This P-Channel MOSFET is a rugged gate version of
Fairchild Semiconductor’s advanced PowerTrench
process. It has been optimized f or power management
applications requiring a wide range of gate drive voltage
ratings (4.5V – 25V).
Applications
• Power management
• Load switch
• Battery protection
D
D
D
D
D
D
D
D
SO-8
Pin 1
SO-8
S
Absolute Maximum Ratings
G
G
S
S
S
S
S
TA=25oC unless otherwise noted
Features
• –11 A, –30 V RR
• Low gate charge
• Fast switching speed
• High performance trench technology for extremely
low R
• High power and current handling capability
DS(ON)
5
6
7
8
= 13 mΩ @ VGS = –10 V
DS(ON)
= 19 mΩ @ VGS = –4.5 V
DS(ON)
4
3
2
1
Symbol Parameter Ratings Units
V
Drain-Source Voltage –30 V
DSS
V
Gate-Source Voltage
GSS
ID Drain Current – Continuous
– Pulsed –50
PD
TJ, T
STG
Power Dissipation for Single Operation
Operating and Storage Junction Temperature Range –55 to +175
This datasheet has been downloaded fromhttp://www.digchip.comat thispage
°C/W
°C/W
°C/W
FDS6675A Rev C (W)
Page 2
FDS6675A
Electrical Characteristics
TA = 25°C unless otherwise noted
Symbol Parameter Test Conditions MinTyp Max Units
Off Characteristics
BV
Drain–Source Breakdown Voltage
DSS
∆BV
∆T
I
Zero Gate Voltage Drain Current VDS = –24 V, VGS = 0 V –10
DSS
I
Gate–Body Leakage VGS = ±25 V, VDS = 0 V ±100 nA
GSS
On Characteristics
V
GS(th)
∆V
GS(th)
∆TJ
R
DS(on)
Breakdown Voltage Temperature
DSS
Coefficient
J
(Note 2)
Gate Threshold Voltage
Gate Threshold Voltage
Temperature Coefficient
Static Drain–Source
On–Resistance
I
On–State Drain Current VGS = –10 V, VDS = –5 V –50 A
D(on)
= 0 V, ID = –250 µA
V
GS
I
= –250 µA, Referenced to 25°C
D
= VGS, ID = –250 µA
V
DS
I
= –250 µA, Referenced to 25°C
D
VGS = –10 V, ID = –11 A
= –4.5 V, ID = –9 A
V
GS
= –10 V, ID = –11 A, TJ=125°C
V
GS
gFS Forward Transconductance VDS = –5 V, ID = –11 A 34 S
–30 V
–23
mV/°C
µA
–1 –1.6 –3 V
5
10
15
14
13
19
18
mV/°C
mΩ
Dynamic Characteristics
C
Input Capacitance 2330 pF
iss
C
Output Capacitance 610 pF
oss
C
Reverse Transfer Capacitance
rss
Rg Gate Resistance
Switching Characteristics
t
Turn–On Delay Time 14 25 ns
d(on)
(Note 2)
tr Turn–On Rise Time 12 22 ns
t
Turn–Off Delay Time 70 110 ns
d(off)
tf Turn–Off Fall Time
Qg Tot al Gate Charge 24 34 nC
Qgs Gate–Source Charge 6 nC
Qgd Gate–Drain Charge
V
= –15 V, V
DS
= 0 V,
GS
f = 1.0 MHz
V
=15 mV f= 1.0 MHz
GS
V
= –15 V, ID = –1 A,
DD
= –10 V, R
V
GS
V
= –15 V, ID = –11 A,
DS
V
= –5 V
GS
GEN
= 6 Ω
300 pF
4
mΩ
37 60 ns
9 nC
Drain–Source Diode Characteristics and Maximum Ratings
IS Maximum Continuous Drain–Source Diode Forward Current –2.1 A
VSD Drain–Source Diode Forward Voltage VGS = 0 V, IS = –2.1 A
trr Diode Reverse Recovery Time 33 ns
Qrr Diode Reverse Recovery Charge
Notes:
1. R
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of
Figure 9. Maximum Safe Operating Area. Figure 10. Single Pulse Maximum
Power Dissipation.
1
D = 0.5
0.2
0.1
0.1
0.05
0.02
0.01
r(t), NORMALIZED EFFE CT IVE
0.001
TRANSIENT THERMAL RESISTANCE
0.00010.0010.010.11101001000
0.01
SINGLE PULSE
t
, TIME (sec)
1
R
(t) = r(t) * R
θJA
R
= 125oC/W
θJA
P(pk
t
1
t
2
T
- TA = P * R
J
Duty Cycle, D = t
θJA
(t)
θJA
/ t
1
2
Figure 11. Transient Thermal Response Curve.
Thermal characterization performed using the conditions described in Note 1c.
Transient thermal response will change depending on the circuit board design.
FDS6675A Rev C (W)
Page 5
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is
not intended to be an exhaustive list of all such trademarks.
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER
NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD
DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT
RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant into
the body, or (b) support or sustain life, or (c) whose
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
reasonably expected to result in significant injury to the
user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet IdentificationProduct StatusDefinition
Advance Information
Preliminary
No Identification Needed
Formative or
In Design
First Production
Full Production
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. I2
Loading...
+ hidden pages
You need points to download manuals.
1 point = 1 manual.
You can buy points or you can get point for every manual you upload.