Datasheet FDS8978 Datasheet (Fairchild)

Page 1
FDS8978 N-Channel PowerTrench
30V, 7.5A, 18mΩ
®
MOSFET
FDS8978 Dual N-Channel PowerTrench
January 2011
Features
r
r
High performance trench technology for extremely low
Low gate charge
High power and current handling capability
100% Rg Tested
RoHS Compliant
= 18mΩ, V
DS(on)
= 21mΩ, V
DS(on)
r
DS(on)
SO-8
MOSFET Maximum Ratings T
Symbol Parameter Ratings Units
V
DSS
V
GS
I
D
E
AS
P
D
, T
T
J
STG
= 10V, ID = 7.5A
GS
= 4.5V, ID = 6.9A
GS
D2
D2
D1
D1
G2
G1
Pin 1
Drain to Source Voltage 30 V
Gate to Source Voltage ±20 V
Drain Current
Continuous (T
Continuous (T
Pulsed 49 A
Single Pulse Avalanche Energy (Note 1) 57 mJ
Power dissipation 1.6 W
Derate above 25
Operating and Storage Temperature -55 to 150
= 25oC, VGS = 10V, R
A
= 25oC, VGS = 4.5V, R
A
o
C13mW/
= 25°C unless otherwise noted
A
θJA
θJA
General Description
This N-Channel MOSFET has been designed specifically to improve the overall efficiency of DC/DC converters using either synchronous or conventional switching PWM controllers. It has been optimized for low gate charge, low r
and fast switching speed.
DS(on)
Applications
DC/DC converters
D2
5
6
D2
D1
D1
= 50oC/W)
= 50oC/W) 6.9 A
7
8
Q2
Q1
7.5 A
4
3
2
1
G2
G1
o
®
MOSFET
o
C
C
Thermal Characteristics
R
θJC
R
θJA
R
θJA
Thermal Resistance, Junction to Case (Note 2) 40
Thermal Resistance, Junction to Ambient (Note 2a) 78
Thermal Resistance, Junction to Ambient (Note 2c) 135
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
FDS8978 FDS8978 SO-8 330mm 12mm 2500 units
©2011 Fairchild Semiconductor Corporation FDS8978 Rev. B1
1
o
C/W
o
C/W
o
C/W
www.fairchildsemi.com
Page 2
FDS8978 Dual N-Channel PowerTrench
Electrical Characteristics T
= 25°C unless otherwise noted
J
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics
B
VDSS
I
DSS
I
GSS
Drain to Source Breakdown Voltage ID = 250µA, VGS = 0V 30 - - V
V
= 24V - - 1
Zero Gate Voltage Drain Current
DS
= 0V TJ = 150oC - - 250
V
GS
Gate to Source Leakage Current VGS = ±20V - - ±100 nA
On Characteristics
V
GS(TH)
r
DS(on)
Gate to Source Threshold Voltage VGS = VDS, ID = 250µA 1.2 - 2.5 V
ID = 7.5A, VGS = 10V - 14 18
Drain to Source On Resistance
ID = 6.9A, VGS = 4.5V - 17 21
I
= 7.5A, VGS = 10V,
D
TJ = 150oC
- 22 29
Dynamic Characteristics
C
ISS
C
OSS
C
RSS
R
G
Q
g(TOT)
Q
g(5)
Q
gs
Q
gs2
Q
gd
Input Capacitance
Output Capacitance - 191 - pF
Reverse Transfer Capacitance - 11 2 - pF
VDS = 15V, VGS = 0V, f = 1MHz
- 907 1270 pF
Gate Resistance VGS = 0.5V, f = 1MHz - 1.2 4.0 Ω
Total Gate Charge at 10V VGS = 0V to 10V
Total Gate Charge at 5V VGS = 0V to 5V - 9 14 nC
VDD = 15V ID = 7.5A
- 17 26 nC
Gate to Source Gate Charge - 2.3 - nC
Gate Charge Threshold to Plateau - 1.5 - nC
Gate to Drain “Miller” Charge - 3.3 - nC
µA
mΩ
®
MOSFET
Switching Characteristics (V
t
ON
t
d(ON)
t
r
t
d(OFF)
t
f
t
OFF
Turn-On Time
Turn-On Delay Time - 7 10.5 ns
Rise Time - 37 55.5 ns
Turn-Off Delay Time - 48 72 ns
Fall Time - 24 36 ns
Turn-Off Time - 72 108 ns
GS
= 10V)
- 44 66 ns
VDD = 15V, ID = 7.5A VGS = 10V, RGS = 16Ω
Drain-Source Diode Characteristics
I
= 7.5A - - 1.25 V
V
SD
t
rr
Q
RR
Notes:
1: Starting TJ = 25°C, L = 1mH, IAS = 7.5A, VDD = 30V, VGS = 10V. 2: R
θJA
drain pins. R
a) 78°C/W when mounted on a 0.5 in
b) 125°C/W when mounted on a 0.02 in2 pad of 2 oz copper. c) 135°C/W when mounted on a minimun pad.
Source to Drain Diode Voltage
Reverse Recovery Time ISD = 7.5A, dISD/dt = 100A/µs - 19 25 ns
Reverse Recovered Charge ISD = 7.5A, dISD/dt = 100A/µs - 10 13 nC
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the
is guaranteed by design while R
θJC
2
pad of 2 oz copper.
is determined by the user’s board design.
θJA
SD
I
= 2.1A - - 1.0 V
SD
©2011 Fairchild Semiconductor Corporation FDS8978 Rev. B1
www.fairchildsemi.com2
Page 3
FDS8978 Dual N-Channel PowerTrench
Typical Characteristics T
1.2
1.0
0.8
0.6
0.4
0.2
POWER DISSIPATION MULTIPLIER
0
0 25 50 75 100 150
TA, AMBIENT TEMPERATURE (oC)
Figure 1.
Normalized Power Dissipation vs
= 25°C unless otherwise noted
J
Ambient Temperature
2
1
θJA
Z
0.1
DUTY CYCLE-DESCENDING ORDER
D = 0.5
0.2
0.1
0.05
0.02
0.01
125
8
7
6
5
V
= 10V
GS
4
V
= 4.5V
3
, DRAIN CURRENT (A)
2
D
I
1
R
= 78oC/W
θJA
0
25 50 75 100 125 150
, AMBIENT TEMPERATURE (
T
A
Figure 2.
Maximum Continuous Drain Current vs
GS
Ambient Temperature
o
C)
®
MOSFET
NORMALIZED THERMAL
IMPEDANCE,
0.001
1000
, PEAK TRANSIENT POWER (W)
(PK)
P
0.01
100
10
0.5
SINGLE PULSE
R
= 135oC/W
θJA
-4
10
-3
10
Figure 3.
-2
10
t, RECTANGULAR PULSE DURATION (s)
-1
10
0
10
1
10
Normalized Maximum Transient Thermal Impedance
VGS = 10V
2
10
SINGLE PULSE
R
= 135oC/W
θJA
= 25oC
T
A
3
10
1
-4
10
-3
10
Figure 4.
-2
10
-1
10
t, PULSE WIDTH (s)
0
10
10
Single Pulse Maximum Power Dissipation
1
2
10
3
10
©2011 Fairchild Semiconductor Corporation FDS8978 Rev. B1
www.fairchildsemi.com3
Page 4
Typical Characteristics T
= 25°C unless otherwise noted
J
FDS8978 Dual N-Channel PowerTrench
100
If R = 0 tAV = (L)(IAS)/(1.3*RATED BV
If R ≠ 0
= (L/R)ln[(IAS*R)/(1.3*RATED BV
t
AV
10
, AVALANCHE CURRENT (A)
AS
I
1
STARTING TJ = 150oC
0.01 0.1 1 10 100
tAV, TIME IN AVALANCHE (ms)
- VDD)
DSS
- VDD) +1]
DSS
STARTING TJ = 25oC
NOTE: Refer to Fairchild Application Notes AN7514 and AN7515
Figure 5.
Unclamped Inductive Switching
Capability
50
PULSE DURATION = 80µs DUTY CYCLE = 0.5%MAX
40
30
20
, DRAIN CURRENT (A)
10
D
I
VGS = 10V
VGS = 5V
VGS = 4.5V
VGS = 3.5V
VGS = 3V
50
PULSE DURATION = 80µs DUTY CYCLE = 0.5%MAX
40
V
= 5V
DS
30
20
, DRAIN CURRENT (A)
10
D
I
0
12345
50
40
30
20
, DRAIN TO SOURCE
ON RESISTANCE (mW)
DS(ON)
r
10
TJ = 25oC
TJ = 150oC
VGS, GATE TO SOURCE VOLTAGE (V)
Figure 6.
ID = 10.2A
ID = 1A
TJ = -55oC
Transfer Characteristics
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
®
MOSFET
0
0.0 0.2 0.4 0.6 0.8 1.0
VDS, DRAIN TO SOURCE VOLTAGE (V)
Figure 7. Saturation Characteristics
1.6 PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
1.4
1.2
ON RESISTANCE
1.0
NORMALIZED DRAIN TO SOURCE
0.8
-80 -40 0 40 80 120 160
Figure 9.
TJ, JUNCTION TEMPERATURE (oC)
Normalized Drain to Source On
Resistance vs Junction Temperature
©2011 Fairchild Semiconductor Corporation FDS8978 Rev. B1
VGS = 10V, ID = 10.2A
0
246810
Figure 8.
1.2
1.0
0.8
NORMALIZED GATE
THRESHOLD VOLTAGE
0.6
-80 -40 0 40 80 120 160
Figure 10.
, GATE TO SOURCE VOLTAGE (V)
V
GS
Drain to Source On Resistance vs Gate
Voltage and Drain Current
VGS = VDS, ID = 250µA
TJ, JUNCTION TEMPERATURE (oC)
Normalized Gate Threshold Voltage vs
Junction Temperature
www.fairchildsemi.com4
Page 5
FDS8978 Dual N-Channel PowerTrench
Typical Characteristics T
1.10 ID = 250µA
1.05
1.00
0.95
BREAKDOWN VOLTAGE
NORMALIZED DRAIN TO SOURCE
0.90
-80 -40 0 40 80 120 160
T
, JUNCTION TEMPERATURE (oC)
J
Figure 11.
Normalized Drain to Source
= 25°C unless otherwise noted
J
Breakdown Voltage vs Junction Temperature
10
VDD = 15V
8
6
4
2
, GATE TO SOURCE VOLTAGE (V)
GS
V
0
0369121518
Qg, GATE CHARGE (nC)
WAVEF OR MS IN DESCENDING ORDER:
ID = 7.5A
= 1A
I
D
2000
C
= CGS + C
1000
C
= C
RSS
GD
C, CAPACITANCE (pF)
V
= 0V, f = 1MHz
GS
10
0.1 1 10
Figure 12.
VDS, DRAIN TO SOURCE VOLTAGE (V)
Capacitance vs Drain to Source
ISS
C
≅ C
OSS
DS
Voltage
60
10
1
, DRAIN CURRENT (A)
D
I
0.1
0.01
THIS AREA IS LIMITED BY r
DS(on)
SINGLE PULSE
= MAX RATED
T
J
o
= 125
θJA
A
= 25
C/W
o
C
R
T
0.01 0.1 1 10 100
VDS, DRAIN to SOURCE VOLTAGE (V)
+ C
GD
GD
100us
100ms
30
®
MOSFET
1ms
10ms
1s
10s
DC
Figure 13.
Gate Charge Waveforms for Constant
Gate Currents
©2011 Fairchild Semiconductor Corporation FDS8978 Rev. B1
Figure 14. Forward Bias Safe Operating Area
www.fairchildsemi.com5
Page 6
Test Circuits and Waveforms
FDS8978 Dual N-Channel PowerTrench
VAR Y t
TO OBTAIN
P
REQUIRED PEAK I
V
GS
t
0V
P
Figure 15.
I
g(REF)
V
DS
L
0.01Ω
+
V
DD
-
0
R
AS
G
DUT
I
AS
Unclamped Energy Test Circuit Figure 16.
V
DS
L
V
GS
DUT
+
V
DD
-
V
DD
V
0
I
g(REF)
0
GS
= 1V
BV
DSS
t
P
I
AS
t
AV
Unclamped Energy Waveforms
Q
g(TOT)
V
DS
Q
Q
gs2
Q
g(TH)
Q
gs
g(5)
Q
gd
V
GS
VGS = 5V
V
DS
V
DD
®
V
= 10V
GS
MOSFET
Figure 17.
V
GS
Figure 19.
©2011 Fairchild Semiconductor Corporation FDS8978 Rev. B1
Gate Charge Test Circuit Figure 18.
V
GS
R
GS
Switching Time Test Circuit Figure 20.
Gate Charge Waveforms
V
DS
R
DUT
L
+
V
DD
-
V
DS
0
V
GS
10%
0
t
d(ON)
90%
t
ON
50%
10%
t
r
PULSE WIDTH
t
d(OFF)
90%
t
OFF
50%
t
f
90%
10%
Switching Time Waveforms
www.fairchildsemi.com6
Page 7
Thermal Resistance vs. Mounting Pad Area
The maximum rated junction temperature, TJM, and the thermal resistance of the heat dissipating path determines the maximum allowable device power dissipation, P application. Therefore the application’s ambient temperature, T must be reviewed to ensure that T Equation 1 mathematically represents the relationship and
(oC), and thermal resistance R
A
is never exceeded.
JM
DM
θJA
, in an
(oC/W)
serves as the basis for establishing the rating of the part.
P
TJMTA–()
--------------------------- ----=
DM
R
θJA
(EQ. 1)
In using surface mount devices such as the SO8 package, the environment in which it is applied will have a significant influence on the part’s current and maximum power dissipation ratings. Precise determination of P and influenced by many factors:
is complex
DM
1. Mounting pad area onto which the device is attached and whether there is copper on one side or both sides of the board.
2. The number of copper layers and the thickness of the board.
3. The use of external heat sinks.
4. The use of thermal vias.
5. Air flow and board orientation.
6. For non steady state applications, the pulse width, the duty cycle and the transient thermal response of the part, the board and the environment they are in.
Fairchild provides thermal information to assist the design­er’s preliminary application evaluation. Figure 21 defines the R
for the device as a function of the top copper (compo-
θJA
nent side) area. This is for a horizontally positioned FR-4 board with 1oz copper after 1000 seconds of steady state power with no air flow. This graph provides the necessary in formation for calculation of the steady state junction temper­ature or power dissipation. Pulse applications can be evaluated using the Fairchild device Spice thermal model or manually utilizing the normalized
150
COPPER BOARD AREA - DESCENDING ORDER
2
0.04 in
2
0.28 in
120
C/W)
o
90
, THERMAL
60
θJA
Z
IMPEDANCE (
30
0.52 in
0.76 in
1.00 in
2
2
2
maximum transient
thermal impedance curve.
Thermal resistances corresponding to other copper areas can be obtained from Figure 21 or by calculation using Equation 2. The area, in square inches is the top copper area including the gate and source pads.
R
The transient thermal impedance (Z varied top copper board area. Figure 22 shows the effect of copper pad area on single pulse transient thermal imped ance. Each trace represents a copper pad area in square inches corresponding to the descending list in the graph. Spice and SABER thermal models are provided for each of the listed pad areas.
Copper pad area has no perceivable effect on transient thermal impedance for pulse widths less than 100ms. For pulse widths less than 100ms the transient thermal impedance is determined by the die and package. Therefore, CTHERM1 through CTHERM5 and RTHERM1 through RTHERM5 remain constant for each of the thermal models. A listing of the model component values is available in Table 1.
-
64
θJA
200
150
C/W)
o
(
θJA
R
100
50
0.001 0.01 0.1 1 10
26
+=
-------------------------------
0.23 Area+
AREA, TOP COPPER AREA (in2)
(EQ. 2)
) is also effected by
θJA
R
= 64 + 26/(0.23+Area)
θJA
Figure 21. Thermal Resistance vs Mounting
Pad Area
FDS8978 Dual N-Channel PowerTrench
-
®
MOSFET
0
-1
10
Figure 22. Thermal Impedance vs Mounting Pad Area
©2011 Fairchild Semiconductor Corporation FDS8978 Rev. B1
0
10
t, RECTANGULAR PULSE DURATION (s)
1
10
2
10
www.fairchildsemi.com7
3
10
Page 8
PSPICE Electrical Model
.SUBCKT FDS8978 2 1 3 *February 2005
Ca 12 8 7.8e-10 Cb 15 14 7.8e-10 Cin 6 8 .78e-9 Dbody 7 5 DbodyMOD Dbreak 5 11 DbreakMOD Dplcap 10 5 DplcapMOD
Ebreak 11 7 17 18 32.9 Eds 14 8 5 8 1 Egs 13 8 6 8 1 Esg 6 10 6 8 1 Evthres 6 21 19 8 1 Evtemp 20 6 18 22 1
It 8 17 1
Lgate 1 9 5.29e-9 Ldrain 2 5 1.0e-9 Lsource 3 7 0.18e-9
RLgate 1 9 52.9 RLdrain 2 5 10 RLsource 3 7 1.8
Mmed 16 6 8 8 MmedMOD Mstro 16 6 8 8 MstroMOD Mweak 16 21 8 8 MweakMOD
Rbreak 17 18 RbreakMOD 1 Rdrain 50 16 RdrainMOD 1.6e-3 Rgate 9 20 2.3 RSLC1 5 51 RSLCMOD 1e-6
GATE
1
LGATE
RLGATE
RGATE
9
CA
ESG
EVTEMP +
20
S1A
12
S1B
18 22
DPLCAP
10
RSLC2
­6
8
EVTHRES
+
+
19
8
6
-
S2A
14
13
13
8
S2B
13
+
+
6
EGS EDS
8
-
-
15
CIN
CB
-
+
-
5
51
5
51
-
RDRAIN
21
MSTRO
14
5 8
RSLC1
+
ESLC
50
16
8
MMED
8
DBREAK
11
+
EBREAK
MWEAK
RSOURCE
RBREAK
17 18
IT
RVTHRES
RSLC2 5 50 1e3 Rsource 8 7 RsourceMOD 8.9e-3 Rvthres 22 8 RvthresMOD 1 Rvtemp 18 19 RvtempMOD 1 S1a 6 12 13 8 S1AMOD S1b 13 12 13 8 S1BMOD S2a 6 15 14 13 S2AMOD S2b 13 15 14 13 S2BMOD
Vbat 22 19 DC 1
ESLC 51 50 VALUE={(V(5,51)/ABS(V(5,51)))*(PWR(V(5,51)/(1e-6*170),5))}
.MODEL DbodyMOD D (IS=2.0E-12 IKF=10 N=1.01 RS=7.0e-3 TRS1=8e-4 TRS2=2e-7 + CJO=3.5e-10 M=0.55 TT=7e-11 XTI=2) .MODEL DbreakMOD D (RS=0.2 TRS1=1e-3 TRS2=-8.9e-6) .MODEL DplcapMOD D (CJO=3.8e-10 IS=1e-30 N=10 M=0.45)
.MODEL MstroMOD NMOS (VTO=2.36 KP=150 IS=1e-30 N=10 TOX=1 L=1u W=1u) .MODEL MmedMOD NMOS (VTO=1.95 KP=5.0 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=2.3) .MODEL MweakMOD NMOS (VTO=1.57 KP=0.02 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=23 RS=0.1)
.MODEL RbreakMOD RES (TC1=8.3e-4 TC2=-8e-7) .MODEL RdrainMOD RES (TC1=15e-3 TC2=0.1e-5) .MODEL RSLCMOD RES (TC1=1e-4 TC2=1e-6) .MODEL RsourceMOD RES (TC1=1e-3 TC2=3e-6) .MODEL RvtempMOD RES (TC1=-1.8e-3 TC2=2e-7) .MODEL RvthresMOD RES (TC1=-2.0e-3 TC2=-6e-6) MODEL S1AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-4 VOFF=-3.5) .MODEL S1BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-3.5 VOFF=-4) .MODEL S2AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-1.5 VOFF=-1.0) .MODEL S2BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-1.0 VOFF=-1.5).ENDSNote: For further discussion of the PSPICE mod­el, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global Temperature Options; IEEE Power Electronics Specialist Conference Records, 1991, written by William J. Hepp and C. Frank Wheatley.
17 18
-
7
RVTEMP
19
-
+
22
LDRAIN
RLDRAIN
DBODY
LSOURCE
RLSOURCE
VBAT
DRAIN
2
SOURCE
3
FDS8978 Dual N-Channel PowerTrench
®
MOSFET
©2011 Fairchild Semiconductor Corporation FDS8978 Rev. B1
www.fairchildsemi.com8
Page 9
SABER Electrical Model
REV February 2005 template FDS8978 n2,n1,n3 electrical n2,n1,n3 { var i iscl dp..model dbodymod = (isl=2.0e-12,ikf=10,nl=1.01,rs=7.0e-3,trs1=8e-4,trs2=2e-7,cjo=3.5e-10,m=0.55,tt=7e-11,xti=2) dp..model dbreakmod = (rs=0.2,trs1=1e-3,trs2=-8.9e-6) dp..model dplcapmod = (cjo=3.8e-10,isl=10e-30,nl=10,m=0.45) m..model mstrongmod = (type=_n,vto=2.36,kp=150,is=1e-30, tox=1) m..model mmedmod = (type=_n,vto=1.95,kp=5.0,is=1e-30, tox=1) m..model mweakmod = (type=_n,vto=1.57,kp=0.02,is=1e-30, tox=1,rs=0.1) sw_vcsp..model s1amod = (ron=1e-5,roff=0.1,von=-4,voff=-3.5) sw_vcsp..model s1bmod = (ron=1e-5,roff=0.1,von=-3.5,voff=-4) sw_vcsp..model s2amod = (ron=1e-5,roff=0.1,von=-1.5,voff=-1.0)
10
DPLCAP
5
sw_vcsp..model s2bmod = (ron=1e-5,roff=0.1,von=-1.0,voff=-1.5) c.ca n12 n8 = 7.8e-10 c.cb n15 n14 = 7.8e-10
RSLC2
c.cin n6 n8 = .78e-9
dp.dbody n7 n5 = model=dbodymod dp.dbreak n5 n11 = model=dbreakmod dp.dplcap n10 n5 = model=dplcapmod
spe.ebreak n11 n7 n17 n18 = 32.9 spe.eds n14 n8 n5 n8 = 1 spe.egs n13 n8 n6 n8 = 1 spe.esg n6 n10 n6 n8 = 1 spe.evthres n6 n21 n19 n8 = 1
GATE
1
LGATE
RLGATE
RGATE
9
ESG
EVTEMP
+
18 22
20
-
+
-
6 8
EVTHRES
+
6
-
19
8
CIN
spe.evtemp n20 n6 n18 n22 = 1
i.it n8 n17 = 1
l.lgate n1 n9 = 5.29e-9 l.ldrain n2 n5 = 1.0e-9 l.lsource n3 n7 = 0.18e-9
res.rlgate n1 n9 = 52.9 res.rldrain n2 n5 = 10 res.rlsource n3 n7 = 1.8
12
CA
S1A
14
13
13
8
S1B
13
+
+
6
EGS EDS
8
-
-
S2A
S2B
15
CB
+
5 8
-
m.mmed n16 n6 n8 n8 = model=mmedmod, l=1u, w=1u m.mstrong n16 n6 n8 n8 = model=mstrongmod, l=1u, w=1u m.mweak n16 n21 n8 n8 = model=mweakmod, l=1u, w=1u
res.rbreak n17 n18 = 1, tc1=8.3e-4,tc2=-8e-7 res.rdrain n50 n16 = 1.6e-3, tc1=15e-3,tc2=0.1e-5 res.rgate n9 n20 = 2.3 res.rslc1 n5 n51 = 1e-6, tc1=1e-4,tc2=1e-6 res.rslc2 n5 n50 = 1e3 res.rsource n8 n7 = 8.9e-3, tc1=1e-3,tc2=3e-6 res.rvthres n22 n8 = 1, tc1=-2.0e-3,tc2=-6e-6 res.rvtemp n18 n19 = 1, tc1=-1.8e-3,tc2=2e-7 sw_vcsp.s1a n6 n12 n13 n8 = model=s1amod sw_vcsp.s1b n13 n12 n13 n8 = model=s1bmod sw_vcsp.s2a n6 n15 n14 n13 = model=s2amod sw_vcsp.s2b n13 n15 n14 n13 = model=s2bmod
v.vbat n22 n19 = dc=1 equations { i (n51->n50) +=iscl iscl: v(n51,n50) = ((v(n5,n51)/(1e-9+abs(v(n5,n51))))*((abs(v(n5,n51)*1e6/170))** 5)) } }
RSLC1
51
ISCL
50
RDRAIN
16
21
MSTRO
14
8
MMED
8
DBREAK
11
MWEAK
EBREAK
+
RSOURCE
RBREAK
17 18
IT
RVTHRES
17 18
­7
+
RVTEMP
19
-
22
LDRAIN
RLDRAIN
DBODY
LSOURCE
RLSOURCE
VBAT
DRAIN
2
SOURCE
3
FDS8978 Dual N-Channel PowerTrench
®
MOSFET
©2011 Fairchild Semiconductor Corporation FDS8978 Rev. B1
www.fairchildsemi.com9
Page 10
SPICE Thermal Model
REV February 2005 template FDS8878 n2,n1,n3 Copper Area =1.0 in CTHERM1 TH 8 2.0e-3 CTHERM2 8 7 5.0e-3 CTHERM3 7 6 1.0e-2 CTHERM4 6 5 4.0e-2 CTHERM5 5 4 9.0e-2 CTHERM6 4 3 2e-1 CTHERM7 3 2 1 CTHERM8 2 TL 3
RTHERM1 TH 8 1e-1 RTHERM2 8 7 5e-1 RTHERM3 7 6 1 RTHERM4 6 5 5 RTHERM5 5 4 8 RTHERM6 4 3 12 RTHERM7 3 2 18 RTHERM8 2 TL 25
2
th
RTHERM1
8
RTHERM2
7
RTHERM3
FDS8978 Dual N-Channel PowerTrench
JUNCTION
CTHERM1
CTHERM2
CTHERM3
SABER Thermal Model
Copper Area = 1.0 in template thermal_model th tl thermal_c th, tl { ctherm.ctherm1 th 8 =2.0e-3 ctherm.ctherm2 8 7 =5.0e-3 ctherm.ctherm3 7 6 =1.0e-2 ctherm.ctherm4 6 5 =4.0e-2 ctherm.ctherm5 5 4 =9.0e-2 ctherm.ctherm6 4 3 =2e-1 ctherm.ctherm7 3 2 1 ctherm.ctherm8 2 tl 3
rtherm.rtherm1 th 8 =1e-1 rtherm.rtherm2 8 7 =5e-1 rtherm.rtherm3 7 6 =1 rtherm.rtherm4 6 5 =5 rtherm.rtherm5 5 4 =8 rtherm.rtherm6 4 3 =12 rtherm.rtherm7 3 2 =18 rtherm.rtherm8 2 tl =25 }
COMPONANT 0.04 in
2
2
RTHERM4
RTHERM5
RTHERM6
RTHERM7
RTHERM8
TABLE 1. THERMAL MODELS
0.28 in
2
0.52 in
2
6
5
4
3
2
tl
0.76 in
CASE
2
CTHERM4
CTHERM5
CTHERM6
CTHERM7
CTHERM8
1.0 in
®
MOSFET
2
CTHERM6 1.2e-1 1.5e-1 2.0e-1 2.0e-1 2.0e-1
CTHERM7 0.5 1.0 1.0 1.0 1.0
CTHERM8 1.3 2.8 3.0 3.0 3.0
RTHERM6 26 20 15 13 12
RTHERM7 39 24 21 19 18
RTHERM8 55 38.7 31.3 29.7 25
©2011 Fairchild Semiconductor Corporation FDS8978 Rev. B1
www.fairchildsemi.com10
Page 11
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®
tm
tm
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PRODUCT STATUS DEFINITIONS Definition of Terms
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©2011 Fairchild Semiconductor Corporation FDS8978 Rev. B1
Datasheet contains the design specifications for product development. Specifications may change in any manner without notice.
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Rev. I51
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