output in High-Z
tHZ
1
1.5 3.81.541.5 41.54—5—6ns
G to Output ValidtOE—3.8—4—4—4—5—6ns
G to output in Low-Z
G to output in High-Z
tOLZ
tOHZ
1
0—0—0—0—0—0—ns
1
—4—4—4—4—5—6ns
Setup timetS1.7—2—2—2—2—2—ns
Hold timetH0.5—0.5—0.5—0.5—0.5—0.5—ns
ZZ setup time
ZZ hold time
tZZS
tZZH
2
5—5—5—5—5—5—ns
2
1—1—1—1—1—1—ns
ZZ recoverytZZR20—20—20—20—20—20—ns
Unit
Notes:
1.These parameters are sampled and are not 100% tested
2.ZZ is an asynchronous signal. However, in order to be recognized on any given clock cycle, ZZ must meet the specified setup and hold
times as specified above.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Page 19
Sleep Mode Timing Diagram
CK
tH
tS
ADSP
ADSC
ZZ
Application Tips
tKC
tKH
tKL
tZZS
~
~
~
~
~
~
~
~
~
~
~
~
Snooze
tZZH
Preliminary
GS82032T/Q-150/138/133/117/100/66
tZZR
Single and Dual Cycle Deselect
SCD devices force the use of “dummy read cycles” (read cycles that are launched normally, but that are ended with the output
drivers inactive) in a fully synchronous environment. Dummy read cycles waste performance, but their use usually assures there
will be no bus contention in transitions from reads to writes or between banks of RAMs. DCD SRAMs do not waste bandwidth on
dummy cycles, and are logically simpler to manage in a multiple bank application (wait states need not be inserted at bank address
boundary crossings), but greater care must be exercised to avoid excessive bus contention.
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Page 22
Preliminary
GS82032T/Q-150/138/133/117/100/66
Ordering Information
2
Org
64K x 32GS82032T-150Pipeline/Flow ThroughTQFP150/9C
64K x 32GS820322T-138Pipeline/Flow ThroughTQFP138/9.7C
64K x 32GS82032T-133Pipeline/Flow ThroughTQFP133/10C
64K x 32GS82032T-4Pipeline/Flow ThroughTQFP133/10C
64K x 32GS82032T-5Pipeline/Flow ThroughTQFP100/12C
64K x 32GS82032T-6Pipeline/Flow ThroughTQFP66/18C
64K x 32GS82032T-150IPipeline/Flow ThroughTQFP150/9INot Available
64K x 32GS82032T-138IPipeline/Flow ThroughTQFP138/9.7I
64K x 32GS82032T-133IPipeline/Flow ThroughTQFP133/10I
64K x 32GS82032T-4IPipeline/Flow ThroughTQFP133/10I
64K x 32GS82032T-5IPipeline/Flow ThroughTQFP100/12I
64K x 32GS82032T-6IPipeline/Flow ThroughTQFP66/18I
64K x 32GS82032Q-150Pipeline/Flow ThroughQFP150/9C
64K x 32GS82032Q-138Pipeline/Flow ThroughQFP138/9.7C
64K x 32GS82032Q-133Pipeline/Flow ThroughQFP133/10C
64K x 32GS82032Q-4Pipeline/Flow ThroughQFP133/10C
64K x 32GS82032Q-5Pipeline/Flow ThroughQFP100/12C
64K x 32GS82032Q-6Pipeline/Flow ThroughQFP66/18C
64K x 32GS82032Q-150IPipeline/Flow ThroughQFP150/9INot Available
64K x 32GS82032Q-138IPipeline/Flow ThroughQFP138/9.7I
64K x 32GS82032Q-133IPipeline/Flow ThroughQFP133/10I
64K x 32GS82032Q-4IPipeline/Flow ThroughQFP133/10I
64K x 32GS82032Q-5IPipeline/Flow ThroughQFP100/12I
64K x 32GS82032Q-6IPipeline/Flow ThroughQFP66/18I
Notes:
1.Customers requiring delivery in Tape and Reel should add the character “T” to the end of the part number. Example: GS82032T-100IT.
2.The speed column indicates the cycle frequency (MHz) of the device in Pipeline mode and the latency (ns) in Flow Through mode. Each
device is Pipeline/Flow Through mode-selectable by the user.
3.TA = C = Commercial Temperature Range. TA = I = Industrial Temperature Range.
4. GSI offers other versions this type of device in many different configurations and with a variety of different features, only some of which
are covered in this data sheet. See the GSI Technology web site(www.gsitechnology.com)for a complete listing of current offerings.