Datasheet FDS5672 Datasheet (Fairchild)

Page 1
60V, 12A, 10mΩ
FDS5672 N-Channel PowerTrench
July 2005
Features
rrHigh performance trench technology for extremely low
r
Low gate chargeHigh power and current handling capability
DS(ON)
DS(ON)
DS(ON)
= 10mΩ, V = 14mΩ, V
= 10V, ID = 12A
GS
= 6V, ID = 10A
GS
Applications
DC/DC converters
General Description
This N-Channel MOSFET has been designed specifically to improve the overall efficiency of DC/DC converters using either synchronous or conventional switching PWM controllers. It has been optimized for low gate charge, low r
and fast switching speed.
DS(ON)
®
MOSFET
Branding Dash
1
2
3
4
©2005 Fairchild Semiconductor Corporation FDS5672 Rev. A
SO-8
5
5
6
7
8
1
4
3
2
1
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Page 2
FDS5672 N-Channel PowerTrench
MOSFET Maximum Ratings T
= 25°C unless otherwise noted
C
Symbol Parameter Ratings Units
V
DSS
V
GS
Drain to Source Voltage 60 V Gate to Source Voltage ±20 V Drain Current
I
D
Continuous (TC = 25 oC, VGS = 10V, R Continuous (TC = 25 oC, VGS = 6V, R
= 50oC/W)
θJA
= 50oC/W) 10
θJA
12 A
Pulsed Figure 4 A
E
AS
P
D
TJ, T
STG
Single Pulse Avalanche Energy (Note 1) 245 mJ Power dissipation 2.5 W Derate above 25oC 20 mW/oC Operating and Storage Temperature -55 to 150
Thermal Characteristics
R
θJC
R
θJA
R
θJA
Thermal Resistance Junction to Case (Note 2) 25 Thermal Resistance Junction to Ambient at 10 seconds (Note 3) 50 Thermal Resistance Junction to Ambient at 1000 seconds (Note 3) 85
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
FDS5672 FDS5672 SO-8 330mm 12mm 2500 units
Electrical Characteristics T
Symbol Parameter Test Conditions Min Typ Max Units
= 25°C unless otherwise noted
C
o
C/W
o
C/W
o
C/W
o
C
®
MOSFET
Off Characteristics
B I
DSS
I
GSS
VDSS
Drain to Source Breakdown Voltage ID = 250µA, VGS = 0V 60 - - V Zero Gate Voltage Drain Current Gate to Source Leakage Current VGS = ±20V - - ±100 nA
On Characteristics
V
GS(TH)
r
DS(ON)
Gate to Source Threshold Voltage VGS = VDS, ID = 250µA 2 - 4 V
Drain to Source On Resistance
Dynamic Characteristics
C C C R Q Q Q Q Q
ISS OSS RSS G
g(TOT) g(TH) gs gs2 gd
Input Capacitance Output Capacitance - 410 - pF Reverse Transfer Capacitance - 130 - pF Gate Resistance VGS = 0.5V, f = 1MHz - 1.4 - Ω Total Gate Charge at 10V VGS = 0V to 10V Threshold Gate Charge VGS = 0V to 2V - 4.2 5.5 nC Gate to Source Gate Charge - 9.4 - nC Gate Charge Threshold to Plateau - 5.2 - nC Gate to Drain “Miller” Charge - 9.3 - nC
VDS = 50V - - 1 VGS = 0V TC = 150oC - - 250
ID = 12A, V
= 10V - 0.0088 0.010
GS
ID = 10A, VGS = 6V, - 0.012 0.014 ID = 12A, V
T
= 150oC
C
VDS = 25V, VGS = 0V,
= 10V,
GS
- 0.016 0.023
- 2200 - pF
f = 1MHz
- 34 45 nC
VDD = 30V ID = 12A Ig = 1.0mA
µA
Ω
©2005 Fairchild Semiconductor Corporation FDS5672 Rev. A
2
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Page 3
Resistive Switching Characteristic s (V
t
ON
t
d(ON)
t
r
t
d(OFF)
t
f
t
OFF
Turn-On Time Turn-On Delay Time - 13 - ns Rise Time - 20 - ns Turn-Off Delay Time - 35 - ns Fall Time - 14 - ns Turn-Off Time - - 64 ns
= 10V)
GS
VDD = 30V, ID = 12A VGS = 10V, RGS = 9.1Ω
- - 50 ns
Drain-Source Diode Characteristics
I
= 12A - - 1.25 V
V
SD
t
rr
Q
RR
Notes: 1: Starting TJ = 25°C, L = 1mH, IAS = 22A, VDD = 60V, VGS = 10V. 2: R
θJA
drain pins. R
3: R
θJA
Source to Drain Diode Voltage Reverse Recovery Time ISD=12A, dISD/dt = 100A/µs - - 39 ns
Reverse Recovered Charge ISD=12A, dISD/dt = 100A/µs - - 40 nC
is the sum of the junction-to-cas e and cas e-to-am bient th ermal r esistance whe re the case therm al refer ence is defined a s the solder mounti ng surface of the is measured with 1.0 in2 copper on FR-4 board.
is guaranteed by design while R
θJC
is determined by the user’s board design.
θJA
SD
ISD = 6A - - 1.0 V
FDS5672 N-Channel PowerTrench
®
MOSFET
©2005 Fairchild Semiconductor Corporation FDS5672 Rev. A
3
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Page 4
FDS5672 N-Channel PowerTrench
Typical Characteristics T
1.2
1.0
0.8
0.6
0.4
0.2
POWER DISSIPATION MULTIPLIER
0
0255075100 150
TA, AMBIENT TEMPERATURE (oC)
Figure 1.
Normalized Power Dissipation vs
= 25°C unless otherwise noted
C
125
Ambient Temperature
2 1
DUTY CYCLE - DESCENDING ORDER
0.5
0.2
0.1
0.05
0.02
0.01
0.1
15
12
9
6
, DRAIN CURRENT (A)
D
I
3
0
25 50 75 100 125 150
TA, AMBIENT TEMPERATURE (oC)
Figure 2.
Maximum Continuous Drain Current vs
V
= 10V
GS
Ambient Temperature
®
MOSFET
, NORMALIZED
θJA
Z
0.01
THERMAL IMPEDANCE
0.001 10
1100
100
, PEAK CURRENT (A)
DM
I
10
-5
10
-5
VGS = 10V
-4
10
Figure 3.
TRANSCONDUCTANCE MAY LIMIT CURRENT IN THIS REGION
-4
10
SINGLE PULSE
NOTES: DUTY FACTOR: D = t
PEAK TJ = PDM x Z
-3
10
-2
10
t, RECTANGULAR PULSE DURATION (s)
-1
10
10
0
1
10
Normalized Maximum Transient Thermal Impedance
TA = 25oC
FOR TEMPERATURES ABOVE 25 CURRENT AS FOLLOWS:
I = I
-3
10
Figure 4.
-2
10
t, PULSE WIDTH (s)
-1
10
Peak Current Capability
0
10
1
10
P
DM
1/t2
x R
θJA
θJA
o
C DERATE PEAK
25
t
1
t
+ T
2
10
150 - T
125
2
10
2
A
3
10
A
3
10
©2005 Fairchild Semiconductor Corporation FDS5672 Rev. A
4
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Page 5
FDS5672 N-Channel PowerTrench
Typical Characteristics T
400
100
10
OPERATION IN THIS
AREA MAY BE
, DRAIN CURRENT (A) I
LIMITED BY r
1
D
SINGLE PULSE TJ = MAX RAT E D
T
= 25oC
A
0.1
0.1 1 10 70
Figure 5.
25
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
20
V
= 15V
DD
15
10
, DRAIN CURRENT (A)
D
I
5
0
3.03.54.04.55.05.5
DS(ON)
, DRAIN TO SOURCE VOLTAGE (V)
V
DS
Forward Bias Safe Operating Area
TJ = 150oC
TJ = 25oC
VGS, GATE TO SOURCE VOLTAGE (V)
= 25°C unless otherwise noted
C
100µs
1ms
10ms
TJ = -55oC
50
If R = 0 tAV = (L)(IAS)/(1.3*RATED BV
If R ≠ 0
= (L/R)ln[(IAS*R)/(1.3*RATED BV
t
AV
10
, AVALANCHE CURRENT (A)
AS
I
1
STARTING TJ = 150oC
tAV, TIME IN AVALANCHE (ms)
- VDD)
DSS
- VDD) +1]
DSS
STARTING TJ = 25oC
1010.1 100
NOTE: Refer to Fairchild Application Notes AN7514 and AN7515
Figure 6.
Unclamped Inductive Switching
Capability
25
, DRAIN CURRENT (A)
D
I
VGS = 6V
20
15
10
5
0
0.20 0.4 0.6 0.8 1.0 VDS, DRAIN TO SOURCE VOLTAGE (V)
VGS = 10V
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
TA = 25oC
VGS = 5V
VGS = 4.5V
®
MOSFET
Figure 7.
15.0
12.5
10.0
7.5
DRAIN TO SOURCE ON RESISTANCE (m Ω)
5.0 036912
Figure 9.
Drain to Source On Resistance vs Drain
Transfer Characteristics Figure 8. Saturation Characteristics
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
I
, DRAIN CURRENT (A)
D
Current
©2005 Fairchild Semiconductor Corporation FDS5672 Rev. A
VGS = 6V
VGS = 10V
5
2.0 PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
1.5
1.0
ON RESISTANCE
NORMALIZED DRAIN TO SOURCE
0.5
-80 -40 0 40 80 120 160 TJ, JUNCTION TEMPERATURE (oC)
Figure 10.
Normalized Drain to Source On
VGS = 10V, ID = 12A
Resistance vs Junction Temperature
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Page 6
FDS5672 N-Channel PowerTrench
Typical Characteristics T
1.2
1.1
1.0
0.9
0.8
NORMALIZED GATE
THRESHOLD VOLTAGE
0.7
0.6
-80 -40 0 40 80 120 160
Figure 11.
TJ, JUNCTION TEMPERATURE (oC)
Normalized Gate Threshold Voltage vs
C
VGS = VDS, ID = 250µA
Junction Temperature
6000
C
= CGS + C
1000
ISS
C
OSS
≅ C
DS
+ C
GD
GD
= 25°C unless otherwise noted
1.10
1.05
1.00
BREAKDOWN VOLTAGE
0.95
NORMALIZED DRAIN TO SOURCE
0.90
Figure 12.
Breakdown Voltage vs Junction Temperature
10
8
6
ID = 250µA
-80 -40 0 40 80 120 160 TJ, JUNCTION TEMPERATURE (oC)
Normalized Drain to Source
VDD = 50V
®
MOSFET
C
= C
RSS
GD
C, CAPACITANCE (pF)
100
V
= 0V, f = 1MHz
GS
40
0.1 11060 VDS, DRAIN TO SOURCE VOLTAGE (V)
Figure 13.
Capacitance vs Drain to Source
Voltage
4
, GATE TO SOURCE VOLTAGE (V)
2
GS
V
0
0 5 10 15 20 25 30 35
Figure 14.
Gate Charge Waveforms for Constant
Qg, GATE CHARGE (nC)
WAVEFORMS IN DESCENDING ORDER:
ID = 12A I
= 1A
D
Gate Currents
©2005 Fairchild Semiconductor Corporation FDS5672 Rev. A
6
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Page 7
Test Circuits and Waveforms
FDS5672 N-Channel PowerTrench
TO OBTAIN
VARY t
P
REQUIRED PEAK I
V
GS
t
0V
P
Figure 15.
I
g(REF)
V
DS
L
0.01Ω
+
V
DD
-
0
R
AS
G
DUT
I
AS
Unclamped Energy Test Circuit Figure 16.
V
DS
L
V
GS
DUT
+
V
DD
-
V
DD
V
GS
V
= 2V
GS
0
Q
g(TH)
I
g(REF)
0
BV
DSS
t
P
I
AS
t
AV
Unclamped Energy Waveforms
Q
g(TOT)
V
DS
Q
gs2
Q
gs
Q
gd
V
DS
V
DD
®
MOSFET
V
= 10V
GS
Figure 17.
V
GS
Figure 19.
©2005 Fairchild Semiconductor Corporation FDS5672 Rev. A
Gate Charge Test Circuit Figure 18.
V
GS
R
GS
Switching Time Test Circuit Figure 20.
Gate Charge Waveforms
V
DS
R
DUT
L
+
V
DD
-
V
DS
0
V
GS
10%
0
t
d(ON)
90%
t
ON
50%
10%
t
r
PULSE WIDTH
t
d(OFF)
90%
t
OFF
50%
t
f
90%
10%
Switching Time Waveforms
7
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Page 8
Thermal Resistance vs. Mounting Pad Area
The maximum rated junction temperature, TJM, and the thermal resistance of the heat dissipating path determines the maximum allowable device power dissipation, P application. Therefore the application’s ambient temperature, T must be reviewed to ensure that T Equation 1 mathematically represents the relationship and
(oC), and thermal resistance R
A
is never exceeded.
JM
serves as the basis for establishing the rating of the part.
P
TJMTA–()
------------------------------ -=
DM
R
θJA
In using surface mount devices such as the SO8 package, the environment in which it is applied will have a significant influence on the part’s current and maximum power dissipation ratings. Precise determination of P and influenced by many factors:
1. Mounting pad area onto which the device is attached and whether there is copper on one side or both sides of the board.
2. The number of copper layers and the thickness of the board.
3. The use of external heat sinks.
4. The use of thermal vias.
5. Air flow and board orientation.
6. For non steady state applications, the pulse width, the duty cycle and the transient thermal response of the part, the board and the environment they are in.
Fairchild provides thermal information to assist the designer’s preliminary application evaluation. Figure 21 defines the R copper (component side) area. This is for a horizontally
for the device as a function of the top
θJA
positioned FR-4 board with 1oz copper after 1000 seconds of steady state power with no air flow. This graph provides the necessary information for calculation of the steady state junction temperature or power dissipation. Pulse applications can be evaluated using the Fairchild device Spice thermal model or manually utilizing the normalized
150
COPPER BOARD AREA - DESCENDING ORDER
2
0.04 in
2
0.28 in
120
C/W)
o
90
, THERMAL
60
θJA
Z
IMPEDANCE (
30
0.52 in
0.76 in
1.00 in
2 2 2
DM
(oC/W)
θJA
(EQ. 1)
is complex
DM
, in an
maximum transient thermal impedance curve. Thermal resistances corresponding to other copper areas
can be obtained from Figure 21 or by calculation using Equation 2. The area, in square inches is the top copper area including the gate and source pads.
θJA
64
R
The transient thermal impedance (Z varied top copper board area. Figure 22 shows the effect of
26
+=
-------------------------------
0.23 Area+
(EQ. 2)
) is also effected by
θJA
copper pad area on single pulse transient thermal impedance. Each trace represents a copper pad area in square inches corresponding to the descending list in the graph. Spice and SABER thermal models are provided for each of the listed pad areas.
Copper pad area has no perceivable effect on transient thermal impedance for pulse widths less than 100ms. For pulse widths less than 100ms the transient thermal impedance is determined by the die and package. Therefore, CTHERM1 through CTHERM5 and RTHERM1 through RTHERM5 remain constant for each of the thermal models. A listing of the model component values is available in Table 1.
200
R
= 64 + 26/(0.23+Area)
θJA
150
C/W)
o
(
θJA
R
100
50
0.001 0.01 0.1 1 10
AREA, TOP COPPER AREA (in2)
Figure 21. Thermal Resistance vs Mounting
Pad Area
FDS5672 N-Channel PowerTrench
®
MOSFET
0
-1
10
Figure 22. Thermal Impedance vs Mounting Pad Area
©2005 Fairchild Semiconductor Corporation FDS5672 Rev. A
0
10
t, RECTANGULAR PULSE DURATION (s)
1
10
8
2
10
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3
10
Page 9
PSPICE Electrical Model
E
.SUBCKT FDS5672 2 1 3 ; rev June 2005 Ca 12 8 7e-10 Cb 15 14 7e-10 Cin 6 8 2.2e-10
Dbody 7 5 DbodyMOD Dbreak 5 11 DbreakMOD Dplcap 10 5 DplcapMOD
Ebreak 11 7 17 18 67 Eds 14 8 5 8 1 Egs 13 8 6 8 1 Esg 6 10 6 8 1 Evthres 6 21 19 8 1 Evtemp 20 6 18 22 1
It 8 17 1 Lgate 1 9 1.23e-9
Ldrain 2 5 1.0e-9 Lsource 3 7 0.18e-9
RLgate 1 9 12.3 RLdrain 2 5 10 RLsource 3 7 1.8
Mmed 16 6 8 8 MmedMOD Mstro 16 6 8 8 MstroMOD Mweak 16 21 8 8 MweakMOD
Rbreak 17 18 RbreakMOD 1 Rdrain 50 16 RdrainMOD 1e-3 Rgate 9 20 1.4 RSLC1 5 51 RSLCMOD 1.0e-6 RSLC2 5 50 1.0e3 Rsource 8 7 RsourceMOD 3.2e-3 Rvthres 22 8 RvthresMOD 1 Rvtemp 18 19 RvtempMOD 1 S1a 6 12 13 8 S1AMOD S1b 13 12 13 8 S1BMOD S2a 6 15 14 13 S2AMOD S2b 13 15 14 13 S2BMOD
Vbat 22 19 DC 1 ESLC 51 50 VALUE={(V(5,51)/ABS(V(5,51)))*(PWR(V(5,51)/(1e-6*250),2.5))} .MODEL DbodyMOD D (IS=4.5E-12 RS=4.7e-3 TRS1=1.5e-3 TRS2=2e-5
+ CJO=1.6e-9 M=0.55 TT=1.8e-8 XTI=3.0) .MODEL DbreakMOD D (RS=2.5 TRS1=1.0e-3 TRS2=1e-6) .MODEL DplcapMOD D (CJO=6.0e-10 IS=1.0e-30 N=10 M=0.45 )
.MODEL MmedMOD NMOS (VTO=3.35 KP=4 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=1.4) .MODEL MstroMOD NMOS (VTO=3.93 KP=50 IS=1e-30 N=10 TOX=1 L=1u W= 1u) .MODEL MweakMOD NMOS (VTO=2.82 KP=0.04 IS=1 e-30 N=10 TOX=1 L=1u W=1u RG=14 RS=0.1)
.MODEL RbreakMOD RES (TC1=7e-4 TC2=-1.3e-7) .MODEL RdrainMOD RES (TC1=1.0e-4 TC2=1e-5) .MODEL RSLCMOD RES (TC1=1.0e-2 TC2=1e-7) .MODEL RsourceMOD RES (TC1=1.0e-2 TC2=1.0e-6) .MODEL RvthresMOD RES (TC1=-3.9e-3 TC2=-1.4e-5) .MODEL RvtempMOD RES (TC1=-4e-3 TC2=2e-7)
.MODEL S1AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-4.0 VOFF=-2.0) .MODEL S1BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-2.0 VOFF=-4.0) .MODEL S2AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-0.5 VOFF=0) .MODEL S2BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=0 VOFF=-0.5)
.ENDS Note: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global Temperature Options; IEEE Power Electronics Specialist Conference Records, 1991, written by William J. Hepp and C. Frank Wheatley.
17 18
7
RLSOURCE
RVTEMP 19
-
+
22
LDRAIN
RLDRAIN
DBODY
LSOURCE
VBAT
DRAIN
2
SOURC
3
GATE
1
LGATE
RLGATE
RGATE
9
CA
ESG
+
EVTEMP +
18 22
20
S1A
12
13
8
S1B
EGS EDS
DPLCAP
10
RSLC2
­6
8
EVTHRES
+
6
-
S2A
14 13
S2B
13
+
+
6 8
-
-
5
RSLC1
51
+
5
ESLC
51
­50
RDRAIN
16
21
-
19
8
MSTRO
CIN
15
CB
8
14
+
5 8
-
MMED
8
DBREAK
11
+
EBREAK
-
MWEAK
RSOURCE
RBREAK
17 18
IT
RVTHRES
FDS5672 N-Channel PowerTrench
®
MOSFET
©2005 Fairchild Semiconductor Corporation FDS5672 Rev. A
9
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Page 10
SABER Electrical Model
REV June 2005 ttemplate FDS5672 n2,n1,n3 electrical n2,n1,n3 { var i iscl dp..model dbodymod = (isl=4.5e-12,rs=4.7e-3,trs1=1.5e-3,trs2=2e-5,cjo=1.6e-9,m=0.55,tt=1.8e-8,xti=3.0) dp..model dbreakmod = (rs=2.5,trs1=1e-4,trs2=1e-6) dp..model dplcapmod = (cjo=6.0e-10,isl=10.0e-30,nl=10,m=0.45) m..model mmedmod = (type=_n,vto=3.35,kp=4,is=1e-30, tox=1) m..model mstrongmod = (type=_n,vto=3.93,kp=50,is=1e-30 , tox=1) m..model mweakmod = (type=_n,vto=2.82,kp=0.04,is=1e-30, tox=1,rs=0.1) sw_vcsp..model s1amod = (ron=1e-5,roff=0.1,von=-4.0,voff=-2.0) sw_vcsp..model s1bmod = (ron=1e-5,roff=0.1,von=-2.0,voff=-4.0) sw_vcsp..model s2amod = (ron=1e-5,roff=0.1,von=-0.5,voff=0) sw_vcsp..model s2bmod = (ron=1e-5,roff=0.1,von=0,voff=-0.5) c.ca n12 n8 = 7e-10 c.cb n15 n14 = 7e-10 c.cin n6 n8 = 2.2e-9
dp.dbody n7 n5 = model=dbodymod dp.dbreak n5 n11 = model=dbreakmod dp.dplcap n10 n5 = model=dplcapmod
spe.ebreak n11 n7 n17 n18 = 67 spe.eds n14 n8 n5 n8 = 1 spe.egs n13 n8 n6 n8 = 1 spe.esg n6 n10 n6 n8 = 1
GATE
1
spe.evthres n6 n21 n19 n8 = 1
LGATE
9
RLGATE
RGATE
ESG
EVTEMP +
18 22
20
spe.evtemp n20 n6 n18 n22 = 1 i.it n8 n17 = 1
CA
S1A
12
S1B
l.lgate n1 n9 = 1.23e-9 l.ldrain n2 n5 = 1.0e-9 l.lsource n3 n7 = 0.18e-9
res.rlgate n1 n9 = 12.3 res.rldrain n2 n5 = 10 res.rlsource n3 n7 = 1.8
m.mmed n16 n6 n8 n8 = model=mmedmod, l=1u, w=1u m.mstrong n16 n6 n8 n8 = model=mstrongmod, l=1u, w=1u m.mweak n16 n21 n8 n8 = model=mweakmod, l=1u, w=1u
res.rbreak n17 n18 = 1, tc1=7e-4,tc2=-1.3e-7 res.rdrain n50 n16 = 1e-3, tc1=1e-4,tc2=1e-5 res.rgate n9 n20 = 1.4 res.rslc1 n5 n51 = 1e-6, tc1=1e-2,tc2=1e-7 res.rslc2 n5 n50 = 1e3 res.rsource n8 n7 = 3.2e-3, tc1=1e-2,tc2=1e-6 res.rvthres n22 n8 = 1, tc1=-3.9e-3,tc2=-1.4e-5 res.rvtemp n18 n19 = 1, tc1=-4e-3,tc2=2e-7 sw_vcsp.s1a n6 n12 n13 n8 = model=s1amod sw_vcsp.s1b n13 n12 n13 n8 = model=s1bmod sw_vcsp.s2a n6 n15 n14 n13 = model=s2amod sw_vcsp.s2b n13 n15 n14 n13 = model=s2bmod
v.vbat n22 n19 = dc=1 equations { i (n51->n50) +=iscl iscl: v(n51,n50) = ((v(n5,n51)/(1e-9+abs(v(n5,n51))))*((abs(v(n5,n51)*1e6/250))** 2.5)) } }
DPLCAP
10
RSLC2
­6
8
EVTHRES
+
+
19
8
6
-
S2A
14
13
13
8
S2B
13
+
+
6
EGS EDS
8
-
-
15
CIN
CB
-
+
5 8
-
5
RSLC1
51
50 RDRAIN
21
MSTRO
14
ISCL
16
8
MMED
8
DBREAK
11
MWEAK
EBREAK
+
RSOURCE
RBREAK
17 18
IT
RVTHRES
-
17 18
7
RVTEMP 19
-
+
22
LDRAIN
RLDRAIN
DBODY
LSOURCE
RLSOURCE
VBAT
DRAIN
2
SOURCE
3
FDS5672 N-Channel PowerTrench
®
MOSFET
©2005 Fairchild Semiconductor Corporation FDS5672 Rev. A
10
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Page 11
SPICE Thermal Model
REV June 2005 FDS5672_JA Junction Ambient
Copper Area = 1sq.in CTHERM1 TH 8 2e-3
CTHERM2 8 7 5e-3 CTHERM3 7 6 1e-2 CTHERM4 6 5 4e-2 CTHERM5 5 4 9e-2 CTHERM6 4 3 2e-1 CTHERM7 3 2 1 CTHERM8 2 TL 3
RTHERM1 TH 8 1e-1 RTHERM2 8 7 5e-1 RTHERM3 7 6 1 RTHERM4 6 5 5 RTHERM5 5 4 8 RTHERM6 4 3 12 RTHERM7 3 2 18 RTHERM8 2 TL 25
SABER Thermal Model
SABER thermal model FDS5672 Copper Area = 1sq.in template thermal_ model th tl thermal_c th, tl { ctherm.ctherm1 th 8 =2e-3 ctherm.ctherm2 8 7 =5e-3 ctherm.ctherm3 7 6 =1e-2 ctherm.ctherm4 6 5 =4e-2 ctherm.ctherm5 5 4 =9e-2 ctherm.ctherm6 4 3 =2e-1 ctherm.ctherm7 3 2 =1 ctherm.ctherm8 2 tl =3
rrtherm.rtherm1 th 8 =1e-1 rtherm.rtherm2 8 7 =5e-1 rtherm.rtherm3 7 6 =1 rtherm.rtherm4 6 5 =5 rtherm.rtherm5 5 4 =8 rtherm.rtherm6 4 3 =12 rtherm.rtherm7 3 2 =18 rtherm.rtherm8 2 tl =25 }
RTHERM1
RTHERM2
RTHERM3
RTHERM4
RTHERM5
RTHERM6
RTHERM7
RTHERM8
th
8
7
6
5
4
3
2
JUNCTION
CTHERM1
CTHERM2
CTHERM3
CTHERM4
CTHERM5
CTHERM6
CTHERM7
CTHERM8
FDS5672 N-Channel PowerTrench
®
MOSFET
tl
AMBIENT
T ABLE 1. THERMAL MODELS
COMPONANT 0.04 in
2
0.28 in
2
0.52 in
2
0.76 in
2
1.0 in
2
CTHERM6 1.2e-1 1.5e-1 2.0e-1 2.0e-1 2.0e-1
CTHERM7 0.5 1.0 1.0 1.0 1.0
CTHERM8 1.3 2.8 3.0 3.0 3.0
RTHERM62620151312
RTHERM73924211918
RTHERM8 55 38.7 31.3 29.7 25
©2005 Fairchild Semiconductor Corporation FDS5672 Rev. A
11
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Page 12
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks.
ACEx™ ActiveArray™ Bottomless™ CoolFET™ CROSSVOLT™ DOME™ EcoSPARK™
2
CMOS™
E EnSigna™ FACT™
Across the board. Around the world.™ The Power Franchise
FACT Quiet Series™
®
FAST FASTr™ FPS™ FRFET™ GlobalOptoisolator™ GTO™ HiSeC™
2
C™
I
i-Lo™
®
Programmable Active Droop™
ImpliedDisconnect™ IntelliMAX™ ISOPLANAR™ LittleFET™ MICROCOUPLER™ MicroFET™ MicroPak™ MICROWIRE™ MSX™ MSXPro™ OCX™ OCXPro™ OPTOLOGIC
®
OPTOPLANAR™ PACMAN™
POP™ Power247™ PowerEdge™ PowerSaver™ PowerTrench QFET
®
®
QS™ QT Optoelectronics™ Quiet Series™ RapidConfigure™ RapidConnect™ µSerDes™ SILENT SWITCHER SMART START™ SPM™
Stealth™ SuperFET™ SuperSOT™-3 SuperSOT™-6 SuperSOT™-8 SyncFET™ TinyLogic TINYOPTO™ TruTranslation™ UHC™ UltraFET UniFET™
®
VCX™
®
®
FDM3622 N-Channel PowerTrench
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, or (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in significant injury to the user.
2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
PRODUCT STATUS DEFINITIONS Definition of Terms
Datasheet Identification Product Status Definition
Advance Information Formative or In
Design
Preliminary First Production This datasheet contains preliminary data, and
No Identification Needed Full Production This datasheet contains final specifications. Fairchild
This datasheet contains the design specifications for product development. Specifications may change in any manner without notice.
supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design.
Semiconductor reserves the right to make changes at any time without notice in order to improve design.
®
MOSFET
Obsolete Not In Production This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor. The datasheet is printed for reference information only.
©2005 Fairchild Semiconductor Corporation FDS5672 Rev. A
www.fairchildsemi.com12
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