This 2 port repeater is designed for high speed interco nnects utilizing Low Voltage Differential Signaling (LVDS)
technology. The FIN1102 accepts and outputs LVDS levels
with a typical differential output swing of 330 mV which provides low EMI at ultr a low power dissipation even at high
frequencies. The FIN1102 provides a V
coupling on the inputs. In addition the FIN1102 can also
directly accept LVPECL, HSTL, and SSTL-2 for translat ion
to LVDS.
reference for AC
BB
Features
■ Greater than 800 Mbps full differential path
■ 3.3V power supply operation
■ 3.5 ps maximum random jitter and 135 ps maximum
deterministic jitter
■ Wide rail-to-rail common mode range
■ LVDS receiver inputs accept LVPECL, HSTL, and
SSTL-2 directly
■ Ultra low power consumption
■ 20 ps typical channel-to-chann el skew
■ Power off protection
■
> 7 kV HBM ESD Protection
■ Meets or exceeds the TIA/EIA-644-A LVDS standard
Absolute Maximum Ratings(Note 1)Recommended Operating
Supply Voltage (VCC)−0.5V to +4.6V
FIN1102
LVDS DC Input Voltage (V
LVDS DC Output Voltage (V
Driver Short Circuit Current (I
Storage Temperature Range (T
Max Junction Temperature (T
Lead Temperature (T
Supply Voltage (V
Magnitude of Differential
Voltage (|V
Common Mode Voltage
Range (V
Operating Temperature (T
°C
Note 1: The “Absolute Maximum Ratings”: are those values beyond which
damage to the device may occur. The databook specifications should be
met, without exception, to ensure that the system design is reliable over its
power supply, temperatur e and output/input loading va riables. Fairchild
does not recommend operation of circu it s o ut s ide databook specific ation.
)3.0V to 3.6V
CC
|)100 mV to V
ID
)(0V + |VID|/2) to (VCC − |VID|/2)
IC
)−40°C to +85°C
A
DC Electrical Characteristics
SymbolParameterTest Conditions
V
Differential Input Threshold HIGH See Figure 1; VIC =+0.05V, +1.2V, or VCC − 0.05V100mV
TH
V
Differential Input Threshold LOW See Figure 1; VIC =+0.05V, +1.2V, or VCC − 0.05V−100mV
TL
V
Input HIGH Voltage (EN)2.0V
IH
V
Input LOW Voltage (EN)GND0.8V
IL
V
Output Differential Voltage250330450mV
OD
∆V
ODVOD
V
OS
∆V
OS
I
OS
I
IN
I
OFF
I
CCZ
I
CC
I
OZ
V
IC
C
IN
C
OUT
V
BB
Note 2: All typical values are at TA = 25°C and with VCC = 3.3V .
Magnitude Change from
Differential LOW-to-HIGHRL = 100 Ω, Driver Enabled,
Offset VoltageSee Figure 21.1251.231.375V
Offset Magnitude Change from
Differential LOW-to-HIGH
Short Circuit Output CurrentD
Input Current (EN, D
Power Off Input or Output Current VCC = 0V, VIN or V
Disabled Power Supply CurrentDrivers Disabled47mA
Power Supply CurrentDrivers Enabled, Any Valid Input Con dition16.723mA
Disabled Output Leakage Current Driver Disabled, D
Common Mode Voltage Range|VID| = 100 mV to V
Input CapacitanceEnable Input2.5
Over supply voltage and operating temperature ranges, unless otherwise specified
SymbolParameterTest Conditions
t
Differential Output Propagation Delay
PLHD
LOW-to-HIGH
t
t
t
t
t
t
t
f
t
Differential Output Propagation Delay
PHLD
HIGH-to-LOWR
Differential Output Rise Time (20% to 80%) |VID| = 200 mV to 450 mV,0.290.40.58ns
TLHD
Differential Output Fall Time (80% to 20%) VIC = |VID|/2 to VCC − (|VID|/2),0.290.40.58ns
THLD
Pulse Skew |t
SK(P)
,Channel-to-Channel SkewSee Figure 3 and Figure 40.02
SK(LH)
(Note 4)0.02
SK(HL)
Part-to-Part Skew (Note 5)0.5ns
SK(PP)
Maximum Frequency (Note 6)(Note 7)400800MHz
MAX
Differential Output Enable Time
PZHD
- t
|Duty Cycle = 50%,0.020.2ns
PLH
PHL
= 100 Ω, CL = 5 pF,
L
from Z to HIGH
t
Differential Output Enable Time
PZLD
from Z to LOWRL = 100 Ω, CL = 5 pF,
t
Differential Output Disable TimeSee Figure 5 and Figure 6
PHZD
from HIGH to Z
t
Differential Output Disable Time
PLZD
from LOW to Z
t
LVDS Data Jitter,|VID| = 300 mV, PRBS = 223 - 1,
DJ
DeterministicVIC = 1.2V at 800 Mbps
t
LVDS Clock Jitter,|VID| = 300 mV,
RJ
Random (RMS)VIC = 1.2V at 400 MHz
Note 3: All typical values are at TA = 25°C and with VCC = 3.3V, VID = 300 mV, VIC = 1.2V, unless otherwise specifie d.
Note 4: t
tion.
Note 5: t
direction (either Low-to-HIGH or HIGH-to-LOW) when both devices operate with the same supply voltage, same temperature, and have identical test circuits.
Note 6: Passing criteria for maximum frequency is the output V
Note 7: Output loading is transm is sion line environment only; C
, t
SK(LH)
SK(PP)
is the skew between spe cifi ed out puts of a sing le dev ice whe n the ou tput s have iden tical lo ads an d ar e switch ing in the sam e direc-
SK(HL)
is the magnitude of th e difference i n differential p ropagation delay time s between i dentical ch annels of tw o devices switching in the same
> 200 mV and the duty cycle is 45% to 55% with all channels switching.
OD
is < 1 pF of stray test fixture capacitance.
L
MinTypMax
(Note 3)
Units
0.751.11.75ns
0.751.11.75ns
0.15ns
2.35ns
2.55ns
1.65ns
1.95ns
85135ps
2.13.5ps
FIN1102
FIGURE 1. Differential Receiver Voltage Definitions and
Propagation and Transition Time Test Circuit
FIGURE 2. Differential Driver DC Test Circuit
Note A: All LVDS input pulses hav e f requency = 10 MHz, tR or
<= 0.5 ns
t
F
includes all probe and test fixture capacitances
Note B: C
L
FIGURE 3. Differential Driver Propagation Delay
and Transition Time Test Circuit
3www.fairchildsemi.com
Page 4
FIN1102
Note A: All input pulses have freq uency = 10MHz, tR or tF <= 2 ns
includes all probe and test fixture capacit ances
Note B: C
L
FIGURE 5. Differential Driver Enable and Disable Circuit
FIGURE 4. AC Waveform
FIGURE 6. Enable and Disable AC Waveforms
www.fairchildsemi.com4
Page 5
FIN1 102 LVDS 2 Port High Speed Repeater
14-Lead Thin Shrin k Small Ou tlin e Pack age (TSSOP), JEDEC MO-153, 4.4mm Wide
Fairchild does not assume any responsibility for use of any circuitry described , no circuit patent licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support de vices o r syst ems are dev ic es or syste ms
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provide d in the l abe ling, can be reasonably expected to result in a significant injury to the
user.
Package Number MTC14
2. A critica l com ponen t in any compo nent o f a l ife supp ort
device or system whose failure to perform can be reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
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