5V Logic Level feedback signal of the drain to source
voltage. Multiple devices can be wired “OR’d” to a single
monitoring circuit input.
Gate Drive Disable Input. Multiple devices controllable by
a single disable transistor.
Qualified to AEC Q101
Applications
Automotive Injector Driver
Solenoid Driver
Source 1
Branding Dash
General Description
This dual N-Channel MOSFET provides added functions as
compared to a conventional Power MOSFET. These are: 1.
A drain to source voltage feedback signal and 2. A gate
drive disable control function that previously required
external discrete circuitry. Including these functions within
the MOSFET saves printed circuit board space. The drain to
source voltage feedback function provides a 5V level output
whenever the drain to source voltage is above 62V. This can
monitor the time an inductive load takes to dissipate its
stored energy. Multiple feedback signals can be wired
“OR’d” together to a single input of the monitoring circuit.
The gate disable function allows the device to be turned off
independent of the drive signal on the gate. This function
permits a second control circuit the ability to deactivate the
load if necessary. It can also be wired “OR’d” allowing
multiple devices to be controlled by a single open collector /
drain control transistor.
2. 55oC/W measured using FR-4 board with 0.50 in2 (323 mm2) copper pad at 1 second.
3. 180oC/W measured using FR-4 board with 0.027 in2 (17.4 mm2) copper pad at 1000 seconds.
4. 200oC/W measured using FR-4 board with 0.006 in2 (3.87 mm2) copper pad at 1000 seconds.
This product has been designed to meet the extreme test conditions and environment demanded by the automotive industry. For a
All Fairchild Semiconductor products are manufactured, assembled and tested under ISO9000 and QS9000 quality systems
FDSS2407 Rev. A
copy of the requirements, see AEC Q101 at: http://www.aecouncil.com/
certification.
3
www.fairchildsemi.com
Page 4
Typical Characteristics T
= 25°C unless otherwise noted
A
FDSS2407 N-Channel Dual MOSFET
1.2
1.0
0.8
0.6
0.4
0.2
POWER DISSIPATION MULTIPLIER
0
0255075100150
125
TA, AMBIENT TEMPERATURE (oC)
Figure 1. Normalized Power Dissipation vs
Ambient Temperature
2
DUTY CYCLE - DESCENDING ORDER
0.5
1
0.2
0.1
0.05
0.02
0.01
0.1
, NORMALIZED
θJA
Z
THERMAL IMPEDANCE
0.01
-5
10
-4
10
-3
10
10
t, RECTANGULAR PULSE DURATION (s)
SINGLE PULSE
-2
4
VGS = 10V
3
2
, DRAIN CURRENT (A)
D
I
1
R
θJA
0
255075100125150
VGS = 5V
= 55oC/W
TA, AMBIENT TEMPERATURE (oC)
Figure 2. Maximum Continuous Drain Current vs
Ambient Temperature
R
= 55oC/W
θJA
P
DM
t
1
t
θJA
10
x R
2
2
+ T
θJA
A
2
3
10
NOTES:
DUTY FACTOR: D = t1/t
PEAK TJ = PDM x Z
-1
10
0
10
1
10
200
100
, PEAK CURRENT (A)
10
DM
I
3
-5
10
FDSS2407 Rev. A
VGS = 10V
Figure 3. Normalized Maximum Transient Thermal Impedance
TA = 25oC
FOR TEMPERATURES
ABOVE 25
CURRENT AS FOLLOWS:
I = I25
1
10
10
TRANSCONDUCTANCE
MAY LIMIT CURRENT
IN THIS REGION
VGS = 5V
-4
R
= 55oC/W
θJA
-3
10
-2
10
-1
10
0
10
t, PULSE W IDTH (s)
Figure 4. Peak Current Capability
4
o
C DERATE PEAK
150 - T
A
125
2
10
www.fairchildsemi.com
3
10
Page 5
FDSS2407 N-Channel Dual MOSFET
Typical Characteristics (Continued) T
100
10
OPERATION IN THIS
1
, DRAIN CURRENT (A)
D
I
0.1
AREA MAY BE
LIMITED BY r
SINGLE PULSE
TJ = MAX RATED
TA = 25oC
110
DS(ON)
R
θJA
VDS, DRAIN TO SOURCE VOLTAGE (V)
Figure 5. Forward Bias Safe Operating Area
15
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
V
= 15V
DD
10
TJ = 25oC
100µs
1ms
10ms
= 55oC/W
= 25°C unless otherwise noted
A
10
STARTING TJ = 150oC
, AVALANCHE CURRENT (A)
If R = 0
AS
I
tAV = (L)(IAS)/(1.3*RATED BV
If R ≠ 0
tAV = (L/R)ln[(IAS*R)/(1.3*RATED BV
1
100
0.010.11
NOTE: Refer to Fairchild Application Notes AN7514 and AN7515
Figure 6. Unclamped Inductive Switching
15
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
TA = 25oC
10
VGS = 10V
STARTING TJ = 25oC
- VDD)
DSS
- VDD) +1]
DSS
tAV, TIME IN AVALANCHE (ms)
Capability
10
VGS = 5V
VGS = 3.5V
5
, DRAIN CURRENT (A)
D
I
TJ = 150oC
0
1.52.02.53.03.54.04.5
VGS, GATE TO SOURCE VOLTAGE (V)
TJ = -55oC
Figure 7. Transfer CharacteristicsFigure 8. Saturation Characteristics
240
210
ID = 3.3A
180
150
, DRAIN TO SOURCE
ON RESISTANCE (mΩ)
DS(ON)
r
120
ID = 1A
90
246810
VGS, GATE TO SOURCE VOLTAGE (V)
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
Figure 9. Drain to Source On Resistance vs Gate
Voltage and Drain Current
5
, DRAIN CURRENT (A)
D
I
0
00.51.01.52.02.5
VDS, DRAIN TO SOURCE VOLTAGE (V)
2.0
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
1.5
1.0
ON RESISTANCE
NORMALIZED DRAIN TO SOURCE
0.5
-80-4004080120160
TJ, JUNCTION TEMPERATURE (oC)
VGS = 3V
VGS = 10V, ID = 3.3A
Figure 10. Normalized Drain to Source On
Resistance vs Junction Temperature
FDSS2407 Rev. A
5
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Page 6
FDSS2407 N-Channel Dual MOSFET
Typical Characteristics (Continued) T
1.2
1.0
0.8
NORMALIZED GATE
THRESHOLD VOLTAGE
0.6
-80-4004080120160
TJ, JUNCTION TEMPERATURE (oC)
VGS = VDS, ID = 250µA
= 25°C unless otherwise noted
A
Figure 11. Normalized Gate Threshold Voltage vs
Junction Temperature
6
FBK voltage measured across
a 51KΩ load resistor.
5
4
3
2
FBK, FEEDBACK VOLTAGE (V)
1
0
TJ = 25oC
203040506070
TJ = 150oC
TJ = -55oC
VDS, DRAIN TO SOURCE VOLTAGE (V)
1.2
ID = 5mA
1.1
1.0
BREAKDOWN VOLTAGE
NORMALIZED DRAIN TO SOURCE
0.9
-80-4004080120160
TJ, JUNCTION TEMPERATURE (oC)
Figure 12. Normalized Drain to Source
Breakdown Voltage vs Junction Temperature
1000
C
= CGS + C
ISS
C
≅ C
OSS
100
C, CAPACITANCE (pF)
V
= 0V, f = 75kHz
GS
10
0.1
VDS, DRAIN TO SOURCE VOLTAGE (V)
110
DS
C
= C
RSS
GD
+ C
GD
GD
20
Figure 13. Feedback Voltage vs Drain to Source
Voltage
500
400
300
200
, DRAIN TO SOURCE
ON RESISTANCE (mΩ)
DS(ON)
r
100
0
12345
V
, GATE DISABLE VOLTAGE (V)
DIS
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
VGS = 5V, ID = 3A
TJ = 150oC
TJ = 25oC
TJ = -55oC
Figure 15. Drain to Source On Resistance vs
Gate Disable Voltage
FDSS2407 Rev. A
Figure 14. Capacitance vs Drain to Source
Voltage
10
TJ = 150oC
8
TJ = 25oC
6
4
, GATE TO SOURCE
GS
VOLTAGE
V
2
0
012345
TJ = -55oC
V
, GATE DISABLE VOLTAGE (V)
DIS
Figure 16. Gate to Source Voltage vs Gate
Disable Voltage
6
VGS = V
DS
ID = 250µA
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Page 7
FDSS2407 N-Channel Dual MOSFET
Typical Characteristics (Continued) T
10
VDD = 30V
8
6
4
2
, GATE TO SOURCE VOLTAGE (V)
GS
V
0
02468
Figure 17. Gate Charge Waveforms for Constant Gate Currents
Test Circuits and Waveforms
V
DS
L
VAR Y tP TO OBTAIN
REQUIRED PEAK I
V
GS
AS
R
G
DUT
= 25°C unless otherwise noted
A
WAVEFORMS IN
DESCENDING ORDER:
ID = 3.3A
ID = 1A
Qg, GATE CHARGE (nC)
+
V
DD
-
BV
DSS
t
P
I
AS
V
DS
V
DD
t
0V
P
I
AS
0.01Ω
0
t
AV
Figure 18. Unclamped Energy Test CircuitFigure 19. Unclamped Energy Waveforms
V
DS
R
I
g(REF)
L
V
GS
+
V
DD
-
DUT
V
DD
V
0
I
g(REF)
GS
= 1V
Q
g(TOT)
V
DS
V
GS
Q
gs2
Q
g(TH)
Q
gs
Q
gd
0
Figure 20. Gate Charge Test CircuitFigure 21. Gate Charge Waveforms
V
= 5V
GS
FDSS2407 Rev. A
7
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Page 8
Test Circuits and Waveforms (Continued)
FDSS2407 N-Channel Dual MOSFET
V
DS
R
L
V
GS
R
GS
V
GS
DUT
+
V
DD
-
V
DS
0
V
GS
10%
0
t
d(ON)
90%
t
ON
50%
10%
t
r
PULSE WIDTH
t
d(OFF)
Figure 22. Switching Time Test CircuitFigure 23. Switching Time Waveforms
V
DS
+
LM324
-
NC
V
DISABLE
DUT
90%
t
OFF
t
f
90%
10%
50%
FDSS2407 Rev. A
Figure 24. Gate to Source Voltage vs Gate Disable Voltage
8
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Page 9
Thermal Resistance vs. Mounting Pad Area
The maximum rated junction temperature, TJM, and the
thermal resistance of the heat dissipating path determines
the maximum allowable device power dissipation, P
application. Therefore the application’s ambient
temperature, T
must be reviewed to ensure that T
Equation 1 mathematically represents the relationship and
(oC), and thermal resistance R
A
is never exceeded.
JM
DM
θJA
, in an
(oC/W)
serves as the basis for establishing the rating of the part.
P
-------------------------------=
DM
TJMTA–()
R
θJA
(EQ. 1)
In using surface mount devices such as the SO8 package,
the environment in which it is applied will have a significant
influence on the part’s current and maximum power
dissipation ratings. Precise determination of P
and influenced by many factors:
is complex
DM
1. Mounting pad area onto which the device is attached and
whether there is copper on one side or both sides of the
board.
2. The number of copper layers and the thickness of the
board.
3. The use of external heat sinks.
4. The use of thermal vias.
5. Air flow and board orientation.
6. For non steady state applications, the pulse width, the
duty cycle and the transient thermal response of the part,
the board and the environment they are in.
Fairchild provides thermal information to assist the
designer’s preliminary application evaluation. Figure 25
defines the R
copper (component side) area. This is for a horizontally
for the device as a function of the top
θJA
positioned FR-4 board with 1oz copper after 1000 seconds
of steady state power with no air flow. This graph provides
the necessary information for calculation of the steady state
junction temperature or power dissipation. Pulse
applications can be evaluated using the Fairchild device
Spice thermal model or manually utilizing the normalized
160
COPPER BOARD AREA - DESCENDING ORDER
2
0.020 in
2
0.140 in
2
0.257 in
, THERMAL
qJA
Z
C/W)
o
IMPEDANCE (
120
80
40
0.380 in
0.493 in
2
2
maximum transient thermal impedance curve.
Thermal resistances corresponding to other copper areas
can be obtained from Figure 25 or by calculation using
Equation 2. The area, in square inches is the top copper
area including the gate and source pads.
R
The transient thermal impedance (Z
varied top copper board area. Figure 26 shows the effect of
copper pad area on single pulse transient thermal
impedance. Each trace represents a copper pad area in
square inches corresponding to the descending list in the
graph. Spice and SABER thermal models are provided for
each of the listed pad areas.
Copper pad area has no perceivable effect on transient
thermal impedance for pulse widths less than 100ms. For
pulse widths less than 100ms the transient thermal
impedance is determined by the die and package.
Therefore, CTHERM1 through CTHERM5 and RTHERM1
through RTHERM5 remain constant for each of the thermal
models. A listing of the model component values is available
in Table 1.
Note: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global
Temperature Options; IEEE Power Electronics Specialist Conference Records, 1991, written by William J. Hepp and C. Frank
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not
intended to be an exhaustive list of all such trademarks.
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY
PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY
LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN;
NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
FDSS2407 N-Channel Dual MOSFET
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR
CORPORATION.
As used herein:
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the body,
or (b) support or sustain life, or (c) whose failure to perform
when properly used in accordance with instructions for use
provided in the labeling, can be reasonably expected to
result in significant injury to the user.
2. A critical component is any component of a life support
device or system whose failure to perform can be
reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet IdentificationProduct StatusDefinition
Advance InformationFormative or In
Design
PreliminaryFirst ProductionThis datasheet contains preliminary data, and
No Identification NeededFull ProductionThis datasheet contains final specifications. Fairchild
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
ObsoleteNot In ProductionThis datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. I15
FDSS2407 Rev. A
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