Datasheet FDS2572 Datasheet (Fairchild Semiconductor)

Page 1
FDS2572
150V, 0.047 Ohms, 4.9A, N-Channel UltraFET® Trench MOSFET
FDS2572
October 2001
General Description
UltraFET® devices combine characteristics that enable benchmark efficiency in power conversion applications. Optimized for Rds(on), low ESR, low total and Miller gate charge, these devices are ideal for high frequency DC to DC converters.
Applications
• DC/DC converters
• Telecom and Data-Com Distributed Power Architectures
• 48-volt I/P Half-Bridge/Full-Bridge
• 24-volt Forward and Push-Pull topologies
D
D
D
D
D
D
D
D
SO-8
S
S
S
SO-8
Pin 1
MOSFET Maximum Ratings T
Symbol Parameter Ratings Units
V
DSS
V
GS
I
D
P
D
TJ, T
STG
Drain to Source Voltage 150 V Gate to Source Voltage ±20 V Drain Current Continuous (TC = 25oC, VGS = 10V, R Continuous (TC = 100oC, VGS = 10V, R Pulsed Figure 4 A Power dissipation
Derate above 25oC Operating and Storage Temperature -55 to 150
S
S
=25°C unless otherwise noted
A
θJA
Features
• R
• Q
• Low QRR Body Diode
• Maximized efficiency at high frequencies
• UIS Rated
G
= 0.040Ω (Typ.), V
DS(ON)
= 29nC (Typ.), V
g(TOT)
= 10V
GS
= 10V
GS
5 6 7
4 3 2
S
8
= 50 oC/W)
= 50 oC/W) 3.1 A
θJA
4.9 A
2.5 20
1
W
mW/oC
o
C
Thermal Characteristics
R
θJC
R
θJA
R
θJA
Thermal Resistance Junction to Case (NOTE1) 25 Thermal Resistance Junction to Case at 10 seconds (NOTE2) 50 Thermal Resistance Junction to Case at steady state (NOTE2) 85
o
C/W
o
C/W
o
C/W
Package Marking and Ordering Information
Device Marking Device Reel Size Tape Width Quantity
FDS2572 FDS2572 330mm 12mm 2500units
©2001 Fairchild Semiconductor Corporation
FDS2572 Rev. B, October 2001
Page 2
FDS2572
Electrical Characteristics T
= 25°C unless otherwise noted
A
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics
B I
DSS
I
GSS
VDSS
Drain to Source Breakdown Voltage ID = 250µA, VGS = 0V 150 - - V Zero Gate Voltage Drain Current
VDS = 120V - - 1 VGS = 0V TC = 150
o
- - 250
Gate to Source Leakage Current VGS = ±20V - - ±100 nA
On Characteristics
V
GS(TH)
r
DS(ON)
r
DS(ON)
Gate to Source Threshold Voltage VGS = VDS, ID = 250µA 2 - 4 V Drain to Source On Resistance ID = 4.9A, VGS = 10V - 0.040 0.047 Ω Drain to Source On Resistance ID = 4.9A, VGS = 6V - 0.044 0.053 Ω
Dynamic Characteristics
C
ISS
C
OSS
C
RSS
Q
g(TOT)
Q
g(TH)
Q
gs
Q
gd
Q
gs2
Input Capacitance Output Capacitance - 220 - pF Reverse Transfer Capacitance - 48 - pF
VDS = 25V, VGS = 0V, f = 1MHz
Total Gate Charge at 10V VGS= 0V to 10V Threshold Gate Charge VGS = 0V to 2V - 4 6 nC Gate to Source Gate Charge - 8 - nC Gate to Drain “Miller” Charge - 6 - nC
VDD = 75V ID = 4.9A Ig = 1.0mA
- 2050 - pF
- 29 38 nC
Gate Charge Threshold to Plateau - 4 - nC
Switching Characteristics
t
ON
t
d(ON)
t
r
t
d(OFF)
t
f
t
OFF
Turn-On Time
- - 27 ns Turn-On Delay Time - 14 - ns Rise Time - 4 - ns Turn-Off Delay Time - 44 - ns
VDD = 75V, ID = 4.9A
VGS = 10V, RG = 10Ω Fall Time - 22 - ns Turn-Off Time - - 100 ns
µA
Drain-Source Diode Characteristics
I
= 4.9A - - 1.25 V
V
SD
t
rr
Q
RR
Notes:
1. R
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal referance is defined as the solder mounting surface of the
θJA
drain pins. R
2. R
is measured with 1.0in2 copper on FR-4 board
θJA
©2001 Fairchild Semiconductor Corporation FDS2572 Rev. B, October 2001
Source to Drain Diode Voltage Reverse Recovery Time ISD = 4.9A, dISD/dt =100A/µs - - 72 ns
Reverse Recovered Charge ISD = 4.9, dISD/dt =100A/µs - - 158 nC
is guaranteed by design while R
θJC
is determined by the user’s board design.
θCA
SD
ISD = 3.1A - - 1.0 V
Page 3
Typical Characteristic
FDS2572
1.2
1.0
0.8
0.6
0.4
0.2
POWER DISSIPATION MULTIPLIER
0
0 25 50 75 100 150
125
TA, AMBIENT TEMPERATURE (oC)
Figure 1. Normalized Power Dissipation vs
Ambient Temperature
2
DUTY CYCLE - DESCENDING ORDER
1
0.5
0.2
0.1
0.05
0.02
0.01
0.1
, NORMALIZED
θJA
0.01
Z
THERMAL IMPEDANCE
SINGLE PULSE
0.001
-5
10
-4
10
-3
10
10
t, RECTANGULAR PULSE DURATION (s)
6
VGS = 10V
4
2
, DRAIN CURRENT (A)
D
I
0
25 50 75 100 125 150
TC, CASE TEMPERATURE (oC)
Figure 2. Maximum Continous Drain Current vs
Case Temperature
P
DM
t
1
t
x R
2
2
+ T
θJA
A
2
10
3
10
NOTES: DUTY FACTOR: D = t1/t
PEAK TJ = PDM x Z
-2
-1
10
0
10
10
θJA
1
Figure 3. Normalized Maximum Transient Thermal Impedance
600
TRANSCONDUCTANCE MAY LIMIT CURRENT IN THIS REGION
100
VGS = 10V
10
, PEAK CURRENT (A)
DM
I
1
-5
10
-4
10
-3
10
-2
10
-1
10
0
10
t, PULSE WIDTH (s)
TC = 25oC FOR TEMPERATURES ABOVE 25oC DERATE PEAK CURRENT AS FOLLOWS:
I = I
1
10
150 - T
25
125
2
10
C
3
10
Figure 4. Peak Current Capability
©2001 Fairchild Semiconductor Corporation FDS2572 Rev. B, October 2001
Page 4
Typical Characteristic (Continued)
FDS2572
10
STARTING TJ = 25oC
STARTING TJ = 150oC
1
, AVALANCHE CURRENT (A)
If R = 0
AS
I
tAV = (L)(IAS)/(1.3*RATED BV If R ≠ 0
tAV = (L/R)ln[(IAS*R)/(1.3*RATED BV
0.1
0.001 0.1 1 10 100 tAV, TIME IN AVALANCHE (ms)
DSS
- VDD)
DSS
- VDD) +1]
Figure 5. Unclamped Inductive Switching
Capability
30
VGS = 10V
VGS = 6V
20
10
, DRAIN CURRENT (A)
D
I
0
0 0.5 1.0 1.5 2.0
VDS, DRAIN TO SOURCE VOLTAGE (V)
VGS = 4.5V
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
TC = 25oC
VGS = 5V
30
PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
V
= 15V
DD
20
TJ = 25oC
10
, DRAIN CURRENT (A)
D
I
TJ = 150oC
TJ = -55oC
0
3 4 5 6
VGS, GATE TO SOURCE VOLTAGE (V)
Figure 6. Transfer Characteristics
2.5 PULSE DURATION = 80µs DUTY CYCLE = 0.5% MAX
2.0
1.5
1.0
ON RESISTANCE
0.5
NORMALIZED DRAIN TO SOURCE
0
-80 -40 0 40 80 120 160 TJ, JUNCTION TEMPERATURE (oC)
VGS = 10V, ID = 4.9A
Figure 7. Saturation Characteristics Figure 8. Normalized Drain to Source On
Resistance vs Junction Temperature
1.4
1.2
1.0
0.8
NORMALIZED GATE
THRESHOLD VOLTAGE
0.6
0.4
-80 -40 0 40 80 120 160 TJ, JUNCTION TEMPERATURE (oC)
VGS = VDS, ID = 250µA
Figure 9. Normalized Gate Threshold Voltage vs
Junction Temperature
©2001 Fairchild Semiconductor Corporation FDS2572 Rev. B, October 2001
1.2 ID = 250µA
1.1
1.0
BREAKDOWN VOLTAGE
NORMALIZED DRAIN TO SOURCE
0.9
-80 -40 0 40 80 120 160 TJ, JUNCTION TEMPERATURE (oC)
Figure 10. Normalized Drain to Source
Breakdown Voltage vs Junction Temperature
Page 5
Typical Characteristic (Continued)
C
, CAPACITANCE (pF
)
FDS2572
5000
C
ISS
= CGS + C
1000
C
≅ C
OSS
C
= C
RSS
GD
100
V
= 0V, f = 1MHz
GS
10
0.1 1 10 150 VDS, DRAIN TO SOURCE VOLTAGE (V)
Figure 11. Capacitance vs Drain to Source
Voltage
Test Circuits and Waveforms
V
DS
L
VARY tP TO OBTAIN REQUIRED PEAK I
V
GS
AS
R
G
DUT
GD
VDD = 75V
8
10
+ C
DS
GD
6
4
WAVEFORMS IN
2
, GATE TO SOURCE VOLTAGE (V)
GS
V
0
0 5 10 15 20 25 30 35
DESCENDING ORDER:
ID = 4.9A ID = 1A
Qg, GATE CHARGE (nC)
Figure 12. Gate Charge Waveforms for Constant
Gate Currents
BV
DSS
t
P
I
AS
+
V
DD
-
V
DS
V
DD
t
0V
P
I
AS
0.01Ω
0
t
AV
Figure 13. Unclamped Energy Test Circuit Figure 14. Unclamped Energy Waveforms
D1
V
I
g(REF)
DS
L
V
GS
+
V
DD
-
DUT
V
DD
Q
g(TOT)
V
DS
V
V
GS
V
= 2V
GS
Q
0
Q
g(TH)
I
g(REF)
gs2
Q
gs
Q
gd
0
Figure 15. Gate Charge Test Circuit Figure 16. Gate Charge Waveforms
GS
= 10V
©2001 Fairchild Semiconductor Corporation FDS2572 Rev. B, October 2001
Page 6
Test Circuits and Waveforms (Continued)
FDS2572
V
DS
R
L
V
GS
R
GS
V
GS
DUT
+
V
DD
-
V
DS
0
V
GS
10%
0
t
d(ON)
90%
t
ON
50%
10%
t
r
PULSE WIDTH
t
Figure 17. Switching Time Test Circuit Figure 18. Switching Time Waveforms
d(OFF)
90%
t
OFF
t
f
90%
10%
50%
©2001 Fairchild Semiconductor Corporation FDS2572 Rev. B, October 2001
Page 7
Thermal Resistance vs. Mounting Pad Area
150
The maximum rated junction temperature, TJM, and the thermal resistance of the heat dissipating path determines the maximum allowable device power dissipation, PDM, in an application. Therefore the application’s ambient temperature, TA (oC), and thermal resistance R TJM is never exceeded. Equation 1 mathematically
(oC/W) must be reviewed to ensure that
θJA
represents the relationship and serves as the basis for establishing the rating of the part.
P
TJMTA–()
-----------------------------=
DM
R
θJA
(EQ. 1)
In using surface mount devices such as the SO8 package, the environment in which it is applied will have a significant influence on the part’s current and maximum power dissipation ratings. Precise determination of P is complex and influenced by many factors:
DM
1. Mounting pad area onto which the device is attached and whether there is copper on one side or both sides of the board.
2. The number of copper layers and the thickness of the board.
3. The use of external heat sinks.
4. The use of thermal vias.
5. Air flow and board orientation.
6. For non steady state applications, the pulse width, the duty cycle and the transient thermal response of the part, the board and the environment they are in.
Fairchild provides thermal information to assist the designer’s preliminary application evaluation. Figure 19 defines the R copper (component side) area. This is for a horizontally
for the device as a function of the top
θJA
positioned FR-4 board with 1oz copper after 1000 seconds of steady state power with no air flow. This graph provides the necessary information for calculation of the steady state junction temperature or power dissipation. Pulse applications can be evaluated using the Fairchild device Spice thermal model or manually
COPPER BOARD AREA - DESCENDING ORDER
2
0.04 in
2
0.28 in
120
C/W)
o
90
0.52 in
0.76 in
1.00 in
2 2 2
utilizing the normalized maximum transient thermal impedance curve.
Thermal resistances corresponding to other copper areas can be obtained from Figure 19 or by calculation using Equation 2. The area, in square inches is the top copper area including the gate and source pads.
R
The transient thermal impedance (Z by varied top copper board area. Figure 20 shows the effect of copper pad area on single pulse transient thermal impedance. Each trace represents a copper pad area in square inches corresponding to the descending list in the graph. Spice and SABER thermal models are provided for each of the listed pad areas.
Copper pad area has no perceivable effect on transient thermal impedance for pulse widths less than 100ms. For pulse widths less than 100ms the transient thermal impedance is determined by the die and package. Therefore, CTHERM1 through CTHERM5 and RTHERM1 through RTHERM5 remain constant for each of the thermal models. A listing of the model component values is available in Table 1.
64
θJA
200
150
C/W)
o
(
θJA
R
100
50
0.001 0.01 0.1 1 10
26
-----------------------------+=
0.23 Area+
θJA
R
= 64 + 26/(0.23+Area)
θJA
AREA, TOP COPPER AREA (in2)
(EQ. 2)
) is also effected
Figure 19. Thermal Resistance vs Mounting
Pad Area
FDS2572
, THERMAL
60
θJA
Z
IMPEDANCE (
30
0
-1
10
0
10
t, RECTANGULAR PULSE DURATION (s)
1
10
2
10
3
10
Figure 20. Thermal Impedance vs Mounting Pad Area
©2001 Fairchild Semiconductor Corporation FDS2572 Rev. B, October 2001
Page 8
PSPICE Electrical Model
.SUBCKT FDS2572 2 1 3 ;rev August 2001 CA 12 8 8e-10 Cb 15 14 8e-10 Cin 6 8 2e-9
Dbody 7 5 DbodyMOD Dbreak 5 11 DbreakMOD Dplcap 10 5 DplcapMOD
Ebreak 11 7 17 18 157.4 Eds 14 8 5 8 1 Egs 13 8 6 8 1 Esg 6 10 6 8 1 Evthres 6 21 19 8 1 Evtemp 20 6 18 22 1
It 8 17 1 Lgate 1 9 5.61e-9
Ldrain 2 5 1.0e-9 Lsource 3 7 1.98e-9
RLgate 1 9 56.1 RLdrain 2 5 10 RLsource 3 7 19.8
Mstro 16 6 8 8 MstroMOD Mmed 16 6 8 8 MmedMOD Mweak 16 21 8 8 MweakMOD
Rbreak 17 18 RbreakMOD 1 Rdrain 50 16 RdrainMOD 2.1e-2 Rgate 9 20 1.47 RSLC1 5 51 RSLCMOD 1e-6 RSLC2 5 50 1e3 Rsource 8 7 RsourceMOD 1.5e-2 Rvthres 22 8 RvthresMOD 1 Rvtemp 18 19 RvtempMOD 1 S1a 6 12 13 8 S1AMOD S1b 13 12 13 8 S1BMOD S2a 6 15 14 13 S2AMOD S2b 13 15 14 13 S2BMOD
GATE
1
LGATE
RLGATE
RGATE
9
CA
ESG
EVTEMP +
18 22
20
S1A
12
13814
S1B
EGS EDS
FDS2572
7
-
+
22
LDRAIN
RLDRAIN
DBODY
LSOURCE
RLSOURCE
RVTEMP 19
VBAT
DRAIN
2
SOURCE
3
DPLCAP
10
RSLC2
­6
8
EVTHRES
+
+
6
-
S2A
13
S2B
13
+
+
6 8
-
-
5
RSLC1
51
+
5
ESLC
51
­50
RDRAIN
16
21
-
19
8
MSTRO
CIN
15
CB
8
14
+
5 8
-
MMED
8
DBREAK
11
+
17
EBREAK
IT
18
-
MWEAK
RSOURCE
RBREAK
17 18
RVTHRES
Vbat 22 19 DC 1 ESLC 51 50 VALUE={(V(5,51)/ABS(V(5,51)))*(PWR(V(5,51)/(1e-6*65),3))} .MODEL DbodyMOD D (IS=4e-11 N=1.131 RS=4.4e-3 TRS1=2e-3 TRS2=1e-6
+ CJO=1.44e-9 M=0.67 TT=7.4e-8 XTI=4.2) .MODEL DbreakMOD D (RS=0.38 TRS1=2e-3 TRS2=-8.9e-6) .MODEL DplcapMOD D (CJO=5e-10 IS=1e-30 N=10 M=0.7)
.MODEL MstroMOD NMOS (VTO=4.05 KP=85 IS=1e-30 N=10 TOX=1 L=1u W=1u) .MODEL MmedMOD NMOS (VTO=3.35 KP=5 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=1.47) .MODEL MweakMOD NMOS (VTO=2.76 KP=0.05 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=14.7 RS=0.1)
.MODEL RbreakMOD RES (TC1=1.1e-3 TC2=-3e-7) .MODEL RdrainMOD RES (TC1=1e-2 TC2=3e-5) .MODEL RSLCMOD RES (TC1=3e-3 TC2=1e-6) .MODEL RsourceMOD RES (TC1=4.5e-3 TC2=1e-6) .MODEL RvtempMOD RES (TC1=-5e-3 TC2=2e-6) .MODEL RvthresMOD RES (TC1=-3e-3 TC2=-1.4e-5)
.MODEL S1AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-10 VOFF=-2) .MODEL S1BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-2 VOFF=-10) .MODEL S2AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-0.8 VOFF=0.3) .MODEL S2BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=0.3 VOFF=-0.8) .ENDS
Note: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global Temperature Options; IEEE Power Electronics Specialist Conference Records, 1991, written by William J. Hepp and C. Frank Wheatley.
©2001 Fairchild Semiconductor Corporation FDS2572 Rev. B, October 2001
Page 9
SABER Electrical Model
SOURCE
REV August 2001 template FDS2572 n2,n1,n3 electrical n2,n1,n3 { var i iscl dp..model dbodymod = (isl=4e-11,nl=1.131,rs=4.4e-3,trs1=2e-3,trs2=1e-6,cjo=1.44e-9,m=0.67,tt=7.4e-8,xti=4.2) dp..model dbreakmod = (rs=0.38,trs1=2e-3,trs2=-8.9e-6) dp..model dplcapmod = (cjo=5e-10,isl=10e-30,nl=10,m=0.7) m..model mstrongmod = (type=_n,vto=4.05,kp=85,is=1e-30, tox=1) m..model mmedmod = (type=_n,vto=3.35,kp=5,is=1e-30, tox=1) m..model mweakmod = (type=_n,vto=2.76,kp=0.05,is=1e-30, tox=1,rs=0.1) sw_vcsp..model s1amod = (ron=1e-5,roff=0.1,von=-10,voff=-2) sw_vcsp..model s1bmod = (ron=1e-5,roff=0.1,von=-2,voff=-10) sw_vcsp..model s2amod = (ron=1e-5,roff=0.1,von=-0.8,voff=0.3) sw_vcsp..model s2bmod = (ron=1e-5,roff=0.1,von=0.3,voff=-0.8) c.ca n12 n8 = 8e-10 c.cb n15 n14 = 8e-10 c.cin n6 n8 = 2e-9
dp.dbody n7 n5 = model=dbodymod dp.dbreak n5 n11 = model=dbreakmod dp.dplcap n10 n5 = model=dplcapmod
spe.ebreak n11 n7 n17 n18 = 157.4
ESG
spe.eds n14 n8 n5 n8 = 1 spe.egs n13 n8 n6 n8 = 1 spe.esg n6 n10 n6 n8 = 1 spe.evthres n6 n21 n19 n8 = 1 spe.evtemp n20 n6 n18 n22 = 1
GATE
1
LGATE
RLGATE
RGATE
9
EVTEMP
+
20
i.it n8 n17 = 1 l.lgate n1 n9 = 5.61e-9
l.ldrain n2 n5 = 1.0e-9 l.lsource n3 n7 = 1.98e-9
res.rlgate n1 n9 = 56.1 res.rldrain n2 n5 = 10 res.rlsource n3 n7 = 19.8
CA
S1A
12
S1B
m.mstrong n16 n6 n8 n8 = model=mstrongmod, l=1u, w=1u m.mmed n16 n6 n8 n8 = model=mmedmod, l=1u, w=1u m.mweak n16 n21 n8 n8 = model=mweakmod, l=1u, w=1u
res.rbreak n17 n18 = 1, tc1=1.1e-3,tc2=-3e-7 res.rdrain n50 n16 = 2.1e-2, tc1=1e-2,tc2=3e-5 res.rgate n9 n20 = 1.47 res.rslc1 n5 n51 = 1e-6, tc1=3e-3,tc2=1e-6 res.rslc2 n5 n50 = 1e3 res.rsource n8 n7 = 1.5e-2, tc1=4.5e-3,tc2=1e-6 res.rvthres n22 n8 = 1, tc1=-3e-3,tc2=-1.4e-5 res.rvtemp n18 n19 = 1, tc1=-5e-3,tc2=2e-6 sw_vcsp.s1a n6 n12 n13 n8 = model=s1amod sw_vcsp.s1b n13 n12 n13 n8 = model=s1bmod sw_vcsp.s2a n6 n15 n14 n13 = model=s2amod sw_vcsp.s2b n13 n15 n14 n13 = model=s2bmod
v.vbat n22 n19 = dc=1 equations { i (n51->n50) +=iscl iscl: v(n51,n50) = ((v(n5,n51)/(1e-9+abs(v(n5,n51))))*((abs(v(n5,n51)*1e6/65))** 3)) }
DPLCAP
10
RSLC2
­6
8
EVTHRES
+
+
6
-
18 22
S2A
13814
13
S2B
13
+
+
6
EGS EDS
8
-
-
5
RSLC1
51
ISCL
16
8
MMED
8
DBREAK
11
MWEAK
EBREAK
+
RSOURCE
RBREAK
17 18
IT
RVTHRES
17 18
­7
50 RDRAIN
21
-
19
8
MSTRO
CIN
15
CB
14
+
5 8
-
LDRAIN
RLDRAIN
DBODY
LSOURCE
RLSOURCE
RVTEMP 19
­VBAT
+
22
DRAIN
2
3
FDS2572
©2001 Fairchild Semiconductor Corporation FDS2572 Rev. B, October 2001
Page 10
FDS2572
SPICE Thermal Model
REV August 2001 FDS2572 Copper Area = 1 in
2
CTHERM1 TH 8 2.0e-3 CTHERM2 8 7 5.0e-3 CTHERM3 7 6 1.0e-2 CTHERM4 6 5 4.0e-2 CTHERM5 5 4 9.0e-2 CTHERM6 4 3 2.0e-1 CTHERM7 3 2 1 CTHERM8 2 TL 3
RTHERM1 TH 8 1.0e-1 RTHERM2 8 7 5.0e-1 RTHERM3 7 6 1 RTHERM4 6 5 5 RTHERM5 5 4 8 RTHERM6 4 3 12 RTHERM7 3 2 18 RTHERM8 2 TL 25
SABER Thermal Model
Copper Area = 1 in template thermal_model th tl thermal_c th, tl { ctherm.ctherm1 th c2 =2.0e-3 ctherm.ctherm2 c2 c3 =5.0e-3 ctherm.ctherm3 c3 c4 =1.0e-2 ctherm.ctherm4 c4 c5 =4.0e-2 ctherm.ctherm5 c5 c6 =9.0e-2 ctherm.ctherm6 c6 c7 =2.0e-1 ctherm.ctherm7 c7 c8 =1 ctherm.ctherm8 c8 tl =3
rtherm.rtherm1 th c2 =1.0e-1 rtherm.rtherm2 c2 c3 =5.0e-1 rtherm.rtherm3 c3 c4 =1 rtherm.rtherm4 c4 c5 =5 rtherm.rtherm5 c5 c6 =8 rtherm.rtherm6 c6 c7 =12 rtherm.rtherm7 c7 c8 =18 rtherm.rtherm8 c8 tl =25 }
2
RTHERM1
RTHERM2
RTHERM3
RTHERM4
RTHERM5
RTHERM6
RTHERM7
RTHERM8
JUNCTION
th
CTHERM1
8
CTHERM2
7
CTHERM3
6
CTHERM4
5
CTHERM5
4
CTHERM6
3
CTHERM7
2
CTHERM8
tl
CASE
TABLE 1. THERMAL MODELS
COMPONANT 0.04 in
2
0.28 in
2
0.52 in
2
0.76 in
2
1.0 in
2
CTHERM6 1.2e-1 1.5e-1 2.0e-1 2.0e-1 2.0e-1 CTHERM7 0.5 1.0 1.0 1.0 1.0 CTHERM8 1.3 2.8 3.0 3.0 3.0 RTHERM6 26 20 15 13 12 RTHERM7 39 24 21 19 18 RTHERM8 55 38.7 31.3 29.7 25
©2001 Fairchild Semiconductor Corporation FDS2572 Rev. B, October 2001
Page 11
MS-012AA
8 LEAD JEDEC MS-012AA SMALL OUTLINE PLASTIC PACKAGE
FDS2572
E E
1
1
2
D
o
h x 45
L
0.060
1.52
0.155
4.0
0.275
7.0
MINIMUM RECOMMENDED FOOTPRINT FOR
SURFACE-MOUNTED APPLICATIONS
e
5 6
c
b
0o-8
0.050
0.024
0.6
1.27
A
A
1
SYMBOL
INCHES MILLIMETERS
MIN MAX MIN MAX
NOTES
A 0.0532 0.0688 1.35 1.75 -
A
0.004 0.0098 0.10 0.25 -
1
b 0.013 0.020 0.33 0.51 -
c 0.0075 0.0098 0.19 0.25 ­D 0.189 0.1968 4.80 5.00 2 E 0.2284 0.244 5.80 6.20 -
E
0.1497 0.1574 3.80 4.00 3
1
0.004 IN
0.10 mm
o
e 0.050 BSC 1.27 BSC ­H 0.0099 0.0196 0.25 0.50 ­L 0.016 0.050 0.40 1.27 4
NOTES:
1.All dimensions are within allowable dimensions of Rev. C of JEDEC MS-012AA outline dated 5-90.
2.Dimension “D” does not include mold flash, protru­sions or gate burrs. Mold flash, protrusions or gate burrs shall not exceed 0.006 inches (0.15mm) per side.
3. Dimension “E1” does not include inter-lead flash or protrusions. Inter-lead flash and protrusions shall not exceed 0.010 inches (0.25mm) per side.
4.“L” is the length of terminal for soldering.
5.The chamfer on the body is optional. If it is not present, a visual index feature must be located with­in the crosshatched area.
6.Controlling dimension:Millimeter.
7.Revision 8 dated 5-99.
MS-012AA
12mm TAPE AND REEL
COVER TAPE
GENERAL INFORMATION
1. 2500 PIECES PER REEL.
2. ORDER IN MULTIPLES OF FULL REELS ONLY.
3. MEETS EIA-481 REVISION “A” SPECIFICATIONS.
©2001 Fairchild Semiconductor Corporation FDS2572 Rev. B, October 2001
1.5mm
DIA. HOLE
12mm
USER DIRECTION OF FEED
4.0mm
8.0mm
2.0mm
1.75mm
C
L
40mm MIN. ACCESS HOLE
330mm 50mm
18.4mm
13mm
12.4mm
Page 12
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TM
FACT™ FACT Quiet Series™
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FAST FASTr™ FRFET™ GlobalOptoisolator™ GTO™ HiSeC™ ISOPLANAR™ LittleFET™ MicroFET™ MicroPak™ MICROWIRE™
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SMART START™ STAR*POWER™ Stealth™ SuperSOT™-3 SuperSOT™-6 SuperSOT™-8 SyncFET™ TinyLogic™ TruTranslation™ UHC™
UltraFET
VCX™
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1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, or (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in significant injury to the user.
PRODUCT STATUS DEFINITIONS Definition of Terms
Datasheet Identification Product Status Definition
Advance Information
Preliminary
No Identification Needed
Formative or In Design
First Production
Full Production
2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or
effectiveness.
This datasheet contains the design specifications for product development. Specifications may change in any manner without notice.
This datasheet contains preliminary data, and supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design.
This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product that has been discontinued by Fairchild semiconductor. The datasheet is printed for reference information only.
Rev. H4
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