These N-Channel enhancement mode power field effect
transistors are produced using Fairchild’s proprietary, planar
stripe, DMOS technology.
This advanced technology has been especially tailored to
minimize on-state resistance, provide superior switching
performance, and withstand high energy pulse in the avalanche
and commutation mode. These devices are well suited for high
efficient switched mode power supplies, active power factor
correction, electronic lamp ballast based on half bridge
topology.
D
G
S
Absolute Maximum Ratings
SymbolParameterFDP65N06Units
V
DSS
I
D
I
DM
V
GSS
E
AS
I
AR
E
AR
dv/dtPeak Diode Recovery dv/dt
P
D
, T
T
J
STG
T
L
Drain-Source Voltage60V
Drain Current - Continuous (TC = 25°C)65A
- Continuous (T
Drain Current- Pulsed
Gate-Source Voltage± 20V
Single Pulsed Avalanche Energy
Avalanche Current
Repetitive Avalanche Energy
Power Dissipation (TC = 25°C)135W
- Derate above 25°C1.08W/°C
Operating and Storage Temperature Range-55 to +150°C
Maximum lead temperature for soldering purposes,
Figure 7. Breakdown Voltage VariationFigure 8. On-Resistance Variation
vs. Temperature vs. Temperature
FDP65N06 60V N-Channel MOSFET
1.2
1.1
1.0
, (Normalized)
DSS
BV
0.9
Drain-Source Breakdown Voltage
0.8
-100-50050100150200
* Notes :
1. V
2. I
TJ, Junction Temperature [oC]
= 0 V
GS
= 250 µA
D
3.0
2.5
2.0
1.5
, (Normalized)
1.0
DS(ON)
R
0.5
Drain-Source On-Resistance
0.0
-100-50050100150200
TJ, Junction Temperature [oC]
Figure 9. Maximum Safe Operating AreaFigure 10. Maximum Drain Current
vs. Case Temperature
10
10
10
, Drain Current [A]
10
D
I
10
3
2
1
0
-1
0
10
Operation in This Area
is Limited by R
DS(on)
VDS, Drain-SourceVoltage[ V ]
10ms
100ms
DC
* Notes :
= 25 oC
1. T
C
2. T
= 150 oC
J
3. Single Pulse
1
10
1ms
100
80
µs
10
µs
10
70
60
50
40
30
, Drain Current [A]
D
I
20
10
2
0
255075100125150
TC, Case Temperature [oC]
* Notes :
1. V
2. I
D
= 10 V
GS
= 32.5 A
Figure 11. Transient Thermal Response Curve
0
10
D=0.5
0.2
-1
0.1
10
0.05
0.02
0.01
-2
10
(t), Thermal Response
FDP65N06 Rev. A1
?JC
Z
-5
10
single pulse
10
* Notes :
(t) = 0.92 0C/W Max.
1. Z
θJC
2. Duty Factor, D=t
3. TJM - TC = PDM * Z
-4
-3
10
-2
10
-1
10
t1, Square Wave Pulse Duration [sec]
4www.fairchildsemi.com
1/t2
(t)
θJC
0
10
1
10
Page 5
Gate Charge Test Circuit & Waveform
Resistive Switching Test Circuit & Waveforms
FDP65N06 60V N-Channel MOSFET
FDP65N06 Rev. A1
Unclamped Inductive Switching Test Circuit & Waveforms
5www.fairchildsemi.com
Page 6
Peak Diode Recovery dv/dt Test Circuit & Waveforms
FDP65N06 60V N-Channel MOSFET
FDP65N06 Rev. A1
6www.fairchildsemi.com
Page 7
Mechanical Dimensions
FDP65N06 60V N-Channel MOSFET
TO-220
FDP65N06 Rev. A1
Dimensions in Millimeters
Dimensions in Millimeters
7www.fairchildsemi.com
Page 8
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not
intended to be an exhaustive list of all such trademarks.
®
ACEx™
ActiveArray™
Bottomless™
Build it Now™
CoolFET™
CROSSVOLT™
DOME™
EcoSPARK™
2
E
CMOS™
EnSigna™
FACT™
FAST
FASTr™
FPS™
FRFET™
GlobalOptoisolator™
GTO™
HiSeC™
2
I
C™
i-Lo™
ImpliedDisconnect™
IntelliMAX™
FACT Quiet Series™
Across the board. Around the world.™
The Power Franchise
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY
PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY
LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN;
NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE
SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS,
SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.
FDP65N06 60V N-Channel MOSFET
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR
CORPORATION.
As used herein:
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the body,
or (b) support or sustain life, or (c) whose failure to perform
when properly used in accordance with instructions for use
2. A critical component is any component of a life support
device or system whose failure to perform can be
reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
provided in the labeling, can be reasonably expected to
result in significant injury to the user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet IdentificationProduct StatusDefinition
Advance InformationFormative or In
Design
PreliminaryFirst ProductionThis datasheet contains preliminary data, and
No Identification NeededFull ProductionThis datasheet contains final specifications. Fairchild
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
ObsoleteNot In ProductionThis datasheet contains specifications on a product
FDP65N06 Rev. A1
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. I19
8www.fairchildsemi.com
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