Drain t o Source Breakdown Volta geID = 250µA, VGS = 0V150--V
V
= 120V--1
Zero Gate Voltage Drain Current
DS
= 0VTC = 150oC-- 250
V
GS
Gate to Source Leakage CurrentVGS = ±20V--±100nA
On Characteristics
V
GS(TH)
r
DS(ON)
Gate to Source Threshold VoltageVGS = VDS, ID = 250µA2-4V
Drain to Source On Resistance
= 4.1A, V
I
D
I
= 2A, VGS = 6V-0.0650.098
D
I
= 4.1A, V
D
T
= 150oC
C
= 10V-0.0570.066
GS
= 10V,
GS
-0.1250.146
Dynamic Characteristics
C
C
C
Q
Q
Q
Q
Q
ISS
OSS
RSS
g(TOT)
g(TH)
gs
gs2
gd
Input Capacitance
Output Capacitance-150-pF
Reverse Transfer Capacitance-32-pF
= 25V, VGS = 0V,
V
DS
f = 1MHz
Total G ate Ch arg e at 10 VVGS = 0V to 10V
Threshold Gate ChargeVGS = 0V to 2V-2.33.0nC
Gate to Source Gate Charge-5.4-nC
Gate Charge Threshold to Plateau-3.1-nC
V
DD
I
= 4.1A
D
I
= 1.0m A
g
= 75V
Gate to Drain “Miller” Charge-4.4-nC
-1290- pF
-1925nC
µA
Ω
Resistive Switching Characteristics
t
ON
t
d(ON)
t
r
t
d(OFF)
t
f
t
OFF
Turn-On Time
Turn-On Delay Time-11-ns
Rise Time-19-ns
T u rn-Off Delay Time-36-ns
Fall Time-26-ns
Turn-Off Time--92ns
(VGS = 10V)
V
DD
V
GS
--45ns
= 75V, ID = 4.1A
= 10V, RGS = 16Ω
Drain-Source Diode Characteristics
I
= 4.1A--1.25V
V
SD
t
rr
Q
RR
Notes:
1: Starting T
2: R
θJA
drain pins. R
3: R
θJA
Source to Drain Di ode Voltage
Reverse Recovery TimeISD= 4.1A, dISD/dt= 100A/µs- - 63ns
is the sum of the junction-to-case and cas e-to-a mbient thermal r esistance wher e the case thermal referance is defined as the solder mounting su rface of the
is measured with 1.0 in2 copper on FR-4 board
The maximum rated junction temperature, TJM, and the
thermal resistance of the heat dissipating path determines
the maxi mum al lowab le de vice p ower di ssip ation, P
application. Therefore the application’s ambient
temperature, T
must be reviewed to ensure that T
Equation 1 mathematically represents the relationship and
(oC), and th ermal res istance R
A
is never exceeded.
JM
DM
θJA
, in an
(oC/W)
serve s as the basis for establ ishing the rating of the part.
P
TJMTA–()
---------------- -------------- -=
DM
R
θJA
(EQ. 1)
In usin g surf ace m o unt d evic es s uch a s the SO8 pa ckag e,
the env ironment in which it is ap plied wi ll ha ve a significant
influence on the part’s current and maximum power
dissipation ratings. Precise determination of P
and influenced by many factors:
is complex
DM
1. Mou nting pad area ont o which the device is attached and
whet her the re is copp er on one s ide or both side s of the
board.
2. The number of copper layers and the thickness of the
board.
3. The use of external heat sinks.
4. The use of thermal vias.
5. Air flow and board orientation.
6. For no n steady state applic ations, th e pulse widt h, the
duty cycle and the transient thermal response of the part,
the boa rd and the environment they are in.
Fairchild provides thermal information to assist the
designer’s preliminary application evaluation. Figure 21
defines the R
copper (component side) area. This is for a horizontally
for the device as a function of the top
θJA
positi on ed FR-4 board w i th 1 oz c opper af ter 100 0 se c on ds
of stea dy st ate pow er w ith n o air flow . Th is gr aph prov ides
the necessary inf ormation for calculation of the steady state
junction temperature or power dissipation. Pulse
applications can be evaluated using the Fairchild device
Spice t hermal model or manually u tilizing the normalized
150
COPPER BOARD AREA - DESCENDING ORDER
2
0.04 in
2
0.28 in
120
C/W)
o
90
0.52 in
0.76 in
1.00 in
2
2
2
maximum transient thermal impedance curve.
Therma l resistan ces corre sponding to other co pper areas
can be obtained from Figure 21 or by calculation using
Equation 2. The area, in square inches is the top copper
area including the gate and source pads.
R
The tr ansi ent t her mal i mp eda nce (Z
varied top copper board area. Figure 22 shows the effect of
copper pad area on single pulse transient thermal
impedance. Each trace represents a copper pad area in
square inches corresponding to the descending list in the
graph. Spice and SABER thermal models are provided for
each of the listed pad areas.
Copper pad area has no perceivable effect on transient
thermal impedance for pulse widths less than 100ms. For
pulse widths less than 100ms the transient thermal
impedance is determined by the die and package.
Therefore, CTHERM1 through CTHERM5 and RTHERM1
through RT HER M 5 re main co ns ta nt fo r ea ch of th e th erm al
models . A li sti ng of th e m od el comp one nt v alue s i s ava i labl e
in Table 1.
64
θJA
200
150
C/W)
o
(
θJA
R
100
50
0.0010.010.1110
26
-------------------------------+=
0.23 Area+
θJA
R
θJA
AREA, TOP COPPER AREA (in2)
(EQ. 2)
) is also ef fect ed by
= 64 + 26/(0.23+Area)
Figure 21. Thermal Resistance vs Mounting
Pad Area
FDS2582
, THERMAL
60
θJA
Z
IMPEDANCE (
30
0
-1
10
0
10
t, RECTANGULAR PULSE DURATION (s)
1
10
2
10
3
10
Figure 22. Thermal Impedance vs Mount ing Pad Area
.MODEL Rb reakMOD RES (T C1=1.1e-3 TC2=-1.0e-8)
.MODEL RdrainMOD RE S (T C1=1.15e-2 TC2=3.0 e-5)
.MODEL RSLCMOD RES (TC1=4.4e-3 TC2=2.9e-6)
.MODEL RsourceMOD RES (TC1=1e-3 TC2=1e-6)
.MODEL RvthresMOD RES (TC1=-3.9e -3 T C2=-1.6e-5 )
.MODEL RvtempMOD RES (T C1=-3.5e-3 TC2=1.5e-6)
.ENDS
Note: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global Temperature Options; IEEE Power Electroni cs Specialist Conference Records, 1991, written by Wil liam J. Hepp and C. F rank
Wheatley.
The following are registe red and unr egistered trademarks Fairchild Semiconductor owns or is aut horized to use and is not
intended to be an exhaustive list of all such trademarks.
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY
PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY
LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN;
NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR
CORPORATION.
As used herein:
1. Life support devices or systems are devices or systems
which, (a) ar e int ende d fo r s urgic al i mpla nt into the bo dy,
or (b) support or sustain life, or (c) whose failure to perform
when properly used in accordance with instructions for use
provided in the labeling, can be reasonably expected to
result in significant injury to the user.
2. A critical component is any component of a life support
device or system whose failure to perform can be
reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet IdentificationProduct StatusDefinition
Adva nce InformationFormative or I n
Design
PreliminaryFirst ProductionThis datasheet contains preliminary data, and
No Identification NeededFull ProductionThis datasheet contains final specifications. Fairchild
ObsoleteNot In ProductionThis datasheet contains specifications on a product
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
supple m entary data will be published at a later dat e.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
Semiconductor reserves the righ t to make chan ges at
any time without notice in order to improve design.
that has been discontinued b y Fairchild semico nductor.
The datasheet is printed for reference information only.
Rev. I1
Loading...
+ hidden pages
You need points to download manuals.
1 point = 1 manual.
You can buy points or you can get point for every manual you upload.