Datasheet FDS6911 Datasheet (Fairchild)

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December 2011
11 D
FDS6911
Dual N-Channel Logic Level PowerTrench® MOSFET
20V, 7.5A, 13mΩ
General Description
These N-Channel Logic Level MOSFETs are produced using Fairchild Semiconductor’s advanced PowerTrench process that has been especially tailored to minimize the on-state resistance and yet maintain superior switching performance.
These devices are well suited for low voltage and battery powered applications where low in-line power loss and fast switching are required.
D2
D
D2
D
D1
D
D1
D
SO-8
Pin 1
SO-8
S1
G2
S2
G
G1
S
S
S
Features
r
Fast switching speed Low gate charge
High performance trench technology for extremely
High power and current handling capability
= 13 mΩ @ VGS = 10 V
DS(on)
r
= 17 mΩ @ V
DS(on)
DS(ON)
low R
= 4.5 V
GS
S1
1
G1
2
S2
3
G2
4
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Q1
Q2
D1
D1
7
D2
6
D2
5
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Absolute Maximum Ratings T
o
=25
C unless otherwise noted
A
Symbol Parameter Ratings Units
V
Drain-Source Voltage 20 V
DSS
V
Gate-Source Voltage
GSS
ID Drain Current – Continuous (Note 1a) 7.5 A – Pulsed 20
PD
TJ, T
STG
Power Dissipation for Single Operation (Note 1a) 1.6 (Note 1b)
Operating and Storage Junction Temperature Range –55 to +150
(Note 1c)
± 20
1.0
0.9
V
W
°C
Thermal Characteristics
R
θJA
R
θJC
Thermal Resistance, Junction-to-Ambient Thermal Resistance, Junction-to-Case
(Note 1a) 78
(Note 1) 40
°C/W °C/W
Package Marking and Ordering Information
Device Marking Device Reel Size Tape width Quantity
FDS6911 FDS6911 13’’ 12mm 2500 units
©2011 Fairchild Semiconductor Corporation FDS6911 Rev C1
www.fairchildsemi.com
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FDS6911 Dual N-Channel Lo
Electrical Characteristics T
= 25°C unless otherwise noted
A
Symbol Parameter Test Conditions Min Typ Max Units Off Characteristics
BV
Drain–Source Breakdown Voltage
DSS
ΔBVDSS ΔT
J
I
Zero Gate Voltage Drain Current VDS = 20 V, VGS = 0 V
DSS
I
Gate–Source Leakage
GSS
Breakdown Voltage Temperature Coefficient
= 0 V, ID = 250 μA
V
GS
I
= 250 μA, Referenced to 25°C
D
= 20 V, VGS = 0 V, TJ = 55°C
V
DS
= ±20 V, VDS = 0 V
V
GS
20 V
28
1
10
±100
mV/°C
μA nA
On Characteristics (Note 2)
V
Gate Threshold Voltage
GS(th)
ΔVGS(th) ΔTJ
r
DS(on)
Gate Threshold Voltage Temperature Coefficient
Static Drain–Source
On–Resistance
I
On–State Drain Current VGS = 10 V, VDS = 5 V 20 A
D(on)
= VGS, ID = 250 μA
V
DS
I
= 250 μA, Referenced to 25°C
D
VGS = 10 V, ID = 7.5 A
= 4.5 V, ID = 6.5 A
V
GS
= 10 V, ID = 7.5 A,TJ = 125°C
V
GS
gFS Forward Transconductance VDS = 5 V, ID = 7.5 A 36 S
1 1.8 3 V
–4.7
10.6 13
14.5
13 17 20
mV/°C
mΩ
ic level PowerTrench
Dynamic Characteristics
C
Input Capacitance
iss
C
Output Capacitance
oss
C
Reverse Transfer Capacitance
rss
RG Gate Resistance
= 15 V, V
V
DS
= 0 V,
GS
f = 1.0 MHz
= 15 mV, f = 1.0 MHz
V
GS
1130 pF
300 pF 100 pF
2.4
Ω
Switching Characteristics (Note 2)
t
Turn–On Delay Time
d(on)
tr Turn–On Rise Time t
Turn–Off Delay Time
d(off)
= 15 V, ID = 1 A,
V
DD
V
= 10 V, R
GS
GEN
= 6 Ω
tf Turn–Off Fall Time Q
Total Gate Charge at Vgs=10V 17 24 nC
g(TOT)
Qg Total Gate Charge at Vgs=5V 9 13 nC Qgs Gate–Source Charge 3.1 nC
V
= 15 V, ID = 7.5 A,
DD
Qgd Gate–Drain Charge
9 18 ns 5 10 ns
26 42 ns
7 14 ns
2.7 nC
®
MOSFET
FDS6911 Rev C1 www.fairchildsemi.com
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Electrical Characteristics TA = 25°C unless otherwise noted
Symbol Parameter Test Conditions Min Typ Max Units Drain–Source Diode Characteristics and Maximum Ratings
IS Maximum Continuous Drain–Source Diode Forward Current 1.3 A VSD Drain–Source Diode Forward
Voltage
trr Diode Reverse Recovery Time 24 nS
Qrr Diode Reverse Recovery Charge
Notes:
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of
1. R
θJA
the drain pins. R
is guaranteed by design while R
θJC
is determined by the user's board design.
θCA
VGS = 0 V, IS = 1.3 A (Note 2) 1.2 V I
= 7.5 A, diF/dt = 100 A/µs
F
13 nC
FDS6911 Dual N-Channel Lo
a) 78°C/W when
mounted on a
0.5 in2 pad of 2 oz copper
Scale 1 : 1 on letter size paper
2. Pulse Test: Pulse Width < 300μs, Duty Cycle < 2.0%
b) 125°C/W when
mounted on a .02 in2 pad of 2 oz copper
c) 135°C/W when mounted on a
minimum pad.
ic level PowerTrench
®
MOSFET
FDS6911 Rev C1 www.fairchildsemi.com
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Typical Characteristics
FD
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20
VGS = 10.0V
16
4.5V
12
8
, DRAIN CURRENT (A)
D
I
4
0
0 0.25 0.5 0.75 1 1.25 1.5
3.5V
4.0V
3.0V
V
, DRAIN-SOURCE VOLTAGE (V)
DS
2.6
VGS = 3.0V
2.2
1.8
, NORMALIZED
(on)
DS
r
3.5V
1.4
1
DRAIN-SOURCE ON-RESISTANCE
0.6 048121620
4.0
4.5V
I
, DRAIN CURRENT (A)
D
5.0
Figure 1. On-Region Characteristics. Figure 2. On-Resistance Variation with
Drain Current and Gate Voltage.
1.6 ID = 7.5A
= 10V
V
GS
1.4
1.2
, NORMALIZED
1
(on)
DS
r
0.8
DRAIN-SOURCE ON-RESISTANCE
0.6
-50 -25 0 25 50 75 100 125 150
, JUNCTION TEMPERATURE (oC)
T
J
0.04
0.03
0.02
, ON-RESISTANCE (OHM)
0.01
(on)
DS
r
TA = 25oC
0
246810
VGS, GATE TO SOURCE VOLTAGE (V)
TA = 125oC
6.0V
10.0V
ID = 3.8A
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Figure 3. On-Resistance Variation with
Temperature.
20
VDS = 5V
16
12
8
, DRAIN CURRENT (A)
D
I
4
0
1.522.533.54
TA = 125oC
V
, GATE TO SOURCE VOLTAGE (V)
GS
25oC
-55
o
C
Figure 4. On-Resistance Variation with
Gate-to-Source Voltage.
100
VGS = 0V
10
1
0.1
0.01
0.001
, REVERSE DRAIN CURRENT (A)
S
I
0.0001 0 0.2 0.4 0.6 0.8 1 1.2
TA = 125oC
25oC
-55oC
VSD, BODY DIODE FORWARD VOLTAGE (V)
Figure 5. Transfer Characteristics. Figure 6. Body Diode Forward Voltage Variation
with Source Current and Temperature.
FDS6911 Rev C1 www.fairchildsemi.com
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Typical Characteristics
FD
11 D
10
ID = 7.5A
8
6
4
, GATE-SOURCE VOLTAGE (V)
2
GS
V
0
0 4 8 12 16 20
VDS = 10V
20V
, GATE CHARGE (nC)
Q
g
15V
1400
1200
C
1000
800
600
CAPACITANCE (pF)
400
200
0
0 5 10 15 20 25 30
C
oss
C
rss
V
, DRAIN TO SOURCE VOLT AGE (V)
DS
iss
Figure 7. Gate Charge Characteristics. Figure 8. Capacitance Characteristics.
100
R
10
1
, DRAIN CURRENT (A)
VGS = 10V
D
0.1
I
SINGLE PULSE
= 135oC/W
R
θ
JA
T
= 25oC
0.01
A
0.1 1 10 100
V
10s
DC
, DRAIN-SOURCE VOLTAGE (V)
DS
1s
10ms
100ms
LIMIT
DS(ON)
100μs
1ms
50
40
30
20
10
P(pk), PEAK TRANSIENT POWER (W)
0
0.001 0.01 0.1 1 10 100 1000
, TIME (sec)
t
1
SINGLE PULSE R
Figure 9. Maximum Safe Operating Area. Figure 10. Single Pulse Maximum
Power Dissipation.
f = 1MHz
V
GS
= 135°C/W
JA
θ
T
= 25°C
A
= 0 V
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1
D = 0.5
0.2
0.1
0.01
r(t), NORMALIZED EFFECTIVE
TRANSIENT THERMAL RESISTANCE
0.001
0.0001 0.001 0.01 0.1 1 10 100 1000
0.1
0.05
0.02
0.01
SINGLE PULSE
TIME (sec
t
R
(t) = r(t) * R
JA
θ
R
= 135°C/W
JA
θ
P(pk
t
1
t
2
T
- TA = P * R
J
Duty Cycle, D = t
JA
θ
(t)
JA
θ
/ t
1
2
Figure 11. Transient Thermal Response Curve.
Thermal characterization performed using the conditions described in Note 1c. Transient thermal response will change depending on the circuit board design.
FDS6911 Rev C1 www.fairchildsemi.com
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tm
®
™
tm
tm
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TRADEMARKS
The following includes registered and unregistered trademar ks and service marks, owned by Fair child Semicondu ctor and/or its glo bal subsidiaries, and is no t intended to be an exhaustive list of all such trademarks.
2Cool™ AccuPower™ Auto-SPM™ AX-CAP™*
®
BitSiC Build it Now™ CorePLUS™ CorePOWER™ CROSSVOLT™ CTL™ Current Transfer Logic™ DEUXPEED Dual Cool™ EcoSPARK EfficentMax™ ESBC™
Fairchild Fairchild Semiconductor FACT Quiet Series™ FACT FAST FastvCore™ FETBench™ FlashWriter
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FD
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LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used here in:
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Datasheet Identification Product Status Definition
Advance Information Formative / In Design
Preliminary First Production
No Identification Needed Full Production
Obsolete Not In Production
.
Datasheet contains the design specifications for product development. Specifications may change in any manner without notice.
Datasheet contains preliminary data; supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design.
Datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve the design.
Datasheet contains specifications on a product that is discontinued by Fairchild Semiconductor. The datasheet is for reference information only.
2. A critical component in any component of a life support, device, or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
Rev. I60
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