This P-Channel MOSFET is a rugged gate version of
Fairchild Semiconductor’s advanced PowerTrench
process. It has been optimized for power management
applications with a wide range of gate drive voltage
(2.5V – 12V).
Applications
• Load switch
• Motor drive
• DC/DC conversion
• Power management
D1
D
D1
D
D2
D
D2
D
SO-8
Pin 1
SO-8
S2
Absolute Maximum RatingsT
G1
G
S1
S
G2
S
S
o
=25
A
C unless otherwise noted
Features
• –5 A, –20 V, R
R
• Extended V
• Low gate charge
• High performance trench technology for extremely
low R
• High power and current handling capability
DS(ON)
GSS
5
6
7
8
= 55 mΩ @ VGS = –4.5 V
DS(ON)
= 90 mΩ @ VGS = –2.5 V
DS(ON)
range (±12V) for battery applications
4
Q1
Q2
3
2
1
Symbol Parameter Ratings Units
V
Drain-Source Voltage
DSS
V
Gate-Source Voltage
GSS
ID Drain Current – Continuous (Note 1a)– Pulsed
PD
TJ, T
STG
Power Dissipation for Dual Operation 2
Power Dissipation for Single Operation (Note 1a)1.6
(Note 1b)(Note 1c)
Operating and Storage Junction Temperature Range –55 to +175
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics
BV
Drain–Source Breakdown Voltage
DSS
∆BVDSS
∆T
I
Zero Gate Voltage Drain Current
DSS
I
Gate–Body Leakage
GSS
Breakdown Voltage Temperature
Coefficient
J
V
= 0 V, ID = –250 µA
GS
I
= –250 µA, Referenced to 25°C
D
= –16 V, VGS = 0 V –1
V
DS
= ±12 V, VDS = 0 V ±100 nA
V
GS
–20 V
–12
mV/°C
µA
On Characteristics (Note 2)
–0.
V
Gate Threshold Voltage
GS(th)
∆VGS(th)
∆TJ
R
DS(on)
Gate Threshold Voltage
Temperature Coefficient
Static Drain–Source
On–Resistance
I
On–State Drain Current
D(on)
V
= VGS, ID = –250 µA
DS
I
= –250 µA, Referenced to 25°C
D
V
= –4.5 V, ID = –3.2 A
GS
= –2.5 V, ID = –1.0 A
V
GS
= –4.5 V, VDS = –5 V –16 A
V
GS
6 –0.8 –1.2V
3
44
72
55
90
mV/°C
mΩ
gFS Forward Transconductance VDS = –9 V, ID = –3.4 A 8 S
Dynamic Characteristics
= –10 V, V
V
C
Input Capacitance 825 pF
iss
C
Output Capacitance 420 pF
oss
C
Reverse Transfer Capacitance
rss
DS
f = 1.0 MHz
= 0 V,
GS
150 pF
Switching Characteristics (Note 2)
= –10 V, ID = –1 A,
V
t
Turn–On Delay Time 16 40 ns
d(on)
tr Turn–On Rise Time 46 80 ns
t
Turn–Off Delay Time 40 70 ns
d(off)
tf Turn–Off Fall Time
Qg Total Gate Charge 10 20 nC
Qgs Gate–Source Charge 2.1 nC
Qgd Gate–Drain Charge
DD
= –4.5 V, R
V
GS
= –6 V, ID = –3.2A,
V
DS
V
= –4.5 V
GS
GEN
= 6 Ω
25 40 ns
3.3 nC
Drain–Source Diode Characteristics and Maximum Ratings
IS Maximum Continuous Drain–Source Diode Forward Current
VSD Drain–Source Diode Forward
VGS = 0 V, IS = –2.0 A (Note 2)–0.7 –1.2 V
Voltage
Notes:
1. R
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of
Figure 9. Maximum Safe Operating Area. Figure 10. Single Pulse Maximum
Power Dissipation.
1
D = 0.5
0.2
R
(t) = r(t) * R
θJA
R
θJA
= 135oC/W
0.1
t
1
t
0.01
r(t), NORMALIZED EFFECTIVE
0.001
TRANSIENT THERMAL RESISTANCE
0.00010.0010.010.11101001000
t
, TIME (sec)
1
2
- TA = P * R
T
J
Duty Cycle, D = t
Figure 11. Transient Thermal Response Curve.
Thermal characterization performed using the conditions described in Note 1c.
Transient thermal response will change depending on the circuit board design.
θJA
(t)
θJA
/ t
1
2
FDS9933 Rev C
Page 5
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not
intended to be an exhaustive list of all such trademarks.
ACEx™
ActiveArray™
Bottomless™
Build it Now™
CoolFET™
CROSSVOLT™
DOME™
EcoSPARK™
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS
HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE
APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER
ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S
WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.
®
UniFET™
UltraFET
VCX™
Wire™
®
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR
SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or syste ms are devices or syst ems which,
(a) are intended for surgical implant into the body, or (b) support or
sustain life, or (c) wh ose failure to perform when properly used in
accordance with instructions for use provided in the labeling, can be
reasonably expected to result in significant injury to the user.
2. A critical component is any component of a life support device or
system whose failure to perform can be reasonably expected to
cause the failure of the life support device or system, or to affect its
safety or effectiveness.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet IdentificationProduct StatusDefinition
Advance InformationFormative or In DesignThis datasheet contains the design specifications for
PreliminaryFirst ProductionThis datasheet contains preliminary data, and
No Identification NeededFull ProductionThis datasheet contains final specifications. Fairchild
ObsoleteNot In ProductionThis datasheet contains specifications on a product
product development. Specifications may change in
any manner without notice.
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice to improve
design.
Semiconductor reserves the right to make changes at
any time without notice to improve design.
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. I20
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