• HIGH PERFORMANCE E2CMOS® TECHNOLOGY
— 3.5 ns Maximum Propagation Delay
— Fmax = 250 MHz
— 2.5 ns Maximum from Clock Input to Data Output
— UltraMOS
— TTL-Compatible Balanced 8mA Output Drive
• 3.3V LOW VOL TAGE 20V8 ARCHITECTURE
— JEDEC-Compatible 3.3V Interface Standard
— 5V Compatible Inputs
• ACTIVE PULL-UPS ON ALL PINS
2
CELL TECHNOLOGY
•E
— Reconfigurable Logic
— Reprogrammable Cells
— 100% Tested/100% Y ields
— High Speed Electrical Erasure (<100ms)
— 20 Year Data Retention
• EIGHT OUTPUT LOGIC MACROCELLS
— Maximum Flexibility for Complex Logic Designs
— Programmable Output Polarity
• PRELOAD AND POWER-ON RESET OF ALL REGISTERS
— 100% Functional Testability
• APPLICATIONS INCLUDE:
— Glue Logic for 3.3V Systems
— DMA Control
— State Machine Control
— High Speed Graphics Processing
— Standard Logic Speed Upgrade
• ELECTRONIC SIGNA TURE FOR IDENTIFICATION
®
Advanced CMOS Technology
Functional Block Diagram
I/CLK
I
I
I
I
I
(64 X 40)
I
AND-ARRAY
PROGRAMMABLE
I
I
I
I
8
8
8
8
8
8
8
8
IMUX
OLMC
OLMC
OLMC
OLMC
OLMC
OLMC
OLMC
OLMC
IMUX
I
CLK
I/O/Q
I/O/Q
I/O/Q
I/O/Q
I/O/Q
I/O/Q
I/O/Q
I/O/Q
OE
I
I/OE
Description
The GAL20LV8D, at 3.5 ns maximum propagation delay time,
provides the highest speed performance available in the PLD
market. The GAL20LV8D is manufactured using Lattice
Semiconductor's advanced 3.3V E2CMOS process, which combines CMOS with Electrically Erasable (E
2
) floating gate technology.
High speed erase times (<100ms) allow the devices to be reprogrammed quickly and efficiently .
The generic architecture provides maximum design flexibility by
allowing the Output Logic Macrocell (OLMC) to be configured by
the user. An important subset of the many architecture configurations possible with the GAL20L V8D are the P AL
architectures listed
in the table of the macrocell description section. GAL20LV8D
devices are capable of emulating any of these P AL architectures
with full function/fuse map compatibility .
Unique test circuitry and reprogrammable cells allow complete AC,
DC, and functional testing during manufacture. As a result, Lattice
Semiconductor delivers 100% field programmability and functionality of all GAL products. In addition, 100 erase/write cycles and
data retention in excess of 20 years are specified.
The following discussion pertains to configuring the output logic
macrocell. It should be noted that actual implementation is accomplished by development software/hardware and is completely transparent to the user.
There are three global OLMC configuration modes possible:
simple, complex, and registered. Details of each of these modes
is illustrated in the following pages. T wo global bits, SYN and AC0,
control the mode configuration for all macrocells. The XOR bit of
each macrocell controls the polarity of the output in any of the three
modes, while the AC1 bit of each of the macrocells controls the input/output configuration. These two global and 16 individual architecture bits define all possible configurations in a GAL20LV8D . The
information given on these architecture bits is only to give a better understanding of the device. Compiler software will transparently set these architecture bits from the pin definitions, so the user
should not need to directly manipulate these architecture bits.
The following is a list of the P AL architectures that the GAL20L V8D
can emulate. It also shows the OLMC mode under which the
devices emulate the PAL architecture.
Software compilers support the three different global OLMC modes
as different device types. These device types are listed in the table
below. Most compilers have the ability to automatically select the
device type, generally based on the register usage and output
enable (OE) usage. Register usage on the device forces the software to choose the registered mode. All combinatorial outputs with
OE controlled by the product term will force the software to choose
the complex mode. The software will choose the simple mode only
when all outputs are dedicated combinatorial without OE control.
The different device types listed in the table can be used to override
the automatic device selection by the software. For further details,
refer to the compiler software manuals.
When using compiler software to configure the device, the user
must pay special attention to the following restrictions in each mode.
In registered mode pin 2 and pin 16 are permanently configured
as clock and output enable, respectively . These pins cannot be configured as dedicated inputs in the registered mode.
In complex mode pin 2 and pin 16 become dedicated inputs and
use the feedback paths of pin 26 and pin 18 respectively . Because
of this feedback path usage, pin 26 and pin 18 do not have the
feedback option in this mode.
In simple mode all feedback paths of the output pins are routed
via the adjacent pins. In doing so, the two inner most pins ( pins
21 and 23) will not have the feedback option as these pins are
always configured as dedicated combinatorial output.
1
2
"Simple"
P20V8C
1
2
3
GAL20V8A
P20V8A
G20V8
1) Used with Configuration keyword.
2) Prior to Version 2.0 support.
3) Supported on Version 1.20 or later.
3
Page 4
Registered Mode
Specifications GAL20LV8
In the Registered mode, macrocells are configured as dedicated
registered outputs or as I/O functions.
Architecture configurations available in this mode are similar to the
common 20R8 and 20RP4 devices with various permutations of
polarity , I/O and register placement.
All registered macrocells share common clock and output enable
control pins. Any macrocell can be configured as registered or I/
O. Up to eight registers or up to eight I/Os are possible in this mode.
CLK
DQ
XOR
OE
Q
Dedicated input or output functions can be implemented as subsets of the I/O function.
Registered outputs have eight product terms per output. I/Os have
seven product terms per output.
The JEDEC fuse numbers, including the User Electronic Signature
(UES) fuses and the Product T erm Disable (PTD) fuses, are shown
on the logic diagram on the following page.
Registered Configuration for Registered Mode
- SYN=0.
- AC0=1.
- XOR=0 defines Active Low Output.
- XOR=1 defines Active High Output.
- AC1=0 defines this output configuration.
- Pin 2 controls common CLK for the registered outputs.
- Pin 16 controls common OE for the registered outputs.
- Pin 2 & Pin 16 are permanently configured as CLK &
OE for registered output configuration.
Combinatorial Configuration for Registered Mode
- SYN=0.
- AC0=1.
- XOR=0 defines Active Low Output.
- XOR=1 defines Active High Output.
- AC1=1 defines this output configuration.
XOR
Note: The development software configures all of the architecture control bits and checks for proper pin usage automatically.
- Pin 2 & Pin 16 are permanently configured as CLK &
OE for registered output configuration.
4
Page 5
Registered Mode Logic Diagram
Specifications GAL20LV8
PLCC Package Pinout
2
41612802024283236
3
0000
0280
4
0320
0600
5
0640
0920
6
0960
1240
7
1280
1560
9
PTD
2640
OLMC
XOR-2560
AC1-2632
OLMC
XOR-2561
AC1-2633
OLMC
XOR-2562
AC1-2634
OLMC
XOR-2563
AC1-2635
OLMC
XOR-2564
AC1-2636
27
26
25
24
23
21
10
11
12
13
64-USER ELECTRONIC SIGNATURE FUSES
2568, 2569, .... .... 2630, 2631
Byte7 Byte6 .... .... Byte1 Byte0
MSB LSB
1600
1880
1920
2200
2240
2520
2703
OLMC
XOR-2565
AC1-2637
OLMC
XOR-2566
AC1-2638
OLMC
XOR-2567
AC1-2639
SYN-2704
AC0-2705
OE
20
19
18
17
16
5
Page 6
Complex Mode
Specifications GAL20LV8
In the Complex mode, macrocells are configured as output only or
I/O functions.
Architecture configurations available in this mode are similar to the
common 20L8 and 20P8 devices with programmable polarity in
each macrocell.
Up to six I/Os are possible in this mode. Dedicated inputs or outputs
can be implemented as subsets of the I/O function. The two outer
most macrocells (pins 18 & 26) do not have input capability . De-
XOR
signs requiring eight I/Os can be implemented in the Registered
mode.
All macrocells have seven product terms per output. One product
term is used for programmable output enable control. Pins 2 and
16 are always available as data inputs into the AND array.
The JEDEC fuse numbers including the UES fuses and PTD fuses
are shown on the logic diagram on the following page.
Combinatorial I/O Configuration for Complex Mode
- SYN=1.
- AC0=1.
- XOR=0 defines Active Low Output.
- XOR=1 defines Active High Output.
- AC1=1.
- Pin 19 through Pin 25 are configured to this function.
Combinatorial Output Configuration for Complex Mode
- SYN=1.
- AC0=1.
- XOR=0 defines Active Low Output.
XOR
Note: The development software configures all of the architecture control bits and checks for proper pin usage automatically.
- XOR=1 defines Active High Output.
- AC1=1.
- Pin 18 and Pin 26 are configured to this function.
6
Page 7
Complex Mode Logic Diagram
2
41612802024283236
3
Specifications GAL20LV8
PLCC Package Pinout
2640
PTD
27
0000
0280
4
0320
0600
5
0640
0920
6
0960
1240
7
1280
1560
9
1600
1880
10
OLMC
XOR-2560
AC1-2632
OLMC
XOR-2561
AC1-2633
OLMC
XOR-2562
AC1-2634
OLMC
XOR-2563
AC1-2635
OLMC
XOR-2564
AC1-2636
OLMC
XOR-2565
AC1-2637
26
25
24
23
21
20
11
12
13
MSB LSB
1920
2200
2240
2520
64-USER ELECTRONIC SIGNATURE FUSES
2568, 2569, .... .... 2630, 2631
Byte7 Byte6 .... .... Byte1 Byte0
7
2703
OLMC
XOR-2566
AC1-2638
OLMC
XOR-2567
AC1-2639
19
18
17
16
SYN-2704
AC0-2705
Page 8
Simple Mode
Specifications GAL20LV8
In the Simple mode, pins are configured as dedicated inputs or as
dedicated, always active, combinatorial outputs.
Architecture configurations available in this mode are similar to the
common 14L8 and 16P6 devices with many permutations of generic output polarity or input choices.
All outputs in the simple mode have a maximum of eight product
terms that can control the logic. In addition, each output has programmable polarity .
Vcc
XOR
Pins 2 and 16 are always available as data inputs into the AND
array . The "center" two macrocells (pins 21 & 23) cannot be used
in the input configuration.
The JEDEC fuse numbers including the UES fuses and PTD fuses
are shown on the logic diagram on the following page.
Combinatorial Output with Feedback Configuration
for Simple Mode
- SYN=1.
- AC0=0.
- XOR=0 defines Active Low Output.
- XOR=1 defines Active High Output.
- AC1=0 defines this configuration.
- All OLMC except pins 21 & 23 can be configured to
this function.
Combinatorial Output Configuration for Simple Mode
Vcc
XOR
Note: The development software configures all of the architecture control bits and checks for proper pin usage automatically.
- SYN=1.
- AC0=0.
- XOR=0 defines Active Low Output.
- XOR=1 defines Active High Output.
- AC1=0 defines this configuration.
- Pins 21 & 23 are permanently configured to this
function.
Dedicated Input Configuration for Simple Mode
- SYN=1.
- AC0=0.
- XOR=0 defines Active Low Output.
- XOR=1 defines Active High Output.
- AC1=1 defines this configuration.
- All OLMC except pins 21 & 23 can be configured to
this function.
8
Page 9
Simple Mode Logic Diagram
2
3
Specifications GAL20LV8
PLCC Package Pinout
41612802024283236
2640
PTD
27
0000
0280
4
0320
0600
5
0640
0920
6
0960
1240
7
1280
1560
9
1600
1880
10
OLMC
XOR-2560
AC1-2632
OLMC
XOR-2561
AC1-2633
OLMC
XOR-2562
AC1-2634
OLMC
XOR-2563
AC1-2635
OLMC
XOR-2564
AC1-2636
OLMC
XOR-2565
AC1-2637
26
25
24
23
21
20
1920
2200
11
2240
2520
12
13
2703
OLMC
XOR-2566
AC1-2638
OLMC
XOR-2567
AC1-2639
19
18
17
16
64-USER ELECTRONIC SIGNATURE FUSES
2568, 2569, .... .... 2630, 2631
Byte7 Byte6 .... .... Byte1 Byte0
SYN-2704
AC0-2705
MSB LSB
9
Page 10
Specifications GAL20LV8
Absolute Maximum Ratings
(1)
Supply voltage VCC................................... –0.5 to +4.6V
Input voltage applied ................................ –0.5 to +5.6V
I/O voltage applied ................................... –0.5 to +4.6V
Off-state output voltage applied ............... –0.5 to +4.6V
Recommended Operating Conditions
Commercial Devices:
Ambient T emperature (TA) ...............................0 to 75°C
Supply voltage (VCC)
with Respect to Ground ......................... +3.0 to +3.6V
Storage Temperature ................................–65 to 150°C
Ambient Temperature with
Power Applied........................................ –55 to 125°C
1.Stresses above those listed under the “Absolute Maximum
Ratings” may cause permanent damage to the device. These
are stress only ratings and functional operation of the device at
these or at any other conditions above those indicated in the
operational sections of this specification is not implied (while
programming, follow the programming specifications).
DC Electrical Characteristics
Over Recommended Operating Conditions (Unless Otherwise Specified)
3
SYMBOLPARAMETERCONDITIONMIN.TYP.
MAX.UNITS
VILInput Low VoltageVss – 0.3—0.8V
VIHInput High V oltage2.0—5.25V
I/O High Voltage2.0—Vcc+0.5V
1
IIL
Input or I/O Low Leakage Current0V ≤ VIN≤ VIL (MAX.)——–100µA
IIHInput or I/O High Leakage Current(Vcc-0.2)V ≤ VIN ≤ VCC——10µA
Input High Leakage CurrentVcc ≤ VIN ≤ 5.25V——10µA
I/O High Leakage CurrentVcc ≤ VIN ≤ 4.6V——20mA
VOLOutput Low VoltageIOL = MAX. Vin = VIL or VIH——0.4V
IOL = 500µA Vin = VIL or VIH——0.2V
VOHOutput High VoltageIOH = MAX. Vin = VIL or VIH2.4——V
1) The leakage current is due to the internal pull-up resistor on all pins. See Input Buffer section for more information.
2) One output at a time for a maximum duration of one second. Vout = 0.5V was selected to avoid test problems caused by tester
ground degradation. Characterized but not 100% tested.
3) T ypical values are at Vcc = 3.3V and TA = 25 °C
10
Page 11
AC Switching Characteristics
Specifications GAL20LV8
Over Recommended Operating Conditions
COM
-5
MIN. MAX.
-7
MIN. MAX.
UNITSPARAMETER
tpd
tco
tcf
COMCOM
TEST
COND
2
2
3
AInput or I/O to Combinational Output13.51517.5ns
AClock to Output Delay12.51315ns
—Clock to Feedback Delay—2—2—3ns
DESCRIPTION
1
.
-3
MIN. MAX.
tsu—Setup Time, Input or Feedback before Clock ↑3—4—5—ns
th—Hold Time, Input or Feedback after Clock↑0—0—0—ns
2) Minimum values for tpd and tco are not 100% tested but established by characterization.
3) Calculated from fmax with internal feedback. Refer to fmax Descriptions section.
4) Refer to fmax Descriptions section. Characterized but not 100% tested.
Capacitance (TA = 25°C, f = 1.0 MHz)
SYMBOLPARAMETERTYPICALUNITSTEST CONDITIONS
C
I
C
I/O
Input Capacitance5pFVCC = 3.3V , VI = 0V
I/O Capacitance5pFVCC = 3.3V , V
I/O
= 0V
11
Page 12
(
)
Switching Waveforms
Specifications GAL20LV8
INPUT or
I/O FEEDBACK
COMBINATIONAL
OUTPUT
INPUT or
I/O FEEDBACK
COMBINATIONAL
OUTPUT
VALID INPUT
t
pd
INPUT or
I/O FEEDBACK
CLK
REGISTERED
OUTPUT
VALID INPUT
su
t
t
t
1/
f
max
(external fdbk)
h
co
Registered OutputCombinatorial Output
OE
dis
t
en
t
REGISTERED
OUTPUT
dis
t
en
t
OE to Output Enable/DisableInput or I/O to Output Enable/Disable
CLK
wh
t
1/fmax
w/o fb
wl
t
CLK
REGISTERED
FEEDBACK
1/fmax (internal fdbk)
cf
t
su
t
Clock Width
fmax with Feedback
12
Page 13
fmax Descriptions
Specifications GAL20LV8
CLK
LOGIC
ARRAY
t
su
REGISTER
t
co
fmax with External Feedback 1/(tsu+tco)
Note: fmax with external feedback is calculated from measured
tsu and tco.
CLK
LOGIC
ARRAY
t
su + th
REGISTER
fmax with No Feedback
Note: fmax with no feedback may be less than 1/(twh + twl). This
is to allow for a clock duty cycle of other than 50%.
CLK
LOGIC
ARRAY
REGISTER
t
cf
t
pd
fmax with Internal Feedback 1/(tsu+tcf)
Note: tcf is a calculated value, derived by subtracting tsu from
the period of fmax w/internal feedback (tcf = 1/fmax - tsu). The
value of tcf is used primarily when calculating the delay from
clocking a register to a combinatorial output (through registered
feedback), as shown above. For example, the timing from clock
to a combinatorial output is equal to tcf + tpd.
Switching Test Conditions
Input Pulse LevelsGND to 3.0V
Input Rise and Fall Times1.5ns 10% – 90%
Input Timing Reference Levels1.5V
Output Timing Reference Levels1.5V
Output LoadSee Figure
TEST POINT
FROM OUTPUT (O/Q)
UNDER TEST
*CL includes test fixture and probe capacitance.
Output Load Conditions (see figure)
Test ConditionR
A50Ω35pF
BHigh Z to Active High at 1.9V50Ω35pF
High Z to Active Low at 1.0V50Ω35pF
CActive High to High Z at 1.9V50Ω35pF
Active Low to High Z at 1.0V50Ω35pF
+1.45V
0
= 50Ω, CL = 35pF*
Z
1CL
R
1
13
Page 14
Specifications GAL20LV8
Electronic Signature
An electronic signature is provided in every GAL20L V8D device.
It contains 64 bits of reprogrammable memory that can contain user
defined data. Some uses include user ID codes, revision numbers,
or inventory control. The signature data is always available to the
user independent of the state of the security cell.
NOTE: The electronic signature is included in checksum calculations. Changing the electronic signature will alter the checksum.
Security Cell
A security cell is provided in the GAL20LV8D devices to prevent
unauthorized copying of the array patterns. Once programmed,
this cell prevents further read access to the functional bits in the
device. This cell can only be erased by re-programming the device, so the original configuration can never be examined once this
cell is programmed. The Electronic Signature is always available
to the user, regardless of the state of this control cell.
Latch-Up Protection
GAL20LV8D devices are designed with an on-board charge pump
to negatively bias the substrate. The negative bias minimizes the
potential of latch-up caused by negative input undershoots.
Device Programming
GAL devices are programmed using a Lattice Semiconductorapproved Logic Programmer, available from a number of manufacturers. Complete programming of the device takes only a few
seconds. Erasing of the device is transparent to the user, and is
done automatically as part of the programming cycle.
Output Register Preload
When testing state machine designs, all possible states and state
transitions must be verified in the design, not just those required
in the normal machine operations. This is because, in system
operation, certain events occur that may throw the logic into an
illegal state (power-up, line voltage glitches, brown-outs, etc.). To
test a design for proper treatment of these conditions, a way must
be provided to break the feedback paths, and force any desired (i.e.,
illegal) state into the registers. Then the machine can be sequenced
and the outputs tested for correct next state conditions.
GAL20L V8D devices include circuitry that allows each registered
output to be synchronously set either high or low. Thus, any present
state condition can be forced for test sequencing. If necessary,
approved GAL programmers capable of executing text vectors
perform output register preload automatically .
Input Buffers
GAL20LV8D devices are designed with TTL level compatible input
buffers. These buffers have a characteristically high impedance,
and present a much lighter load to the driving logic than bipolar TTL
devices.
The GAL20L V8D input and I/O pins have built-in active pull-ups.
As a result, unused inputs and I/Os will float to a TTL “high”
(logical “1”). Lattice Semiconductor recommends that all unused
inputs and tri-stated I/O pins be connected to another active input,
VCC, or Ground. Doing this will tend to improve noise immunity
and reduce ICC for the device.
T ypical Input Pull-up Characteristic
0
-10
-20
-30
-40
-50
-60
Input Current (µA)
-70
-80
0
0.5
1
1.5
Input Voltage (V)
2
2.5
3
3.5
4
14
Page 15
Power-Up Reset
Specifications GAL20LV8
Vcc
CLK
INTERNAL REGISTER
Q - OUTPUT
FEEDBACK/EXTERNAL
OUTPUT REGISTER
Vcc (min.)
Circuitry within the GAL20L V8D provides a reset signal to all registers during power-up. All internal registers will have their Q outputs
set low after a specified time (
tpr, 1µs MAX). As a result, the state
on the registered output pins (if they are enabled) will always be
high on power-up, regardless of the programmed polarity of the
output pins. This feature can greatly simplify state machine design
by providing a known state on power-up. Because of the asynchronous nature of system power-up, some conditions must be met to
Input/Output Equivalent Schematics
t
su
t
wl
t
pr
Internal Register
Reset to Logic "0"
Device P in
Reset to Logic "1"
provide a valid power-up reset of the device. First, the V
CC rise must
be monotonic. Second, the clock input must be at static TTL level
as shown in the diagram during power up. The registers will reset within a maximum of
tpr time. As in normal system operation,
avoid clocking the device until all input and feedback path setup
times have been met. The clock must also meet the minimum pulse
width requirements.
PIN
ESD
Protection
Circuit
PIN
Typ. V ref = Vcc
ESD
Protection
Circuit
Active Pull-up
Circuit
Vcc
Vref
T ypical Input
Vcc
Vcc
Feedback
Tri-State
Control
Data
Output
Typ. V ref = Vcc
Active Pull-up
Circuit
Vcc
Vref
Feedback
(To Input Buffer)
T ypical Output
PIN
PIN
15
Page 16
Typical AC and DC Characteristic Diagrams
Specifications GAL20LV8
Normalized Tpd vs Vcc
1.2
1.1
1
0.9
Normalized Tpd
0.8
3.003.153.303.453.60
Supply Voltage (V)
Normalized Tpd vs Temp
1.2
1.1
1
0.9
Normalized Tpd
0.8
PT H->L
PT L->H
-55 -250255075 100 125
Temperature (deg. C)
PT H->L
PT L->H
Normalized Tco vs Vcc
1.2
1.1
1
0.9
Normalized Tco
0.8
3.003.153.303.453.60
Supply Voltage (V)
Normalized Tco vs Temp
1.2
1.1
1
0.9
Normalized Tco
0.8
-55 -250255075 100 125
RISE
FALL
Temperature (deg. C)
RISE
FALL
Normalized Tsu vs Vcc
1.2
1.1
1
0.9
Normalized Tsu
0.8
3.003.153.303.453.60
PT H->L
PT L->H
Supply Voltage (V)
Normalized Tsu vs Temp
1.2
1.1
1
0.9
Normalized Tsu
0.8
PT H->L
PT L->H
-55 -25025 5075 100 125
Temperature (deg. C)
Delta Tpd vs # of Outputs
Switching
0
-0.1
-0.2
-0.3
-0.4
Delta Tpd (ns)
-0.5
12345678
Number of Outputs Switching
Delta Tpd vs Output
Loading
18
14
10
6
2
Delta Tpd (ns)
-2
-6
050100150200250 300
RISE
FALL
Output Loading (pF)
RISE
FALL
Delta Tco vs # of Outputs
Switching
0
-0.1
-0.2
-0.3
-0.4
Delta Tco (ns)
-0.5
12345678
Number of Outputs Switching
Delta Tco vs Output Loading
16
12
8
4
0
Delta Tco (ns)
-4
050100150200250 300
RISE
FALL
Output Loading (pF)
RISE
FALL
16
Page 17
Typical AC and DC Characteristic Diagrams
Specifications GAL20LV8
Vol vs Iol
1
0.75
0.5
Vol (V)
0.25
0
0.00 5.00 10.00 15.00 20.00 25.00 30.00
Iol (mA)
Normalized Icc vs Vcc
1.20
1.10
1.00
0.90
Normalized Icc
0.80
3.003.153.303.453.60
Supply Voltage (V)
Voh vs Ioh
3
2.5
2
1.5
Voh (V)
1
0.5
0
0.00 5.00 10.00 15.00 20.00 25.00 30.00
Ioh(mA)
Normalized Icc vs Temp
1.2
1.1
1
0.9
Normalized Icc
0.8
-55 -25025 5075 100 125
Temperature (deg. C)
Voh vs Ioh
3
2.95
2.9
Voh (V)
2.85
2.8
0.001.002.003.004.00
Ioh(mA)
Normalized Icc vs Freq.
1.40
1.30
1.20
1.10
1.00
Normalized Icc
0.90
0.80
0255075100
Frequency (MHz)
Delta Icc vs Vin (1 input)
10
8
6
4
Delta Icc (mA)
2
0
0.00 0.50 1.00 1.50 2.00 2.50 3.00 3.50 4.00
Vin (V)
Input Clamp (Vik)
0
5
10
15
20
25
Iik (mA)
30
35
40
-2.00-1.50-1.00-0.500.00
Vik (V)
17
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