Datasheet FDS2582 Datasheet (Fairchild)

Page 1
FDS2582
N-Channel PowerTrench® MOSFET 150V, 4.1A, 66mΩ
FDS2582
September 2002
Features
•r
•Q
• Low Miller Charge
•Low Q
• Optimized eff iciency at high frequ encies
• UIS Capability (Single Pulse and Repetitive Pulse)
= 57mΩ (Typ.), V
DS(ON)
(tot) = 19nC (Typ.), V
g
Body Diode
RR
= 10V, ID = 4.1A
GS
= 10V
GS
Applications
• DC/DC converters and Off-Line UPS
• Distributed Power Architectures and VRMs
• PrimarySwitch for 24V and 48V Systems
• High Voltage Synchronous R ectifier
• Direct Injection / Diesel Injection Systems
• 42V Automotive Load Control
Formerly developmental type 82855
Branding Dash
1
2
3
4
5
• Electronic Valve Train Systems
5 6 7 8
SO-8
MOSFET Maximum Ratings T
Symbol Parameter Ratings Units
V
DSS
V
GS
I
D
E
AS
P
D
, T
T
J
STG
Drain to Source Voltage 150 V Gate to Source Voltage ±20 V Drain Curr e nt Continuous (T Continuous (T
= 25oC, VGS = 10V, R
A
= 100oC, VGS = 10V, R
A
Pulsed Figure 4 A Single Pulse Avalanche Energy (Note 1) 252 mJ Power dissipation 2.5 W Derate above 25
o
C20mW/
Operating and Storage Temperature -55 to 150
= 25°C unless otherwise noted
A
= 50oC/W)
θJA
= 50oC/W) 2.6 A
θJA
4.1 A
4 3 2 1
o
C
o
C
Thermal Characteristi cs
R
θJA
R
θJA
R
θJC
ThermalResistance,Junction to Ambientat 10 seconds (Note 3) 50 ThermalResistance,Junction to Ambientat 1000 seconds (Note 3) 80 ThermalResistance,Junctionto Case (Note 2) 25
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
FDS258 2 FDS2582 SO-8 330mm 12mm 2500 un its
©2002 Fairchild Semiconductor Corporation
o
C/W
o
C/W
o
C/W
FDS2582 Rev. B
Page 2
FDS2582
Electrical Characteristics T
= 25°C unl ess otherwise noted
A
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics
B I
DSS
I
GSS
VDSS
Drain t o Source Breakdown Volta ge ID = 250µA, VGS = 0V 150 - - V
V
= 120V - - 1
Zero Gate Voltage Drain Current
DS
= 0V TC = 150oC- - 250
V
GS
Gate to Source Leakage Current VGS = ±20V - - ±100 nA
On Characteristics
V
GS(TH)
r
DS(ON)
Gate to Source Threshold Voltage VGS = VDS, ID = 250µA2-4V
Drain to Source On Resistance
= 4.1A, V
I
D
I
= 2A, VGS = 6V - 0.065 0.098
D
I
= 4.1A, V
D
T
= 150oC
C
= 10V - 0.057 0.066
GS
= 10V,
GS
- 0.125 0.146
Dynamic Characteristics
C C C Q Q Q Q Q
ISS OSS RSS
g(TOT) g(TH) gs gs2 gd
Input Capacitance Output Capacitance - 150 - pF Reverse Transfer Capacitance - 32 - pF
= 25V, VGS = 0V,
V
DS
f = 1MHz
Total G ate Ch arg e at 10 V VGS = 0V to 10V Threshold Gate Charge VGS = 0V to 2V - 2.3 3.0 nC Gate to Source Gate Charge - 5.4 - nC Gate Charge Threshold to Plateau - 3.1 - nC
V
DD
I
= 4.1A
D
I
= 1.0m A
g
= 75V
Gate to Drain “Miller” Charge - 4.4 - nC
-1290- pF
-1925nC
µA
Ω
Resistive Switching Characteristics
t
ON
t
d(ON)
t
r
t
d(OFF)
t
f
t
OFF
Turn-On Time Turn-On Delay Time - 11 - ns Rise Time - 19 - ns T u rn-Off Delay Time - 36 - ns Fall Time - 26 - ns Turn-Off Time - - 92 ns
(VGS = 10V)
V
DD
V
GS
--45ns
= 75V, ID = 4.1A = 10V, RGS = 16Ω
Drain-Source Diode Characteristics
I
= 4.1A - - 1.25 V
V
SD
t
rr
Q
RR
Notes: 1: Starting T 2: R
θJA
drain pins. R
3: R
θJA
Source to Drain Di ode Voltage Reverse Recovery Time ISD= 4.1A, dISD/dt= 100A/µs- - 63ns
Reverse Recovered Charge ISD= 4.1A, dISD/dt= 100A/µs - - 116 nC
= 25°C, L = 56mH, IAS = 3A.
J
is the sum of the junction-to-case and cas e-to-a mbient thermal r esistance wher e the case thermal referance is defined as the solder mounting su rface of the is measured with 1.0 in2 copper on FR-4 board
is guaranteed by design while R
θJC
is determined by the user’s board design.
θCA
SD
I
= 2A - - 1.0 V
SD
©2002 Fairchild Semiconductor Corporation FDS2582 Rev . B
Page 3
FDS2582
Typical Characteristics T
= 25°C unl ess otherwise noted
A
1.2
1.0
0.8
0.6
0.4
0.2
POWER DISSIPATION MULTIPLIER
0
0 25 50 75 100 150
TA, AMBIENT TEMPERATURE (oC)
Figure 1. Normalized Power Dissipation vs
Ambient Temperature
2
DUTY CYCLE - DESCENDING ORDER
1
0.5
0.2
0.1
0.05
0.02
0.01
0.1
, NORMALIZED
0.01
θJA
Z
THERMAL IMPEDANCE
0.001
-5
10
SINGLE PULSE
-4
10
-3
10
5
4
3
2
, DRAIN CURRENT (A)
D
I
1
0
125
25 50 75 100 125 150
Figure 2. Maximum Continuous Drain Curr ent vs
-2
10
t, RECTANGULAR PULSE DURATION (s)
-1
10
10
TC, CASE TEMPERATURE (oC)
Case Temperature
NOTES: DUTY FACTOR: D = t
PEAK TJ = PDM x Z
0
1
10
V
= 10V
GS
R
=50oC/W
θJA
P
DM
t
1
t
2
1/t2
x R
+ T
θJA
θJA
A
2
10
3
10
Figure 3. Normalized Maximum Transient Thermal Impedance
400
100
TRANSCONDUCTANCE MAY LIMIT CURRENT IN THIS REGION
10
, PEAK CURRENT (A)
DM
I
VGS = 10V
1
-5
10
-4
10
-3
10
-2
10
-1
10
0
10
t, PULSE WIDTH (s)
TA = 25oC FOR TEMPERATURES
o
ABOVE 25
C DERATE PEAK
CURRENT AS FOLLOWS:
150 - T
I = I
25
1
10
10
125
2
C
3
10
Figure 4. Peak Current Capability
©2002 Fairchild Semiconductor Corporation FDS2582 Rev . B
Page 4
Typical Characteristics T
= 25°C unl ess otherwise noted
A
FDS2582
100
10
1
OPERATION IN THIS
AREA MAY BE
LIMITED BY r
, DRAIN CURRENT (A)
D
I
0.1 SINGLE PULSE
TJ = MAX RATED T
= 25oC
C
0.01
0.1 1 10 100
DS(ON)
VDS, DRAIN TO SOURCE VOLTAGE (V)
10µs
100µs
1ms 10ms
100ms
1s
Figure 5. Forward Bias Safe Operating Area
30
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX V
= 15V
DD
25
20
15
TJ = 25oC
10
, DRAIN CURRENT (A)
D
I
5
0
3.5 4.0 4.5 5.0 5.5 6.0
TJ = 150oC
TJ = -55oC
VGS, GATE TO SOURCE VOLTAGE (V)
7
STARTING TJ = 25oC
1
STARTING TJ = 150oC
, AVALANCHE CURRENT (A)
AS
I
If R = 0
400
tAV = (L)(IAS)/(1.3*RATED BV If R ≠ 0
t
= (L/R)ln[(IAS*R)/(1.3*RATED BV
AV
0.1
0.01 0.1 1 10 100 tAV, TIME IN AVALANCHE (ms)
DSS
- VDD)
DSS
- VDD) +1]
NOTE: Refer to Fairchild Application Notes AN7514 and AN7515
Figure 6. Unclamped Inductive Switching
Capability
30
TA = 25oC
25
20
15
10
, DRAIN CURRENT (A)
D
I
5
0
0 0.5 1.0 1.5 2.0
VDS, DRAIN TO SOURCE VOLTAGE (V)
VGS = 10V
VGS = 6V
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
VGS = 7V
VGS = 5V
Figure 7. Transfer Characteristics Figure 8. Saturation Characteristics
66
VGS = 6V
64
62
PULSE DURATION = 80µs
60
58
VGS = 10V
56
DRAIN TO SOURCE ON RESISTANCE (m Ω)
1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5
DUTY CYCLE = 0.5% MAX
I
, DRAIN CURRENT (A)
D
Figure 9. Drain to So urce On Resistanc e v s Drai n
Current
©2002 Fairchild Semiconductor Corporation FDS2582 Rev . B
2.5
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
2.0
1.5
ON RESISTANCE
1.0
NORMALIZED DRAIN TO SOURCE
0.5
-80 -40 0 40 80 120 160 TJ, JUNCTION TEMPERATURE (oC)
VGS = 10V, ID = 4.1A
Figure 10. Normalized Drain to Source On
Resistance vs Junction Temperature
Page 5
FDS2582
Typical Characteristics T
1.2
1.0
0.8
NORMALIZED GATE
THRESHOLD VOLTAGE
0.6
-80 -40 0 40 80 120 160 TJ, JUNCTION TEMPERATURE (oC)
= 25°C unl ess otherwise noted
A
VGS = VDS, ID = 250µA
Figure 11. Normalized G ate Threshol d Voltage vs
Junction Temperatur e
3000
C
= CGS + C
ISS
1000
C
OSS
C
RSS
100
C, CAPACITANCE (pF)
V
= 0V, f = 1MHz
GS
10
0.1 1 10 150
GD
≅ C
+ C
DS
GD
= C
GD
VDS, DRAIN TO SOURCE VOLTAGE (V)
1.2 ID = 250µA
1.1
1.0
BREAKDOWN VOLTAGE
NORMALIZED DRAIN TO SOURCE
0.9
-80 -40 0 40 80 120 160 T
, JUNCTION TEMPERATURE (oC)
J
Figure 12. Normalized Drain to Source
Breakdown Voltage vs Junction Temperature
10
VDD = 75V
8
6
4
2
, GATE TO SOURCE VOLTAGE (V)
GS
V
0
0 5 10 15 20
Qg, GATE CHARGE (nC)
WAVEFORMS IN DESCENDING ORDER:
ID = 4.1A ID = 2A
Figure 13. Capacitance vs Drain to Sour ce
Voltage
©2002 Fairchild Semiconductor Corporation FDS2582 Rev . B
Figure 14. Gat e Charge Waveforms for Constant
Gate Currents
Page 6
Test Circuits and Waveforms
FDS2582
BV
DSS
t
P
V
DS
TO OBTAIN
VARY t
P
REQUIRED PEAK I
V
GS
V
DS
L
I
AS
R
AS
G
+
V
DD
-
DUT
t
0V
P
I
AS
0.01Ω
0
t
AV
Figure 15. Unclamped Energy Test Circuit Figure 16. Unclamped Energy Waveforms
V
I
g(REF)
DS
L
V
GS
+
V
DD
-
DUT
V
DD
V
GS
V
= 2V
GS
Q
0
Q
g(TH)
I
g(REF)
gs2
Q
gs
Q
g(TOT)
V
DS
Q
gd
0
V
DD
V
= 10V
GS
Figure 17. Gate Charge Test Circuit Figure 18. Gate Charge Waveforms
V
DS
R
L
V
GS
R
GS
V
GS
DUT
+
V
DD
-
V
DS
0
V
GS
10%
0
t
d(ON)
90%
t
ON
t
r
t
d(OFF)
t
OFF
t
f
90%
10%
10%
90%
PULSE WIDTH
50%50%
Figure 19. Switching Time Test Circuit Figure 20. Switching Time Waveforms
©2002 Fairchild Semiconductor Corporation FDS2582 Rev . B
Page 7
Thermal Resistance vs. Mounting Pad Area
The maximum rated junction temperature, TJM, and the thermal resistance of the heat dissipating path determines the maxi mum al lowab le de vice p ower di ssip ation, P application. Therefore the application’s ambient temperature, T must be reviewed to ensure that T Equation 1 mathematically represents the relationship and
(oC), and th ermal res istance R
A
is never exceeded.
JM
DM
θJA
, in an
(oC/W)
serve s as the basis for establ ishing the rating of the part.
P
TJMTA–()
---------------- -------------- -=
DM
R
θJA
(EQ. 1)
In usin g surf ace m o unt d evic es s uch a s the SO8 pa ckag e, the env ironment in which it is ap plied wi ll ha ve a significant influence on the part’s current and maximum power dissipation ratings. Precise determination of P and influenced by many factors:
is complex
DM
1. Mou nting pad area ont o which the device is attached and whet her the re is copp er on one s ide or both side s of the board.
2. The number of copper layers and the thickness of the board.
3. The use of external heat sinks.
4. The use of thermal vias.
5. Air flow and board orientation.
6. For no n steady state applic ations, th e pulse widt h, the duty cycle and the transient thermal response of the part, the boa rd and the environment they are in.
Fairchild provides thermal information to assist the designer’s preliminary application evaluation. Figure 21 defines the R copper (component side) area. This is for a horizontally
for the device as a function of the top
θJA
positi on ed FR-4 board w i th 1 oz c opper af ter 100 0 se c on ds of stea dy st ate pow er w ith n o air flow . Th is gr aph prov ides the necessary inf ormation for calculation of the steady state junction temperature or power dissipation. Pulse applications can be evaluated using the Fairchild device Spice t hermal model or manually u tilizing the normalized
150
COPPER BOARD AREA - DESCENDING ORDER
2
0.04 in
2
0.28 in
120
C/W)
o
90
0.52 in
0.76 in
1.00 in
2 2 2
maximum transient thermal impedance curve. Therma l resistan ces corre sponding to other co pper areas
can be obtained from Figure 21 or by calculation using Equation 2. The area, in square inches is the top copper area including the gate and source pads.
R
The tr ansi ent t her mal i mp eda nce (Z varied top copper board area. Figure 22 shows the effect of copper pad area on single pulse transient thermal impedance. Each trace represents a copper pad area in square inches corresponding to the descending list in the graph. Spice and SABER thermal models are provided for each of the listed pad areas.
Copper pad area has no perceivable effect on transient thermal impedance for pulse widths less than 100ms. For pulse widths less than 100ms the transient thermal impedance is determined by the die and package. Therefore, CTHERM1 through CTHERM5 and RTHERM1 through RT HER M 5 re main co ns ta nt fo r ea ch of th e th erm al models . A li sti ng of th e m od el comp one nt v alue s i s ava i labl e in Table 1.
64
θJA
200
150
C/W)
o
(
θJA
R
100
50
0.001 0.01 0.1 1 10
26
-------------------------------+=
0.23 Area+
θJA
R
θJA
AREA, TOP COPPER AREA (in2)
(EQ. 2)
) is also ef fect ed by
= 64 + 26/(0.23+Area)
Figure 21. Thermal Resistance vs Mounting
Pad Area
FDS2582
, THERMAL
60
θJA
Z
IMPEDANCE (
30
0
-1
10
0
10
t, RECTANGULAR PULSE DURATION (s)
1
10
2
10
3
10
Figure 22. Thermal Impedance vs Mount ing Pad Area
©2002 Fairchild Semiconductor Corporation FDS2582 Rev . B
Page 8
PSPICE Electrical Model
.SUBCKT FDS 2582 2 1 3 ; rev July 2002 Ca 12 8 4.5e-10 Cb 15 14 5.0e-10 Cin 6 8 1.25e-9
Dbod y 7 5 DbodyMOD Dbreak 5 11 Db reakMOD Dplcap 10 5 DplcapMOD
Ebreak 11 7 17 18 155.5 Eds 14 8 5 8 1 Egs 13 8 6 8 1 Esg 6 10 6 8 1 Evthres 6 21 19 8 1 Evtemp 20 6 18 22 1
It 8 17 1 Lgat e 1 9 5.61e-9
Ldrain 2 5 1e-9 Lsource 3 7 1.98e-9
RLgate 1 9 56.1 RLdr ai n 2 5 10 RLsource 3 7 19.8
Mmed 16 6 8 8 M m edMOD Mstro 16 6 8 8 MstroMOD Mweak 16 21 8 8 MweakMOD
Rbreak 17 18 RbreakMOD 1 Rdrain 50 16 RdrainMOD 30.0e-3 Rgate 9 20 1.5 RSLC1 5 51 RSL CM OD 1e-6 RSLC2 5 50 1e3 Rsource 8 7 RsourceMOD 20.0e-3 Rvthres 22 8 Rvthresmo d 1 Rvtemp 18 19 RvtempMOD 1 S1a 6 12 13 8 S1AMOD S1b 13 12 13 8 S1BM OD S2a 6 15 14 13 S2AM OD S2b 13 15 14 13 S2BM OD
GATE
1
LGATE
RLGATE
RGATE
9
CA
ESG
+
EVTEMP
+
-
18 22
20
S1A
12
13
8
S1B
EGS EDS
FDS2582
17 18
7
+
RVTEMP 19
-
22
LDRAIN
RLDRAIN
DBODY
LSOURCE
RLSOURCE
VBAT
DRAIN
2
SOURCE
3
DPLCAP
10
RSLC2
­6
8
EVTHRES
+
6
S2A
14 13
S2B
13
+
+
6 8
-
-
5
RSLC1
51
+
5
ESLC
51
­50
RDRAIN
16
21
-
19
8
MSTRO
CIN
15
CB
8
14
+
5 8
-
MMED
DBREAK
EBREAK
MWEAK
RSOURCE
RBREAK
17 18
IT
8
RVTHRES
11
+
-
Vbat 22 19 DC 1 ESLC 51 50 VALUE={(V(5,51)/ABS(V(5,51))) *(PWR(V(5,51)/(1e-6 *60),2.5)) } .MODEL DbodyMOD D (IS=2.4E-12 N=1.0 RS=10.0e-3 TRS1=2.1e-3 TRS2=4.7e-7
+ CJO=9.0e-10 M=0.64 TT=3.9e-8 XTI=4.6) .MODEL DbreakMOD D (RS=1.0 TRS1=1.4 e-3 TRS2=-5e- 5) .MODEL DplcapMOD D (CJO=2.8e-10 IS=1e-30 N=10 M=0.64)
.MODEL MmedM OD NMOS (VTO=3.5 KP=4.0 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=1. 5) .MODEL MstroMOD NMOS (VTO =4.2 KP=50 IS=1e-30 N=10 TOX=1 L=1u W=1u) .MODEL Mwe akMOD NMOS (VTO =2.92 KP=0. 04 IS=1e-30 N= 10 T OX=1 L=1u W=1u RG=15 RS=0.1)
.MODEL Rb reakMOD RES (T C1=1.1e-3 TC2=-1.0e-8) .MODEL RdrainMOD RE S (T C1=1.15e-2 TC2=3.0 e-5) .MODEL RSLCMOD RES (TC1=4.4e-3 TC2=2.9e-6) .MODEL RsourceMOD RES (TC1=1e-3 TC2=1e-6) .MODEL RvthresMOD RES (TC1=-3.9e -3 T C2=-1.6e-5 ) .MODEL RvtempMOD RES (T C1=-3.5e-3 TC2=1.5e-6)
.MODEL S1AMOD VSWITC H (RON =1e - 5 ROFF= 0. 1 VON=- 3. 0 VOFF =-2 .0 ) .MODEL S1BMOD VSWITC H (RON =1e - 5 ROFF= 0. 1 VON=- 2. 0 VOFF =-3 .0 ) .MODEL S2AMOD VSWITC H (RON= 1e- 5 ROFF = 0.1 VON= - 1.5 VO FF=1.0) .MODEL S2BMOD VSWITC H (RON= 1e- 5 ROFF = 0.1 VON= 1 .0 VOFF= -1.5)
.ENDS Note: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global Temperature Options; IEEE Power Electroni cs Specialist Conference Records, 1991, written by Wil liam J. Hepp and C. F rank Wheatley.
©2002 Fairchild Semiconductor Corporation FDS2582 Rev . B
Page 9
SABER Electrical Model
REV July 2002 template FDS2582 n2,n1,n3 electrical n2,n1,n3 { var i iscl dp..model dbodymod = (isl=2.4e-12,nl=1.0,rs=10.0e-3,trs1=2.1e-3,trs2=4.7e-7,cjo=9.0e-10,m=0.64,tt=3.9e-8,xti=4.6) dp..model dbreakmod = (rs=1.0,trs1=1.4e-3,trs2=-5e- 5) dp..model dplcapmod = (cjo=2.8e-10,isl=10e-30,nl=10,m=0.64) m..model mmedmod = (type=_n,vto=3.5,kp=4.0,is=1e-30, tox=1) m..model mstrongmod = (type=_n,vto=4.2,kp=50,is=1e-30, tox=1) m..model mweakmod = (type=_n,vto=2.92,kp=0.04,is=1e-30, tox=1,rs=0.1) sw_vcsp.. mo del s1amod = (ron=1e-5,roff=0. 1, von=-3.0,voff=-2.0) sw_vcsp.. mo del s1bmod = (ron=1e-5,roff=0. 1, von=-2.0,voff=-3.0) sw_vcsp.. mo del s2amod = (ron=1e-5,roff=0.1,von=-1.5, vof f = 1. 0) sw_vcsp.. mo del s2bmod = (ron=1e-5,roff=0.1,von=1.0,voff=-1.5) c.ca n12 n8 = 4.5e -10 c.cb n15 n14 = 5.0e-10 c.cin n6 n8 = 1.25 e-9
dp.dbody n7 n5 = model=dbodym od dp.dbreak n5 n11 = model=dbr eakmod dp.dplcap n10 n5 = model=dplcapmod
spe.ebreak n11 n7 n17 n18 = 155.5 spe.eds n14 n8 n5 n8 = 1 spe.egs n13 n8 n6 n8 = 1
GATE
spe.esg n6 n10 n6 n8 = 1 spe.evthres n6 n21 n19 n8 = 1
LGATE
1
RLGATE
9
RGATE
ESG
EVTEMP
+
18 22
20
spe.evtemp n20 n6 n18 n22 = 1 i.it n8 n17 = 1 l.lgate n1 n9 = 5.61e-9
l.ldrain n2 n5 = 1e-9 l.lsource n3 n7 = 1.98e-9
res.rlgate n1 n9 = 56.1 res.rldrai n n2 n5 = 10 res.rlsource n3 n7 = 19.8
12
CA
S1A
13
S1B
EGS EDS
m.mmed n16 n6 n8 n8 = m odel=mmedm od, l=1u, w=1u m.mstrong n16 n6 n8 n8 = model=mstrongmod, l= 1u, w=1u m.mweak n16 n21 n8 n8 = model=mwea kmod, l=1u, w=1u
DPLCAP
10
RSLC2
­6
8
EVTHRES
+
+
6
-
S2A
14
8
13
S2B
13
+
+
6 8
-
-
5
RSLC1
51
ISCL
8
MMED
8
DBREAK
11
MWEAK
EBREAK
+
-
RSOURCE
RBREAK
17 18
IT
RVTHRES
50 RDRAIN
16
21
-
19
8
MSTRO
CIN
15
CB
14
+
5 8
-
17 18
7
RVTEMP 19
-
+
22
LDRAIN
RLDRAIN
DBODY
LSOURCE
RLSOURCE
VBAT
DRAIN
2
SOURCE
3
FDS2582
res.rbreak n17 n18 = 1, tc1=1.1e- 3,tc2=-1.0e -8 res.rdrain n50 n16 = 30.0e-3, tc 1=1.15e-2,tc2=3.0e-5 res.rgate n9 n20 = 1.5 res.rslc1 n5 n51 = 1e-6, tc1=4.4e-3,tc2=2. 9e-6 res.rslc2 n5 n50 = 1e3 res.rsour ce n8 n7 = 20.0e-3, tc1=1e-3,tc2=1e-6 res.rvthres n22 n8 = 1, tc1=-3.9e-3,tc2=-1. 6e-5 res.rvtemp n18 n19 = 1, tc1=-3.5e-3,tc2=1.5e-6 sw_vcsp.s1 a n6 n12 n13 n8 = model=s1amod sw_vcsp.s1 b n13 n12 n13 n8 = mode l= s1bmod sw_vcsp.s2 a n6 n15 n14 n13 = mode l= s2amod sw_vcsp.s2 b n13 n15 n14 n13 = model = s2bmod
v.vbat n22 n19 = dc=1 equations { i (n51->n50) +=iscl iscl: v(n51,n50) = ((v(n5,n51)/(1e-9+abs(v(n5 ,n51))))*(( abs(v(n5,n51)*1e6/60) )** 2. 5)) }
©2002 Fairchild Semiconductor Corporation FDS2582 Rev . B
Page 10
FDS2582
SPICE Thermal Model
REV July 2002 FDS2582 Copper Area =1.0 in
2
CTHERM1 TH 8 4e-4 CTHERM2 8 7 5e-3 CTHERM3 7 6 6e-2 CTHERM4 6 5 9e-2 CTHERM5 5 4 3e-1 CTHERM6 4 3 4e-1 CTHERM7 3 2 9e-1 CTHERM8 2 T L 2
RTHERM1 TH 8 5e-1 RTHERM2 8 7 6e-1 RTHERM3 7 6 4 RTHERM4 6 5 5 RTHERM5 5 4 8 RTHERM6 4 3 9 RTHERM7 3 2 15 RTHERM8 2 TL 23
SABER Thermal Model
Copper Area = 1. 0 i n template thermal_model th tl thermal_ c th , tl { CTHERM1 TH 8 4e-4 CTHERM2 8 7 5e-3 CTHERM3 7 6 6e-2 CTHERM4 6 5 9e-2 CTHERM5 5 4 3e-1 CTHERM6 4 3 4e-1 CTHERM7 3 2 9e-1 CTHERM8 2 T L 2
RTHERM1 TH 8 5e-1 RTHERM2 8 7 6e-1 RTHERM3 7 6 4 RTHERM4 6 5 5 RTHERM5 5 4 8 RTHERM6 4 3 9 RTHERM7 3 2 15 RTHERM8 2 TL 23 }
2
RTHERM1
RTHERM2
RTHERM3
RTHERM4
RTHERM5
RTHERM6
RTHERM7
RTHERM8
JUNCTION
th
CTHERM1
8
CTHERM2
7
CTHERM3
6
CTHERM4
5
CTHERM5
4
CTHERM6
3
CTHERM7
2
CTHERM8
CASE
tl
TABLE 1. THERMAL MODELS
COMPONANT 0.04 in
2
0.28 in
2
0.52 in
2
0.76 in
2
1.0 in
2
CTHERM6 3.2e-1 3.5e-1 4.0e-1 4.0e-1 4.0e-1 CTHERM7 8.5e-1 9.0e-1 9.0e-1 9.0e-1 9.0e-1 CTHERM8 0.3 1.8 2.0 2.0 2.0 RTHERM624181210 9 RTHERM73621181615 RTHERM85337302823
©2002 Fairchild Semiconductor Corporation FDS2582 Rev . B
Page 11
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