Datasheet FDP65N06 Datasheet (Fairchild)

Page 1
FDP65N06
60V N-Channel MOSFET
FDP65N06 60V N-Channel MOSFET
June 2006
TM
UniFET
• 65A, 60V, R
• Low gate charge ( typical 132nC)
• Low Crss ( typical 35pF)
•Fast switching
• Improved dv/dt capability
= 0.016Ω @VGS = 10 V
DS(on)
G
D
S
TO-220
FDP Series
Description
These N-Channel enhancement mode power field effect transistors are produced using Fairchild’s proprietary, planar stripe, DMOS technology. This advanced technology has been especially tailored to minimize on-state resistance, provide superior switching performance, and withstand high energy pulse in the avalanche and commutation mode. These devices are well suited for high efficient switched mode power supplies, active power factor correction, electronic lamp ballast based on half bridge topology.
D
G
S
Absolute Maximum Ratings
Symbol Parameter FDP65N06 Units
V
DSS
I
D
I
DM
V
GSS
E
AS
I
AR
E
AR
dv/dt Peak Diode Recovery dv/dt P
D
, T
T
J
STG
T
L
Drain-Source Voltage 60 V Drain Current - Continuous (TC = 25°C) 65 A
- Continuous (T Drain Current - Pulsed Gate-Source Voltage ± 20 V Single Pulsed Avalanche Energy Avalanche Current Repetitive Avalanche Energy
Power Dissipation (TC = 25°C) 135 W
- Derate above 25°C 1.08 W/°C Operating and Storage Temperature Range -55 to +150 °C Maximum lead temperature for soldering purposes,
1/8" from case for 5 seconds
= 100°C) 41 A
C
(Note 1)
(Note 2) (Note 1) (Note 1) (Note 3)
260 A
430 mJ
65 A
13.5 mJ
4.5 V/ns
300 °C
Thermal Characteristics
Symbol Parameter FDP65N06 Units
R
θJC
R
θJA
©2006 Fairchild Semiconductor Corporation 1 www.fairchildsemi.com
FDP65N06 Rev. A1
Thermal Resistance, Junction-to-Case 0.92 °C/W Thermal Resistance, Junction-to-Ambient 62.5 °C/W
Page 2
Package Marking and Ordering Information
Device Marking Device Package Reel Size Tape Width Quantity
FDP65N06 FDP65N06 TO-220 -- -- 50
FDP65N06 60V N-Channel MOSFET
Electrical Characteristics T
= 25°C unless otherwise noted
C
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics
BV
DSS
∆BV ∆T
J
I
DSS
I
GSSF
I
GSSR
On Characteristics V
GS(th)
R
DS(on)
g
FS
Dynamic Characteristics C
iss
C
oss
C
rss
Switching Characteristics t
d(on)
t
r
t
d(off)
t
f
Q
g
Q
gs
Q
gd
Drain-Source Diode Characteristics and Maximum Ratings I
S
I
SM
V
SD
t
rr
Q
rr
NOTES:
1. Repetitive Rating : Pulse width limited by maximum junction temperature
2. L = 47µH, IAS =65A, VDD = 50V, RG = 25 Ω, Starting TJ = 25°C
3. ISD ≤ 65A, di/dt ≤200A/µs, VDD ≤ BV
4. Pulse Test : Pulse width ≤ 300µs, Duty cycle ≤ 2%
5. Essentially independent of operating temp er at ur e
Drain-Source Breakdown Voltage VGS = 0 V, ID = 250 µA60----V
/
DSS
Breakdown Voltage Temperature Coefficient ID = 250 µA, Referenced to 25°C -- 0.5 -- V/°C Zero Gate Voltage Drain Current VDS = 60 V, VGS = 0 V -- -- 1 µA
= 48 V, TC = 125°C -- -- 10 µA
V
DS
Gate-Body Leakage Current, Forward VGS = 20 V, VDS = 0 V -- -- 100 nA Gate-Body Leakage Current, Reverse VGS = -20 V, VDS = 0 V -- -- -100 nA
Gate Threshold Voltage VDS = VGS, ID = 250 µA2.0--4.0V Static Drain-Source On-Resistance VGS = 10 V, ID = 32.5 A -- 0.013 0.016 Ω Forward Transconductance VDS = 40 V, ID = 32.5 A (Note 4) -- 39 -- S
Input Capacitance VDS = 25 V, VGS = 0 V, Output Capacitance -- 464 600 pF
f = 1.0 MHz
-- 1670 2170 pF
Reverse Transfer Capacitance -- 35 52 pF
Turn-On Delay Time VDD = 30 V, ID = 65A,
R
= 25 Ω
Turn-On Rise Time -­Turn-Off Delay Time -­Turn-Off Fall Time --
G
(Note 4, 5)
Total Gate Charge VDS = 48 V, ID = 65A,
V
= 10 V
Gate-Source Charge -­Gate-Drain Charge --
GS
(Note 4, 5)
--
24 58 94 200 98 210 52 114
--
33 43 10 11
-- nC
-- nC
Maximum Continuous Drain-Source Diode Forward Current -- -- 65 A Maximum Pulsed Drain-Source Diode Forward Current -- -- 260 A Drain-Source Diode Forward Voltage VGS = 0 V, IS = 65 A -- -- 1.4 V Reverse Recovery Time VGS = 0 V, IS = 65 A,
dI
/ dt = 100 A/µs (Note 4)
Reverse Recovery Charge -- 132 --
Starting TJ = 25°C
DSS,
F
-- 62 -- ns
ns ns ns ns
nC
nC
FDP65N06 Rev. A1
2 www.fairchildsemi.com
Page 3
Typical Performance Characteristics
Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics
FDP65N06 60V N-Channel MOSFET
, Drain Current [A]
D
I
300
100
V Top : 15 .0 V
1 0 .0 V 8 .0 V 7 .0 V 6 .5 V 6 .0 V Botto m : 5.5 V
10
2
0.1
GS
* No te s :
1. 2 5 0
2. T
110
VDS, Drain-Source Voltage [V]
µs Pulse Test
= 25oC
C
500
150oC
100
25oC
, Drain Current [A]
D
I
10
-55oC
* Notes :
= 40V
1. V
DS
µ s Pulse Test
1
246810
VGS, Ga te -So urc e V o ltag e [V]
2. 250
Figure 3. On-Resistance Variation vs. Figure 4. Body Diode Forward Voltage
Drain Current and Gate Voltage Variation vs. Source Current
and Temperatue
0.14
0.12
0.10
0.08
[Ω],
0.06
DS(ON)
R
0.04
Drain-Source On-Resistance
0.02
0 5 10 15 20
VGS = 10V
VGS = 20V
ID, Drain Current [A]
* Note : TJ = 25oC
100
10
1500C
250C
, Reverse Drain Current [A]
DR
I
1
0.20.40.60.81.01.21.4
VDS, Source-Drain Violtage [V]
* Note :
1. V
=0V
GS
2. 250
µs Pulse Test
Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics
4000
3000
2000
Capacitances [pF]
1000
0
-1
10
FDP65N06 Rev. A1
C
oss
C
iss
C
rss
VDS, Drain-Source Voltage [V]
C
= Cgs + Cgd (Cds = shorted)
iss
C
= Cds + C
oss
C
0
10
gd
= C
rss
gd
* Note :
1. V
= 0 V
GS
2. f = 1 MHz
1
10
12
10
8
6
4
, Gate-Source Voltage [V]
2
GS
V
0
0 10203040
VDS = 12V VDS = 30V
VDS = 48V
QG, Total Gate Charge [nC]
3 www.fairchildsemi.com
* Note : ID = 65A
Page 4
Typical Performance Characteristics (Continued)
Figure 7. Breakdown Voltage Variation Figure 8. On-Resistance Variation vs. Temperature vs. Temperature
FDP65N06 60V N-Channel MOSFET
1.2
1.1
1.0
, (Normalized)
DSS
BV
0.9
Drain-Source Breakdown Voltage
0.8
-100 -50 0 50 100 150 200
* Notes :
1. V
2. I
TJ, Junction Temperature [oC]
= 0 V
GS
= 250 µA
D
3.0
2.5
2.0
1.5
, (Normalized)
1.0
DS(ON)
R
0.5
Drain-Source On-Resistance
0.0
-100 -50 0 50 100 150 200
TJ, Junction Temperature [oC]
Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current
vs. Case Temperature
10
10
10
, Drain Current [A]
10
D
I
10
3
2
1
0
-1 0
10
Operation in This Area is Limited by R
DS(on)
VDS, Drain-SourceVoltage[ V ]
10ms
100ms
DC
* Notes :
= 25 oC
1. T
C
2. T
= 150 oC
J
3. Single Pulse
1
10
1ms
100
80
µs
10
µs
10
70
60
50
40
30
, Drain Current [A]
D
I
20
10
2
0
25 50 75 100 125 150
TC, Case Temperature [oC]
* Notes :
1. V
2. I
D
= 10 V
GS
= 32.5 A
Figure 11. Transient Thermal Response Curve
0
10
D=0.5
0.2
-1
0.1
10
0.05
0.02
0.01
-2
10
(t), Thermal Response
FDP65N06 Rev. A1
?JC
Z
-5
10
single pulse
10
* Notes :
(t) = 0.92 0C/W Max.
1. Z
θJC
2. Duty Factor, D=t
3. TJM - TC = PDM * Z
-4
-3
10
-2
10
-1
10
t1, Square Wave Pulse Duration [sec]
4 www.fairchildsemi.com
1/t2
(t)
θJC
0
10
1
10
Page 5
Gate Charge Test Circuit & Waveform
Resistive Switching Test Circuit & Waveforms
FDP65N06 60V N-Channel MOSFET
FDP65N06 Rev. A1
Unclamped Inductive Switching Test Circuit & Waveforms
5 www.fairchildsemi.com
Page 6
Peak Diode Recovery dv/dt Test Circuit & Waveforms
FDP65N06 60V N-Channel MOSFET
FDP65N06 Rev. A1
6 www.fairchildsemi.com
Page 7
Mechanical Dimensions
FDP65N06 60V N-Channel MOSFET
TO-220
FDP65N06 Rev. A1
Dimensions in Millimeters
Dimensions in Millimeters
7 www.fairchildsemi.com
Page 8
TRADEMARKS
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®
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DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.
FDP65N06 60V N-Channel MOSFET
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, or (c) whose failure to perform when properly used in accordance with instructions for use
2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness. provided in the labeling, can be reasonably expected to result in significant injury to the user.
PRODUCT STATUS DEFINITIONS Definition of Terms
Datasheet Identification Product Status Definition
Advance Information Formative or In
Design
Preliminary First Production This datasheet contains preliminary data, and
No Identification Needed Full Production This datasheet contains final specifications. Fairchild
This datasheet contains the design specifications for product development. Specifications may change in any manner without notice.
supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design.
Semiconductor reserves the right to make changes at any time without notice in order to improve design.
Obsolete Not In Production This datasheet contains specifications on a product
FDP65N06 Rev. A1
that has been discontinued by Fairchild semiconductor. The datasheet is printed for reference information only.
Rev. I19
8 www.fairchildsemi.com
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