UltraFET® devices combine characteristics that enable
benchmark efficiency in power conversion applications.
Optimized for Rds(on), low ESR, low total and Miller gate
charge, these devices are ideal for high frequency DC to
DC converters.
Applications
• DC/DC converters
• Telecom and Data-Com Distributed Power Architectures
• 48-volt I/P Half-Bridge/Full-Bridge
• 24-volt Forward and Push-Pull topologies
D
D
D
D
D
D
D
D
SO-8
S
S
S
SO-8
Pin 1
MOSFET Maximum RatingsT
SymbolParameterRatingsUnits
V
DSS
V
GS
I
D
P
D
TJ, T
STG
Drain to Source Voltage150V
Gate to Source Voltage±20V
Drain Current
Continuous (TC = 25oC, VGS = 10V, R
Continuous (TC = 100oC, VGS = 10V, R
PulsedFigure 4A
Power dissipation
Derate above 25oC
Operating and Storage Temperature-55 to 150
S
S
=25°C unless otherwise noted
A
θJA
Features
• R
• Q
• Low QRR Body Diode
• Maximized efficiency at high frequencies
• UIS Rated
G
= 0.040Ω (Typ.), V
DS(ON)
= 29nC (Typ.), V
g(TOT)
= 10V
GS
= 10V
GS
5
6
7
4
3
2
S
8
= 50 oC/W)
= 50 oC/W) 3.1A
θJA
4.9A
2.5
20
1
W
mW/oC
o
C
Thermal Characteristics
R
θJC
R
θJA
R
θJA
Thermal Resistance Junction to Case (NOTE1)25
Thermal Resistance Junction to Case at 10 seconds (NOTE2)50
Thermal Resistance Junction to Case at steady state (NOTE2)85
VGS = 10V, RG = 10Ω
Fall Time-22-ns
Turn-Off Time--100ns
µA
Drain-Source Diode Characteristics
I
= 4.9A--1.25V
V
SD
t
rr
Q
RR
Notes:
1. R
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal referance is defined as the solder mounting surface of the
The maximum rated junction temperature, TJM, and the
thermal resistance of the heat dissipating path
determines the maximum allowable device power
dissipation, PDM, in an application. Therefore the
application’s ambient temperature, TA (oC), and thermal
resistance R
TJM is never exceeded. Equation 1 mathematically
(oC/W) must be reviewed to ensure that
θJA
represents the relationship and serves as the basis for
establishing the rating of the part.
P
TJMTA–()
-----------------------------=
DM
R
θJA
(EQ. 1)
In using surface mount devices such as the SO8
package, the environment in which it is applied will have
a significant influence on the part’s current and maximum
power dissipation ratings. Precise determination of P
is complex and influenced by many factors:
DM
1. Mounting pad area onto which the device is attached
and whether there is copper on one side or both sides
of the board.
2. The number of copper layers and the thickness of the
board.
3. The use of external heat sinks.
4. The use of thermal vias.
5. Air flow and board orientation.
6. For non steady state applications, the pulse width, the
duty cycle and the transient thermal response of the
part, the board and the environment they are in.
Fairchild provides thermal information to assist the
designer’s preliminary application evaluation. Figure 19
defines the R
copper (component side) area. This is for a horizontally
for the device as a function of the top
θJA
positioned FR-4 board with 1oz copper after 1000
seconds of steady state power with no air flow. This
graph provides the necessary information for calculation
of the steady state junction temperature or power
dissipation. Pulse applications can be evaluated using
the Fairchild device Spice thermal model or manually
COPPER BOARD AREA - DESCENDING ORDER
2
0.04 in
2
0.28 in
120
C/W)
o
90
0.52 in
0.76 in
1.00 in
2
2
2
utilizing the normalized maximum transient thermal
impedance curve.
Thermal resistances corresponding to other copper
areas can be obtained from Figure 19 or by calculation
using Equation 2. The area, in square inches is the top
copper area including the gate and source pads.
R
The transient thermal impedance (Z
by varied top copper board area. Figure 20 shows the
effect of copper pad area on single pulse transient
thermal impedance. Each trace represents a copper pad
area in square inches corresponding to the descending
list in the graph. Spice and SABER thermal models are
provided for each of the listed pad areas.
Copper pad area has no perceivable effect on transient
thermal impedance for pulse widths less than 100ms.
For pulse widths less than 100ms the transient thermal
impedance is determined by the die and package.
Therefore, CTHERM1 through CTHERM5 and
RTHERM1 through RTHERM5 remain constant for each
of the thermal models. A listing of the model component
values is available in Table 1.
.MODEL RbreakMOD RES (TC1=1.1e-3 TC2=-3e-7)
.MODEL RdrainMOD RES (TC1=1e-2 TC2=3e-5)
.MODEL RSLCMOD RES (TC1=3e-3 TC2=1e-6)
.MODEL RsourceMOD RES (TC1=4.5e-3 TC2=1e-6)
.MODEL RvtempMOD RES (TC1=-5e-3 TC2=2e-6)
.MODEL RvthresMOD RES (TC1=-3e-3 TC2=-1.4e-5)
Note: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global Temperature Options; IEEE Power Electronics Specialist Conference Records, 1991, written by William J. Hepp and C. Frank
Wheatley.
1.All dimensions are within allowable dimensions of
Rev. C of JEDEC MS-012AA outline dated 5-90.
2.Dimension “D” does not include mold flash, protrusions or gate burrs. Mold flash, protrusions or gate
burrs shall not exceed 0.006 inches (0.15mm) per
side.
3. Dimension “E1” does not include inter-lead flash or
protrusions. Inter-lead flash and protrusions shall
not exceed 0.010 inches (0.25mm) per side.
4.“L” is the length of terminal for soldering.
5.The chamfer on the body is optional. If it is not
present, a visual index feature must be located within the crosshatched area.
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is
not intended to be an exhaustive list of all such trademarks.
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER
NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD
DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT
RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant into
the body, or (b) support or sustain life, or (c) whose
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
reasonably expected to result in significant injury to the
user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet IdentificationProduct StatusDefinition
Advance Information
Preliminary
No Identification Needed
Formative or
In Design
First Production
Full Production
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. H4
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