Gate Resistancef = 1MHz-5.0 -Ω
Total Gate Charge at -10VVGS = 0 to -10V
Total Gate Charge at -5VVGS = 0 to -5V -18.624.2nC
Gate to Source Gate Charge-5.2-nC
Gate to Drain “Miller“ Charge -6.6 -nC
FDS4141_F085 Rev. Awww.fairchildsemi.com2
V
DD
I
= -10.5A
D
-2005 -pF
-3545nC
= -20V
Page 3
FDS4141_F085 P-Channel PowerTrench
Electrical Characteristics T
= 25oC unless otherwise noted
A
SymbolParameterTest ConditionsMinTypMaxUnits
Switching Characteristics
t
on
t
d(on)
t
r
t
d(off)
t
f
t
off
Turn-On Time
Turn-On Delay Time-9.7-ns
Rise Time-4.4-ns
Turn-Off Delay Time-41-ns
Fall Time-11.6-ns
Turn-Off Time--84ns
Source to Drain Diode Voltage
Reverse Recovery Time
Reverse Recovery Charge-13.417.4nC
= -20V, ID = -10.5A
V
DD
V
= -10V, R
GS
I
= -10.5A--0.8-1.3
SD
= -2.1A--0.7-1.2
I
SD
= -10.5A, dSD/dt = 100A/µs
I
F
GEN
= 6Ω
--25ns
-2634ns
V
®
MOSFET
This product has been designed to meet the extreme test conditions and environment demanded by the automotive industry. For
All Fairchild Semiconductor products are manufactured, assembled and tested under ISO9000 and QS9000 quality systems
FDS4141_F085 Rev. Awww.fairchildsemi.com3
a copy of the requirements, see AEC Q101 at: http://www.aecouncil.com/
certification.
Page 4
Typical Characteristics
)
FDS4141_F085 P-Channel PowerTrench
1.2
1.0
0.8
0.6
0.4
0.2
POWER DISSIPATION MULTIPLIER
0.0
02550751 00125150
TA, CASE TEMPERATURE
o
(
C
)
Figure 1. Normalized Power Dissipation vs
Ambient Temperature
2
DUTY CYCLE - DESCENDING ORDER
1
JA
θ
IMPEDANCE, Z
NORMALIZED THERMAL
0.1
0.01
0.001
D = 0.50
0.20
0.10
0.05
0.02
0.01
SINGLE PULSE
R
θ
JA
-3
10
= 81oC/W
Figure 3.
-2
10
Normalized Maximum Transient Thermal Impedance
-1
10
t, RECTANGULAR PULSE DURA TION (s
9
VGS = -10V
6
VGS = -4.5V
3
, DRAIN CURRENT (A)
D
-I
R
= 81oC/W
θ
JA
0
255075100125150
TA, CASE TEMPERATURE
o
(
C
)
Figure 2. Maximum Continuous Drain Current vs
Ambient Temperature
P
DM
t
1
t
x R
2
2
+ T
θJA
A
NOTES:
DUTY FACTOR: D = t1/t
PEAK TJ = PDM x Z
θJA
11010210
MOSFET
3
®
1000
VGS = -10V
TRANSCONDUCTANCE
MAY LIMIT CURRENT
IN THIS RE GION
100
10
, PEAK CURRENT (A)
DM
-I
SINGLE PULSE
R
1
-3
10
θ
JA
= 81oC/W
-2
10
-1
10
t, RECTANGULAR PULSE DURATION(s)
Figure 4. Peak Current Capability
FDS4141_F085 Rev. Awww.fairchildsemi.com4
TA = 25oC
FOR TEMPERATURES
o
ABOVE 25
CURRENT AS FOLLOWS:
I = I
2
5
C DERATE PEAK
150 - T
A
125
11010210
3
Page 5
Typical Characteristics
FDS4141_F085 P-Channel PowerTrench
100
10
1
, DRAIN CURRENT (A)
D
0.1
-I
OPERATION IN THIS
AREA MAY BE
LIMITED BY r
DS(on)
SINGLE PULSE
= MAX RATED
T
J
T
= 25oC
A
0.01
0.010.1110100 300
-VDS, DRAIN TO SOURCE VOLTAGE (V)
Figure 5.
36
27
Forward Bias Safe Operating Area
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
=
V
-5V
DD
18
TJ = 150oC
1ms
10ms
100ms
1s
DC
60
If R = 0
tAV = (L)(IAS)/(1.3*RATED BV
If R
≠ 0
= (L/R)ln[(IAS*R)/(1.3*RATED BV
t
AV
10
, AVALANCHE CURRENT (A)
AS
-I
1
0.010.1110100
NOTE: Refer to Fairchild Application Notes AN7514 and AN7515
STARTING TJ = 150oC
tAV, TIME IN AVALANCHE (ms)
- VDD)
DSS
- VDD) +1]
DSS
STARTING TJ = 25oC
Figure 6. Unclamped Inductive Switching
Capability
36
27
18
VGS = -10V
VGS = -4.5V
VGS = -4V
VGS = -3.5V
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
VGS = -3V
®
MOSFET
9
, DRAIN CURRENT (A)
D
-I
0
01234
TJ = 25oC
TJ = -55oC
-VGS, GA T E T O S O U R C E VO L T AGE (V)
Figure 7.
Transfer CharacteristicsFigure 8.
50
I
D
)
40
Ω
m
(
PULSE DURATION = 80µs
-
10.5A
=
DUTY CYCLE = 0.5% MAX
30
TJ = 150oC
20
, DRAIN TO SOURCE
ON-RESISTANCE
10
DS(on)
r
0
246810
TJ = 25oC
-VGS, GATE TO SOURC E V O L T AGE (V)
Figure 9.
Drain to Source On-Resistance
Variation vs Gate to Source Voltage
, DRAIN CURRENT (A)
9
D
-I
0
0123
-VDS, DRAIN TO SOURCE VOLTA G E (V)
Saturation Characteristics
1.8
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
1.6
1.4
1.2
1.0
NORMALIZED
0.8
0.6
DRAIN TO SOURCE ON-RESIS T A NCE
-75 -50 -250255075 100 125 150
TJ, JUNCTION TEMPERATURE
ID = -10.5A
= -10V
V
GS
o
(
C
)
Figure 10. Normalized Drain to Source On
Resistance vs Junction Temperature
FDS4141_F085 Rev. Awww.fairchildsemi.com5
Page 6
Typical Characteristics
FDS4141_F085 P-Channel PowerTrench
1.4
1.2
1.0
0.8
NORMALIZED GATE
0.6
THRESHOLD VOLTAGE
0.4
-75 -50 -250255075 100 125 150
Figure 11.
4000
1000
CAPACITANCE (pF)
100
0.111060
V
=
V
GS
DS
I
=
-
250
µ
A
o
C
)
TJ, JUNCTION TEMPERATURE
D
(
Normalized Gate Threshold Voltage vs
Junction Temperature
C
iss
C
oss
f = 1MHz
= 0V
V
GS
-VDS, DRAIN TO SOURCE VOLTAGE (V
C
rss
)
1.10
ID =
-
1mA
1.05
1.00
0.95
BREAKDOWN VOLTAGE
NORMALIZED DRAIN TO SOURCE
0.90
-80-4004080120160
TJ, JUNCTION TEMPERATURE
o
(
C
)
Figure 12. Normalized Drain to Source
Breakdown Voltage vs Junction Temperature
10
ID = -10.5A
8
6
4
2
, GATE TO SOURCE VOLTAGE (V)
GS
0
V
-
0510152025303540
VDD = -20V
VDD = -25VVDD = -15V
Qg, GATE CHARGE (nC)
®
MOSFET
Figure 13.
Capacitance vs Drain to Source
Voltage
FDS4141_F085 Rev. Awww.fairchildsemi.com6
Figure 14. Gate Charge vs Gate to Source Voltage
Page 7
TRADEMARKS
tm
®
tm
tm
The following includes registered and unregistered trad emarks and service marks, owned by Fairchild Semiconductor and/o r its globa l subsidiaries, and is not
intended to be an exhaustive list of all such trademarks.
Auto-SPM™
Build it Now™
CorePLUS™
CorePOWER™
CROSSVOLT™
CTL™
Current Transfer Logic™
EcoSPARK
EfficentMax™
EZSWITCH™ *
*Trademarks of System General Corporation, used under license by Fairchild Semiconductor.
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE
RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY
PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY
THEREIN, WHICH COVERS THESE PRODUCTS.
FDS4141_F085 P-Channel PowerTrench
®
MOSFET
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE
EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or systems which, (a) are
intended for surgical implant into the body or (b) support or sustain life,
and (c) whose failure to perform when properly used in accordance with
instructions for use provided in the labeling, can be reasonably
expected to result in a significant injury of the user.
ANTI-COUNTERFEITING POLICY
Fairchild Semiconductor Corporation’s Anti-Counterfeiting Policy. Fairchild’s Anti-Counterfeiting Policy is also stated on our external website,
www.Fairchildsemi.com, under Sales Support
Counterfeiting of semiconductor parts is a growing problem in the industry. All manufactures of se miconductor products are experie ncing counterfeiting of their
parts. Customers who inadvertently purchase counterfeit parts experie nce many problems such as loss o f bran d re putat ion, subst and ard performance, fa iled
application, and increased cost of production and manufacturing delays. Fairchild is taking strong measures to protect ourselves and our customers fr om the
proliferation of counterfeit parts. Fairch ild strongly en courage s customers to purchase Fair child parts eit her directly f rom Fa irchild or from Au thorized Fairchild
Distributors who are listed by country on our web page cited above. Products customers buy either from Fairchild directly or from Authorized Fairchild
Distributors are genuine parts, have full traceability, meet Fairchild’s quality standards for handing and storage and provide access to Fairchild’s full range of
up-to-date technical and product information. Fairchild and our Authorized Distributors will stand behind all warranties and will appropriately address and
warranty issues that may arise. Fairchild will not provide any warranty coverage or other assistance for parts bought from Unauthorized Sources. Fairchild is
committed to combat this global problem and e ncourage our cust omers to do the ir part in stopping this practice by buying direct or f rom authorized di stributors.
PRODUCT STATUS DEFINITIONS
Definition of Terms
.
2.A critical component in any component of a life support, device, or
system whose failure to perform can be reasonably expected to cause
the failure of the life support device or system, or to affect its safety or
effectiveness.
Datasheet IdentificationProduct StatusDefinition
Advance InformationFormative / In Design
PreliminaryFirst Production
No Identification NeededFull Production
ObsoleteNot In Production
Datasheet contains the design specifications for product development. Specifications
may change in any manner without notice.
Datasheet contains preliminary data; supplementary data will be published at a later
date. Fairchild Semiconductor reserves the right to make changes at any time without
notice to improve design.
Datasheet contains final specifications. Fairchild Semiconductor reserves the right to
make changes at any time without notice to improve the design.
Datasheet contains specifications on a product that is disco ntinued by Fairchild
Semiconductor. The datasheet is for reference information only.
Rev. I40
FDS4141_F085 Rev. Awww.fairchildsemi.com7
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