This P-Channel 2.5V specified MOSFET is in a rugged
gate version of Fairchild Semiconductor's advanced
PowerTrench
management applications with a wide range of gate
drive voltage (2.5V - 12V).
®
®
process. It has been optimized for power
Applications
Load switch
•
• Battery protection
• Power management
–11 A, –20 V. R
R
• Extended V
•
Low gate charge (43nC typical).
• Fast switching speed.
• High performance trench technology for extremely
low R
DS(ON)
= 0.014 :@ VGS = –4.5 V
DS(ON)
= 0.020 :@ VGS = –2.5 V
DS(ON)
range (r12V) for battery applications.
GSS
.
• High power and current handling capability.
• RoHS Compliant.
D
D
D
D
G
S
SO-8
S
S
Absolute Maximum RatingsT
=25oC unless otherwise noted
A
5
6
7
8
4
3
2
1
Symbol ParameterRatings Units
V
DSS
V
GSS
I
D
P
D
TJ, T
STG
Drain-Source Voltage –20V
Gate-Source Voltage
Drain Current – Continuous (Note 1a)–11A
– Pulsed–50
Power Dissipation for Single Operation
Operating and Storage Junction Temperature Range –55 to +150
On–State Drain Current VGS = –4.5 V, VDS = –5 V –25A
Forward Transconductance VDS = –4.5 V, ID = –11 A 50S
–0.6–0.83–1.5V
3.5
8.2
11.5
11.1
mV/qC
14
20
23
Dynamic Characteristics
C
iss
C
oss
C
rss
Input Capacitance 4044pF
Output Capacitance 955pF
V
= –10 V, V
DS
f = 1.0 MHz
GS
= 0 V,
504Reverse Transfer Capacitance pF
Switching Characteristics (Note 2)
= –10 V, ID = –1 A,
t
t
t
t
Q
Q
Q
d(on)
r
d(off)
f
Turn–On Delay Time 1832ns
Turn–On Rise Time 1731ns
Turn–Off Delay Time 124198ns
Turn–Off Fall Time
g
gs
gd
Total Gate Charge 4360nC
Gate–Source Charge 7nC
Gate–Drain Charge
V
DD
V
= –4.5 V, R
GS
= –10 V, ID = –11 A,
V
DS
= –4.5 V
V
GS
GEN
= 6 :
79126ns
12nC
Drain–Source Diode Characteristics and Maximum Ratings
I
S
V
SD
Notes:
1. R
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of
TJA
the drain pins. R
Maximum Continuous Drain–Source Diode Forward Current –2.1A
Drain–Source Diode Forward
Figure 9. Maximum Safe Operating Area. Figure 10. Single Pulse Maximum
Power Dissipation.
1
D = 0.5
R
(t) = r(t) + R
JA
P(pk)
T
R
= 125 Ⱌ/W
JA
T
t
0.1
0.2
0.1
0.05
0.02
0.01
0.01
- TA = P * R
T
SINGLE PULSE
r(t), NORMALIZED EFFECTIVE
TRANSIENT THERMAL RESISTANCE
0.001
0.00010.0010.010.111001000
10
J
Duty Cycle, D = t
JA
T
1
t
2
(t)
JA
T
/ t
1
2
Figure 11. Transient Thermal Response Curve.
Thermal characterization performed using the conditions described in Note 1c.
Transient thermal response will change depending on the circuit board design.
FDS6576 Rev E3
Page 5
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not
intended to be an exhaustive list of all such trademarks.
ACEx™
ActiveArray™
Bottomless™
Build it Now™
CoolFET™
CROSSVOLT™
DOME™
EcoSPARK™
2
CMOS™
E
EnSigna™
®
FACT
®
FAST
FASTr™
FPS™
FRFET™
Across the board. Around the world.™
The Power Franchise
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS
HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE
APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS
PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S
WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.
®
UniFET™
VCX™
Wire™
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS
WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the body, or
(b) support or sustain life, or (c) whose failure to perform
when properly used in accordance with instructions for use
provided in the labeling, can be reasonably expected to
result in significant injury to the user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
2. A critical component is any component of a life support
device or system whose failure to perform can be
reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
Datasheet IdentificationProduct StatusDefinition
Advance InformationFormative or In
Design
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
PreliminaryFirst ProductionThis datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
No Identification NeededFull ProductionThis datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
ObsoleteNot In ProductionThis datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. I22
FDS6576 Rev E3
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