Datasheet fds4435bz_f085 Datasheet

Page 1
P-Channel PowerTrench® MOSFET
-30V, -8.8A, 20m:
Features
Max r
Max r
Extended V
HBM ESD protection level of ±3.8KV typical (note 3)
High performance trench technology for extremely low r
High power and current handling capability
Termination is Lead-free and RoHS compliant
Qualified to AEC Q101
= 20m: at VGS = -10V, ID = -8.8A
DS(on)
= 35m: at VGS = -4.5V, ID = -6.7A
DS(on)
range (-25V) for battery applications
GSS
DS(on)
July 2009
General Description
This P-Channel MOSFET is produced using Fairchild
®
Semiconductor’s advanced PowerTrench
been especially tailored to minimize the on-state resistance.
This device is well suited for Power Management and load
switching applications common in Notebook Computers and
Portable Battery Packs.
process that has
FDS4435BZ_F085 P-Channel PowerTrench
®
MOSFET
D
D
D
D
G
S
S
Pin 1
SO-8
MOSFET Maximum Ratings T
Symbol Parameter Ratings Units
V
DS
V
GS
I
D
P
D
E
AS
, T
T
J
STG
Drain to Source Voltage -30 V
Gate to Source Voltage ±25 V
Drain Current -Continuous TA= 25°C (Note 1a) -8.8
-Pulsed -50
Power Dissipation TA = 25°C (Note 1a) 2.5
Power Dissipation T
Single Pulse Avalanche Energy (Note 4) 24 mJ
Operating and Storage Junction Temperature Range -55 to +150 °C
S
= 25°C unless otherwise noted
A
D
5
6
D
7
D
8
D
= 25°C (Note 1b) 1.0
A
G
4
3
S
S
2
S
1
Thermal Characteristics
R
TJC
R
TJA
Thermal Resistance, Junction to Case 25
Thermal Resistance, Junction to Ambient (Note 1a) 50
Package Marking and Ordering Information
A
W
°C/W
Device Marking Device Package Reel Size Tape Width Quantity
FDS4435BZ FDS4435BZ
©2009 Fairchild Semiconductor Corporation FDS4435BZ
_F085 Rev.A
_F085 SO-8 13’’
1
12mm 2500units
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Page 2
FDS4435BZ_F085 P-Channel PowerTrench
Electrical Characteristics T
= 25°C unless otherwise noted
J
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics
BV
'BV 'T
I
DSS
I
GSS
DSS
DSS
J
Drain to Source Breakdown Voltage ID = -250PA, VGS = 0V -30 V
Breakdown Voltage Temperature Coefficient
I
= -250PA, referenced to 25°C -21 mV/°C
D
Zero Gate Voltage Drain Current VDS = -24V, VGS= 0V 1 PA
Gate to Source Leakage Current VGS = ±25V, VDS= 0V ±10 PA
On Characteristics
V
GS(th)
'V 'T
r
DS(on)
g
FS
GS(th)
J
Gate to Source Threshold Voltage VGS = VDS, ID = -250PA -1 -2.1 -3 V
Gate to Source Threshold Voltage Temperature Coefficient
Static Drain to Source On Resistance
= -250PA, referenced to 25°C 6 mV/°C
I
D
V
= -10V, ID = -8.8A 16 20
GS
= -4.5V, ID = -6.7A 26 35
GS
= -10V, ID = -8.8A, TJ = 125°C 22 28
V
GS
Forward Transconductance VDS = -5V, ID = -8.8A 24 S
Dynamic Characteristics
C
iss
C
oss
C
rss
R
g
Input Capacitance
Output Capacitance 275 365 pF
Reverse Transfer Capacitance 230 345 pF
V
= -15V, VGS = 0V,
DS
f = 1MHz
1385 1845 pF
Gate Resistance f = 1MHz 4.5 :
Switching Characteristics
t
d(on)
t
r
t
d(off)
t
f
Q
Q
Q
Q
Turn-On Delay Time
Rise Time 612ns
Turn-Off Delay Time 30 48 ns
V
= -15V, ID = -8.8A,
DD
= -10V, R
V
GS
GEN
= 6:
Fall Time 12 22 ns
g
g
gs
gd
Total Gate Charge VGS= 0V to -10V
Total Gate Charge VGS= 0V to -5V 16 23 nC
Gate to Source Charge 5.2 nC
VDD = -15V,
= -8.8A
I
D
Gate to Drain “Miller” Charge 7.4 nC
10 20 ns
28 40 nC
m:V
®
MOSFET
Drain-Source Diode Characteristics
V
SD
t
rr
Q
rr
NOTES:
1. R
TJA
the user's board design.
2. Pulse Test: Pulse Width < 300Ps, Duty cycle < 2.0%.
3. The diode connected between the gate and source serves only as protection against ESD. No gate overvoltage rating is implied.
4. Starting T
©2009 Fairchild Semiconductor Corporation FDS4435BZ
Source to Drain Diode Forward Voltage VGS= 0V, IS= -8.8A (Note 2) -0.9 -1.2 V
Reverse Recovery Time
Reverse Recovery Charge 23 35 nC
is determined with the device moun ted on a 1in2 pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. R
a. 50°C/W when mounted on
2
pad of 2 oz copper.
a 1 in
= 25°C, L = 1mH, IAS = -7A, VDD = -30V, VGS = -10V
J
_F085 Rev.A
= -8.8A, di/dt = 100A/Ps
I
F
2
29 44 ns
is guaranteed by design while R
TJC
b. 125°C/W when mounted on a minimum pad of 2 oz copper.
is determined by
TCA
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Page 3
FDS4435BZ_F085 P-Channel PowerTrench
Typical Characteristics T
50
40
30
20
, DRAIN CURRENT (A)
D
-I
10
0
01234
-VDS, DRAIN TO SOURCE VOLTAGE (V)
Figure 1.
1.6
1.4
On-Region Characteristics Figure 2.
ID = -8.8A V
= -10V
GS
1.2
1.0
NORMALIZED
0.8
DRAIN TO SOURCE ON-RESISTANCE
0.6
-75 -50 -25 0 25 50 75 100 125 150
TJ, JUNCTION TEMPERATURE (oC)
VGS = -10V VGS = -5V
= 25°C unless otherwise noted
J
VGS = -4.5V
VGS = -4V
VGS = -3.5V
PULSE DURATION = 80Ps DUTY CYCLE = 0.5%MAX
4.0
3.5
3.0
2.5
VGS = -3.5V
VGS = -4V
PULSE DURATION = 80Ps DUTY CYCLE = 0.5%MAX
VGS = -4.5V
VGS = -5V
2.0
NORMALIZED
1.5
VGS = -10V
1.0
DRAIN TO SOURCE ON-RESISTANCE
0.5 0 1020304050
-ID, DRAIN CURRENT(A)
N o r m a l i z e d O n - R e s i s t a n c e
vs Drain Current and Gate Voltage
60
ID= -8.8A
50
(m:)
40
, DRAIN TO
30
DS(on)
r
20
SOURCE ON-RESISTANCE
10
246810
-VGS, GATE TO SOURCE VOLTAGE (V)
PULSE DURATION = 80Ps DUTY CYCLE = 0.5%MAX
TJ= 125oC
TJ= 25oC
®
MOSFET
F i g u r e 3 . N o r m a l i z e d O n - R e s i s t a n c e
vs Junction Temperature
50
PULSE DURATION = 80Ps DUTY CYCLE = 0.5%MAX
40
VDS= -5V
30
20
, DRAIN CURRENT (A)
D
10
-I
0
12345
TJ= 25oC
-VGS, GATE TO SOURCE VOLTAGE (V)
Figure 5. Transfer Characteristics
©2009 Fairchild Semiconductor Corporation FDS4435BZ
_F085 Rev.A
TJ= 150oC
TJ =-55oC
Figure 4.
O n - R es i s t a n c e vs G a t e t o
Source Voltage
100
VGS= 0V
10
1
0.1
TJ= 150oC
0.01
0.001
, REVERSE DRAIN CURRENT (A)
S
-I
0.0001
0.0 0.2 0.4 0.6 0.8 1.0 1.2
-VSD, BODY DIODE FORWARD VOLTAGE (V)
Figure 6.
S o u r ce t o D r a i n Di o d e
TJ = 25oC
TJ = -55oC
Forward Voltage vs Source Current
3
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Page 4
FDS4435BZ_F085 P-Channel PowerTrench
Typical Characteristics T
10
ID = -8.8A
8
V
= -10V
DD
6
VDD = -15V
4
2
, GATE TO SOURCE VOLTAGE(V)
GS
-V
0
0 5 10 15 20 25 30
Figure 7.
20
10
, AVALANCHE CURRENT(A)
AS
-I
1
0.01 0.1 1 10
Qg, GATE CHARGE(nC)
Gate Charge Characteristics Figure 8.
TJ= 125oC
tAV, TIME IN AVALANCHE(ms)
= 25°C unless otherwise noted
J
VDD = -20V
TJ= 25oC
30
4000
C
iss
1000
C
oss
CAPACITANCE (pF)
f = 1MHz
= 0V
V
GS
100
0.1 1 10
-VDS, DRAIN TO SOURCE VOLTAGE (V)
C
rss
C a p a c i t a n c e v s D r a i n
to Source Voltage
-4
10
VDS= 0V
-5
10
-6
10
-7
10
-8
10
, GATE LEAKAGE CURRENT(A)
g
-I
-9
10
0 5 10 15 20 25 30
-V
GS
TJ= 125oC
TJ = 25oC
, GATE TO SOURCE VOLTAGE(V)
30
®
MOSFET
Figure 9.
U n c l a m p e d I n d u c t i v e
Switching Capability
10
8
6
4
, DRAIN CURRENT (A)
D
-I
2
R
TJA
0
25 50 75 100 125 150
VGS= -4.5V
= 50oC/W
TA, AMBIENT TEMPERATURE (oC)
F i g u r e 1 1 . M a x i m u m C o n t i n u o u s D r a i n
Current vs Ambient Temperature
©2009 Fairchild Semiconductor Corporation FDS4435BZ
_F085 Rev.A
VGS= -10V
4
Figure 10.
Gate Leakage Current vs Gate to
Source Voltage
100
10
1
THIS AREA IS
LIMITED BY r
, DRAIN CURRENT (A)
0.1
D
-I
0.01
0.1 1 10
Figure 12.
DS(on)
SINGLE PULSE T
= MAX RATED
J
R
TJA
T
=25oC
A
-VDS, DRAIN to SOURCE VOLTAGE (V)
F or w ar d Bi a s S a fe
Operating Area
= 125oC/W
100us
1ms
10ms
100ms
1s
10s DC
80
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Page 5
FDS4435BZ_F085 P-Channel PowerTrench
Typical Characteristics T
1000
100
10
, PEAK TRANSIENT POWER (W)
1
(PK)
P
0.5
-4
10
2
DUTY CYCLE-DESCENDING ORDER
1
D = 0.5
0.2
JA
T
0.1
0.1
0.05
0.02
0.01
-3
10
Figure 13. Single Pulse Maximum Power Dissipation
= 25°C unless otherwise noted
J
-2
10
-1
10
t, PULSE WIDTH (s)
VGS = -10 V
110
P
SINGLE PULSE
R
= 125 oC/W
T
JA
T
= 25 oC
A
100 1000
DM
®
MOSFET
IMPEDANCE, Z
0.01
NORMALIZED THERMAL
0.001
-4
10
-3
10
SINGLE PULSE
= 125 oC/W
R
T
JA
-2
10
t, RECTANGULAR PULSE DURATION (sec)
-1
10
NOTES: DUTY FACTOR: D = t
PEAK TJ = PDM x Z
110
t
1
t
2
1/t2
x R
+ T
TJA
TJA
A
100 1000
Figure 14. Transient Thermal Response Curve
©2009 Fairchild Semiconductor Corporation FDS4435BZ
_F085 Rev.A
5
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Page 6
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®
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PDP SPM™ Power-SPM™
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Saving our world, 1mW /W /kW at a time™ SmartMax™ SMART START™ SPM STEALTH™ SuperFET™ SuperSOT™-3 SuperSOT™-6 SuperSOT™-8 SupreMOS™ SyncFET™ Sync-Lock™
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The Power Franchise
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FDS4435BZ_F085 P-Channel PowerTrench
®
MOSFET
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury of the user.
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Fairchild Semiconductor Corporation’s Anti-Counterfeiting Policy. Fairchild’s Anti-Counterfeiting Policy is also stated on our external website, www.Fairchildsemi.com, under Sales Support Counterfeiting of semiconductor parts is a growing problem in the industry. All manufactures of semiconductor products are experiencing counterfeiting of their parts. Customers who inadvertently purchase counterfeit parts experience many problems such as loss of brand reputation, substandard performance, failed application, and increased cost of production and manufacturing delays. Fairchild is taking strong measures to protect ourselves and our customers from the proliferation of counterfeit parts. Fairchild strongly encourages customers to purchase Fairchild parts either directly from Fairchild or from Authorized Fairchild Distributors who are listed by country on our web page cited above. Products customers buy either from Fairchild directly or from Authorized Fairchild Distributors are genuine parts, have full traceability, meet Fairchild’s quality standards for handing and storage and provide access to Fairchild’s full range of up-to-date technical and product information. Fairchild and our Authorized Distributors will stand behind all warranties and will appropriately address and warranty issues that may arise. Fairchild will not provide any warranty coverage or other assistance for parts bought from Unauthorized Sources. Fairchild is committed to combat this global problem and encourage our customers to do their part in stopping this practice by buying direct or from authorized distributors.
PRODUCT STATUS DEFINITIONS Definition of Terms
.
2. A critical component in any component of a life support, device, or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
Datasheet Identification Product Status Definition
Advance Information Formative / In Design
Preliminary First Production
No Identification Needed Full Production
Obsolete Not In Production
©2009 Fairchild Semiconductor Corporation FDS4435BZ
_F085 Rev.A
Datasheet contains the design specifications for product development. Specifications may change in any manner without notice.
Datasheet contains preliminary data; supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design.
Datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve the design.
Datasheet contains specifications on a product that is discontinued by Fairchild Semiconductor. The datasheet is for reference information only.
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Rev. I40
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