Datasheet GLT6200L08LL-85ST, GLT6200L08LL-85FG, GLT6200L08LL-70ST, GLT6200L08LL-70FG, GLT6200L08LL-55ST Datasheet (G-LINK)

...
Page 1
G-LINK
GLT6200L08
Ultra Low Power 256k x 8 CMOS SRAM
Nov 2000(Rev. 1.0)
G-Link Technology Corporation
2701 Northwestern Parkway Santa Clara, CA 95051, U.S.A.
G-Link Technology Corporation, Taiwan
- 1 -
Features : Description :
Low-power consumption.
-active: 30mA at 55ns.
-stand by : 10 µA (CMOS input / output) 2 µA (CMOS input / output, SL)
Single +2.7 to 3.3V power supply. Equal access and cycle time. 55/70/85 ns access time. 1.0V data retention mode. TTL compatible, tri-state input/output. Automatic power-down when deselected. Industrial grade (-40°C ~ 85°C)
available.
Package available: 32-sTSOP.
48Ball CSP-BGA
The GLT6200L08 is a low power CMOS Static
RAM organized as 262,144 x 8 bits. Easy memory expansion is provided by an active LOW CE1 an
active LOW OE , and Tri-state I/O’s. This device has an automatic power-down mode feature when
deselected.
Writing to the device is accomplished by taking
chip Enable 1 ( CE1 ) with Write Enable ( WE ) LOW. Reading from the device is performed by taking Chip
Enable 1 ( CE1 ) with Output Enable ( OE ) LOW while Write Enable ( WE ) and Chip Enable 2 (CE2)
is HIGH. The I/O pins are placed in a high-impedance state when the device is deselected : the outputs are disabled during a write cycle.
The GLT6200L08 comes with a 1V data retention feature and Lower Standby Power. The GLT6200L08 is available in a 32-pin sTSOP packages.
Function Block Diagram :
ROW DECODER
Cell
Array
SENSE AMP
INPUT BUFFER
COLUMN DECODER
CONTROL
CIRCUIT
OE WE CE1 CE2
I/O7
I/O1
Column Address
Row Address
Page 2
G-LINK
GLT6200L08
Ultra Low Power 256k x 8 CMOS SRAM
Nov 2000(Rev. 1.0)
G-Link Technology Corporation
2701 Northwestern Parkway Santa Clara, CA 95051, U.S.A.
G-Link Technology Corporation, Taiwan
- 2 -
Pin Configurations :
sTSOPI
GLT6200L08
A16
A7
1 2 3 4 5 6
8 9 10 11 12 13
22 21
19 18 17
26 25 24 23
GND
OE
A10
14
27
28
I/O7 I/O6
20 A0
7
WE
VCC
15 16
29
30
31
32A11 A9 A8 A13
CE2
A15
A14 A12
A6 A5
A4
A3
A2
A1
I/O0
I/O1
I/O2
I/O3
I/O4
I/O5
CE1
A17
48 Ball fpBGA :
1 2 3 4 5 6 7 8 A B C D E F G H
¡¡¡¡¡¡¡
¡
1
A0 I/O4 I/O5 VSS VCC I/O6 I/O7 A9
¡ ¡ ¡ ¡ ¡ ¡ ¡ ¡
2
A1 A2 NC NC NC NC
OE
A10
¡ ¡ ¡ ¡ ¡ ¡ ¡ ¡
3
CE2
WE
NC NC NC NC
CE
A11
¡ ¡ ¡ ¡ ¡ ¡ ¡ ¡
4
A3 A4 A5 NC NC A17 A16 A12
¡ ¡ ¡ ¡ ¡ ¡ ¡ ¡
5
A6 A7 NC NC NC NC A15 A13
¡ ¡ ¡ ¡ ¡ ¡ ¡ ¡
6
A8 I/O0 I/O1 VCC VSS I/O2 I/O3 A14
Note : NC means no Ball.
Pin Descriptions:
Name
Function
A0 – A
17
Address Inputs
CE
1
and CE2
Chip Enable Input
OE
Output Enable Input
WE
Write Enable Input
I/O0 – I/O
7
Data Input and Data Output
V
CC
3V Power Supply
GND Ground NC No Connection
Page 3
G-LINK
GLT6200L08
Ultra Low Power 256k x 8 CMOS SRAM
Nov 2000(Rev. 1.0)
G-Link Technology Corporation
2701 Northwestern Parkway Santa Clara, CA 95051, U.S.A.
G-Link Technology Corporation, Taiwan
- 3 -
Truth Table:
CE
1
WE
OE
Data Mode
HXX
High-Z
Standby
XXX
High-Z
Standby
LHL
Data Out
Active, Read
LHH
High-Z
Active, Output Disable
LLX
Data Out
Active, Write
*Key : X = Don’t Care, L = Low, H = High
Absolute Maximum Ratings*
Parameter Symbol Minimum Maximum Unit
Voltage on Any Pin Relative to Gnd Vt -0.5 Vcc+0.5 V Power Dissipation P
T
- 1.0 W
Storage Temperature (Plastic) Tstg -55 +150
°C
Temperature Under Bias Tbias -40 +85
°C
*Note : Stresses greater than those listed above Absolute Maximum Ratings may cause permanent damage to the device.
This is a stress rating only and functional operation of the device at these or any conditions outside those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
Recommended Operating Conditions ( TA = -25°C to + 85°C)
Parameter Symbol Min Typ Max Unit
V
CC
2.7 3 3.3 V
Supply Voltage
Gnd 0.0 0.0 0.0 V
V
IH
2.0 - VCC+0.2 V
Input Voltage
V
IL
-0.5* - 0.6 V
* VIL min = -1.0V for pulse width less than tRC/2.
Page 4
G-LINK
GLT6200L08
Ultra Low Power 256k x 8 CMOS SRAM
Nov 2000(Rev. 1.0)
G-Link Technology Corporation
2701 Northwestern Parkway Santa Clara, CA 95051, U.S.A.
G-Link Technology Corporation, Taiwan
- 4 -
DC Operating Characteristics ( Vcc=2.7V to 3.3V, T
A
=-25°C to + 85°C)
55 70 85
Parameter Sym. Test Conditions
Min Max Min Max Min Max
Unit
Input Leakage Current
I
LI
VCC = Max, Vin = Gnd to V
CC
1 1 1
µA
Output Leakage Current
I
LO
CE
1
=V
IH
VCC = Max, V
OUT
= Gnd to V
CC
1 1 1
µA
Operating Power Supply Current
I
CC
CE
1
=VIL ,
VIN=VIH or VIL, I
OUT
=0mA
3 3 3 mA
I
CC1
CE
1
=VIL ,
I
OUT
= 0mA,
Min Cycle, 100% Duty
30 30 25 mA
Average Operating Current
I
CC2
CE
1
=0.2V
I
OUT
= 0mA,
Cycle Time=1µs, 100% Duty
3 3 3 mA
Standby Power Supply
Current(TTL Level)
I
SB
CE
1
=V
IH
0.5 0.5 0.5 mA
10 10 10
µA
Standby Power Supply Current (CMOS Level)
I
SB1
CE
1
VCC-
0.2V or f=0 VIN 0.2V or VIN VCC-0.2V
2 2 2
µA
Output Low Voltage V
OLIOL
= 2 mA 0.4 0.4 0.4 V
Output High Voltage V
OHIOH
= -1 mA 2.4 2.4 2.4 V
Data Retention
Parameter Sym. Test Conditions Min. Max. Unit
VCC for Data retention
V
DR
1.0 - V
Data Retention Current
I
CCDR
- 2
µA
Chip Deselect to Data Retention Time
t
CDR
0 - ns
Operating Recovery Time
(2)
t
R
CE
1
VCC -0.2V or
V
IN
VCC -0.2V or
V
IN
0.2V
t
RC
- ns
Page 5
G-LINK
GLT6200L08
Ultra Low Power 256k x 8 CMOS SRAM
Nov 2000(Rev. 1.0)
G-Link Technology Corporation
2701 Northwestern Parkway Santa Clara, CA 95051, U.S.A.
G-Link Technology Corporation, Taiwan
- 5 -
Data Retention Waveform (TA = -25°C to + 85°C)
Data Retention Mode
Vcc
CE
VDR
VDR >= 1.0V
tRtCDR
2.7V
2.7V
VIH
V
IH
AC Test Conditions AC Test Loads and Waveforms
CL*
TTL
Output Load Condition *Including Scope and Jig Capacitance
CL = 30pf + 1TTL Load
Read Cycle
(3,9)
( Vcc=2.7V to 3.3V, TA =-25°C to + 85°C)
55 70 85
Unit NoteParameter Symbol
Min Max Min Max Min Max
Read Cycle Time t
RC
55 70 85 ns
Address Access Time t
AA
55 70 85 ns
Chip Enable Access Time t
ACE
55 70 85 ns
Output Enable Access Time t
OE
40 40 40 ns
Output Hold from address Change t
OH
10 10 10 ns
Chip Enable to Output in Low-Z t
CLZ
10 10 10 ns 4,5
Chip Disable to Output in High-Z t
CHZ
25 30 35 ns 4,5
Output Enable to Output in Low-Z t
OLZ
5 5 5 ns 4,5
Output Disable to Output in High-Z t
OHZ
20 25 30 ns 4,5
Power-Up Time t
PU
0 0 0 ns 5
Power-Down Time t
PD
55 70 85 ns 5
Input Pulse Levels 0.4V to 2.4V Input Rise and Fall Time Input and Output Timing Reference Level
5 ns
1.4V
Page 6
G-LINK
GLT6200L08
Ultra Low Power 256k x 8 CMOS SRAM
Nov 2000(Rev. 1.0)
G-Link Technology Corporation
2701 Northwestern Parkway Santa Clara, CA 95051, U.S.A.
G-Link Technology Corporation, Taiwan
- 6 -
Timing Waveform of Read Cycle 1
(3,6,7,9)
(Address Controlled)
DOUT
tAA tOH
tRC
Data Valid
Address
Timing Waveform of Read Cycle 2
(5,6,8,9)
( CE1 Controlled)
t
OE
t
RC
Data Valid
CE1
t
OHZ
t
CHZ
t
PD
50%
50%
t
OLZ
t
ACE
t
CLZ
t
PU
Supply Current
OE
D
OUT
I
CC
I
SB
Write Cycle
(3,11)
( Vcc=2.7V to 3.3V, TA =-25°C to + 85°C)
55 70 85
Parameter Symbol
Min Max Min Max Min Max
Unit Note
Write Cycle Time t
WC
55 70 85 ns
Chip Enable to Write End t
CW
40 60 70 ns
Address Setup to Write End t
AW
40 60 70 ns
Address Setup Time t
AS
0 0 0 ns
Write Pulse Width t
WP
40 50 60 ns
Write Recovering Time t
WR
0 0 0 ns
Data Valid to Write End t
DW
25 30 35 ns
Data Hold Time t
DH
0 0 0 ns
Write Enable to Output in High-Z t
WZ
25 30 35 ns 4,5
Output Active from Write End t
OW
5 5 5 ns 4,5
Page 7
G-LINK
GLT6200L08
Ultra Low Power 256k x 8 CMOS SRAM
Nov 2000(Rev. 1.0)
G-Link Technology Corporation
2701 Northwestern Parkway Santa Clara, CA 95051, U.S.A.
G-Link Technology Corporation, Taiwan
- 7 -
Timing Waveform of Write Cycle 1
(10,11)
( WE Controlled)
tWP
tAW
WE
tWC
tWR
tAS
t
DW
t
DH
tOW
tWZ
Data Valid
Address
DIN
DOUT
Timing Waveform of Write Cycle 2
(10,11)
( CE1 Controlled)
tAW
WE
tWC
tWR
t
DW
tDH
Data Valid
Address
DIN
tAS tCW
tWP
tWZ
CE1
DOUT
Page 8
G-LINK
GLT6200L08
Ultra Low Power 256k x 8 CMOS SRAM
Nov 2000(Rev. 1.0)
G-Link Technology Corporation
2701 Northwestern Parkway Santa Clara, CA 95051, U.S.A.
G-Link Technology Corporation, Taiwan
- 8 -
Notes :
1. L-version includes this feature.
2. This Parameter is samples and not 100% tested.
3. For test conditions, see AC Test Condition.
4. This parameter is tested with CL = 5pF. Transition is measured ± 500mV from steady – state voltage.
5. This parameter is guaranteed, but is not tested.
6. WE is HIGH for read cycle.
7. CE1 and OE are LOW and for read cycle.
8. Address valid prior to or coincident with CE1 transition LOW .
9. All read cycle timings are referenced from the last valid address to the first transition address.
10. CE1 or WE must be HIGH during address transition.
11. All write cycle timings are referenced from the last valid address to the first transition address.
Page 9
G-LINK
GLT6200L08
Ultra Low Power 256k x 8 CMOS SRAM
Nov 2000(Rev. 1.0)
G-Link Technology Corporation
2701 Northwestern Parkway Santa Clara, CA 95051, U.S.A.
G-Link Technology Corporation, Taiwan
- 9 -
Ordering Information
Part Number SPEED POWER PACKAGE
GLT6200L08LL-55 ST
55ns
Normal
sTSOPI 32L
GLT6200L08LL-70 ST
70ns
Normal
sTSOPI 32L
GLT6200L08LL-85 ST
85ns
Normal
sTSOPI 32L
GLT6200L08SL-55 ST
55ns
Normal
sTSOPI 32L
GLT6200L08SL-70 ST
70ns
Normal
sTSOPI 32L
GLT6200L08SL-85 ST
85ns
Normal
sTSOPI 32L
GLT6200L08LLI-55 ST
55ns
Normal
sTSOPI 32L
GLT6200L08LLI-70 ST
70ns
Normal
sTSOPI 32L
GLT6200L08LLI-85 ST
85ns
Normal
sTSOPI 32L
GLT6200L08SLI-55 ST
55ns
Normal
sTSOPI 32L
GLT6200L08SLI-70 ST
70ns
Normal
sTSOPI 32L
GLT6200L08SLI-85 ST
85ns
Normal
sTSOPI 32L
GLT6200L08LL-55 FG
55ns
Normal
fpBGA-48L
GLT6200L08LL-70 FG
70ns
Normal
fpBGA-48L
GLT6200L08LL-85 FG
85ns
Normal
fpBGA-48L
GLT6200L08SL-55 FG
55ns
Normal
fpBGA-48L
GLT6200L08SL-70 FG
70ns
Normal
fpBGA-48L
GLT6200L08SL-85 FG
85ns
Normal
fpBGA-48L
GLT6200L08LLI-55 FG
55ns
Normal
fpBGA-48L
GLT6200L08LLI-70 FG
70ns
Normal
fpBGA-48L
GLT6200L08LLI-85 FG
85ns
Normal
fpBGA-48L
GLT6200L08SLI-55 FG
55ns
Normal
fpBGA-48L
GLT6200L08SLI-70 FG
70ns
Normal
fpBGA-48L
GLT6200L08SLI-85 FG
85ns
Normal
fpBGA-48L
Page 10
G-LINK
GLT6200L08
Ultra Low Power 256k x 8 CMOS SRAM
Nov 2000(Rev. 1.0)
G-Link Technology Corporation
2701 Northwestern Parkway Santa Clara, CA 95051, U.S.A.
G-Link Technology Corporation, Taiwan
- 10 -
Parts Numbers (Top Mark) Definition :
GLT 6 200 L 08 LL I - 55 TS
4 : DRAM 6 : Standard SRAM 7 : Cache SRAM 8 : Synchronous Burst SRAM
-SRAM
064 : 64K 256 : 256K 512 : 512K 100 : 1M
-DRAM
10 : 1M(C/EDO)* 11 : 1M(C/FPM)* 12 : 1M(H/EDO)* 13 : 1M(H/FPM)* 20 : 2M(EDO) 21 : 2M(FPM) 40 : 4M(EDO) 41 : 4M(FPM) 80 : 8M(EDO) 81 : 8M(FPM) *See note
VOLTAGE
Blank : 5V L : 3.3V M : 2.5V N : 2.1V
CONFIG.
04 : x04 08 : x08 16 : x16 32 : x32
SPEED
-SRAM
10 : 10ns 12 : 12ns 15 : 15ns 20 : 20ns 70 : 70ns
-DRAM
35 : 35ns 40 : 40ns 45 : 45ns 50 : 50ns 60 : 60ns
PACKAGE
T : PDIP(300mil) TS : TSOP(Type I) ST : sTSOP (Type I) TC : TSOP(Type ll) PL : PLCC FA : 300mil SOP FB : 330mil SOP FC : 445mil SOP J3 : 300mil SOJ J4 : 400mil SOJ P : PDIP(600mil) Q : PQFP TQ : TQFP FG : 48-fpBGA
LL : Low Low power L : Low power SL : Super Low power
I : Industrial Temperature
Page 11
G-LINK
GLT6200L08
Ultra Low Power 256k x 8 CMOS SRAM
Nov 2000(Rev. 1.0)
G-Link Technology Corporation
2701 Northwestern Parkway Santa Clara, CA 95051, U.S.A.
G-Link Technology Corporation, Taiwan
- 11 -
Package Information
32 pin 8x13.4mm Small Outline J-form Package (sTSOP)
Page 12
G-LINK
GLT6200L08
Ultra Low Power 256k x 8 CMOS SRAM
Nov 2000(Rev. 1.0)
G-Link Technology Corporation
2701 Northwestern Parkway Santa Clara, CA 95051, U.S.A.
G-Link Technology Corporation, Taiwan
- 12 -
GLT6200L08 fpBGA
ABCDEFGH
1 2 3 4 5 6
OOOOOOOO OOOOOOOO OOOOOOOO OOOOOOOO OOOOOOOO OOOOOOOO
PACKAGE OUTLINE DWG.
SYMBOL UNIT : MM
A 1.10±0.1
A1 0.22±0.05
b 0.35
C 0.36TYP D 8.00±0.10
D1 5.25
E 6.00±0.10
E1 3.75
e 0.75TYP
aaa 0.10
aaa
b
Loading...