Datasheet FDS3672 Datasheet (Fairchild Semiconductor)

Page 1
FDS3672
N-Channel PowerTrench® MOSFET 100V, 7.5A, 22mΩ
FDS3672
March 2003
Features
•r
•Q
• Low Miller Charge
•Low Q
• Optimized eff iciency at high frequ encies
• UIS Capability (Single Pulse and Repetitive Pulse)
= 19mΩ (Typ.), V
DS(ON)
(tot) = 28nC (Typ.), V
g
Body Diode
RR
= 10V, ID = 7.5A
GS
= 10V
GS
Applications
• DC/DC converters and Off-Line UPS
• Distributed Pow er Architectures and VRMs
• Primary Switch for 24V and 48V Systems
• High Voltage Synchronous Re ctifier
• Direct Injection / Diesel Injection Systems
• 42V Automotive Lo ad Control
Formerly developmental type 82763
Branding Dash
1
2
3
4
5
• Electronic Valve T rain System s
5 6 7 8
SO-8
MOSFET Maximum Ratings T
Symbol Parameter Ratings Units
V
DSS
V
GS
I
D
E
AS
P
D
, T
T
J
STG
Drain to Source Voltage 100 V Gate to Source Voltage ±20 V Drain Curr e nt Continuous (T Continuous (T
= 25oC, VGS = 10V, R
A
= 100oC, VGS = 10V, R
A
Pulsed Figure 4 A Single Pulse Avalanche Energy (Note 1) 416 mJ Power dissipation 2.5 W
o
Derate above 25
C20mW/
Operating and Storage Temperature -55 to 150
= 25°C unless otherwise noted
A
= 50oC/W)
θJA
= 50oC/W) 4.8 A
θJA
7.5 A
4 3 2 1
o
C
o
C
Thermal Characteristics
R
θJA
R
θJA
R
θJC
Thermal Resis tan ce , Ju nc tion to Ambi en t at 10 se co nds (Note 3) 50 Thermal Resistance, Junction to Ambient at 1000 seconds (Note 3) 85 Thermal Resis tan ce , Ju nc tio n t o Cas e (Note 2) 25
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
FDS367 2 FDS3672 SO-8 330mm 12mm 2500 un its
©2003 Fairchild Semiconductor Corporation
o
C/W
o
C/W
o
C/W
FDS3672 Rev. B
Page 2
FDS3672
Electrical Characteristics T
= 25°C unless otherwise noted
A
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics
B I
DSS
I
GSS
VDSS
Drain t o Source Breakdown Volta ge ID = 250µA, VGS = 0V 100 - - V
V
= 80V - - 1
Zero Gate Voltage Drain Current
DS
= 0V TC = 150oC- - 250
V
GS
Gate to Source Leakage Current VGS = ±20V - - ±100 nA
On Characteristics
V
GS(TH)
r
DS(ON)
Gate to Source Threshold Voltage VGS = VDS, ID = 250µA2-4V
Drain to Source On Resistance
= 7.5A, V
I
D
I
= 6.8A, VGS = 6V - 0.023 0.028
D
= 7.5A, V
I
D
T
= 150oC
C
= 10V - 0.019 0.023
GS
= 10V,
GS
- 0.035 0.043
Dynamic Characteristics
C C C Q Q Q Q Q
ISS OSS RSS
g(TOT) g(TH) gs gs2 gd
Input Capacitance Output Capacitance - 285 - pF Reverse Transfer Capacitance - 70 - pF
= 25V, VGS = 0V,
V
DS
f = 1MHz
Total G ate Ch arg e at 10 V VGS = 0V to 10V Threshold Gate Charge VGS = 0V to 2V - 4 6 nC Gate to Source Gate Charge - 10 - nC Gate Charge Threshold to Plateau - 6.8 - nC
V
DD
I
= 7.5A
D
I
= 1.0m A
g
= 50V
Gate to Drain “Miller” Charge - 6 - nC
-2015- pF
-2837nC
µA
Ω
Switching Characteristics
t
ON
t
d(ON)
t
r
t
d(OFF)
t
f
t
OFF
Turn-On Time T urn-On Delay Time - 14 - ns Rise Time - 20 - ns T u rn-Off Delay Time - 37 - ns Fall Time - 27 - ns Turn-Off Time - - 96 ns
(VGS = 10V)
V
= 50V, ID = 4A
DD
V
= 10V, RGS = 10Ω
GS
--51ns
Drain-Source Diode Characteristics
I
= 7.5A - - 1.25 V
V
SD
t
rr
Q
RR
Notes: 1: Starting TJ = 25°C, L = 13mH, IAS = 8A. 2: R
θJA
drain pins. R
3: R
θJA
Source to Drain Di ode Voltage Reverse Recovery Time ISD= 7.5A, dISD/dt= 100A/µs- - 55ns
Reverse Recovered Charge ISD= 7.5A, dISD/dt= 100A/µs- - 90nC
is the sum of the junction-to-case and cas e-to-a mbient thermal r esistance wher e the case thermal reference is defined as the solder mounting su rface of the is measured with 1.0 in2 copper on FR-4 board
is guaranteed by design while R
θJC
is determined by the user’s board design.
θCA
SD
I
= 4A - - 1.0 V
SD
©2003 Fairchild Semiconductor Corporation FDS3672 Rev . B
Page 3
FDS3672
Typical Characteristics T
= 25°C unless otherwise noted
A
1.2
1.0
0.8
0.6
0.4
0.2
POWER DISSIPATION MULTIPLIER
0
0 25 50 75 100 150
TA, AMBIENT TEMPERATURE (oC)
Figure 1. Normalized Power Dissipation vs
Ambient Temperature
2
DUTY CYCLE - DESCENDING ORDER
1
0.5
0.2
0.1
0.05
0.02
0.01
0.1
, NORMALIZED
0.01
θJA
Z
THERMAL IMPEDANCE
0.001
-5
10
SINGLE PULSE
-4
10
-3
10
8
6
4
, DRAIN CURRENT (A)
D
2
I
0
125
25 50 75 100 125 150
Figure 2. Maximum Continuous Drain Curr ent vs
-2
10
t, RECTANGULAR PULSE DURATION (s)
-1
10
10
TC, CASE TEMPERATURE (oC)
Case Temperature
NOTES: DUTY FACTOR: D = t1/t
PEAK TJ = PDM x Z
0
1
10
V
= 10V
GS
R
=50oC/W
θJA
P
DM
t
1
t
2
2
x R
+ T
θJA
θJA
A
2
10
3
10
Figure 3. Normalized Maximum Transient Thermal Impedance
1000
TRANSCONDUCTANCE MAY LIMIT CURRENT IN THIS REGION
VGS = 10V
100
, PEAK CURRENT (A)
DM
I
10
5
-5
10
-4
10
-3
10
-2
10
-1
10
0
10
t, PULSE WIDTH (s)
TA = 25oC FOR TEMPERATURES
ABOVE 25oC DERATE PEAK CURRENT AS FOLLOWS:
150 - T
I = I
25
1
10
2
10
125
C
3
10
Figure 4. Peak Current Capability
©2003 Fairchild Semiconductor Corporation FDS3672 Rev . B
Page 4
Typical Characteristics T
= 25°C unless otherwise noted
A
FDS3672
300 100
10
1
, DRAIN CURRENT (A)
D
I
0.1
0.01
OPERATION IN THIS
AREA MAY BE
LIMITED BY r
SINGLE PULSE TJ = MAX R ATED
TC = 25oC
DS(ON)
1.0 10.0 100
VDS, DRAIN TO SOURCE VOLTAGE (V)
10µs
100µs
1ms 10ms
100ms
1s
Figure 5. Forward Bias Safe Operating Area
30
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
V
= 15V
DD
20
TJ = 150oC
30
If R = 0 tAV = (L)(IAS)/(1.3*RATED BV
If R ≠ 0
= (L/R)ln[(IAS*R)/(1.3*RATED BV
t
AV
10
, AVALANCHE CURRENT (A)
AS
I
STARTING TJ = 150oC
1
3000.1
0.01 0.1 1 10 100 tAV, TIME IN AVALANCHE (ms)
DSS
- VDD)
DSS
- VDD) +1]
ST ARTING TJ = 25oC
NOTE: Refer to Fairchild Application Notes AN7514 and AN7515
Figure 6. Unclamped Inductive Switching
Capability
30
VGS = 10V
20
VGS = 6V
VGS = 5V
10
, DRAIN CURRENT (A)
D
I
0
2.53.03.54.04.55.05.5
TJ = 25oC
TJ = -55oC
VGS, GATE TO SOURCE VOLTAGE (V)
Figure 7. Transfer Characteristics Figure 8. Saturation Characteristics
24
VGS = 6V
22
20
VGS = 10V
DRAIN TO SOURCE ON RESISTANCE (m Ω)
18
02468
ID, DRAIN CURRENT (A)
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
Figure 9. Drain to So urce On Resistanc e v s Drai n
Current
10
, DRAIN CURRENT (A)
D
I
0
0 0.5 1.0 1.5 2.0
2.0
1.5
1.0
ON RESISTANCE
NORMALIZED DRAIN TO SOURCE
0.5
VDS, DRAIN TO SOURCE VOLTAGE (V)
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
-80 -40 0 40 80 120 160 TJ, JUNCTION TEMPERATURE (oC)
TA = 25oC
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
VGS = 4.5V
VGS = 10V, ID = 7.5A
Figure 10. Normalized Drain to Source On
Resistance vs Junction Temperature
©2003 Fairchild Semiconductor Corporation FDS3672 Rev . B
Page 5
FDS3672
Typical Characteristics T
1.4
1.2
1.0
0.8
NORMALIZED GATE
THRESHOLD VOLTAGE
0.6
0.4
-80 -40 0 40 80 120 160 TJ, JUNCTION TEMPERATURE (oC)
= 25°C unless otherwise noted
A
VGS = VDS, ID = 250µA
Figure 11. Normalized G ate Threshol d Voltage vs
Junction Temperatur e
5000
C
= CGS + C
ISS
1000
C
OSS
C
RSS
100
C, CAPACITANCE (pF)
V
GS
10
0.1 1 10 100
GD
≅ C
+ C
DS
GD
= C
GD
= 0V, f = 1MHz
VDS, DRAIN TO SOURCE VOLTAGE (V)
1.10 ID = 250µA
1.05
1.00
0.95
BREAKDOWN VOLTAGE
NORMALIZED DRAIN TO SOURCE
0.90
-80 -40 0 40 80 120 160 TJ, JUNCTION TEMPERATURE (oC)
Figure 12. Normalized Drain to Source
Breakdown Voltage vs Junction Temperature
10
VDD = 50V
8
6
4
2
, GATE TO SOURCE VOLTAGE (V)
GS
V
0
0 5 10 15 20 25 30
Qg, GATE CHARGE (nC)
WAVEFORMS IN DESCENDING ORDER:
ID = 7.5A ID = 4A
Figure 13. Capacitance vs Drain to Sour ce
Voltage
©2003 Fairchild Semiconductor Corporation FDS3672 Rev . B
Figure 14. Gat e Charge Waveforms for Constant
Gate Currents
Page 6
Test Circuits and Waveforms
FDS3672
VARY tP TO OBTAIN REQUIRED PEAK I
V
GS
V
DS
L
I
AS
R
AS
G
+
V
DD
-
BV
DSS
t
P
V
DS
DUT
t
0V
P
I
AS
0.01Ω
0
t
AV
Figure 15. Unclamped Energy Test Circuit Figure 16. Unclamped Energy Waveforms
V
I
g(REF)
DS
L
V
GS
+
V
DD
-
DUT
V
DD
V
GS
V
= 2V
GS
Q
0
Q
g(TH)
I
g(REF)
gs2
Q
gs
Q
g(TOT)
V
DS
Q
gd
0
V
DD
V
= 10V
GS
Figure 17. Gate Charge Test Circuit Figure 18. Gate Charge Waveforms
V
DS
R
L
V
GS
R
GS
V
GS
DUT
+
V
DD
-
V
DS
0
V
GS
10%
0
t
d(ON)
90%
t
ON
t
r
t
d(OFF)
t
OFF
t
f
90%
10%
10%
90%
PULSE WIDTH
50%50%
Figure 19. Switching Time Test Circuit Figure 20. Switching Time Waveforms
©2003 Fairchild Semiconductor Corporation FDS3672 Rev . B
Page 7
Thermal Resistance vs. Mounting Pad Area
The maximum rated junction temperature, TJM, and the thermal resistance of the heat dissipating path determines the maximum allowable device power dissipation, P application. Therefore the application’s ambient temperature, T must be reviewed to ensure that T Equation 1 mathematically represents the relationship and
(oC), and th ermal res istance R
A
is never exceeded.
JM
DM
θJA
, in an
(oC/W)
serve s as the basis for establ ishing the rating of the part.
P
TJMTA–()
---------------- -------------- -=
DM
R
θJA
(EQ. 1)
In usin g surf ace m o unt d evic es s uch a s the SO8 pa ckag e, the env ironment in w hi ch it is appl ied will ha ve a significa nt influence on the part’s current and maximum power dissipation ratings. Precise determination of P and influenced by many factors:
is complex
DM
1. Mou nting pad area ont o which the device is attached and whet her the re is copp er on one s ide or both side s of the board.
2. The number of copper layers and the thickness of the board.
3. The use of external heat sinks.
4. The use of thermal vias.
5. Air flow and board orientation.
6. For no n steady state applic ations, th e pulse widt h, the duty cycle and the transient thermal response of the part, the boa rd and the environment they are in.
Fairchild provides thermal information to assist the designer’s preliminary application evaluation. Figure 21 defines the R copper (component side) area. This is for a horizontally
for the device as a function of the top
θJA
positi on ed FR-4 board w it h 1 oz c o pper af ter 1000 seconds of stea dy st ate pow er w ith n o air flow . Th is gr aph prov ides the necessary information for calculation of the steady state junction temperature or power dissipation. Pulse applications can be evaluated using the Fairchild device Spice t hermal model or manually u tilizing the normaliz ed
150
COPPER BOARD AREA - DESCENDING ORDER
2
0.04 in
2
0.28 in
, THERMAL
θJA
Z
120
C/W)
o
90
60
IMPEDANCE (
30
0.52 in
0.76 in
1.00 in
2 2 2
maximum transient thermal impedance curve. Therma l resistan ces corres ponding to other co pper areas
can be obtained from Figure 21 or by calculation using Equation 2. The area, in square inches is the top copper area including the gate and source pads.
R
The tr ansi ent t her mal i mp eda nce (Z varied top copper board area. Figure 22 shows the effect of copper pad area on single pulse transient thermal impedance. Each trace represents a copper pad area in square inches corresponding to the descending list in the graph. Spice and SABER thermal models are provided for each of the listed pad areas.
Copper pad area has no perceivable effect on transient thermal impedance for pulse widths less than 100ms. For pulse widths less than 100ms the transient thermal impedance is determined by the die and package. Therefore, CTHERM1 through CTHERM5 and RTHERM1 through RT HER M 5 re main co ns ta nt fo r ea ch of th e th erm al models . A li sti ng of th e m od el comp one nt v alue s i s ava i labl e in Table 1.
64
θJA
200
150
C/W)
o
(
θJA
R
100
50
0.001 0.01 0.1 1 10
26
-------------------------------+=
0.23 Area+
θJA
R
θJA
AREA, TOP COPPER AREA (in2)
(EQ. 2)
) is also e ffect ed by
= 64 + 26/(0.23+Area)
Figure 21. Thermal Resistance vs Mounting
Pad Area
FDS3672
0
-1
10
0
10
t, RECTANGULAR PULSE DURATION (s)
1
10
2
10
3
10
Figure 22. Thermal Impedance vs Mount ing Pad Area
©2003 Fairchild Semiconductor Corporation FDS3672 Rev . B
Page 8
PSPICE Electrical Mod el
.SUBCKT FDS 3672 2 1 3 ; rev October 2002 Ca 12 8 6.0e-10 Cb 15 14 7.4e-10 Cin 6 8 2.0e-9
Dbod y 7 5 DbodyMOD Dbreak 5 11 Db reakMOD Dplcap 10 5 DplcapMOD
Ebreak 11 7 17 18 107 Eds 14 8 5 8 1 Egs 13 8 6 8 1 Esg 6 10 6 8 1 Evthres 6 21 19 8 1 Evtemp 20 6 18 22 1
It 8 17 1 Lgat e 1 9 5.61e-9
Ldrain 2 5 1.0e -9 Lsource 3 7 1.98e-9
RLgate 1 9 56.1 RLdr ai n 2 5 10 RLsource 3 7 19.8
Mmed 16 6 8 8 M m edMOD Mstro 16 6 8 8 MstroMOD Mweak 16 21 8 8 MweakMOD
Rbreak 17 18 RbreakMOD 1 Rdrain 50 16 RdrainMOD 0.4e-2 Rgate 9 20 1.40 RSLC1 5 51 RSL CM OD 1.0e-6 RSLC2 5 50 1.0e 3 Rsource 8 7 RsourceMOD 1.3e-2 Rvthres 22 8 RvthresMO D 1 Rvtemp 18 19 RvtempMOD 1 S1a 6 12 13 8 S1AMOD S1b 13 12 13 8 S1BM OD S2a 6 15 14 13 S2AM OD S2b 13 15 14 13 S2BM OD
Vbat 22 19 DC 1
GATE
1
LGATE
RLGATE
RGATE
9
CA
ESG
+
EVTEMP
+
-
18 22
20
S1A
12
13814
S1B
EGS EDS
FDS3672
17 18
-
7
+
RVTEMP 19
-
22
LDRAIN
RLDRAIN
DBODY
LSOURCE
RLSOURCE
VBAT
DRAIN
2
SOURCE
3
DPLCAP
10
RSLC2
­6
8
EVTHRES
+
6
S2A
13
S2B
13
+
+
6 8
-
-
5
RSLC1
51
+
5
ESLC
51
­50
RDRAIN
16
21
-
19
8
MSTRO
CIN
15
CB
8
14
+
5 8
-
MMED
DBREAK
EBREAK
MWEAK
RSOURCE
RBREAK
17 18
IT
8
RVTHRES
11
+
ESLC 51 50 VALUE = {(V(5,51)/ABS(V(5, 51)))*(PWR (V(5,51)/(1e-6*110), 3))} .MODEL DbodyMOD D (IS=5.0E-11 N=1.13 RS=4.4e-3 TRS1=2.0e-3 TRS2=1.0e-6
+ CJO=1.4e-9 M= 0.58 TT=4.0e- 8 X T I=4.2) .MODEL DbreakMOD D (RS=0.38 TRS1=2. 0e-3 TRS2=-8. 9e-6) .MODEL DplcapMOD D (CJO=4.9e-10 IS=1.0e-30 N=10 M=0.6)
.MODEL Mstro M OD NMOS (VTO=4.05 K P=90 lambda=0.02 IS=1e-30 N=1 0 T OX = 1 L=1u W=1u) .MODEL MmedMOD NMOS (VTO=3.35 KP=6.0 IS=1e-30 N=10 TOX =1 L=1u W=1u RG=1.40) .MODEL Mwe akMOD NMOS (VTO=2.76 KP=0. 05 IS=1e-30 N= 10 T OX = 1 L=1u W=1u RG=1.40e+1 RS=0.1 )
.MODEL RbreakMOD RES (TC1=8.5e-4 TC2=-25.0e-7) .MODEL Rd rai nMOD RES (TC1=1.5e-2 TC 2=5. 5e-5) .MODEL RSLCMOD RES (TC1=1.0e-3 TC2=1.0e-6) .MODEL RsourceMOD RES (TC1=4e-3 TC2=1 e-6) .MODEL RvthresMOD RES (TC1=-3.4e -3 T C2=-1.7e-5) .MODEL RvtempMOD RES (T C1=-4.4e-3 TC2=2.2e-6)
.MODEL S1AMOD VSWITC H (RON =1e - 5 ROFF= 0. 1 VON=- 4 VOFF =-1 .5 ) .MODEL S1BMOD VSWITC H (RON= 1e- 5 ROFF = 0.1 VON= - 1.5 VO FF=- 4) .MODEL S2AMOD VSWITC H (RON= 1e- 5 ROFF = 0.1 VON= - 1 VOFF =0.5) .MODEL S2BMOD VSWITC H (RON= 1e- 5 ROFF = 0.1 VON= 0 .5 VOFF= -1)
.ENDS Note: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global Temperature Options; IEEE Power Electronics Specialist Conference Records, 1991, written by Wil liam J. Hepp and C. F rank Wheatley.
©2003 Fairchild Semiconductor Corporation FDS3672 Rev . B
Page 9
SABER Electrical Model
REV October 2002 template FDS3672 n2,n1,n3 electrical n2,n1,n3 { var i iscl dp..model dbodymod = (isl=5.0e-11,nl=1.13,rs=4.4e-3,trs1=2.0e-3,trs2=1.0e-6,cjo=1.4e-9,m=0.58,tt=4.0e-8,xti=4.2) dp..model dbreakmod = (rs=0. 38,trs1=2.0 e-3,trs2=-8.9e-6) dp..model dplcapmod = (cjo=4.9e-10,isl=10.0e-30,nl=10,m=0.6) m..model mstrongmod = (type=_n,vto=4.05,kp=90,lambda=0.02,is=1e-30, tox=1) m..model mmedmod = (type=_n,vto=3.35,kp=6.0,is=1e-30, tox=1) m..model mweakmod = (type=_n,vto=2.76,kp=0.05,is=1e-30, tox=1,rs=0.1) sw_vcsp.. mo del s1amod = (ron=1e-5,roff=0.1,von=-4,voff = -1.5) sw_vcsp.. mo del s1bmod = (ron=1e-5,roff=0.1,von=-1.5,vof f=-4) sw_vcsp.. mo del s2amod = (ron=1e-5,roff=0.1,von=-1,voff =0.5) sw_vcsp.. mo del s2bmod = (ron=1e-5,roff=0.1,von=0.5,vof f=-1) c.ca n12 n8 = 6.0e -10 c.cb n15 n14 = 7.4e-10 c.cin n6 n8 = 2.0e -9
dp.dbody n7 n5 = model=dbodym od dp.dbreak n5 n11 = model=dbreakmod dp.dplcap n10 n5 = model=dplca pm od
spe.ebreak n11 n7 n17 n18 = 107 spe.eds n14 n8 n5 n8 = 1 spe.egs n13 n8 n6 n8 = 1
GATE
spe.esg n6 n10 n6 n8 = 1 spe.evthres n6 n21 n19 n8 = 1
LGATE
1
RLGATE
9
RGATE
ESG
EVTEMP
+
18 22
20
spe.evtemp n20 n6 n18 n22 = 1 i.it n8 n17 = 1
CA
S1A
12
S1B
l.lgate n1 n9 = 5.61e-9 l.ldrain n2 n5 = 1.0e-9 l.lsource n3 n7 = 1.98e-9
res.rlgate n1 n9 = 56.1 res.rldrai n n2 n5 = 10 res.rlsource n3 n7 = 19.8
m.mmed n16 n6 n8 n8 = m odel=mmedm od, l=1u, w=1u m.mstrong n16 n6 n8 n8 = model=mstrongmod, l= 1u, w=1u m.mweak n16 n21 n8 n8 = model=mwea kmod, l=1u, w=1u
DPLCAP
10
RSLC2
­6
8
EVTHRES
+
+
19
6
-
S2A
13814
13
S2B
13
+
+
6
EGS EDS
8
-
-
5
RSLC1
51
ISCL
8
MMED
8
DBREAK
11
MWEAK
EBREAK
RSOURCE
RBREAK
17 18
IT
RVTHRES
50 RDRAIN
16
21
-
8
MSTRO
CIN
15
CB
14
+
5 8
-
RLDRAIN
DBODY
+
17 18
LSOURCE
­7
RLSOURCE
RVTEMP 19
­VBAT
+
22
LDRAIN
DRAIN
2
SOURCE
3
FDS3672
res.rbreak n17 n18 = 1, tc1=8.5e- 4,tc2=-25.0 e-7 res.rdrain n50 n16 = 0.4e-2, tc1=1.5e-2,tc2 =5.5e-5 res.rgate n9 n20 = 1.40 res.rslc1 n5 n51 = 1.0e-6, tc1=1. 0e-3,tc2=1. 0e-6 res.rslc2 n5 n50 = 1.0e3 res.rsour ce n8 n7 = 1.3e-2, tc1= 4e-3,tc2=1e- 6 res.rvthres n22 n8 = 1, tc1=-3.4e-3,tc2=-1. 7e-5 res.rvtemp n18 n19 = 1, tc1=-4.4e-3,tc2=2.2e-6 sw_vcsp.s1 a n6 n12 n13 n8 = model= s1amod sw_vcsp.s1 b n13 n12 n13 n8 = model = s1 bm od sw_vcsp.s2 a n6 n15 n14 n13 = model = s2 am od sw_vcsp.s2 b n13 n15 n14 n13 = model =s2bmod
v.vbat n22 n19 = dc=1 equations { i (n51->n50) +=iscl iscl: v(n51,n50) = ((v(n5,n51)/(1e-9+abs(v(n5,n51))))*(( abs(v(n5,n51)*1e6/110 ))** 3)) }
©2003 Fairchild Semiconductor Corporation FDS3672 Rev . B
Page 10
FDS3672
SPICE Thermal Model
REV Aug 2002 FDS3692 Copper Area =1.0 in
2
CTHERM1 TH 8 2e-3 CTHERM2 8 7 5e-3 CTHERM3 7 6 1e-2 CTHERM4 6 5 4e-2 CTHERM5 5 4 9e-2 CTHERM6 4 3 2e-1 CTHERM7 3 2 1 CTHERM8 2 T L 3
RTHERM1 TH 8 1e-1 RTHERM2 8 7 5e-1 RTHERM3 7 6 1 RTHERM4 6 5 5 RTHERM5 5 4 8 RTHERM6 4 3 13 RTHERM7 3 2 19 RTHERM8 2 TL 29.7
SABER Thermal Model
Copper Area = 1. 0 i n template thermal_model th tl thermal_ c th , tl { ctherm.c th erm 1 th 8 =2e-3 ctherm.ctherm2 8 7 =5e-3 ctherm.ctherm3 7 6 =1e-2 ctherm.ctherm4 6 5 =4e-2 ctherm.ctherm5 5 4 =9e-2 ctherm.ctherm6 4 3 =2e-1 ctherm7 3 2 1 ctherm8 2 tl 3
rtherm.rtherm1 th 8 =1e-1 rtherm.rt he rm2 8 7 =5e-1 rtherm.rt herm3 7 6 =1 rtherm.rt herm4 6 5 =5 rtherm.rt herm5 5 4 =8 rtherm.rt herm6 4 3 =13 }
2
RTHERM1
RTHERM2
RTHERM3
RTHERM4
RTHERM5
RTHERM6
RTHERM7
RTHERM8
JUNCTION
th
CTHERM1
8
CTHERM2
7
CTHERM3
6
CTHERM4
5
CTHERM5
4
CTHERM6
3
CTHERM7
2
CTHERM8
tl
CASE
TABLE 1. THERMAL MODELS
COMPONANT 0.04 in
2
0.28 in
2
0.52 in
2
0.76 in
2
1.0 in
2
CTHERM6 3.2e-1 3.5e-1 4.0e-1 4.0e-1 4.0e-1 CTHERM7 8.5e-1 9.0e-1 9.0e-1 9.0e-1 9.0e-1 CTHERM8 0.3 1.8 2.0 2.0 2.0 RTHERM6 24 18 12 10 9 RTHERM7 36 21 18 16 15 RTHERM8 53 37 30 28 23
©2003 Fairchild Semiconductor Corporation FDS3672 Rev . B
Page 11
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Rev. I2
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