Datasheet FDS8870 Datasheet (Fairchild)

Page 1
tm
FDS8870 N-Channel PowerTrench
30V, 18A, 4.2mΩ
®
MOSFET
FDS8870 N-Channel PowerTrench
April 2007
Features
r
r
High performance trench technology for extremely low
Low gate charge
High power and current handling capability
RoHS Compliant
Branding Dash
DS(on)
DS(on)
r
DS(on)
= 4.2mΩ, V
= 4.9mΩ, V
= 10V, ID = 18A
GS
= 4.5V, ID = 17A
GS
General Description
This N-Channel MOSFET has been designed specifically to improve the overall efficiency of DC/DC converters using either synchronous or conventional switching PWM controllers. It has been optimized for low gate charge, low r
and fast switching speed.
DS(on)
Applications
DC/DC converters
5
4
®
MOSFET
1
2
3
4
SO-8
©2007 Fairchild Semiconductor Corporation FDS8870 Rev. B
5
6
7
8
3
2
1
Page 2
FDS8870 N-Channel PowerTrench
MOSFET Maximum Ratings T
= 25°C unless otherwise noted
A
Symbol Parameter Ratings Units
V
DSS
V
GS
Drain to Source Voltage 30 V
Gate to Source Voltage ±20 V
Drain Current
I
D
Continuous (TA = 25oC, VGS = 10V, R
Continuous (TA = 25oC, VGS = 4.5V, R
= 50oC/W)
θJA
= 50oC/W) 17 A
θJA
18 A
Pulsed 134 A
E
AS
P
D
TJ, T
STG
Single Pulse Avalanche Energy (Note 1) 420 mJ
Power dissipation 2.5 W
Derate above 25oC 20 mW/oC
Operating and Storage Temperature -55 to 150
Thermal Characteristics
R
θJC
R
θJA
R
θJA
Thermal Resistance, Junction to Case (Note 2) 25
Thermal Resistance, Junction to Ambient (Note 2a) 50
Thermal Resistance, Junction to Ambient (Note 2b) 125
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape W i dt h Quantity
FDS8870 FDS8870 SO-8 330mm 12mm 2500 units
Electrical Characteristics T
Symbol Parameter Test Conditions Min Typ Max Units
= 25°C unless otherwise noted
J
o
C/W
o
C/W
o
C/W
o
C
®
MOSFET
Off Characteristics
B
I
DSS
I
GSS
VDSS
Drain to Source Breakdown Voltage ID = 250µA, VGS = 0V 30 - - V
Zero Gate Voltage Drain Current
Gate to Source Leakage Current VGS = ±20V - - ±100 nA
On Characteristics
V
GS(TH)
r
DS(on)
Gate to Source Threshold Voltage VGS = VDS, ID = 250µA 1.2 - 2.5 V
Drain to Source On Resistance
Dynamic Characteristics
C
ISS
C
OSS
C
RSS
R
G
Q
g(TOT)
Q
g(5)
Q
g(TH)
Q
gs
Q
gs2
Q
gd
Input Capacitance
Output Capacitance - 900 - pF
Reverse Transfer Capacitance - 450 - pF
Gate Resistance VGS = 0.5V, f = 1MHz 0.5 2.0 3.5 Ω
Total Gate Charge at 10V VGS = 0V to 10V
Total Gate Charge at 5V VGS = 0V to 5V - 45 62 nC
Threshold Gate Charge VGS = 0V to 1V - 4.6 6.0 nC
Gate to Source Gate Charge - 11 - nC
Gate Charge Threshold to Plateau - 6.4 - nC
Gate to Drain “Miller” Charge - 15 - nC
VDS = 24V - - 1
VGS = 0V TJ = 150oC - - 250
ID = 18A, VGS = 10V - 3.5 4.2
ID = 17A, VGS = 4.5V - 3.9 4.9
ID = 18A, VGS = 10V, TJ = 150oC
VDS = 15V, VGS = 0V,
- 5.5 7.2
- 4615 - pF
f = 1MHz
- 85 11 2 nC
VDD = 15V ID = 18A Ig = 1.0mA
µA
mΩ
©2007 Fairchild Semiconductor Corporation FDS8870 Rev. B
Page 3
Switching Characteristics (V
t
ON
t
d(ON)
t
r
t
d(OFF)
t
f
t
OFF
Turn-On Time
Turn-On Delay Time - 9 - ns
Rise Time - 48 - ns
Turn-Off Delay Time - 60 - ns
Fall Time - 21 - ns
Turn-Off Time - - 122 ns
GS
= 10V)
- - 86 ns
VDD = 15V, ID = 18A VGS = 10V, RGS = 3.3Ω
Drain-Source Diode Characteristics
I
= 18A - - 1.25 V
V
SD
t
rr
Q
RR
Notes:
1: Starting TJ = 25°C, L = 1mH, IAS = 29A, VDD = 30V, VGS = 10V. 2: R
θJA
drain pins. R
a) 50°C/W when mounted on a 1in
b) 125°C/W when mounted on a minimum pad.
Source to Drain Diode Voltage
Reverse Recovery Time ISD = 18A, dISD/dt = 100A/µs - - 37 ns
Reverse Recovered Charge ISD = 18A, dISD/dt = 100A/µs - - 22 nC
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the
is guaranteed by design while R
θJC
2
pad of 2 oz copper.
is determined by the user’s board design.
θJA
SD
ISD = 2.1A - - 1.0 V
FDS8870 N-Channel PowerTrench
®
MOSFET
©2007 Fairchild Semiconductor Corporation FDS8870 Rev. B
Page 4
FDS8870 N-Channel PowerTrench
Typical Characteristics T
1.2
1.0
0.8
0.6
0.4
0.2
POWER DISSIPATION MULTIPLIER
0
0255075100 150
TA, AMBIENT TEMPERATURE (oC)
= 25°C unless otherwise noted
J
Figure 1. Normalized Power Dissipation vs
Ambient Temperature
2
1
DUTY CYCLE-DESCENDING ORDER
D = 0.5
0.1
θJA
Z
0.01
0.2
0.1
0.05
0.02
0.01
125
20
15
VGS = 10V
R
θJA
VGS = 4.5V
=50oC/W
TA, AMBIENT TEMPERATURE (oC)
10
, DRAIN CURRENT (A)
D
I
5
0
25 50 75 100 125 150
Figure 2. Maximum Continuous Drain Current vs
Ambient Temperature
®
MOSFET
NORMALIZED THERMAL
IMPEDANCE,
0.001
0.0001
3000
1000
100
10
, PEAK TRANSIENT POWER (W)
(PK)
P
0.5
SINGLE PULSE
R
= 125oC/W
θJA
-4
10
-3
10
-2
10
t, RECTANGULAR PULSE DURATION (s)
-1
10
0
10
1
10
2
10
3
10
Figure 3. Normalized Maximum Transient Thermal Impedance
VGS = 10V
1
-4
10
-3
10
-2
10
-1
10
t, PULSE WIDTH (s)
0
10
1
10
SINGLE PULSE
R
= 125oC/W
θJA
T
= 25oC
A
2
10
3
10
Figure 4. Single Pulse Maximum Power Dissipation
©2007 Fairchild Semiconductor Corporation FDS8870 Rev. B
Page 5
FDS8870 N-Channel PowerTrench
Typical Characteristics T
100
If R = 0 tAV = (L)(IAS)/(1.3*RATED BV
If R ≠ 0
= (L/R)ln[(IAS*R)/(1.3*RATED BV
t
AV
10
, AVALANCHE CURRENT (A)
AS
I
1
0.1 1 10 100
STARTING TJ = 150oC
tAV, TIME IN AVALANCHE (ms)
= 25°C unless otherwise noted
J
- VDD)
DSS
- VDD) +1]
DSS
STARTING TJ = 25oC
NOTE: Refer to Fairchild Application Notes AN7514 and AN7515
Figure 5. Unclamped Inductive Switching
Capability
50
40
30
20
, DRAIN CURRENT (A)
D
I
10
0
0 0.1 0.2 0.3 0.4 0.5
VGS = 10V
TA = 25oC PULSE DURATION = 80µs
VGS = 2.5V
VDS, DRAIN TO SOURCE VOLTAGE (V)
DUTY CYCLE = 0.5% MAX
VGS = 5V
VGS = 4V
VGS = 3V
50
PULSE DURATION = 80µs DUTY CYCLE = 0.5%MAX
40
V
= 5V
DS
30
20
, DRAIN CURRENT (A)
D
10
I
0
1.5 2.0 2.5 3.0 3.5
TJ = 150oC
VGS, GATE TO SOURCE VOLTAGE (V)
TJ = 25oC
TJ = -55oC
Figure 6. Transfer Characteristics
14
ID = 15A
12
10
8
, DRAIN TO SOURCE
ON RESISTANCE (mW)
DS(on)
r
6
4
246810
VGS, GATE TO SOURCE VOLTAGE (V)
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
®
MOSFET
Figure 7. Saturation Characteristics Figure 8. Drain to Source On Resistance vs Gate
1.6 PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
1.4
1.2
1.0
ON RESISTANCE
0.8
NORMALIZED DRAIN TO SOURCE
0.6
-80 -40 0 40 80 120 160
TJ, JUNCTION TEMPERATURE (oC)
Figure 9. Normalized Drain to Source On
Resistance vs Junction Temperature
©2007 Fairchild Semiconductor Corporation FDS8870 Rev. B
VGS = 10V, ID = 15A
Voltage and Drain Current
1.2
1.0
0.8
NORMALIZED GATE
THRESHOLD VOLTAGE
0.6
-80 -40 0 40 80 120 160
TJ, JUNCTION TEMPERATURE (oC)
VGS = VDS, ID = 250µA
Figure 10. Normalized Gate Threshold Voltage vs
Junction Temperature
Page 6
FDS8870 N-Channel PowerTrench
Typical Characteristics T
1.10 ID = 250µA
1.05
1.00
0.95
BREAKDOWN VOLTAGE
NORMALIZED DRAIN TO SOURCE
0.90
-80 -40 0 40 80 120 160
TJ, JUNCTION TEMPERATURE (oC)
= 25°C unless otherwise noted
J
Figure 11. Normalized Drain to Source
Breakdown Voltage vs Junction Temperature
10
VDD = 15V
8
6
4
2
, GATE TO SOURCE VOLTAGE (V)
GS
V
0
0 1020304050
Qg, GATE CHARGE (nC)
WAVEFORMS IN DESCENDING ORDER:
ID = 15A ID = 1A
5000
C
= CGS + C
ISS
C
OSS
1000
C
RSS
C, CAPACITANCE (pF)
V
= 0V, f = 1MHz
GS
100
0.1 1 10
GD
≅ C
+ C
DS
GD
= C
GD
VDS, DRAIN TO SOURCE VOLTAGE (V)
Figure 12. Capacitance vs Drain to Source
Voltage
300
100
10
THIS AREA IS
1
LIMITED BY r
, DRAIN CURRENT (A)
D
0.1
I
0.01
0.01 0.1 1 10 100
DS(on)
SINGLE PULSE
= MAX RATED
T
J
o
= 125
θJA
= 25
A
C/W
o
C
R
T
VDS, DRAIN to SOURCE VOLTAGE (V)
30
®
MOSFET
100us
1ms
10ms
100ms
1s
10s
DC
Figure 13. Gate Charge Waveforms for Constant
Gate Currents
©2007 Fairchild Semiconductor Corporation FDS8870 Rev. B
Figure 14. Forward Bias Safe Operating Area
Page 7
Test Circuits and Waveforms
FDS8870 N-Channel PowerTrench
BV
DSS
t
P
V
DS
VAR Y tP TO OBTAIN
REQUIRED PEAK I
V
GS
V
DS
L
I
AS
R
AS
G
+
V
DD
-
DUT
t
0V
P
I
AS
0.01Ω
0
t
AV
Figure 15. Unclamped Energy Test Circuit Figure 16. Unclamped Energy Waveforms
V
I
g(REF)
DS
Λ
V
GS
+
V
DD
−
DUT
V
DD
V
0
I
g(REF)
0
GS
= 1V
Q
g(TOT)
V
DS
Q
Q
gs2
Q
g(TH)
Q
gs
g(5)
Q
gd
V
GS
VGS = 5V
V
DD
®
MOSFET
V
= 10V
GS
Figure 17. Gate Charge Test Circuit Figure 18. Gate Charge Waveforms
V
GS
R
GS
V
GS
Figure 19. Switching Time Test Circuit Figure 20. Switching Time Waveforms
©2007 Fairchild Semiconductor Corporation FDS8870 Rev. B
V
DS
R
L
+
V
DD
-
V
DS
0
DUT
V
GS
10%
0
t
d(ON)
90%
t
ON
50%
10%
t
r
PULSE WIDTH
t
d(OFF)
90%
t
OFF
t
f
90%
10%
50%
Page 8
Thermal Resistance vs. Mounting Pad Area
The maximum rated junction temperature, TJM, and the thermal resistance of the heat dissipating path determines the maximum allowable device power dissipation, P application. Therefore the application’s ambient temperature, T must be reviewed to ensure that T Equation 1 mathematically represents the relationship and
(oC), and thermal resistance R
A
is never exceeded.
JM
DM
(oC/W)
θJA
, in an
serves as the basis for establishing the rating of the part.
P
TJMTA–()
----------------------------- --=
DM
R
θJA
(EQ. 1)
In using surface mount devices such as the SO8 package, the environment in which it is applied will have a significant influence on the part’s current and maximum power dissipation ratings. Precise determination of P and influenced by many factors:
is complex
DM
1. Mounting pad area onto which the device is attached and whether there is copper on one side or both sides of the board.
2. The number of copper layers and the thickness of the board.
3. The use of external heat sinks.
4. The use of thermal vias.
5. Air flow and board orientation.
6. For non steady state applications, the pulse width, the duty cycle and the transient thermal response of the part, the board and the environment they are in.
Fairchild provides thermal information to assist the design­er’s preliminary application evaluation. Figure 21 defines the R
for the device as a function of the top copper (compo-
θJA
nent side) area. This is for a horizontally positioned FR-4 board with 1oz copper after 1000 seconds of steady state power with no air flow. This graph provides the necessary in formation for calculation of the steady state junction temper­ature or power dissipation. Pulse applications can be evaluated using the Fairchild device Spice thermal model or manually utilizing the normalized
150
COPPER BOARD AREA - DESCENDING ORDER
2
0.04 in
2
0.28 in
120
C/W)
o
90
, THERMAL
60
θJA
Z
IMPEDANCE (
30
0.52 in
0.76 in
1.00 in
2
2
2
maximum transient
thermal impedance curve.
Thermal resistances corresponding to other copper areas can be obtained from Figure 21 or by calculation using Equation 2. The area, in square inches is the top copper area including the gate and source pads.
R
The transient thermal impedance (Z varied top copper board area. Figure 22 shows the effect of copper pad area on single pulse transient thermal imped ance. Each trace represents a copper pad area in square inches corresponding to the descending list in the graph. Spice and SABER thermal models are provided for each of the listed pad areas.
Copper pad area has no perceivable effect on transient thermal impedance for pulse widths less than 100ms. For pulse widths less than 100ms the transient thermal impedance is determined by the die and package. Therefore, CTHERM1 through CTHERM5 and RTHERM1 through RTHERM5 remain constant for each of the thermal models. A listing of the model component values is available in Table 1.
-
64
θJA
200
150
C/W)
o
(
θJA
R
100
50
0.001 0.01 0.1 1 10
26
+=
-------------------------------
0.23 Area+
AREA, TOP COPPER AREA (in2)
(EQ. 2)
) is also effected by
θJA
R
= 64 + 26/(0.23+Area)
θJA
Figure 21. Thermal Resistance vs Mounting
Pad Area
FDS8870 N-Channel PowerTrench
-
®
MOSFET
0
-1
10
Figure 22. Thermal Impedance vs Mounting Pad Area
©2007 Fairchild Semiconductor Corporation FDS8870 Rev. B
0
10
t, RECTANGULAR PULSE DURATION (s)
1
10
2
10
3
10
Page 9
PSPICE Electrical Model
.SUBCKT FDS8870 2 1 3 ; rev March 2004 Ca 12 8 2.8e-9 Cb 15 14 2.8e-9 Cin 6 8 4.3e-9
Dbody 7 5 DbodyMOD Dbreak 5 11 DbreakMOD Dplcap 10 5 DplcapMOD
Ebreak 11 7 17 18 33.62 Eds 14 8 5 8 1 Egs 13 8 6 8 1 Esg 6 10 6 8 1 Evthres 6 21 19 8 1 Evtemp 20 6 18 22 1
It 8 17 1
Lgate 1 9 1e-9 Ldrain 2 5 1.0e-9 Lsource 3 7 7e-11
RLgate 1 9 10 RLdrain 2 5 10 RLsource 3 7 0.7
Mmed 16 6 8 8 MmedMOD Mstro 16 6 8 8 MstroMOD Mweak 16 21 8 8 MweakMOD
Rbreak 17 18 RbreakMOD 1 Rdrain 50 16 RdrainMOD 3.05e-3 Rgate 9 20 2 RSLC1 5 51 RSLCMOD 1e-6 RSLC2 5 50 1e3 Rsource 8 7 RsourceMOD 9e-4 Rvthres 22 8 RvthresMOD 1
GATE
1
LGATE
RLGATE
RGATE
9
CA
ESG
EVTEMP +
20
S1A
12
S1B
18 22
DPLCAP
10
RSLC2
­6
8
EVTHRES
+
+
19
8
6
-
S2A
13814
13
S2B
13
+
+
6
EGS EDS
8
-
-
5
RSLC1
51
+
5
ESLC
51
­50
RDRAIN
16
21
-
MSTRO
CIN
15
CB
8
14
+
5 8
-
MMED
8
DBREAK
11
+
EBREAK
MWEAK
RSOURCE
RBREAK
17 18
IT
RVTHRES
Rvtemp 18 19 RvtempMOD 1 S1a 6 12 13 8 S1AMOD S1b 13 12 13 8 S1BMOD S2a 6 15 14 13 S2AMOD S2b 13 15 14 13 S2BMOD
Vbat 22 19 DC 1
ESLC 51 50 VALUE={(V(5,51)/ABS(V(5,51)))*(PWR(V(5,51)/(1e-6*500),10))}
.MODEL DbodyMOD D (IS=1E-11 IKF=17 N=1.01 RS=2.8e-3 TRS1=2e-3 TRS2=2e-7 + CJO=1.95e-9 M=0.55 TT=9e-11 XTI=2.6) .MODEL DbreakMOD D (RS=8e-2 TRS1=1e-3 TRS2=-8.9e-6) .MODEL DplcapMOD D (CJO=1.42e-9 IS=1e-30 N=10 M=0.38)
.MODEL MmedMOD NMOS (VTO=1.85 KP=15 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=2) .MODEL MstroMOD NMOS (VTO=2.2 KP=650 IS=1e-30 N=10 TOX=1 L=1u W=1u) .MODEL MweakMOD NMOS (VTO=1.48 KP=0.05 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=20 RS=0.1)
.MODEL RbreakMOD RES (TC1=8.3e-4 TC2=-9e-7) .MODEL RdrainMOD RES (TC1=1.8e-3 TC2=5e-6) .MODEL RSLCMOD RES (TC1=1e-4 TC2=1e-6) .MODEL RsourceMOD RES (TC1=8e-3 TC2=1e-6) .MODEL RvthresMOD RES (TC1=-1.8e-3 TC2=-9e-6) .MODEL RvtempMOD RES (TC1=-2.5e-3 TC2=2e-7)
.MODEL S1AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-5 VOFF=-3) .MODEL S1BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-3 VOFF=-5) .MODEL S2AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-2 VOFF=-0.5) .MODEL S2BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-0.5 VOFF=-2)
.ENDS Note: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global Temperature Options; IEEE Power Electronics Specialist Conference Records, 1991, written by William J. Hepp and C. Frank Wheatley.
17 18
-
7
RVTEMP
19
-
+
22
LDRAIN
RLDRAIN
DBODY
LSOURCE
RLSOURCE
VBAT
DRAIN
2
SOURCE
3
FDS8870 N-Channel PowerTrench
®
MOSFET
©2007 Fairchild Semiconductor Corporation FDS8870 Rev. B
Page 10
SABER Electrical Model
REV March 2004 template FDS8870 n2,n1,n3 electrical n2,n1,n3 { var i iscl dp..model dbodymod = (isl=1e-11,ikf=17,nl=1.01,rs=2.8e-3,trs1=2e-3,trs2=2e-7,cjo=1.95e-9,m=0.55,tt=9e-11,xti=2.6) dp..model dbreakmod = (rs=8e-2,trs1=1e-3,trs2=-8.9e-6) dp..model dplcapmod = (cjo=1.42e-9,isl=10e-30,nl=10,m=0.38) m..model mmedmod = (type=_n,vto=1.85,kp=15,is=1e-30, tox=1) m..model mstrongmod = (type=_n,vto=2.2,kp=650,is=1e-30, tox=1) m..model mweakmod = (type=_n,vto=1.48,kp=0.05,is=1e-30, tox=1,rs=0.1) sw_vcsp..model s1amod = (ron=1e-5,roff=0.1,von=-5,voff=-3) sw_vcsp..model s1bmod = (ron=1e-5,roff=0.1,von=-3,voff=-5) sw_vcsp..model s2amod = (ron=1e-5,roff=0.1,von=-2,voff=-0.5) sw_vcsp..model s2bmod = (ron=1e-5,roff=0.1,von=-0.5,voff=-2) c.ca n12 n8 = 2.8e-9 c.cb n15 n14 = 2.8e-9 c.cin n6 n8 = 4.3e-9
dp.dbody n7 n5 = model=dbodymod dp.dbreak n5 n11 = model=dbreakmod dp.dplcap n10 n5 = model=dplcapmod
spe.ebreak n11 n7 n17 n18 = 33.62 spe.eds n14 n8 n5 n8 = 1 spe.egs n13 n8 n6 n8 = 1
GATE
1
spe.esg n6 n10 n6 n8 = 1 spe.evthres n6 n21 n19 n8 = 1
LGATE
9
RLGATE
RGATE
ESG
EVTEMP
+
18 22
20
spe.evtemp n20 n6 n18 n22 = 1
DPLCAP
10
RSLC2
­6
8
EVTHRES
+
+
6
-
5
RSLC1
51
50
RDRAIN
21
-
19
8
MSTRO
CIN
i.it n8 n17 = 1
l.lgate n1 n9 = 1e-9 l.ldrain n2 n5 = 1.0e-9 l.lsource n3 n7 = 7e-11
res.rlgate n1 n9 = 10 res.rldrain n2 n5 = 10 res.rlsource n3 n7 = 0.7
m.mmed n16 n6 n8 n8 = model=mmedmod, l=1u, w=1u
CA
S1A
12
S1B
S2A
13814
13
S2B
13
+
+
6
EGS EDS
8
-
-
15
CB
14
+
5 8
-
m.mstrong n16 n6 n8 n8 = model=mstrongmod, l=1u, w=1u m.mweak n16 n21 n8 n8 = model=mweakmod, l=1u, w=1u
res.rbreak n17 n18 = 1, tc1=8.3e-4,tc2=-9e-7 res.rdrain n50 n16 = 3.05e-3, tc1=1.8e-3,tc2=5e-6 res.rgate n9 n20 = 2 res.rslc1 n5 n51 = 1e-6, tc1=1e-4,tc2=1e-6 res.rslc2 n5 n50 = 1e3 res.rsource n8 n7 = 9e-4, tc1=8e-3,tc2=1e-6 res.rvthres n22 n8 = 1, tc1=-1.8e-3,tc2=-9e-6 res.rvtemp n18 n19 = 1, tc1=-2.5e-3,tc2=2e-7 sw_vcsp.s1a n6 n12 n13 n8 = model=s1amod sw_vcsp.s1b n13 n12 n13 n8 = model=s1bmod sw_vcsp.s2a n6 n15 n14 n13 = model=s2amod sw_vcsp.s2b n13 n15 n14 n13 = model=s2bmod
v.vbat n22 n19 = dc=1 equations { i (n51->n50) +=iscl iscl: v(n51,n50) = ((v(n5,n51)/(1e-9+abs(v(n5,n51))))*((abs(v(n5,n51)*1e6/500))** 10))
} }
ISCL
16
8
MMED
DBREAK
11
MWEAK
EBREAK
RSOURCE
RBREAK
17 18
IT
8
RVTHRES
+
-
17 18
7
+
RVTEMP
19
-
22
LDRAIN
RLDRAIN
DBODY
LSOURCE
RLSOURCE
VBAT
DRAIN
2
SOURCE
3
FDS8870 N-Channel PowerTrench
®
MOSFET
©2007 Fairchild Semiconductor Corporation FDS8870 Rev. B
www.fairchildsemi.com10
Page 11
FDS8870 N-Channel PowerTrench
SPICE Thermal Model
REV March 2004 FDS8870T Copper Area =1.0 in
2
CTHERM1 TH 8 2.0e-3 CTHERM2 8 7 5.0e-3 CTHERM3 7 6 1.0e-2 CTHERM4 6 5 4.0e-2 CTHERM5 5 4 9.0e-2 CTHERM6 4 3 2e-1 CTHERM7 3 2 1 CTHERM8 2 TL 3
RTHERM1 TH 8 1e-1 RTHERM2 8 7 5e-1 RTHERM3 7 6 1 RTHERM4 6 5 5 RTHERM5 5 4 8 RTHERM6 4 3 12 RTHERM7 3 2 18 RTHERM8 2 TL 25
SABER Thermal Model
Copper Area = 1.0 in template thermal_model th tl thermal_c th, tl { ctherm.ctherm1 th 8 =2.0e-3 ctherm.ctherm2 8 7 =5.0e-3 ctherm.ctherm3 7 6 =1.0e-2 ctherm.ctherm4 6 5 =4.0e-2 ctherm.ctherm5 5 4 =9.0e-2 ctherm.ctherm6 4 3 =2e-1 ctherm.ctherm7 3 2 1 ctherm.ctherm8 2 tl 3
rtherm.rtherm1 th 8 =1e-1 rtherm.rtherm2 8 7 =5e-1 rtherm.rtherm3 7 6 =1 rtherm.rtherm4 6 5 =5 rtherm.rtherm5 5 4 =8 rtherm.rtherm6 4 3 =12 rtherm.rtherm7 3 2 =18 rtherm.rtherm8 2 tl =25 }
2
RTHERM1
RTHERM2
RTHERM3
RTHERM4
RTHERM5
RTHERM6
RTHERM7
RTHERM8
JUNCTION
th
CTHERM1
8
CTHERM2
7
CTHERM3
6
CTHERM4
5
CTHERM5
4
CTHERM6
3
CTHERM7
2
CTHERM8
®
MOSFET
tl
CASE
TABLE 1. THERMAL MODELS
COMPONANT 0.04 in
2
0.28 in
2
0.52 in
2
0.76 in
2
CTHERM6 1.2e-1 1.5e-1 2.0e-1 2.0e-1 2.0e-1
CTHERM7 0.5 1.0 1.0 1.0 1.0
CTHERM8 1.3 2.8 3.0 3.0 3.0
RTHERM6 26 20 15 13 12
RTHERM7 39 24 21 19 18
RTHERM8 55 38.7 31.3 29.7 25
©2007 Fairchild Semiconductor Corporation FDS8870 Rev. B
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1.0 in
2
Page 12
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FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.
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FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury of the user.
PRODUCT STATUS DEFINITIONS Definition of Terms
Datasheet Identification
Advance Information
Product Status
Formative or In Design
Preliminary First Production This datasheet contains preliminary data; supplementary data will
No Identification Needed Full Production This datasheet contains final specifications. Fairchild
Obsolete
Not In Production
2. A critical component in any component of a life support, device, or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
Definition
This datasheet contains the design specifications for product development. Specifications may change in any manner without notice.
be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design.
Semiconductor reserves the right to make changes at any time without notice to improve design.
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Rev. I 26
©2007 Fairchild Semiconductor Corporation FDS8870 Rev. B
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