These N-Channel Logic Level MOSFETs are produced
using Fairchild Semiconductor’s advanced
PowerTrench process that has been espec ially tailored
to minimize the on-state resistance and yet maintain
superior switching performance.
These devices are well suited for low voltage and
battery powered applications where low in-line power
loss and fast switching are required.
Features
• 7.5 A, 30 V. R
R
• Fast switching speed
• Low gate charge
• High performance trench technology for extremely
low R
• High power and current handling capability
DS(ON)
= 13 mΩ @ VGS = 10 V
DS(ON)
= 17 mΩ @ VGS = 4.5 V
DS(ON)
D1
D
D1
D
D2
D
D2
D
SO-8
G2
Pin 1
SO-8
S2
S
Absolute Maximum Ratings
G1
G
S1
S
S
TA=25oC unless otherwise noted
5
Q1
6
7
Q2
8
4
3
2
1
Symbol Parameter Ratings Units
V
Drain-Source Voltage 30 V
DSS
V
Gate-Source Voltage
GSS
ID Drain Current – Continuous
– Pulsed 20
PD
TJ, T
STG
Power Dissipation for Single Operation
Operating and Storage Junction Temperature Range –55 to +150
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics
BV
Drain–Source Breakdown Voltage
DSS
∆BV
DSS
∆T
J
I
Zero Gate Voltage Drain Current VDS = 24 V, VGS = 0 V
DSS
I
Gate–Source Leakage
GSS
On Characteristics
V
GS(th)
∆V
GS(th)
∆TJ
R
DS(on)
Breakdown Voltage Temperature
Coefficient
(Note 2)
Gate Threshold Voltage
Gate Threshold Voltage
Temperature Coefficient
Static Drain–Source
On–Resistance
I
On–State Drain Current VGS = 10 V, VDS = 5 V 20 A
D(on)
= 0 V, ID = 250 µA
V
GS
= 250 µA, Referenced to 25°C
I
D
= 24 V, VGS = 0 V, TJ = 55°C
V
DS
= ±20 V, VDS = 0 V
V
GS
= VGS, ID = 250 µA
V
DS
= 250 µA, Referenced to 25°C
I
D
VGS = 10 V, ID = 7.5 A
V
= 4.5 V, ID = 6.5 A
GS
= 10 V, ID = 7.5 A,TJ = 125°C
V
GS
gFS Forward Transconductance VDS = 5 V, ID = 7.5 A 36 S
30 V
28
1
10
±100
mV/°C
µA
nA
1 1.8 3 V
–4.7
10.6
13
14.5
13
17
20
mV/°C
mΩ
Dynamic Characteristics
C
Input Capacitance
iss
C
Output Capacitance
oss
C
Revers e T rans fer Capacitance
rss
RG Gate Resistance
Switching Characteristics
t
Turn–On Delay Time
d(on)
(Note 2)
tr Turn–On Rise Time
t
Turn–Off Delay Time
d(off)
V
= 15 V, V
DS
= 0 V,
GS
f = 1.0 MHz
V
= 15 mV, f = 1.0 MHz
GS
V
= 15 V, ID = 1 A,
DD
V
= 10 V, R
GS
GEN
= 6 Ω
tf Turn–Off Fall Time
Q
Total Gate Charge at Vgs=10V 17 24 nC
g(TOT)
Qg Total Gate Charge at Vgs=5V 9 13 nC
Qgs Gate–Source Charge 3.1 nC
V
= 15 V, ID = 7.5 A,
DD
Qgd Gate–Drain Charge
1130 pF
300 pF
100 pF
2.4
9 18 ns
5 10 ns
26 42 ns
7 14 ns
Ω
2.7 nC
FDS6910 Rev B(W)
Page 3
Electrical Characteristics TA = 25°C unless otherwise noted
Symbol Parameter Test Conditions Min Typ Max Units
Drain–Source Diode Characteristics and Maximum Ratings
IS Maximum Continuous Drain–Source Diode Forward Current 1.3 A
VSD Drain–Source Diode Forward
Voltage
trr Diode Reverse Recovery Tim e 24 nS
Qrr Diode Reverse Recovery Charge
Notes:
1. R
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of
Figure 9. Maximum Safe Operating Area. Figure 10. Single Pulse Maximum
Power Dissipation.
f = 1MHz
V
= 0 V
GS
= 135°C/W
θJA
T
= 25°C
A
1
r(t), NORMALIZED EFFECTIVE
TRANSIENT THERMAL RESISTANCE
0.001
0.1
0.01
D = 0.5
0.2
0.1
0.05
0.02
0.01
SINGLE PULSE
R
(t) = r(t) * R
JA
θ
R
= 135°C/W
JA
θ
P(pk
t
1
t
2
T
- TA = P * R
J
Duty Cycle, D = t
JA
θ
(t)
JA
θ
/ t
1
2
0.00010.0010.010.11101001000
TIME (sec
t
Figure 11. Transient Thermal Response Curve.
Thermal characterization performed using the conditions described in Note 1c.
Transient thermal response will change depending on the circuit board design.
FDS6910 Rev B(W)
Page 6
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is
not intended to be an exhaustive list of all such trademarks.
Across the board. Around the world.™
The Power Franchise
Programmable Active Droop™
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE T O ANY
PRODUCTS HEREIN TO IMPROVE RELIABILITY , FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY
ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT
CONVEY ANY LICENSE UNDER ITS PA TENT RIGHTS, NOR THE RIGHTS OF OTHERS.
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORA TION.
As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant into
the body, or (b) support or sustain life, or (c) whose
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
reasonably expected to result in significant injury to the
user.
PRODUCT STA TUS DEFINITIONS
Definition of Terms
Datasheet IdentificationProduct StatusDefinition
Advance Information
Preliminary
No Identification Needed
Formative or
In Design
First Production
Full Production
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. I13
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